Agilent Technologies E5035A Operation Manual

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Page 2 Agilent E5022A/B and E5023A Hard Disk Read/Write Test System Operation Manual 27th Edition Software Revision This manual applies directly to system which has the software revision B.04.00. Part No. E5023-90090 January 2004 Printed in Japan Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 3 This document contains proprietary information that is protected by copyright.All rights are reserved. No part of this document may be photocopied, reproduced, or translated to another language without the prior written consent of the Agilent Technologies, Inc. Agilent Technologies Japan, Ltd.
Page 4 Manual Printing History The manual’s printing date and part number indicate its current edition. The printing date changes when a new edition is printed. (Minor corrections and updates that are incorporated at reprint do not cause the date to change.) The manual part number changes when extensive technical changes are incorporated.
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Page 6 WARNINGS elsewhere in this manual may impair the protection provided by the equipment. In addition it violates safety standards of design, manufacture, and intended use of the instrument. The Agilent Technologies, Inc. assumes no liability for the customer’s failure to comply with these requirements. •...
Page 7 The furnished shroud does not provide protection from glass shards which can cause death or serious injury. To prevent injury to the operating personnel use a safety cover when you use glass media. Contact Agilent Technologies when you design a safety cover.
Page 8 Certification Agilent Technologies, Inc. certifies that the module and the spectrum analyzer and the oscilloscope met its published specifications at the time of shipment from the factory. Agilent Technologies further certifies that their calibration measurements are traceable to the United States National Institute of Standards and Technology, to the extent allowed by the Institution’s calibration facility, or to the calibration facilities of other International...
Page 9 SAMPLE PROGRAMS or modification of any part thereof. Agilent Technologies shall not be liable for the quality, performance, or behavior of the Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 10 AGILENT TECHNOLOGIES DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Agilent Technologies shall not be liable for any infringement of any patent, trademark, copyright, or other proprietary rights by the SAMPLE PROGRAMS or their use. Agilent Technologies does not warrant that the SAMPLE PROGRAMS are free from infringements of such rights of third parties.
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Page 12: Table Of Contents
Contents 1. Introduction Manual Overview ..............18 About this Manual.
Page 13 Contents Baseline Measurement (Parametric) ........... . . 72 Parametric Measurement (Parametric) .
Page 14 Contents Baseline Measurement ............. . 244 Resolution Measurement.
Page 15 Contents Write Characteristics..............329 Read Channel .
Page 16 Contents Changes at Revision A.04.10.02 ............358 Changes at Revision A.04.10.02 .
Page 17 Contents E5029J Head Amplifiers for Amplifier on Cassette......... . 417 E5029K Buffer Board.
Page 18: Introduction
Introduction Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 19: Manual Overview
Introduction Manual Overview Manual Overview The Agilent E5022A/B and E5023A have the following seven manuals. Site Preparation and Installation Manual This manual provides the information on how to prepare the environment or place of installation before installing the system. Information such as required space, power supply, load capacity, air pressure, vacuum pressure and others are all provided in this manual.
Page 20 Introduction Manual Overview The Operating Manual, the Programming Manual and the UDS Programming Manual have been installed in PDF format inside the PC. By selecting the desired manual from the start menu of Windows 95/2000 [Program][Agilent Hard Disk ReadWrite Test System], the Acrobat Reader will automatically start up displaying the manual on the screen.
Page 21: About This Manual
Agilent Technologies E5022/E5023. Appendix A. Manual Changes This appendix provides the information required to adapt this manual to earlier versions or configurations of the Agilent Technologies E5022/E5023 to the current printing data of this manual. Appendix B. Error Messages This appendix provides the error messages list from a Measurement software and LCD on the spinstand’s front panel.
Page 22: Product Overview
Product Overview Product Overview Agilent Technologies E5022A/B and EE5023A are hard disk read/write test systems. The difference between E5022A, E5022B, and E5023A is a measurement channel bit rate. E5022A has a capability to measure up to 600 Mbps/750 Mbps (option 002). E5022B has one up to 1G bps.
Page 23 The Table 1-2 shows its matrix. Table 1-2 E5022/E5023 Components Matrix (Spinstand Dependent) Module E5010B E5011A E5010C E5013A Spinstand I/F E5035A E5035A E5035B E5035B module Opt. 001 Opt. 001 Head Amplifier Not Necessary Not Necessary...
Page 24 Introduction Product Overview Table 1-2 E5022/E5023 Components Matrix (Spinstand Dependent) Module E5010B E5011A E5010C E5013A Head Amplifier E5029H E5029H E5029K E5029K (Conventional) (Conventional) (AOC) (AOC) E5029J E5029J (AOC) (AOC) Cassette E5029C E5029C E5029E E5029E (Conventional) (Conventional) (AOC) (AOC) E5029D E5029D (AOC) (AOC) *1.Obsolete.
Page 25 Introduction Product Overview Figure 1-1 Name of each E5022/E5023 Spinstand Portion Agilent E5010B/ E5011A/E5010C/E5013A, the split-axis style spinstand, is used as a spinstand of E5022/E5023. The 3.5 and 2.5 inch spindle clamps (chuck) are available as a option. Figure 1-2 shows the name of each part of spinstand. Chapter 1 Artisan Technology Group - Quality Instrumentation ...
Page 26 Introduction Product Overview Figure 1-2 Name of each part of the E5010B Spinstand Chapter 1 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 27 Introduction Product Overview Figure 1-3 Name of each part of the E5010C Spinstand (with Spinstand Cover Option) Figure 1-4 E5029K On Stage Buffer Unit/Connection Board Chapter 1 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 28: Safety Precautions
Introduction Safety Precautions Safety Precautions WARNING This section explains the safety precautions when you operate the spinstand. E5010B HLM-Spindle Stage When you power on the spinstand, Do Not stick your fingers near the HLM-Spindle Stage in the following precautionary points. •...
Page 29 Introduction Safety Precautions • The intersection point between the HLM and Spindle stage as shown below. When the HLM moves toward the spinstand, DO NOT put your fingers along this line as shown in the figure below. Figure 1-6 HLM-Spindle stage Chapter 1 Artisan Technology Group - Quality Instrumentation ...
Page 30: E5011A Hlm Stage
Introduction Safety Precautions E5011A HLM Stage During power on the spinstand, do not stick your fingers near the HLM Stage in the following precautionary area. Figure 1-7 Precautionary Area NOTE Although there is no shroud in Figure 1-7, do not remove it in use. Shroud (Spindle Cover) While the spindle is running, DO NOT stick your fingers in the shroud.
Page 31: System Structure
Introduction System Structure System Structure This section explains the structure of the system. Measuring Instrument System The measuring instrument system of Agilent E5022/E5023 have three major parts namely: • Signal Generation Part • Agilent E5037A/B/C/D Data Generator Module • Agilent E5043A/B/C Head Amplifier Control Unit •...
Page 32: Spinstand System
Agilent E5035A/B Spinstand Interface Module. The box type measuring instrument such as Oscilloscope and (4395A) are controlled by the PC through GPIB cable. Also, the trigger to start measurement from Agilent E5035A Spinstand Interface Module are received to start measurement.
Page 33: Software
ON, it will slow down the measurement proceedings. CAUTION Agilent Technologies does not warrant any troubles and damages caused by computer virus. Protection, recovery, and the installation of any anti-virus software are to be performed under the responsibility of the Users.
Page 34: Software For E5039A/B/C Bit Error Test Module
Introduction System Structure one of the modules in the VXI Mainframe, the system software must be installed again if the module’s revision does not match with one installed in PC. E5022/E5023 VEE Measurement Program (Demo Program) The VEE Measurement Program is a user interface, it is constructed in VEE which allows the user to make quick measurements and display the system settings.
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Page 36: Preparation For Measurement
Preparation for Measurement Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 37: Overview
Preparation for Measurement Overview Overview The basic procedure by which the measurement of Agilent E5022/E5023 is executed is shown in Figure 2-1. Figure 2-1 Basic Procedure First turn on the spinstand system, second turn on the electronics system, then attach the head cassette on the HLM.
Page 38: Switch On The System
Preparation for Measurement Switch on the System Switch on the System This section provides the procedure when you turn on the system. NOTE Do not turn on the electronics system (VXI modules, oscilloscope, PC, monitor, etc.), before you turn on the spinstand system. Doing so may cause some troubles or failures of the spinstand system.
Page 39: Switch On The Vxi Mainframe And Other Measuring Instruments
Preparation for Measurement Switch on the System Table 2-1 Air Pressure and Vacuum Pressure Minimum Vacuum Pressure -70 kPa (-20.5 inHg) Switch on the VXI mainframe and other measuring instruments. Switch on the VXI mainframe and other measuring instruments (i.e, spectrum analyzer, oscilloscope).
Page 40: Setting The Media
Preparation for Measurement Setting the Media Setting the Media Place the media on top of the spindle. The spindle is equipped with a protective cover called shroud. The shroud protects operating personnel from any injury, in case the user accidentally touches the media under test. If the shroud’s top lid cover is left open the spindle will not rotate.
Page 41: Initialize The System
Preparation for Measurement Initialize the System Initialize the System Before placing the HGA cassette on the HLM of the spinstand, initialize the system. In the case of VEE measurement program, start the program before placing the HGA cassette. This is because the initialization perform the homing of the spinstand. As the homing moves the stage to full travel.
Page 42 Preparation for Measurement Setting the HGA Cassette Figure 2-5 Setting the Cassette on the HLM (E5010C) Chapter 2 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 43: Measurement
Preparation for Measurement Measurement Measurement After doing all the preparations you can now proceed to measurement. The Agilent E5022/E5023 has a pre-installed VEE measurement program. This measurement program allows the user to do basic measurements. Detailed description on how to use the measurement program is written in Chapter 3. This software controls the system by calling the Agilent E5022/E5023 DLL measurement library from VEE.
Page 44: Vee Measurement Program Operation
VEE Measurement Program Operation This chapter provides the information on how to make measurements on the Agilent E5022/E5023 using the furnished Measurement program. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 45: Introduction
VEE Measurement Program Operation Introduction Introduction The Agilent E5022/E5023 has a dynamic link library designed to facilitate the control and measurement programming. The Measurement program has been provided to enable the user to set, measure and display the results in graphical display easily. It is not necessary to care about the DLL library because the measurement program controls this.
Page 46 VEE Measurement Program Operation Introduction will vary depending on measurement applications. This section explains how to set the input range automatically. 5. Performing measurement. Typical measurement and functions have been built-in on Agilent E5022/E5023. This section explains the parameter setting for each measurement.
Page 47: Starting The Vee Measurement Program
VEE Measurement Program Operation Starting the VEE measurement program Starting the VEE measurement program 1. Click on [Start] > [Programs] > [Agilent Hard Disk ReadWrite Test System] > [Test Environment (RunTime Version)] from the task bar of Windows 95/2000 to start the program.
Page 48: Hga Cassette Parameter Configuration
VEE Measurement Program Operation HGA Cassette Parameter Configuration HGA Cassette Parameter Configuration After initializing the system, the cassette parameter setup menu will pop up, this will require you to specify the size of the cassette’s HGA and cassette part number. This setup menu is necessary to activate the VEE measurement program and remind the user that such parameter setup is required.
Page 49 VEE Measurement Program Operation HGA Cassette Parameter Configuration • HGA tip to Boss Center, specify the distance from the boss center to the tip of the HGA as shown in (Figure 3-4 “tip”). • HGA bottom to Boss Center, specify the distance from the boss center to the base of the HGA as shown in (Figure 3-4 “bot”).
Page 50: Customer-Designed Cassette Configuration
VEE Measurement Program Operation HGA Cassette Parameter Configuration Customer-designed Cassette Configuration Agilent E5022/E5023 allows the user to use a customer-designed HGA cassette. When you use your own designed cassette, you have to let the system know the dimensions of the cassette.
Page 51 VEE Measurement Program Operation HGA Cassette Parameter Configuration Figure 3-6 User-Designed Cassette Parameter Menu • Tip1(X), Tip1(Y): Specifies the location of the base of HGA. • Tip2(X), Tip2(Y): Specifies the location of an arbitrary point in theouter area. • Tip3(X), Tip3(Y): Specifies the location of an arbitrary point in theouter area.
Page 52: Software Revision And Hardware Information
VEE Measurement Program Operation Software Revision and Hardware Information Software Revision and Hardware Information The revision number of Agilent E5022/E5023 system software, serial number of modules and instruments, part number and serial number of Buffer/Amplifier Board are reported in [About E5022/E5023] menu. 1.
Page 53: Setup Menu
VEE Measurement Program Operation Setup Menu Setup Menu The Setup Menu is used to set the configuration for precompensation, head amplifier, input range, filter, data pattern and narrow band TAA frequency for advance measurements. 1. Displays the Main Menu. Figure 3-8 Main Menu 2.
Page 54 VEE Measurement Program Operation Setup Menu Figure 3-9 Configuration Menu 3. Click on [Setup] button to open the setup menu. Figure 3-10 Setup Menu 4. Set the parameters within the limits of measurement. Channel Bit Rate Specifies the speed at which data bits are Chapter 3 Artisan Technology Group - Quality Instrumentation ...
Page 55 VEE Measurement Program Operation Setup Menu written on the media per second [bps]. Write Current Specifies the current applied to the write head. Sense Bias Specifies the MR bias applied to the read head. Sense Bias Mode Specifies the MR bias type and its polarity during a write sequence.
Page 56 VEE Measurement Program Operation Setup Menu Measure R/W offset Sets the read/write offset automatically even if the head position is changed. When this parameter is checked, track profile measurement is performed on background just after head position is changed, then [Write Offset] and [Read Offset] parameters are updated to the appropriate values.
Page 57: Filter Configuration Menu
VEE Measurement Program Operation Setup Menu Filter Configuration Menu 1. Click on [Configuration] > [Setup] > [Filter Config] to open the Filter menu. Figure 3-11 Filter Menu 2. Click on [Filter] and select the type of filter to be used by the Filter Matrix Module. 3.
Page 58: Pattern Configuration Menu
VEE Measurement Program Operation Setup Menu Pattern Configuration Menu 1. Click on [Configuration] > [Setup] > [Pattern Config.] to open the Data Pattern menu. Figure 3-12 Data Pattern Menu Specify the number of repetitive periods for each data pattern. Consequently, the frequency of each data pattern will be computed in ‘MHz’...
Page 59: Perform The Amplitude Calibration For E4402B Spectrum Analyzer
VEE Measurement Program Operation Setup Menu Perform the Amplitude Calibration for E4402B Spectrum Analyzer This chapter describes how to perform the amplitude calibration for E4402B Spectrum Analyzer. NOTE The amplitude calibration must be performed at least once after the installation. Or the error message will be displayed in the Narrow Band Spectrum measurements, such as Narrow Band TAA, Overwrite, and Narrow Band Track Profile, etc.
Page 60 VEE Measurement Program Operation Setup Menu Figure 3-14 3. Replace the cable and adapter on E4402B as advised on the display, and then Click on [OK]. Figure 3-15 Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 61 VEE Measurement Program Operation Setup Menu 4. Click on [Calibration] to start the amplitude calibration. Figure 3-16 5. Replace the cable and adapter on E4402B again as advised on the display, and then Click on [OK] to finish the amplitude calibration. NOTE It is recommended to do the calibration in case of the followings: a.
Page 62: Auto Configuration (Input Range Configuration)
VEE Measurement Program Operation Auto Configuration (Input Range Configuration) Auto Configuration (Input Range Configuration) Although it is a must to set the input range relative to the signal level. This setting can be done automatically by a function called “Auto Configuration”. See also the “Input Range Control &...
Page 63 VEE Measurement Program Operation Auto Configuration (Input Range Configuration) Figure 3-18 Measure Menu 4. Click on [Auto Config.] button to open the Auto Config. menu. Figure 3-19 Auto Configuration Menu 5. Set the write and sense currents according to test requirements. The new setting will automatically update similar parameters in other menus.
Page 64 VEE Measurement Program Operation Auto Configuration (Input Range Configuration) Figure 3-20 Auto Config - Result 7. Set the parameters of the band erase and the track profile measurement since the auto config performs a track profile measurement in the sequence. 8.
Page 65 VEE Measurement Program Operation Auto Configuration (Input Range Configuration) Figure 3-21 Auto Config - Result 10. Click on the [Return] button to return to Measure menu. See also See “Input Range Control & Auto Configuration” on page 308 for the auto configuration. Chapter 3 Artisan Technology Group - Quality Instrumentation ...
Page 66: Measurement
VEE Measurement Program Operation Measurement Measurement After executing the auto configuration, you can now proceed to perform any measurements. Prior to any measurements you need to specify proper values of the parameters. Measurements are generally performed automatically. The spindle rotation, head loading and unloading are also done automatically.
Page 67: Taa Measurement (Parametric)
VEE Measurement Program Operation Measurement TAA Measurement (Parametric) Overview This section describes the TAA measurement. TAA measurement is used to measure TAA positive, TAA negative and TAA asymmetry. TAA measurement is measured by the parametric module (E5038A). Measurement 1. To open the TAA menu, click on the [TAA] button from the Parametric frame of the Procedure Measure menu.
Page 68 VEE Measurement Program Operation Measurement Meas. Type Specifies the type of measurement sequence. 1)[Erase Write Meas.] means to perform DC erase, write data then measure. 2)[Write Meas.] means to write data, then measure. 3) [Meas.] means to measure only. NOTE The parameter values of Channel Bit Rate, Write Current and Sense Current that have been set in the [Configuration] menu will automatically update similar parameters in this menu.
Page 69 VEE Measurement Program Operation Measurement 6. Click on the [TAA Asym. Trace] button to display the results of TAA Asym Trace. Figure 3-25 TAA Asym.Trace Display Measurement The upper portion of the window shows the mean, minimum, maximum and standard Display deviation of TAA Asymmetry from the number of measured revolutions.
Page 70 VEE Measurement Program Operation Measurement Measurement The Raw Data represents the original data used to calculate the TAA. Although its Display averaged value is measured for every rotation of the track, the raw data displays the measurement results for every 5 µsec of each track. If Average is set to 2, then only the results of the last rotation will be displayed.
Page 71: Pw Measurement (Parametric)
VEE Measurement Program Operation Measurement PW Measurement (Parametric) Overview This section describes the PW measurement. The PW measurement is used to measure the PW+ positive, PW- negative and PW asymmetry. PW is measured by the parametric module (E5038A). Measurement 1. To open the PW menu, click on the [PW] button from the Parametric frame of the Procedure Measure menu.
Page 72 VEE Measurement Program Operation Measurement Average Specifies the number of revolutions to get the average results. Track # Specifies the track number to be tested. Meas. Type Specifies the type of measurement sequence. 1)[Erase Write Meas.] means to perform a DC erase, write data then measure.
Page 73: Baseline Measurement (Parametric)
VEE Measurement Program Operation Measurement Baseline Measurement (Parametric) Overview This section describes the Baseline measurement. The Baseline measurement is used to measure Baseline, Baseline+ positive, Baseline- negative and Baseline Separation. Baseline measurement is measured by the parametric module (E5038A). Measurement 1.
Page 74 VEE Measurement Program Operation Measurement PLL Threshold Specifies the PLL threshold when measuring with a parametric module. This is normally set to 50%. Meas. Type Specifies the type of measurement sequence. 1)[Erase Write Meas.] means to perform a DC erase, write data then measure. 2)[Write Meas.] means to write data, then measure.
Page 75: Parametric Measurement (Parametric)
VEE Measurement Program Operation Measurement Parametric Measurement (Parametric) Overview This section describes the parametric measurement. Parametric measurement is performed with TAA, PW and Baseline measurements. The Parametric measurement measures the following data patterns: • HF pattern for TAA measurement (HF TAA). •...
Page 76 VEE Measurement Program Operation Measurement Sense Current Specifies the current applied to the read head. Average Specifies the number of revolutions to get the average results. Track# Specifies the track number to be tested. NOTE The parameter values of Channel Bit Rate, Write Current and Sense Current that have been set in the [Configuration] menu will automatically update similar parameters in this menu.
Page 77: Resolution Measurement (Parametric)
VEE Measurement Program Operation Measurement Resolution Measurement (Parametric) Overview This section describes the Resolution measurement. Resolution is used to measure the TAA of HF and LF data patterns. Resolution is measured by the parametric module (E5038A). Measurement 1. To open the Resolution menu, click on the [Resolution] button from the Parametric Procedure frame of the Measure menu.
Page 78 VEE Measurement Program Operation Measurement set in the [Configuration] menu will automatically update similar parameters in this menu. 3. Click on the [Measure] button to start measurement, results are displayed after measurement. Measurement The upper portion of the window shows the mean, minimum, maximum and standard Display deviation.
Page 79: Stability Measurement
VEE Measurement Program Operation Measurement Stability Measurement Stability Measurement (Ratio Setting) The Stability measurement is used to measure the TAA stability during many read /write iterations of the head. See “Stability Measurement” on page 248. 1. To open the ‘Stability (Ratio Setting)’ menu, click on the [Stability] > [Stability (Ratio Setting)] button from the measurement menu.
Page 80 VEE Measurement Program Operation Measurement Figure 3-33 TAA Stability Menu 3. Set the parameters, click on each button to enter a new value. Skip Erase & Write Selects the type of measurement sequence. Erase and write sequences are not done when this is checked.
Page 81 VEE Measurement Program Operation Measurement Read Ratio Specifies the read aperture ratio relative to its corresponding sector (segment). See “Stability Measurement” on page 248. Curr. Mode Specifies the current polarity. When “Normal Mode” is selected, write current polarity is the same as read current polarity.
Page 82 VEE Measurement Program Operation Measurement system error “hpe5022_ERROR_NSUP_CONF” will be displayed, when you set the [Write Mode] to “Continuous”. Figure 3-35 Write Mode Write Pattern Specifies the write excitation pattern for stability measurement. Write Mode Specifies the write data polarity when writing the data.
Page 83 VEE Measurement Program Operation Measurement Click on [Narrow Band TAA] to open the Narrow Band TAA menu Figure 3-36 Narrow Band TAA Menu NOTE For Stability measurement of Narrow Band TAA, tracks are unsectored. 2. Set the parameters, click on each button to enter a new value. Skip Erase &...
Page 84 VEE Measurement Program Operation Measurement Curr. Mode Specifies the current polarity. When “Normal Mode” is selected, write current polarity is the same as read current polarity. If “Reverse Mode” is selected, the read current polarity is opposite to the write current polarity. Some head amplifier does not support the reverse and/or off functions.
Page 85 VEE Measurement Program Operation Measurement Figure 3-37 Stability Write Configuration Write Pattern Specifies the write excitation pattern for stability measurement. Write Mode Specifies the write data polarity when writing the data. When ‘Fixed’ is selected the write current direction of each write operation is the always the same.
Page 86 VEE Measurement Program Operation Measurement Stability Measurement (Absolute Time Setting) This measurement allows the user to set up the write and read operation in each segment (sector) as a function of absolute time so that test results can be closely correlated to popcorn noise test.
Page 87 VEE Measurement Program Operation Measurement Figure 3-39 TAA Stability Menu 3. Set the parameters, click on each button to enter a new value. Skip Erase & Write Selects the type of measurement sequence. Erase and write sequences are not done when this is checked.
Page 88 VEE Measurement Program Operation Measurement “hpe5022_measureAbsStability” function of the programming manual for details. Read Time Specifies the amount of time to read the data. Minimum value is 20[µsec] and maximum value is 10[msec]. Refer to “hpe5022_measureAbsStability” function of the programming manual for details. Curr.
Page 89 VEE Measurement Program Operation Measurement [Write Mode] to “Continuous”. Figure 3-41 Write Mode Write Pattern Specifies the write excitation pattern for stability measurement. Write Mode Specifies the write data polarity when writing the data. When ‘Fixed’ is selected the write current direction of each write operation is the always the same for all segments.
Page 90 VEE Measurement Program Operation Measurement Click on [Narrow Band TAA] to open the Narrow Band TAA menu. Figure 3-42 [Narrow Band TAA] Menu NOTE For Stability measurement of Narrow Band TAA, tracks are unsectored. 2. Set the parameters, click on each button to enter a new value. Skip Erase &...
Page 91 VEE Measurement Program Operation Measurement the programming manual for details. Delay Specifies the distance in time between write and read operation. This parameter represents the delay time when to read the data after write. Minimum value is zero and maximum value is 10[msec].
Page 92 VEE Measurement Program Operation Measurement Figure 3-43 Stability Write Configuration Write Pattern Specifies the write excitation pattern for stability measurement. Write Mode Specifies the write data polarity when writing the data. When ‘Fixed’ is selected the write current direction of each write operation is the always the same.
Page 93: Narrow Band Taa (Parametric)
VEE Measurement Program Operation Measurement Narrow Band TAA (Parametric) Overview This section describes the Narrow Band TAA measurement. Narrow Band TAA is measured by the spectrum analyzer where low signal level measurement is possible. Measurement 1. To open the Narrow Band TAA menu, click on the [Narrow Band TAA] button from Procedure the Parametric frame of the Measure menu.
Page 94 VEE Measurement Program Operation Measurement Center Freq. Specifies the measurement frequency of the spectrum analyzer. This parameter can only be used if [Freq.Mode] is set to “Manual”. Freq. Mode Specifies the setting of the measurement frequency. Select either Auto Mode or Manual Mode.
Page 95 VEE Measurement Program Operation Measurement Measurement The Raw Data represents the original data used to calculate the narrow Band TAA. Display The upper portion of the graph shows the mean, maximum, minimum and std. deviation of the raw data. 5. Click the [Return] button to return to Measure menu. Chapter 3 Artisan Technology Group - Quality Instrumentation ...
Page 96: Waveform Analysis (Parametric)
VEE Measurement Program Operation Measurement Waveform Analysis (Parametric) Overview This section describes the parametric measurement by waveform analysis. Waveform analysis is performed by an oscilloscope. If an oscilloscope is not installed in your system, this measurement can not be executed. Measurement 1.
Page 97 VEE Measurement Program Operation Measurement 1)[Erase Write Meas.] means to perform a DC erase, write data then measure. 2)[Write Meas.] means to write data, then measure. 3) [Meas.] means to measure only. NOTE The parameter values of Channel Bit Rate, Write Current and Sense Current that have been set in the [Configuration] menu will automatically update similar parameters in this menu.
Page 98: Absolute Polarity (Parametric)
VEE Measurement Program Operation Measurement Absolute Polarity (Parametric) Overview This section describes the Absolute Polarity measurement. Absolute polarity is measured by the parametric module. This test is used to detect the pinned layer reversal of the GMR head by measuring the TAA asymmetry of the Isolated Pulse TAA and Tribit TAA. Measurement 1.
Page 99 VEE Measurement Program Operation Measurement allows the user to specify a new data pattern. Absolute Polarity Pattern Specifies the data pattern defined by the user. This button becomes active when the [Pattern Mode] is set to ‘User Mode’. When you click this button a popup window will appear that allows the user to specify a new data pattern.
Page 100: Track Profile Measurement (Parameter Sweep)
VEE Measurement Program Operation Measurement Track Profile Measurement (Parameter Sweep) This section describes the track profile measurement. Track profile measurement is used to measure the track profile, the narrow band track profile and micro track profile. This measurement is measured by the parametric module. While narrow band track profile and the micro track profile measurements are measured by the spectrum analyzer.
Page 101 VEE Measurement Program Operation Measurement Figure 3-49 TAA Track Profile Menu 3. Set the parameters, click on each button to enter a new value. Program Read Offset Specifies the auto setting of the read-write offset when track profile is performed. If you check this box the write offset and read offset of the [Spinstand] menu will change automatically.
Page 102 VEE Measurement Program Operation Measurement [Configuration] > [Setup] > [Pattern Config] buttons to open the data pattern menu. Track # Specifies the track number to be tested. Offset Start Specifies the starting point of the head offset in measuring the TAA track profile. Offset Stop Specifies the stopping point of the head offset in measuring the TAA track profile.
Page 103 VEE Measurement Program Operation Measurement Figure 3-50 TAA Track Profile Menu - Band Erase Setting Band Erase Range Specifies the range of band erase. Band Erase Pitch Specifies the erase pitch of band erase. Figure 3-51 Parameter of Band Erase 5.
Page 104 VEE Measurement Program Operation Measurement Figure 3-52 TAA Track Profile Menu - Track Offset Compensation Setup • Compensation Profile Setting Size Specifies the track profile points for a calibration sequence in the track offset compensation sequence. Range Specifies the track profile range for a calibration sequence in the track offset compensation sequence.
Page 105 VEE Measurement Program Operation Measurement 6. Click on the [Measure] button to start measurement. Results will be displayed after measurement. The measured results of the track profile are displayed on this menu. This menu also reports the computed ‘Track Width’ and ‘Read/Write Offset’. NOTE Click on the “Save Trace”...
Page 106 VEE Measurement Program Operation Measurement Micro Track Profile Measurement Overview The micro track profile measurement is used to predict the width of the read head. It measures the narrow band track profile after creating a micro track. There are two types of micro track profile measurement, a micro track profile and a fast micro track profile measurements.
Page 107 VEE Measurement Program Operation Measurement Figure 3-54 Micro Track Profile Menu 2. Set the parameters, click on each button to enter a new value. Track Offset Compensation Checking this box will activate a track offset compensation function. See “Track Offset Compensation Function”...
Page 108 VEE Measurement Program Operation Measurement Ratio Specifies the ratio for micro track profile measurement. When this ratio is reached the erase offset will stop.Compares the TAA level of micro track from the original track. This ratio is defined as (TAA of Narrow Band Micro Track Profile) / (TAA of Narrow Band Track Profile).
Page 109 VEE Measurement Program Operation Measurement range and its detailed description. Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 110 VEE Measurement Program Operation Measurement Fast Micro Track Profile Measurement Overview This measurement allows a faster micro track profile measurement. There is no TAA level monitoring during erase operation, erase is performed at once which allows for faster measurement. Measurement 1.
Page 111 VEE Measurement Program Operation Measurement Figure 3-57 Fast Micro Track Menu 2. Set the parameters, click on each button to enter a new value. Channel Bit Rate Specifies the speed at which data bits are written on the media per second [bps]. Write Current Specifies the current applied to the write head.
Page 112 VEE Measurement Program Operation Measurement Offset Step Specifies the step by which the head is moved when measuring the TAA track profile. If you set this parameter with [Offset Start] and [Offset Stop], [Offset NOP] will be computed and updated automatically. Offset NOP Specifies the number of measurement points to build the track profile.
Page 113: Write Current Sweep (Parameter Sweep)
VEE Measurement Program Operation Measurement Write Current Sweep (Parameter Sweep) Overview This section describes the Write Current Sweep measurement. Write Current Sweep measurement is used to measure the TAA, PW, 5th Harmonic NLTS, Overwrite, and Narrow Band TAA. Measurement 1. To open the Write Current Sweep menu, click on the [Write Current Sweep] button Procedure from the Parameter Sweep frame of the Measure menu.
Page 114 VEE Measurement Program Operation Measurement Figure 3-59 Write Current Setup menu 2. Set the parameters of write current sweep. Start Specifies the starting point to sweep the write current. Stop Specifies the stopping point to sweep the write current. Step Specifies the step by which write current is incremented while measuring TAA.
Page 115 VEE Measurement Program Operation Measurement Figure 3-60 Write Current Sweep TAA Menu 5. Set the parameters, click on each button to enter a new value. Channel Bit Rate Specifies the speed at which data bits are written on the media per second [bps]. Sense Current Specifies the current applied to the read head.
Page 116 VEE Measurement Program Operation Measurement Write Curr. NOP Specifies the number of points in measuring TAA relative to the change in write current. If you specify this parameter with [Write Curr. Stop] and [Write Curr. Step], [Write Curr. Step] will be computed and updated automatically.
Page 117: Sense Bias Sweep (Parameter Sweep)
VEE Measurement Program Operation Measurement Figure 3-62 TAA Asym.Trace Window Measurement The window shows the results of TAA Asymmetry of the write current sweep. Display 10. Click [OK] to return to Write Current Sweep TAA menu. 11. Click the [Return] button to return to Measure menu. Sense Bias Sweep (Parameter Sweep) Overview This section describes the sense bias sweep measurement.
Page 118: Roll Off (Parameter Sweep)
VEE Measurement Program Operation Measurement Roll Off (Parameter Sweep) Overview This section describes the Roll Off measurement. Roll Off measurement is used to measure the TAA and Narrow Band TAA. Measurement 1. To open the Roll Off menu, click on the [Roll Off] button from the Parameter Sweep Procedure frame of the Measure menu.
Page 119 VEE Measurement Program Operation Measurement Figure 3-64 Roll Off Narrow Band TAA Menu Write Current Specifies the current applied to the write head. Sense Current Specifies the current applied to the read head. Track # Specifies the track number to be tested. Bit Rate Start Specifies the starting point of the flux frequency.
Page 120 VEE Measurement Program Operation Measurement NOTE The parameter values of Channel Bit Rate, Write Current and Sense Current that have been set in the [Configuration] menu will automatically update similar parameters in this menu. 4. Click the [Measure] button to start measurement. When [Auto Scale] is pressed the graph scale will adjust itself automatically to its maximum and minimum values.
Page 121: Channel Bit Rate (Parameter Sweep)
VEE Measurement Program Operation Measurement Channel Bit Rate (Parameter Sweep) Overview This section describes the Channel Bit Rate measurement. Channel Bit Rate measurement is used to measure the TAA, PW, NLTS 5th Harmonic, Overwrite and Narrow Band TAA. Measurement 1. To open the Channel Bit Rate menu, click on the [Channel Bit Rate] button from the Procedure Parameter Sweep frame of the Measure menu.
Page 122 VEE Measurement Program Operation Measurement Figure 3-66 Channel Bit Rate Menu 3. Set the parameters for channel bit rate sweep. Start Specifies the starting point of the channel bit rate. Stop Specifies the stopping point of the channel bit rate. Step Specifies the step by which channel bit rate is incremented while measuring TAA.
Page 123 VEE Measurement Program Operation Measurement Figure 3-67 Channel Bit Rate Sweep PW Menu 6. Set the parameters, click on each button to enter a new value. Write Current Specifies the current applied to the write head. Sense Current Specifies the current applied to the read head. Data Pattern Specifies the data pattern to be written on the test track.
Page 124 VEE Measurement Program Operation Measurement NOTE The Bit Rate Start, Bit Rate Stop, Bit Rate Step and Bit Rate NOP are all reflected in both Channel Bit Rate Set Up menu and Channel Bit Rate Sweep PW menus.You can use either of the two menus to set the parameters.
Page 125: Write Precompensation Sweep (Parameter Sweep)
VEE Measurement Program Operation Measurement Write Precompensation Sweep (Parameter Sweep) Overview This section describes the Write Precompensation Sweep. Write Precompensation Sweep measurement can be used to observe the TAA, PW, 5th Harmonic NLTS, Overwrite and Narrow Band TAA. Measurement 1. To open the Precompensation Sweep menu, click on the [Precomp Sweep] button from Procedure the Parameter Sweep frame of the Measure menu.
Page 126 VEE Measurement Program Operation Measurement Delay Stop Specifies the time to stop the delay for write precompensation. Delay Step Specifies the step by which the time delay is incremented from [Delay Start] to [Delay Stop]. When you set this parameter with [Delay Start] and [Delay Stop], [NOP] will be computed and updated automatically.
Page 127: Standard Triple Track Measurement
VEE Measurement Program Operation Measurement Standard Triple Track Measurement Overview This section describes the standard Triple Track Measurement. This measurement allows you to evaluate the characteristics of head offset versus TAA. Measurement 1. To open the Triple Track Test menu, click on the [Triple Track Test] button from the Procedure Parametric Sweep frame of the Measure menu.
Page 128 VEE Measurement Program Operation Measurement Figure 3-71 Triple Track Menu NOTE Before you execute this measurement, you must execute the auto configuration to set the input range automatically, or set the input range manually. Program Read Offset Specifies the auto setting of the read-write offset after the track profile is measured.
Page 129 VEE Measurement Program Operation Measurement and the adjacent track (i.e, squeezing track).See measurement definitions on Chapter 4. OTRC Write Pos. Specifies the distance where the write data track is written. (not the same as squeezing track). This distance is expressed as percentage of the write width.
Page 130 VEE Measurement Program Operation Measurement used to plot the interpolation lines. Refer to Figure 3-73 on page 129. Window% Specifies the size of the window to be used in finding the best correlation to plot the interpolation lines.This value is expressed as percentage between the high and low threshold settings.
Page 131 VEE Measurement Program Operation Measurement Figure 3-74 Profile Setup Menu Offset Start Specifies the starting point of the track offset in building the track profile.This point is defined as the distance in [µm] from the track center. Offset Stop Specifies the stopping point of the track offset in building the track profile.
Page 132 VEE Measurement Program Operation Measurement Figure 3-75 Band Erase Configuration menu Band Erase Range Specifies the range for band erase. Band Erase Pitch Specifies the erase pitch for band erase. Erase pitch is the distance between the centers of two adjacent tracks. Figure 3-76 Parameter of Band Erase 8.
Page 133 VEE Measurement Program Operation Measurement Figure 3-77 Adjacent Track Configuration Menu Adjacent Track Pattern Specifies the data pattern of the adjacent track. DC and AC erase can be selected as a data pattern. 9. Click the [Measure] button to start measurement. Measurement The upper portion of the menu shows the measurement results of the WW (Write Display...
Page 134: Snr Triple Track Measurement
VEE Measurement Program Operation Measurement SNR Triple Track Measurement Overview This section describes the SNR Triple Track Measurement. This measurement allows you to evaluate the characteristics of head offset versus TAA. Measurement 1. Set the input range using the auto configuration, or set the input range manually. Procedure 2.
Page 135 VEE Measurement Program Operation Measurement 5. Set the following parameters. Specifies the speed at which data bits are Channel Bit Rate written on the media per second [bps]. Specifies the current applied to the write head. Write Current Specifies the sense bias applied to the read Sense Bias head.
Page 136 VEE Measurement Program Operation Measurement finding the best correlation to plot the interpolation lines.This value is expressed as percentage between the high and low threshold settings. High% Specifies the maximum threshold value for interpolation. Low% Specifies the minimum threshold value for interpolation.
Page 137 VEE Measurement Program Operation Measurement Specifies the stopping point of the track offset Stop in building the track profile. This point is defined as the distance in [µm] from the track center. Specifies the step by which the head is moved Step while measuring TAA in order to build the track profile.
Page 138 VEE Measurement Program Operation Measurement Figure 3-84 Adjacent Track Configuration Menu Adjacent Track Pattern Specifies the data pattern of the adjacent track. DC and AC erase can be selected as a data pattern. 10. Click [SNR Profile Setup] button to open the SNR Profile Setup Dialog Box and set SNR Profile.
Page 139 VEE Measurement Program Operation Measurement Figure 3-86 Filter Setup Dialog Box Noise Threshold Specifies the noise threshold. Use FIR Filter (check box) Selects to use FIR filter or not. Specifies the FIR filter factor. FIR Filter Factor 12. Click [Measure] button to start measurement. Figure 3-87 Measurement Execution Measurement...
Page 140 VEE Measurement Program Operation Measurement Figure 3-88 Trace Display Buttons Figure 3-89 Signal Track Profile Display 14. To observe the normalized traces, click [Normalized Profile] button (see Figure 3-88 on page 139). Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 141 VEE Measurement Program Operation Measurement Figure 3-90 Normalized Trace Display 15. To observe the SNR traces, click [SNR Profile] button (see Figure 3-88 on page 139). Figure 3-91 SNR Trace Display 16. Click [Return] button to return to Measure menu. Chapter 3 Artisan Technology Group - Quality Instrumentation ...
Page 142: Snr Triple Track 747 Test
VEE Measurement Program Operation Measurement SNR Triple Track 747 Test Overview This section describes the SNR Triple Track 747 Test. You can obtain the 747 characteristics through the squeezed OTRC evaluation in the SNR Triple Track Test. Measurement 1. Set the input range using the auto configuration, or set the input range manually. Procedure 2.
Page 143 VEE Measurement Program Operation Measurement Figure 3-93 SNR Triple Track 747 Measurement Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 144: Baseline Popping Measurement
VEE Measurement Program Operation Measurement Baseline Popping Measurement Overview This section describes the Baseline Popping Measurement. This measurement allows you to evaluate the Narrow Band TAA level. Measurement 1. To open the Baseline Popping menu, click on the [Baseline Popping] button from the Procedure Parameter Sweep frame of the Measure menu.
Page 145 VEE Measurement Program Operation Measurement Sense Curr. Step Specifies the step by which sense current is incriminated while measuring Narrow Band TAA. When you set this parameter with [Sense Curr. Start] and [Sense Curr. Stop], [NOP] will be computed and updated automatically.
Page 146: Sub-Harmonic Noise Ratio (Shnr)
VEE Measurement Program Operation Measurement Sub-Harmonic Noise Ratio (SHNR) Overview This section describes the SHNR measurement. This test is used to detect baseline popping of MR/GMR heads by measuring the sub-harmonics noise ratio. Measurement 1. To open the SHNR menu, click on the [SHNR] button from the Parameter Sweep frame Procedure of the Measure menu.
Page 147 VEE Measurement Program Operation Measurement Track # Specifies the track number to be tested. Write Time Specifies the time to perform write excitation. This parameter is expressed in terms of [msec]. Delay Specifies the distance in time between write excitation and read operation. This parameter represents the delay time when to read the data after write.
Page 148 VEE Measurement Program Operation Measurement Sense Curr. Step Specifies the step by which sense current is incremented while measuring SHNR. When you set this parameter, Sense Curr [NOP] will be computed and updated automatically. Sense Curr. NOP Specifies the number of sense current points to measure relative to the change in sense current.
Page 149 VEE Measurement Program Operation Measurement Excite Write Current Specifies the write excitation current. Write Mode Specifies the write current direction when writing data. When ‘Fixed’ is selected the write current direction at the start of each write operation is the always the same. When ‘Continuous’...
Page 150: Dipulse Extraction (Nlts)
VEE Measurement Program Operation Measurement Dipulse Extraction (NLTS) The Dipulse Extraction (NLTS) is measured by an oscilloscope. If an oscilloscope is not installed in the system, this measurement can not be measured 1. To open the Dipulse Extraction menu, click on the [Dipulse Extraction] button from the NLTS frame of the Measure menu.
Page 151: Time Correlation Nlts
VEE Measurement Program Operation Measurement Track # Specifies the track number to be tested. Echo Location Specifies the echo location for the result named “Echo” on the top of the display. NOTE The parameter values of Channel Bit Rate, Write Current and Sense Current that have been set in the [Configuration] menu will automatically update similar parameters in this menu.
Page 152: 5Th Harmonic (Nlts)
VEE Measurement Program Operation Measurement 5th Harmonic (NLTS) Overview The 5th Harmonic (NLTS) is measured by a spectrum analyzer. Measurement 1. To open the NLTS 5th Harmonic menu, click on the [5th Harmonic] button from NLTS Procedure frame of the Measure menu. Also refer to “Pattern Configuration Menu” on page 57 to set the precompensation delay pattern.
Page 153 VEE Measurement Program Operation Measurement 5th min., NLTS 5th max. and Std. Dev. See also See the “NLTS (5th Harmonic) measurement function” section in Chapter 3 of the programming manual for the parameter range and its detailed descriptions. Chapter 3 Artisan Technology Group - Quality Instrumentation ...
Page 154: Snr Measurement
VEE Measurement Program Operation Measurement SNR Measurement Overview This section describes the SNR (Signal To Noise Ratio) measurement. SNR allows you to measure and compare the signal levels of an erased track and an overwritten track. Measurement 1. To open the SNR menu, click on the [SNR] button from the Measure menu. Procedure Figure 3-100 SNR Measurement Menu...
Page 155 VEE Measurement Program Operation Measurement Track # Specifies the track number to be tested. NOTE The parameter values of Channel Bit Rate, Write Current and Sense Current that have been set in the [Configuration] menu will automatically update similar parameters in this menu. 3.
Page 156: Spectral Snr Measurement
VEE Measurement Program Operation Measurement Spectral SNR Measurement Overview This section describes the SNR (Signal To Noise Ratio) measurement using the spectrum analyzer. SNR allows you to measure and compare the signal levels of an erased track versus an overwritten track. Measurement 1.
Page 157 VEE Measurement Program Operation Measurement Specifies the video band width. Narrowing VBW will reduce the noise variations. And widening VBW results to a faster measurement. If the system has E4402B 3GHz spectrum analyzer or 4395A, this value is clipped to a largest (and not greater than it) value within the range from RBW/300 to RBW and among 10, 30, 100, 1k, 3k, 10k, 30k, 100k, 300k, 1M and 3MHz.
Page 158: Spectrum Measurement
VEE Measurement Program Operation Measurement Spectrum Measurement Overview This section describes the measurement of noise signal using a spectrum analyzer. Measurement 1. To open the Spectrum Measurement menu, click on [Measure Spectrum] button from Procedure the Measure menu. Figure 3-102 Spectrum Measurement Menu NOTE Before you execute this measurement, you should set an appropriate input range or execute...
Page 159 VEE Measurement Program Operation Measurement span, the measurement speed may become very slow when you set this below 10kHz. The values which can be set by vary by Spectrum analyzer the system has If the system has 4395A or E5040A, the RBWs of 3k, 10k, 30k, 100k, 300k and 1MHz can be set.
Page 160 VEE Measurement Program Operation Measurement menu and select the type in the [Erase Type] parameter. 3. Click the [Measure] button to start measurement. When [Auto Scale] is pressed, the graph scale will adjust itself automatically to its maximum and minimum values. 4.
Page 161: Popcorn Noise Test
VEE Measurement Program Operation Measurement Popcorn Noise Test Popcorn Noise Test when using E5038A/B Overview This section describes the Popcorn Noise Measurement. This measurement allows you to analyze the head noise after write operation. Popcorn noise is detected when it exceeds a specified level (threshold level) at a specified time.
Page 162 VEE Measurement Program Operation Measurement Write Time Specifies the time to write the data. This parameter is expressed in terms of [µsec]. Delay Specifies the distance in time between write and read operations. This parameter represents the delay time when to read the data after write.
Page 163 VEE Measurement Program Operation Measurement NOTE The parameter values of Channel Bit Rate, Write Current and Sense Current that have been set in the [Configuration] menu will automatically update similar parameters in this menu. Write Config Select the data pattern for the write excitation. This allows you to select the different data patterns for write excitation from the standard data pattern independently.
Page 164 VEE Measurement Program Operation Measurement Popcorn Noise Test using E5041A Overview The Agilent E5041A is a dual counter module designed to detect and count the number of noise spikes in the read head. This measurement is used to measure the head noise called popcorn noise, which occurs shortly after the write operation.
Page 165 VEE Measurement Program Operation Measurement Delay Specifies the distance in time between write and read operation. This parameter represents the delay time when to read the data after write. This parameter is expressed in terms of [µsec]. Read Time Specifies the amount of time to read the data. This parameter is expressed in [µsec].
Page 166 VEE Measurement Program Operation Measurement Write Config Select the data pattern for the write excitation. This allows you to select the different data patterns for write excitation from the standard data pattern independently. This also allows you to select the erase patterns as a write pattern.
Page 167: Bit Error Test Measurement
VEE Measurement Program Operation Measurement Bit Error Test Measurement Overview The Agilent E5039A/B/C is a Bit Error Rate Test Module designed to allow users to measure the bit error rate characteristics of the head and media with a customer specified channel IC.
Page 168 VEE Measurement Program Operation Measurement [Optimize] Menu Measurement Click on the [Optimize] button to open the optimization menu. Procedure Optimization enables the channel IC to operate at optimum performance. Optimization is necessary whenever you change the user data rate, endec parameters, etc. prior to measurement.
Page 169 VEE Measurement Program Operation Measurement click this button. Consequently, the corresponding selected parameters in this menu will be shown automatically in the sequence setup frame. Ch Quality Meas. Selects the sequence type of the channel quality measurement. [Optimize] > [Sequence Setup] (When Optimize Sequence is Standard) When “Optimize Sequence”...
Page 170 The [# of Lost Sectors] counts the sector where the synchronous pattern is not detected. [Total Sectors] represents the total number of sectors measured. [Configuration] Menu The [Configuration] menu is provided in the Agilent Technologies E5039A/B ‘Manual Supplement’ because configuration is dependent on each channel IC characteristics. Chapter 3...
Page 171 VEE Measurement Program Operation Measurement [BER] Menu Measurement 1. Click on [BER] button to open the BER Test menu. Procedure Figure 3-108 Ber Menu Exec. Optimize Optimizes the setup parameters in the [Optimize] menu for optimum measurement results. Optimization is required whenever you change the ‘User Data Rate’...
Page 172 VEE Measurement Program Operation Measurement If [Last Revolution] is selected, only the error data of the last revolution is logged. The [View Err Log] displays the logged error data. Refer to the “hpe5022_BER_berDataLoggingMode” function of the programming manual for details. Meas.
Page 173 VEE Measurement Program Operation Measurement 3. Click on the [Adjacent Track Setup] button to set up the adjacent track parameters. The setup parameters in this menu will automatically update similar parameters in the Bathtub menu. Figure 3-109 Adjacent Track Menu Background Adjacent Track Setting Adjacent Track Mode Specifies the type of background adjacent...
Page 174 VEE Measurement Program Operation Measurement Figure 3-110 Adjacent Track Position 4. Click the [Drift Compensation Setup] button to open the Track Offset Compensation window. Figure 3-111 BER Menu - Track Offset Compensation Setup • Compensation Profile Setting Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 175 VEE Measurement Program Operation Measurement Size Specifies the track profile points for calibration sequence in the track offset compensation sequence. Range Specifies the track profile range for calibration sequence in the track offset compensation sequence. • Compensation Pattern Setting Auto Setting Checking this box will define a compensation pattern setting automatically.
Page 176 VEE Measurement Program Operation Measurement [BER] > [View Sector Data] Window The [View Sector Data] allows you to monitor the number of error symbols per sector, i.e., the number of detected error bytes per sector as reported by ‘Err’ graph line. The ‘Lost’...
Page 177 VEE Measurement Program Operation Measurement This table shows the originally written/read data of each sector where data error is detected. 8. Click on [Error Length] button to open the error length window. [BER] > [Error Length] Window This window shows the length of the counted errors. 9.
Page 178 VEE Measurement Program Operation Measurement [Ch Quality] Menu Measurement Click on the [Ch Quality] button to open the Channel Quality Measurement menu. Procedure It is important to determine the quality of the channel IC, any non-linear distortions in the channel will degrade the error rate performance of the system. When channel quality measurement is performed, it executes the measurement sequence for one cycle only, i.e., there is no average measurement for channel quality.
Page 179 VEE Measurement Program Operation Measurement BER Pattern # Specifies the pattern number to be used to write the data pattern. The data pattern of the selected pattern number must be specified in the [Pattern Config.] menu in advance. Track # Specifies the track number to be tested.
Page 180 VEE Measurement Program Operation Measurement Data Rate Sweep Overview This section describes the Data Rate Sweep measurement. Data Rate Sweep measurement is used for both bit error rate and channel quality measurements. Measurement 1. To open the Data Rate Sweep menu, click on the [Data Rate Sweep] button from the Procedure BER Main menu.
Page 181 VEE Measurement Program Operation Measurement [Data Rate Sweep] BER Menu Click on [BER] button to open the BER measurement menu of the data rate sweep. [Data Rate Sweep] > [BER] Menu Set the parameters, click on each button to enter a new value. Meas.
Page 182 VEE Measurement Program Operation Measurement Stop Data Rate Specifies the stopping point of the data rate. Specifies the number of points to sweep the data rate. Step Displays the step by which data rate is incremented. This parameter is computed and updated automatically when you specify [NOP].
Page 183 VEE Measurement Program Operation Measurement [Data Rate Sweep] Ch. Quality Menu Measurement Click on [Ch Quality] button to open the BER measurement menu of the data rate Procedure sweep. [Data Rate Sweep] > [Ch Quality] Menu Set the parameters, click on each button to enter a new value. BER Pattern # Specifies the pattern number to be used for bit error rate measurement.
Page 184 VEE Measurement Program Operation Measurement NOTE To set the erase type (DC+ / DC- / AC), click on [More Config.], to open the setup menu and select the type in the [Erase Type] parameter. 3. The [More Config.], [Pattern Config], [Register Config.], [BER Config.] and [Ch Qual. Config.] buttons are added for additional configurations.
Page 185 VEE Measurement Program Operation Measurement [Bathtub] Menu Measurement 1. Click on the [Bathtub] button from the BER Main menu to open the bathtub menu. Procedure Exec. Optimize Optimizes the setup parameters in the [Optimize] menu for optimum measurement results. Optimization is required whenever you change the ‘User Data Rate’...
Page 186 VEE Measurement Program Operation Measurement Offset Range Specifies the range of the track offset sweep. The maximum range is 6[µm]. Refer to the ‘hpe5022_measureTrackProfile’ of the programming manual for details. Offset NOP Specifies the number of offset points to build the bath tub curve.
Page 187 VEE Measurement Program Operation Measurement Figure 3-113 OTC Definitions 5. Click the [Return] button to return to BER Main menu. Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 188 VEE Measurement Program Operation Measurement [747] Test Measurement 1. Click on the [747] button to open the 747 measurement menu. Procedure Exec. Optimize Optimizes the setup parameters in the [Optimize] menu for optimum measurement results. Optimization is required whenever you change the ‘Data Rate’ and ‘Endec’ parameters.
Page 189 VEE Measurement Program Operation Measurement can be set from 0[µm] min. to 6[µm] max. Adjacent Offs. Stop Specifies the stopping point of the adjacent track offset. This point is defined as the distance in [µm] between the track center and the adjacent track.
Page 190 VEE Measurement Program Operation Measurement range. The NOP range should be from 1 min. to 201 max. Refer to the “hpe5022_BER_747 Config” function of the programming manual for details. Offset Step Specifies the step by which the head is moved to measure track profile.
Page 191 VEE Measurement Program Operation Measurement [Register Sweep] Menu The measurement procedures for [Register Sweep] menu is provided in the ‘Manual Supplement’ because it is channel IC dependent. Refer to the ‘Manual Supplement’ for details. Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 192: Dcr Measurement
VEE Measurement Program Operation Measurement DCR Measurement Overview This section describes the dc resistance measurement of the head. When this measurement is performed, the head is unloaded and the spindle stops rotating. Measurement 1. To open the DCR menu, click [DCR] button from the “Others” frame of the Measure Procedure menu.
Page 193: Overwrite Measurement
VEE Measurement Program Operation Measurement Overwrite Measurement Overview This section describes the Overwrite Measurement. This measurement is performed by a spectrum analyzer. Measurement 1. To open the Overwrite Selection Menu, click [Overwrite] from the Measure menu. Procedure NOTE Before you execute this measurement, you should set an appropriate input range or execute the Auto Configuration to set the input range automatically.
Page 194 VEE Measurement Program Operation Measurement Figure 3-116 Overwrite Menu Channel Bit Rate Specifies the speed at which data bits are written on the media per second [bps]. Write Current Specifies the current applied to the write head. Sense Current Specifies the current applied to the read head. OverwriteHF Specifies the repetitive period of the HF pattern for overwrite measurement.
Page 195: Sectored Overwrite Measurement
VEE Measurement Program Operation Measurement Sectored Overwrite Measurement Overview This section describes the Sectored Overwrite Measurement. This measurement is performed by a spectrum analyzer. Measurement 1. To open the Overwrite Selection Menu, click [Overwrite] in the Measure menu. Procedure NOTE Before you execute this measurement, you should set an appropriate input range or execute the Auto Configuration to set the input range automatically.
Page 196 VEE Measurement Program Operation Measurement Figure 3-118 Sectored Overwrite Menu Channel Bit Rate Specifies the speed at which data bits are written on the media per second [bps]. Write Current Specifies the current applied to the write head. Sense Bias Specifies the sense bias applied to the read head.
Page 197: Partial Erasure Measurement
VEE Measurement Program Operation Measurement Partial Erasure Measurement Overview This section describes the Partial Erasure Measurement. This measurement is performed by a parametric module. Measurement 1. To open the Partial Erasure menu, click on the [Partial Erasure] button from the Procedure Measure menu.
Page 198 VEE Measurement Program Operation Measurement Measurement The menu shows the mean, min, max and std.deviation of the measured Partial Erasure. Display The graph displays the partial erasure result for every revolution. 4. Click on the [Return] button to return to Measure menu. Chapter 3 Artisan Technology Group - Quality Instrumentation ...
Page 199: Side Reading Measurement
VEE Measurement Program Operation Measurement Side Reading Measurement Overview This section describes the side reading measurement. This measurement is performed by a spectrum analyzer or a spectrum measurement module. Measurement 1. To open the side reading menu, click on the [Side Erase/Reading] [Side Reading] Procedure button from the Measure menu.
Page 200 VEE Measurement Program Operation Measurement Freq. Mode Specifies the setting of the measurement frequency. Select either Auto Mode or Manual Mode. If Auto is selected the measurement frequency is automatically set. If Manual is selected the frequency specified by Center Freq.
Page 201: Side Erase Measurement
VEE Measurement Program Operation Measurement Side Erase Measurement Overview This section describes the side erase measurement. This measurement is performed by a spectrum analyzer or a spectrum measurement module. Measurement 1. To open the side erase menu, click on the [Side Erase/Reading] [Sid Erase] button from Procedure the Measure menu.
Page 202 VEE Measurement Program Operation Measurement Freq. Mode Specifies the setting of the measurement frequency. Select either Auto Mode or Manual Mode. If Auto is selected the measurement frequency is automatically set. If Manual is selected the frequency specified by Center Freq.
Page 203: Track Search
VEE Measurement Program Operation Measurement Track Search Overview This section describes the track search measurement. This function allows you to write a track by one head and then read it by another head. Measurement Procedure NOTE Before the track search is performed, the toggle switch of “Measure R/W offset after head is moved”...
Page 204 VEE Measurement Program Operation Measurement Figure 3-123 Track Search Menu 2. Set the parameters, click on each button to enter a new value. Track # Specifies a track number of the start position. After the track search is done, this shows -1 and Radius/ Skew show where the track is.
Page 205 VEE Measurement Program Operation Measurement Search Pitch Specifies a pitch of the search a track. 3. Click on the [Erase] button to erase a whole specified area. 4. Click on the [Write] button to write a track at the specified start position. A data pattern, channel bit rate and write current can be set in [More Config.].
Page 206: Erase & Write
VEE Measurement Program Operation Measurement Erase & Write Overview This section performs the erase and write data independently and compensates/monitors the head position. Procedure 1. To open the Erase & Write menu, click on [Erase & Write] button from Other frame of the Measure menu.
Page 207 VEE Measurement Program Operation Measurement Radius Specifies the current position of the head radius. Click on the [Radius] button to set the position. During head unloading the [****] symbol will appear. Skew Specifies the current angular position of the head skew. Click on the [Skew] button to set the position.
Page 208 VEE Measurement Program Operation Measurement b. Click on the [Erase] or [Band Erase] button to erase a track, if necessary. c. Click on the [Write] button to wirte a data pattern. d. Click on the [Comp. Always] button to stay the read head at the center of burst pattern.
Page 209 VEE Measurement Program Operation Measurement Aperture Specifies the length of time to open the write gate. See Figure 3-128 on page 208 Pattern Start Time Specifies the starting time to write the burst pattern. See Figure 3-129 on page 208 Pattern Length Specifies the length of time to write the burst pattern.
Page 210 VEE Measurement Program Operation Measurement Position Error Monitor This function allows you to monitor the head position drift with or without the track offset compensation function. 1. Click the [Position Error] button to open the position error menu. Once the position error menu open, the state of the track offset compensation is turned on.
Page 211 VEE Measurement Program Operation Measurement Track Offset Comp. Config Opens the Track Offset Compensation Configuration menu. This menu is the same as one in the track profile measurement. See the “TAA Track Profile Menu - Track Offset Compensation Setup” on page 103 Measure Executes monitoring a head drift.
Page 212: Auto Alignment
VEE Measurement Program Operation Measurement Auto Alignment Overview Auto alignment is used to determine the center position of the spindle. Once the auto alignment is completed, the alignment data will be saved in the non volatile memory of the spinstand. This data contains each individual data of the up face and down face HGAs. See “Auto Alignment”...
Page 213 VEE Measurement Program Operation Measurement Figure 3-132 Auto Alignment Menu Start Radius Specifies the auto alignment start position of the head as radius from the spindle center [meter]. The default value is as follows: Disk Type Default Start Radius 1.8 inch 0.018 meter 2.5 inch 0.0255 meter...
Page 214 VEE Measurement Program Operation Measurement Status Message Process Rough tune Finding the skew = 0° position by searching the written track. Searching the skew = 0°, +3°, −3° positions on the Fine tune first step track and calculating the spindle center position. Fine tune at skew = 0, Searching the skew = 0, “step 1 positive”...
Page 215: Service
VEE Measurement Program Operation Measurement Service Overview The service menu allows you to evaluate the spinstand performance. Contact Agilent Technologies for information. Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 216: Exit The Vee Measurement Program
VEE Measurement Program Operation Exit the VEE measurement program Exit the VEE measurement program 1. Click on the [Quit] button from the Measure menu. A pop-up window will appear that will ask the user to store the current setting. If “yes” is selected the parameters set in the Configuration menu will be saved.
Page 217 VEE Measurement Program Operation Exit the VEE measurement program 2. Click [Yes] to end the program. Figure 3-134 End the Program Chapter 3 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 218: Configuration
Configuration This chapter provides the information about the measurement configurations of E5022/E5023. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 219: Configuration
Configuration Configuration Configuration The channel bit rate, data pattern, common setup parameters and spinstand related setups are all performed in the configuration menu. The [Setup] handles the common setup parameters while the [Spinstand] handles the spinstand related settings. Once the drive is running the spinstand related settings can not be changed.
Page 220 Configuration Configuration Precompensation Setting Menu 1. Click on [Configuration] > [Setup] > [Precomp. Config] to open the precompensation menu. Figure 4-2 Precompensation Setting Menu The Agilent E5022/E5023 can delay the write timing of the write operation when writing the data pattern. This timing delay is defined as three bits off the target bit (prebit or postbit).
Page 221 Configuration Configuration Figure 4-3 Precomp Pattern Select Menu 2. Click on [OK] to set the precompensation pattern 3. Click the [Return] button to return to setup menu. Chapter 4 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 222 Configuration Configuration Input Range Menu 1. Click on [Configuration] > [Setup] > [Input Range] button to display the input range menu. Figure 4-4 Input Range Menu Measurement Mode Specifies the type of input range setting. When “Auto Mode” is selected the input range is set automatically by the [Auto Configuration].
Page 223 Configuration Configuration Narrow Band TAA Frequency Menu 1. Click on [Configuration] > [Setup] > [Narrow Band TAA Freq.] to open the Narrow Band Setting menu. Figure 4-5 Narrow Band TAA Measurement Setting Menu Center Frequency Specifies the center frequency of the spectrum analyzer when Narrow Band TAA is measured.
Page 224 Configuration Configuration Head Amplifier Information File Menu 1. Click on [Configuration] > [Setup] > [Head Amp Info File] to open Head Amp Info File menu. Generally, the system detects which head amplifier is installed automatically because it refers the information in the EEPROM in the head amplifier and reads the corresponding information file under the system software directory.
Page 225 Head Amplifier Configuration Menu The head amplifier configuration menu depends on the installed E5035. • When the system has the E5035A: 1. Click on [Configuration] > [Setup] >[Head Amp Config.] to open the head amplifier configuration menu. When the property of the installed head amplifier is supported by the DLL, the [Head Amp Setup] menu will pop up.
Page 226 When the property of the installed head amplifier is not supported by the DLL, only the parts number and serial number will be displayed. Figure 4-8 [Head Amp Config.] Menu (E5035A) • When the system has the E5035B: 1. Click on [Configuration] > [Setup] >[Head Amp Config.] to open the head amplifier configuration menu.
Page 227 Configuration Configuration Figure 4-9 [Head Amp Config.] Menu (E5035B) Chapter 4 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 228 Configuration Configuration Spectrum Analyzer Display 1. Click on [Configuration] > [Setup] > [Spectrum Analyzer Display] to open the spectrum analyzer display setting. This parameter allows you to view the waveform on the screen of the spectrum analyzer. This parameter is set to [ON] when the spectrum analyzer is used manually.
Page 229 Configuration Configuration Positioner Configuration 1. Click on [Configuration] > [Setup] > [Positioner Config] to open the menu about the head positioning. Figure 4-11 Positioner Configuration Menu Positioning Speed Specifies a velocity of the head movement by the coarse stage. The head movement speeds at not only on-media but also off-media (movement between the loading/unloading and the home positions) are changed.
Page 230: Spinstand Configuration Menu
Configuration Configuration Figure 4-12 Configuration Menu Spinstand Configuration Menu 1. Click on [Configuration] > [Spinstand] to open the Spinstand menu. Figure 4-13 Spinstand Menu Chapter 4 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 231 Configuration Configuration The track boundary is specified in the Data Area frame. See “Data Area” on page 314. ID Radius Specifies the radius from the center of the disk to the innermost track. OD Radius Shows the radius from the center of the disk to the outermost track.
Page 232 Configuration Configuration Head Load Frame, head loading configuration is set by the parameters below. Load Type Specifies the type of loading as Normal, Ramp and Tilt. The Ramp allows you to use the ramp load wich is available with the E5010C/E5013A Option 320.
Page 233 Configuration Configuration The [Advanced] menu in the “Head Load Frame” allows the user to set the rpm speed different for head loading and head unloading. Click this button to open the ‘Advanced Head Load Configuration’ menu. Figure 4-15 Advanced Head Load Configuration menu The [Load Radius] and [Load Mode] parameters specified in the [Spinstand] menu will automatically update similar parameters in this menu.
Page 234 Configuration Configuration Unload Mode Specifies the type of head unloading. Select either Dynamic, Static or Change RPM. [Dynamic] is when the spindle rotation is continuous as the head unloads. [Static] is when the spindle rotation stops as the head unloads. [Change RPM] allows you to specify the spindle speed rpm independent from the load mode.
Page 235 Configuration Configuration Figure 4-16 Pivot to Center and Pivot to Gap setting menu Pivot to Center Specifies the distance between the pivot and the center of the spindle. Pivot Gap Specifies the distance between the pivot and the reference point of the HGA. Figure 4-17 Skew and Radius setting display Chapter 4...
Page 236 Configuration Configuration Radius 1 Radius that can be defined optionally at any point within the data area of the media. Radius 2 Radius that can be defined optionally at any point within the data area of the media. Skew 1 Specifies the head skew angle relative to Radius 1.
Page 237 Configuration Configuration Chapter 4 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 238: Measurement Definition
Measurement Definition This chapter provides the definition of the Agilent E5022/E5023 measurements. The Agilent E5022/E5023 is provided with a set of Windows Dynamic Link Libraries (DLLs) and a demo program written in VEE that calls these DLLs. The DLL syntax is in the Programming Manual.
Page 239: Measurement Parameters
Measurement Definition Measurement Parameters Measurement Parameters The Agilent E5022/E5023 can measure various parameters related to the disk - head interface of a hard disk. The measurement parameters are listed in the first row of Table . Track Average Amplitude (TAA), Pulse Width (PW) and Baseline (BL) can be measured by either the parametric module or an oscilloscope.
Page 240 Measurement Definition Measurement Parameters Measurement Parameter versus Sweep Parameter Sweep Parameter Other Meas. Inst. Parameter Track Write Sense Channel Rolloff Stability Profile Current Current Bit Rate compensation NLTS by Time Correlation NLTS by Dipulse Extraction Spectral Spectrum √ √ √ Overwrite Partial Erasure...
Page 241: Measurement Parameter Definition
Measurement Definition Measurement Parameter Definition Measurement Parameter Definition This section provides the parameter definitions for measurements. The TAA, PW, Baseline and Resolution parameters can be measured by a parametric module or an oscilloscope. There is a slight difference in measurement definition between the two. TAA Measurement The TAA is defined as the average peak-to-peak amplitude measurement for a period.
Page 242 Measurement Definition Measurement Parameter Definition Equation 5-3 Modulation Positive Definition Ð RawDataMax Modulation -------------------------------------------------------- - Equation 5-4 Modulation Negative Definition Ð RawDataMin Modulation -------------------------------------------------------- Figure 5-1 TAA Measurement Definition When the parametric module is used for TAA measurement, the module requires a rough pulse width value to measure the TAA.
Page 243: Pw (Pulse Width) Measurement
Measurement Definition Measurement Parameter Definition PW (Pulse Width) Measurement PW is defined as the average of the widths for a number of positive and negative pulses. It is formed at a specific voltage level of the readback pulse. The Agilent E5022/E5023 measures it and averages PW for several periods.
Page 244 Measurement Definition Measurement Parameter Definition Figure 5-3 Fixed mode PW Measurement Definition The PW Asymmetry is defined as follows: Equation 5-5 PW Asymmetry Definition Ð positive negative ---------------------------------------------------------- Asymmetry positive negative Chapter 5 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 245: Baseline Measurement
Measurement Definition Measurement Parameter Definition Baseline Measurement Baseline positive (baseline+) is the amplitude half way between a positive peak and a negative peak. Baseline negative (baseline-) is the amplitude measured half way between a negative peak and a positive peak. Baseline is the average amplitude level between baseline+ and baseline-.
Page 246 Measurement Definition Measurement Parameter Definition Figure 5-5 Baseline Measurement Definition using the Parametric Module Chapter 5 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 247: Resolution Measurement
Measurement Definition Measurement Parameter Definition At default setting, point C is centered between points A and B. It can be changed using the “hpe5022_baselineSamplingPhase” function. As shown in Figure 5-6, points C, A and B are defined as 0 degree, -90 degrees and 90 degrees, respectively for this function. The value specified by the “hpe5022_baselineSamplingPhase”...
Page 248: Time Asymmetry Measurement
Measurement Definition Measurement Parameter Definition 1. Erase the track as specified by the “hpe5022_erase” function. 2. Write HF (high frequency) data pattern given by the function “hpe5022_hfPattern”. 3. Measure the HF-TAA. 4. Erase the track as specified by the “hpe5022_erase” function. 5.
Page 249: Narrow Band Taa Measurement
Measurement Definition Measurement Parameter Definition • Ts denotes the time distance from negative peak transition to positive peak transition (n-p). • N denotes the number of transitions to be averaged. Time Asymmetry is also used in measuring the hard transition shift (HTS) based on the timing difference between the positive and negative peaks of the low frequency signal written on the magnetic medium after the medium was DC erased.
Page 250 Measurement Definition Measurement Parameter Definition Figure 5-8 Read-write iteration in each segment (sector) The length of write and read in each sector can be specified by the write ratio and read ratio parameters. The portion named “I” is defined as an idle section or delay time. Figure 5-9 Write/Read Ratios The illustration above shows the partition of the write ratio, read ratio and idle in a single...
Page 251 Measurement Definition Measurement Parameter Definition Stability Measurement by Absolute Time The objective of this test is to evaluate head instability by measuring the TAA, TAA Asymmetry etc. in terms of absolute time. This test allows the user to set up the write and read operation in each segment (sector) as a function of absolute time so that test results can be closely correlated similar to popcorn noise test.
Page 252 Measurement Definition Measurement Parameter Definition Equation 5-8 Segment ----------------------------------------- - Segment × RPM SegTime Equation 5-9 Revolution Counts --------------------- - Segment Equation 5-10 Counts × Counts Rev Segment NOTE There is a gate timing restrictions that the user must compensate when the spindle speed (RPM) is set up.
Page 253: Waveform Analysis Measurement
Measurement Definition Measurement Parameter Definition Waveform Analysis Measurement The Waveform Analysis measurement requires the use of an oscilloscope in order to evaluate the waveform characteristics of the read signal. It measures the standard TAA, PW50 and Baseline parameters. This measurement is a graphical plot of the read TAA voltage vs. time as observed through an oscilloscope.
Page 254 Measurement Definition Measurement Parameter Definition PW positive is measured as the average pulse width at 50% of the positive TAA signal. While PW negative is measured as the average pulse width at 50% of the negative TAA signal. PW Asymmetry is defined by Equation 5-12. Another important parameter in the analysis of waveform is the measurement of baseline.
Page 255: Absolute Polarity Test
Measurement Definition Measurement Parameter Definition Absolute Polarity Test The absolute polarity test is used to detect the pinned layer reversal of the GMR head. When pinned layer reversal occurs the polarity of the read pulse reverses indicating a damaged head. TAA measurement of the 1-3 bit data pattern (i.e. combined pattern of isolated pulse and tribit pulses) is the simplest way of detecting pinned layer reversal.
Page 256 Measurement Definition Measurement Parameter Definition Figure 5-13 Normal Pinned Layer There are two conditions in determining the pinned layer reversal, namely, ‘normal pinned layer’ and ‘pinned layer reversal’. For normal pinned layer, if the output pulse satisfies the condition in Figure 5-13 then pinned layer is normal. Equation 5-13 Condition for Normal Pinned Layer ...
Page 257 Measurement Definition Measurement Parameter Definition Figure 5-14 Pinned Layer Reversal with Symmetrical TAA Equation 5-14 Condition for Pinned Layer Reversal with Symmetrical TAA     triTAA + triTAA Ð < ---------------------------- -----------------------------     isoTAA + isoTAA Ð...
Page 258 Measurement Definition Measurement Parameter Definition Figure 5-15 Pinned Layer Reversal with Asymmetrical TAA In another case similar to Equation 5-14, even if TAA is asymmetrical, the inequality of pinned layer reversal never changes since triTAA- is always the same as isoTAA- and triTAA+ is always smaller than isoTAA+.
Page 259 Measurement Definition Measurement Parameter Definition Equation 5-15 Absolute Polarity     triTAA + triTAA Ð ---------------------------- ----------------------------- Ð     isoTAA + isoTAA Ð ---------------------------------------------------------------------------- - AbsPol     triTAA + triTAA Ð ---------------------------- ----------------------------- ...
Page 260: Nlts Measurement
Measurement Definition Measurement Parameter Definition NLTS Measurement Agilent E5022/E5023 has three methods of measuring Non Linear Transition Shift (NLTS). Ideally the location of the transitions when the track is read is where they were written. But in actual case the location of the transitions changes since it is influenced by its neighboring transitions i.e.
Page 261 Measurement Definition Measurement Parameter Definition SNR Definition The Agilent E5022/E5023 uses several periods of the waveform, when averaging factor is specified, SNR will be defined as: Equation 5-17 SNR Calculation Formula Ð r V t ( ) V t ∑ ------------- - -------------------------------------------------------- - r V t ( ) V t...
Page 262: Signal To Noise Ratio (Snr)
Measurement Definition Measurement Parameter Definition Equation 5-20 Correlation Calculation Formula ∫ V t ( )V t ) t d V t ( )V t ------ - Ð r V t ( ) V t ---------------------------------------------------------------------------------------------------------------------------- V t ( ) V t ( ) Ð...
Page 263: Spectral Snr (Snr Measurement By A Spectrum Analyzer)
Measurement Definition Measurement Parameter Definition The detailed measurement sequence is described in Chapter 3 of the programming manual. Spectral SNR (SNR measurement by a spectrum analyzer) The spectrum analyzer is a convenient tool in measuring noise media. Spectral SNR is the ratio between the narrow band TAA amplitude level and the noise signal measured in ‘rms’...
Page 264 Measurement Definition Measurement Parameter Definition Figure 5-16 Counting Popcorn Noise In order to trigger a count, the input signal must cross both the threshold level and the lower limit of the hysteresis window at points a and b. If the lower peak of the input signal does not cross the lower limit of the hysteresis window, this will not trigger a count even if the next peak amplitude crosses over the threshold level at point c.
Page 265: Bit Error Test
Measurement Definition Measurement Parameter Definition Bit Error Test System of Read The Agilent E5039A/B/C is a Bit Error Rate Test Module designed to allow users to Channel IC measure the bit error rate characteristics of the head and media with a customer specified read channel IC.
Page 266 Measurement Definition Measurement Parameter Definition by the read channel IC’s detector. Filter equalization modifies the data sample so that they cluster around the target values, zero, positive and negative value. The length of time delay (tap) determines the impulse response of the equalizer. The output signal of the analog filter is quantized using an ADC (analog to digital converter), the digitized data is then equalized for partial response.
Page 267 Measurement Definition Measurement Parameter Definition On-Track BER Measurement BER Measurement A unique characteristic of the Agilent E5039A/B/C BER Test Module is that it detects the Feature in E5022A number of errors in terms of bytes, such that the user must specify the number of error bits to be counted per byte in order to compute the system’s bit error rate (BER) performance.
Page 268 Measurement Definition Measurement Parameter Definition Bathtub Measurement This test is done by optimizing the BER at the track center then moving a small step and optimizing and measuring BER. This is done towards the ID (inner diameter) then back to the track center and again towards the OD (outer diameter).
Page 269 Measurement Definition Measurement Parameter Definition Analysis of the 747 Test The purpose of the 747 test is to determine the off-track capability of the magnetic recording system. The off-track capability helps us to know how close tracks of information can be written on a magnetic media without picking up the interference signal of its adjacent track.
Page 270 Measurement Definition Measurement Parameter Definition 1. When an adjacent track is far, only noise from the media and the written old data limit the off-track capability. So the affordable off-track is relatively constant as shown above. Figure 5-23 The adjacent track is written next to the data track. 2.
Page 271 Measurement Definition Measurement Parameter Definition Figure 5-25 Characteristic curve of the 747 test Figure 5-25 shows how much off-track (OTC) can be afforded between the data track and the read head for a fixed error rate level for a specific distance to an adjacent track. The 747 test is an excellent test to determine the optimum number of tracks per inch.
Page 272: Shnr (Sub-Harmonic Noise Ratio)
Measurement Definition Measurement Parameter Definition SHNR (Sub-Harmonic Noise Ratio) The SHNR measurement is closely tied with baseline popping measurement. This test is used to detect baseline popping of MR/GMR heads by measuring the sub-harmonics noise ratio. In general, some form of biasing is applied to the MR element in order to achieve linearity of the output signal.
Page 273 Measurement Definition Measurement Parameter Definition In measuring SHNR, the noise reference and signal (i.e, Narrow Band TAA) is measured by the spectrum analyzer at the frequency specified by “hpe5022_shnrConfig” function. At various frequencies the amplitude of the signal will vary over time. In general, SHNR is measured at low frequency where signal to noise ratio is poor.
Page 274 Measurement Definition Measurement Parameter Definition 16. Calculate the average TAA = Sum_TAA/ n 17. Next sense current go to step 8. 18. Next read offset go to step 7. 19. For ib_index = 0 to (ib_points-1) 20. Calculate the SHNR data as; SHNR_DATA(ib_index) = 20log (Max (Aver_TAA[ib_index]) / Noise_Ref[ib_index]) Equation 5-25 Calculation of SHNR...
Page 275: Track Offset Compensation Function
Measurement Definition Measurement Parameter Definition Track Offset Compensation Function The track offset compensation function compensates the read head position according to the read back signal from the burst patterns. Even if the read head position drifts from the center of the write position due to temperature changes, long period elapses and etc. this function locates the read head at the center of write position.
Page 276 Measurement Definition Measurement Parameter Definition calibration and the write burst pattern sequences are performed by the hpe5022_writetrackOffsetCompPattern” function. “ Figure 5-29 Calibration Sequence Write Burst Pattern Write Burst Pattern sequence writes the burst patterns in the first portion of the track. The data pattern will be written after the burst pattern later during the measurement sequence such as hpe5022_measureTAA.
Page 277 Measurement Definition Measurement Parameter Definition hpe5022_writetrackOffsetCompPattern” function. are performed by the “ The burst pattern is defined by a write offset, an aperture time and a pattern frequency. These three parameters can be set by users. Also, the function allows you to set these parameters automatically.
Page 278 Measurement Definition Measurement Parameter Definition if their interval is too long. Read Burst Pattern Read Burst Pattern sequence reads the burst pattern and calculate the PES from the read-back signal. As shown in Figure 5-32, the read back signals from the patterns A and B are monitored and calculates the PES value.
Page 279 Measurement Definition Measurement Parameter Definition center are shifted by this compensation as shown in Figure 5-33. For example, when the position compensation is set at +2µm, the track center is shifted by +2µm. This means that the origin of all tracks was shifted. When the position compensation is set, the travel range of track offset is also changed.
Page 280 Measurement Definition Measurement Parameter Definition Sample sequences of track offset compensation function is shown in Figure 5-33. In the track profile measurement in the VEE measurement program, the head position is compensated just once before the sequences of writing and reading a data pattern. In the sample program shown in the programming manual, the sequences of reading burst pattern and setting the head offset compensation are performed each 10 revolution during measuring TAA parameters.
Page 281 Measurement Definition Measurement Parameter Definition Figure 5-34 Track Offset Compensation Sequence Flow Track Offset Compensation in Create Micro Track and Bit Error Test The create micro track and the bit error test take a quite long time to measure and a head position is inclined to drift during a measurement sequence.
Page 282 Measurement Definition Measurement Parameter Definition sequence in the create micro track and the bit error test. In the create micro track, the head position is compensated before erasing a positive side edge when the track offset compensation state is turned on. See the programming manual for detailed sequence.
Page 283: Write Bursts Function
Measurement Definition Measurement Parameter Definition Write Bursts Function The Write Bursts Function allows users to write a burst pattern. This function only writes burst patterns. It has no capability to compensate the position. When you want to compensate the position, see “Track Offset Compensation Function” on page 274. This function will only allow one burst pattern to be written for each track rotation.
Page 284 Measurement Definition Measurement Parameter Definition 5. Set the frequency at which burst pattern is written using “hpe5022_burstFrequencyConfig” function. 6. Write the burst pattern by executing “hpe5022_writeBurst” function. 7. Repeat steps 2 to 6 and change the parameters (i.e. burst start, gate delay etc.) for multi-burst pattern.
Page 285: Parametric Sweep Measurement Definitions
Measurement Definition Parametric Sweep Measurement Definitions Parametric Sweep Measurement Definitions Track Profile Measurement Track Profile is a graphical plot of the read head voltage as a function of the read head position on a written track. It is also used to observe the TAA, PW and Narrow Band TAA. The Agilent E5022/E5023 allows you to select forward, backward or both directions for head displacement.
Page 286 Measurement Definition Parametric Sweep Measurement Definitions Figure 5-37 Write Head Width Definition The output signal remains constant until the center of the head offsets from the center of the test track by 1/2 (Write - Read ), this serves as protection against any track width width misregistration of this magnitude, also called “guard bands”.
Page 287: Micro Track Profile Measurement
Measurement Definition Parametric Sweep Measurement Definitions width and the track center, as shown in Figure 5-38. The track center is defined as the position of the head during write sequence. Figure 5-39 Track Geometry General Definition of Track Geometry is as follows: •...
Page 288 Measurement Definition Parametric Sweep Measurement Definitions Measurement procedure is as follows: This measurement is divided into two parts. The first part is to create a micro track and the second part is to measure the track profile of the micro track. Create Micro Track Micro track is created by erasing both sides of the track as shown in Figure 5-40, resulting to a narrowed track.
Page 289 Measurement Definition Parametric Sweep Measurement Definitions Figure 5-41 Parameters to create a Micro Track Chapter 5 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 290: Fast Micro Track Profile Measurement
Measurement Definition Parametric Sweep Measurement Definitions Track Profile Measurement for a Micro Track (Micro Track Profile) Measuring the track profile relative to micro track will allow you to compute the read head width, as shown in Figure 5-42. From the illustration above the half amplitude width of the micro track becomes the width of the read head.
Page 291: Write Current Sweep Measurement
Measurement Definition Parametric Sweep Measurement Definitions Write Current Sweep Measurement Write current sweep is a measurement of the TAA, narrow band TAA, PW, Overwrite and NLTS by 5th Harmonic method. The typical shape of this curve is a flat part at low currents, i.e.
Page 292: Sense Current Sweep Measurement
Measurement Definition Parametric Sweep Measurement Definitions Sense Current Sweep Measurement Sense current sweep is a measurement of the TAA, narrow band TAA, PW, Overwrite and NLTS by 5th Harmonic method. In theory the sense current head curve would be very similar to the write current curve.
Page 293: Precompensation Sweep Measurement
Measurement Definition Parametric Sweep Measurement Definitions optimized current. The sequence pattern is then read and zero-to-peak voltage is measured. This process is repeated for higher density of the same pattern until the voltage signal becomes too small. The detailed measurement sequence is described in Chapter 3 of the programming manual. Precompensation Sweep Measurement Precompensation Sweep is a measurement to observe the special characteristics of NLTS by 5th harmonic method for sweep values of write precompensation.
Page 294: Standard Triple Track Test
Measurement Definition Parametric Sweep Measurement Definitions Standard Triple Track Test The Standard Tripe Track Test is used to measure the write width, read width, write-read offset, squash, squeeze and off-track read capability (OTRC) parameters of the written signal. This test performs the track profile as it measures the effect on how adjacent tracks and erased signals interfere with one another.
Page 295 Measurement Definition Parametric Sweep Measurement Definitions 7. Measure the distance between the center of the track (i.e, at zero offset) and the center of the write track width. And denote the measured distance as read/write offset (RW offset). Figure 5-46 Measurement of Read Write Offset 8.
Page 296 Measurement Definition Parametric Sweep Measurement Definitions TrackConfig) at the squeeze position on each side of the test track. 11. Measure TAA (or Narrow Band TAA) at the same point where the maximum TAA was previously measured. Calculate squash as the ratio of the TAA squash and TAAmax. The remaining TAA signal is measured as percentage of the original track amplitude referred to as squash.
Page 297 Measurement Definition Parametric Sweep Measurement Definitions Figure 5-49 Measurement of OTRC 14. Measure the distance between the two interpolations at the 0% threshold. And calculate half the difference as OTRC (off-track read capability). As shown in Figure 5-49 the the allowable OTRC is affected on how close the data tracks are written closer to the adjacent track.
Page 298: Snr Triple Track Test
Measurement Definition Parametric Sweep Measurement Definitions SNR Triple Track Test The SNR Tripe Track Test is used to evaluate the OTRC (unsqueezed OTRC) and squeezed OTRC using both the signal and off-track noise at each test point. Measurement procedure of the SNR Triple Track Test is as follows: Note: In this description, data name with [ ] shows that the data type is an array.
Page 299 Measurement Definition Parametric Sweep Measurement Definitions Data2[ ] OTRC Signal[ ] = NoiseFloor d. Normalize “OTRC Signal[ ]” as the maximum and minimum values of “OTRC Signal[ ]” are converted to 1 and 0 respectively. The obtained data is called “Normalized OTRC Signal[ ].”...
Page 300 Measurement Definition Parametric Sweep Measurement Definitions Signal[ ]” are converted to 1 and 0 respectively. The obtained data is called “Normalized Squeezed Noise[ ].” 8. “OTRC SNR[ ]” and “Squeezed SNR[ ]” Calculation, and “OTRC (Unsqueezed OTRC)” and “Squeezed OTRC” Calculation a.
Page 301 Measurement Definition Parametric Sweep Measurement Definitions Figure 5-50 OTRC (Unsqueezed OTRC) Evaluation d. Calculate “Squeezed OTRC” value from “Squeezed SNR[ ]” profile (see Figure 5-51). Figure 5-51 Squeezed OTRC Evaluation 9. “WW,” “RW,” “RW Offset,” and “Squash” Evaluation a. For the “Normalized OTRC Signal,” specify the interpolation range which includes the threshold and window size settings.
Page 302 Measurement Definition Parametric Sweep Measurement Definitions Figure 5-52 Evaluation of Write Track Width and Read Track Width d. Calculate the distance between the center of the track (i.e, at zero offset) and the center of the write track width. And denote the measured distance as “Read/Write Offset (RW offset).”...
Page 303 Measurement Definition Parametric Sweep Measurement Definitions Gaussian Noise Level Calculation Method If a track profile data array and noise threshold ratio are described as “profileData[ ]” and “noiseThr” respectively, the Gaussian noise level (“gaussianNoiseLevel”) is calculated as follows: 1. Obtain maximum value (“max”) and minimum value (“min”) of “profileData[ ].” 2.
Page 304: Baseline Popping
Measurement Definition Parametric Sweep Measurement Definitions Baseline Popping is defined as the voltage level measured by the first value of the read current erase specified from the read current list when the track has been dc erased. V is defined as the voltage level measured by changing the read current from the list.
Page 305: Other Measurement Definitions
Measurement Definition Other Measurement Definitions Other Measurement Definitions Overwrite Measurement When old data is overwritten with new data, remnants of previous transitions remain. They are not completely erased. The overwrite measurement measures the overwrite ratio of a new data signal with respect to the residual signal from the data previously recorded on the disk.
Page 306: Partial Erasure Measurement
Measurement Definition Other Measurement Definitions Partial Erasure Measurement Partial Erasure is also referred to as ‘nonlinear amplitude loss’ that occurs at high recording densities when two transitions (dibit) are written closely with a narrow separation, resulting to amplitude loss of the read back signal when data is read. As shown in Figure 5-54, isolated transition 1 is written with a typical zigzag structure and is isolated from other transitions.
Page 307 Measurement Definition Other Measurement Definitions transition shifts or NLTS’. It cannot be precompensated i.e., partial error is severe limitation of the magnetic recording. Chapter 5 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 308: Data Pattern
Measurement Definition Data Pattern Data Pattern The Square Waveform pattern, 5th Harmonic NLTS pattern and Pseudo Random Bit sequence have been provided for Agilent E5022/E5023. For a square waveform there are six data patterns namely, the HF, LF, Isolated Pulse, Repetitive, Overwrite HF and Overwrite LF pattern.
Page 309: Input Range Control & Auto Configuration
Measurement Definition Input Range Control & Auto Configuration Input Range Control & Auto Configuration The Agilent E5022/E5023 requires an approximate level of the input signal in order to set the input range. This is because it does not dynamically auto range. Also, when parametric module is used for parametric measurement the input signal of the pulse width (PW) must be specified.
Page 310 Measurement Definition Input Range Control & Auto Configuration Figure 5-55 Relation between Input Range & Auto Configuration Functions Chapter 5 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 311: Drive Setup/Control
Measurement Definition Drive Setup/Control Drive Setup/Control This section explains how the spindle and head are setup and controlled. The setup specifies the necessary parameters to be set until the drive is on (i.e. the spindle is running and the head is loaded). Control, on the other hand specifies the parameters after the drive is on (i.e.
Page 312 Measurement Definition Drive Setup/Control Figure 5-57 Drive Configuration Parameters (Radius, Skew Angle) Computation of Skew Equations for solving Skew Angle An equation must be established that will show the relationship of these parameters in determining skew angle with respect to radius. The radius between spindle center and reference point.
Page 313 Measurement Definition Drive Setup/Control Figure 5-58 Relationship of each parameter in solving skew angle Assuming that pivot to center (PC), pivot to gap (PG) and the radius (r) are known parameters, by applying the Law of Cosine in solving triangles we will be able to establish the following equations.
Page 314 Measurement Definition Drive Setup/Control Simplifying equation 4-18, will give us the general equation in determining skew. Equation 5-32 Definition of Skew   Ð   -------------------------------------------- skew asin 2rPG   By substituting the known quantities of PC, PG and radius (r) in equation 4-19 you will be able to determine the skew angle.
Page 315 Measurement Definition Drive Setup/Control Agilent Cassette Part Number The Agilent E5022/E5023 contains the information of the dimension of the Agilent cassette, this is to prevent the head and the cassette from bumping into the spindle. Enter the down head’s Agilent part number of the HGA cassette to be used. If an upper face of the head is to be used then enter its corresponding Agilent part number.
Page 316: Drive Control
Measurement Definition Drive Setup/Control Figure 5-61 Data Area Head Loading Configuration Head loading configuration is done when you set the rotation of the spindle either to stop its rotation or allow it to continue when the head moves to its initial track number to load or unload.
Page 317 Measurement Definition Drive Setup/Control Drive ON/OFF Disk clamping, rotation of the spindle and head loading are all performed during the Drive ON state. While the Drive OFF performs the head unloading, stops the spindle rotation, unclamps the disk and moves the head to the home position. Parameters can be set by the “hpe5022_driveState”...
Page 318: Auto Alignment
Measurement Definition Auto Alignment Auto Alignment Auto alignment is a process to determine the X and Y coordinates of the spindle center based on an actual written data track evaluation. The spindle center coordinates are important because it is the reference position when the spinstand places the head on a specific location on the media.
Page 319 Measurement Definition Auto Alignment Figure 5-62 Auto Alignment Algorithm NOTE Available setup ranges for positive skew angles (“step 1 positive” and “step 2 positive”) and negative skew angles (“step 1 negative” and “step 2 negative”) are 3.0 to 30.0 and −3.0 to −60.0 respectively.
Page 320: Spindle Center Calculation
Measurement Definition Auto Alignment Spindle Center Calculation The calculation of the spindle center coordinates in the above steps 3 to 5 is based on the following concept: Figure 5-63 X-Y Coordinates of Spindle Center As shown in the illustration above, determining the spindle center in terms of X-Y coordinates requires three conditions to be satisfied (i.e, three known arbitrary points where the circle passes through) in order to measure the alignment data.
Page 321 Measurement Definition Auto Alignment Chapter 5 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 322: Specifications
Specifications This chapter describes the specifications of Agilent E5022/E5023 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 323: E5022A/B Specifications
E5022A/B Specifications E5022A/B Specifications These specifications are the performance standards or limits against which the system is tested. NOTE E5022A/B, E5035A, E5037A/B, E5038A and E5039A are obsolete products. Write Characteristics Table 6-1 Data Clock: 1 kbps resolution, Arbitrary patterns E5037A: 50 Mbps to 600 Mbps (750 Mbps, Opt. 002)
Page 324: Bit Error Measurement (Agilent E5039A)
Specifications E5022A/B Specifications Table 6-3 Filters: Four selectable filters Bit Error Measurement (Agilent E5039A) Table 6-4 Data Rate: 50 Mbps to 800 Mbps (depends on the Data Rate of a PRML chip) Input Level: < 400 mVp-p (isolated pulse) Reference Clock: 1M to 100 MHz (TTL Level) Measurement Data: 128 kByte (max) / Segment...
Page 325: Measurement Functions
Specifications E5022A/B Specifications Physical Specifications: Table 6-7 Size: 600 mm(W) ×760 mm(D) × 1020 mm(H) Spinstand : Weight: About 300 kg 600 mm(W) × 905 mm(D) × 1600 mm(H) or Measurement bay : 2000 mm(H) about 2 m × 1.5 m Necessary working space : Measurement Functions DC Resistance Measurement...
Page 326 Specifications E5022A/B Specifications Table 6-10 Measurement Range: 3 nsec to 30 nsec Data Pattern: Isolated Pulse Range of PW% (PWxx): PW20 to PW80 ±10 % of reading + 150 psec Absolute Measurement Accuracy: ±5 % + 150 psec (typical) BL (Baseline) Measurement Table 6-11 Parameters: Baseline+, Baseline-, Average,...
Page 327 Specifications E5022A/B Specifications Spectral SNR Measurement Table 6-16 Parameters: S/N (dB) [Signal / rms Noise (dB)] Spectrum Measurement Table 6-17 Parameters: Power (dBm) Sub Harmonic Noise Ratio Measurement Table 6-18 Parameters: SHNR (dB) Parameter Sweep Measurements Table 6-19 Write Current Sweep TAA, NB-TAA, PW, BL, Overwrite, NLTS (Write Current Saturation): Sense Current Sweep...
Page 328 Specifications E5022A/B Specifications Micro Track Profile Measurement Table 6-21 Measurement Parameters: Read track width, Write track width Stability Measurement (TAA cov, PW cov) Table 6-22 Number of Segment per one track: 1 to 80 segments (Maximum number of segment s per one track depends on Write/Read time settings and spindle rotation speed.) Total Segments: 1 to 1000 segments...
Page 329 Specifications E5022A/B Specifications Table 6-25 S/N ratio by auto correlation method Measurements using the Agilent E5039A Bit Error Test Module • OTC Measurement • 747 Measurement • Channel Resister Sweep Measurement • Channel Quality Monitor Function • Automatic Channel Optimization Function Chapter 6 Artisan Technology Group - Quality Instrumentation ...
Page 330: E5023A Specifications
Specifications E5023A Specifications E5023A Specifications These specifications are the performance standards or limits against which the system is tested. NOTE E5043B and E5039B are obsolete products. Write Characteristics Table 6-26 (Option 415: E5037C 1.5 Gbps Data Generator Module + E5043A/B, Option 426: E5037D 2.6 Gbps Data Generator Module + E5043C) E5023A-415 (1.5 Gbps Data Rate Option) Channel Bit...
Page 331: Bit Error Measurement
Specifications E5023A Specifications Table 6-27 (E5036A Filter Matrix Module) Filters: Four selectable filters Bit Error Measurement Table 6-28 (E5039B Bit Error Rate Measurement Module) (Optional) Data Rate: 50 Mbps to 1.2 Gbps (depends on the Data Rate of a PRML chip) Input Level: <...
Page 332: General Information
Specifications E5023A Specifications General Information (Please refer to the “Site Preparation Guide” for more details) Warm-up Time Table 6-30 Warm-up Time: 30 min. Operating Temperature and Humidity: Table 6-31 Temperature: 23 ± 5 C° Humidity 15% to 80% RH, Non-condensation Power Requirements: Table 6-32 Number of plugs :...
Page 333 Specifications E5023A Specifications Table 6-34 Absolute Measurement Accuracy: For sinusoidal wave @Agilent E5038B input ±6 % @ <600 MHz, ±4 % (typical) ±7 % @ 600 to 750 MHz For any waveform @Agilent E5038B input ±5 % (typical) Narrow Band TAA Measurement Table 6-35 Parameters: Amplitude of the basic frequency contents of the...
Page 334 Specifications E5023A Specifications Table 6-38 ±10 % (Typical) Accuracy: NLTS Measurement: 5’th Harmonics Table 6-39 ×100 (%)] Parameters: NLTS (%) [Level /Level test reference ±2 % Accuracy: Overwrite Measurement Table 6-40 Parameters: Overwrite (dB) [(Level /Level ) dB] ±0.2 dB Accuracy: SNR (Signal To Noise Ratio) Measurement Table 6-41...
Page 335 Specifications E5023A Specifications Table 6-45 Sense Current Sweep TAA, NB-TAA, PW, BL, Overwrite, NLTS (MR Bias Saturation): Write Frequency Sweep Roll Off (Roll-off, Channel Bit Rate Sweep): TAA, NB-TAA Channel Bit Rate Sweep TAA, NB-TAA, PW, Overwrite, NLTS Write Pre-compensation Sweep NLTS (only 1 level): Head Position Sweep...
Page 336 Specifications E5023A Specifications Popcorn Noise Measurement Table 6-49 Number of Segment per one track: 1 to 100 segments (Maximum number of segment s per one track depends on Write/Read time settings and spindle rotation speed.) Total Segments: 1 to 10,000 segments Parameters E5038A: Histogram by 20 MHz sampling E5041A: Error Counts...
Page 337: E5010B Spinstand Specifications
Specifications E5010B Spinstand Specifications E5010B Spinstand Specifications NOTE E5010B is the obsolete product. X-Y Stage (Coarse Positioning Stage): Table 6-52 Stage Type: Air Bearing, dual axis stage with vacuum lock down feature 140 mm × 100 mm (5.5" × 4") Stage Travel : 100nm (4 µ") Linear Scale Resolution:...
Page 338: Air Supply Requirements
Specifications E5010B Spinstand Specifications Table 6-54 Motor: Brushless DC, programmable Air Supply Requirements: Table 6-55 Pressure : 724 kPa (min), 827kPa (max) (105psi (min), 120psi (max)) Flow : s ⁄ 0.00048 (1.02scfm) (min) Vacuum Requirements: Table 6-56 Pressure : -70 kPa (min) (-20.5 inHg) Flow: s ⁄...
Page 339: E5010C Spinstand Specifications
Specifications E5010C Spinstand Specifications E5010C Spinstand Specifications NOTE E5010C is the obsolete product. X-Y Stage (Coarse Positioning Stage): Table 6-57 Stage Type: Air Bearing, dual axis stage with vacuum lock down feature 140 mm × 100 mm (5.5" × 4") Stage Travel : 100 nm (4 µ") Linear Scale Resolution:...
Page 340: Operating Temperature And Humidity
Specifications E5010C Spinstand Specifications Operating Temperature and Humidity: Table 6-60 Temperature: 23 ± 5 C° Humidity 15% to 80% RH, Non-condensation Power Requirements: Table 6-61 Number of plugs : 2 (Spinstand and Fan on the Cover) Voltage : 100/120/220/230/240 V ± 10% Frequency : 50/60 Hz Air Supply Requirements:...
Page 341 Specifications E5010C Spinstand Specifications Chapter 6 Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 342: Manual Changes
Manual Changes This appendix contains the information on the updated firmware versions or configurations of the Agilent Technologies E5022A/B and E5023A. The information in this manual applies directly to an Agilent Technologies E5022A/B or E5023A whose firmware/software revision is listed on the title page of this manual.
Page 343: Changes In Revision B.04.00 From Revision B.03.10
Manual Changes Changes in Revision B.04.00 from Revision B.03.10 Changes in Revision B.04.00 from Revision B.03.10 Add 3 GHz spectrum measurement capability option (E5023A-300)’s information. Update products information. Appendix A Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 344: Changes In Revision B.xx.xx From Revision B.02.50
Manual Changes Changes in Revision B.xx.xx from Revision B.02.50 Changes in Revision B.xx.xx from Revision B.02.50 See the readme.htm and readme_config.htm files. Appendix A Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 345: Changes In Revision B.02.50 From Revision B.02.20
Manual Changes Changes in Revision B.02.50 from Revision B.02.20 Changes in Revision B.02.50 from Revision B.02.20 The following functions have been supported. • The tilt load function is supported which is available only in the E5010C/E5013A spinstand with the tilt loading mechanism. In the VEE measurement program, it is available to set the “Tilt”...
Page 346: Changes In Revision B.02.20 From Revision B.02.00
Manual Changes Changes in Revision B.02.20 from Revision B.02.00 Changes in Revision B.02.20 from Revision B.02.00 The SNR Triple Track Test function has been added. Appendix A Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 347: Changes In Revision B.02.00 From Revision B.01.10
Manual Changes Changes in Revision B.02.00 from Revision B.01.10 Changes in Revision B.02.00 from Revision B.01.10 See the readme.htm file. Select windows start menu [Programs][Agilent Hard Disk ReadWrite Test System] [README] Appendix A Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 348: Changes In Revision B.01.10 From Revision B.01.00.02
Manual Changes Changes in Revision B.01.10 from Revision B.01.00.02 Changes in Revision B.01.10 from Revision B.01.00.02 1. Supports E5023A System. The system calibration (Cable-loss compensation) function has been added. The calibration factor is installed in PC. The value is stored into PC at the factory shipment. The value is the same for all systems as far as the provided cables are used.
Page 349: Service Release For Revision B.01.00
Manual Changes Service Release for Revision B.01.00 Service Release for Revision B.01.00 Changes at Revision B.01.00.02 1) The following cassette has been supported. * E5029E Opt. 002 Cascade for the Universal Head Amplifier 2) The following cassette has been supported. * E5029K Opt.
Page 350: Changes In Revision B.01.00 From Revision A.04.30.03
Manual Changes Changes in Revision B.01.00 from Revision A.04.30.03 Changes in Revision B.01.00 from Revision A.04.30.03 1. Supports E5023A System. The system calibration (Cable-loss compensation) function has been added. The calibration factor is installed in PC. The value is stored into PC at the factory shipment. The value is the same for all systems as far as the provided cables are used.
Page 351: Service Release For Revision A.04.30
Manual Changes Service Release for Revision A.04.30 Service Release for Revision A.04.30 Changes at Revision A.04.30.07 1) The following head amplifier is supported * E5029J Opt.701 E5029-66701 Changes at Revision A.04.30.06 1) The following head amplifier is supported * E5029H Opt.H37 E5022-66537 Bug Fixes 1) In the triple track profile measurement, the auto range was failed when a signal is detected only at the right side of the track profile measurementt...
Page 352: Changes At Revision A.04.30.03
Manual Changes Service Release for Revision A.04.30 5) The function stops the spindle rotation with clamping the media has been added. * hpe5022_motorStateEx() Changes at Revision A.04.30.03 1. Supports the following head amplifier. • E5029H Opt.H35 E5022-66535 • E5029J Opt.702 E5022-66702 2.
Page 353 Manual Changes Service Release for Revision A.04.30 This function allows you to move the piezo. You can move it even if the drive is turned off. This mean, you can move the piezo even if the head is at the home position. Bug Fixes 1.
Page 354: Changes In Revision A.04.30 From Revision A.04.20.04
Manual Changes Changes in Revision A.04.30 from Revision A.04.20.04 Changes in Revision A.04.30 from Revision A.04.20.04 1. A capability to change a center position of the burst patterns in the track offset compensation function has been added. This function allow you to stay the read head at a positon which has offset from the track center.
Page 355: Service Release For Revision A.04.20
Manual Changes Service Release for Revision A.04.20 Service Release for Revision A.04.20 Changes at Revision A.04.20.04 1. For the VM8020 head amplifiers (E5029J Opt.215, 217 and E5029H Opt.H32), the function allows you to turn off the sense current during the write sequence has been deleted.
Page 356: Changes At Revision A.04.10.02
Manual Changes Service Release for Revision A.04.20 2. Oscilloscope Initialization Problem Symptom: Agilent 54845A (4CH 8G/sa Oscilloscope) does not change at 2 channel mode at initialize. This might occur when a PC is a Pentium III model. 3. Ranging Problem in Auto Disk Alignment. Symptom: Overflow error might occur when a low noise level head is used.
Page 357 Manual Changes Service Release for Revision A.04.20 • E5029J Opt.215 E5022-66215/E5022-66216 VM8020 • E5029J Opt.217 E5022-66217/E5022-66218 VM8020 Note: VM802010BXD1 is supported and VM802010BXB1 is not supported. Bug Fixes 1. Symptom: In the cassette of E5029D Opt. 009 (E5010-61291/E5010-61292), the cassette might contact with the shroud. Appendix A Artisan Technology Group - Quality Instrumentation ...
Page 358: Changes In Revision A.04.20 From Revision A.04.10.03
Manual Changes Changes in Revision A.04.20 from Revision A.04.10.03 Changes in Revision A.04.20 from Revision A.04.10.03 1. The multiple-write and multiple-read functions have been added. This functions allow you to write or erase for several revolutions. 2. The sense current polarity functions has been added. This function allows you to change the sense current polarity on write sequence.
Page 359: Service Release For Revision A.04.10
Manual Changes Service Release for Revision A.04.10 Service Release for Revision A.04.10 Changes at Revision A.04.10.03 1. Supports the following Head Amplifiers • E5029J Opt.613 E5022-66613/E5022-66614 VM8020 2. Supports the following Cassette • E5029D Opt.009 E5010-61291/E5010-61292 Changes at Revision A.04.10.02 1.
Page 360: Changes In Revision A.04.10 From Revision A.04.00.01
Manual Changes Changes in Revision A.04.10 from Revision A.04.00.01 Changes in Revision A.04.10 from Revision A.04.00.01 1. Supports the following Cassettes. • E5029C Opt.019 E5022-61163/E5022-61164 • E5029C Opt.020 E5022-61165/E5022-61166 2. Supports the E5011A small profile spinstand. 3. The following measurements are added. •...
Page 361: Service Release For Revision A.04.00
Manual Changes Service Release for Revision A.04.00 Service Release for Revision A.04.00 Changes in Revision A.04.00.01 from Revision A.04.00 1. Supports the following Head Amplifiers • E5029J Opt.215 E5022-66215/E5022-66216 VM8020 • E5029J Opt.217 E5022-66217/E5022-66218 VM8020 • E5029J Opt.219 E5022-66219/E5022-66210 VM8030 •...
Page 362: Changes In Revision A.04.00 From Revision A.03.81.04
Manual Changes Changes in Revision A.04.00 from Revision A.03.81.04 Changes in Revision A.04.00 from Revision A.03.81.04 1. Supports the following Head Amplifier for an Amplifier on Cassette. • E5029J Opt.607 E5022-66607/E5022-66608 SR1760 2. Supports the following new modules. • E5037B 1Gbps Data Generator Module •...
Page 363 Manual Changes Changes in Revision A.04.00 from Revision A.03.81.04 Figure A-1 Changes on Squeeze OTRC Appendix A Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 364 Manual Changes Changes in Revision A.04.00 from Revision A.03.81.04 • Squeeze Profile The imaginary track profiles are plotted on both side of the original track profile at the setting of squeeze position apart from the original track profile position. In the E5022A/B triple track profile sequence, the imaginary track profile position is rounded to the step of track profile measurement as shown in Figure A-2.
Page 365 Manual Changes Changes in Revision A.04.00 from Revision A.03.81.04 Figure A-2 Changes on Squeeze Profile Appendix A Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 366: Service Release For Revision A.03.81
Manual Changes Service Release for Revision A.03.81 Service Release for Revision A.03.81 Changes in Revision A.03.81.04 from Revision A.03.81.03 1) Supports spectrum measurements using 4396B. When 4396B is connected with E5022A system, user can measure the following measurements. * RollOff * CBR Sweep * Spectrum * Spectral SNR...
Page 367 Manual Changes Service Release for Revision A.03.81 Problem Description: In case of using E5029H Opt.015, when the measurement interval is more than about 1 minute, next first measurement result is not good. After one bad measurement result, the result becomes good if the interval is less than about 1 minute. Cause: At the revision 3.81 and below, the SR1750 was set at IDLE mode at unload position.
Page 368: Changes In Revision A.03.81 From Revision A.03.70
Manual Changes Changes in Revision A.03.81 from Revision A.03.70 Changes in Revision A.03.81 from Revision A.03.70 For VEE program, the following measurements have been added. • Stability Measurement (Absolute Time Setting), This test allows the user to set up the write and read operation in each segment as a function of absolute time so that test results can be closely correlated similar to popcorn noise test.
Page 369: Changes In Revision A.03.70 From Revision A.03.60
Manual Changes Changes in Revision A.03.70 from Revision A.03.60 Changes in Revision A.03.70 from Revision A.03.60 For VEE program, the following measurements have been added and/or modified: • [Burst Pattern Write] has been added in the Erase&Write menu. This allows the user to write multi-burst patterns on the disk which are used as position information for microactuator test.
Page 370 The parts number and serial number of the installed head amplifier can be shown in the [Head Amp Config.] menu. When you click on [About Agilent Technologies E5022A] the parts number and serial number of the head amplifier board will be reported. If the BER module is installed in the system, the name of its read channel IC will also be reported.
Page 371: Changes In Revision A.03.60 From Revision A.03.50
Manual Changes Changes in Revision A.03.60 from Revision A.03.50 Changes in Revision A.03.60 from Revision A.03.50 For VEE program, the following measurements have been added and/or modified: • SHNR (sub-harmonic noise ratio) measurement has been added. This measurement allows the user to measure the signal to noise ratio and to detect baseline popping over various sense current and off-track positions.
Page 372: Changes In Revision A.03.50 From Revision A.03.40
Manual Changes Changes in Revision A.03.50 from Revision A.03.40 Changes in Revision A.03.50 from Revision A.03.40 For VEE program, the following measurements have been added and/or modified: • Popcorn Noise Test using E5041A (dual counter module) has been added. Software Rev 3.50 supports this new popcorn noise test when you install E5041A.
Page 373: Changes In Revision A.03.40 From Revision A.03.30
Manual Changes Changes in Revision A.03.40 from Revision A.03.30 Changes in Revision A.03.40 from Revision A.03.30 For VEE program, the following measurements have been added : • The Absolute Polarity Test is added. This test is used to detect the pinned layer reversal of the GMR head by measuring the TAA asymmetry of both the Isolated pulse and Tribit pulse.
Page 374: Changes In Revision A.03.30 From Revision A.03.2X
As a result of the spin off from Hewlett-Packard Company, the Hewlett-Packard name brand and HP logos will all be changed to Agilent Technologies and Agilent Technologies logos effective November 1, 1999. From this transition period all existing documents that refer to Hewlett-Packard will be changed to Agilent Technologies.
Page 375: When Downgrading Rev3.30 To Software Rev3.21 And Earlier Revisions
Manual Changes Changes in Revision A.03.30 from Revision A.03.2x — For Visual Basic, the file “hpe5022.bas” under the directory “c:\Program Files\Agilent\ E5022\include” should be added in the development environment as an object file. — For C language, the file “hpe5022.h” under the directory “c:\Program Files\Agilent\E5022\include”...
Page 376: Changes In Revision A.03.2X From Revision A.03.10
Manual Changes Changes in Revision A.03.2x from Revision A.03.10 Changes in Revision A.03.2x from Revision A.03.10 • The fast micro track profile measurement is added to provide a faster measurement of the micro track profile. • For TAA measurement, The parameter of modulation has been added as a measurement result.
Page 377: Changes At Revision A.03.10 From Revision A.03.00
Manual Changes Changes at Revision A.03.10 from Revision A.03.00 Changes at Revision A.03.10 from Revision A.03.00 • The parameter ‘Average’ is added in the following measurement menus. • BER Measurement • 747 Measurement • Bath tub Measurement • Channel Quality Measurement •...
Page 378: Changes At Revision A.03.00 From Revision A.02.1X
Manual Changes Changes at Revision A.03.00 from Revision A.02.1x Changes at Revision A.03.00 from Revision A.02.1x • The auto disk alignment program is changed. This improves the accuracy of the auto alignment. • For VEE program, the following measurements have been added. •...
Page 379: Changes At Revision A.02.1X From Revision A.02.0X
Manual Changes Changes at Revision A.02.1x from Revision A.02.0x Changes at Revision A.02.1x from Revision A.02.0x • Extension Head Load Configuration is added. • Popcorn Measurement is added. • The definition of SNR measurement has changed. Inputting the noise level reference is required.
Page 380: Error Messages
Error Messages This appendix describes possible error messages that will appear on the PC monitor and LCD display of the spinstand when you operate Agilent E5022A. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 381: Error Messages On Pc Monitor Display
Error Messages Error Messages on PC Monitor Display Error Messages on PC Monitor Display Table shows the error messages that could appear on the PC monitor display when you use a demo program or other programs created by the user. Error Messages on PC Monitor Display Error Code Description...
Page 382 Error Messages Error Messages on PC Monitor Display Error Messages on PC Monitor Display Error Code Description hpe5022_ERROR_FILE_ACCESS Data log file in the auto alignment operation can not be created. hpe5022_ERROR_FUNCTION_NOT_LOADED Unable to load the DLL file. Perform the E5023A installation software or check if the file is installed in the PC.
Page 383 Error Messages Error Messages on PC Monitor Display Error Messages on PC Monitor Display Error Code Description hpe5022_ERROR_INV_DATA_SIZE In the user defined data pattern, the length of specified data pattern is shorter than the specified user data bit length. hpe5022_ERROR_INV_DATA_TYPE The specified data pattern for the user define data pattern includes an invalid...
Page 384 Error Messages Error Messages on PC Monitor Display Error Messages on PC Monitor Display Error Code Description hpe5022_ERROR_INV_SEQ Sequence is invalid. Check your program. hpe5022_ERROR_INV_SEQ_HNDL Detected the invalid sequence handle parameter in UDS. Check your program. hpe5022_ERROR_INV_SETUP Detected an error in operation.
Page 385 Error Messages Error Messages on PC Monitor Display Error Messages on PC Monitor Display Error Code Description hpe5022_ERROR_NSUP_CHAN_IC The DLL for the installed channel IC is not installed. Install the E5039B/C option software. hpe5022_ERROR_NSUP_CONF Detected software configuration errors. Check your program. hpe5022_ERROR_NSUP_FUNC Detected a mismatch between measurement...
Page 386 Error Messages Error Messages on PC Monitor Display Error Messages on PC Monitor Display Error Code Description hpe5022_ERROR_NSUP_SENS_CURR_POL The head does not support the reverse polarity on a stability measurement. Set the polarity at normal. hpe5022_ERROR_OPEN Unable to open some components in initialization.
Page 387 Error Messages Error Messages on PC Monitor Display Error Messages on PC Monitor Display Error Code Description hpe5022_ERROR_RESET Unable to reset on some components (instruments and the spinstand). hpe5022_ERROR_SERCH_TRACK_FAILED Detected an error and failed the operation in searching the track. hpe5022_ERROR_SEG_COMPLETE Segment is already completed in UDS.
Page 388 Error Messages Error Messages on PC Monitor Display Error Messages on PC Monitor Display Error Code Description hpe5022_ERROR_TOO_MANY_RETRY Spinstand stage is not positioned within a certain range after retry. Call Agilent Service office. hpe5022_ERROR_TRACK_OFFSET_COMP_FAILE Track offset compensation is failed. Check if the all measurement conditions are correct.
Page 389: Error Messages On The Lcd Of The Spinstand Controller
The encoder of X or Y stage is over the limit. Reset the spinstand. Amp Fault, Axis (1, 3 or 5) Amplifier could be in malfunction. Contact the Agilent Technologies office. Encoder error, Axis (1, 3 or 5) The encoder might be in malfunction. Contact the Agilent Technologies office.
Page 390: Error Messages Of The Auto Disk Alignment
Error Messages Error Messages of the Auto Disk Alignment Error Messages of the Auto Disk Alignment The table below shows the error messages that could appear when Auto Disk Alignment is performed. Table B-1 Error Message at Auto Disk Alignment Error Message Description Can't converge the track position...
Page 391 Error Messages Error Messages of the Auto Disk Alignment Appendix B Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 392: Cassette And Z-Height Adjustment
Cassette and Z-Height Adjustment This appendix provides the information about the cassette and its Z-Height Adjustment for E5022A/B. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 393: Z-Height Adjustment For E5029C/D Cassettes
Cassette and Z-Height Adjustment Z-height Adjustment for E5029C/D Cassettes Z-height Adjustment for E5029C/D Cassettes The Z-height adjustment tool is used to adjust the Z-height of the HGA mount face. The Z-height Adjustment tool is included in the Agilent E5029C Option Zxx (xx represents a two-digit number).
Page 394 Cassette and Z-Height Adjustment Z-height Adjustment for E5029C/D Cassettes Figure C-2 Needle Pin Replacement 3. To replace the needle pin in Figure C-2, use a 0.71-mm hex screwdriver to loosen the screw that locks the needle pin. Then select the pin hole to be used for measurement as shown in Figure C-3.
Page 395 Cassette and Z-Height Adjustment Z-height Adjustment for E5029C/D Cassettes Figure C-4 Zero Gauge Cassette Figure C-5 Attaching Zero Gauge Cassette (Down Face) NOTE When the FIC length of cassette is adjustable such as E5029C Option C11, the letters “s” (short length), “m” (medium length) and “l” (long length) is added as subscript to the cassette’s part number (e.g, “E5010-61145s”, “E5010-61145m”...
Page 396 Cassette and Z-Height Adjustment Z-height Adjustment for E5029C/D Cassettes height. The “R” reading can be calculated from the equations below. NOTE For standard disk thickness (0.8-mm), the micrometer reads direct Z-height (i.e, R=Z). For non-standard disk thickness (e.g, 1.0-mm and others), the user must compensate the “R” value by using the equations below.
Page 397 Cassette and Z-Height Adjustment Z-height Adjustment for E5029C/D Cassettes Figure C-6 Adjusting the height of the cassette 12. Loosen the flat screw located on top of the cassette as shown in Figure C-6 until the Z-height is almost at its highest position. Use a slotted screw driver. 13.
Page 398 Cassette and Z-Height Adjustment Z-height Adjustment for E5029C/D Cassettes Figure C-8 Measuring the Z-height of the Cassette 15. Carefully tighten up the pin screw and the hexagonal screw to fix the Z-height position. NOTE When you tighten up the hexagonal screw (upper), the torque of the driver must be 0.1N⋅m (1 Kgf⋅cm).
Page 399: Battery Replacement Procedure For Micrometer And Z-Height Tool
Cassette and Z-Height Adjustment Battery Replacement Procedure for Micrometer and Z-height Tool Battery Replacement Procedure for Micrometer and Z-height Tool Z-height tool has batteries inside. This section provides the battery replacement procedure. Table C-3 Required Tools Tools Size Hex Screwdriver 2.5 mm Hex Screwdriver 2.0 mm...
Page 400 Cassette and Z-Height Adjustment Battery Replacement Procedure for Micrometer and Z-height Tool 2. Remove the battery cover (black button) by turning it counter-clockwise using slotted screwdriver or coin. 3. Remove the battery and replace it with a 1.55-V button type battery (SR44 or LR44). This battery is commercially available.
Page 401 Cassette and Z-Height Adjustment Battery Replacement Procedure for Micrometer and Z-height Tool Figure C-11 Removing the pc board 7. Remove the cable tie with a cutting plier. 8. Remove the lithium battery and replace it with a new one. The battery is not soldered to the pc board, it is connected to the pc board through the battery holder.
Page 402: Adjusting The Fic Length
Cassette and Z-Height Adjustment Adjusting the FIC length Adjusting the FIC length The length of the FIC can be adjusted if it is FIC type cassette. This length can be adjusted in three different settings i.e., short, medium or long. This procedure shows the E5029C option C11.
Page 403 Cassette and Z-Height Adjustment Adjusting the FIC length Figure C-12 Adjusting the HGA Mount block assembly Appendix C Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 404: Qm Stopper Replacement Procedure
Cassette and Z-Height Adjustment QM Stopper Replacement Procedure QM Stopper Replacement Procedure The type of HGA bottom can be changed on some cassettes. This procedure shows the E5029C option C11 type. Other cassettes have the same replacement procedure. Table C-6 Required Tools Tools Size...
Page 405 Cassette and Z-Height Adjustment QM Stopper Replacement Procedure 2. To set the type of stopper to be used, first disassemble the HGA Mount block assembly from the cassette as shown in Figure C-13. Use a 1.5-mm hex screwdriver to remove 2 hexagonal screws from the block assembly.
Page 406: Measurement Using 4396B
Measurement Using 4396B This appendix provides the information when you make a measurement using high frequency spectrum analyzer 4396B. Users can use their own 4396B in order to make a high frequency spectrum measurements. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 407: Introduction For Measurement Using 4396B
Measurement Using 4396B Introduction for Measurement using 4396B Introduction for Measurement using 4396B The high frequency spectrum measurement is available when 4396B is connected with E5022/E5023 system. Although Agilent does not provide 4396B as a option of E5022A, users can use 4396B as one of module such as 4395A. The available measurements are: •...
Page 408: Required Parts
Table D-1 shows the required parts for 4396B measurement. Table D-1 Recommended Parts List Description Connection Part Number BNC(m)-BNC(m) Cable E5035A “Trig Out 2” 4396B “ExtTrigger” E5022-61613 BNC(m)-BNC(m) Cable 4395A “Ext Ref Output” 4396B “Ext Ref Input” E5022-61613 SMA(m)-SMA(m) E5036A “Filtrd Out 2”...
Page 409: Making A Measurement
Measurement Using 4396B Making a Measurement Making a Measurement The VEE measurement program detects 4396B automatically during its initialization process. Then, the menu for 4396B measurement is available under the following measurement button of the main menu. The display and usage for measurement are the same as ones for 4395A.
Page 410: Module/Head Amplifier/Cassette/Filter Lists
Module/Head Amplifier/Cassette/Filter Lists This appendix provides the information of head amplifiers, cassettes and filters. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 411: Module
Module Table E-1 Supported Revision for Each Module Module Opt. Description Supported Revision Spinstand I/F Module A.01.00 and above E5035A E5035B Spinstand I/F Module B.01.00 and above E5036A Filter Matrix Module A.01.00 and above Data Generator Module A.01.00 and above...
Page 412 Module/Head Amplifier/Cassette/Filter Lists Module Table E-1 Supported Revision for Each Module Module Opt. Description Supported Revision Spinstand A.01.00 and above E5010B Small Profile Spinstand A.04.10 and above E5011A High TPI Spinstand B.01.00 and above E5010C E5013A High TPI Small Profile Spinstand B.01.00 and above *1.Obsolete.
Page 413: E5029C Cassettes
Module/Head Amplifier/Cassette/Filter Lists E5029C Cassettes E5029C Cassettes Table E-2 E5029C Cassettes List Option Down Face Part Up Face Part Support Firmware Number Number Number Revision E5010-61121 E5010-61122 All Revision E5010-61147 E5010-61148 A.03.10 and above E5010-61125 E5010-61126 All Revision E5010-61129 E5010-61130 All Revision E5010-61149 E5010-61150...
Page 414: E5029D Amplifier On Cassette
Module/Head Amplifier/Cassette/Filter Lists E5029D Amplifier on Cassette E5029D Amplifier on Cassette Table E-3 E5029D Amplifier on Cassettes List Down Face Up Face Part Z-Height Z-Height Tool Support Firmware . No Part Number Number Tool Part Number Revision Option Number E5010-61211 E5010-61212 E5010-61531 A.03.70 and above...
Page 415: E5029E Amplifier On Cassette
Module/Head Amplifier/Cassette/Filter Lists E5029E Amplifier on Cassette E5029E Amplifier on Cassette Table E-4 E5029E Amplifier on Cassettes List Down Face Up Face Z-Height Checker Support . No Part Part Fixture Option Firmware Number Number Number Revision E5012-60011 E5012-60012 B.01.00 and above E5012-60021 E5012-60022 B.01.01 and above...
Page 416: E5029H Head Amplifiers
Module/Head Amplifier/Cassette/Filter Lists E5029H Head Amplifiers E5029H Head Amplifiers Table E-5 E5029H Head Amplifiers List Option Part Number Supported Firmware Revision Number E5022-66509 A.03.60 and above E5022-66511 All Revisions E5022-66513 All Revisions E5022-66512 All Revisions E5022-66510 All Revisions E5022-66514 A.03.20 and above E5022-66515 A.04.00 and above E5022-66516...
Page 417: E5029J Buffer Board
Module/Head Amplifier/Cassette/Filter Lists E5029J Buffer Board E5029J Buffer Board Table E-6 E5029J Buffer Boards List Option Part Number Description Number E5022-66001 For universal head amplifiers E5022-66002 For commercial head amplifiers E5022-66003 For SSI 833 E5022-66004 For commercial head amplifiers (for the thermal-drift-performance-improved cassette) *1.
Page 418: E5029J Head Amplifiers For Amplifier On Cassette
Module/Head Amplifier/Cassette/Filter Lists E5029J Head Amplifiers for Amplifier on Cassette E5029J Head Amplifiers for Amplifier on Cassette Table E-7 E5029J Head Amplifiers List Opt. Face Board P/N Lever P/N Support Firmware Revision E5022-66101 A.03.70 and above E5022-66102 E5022-66201 E5010-61701 E5022-66202 E5010-61702 E5022-66213 E5010-61707...
Page 419 Module/Head Amplifier/Cassette/Filter Lists E5029J Head Amplifiers for Amplifier on Cassette Table E-7 E5029J Head Amplifiers List Opt. Face Board P/N Lever P/N Support Firmware Revision E5022-66215 E5010-61701 A.04.00.01 and above E5022-66216 E5010-61702 E5022-66217 E5010-61707 A.04.00.01 and above E5022-66218 E5010-61708 E5022-66213 E5010-61751 A.04.10.03 and above E5022-66214...
Page 420: E5029K Buffer Board
Module/Head Amplifier/Cassette/Filter Lists E5029K Buffer Board E5029K Buffer Board Table E-9 E5029K Buffer Boards List Option Part Number Part Number Description Number for Onstage Buffer Board Connection Board E5023-66504 E5023-66505 For universal head amplifiers E5023-66506 E5023-66507 For commercial head amplifiers E5023-xxxx E5023-xxxx For commercial head amplifiers...
Page 421: E5029K Head Amplifiers For Amplifier On Cassette
Module/Head Amplifier/Cassette/Filter Lists E5029K Head Amplifiers for Amplifier on Cassette E5029K Head Amplifiers for Amplifier on Cassette Table E-10 E5029K Head Amplifiers List Opt. Board P/N Down Lever Support Firmware Lever P/N Revision E5023-66101 B.01.00.02 and above E5023-66201 E5012-60701 E5012-60702 B.01.00 and above E5023-66202 E5012-60703...
Page 422: E5029F Filter Board
Module/Head Amplifier/Cassette/Filter Lists E5029F Filter Board E5029F Filter Board Table E-11 E5029F Filter Boards List Option Part Filter Type Frequency Number Number Low Pass Sets 100/200/300/400 MHz E5036-66575 Low Pass 75 MHz E5036-66571 Low Pass 100 MHz E5036-66576 Low Pass 150 MHz E5036-66572 Low Pass...
Page 423 Module/Head Amplifier/Cassette/Filter Lists E5029F Filter Board Appendix E Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 424: Cable Loss Compensation For E5023A
Cable Loss Compensation for E5023A This appendix provides the information about the cable loss compensation for E5023A. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 425: Introduction
Cable Loss Compensation for E5023A Introduction Introduction Since the cable loss is not negligible in the high bit rate measurement, E5023A compensates the cable loss. The cable loss factor is stored in the PC. It is a typical value which is determined from the standard cables furnished with E5023A.
Page 426: E5029K Connection Board Maintenance
E5029K Connection Board Maintenance This appendix describes how to maintenance of the connection board. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 427: Connection Pads Maintenance
E5029K Connection Board Maintenance Connection Pads Maintenance Connection Pads Maintenance The connection board has pads to contact between the cassette and the connection board. Figure G-1 Connection Pads Cleaning the Pads To clean contamination, use a cotton swab with alcohol. Wipe them from the inside out as shown in Figure G-2.
Page 428: Inspecting The Pads Condition
E5029K Connection Board Maintenance Connection Pads Maintenance Inspecting the Pads Condition The life time is approximately 100,000 contacts. However, improper operation might damage the wire on the pad as shown in Figure G-3. This causes the short circuit between the terminals on the connection board. Four sets of this are furnished with the system as spares.
Page 429: Connection Pad Replacement
E5029K Connection Board Maintenance Connection Pad Replacement Connection Pad Replacement Step 1. There are two length of the connection pads as shown in Figure G-4. Figure G-4 Pad Length Step 2. Remove the connection pads from the connection board with tweezers. First, remove the long pads, then remove the short one.
Page 430 E5029K Connection Board Maintenance Connection Pad Replacement CAUTION Do not re-use the pads once you remove them with tweezers. Because the pads might have been damaged by tweezers. Step 3. Clean the ditchs and confirm there is no dust. Step 4. Mount the new short pad on the board with fingers. Do ware gloves. Do not use tweezers. The orientation of the pad is shown in Figure G-7.
Page 431 E5029K Connection Board Maintenance Connection Pad Replacement Step 5. Mount the new long pads with fingers. Figure G-8 Mounting the Long Pad Appendix G Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 432: Ramp Load
Ramp Load This appendix describes how to perform a ramp load. Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 433: Ramp Load
Ramp Load Ramp Load Ramp Load The ramp load provides the function to load and unload the hard disk head without damage whose suspension has the a lift tab. The ramp loading mechanism is installed to the media support assembly as shown in Figure H-1. NOTE At the E5022/E5023 system software revision B.02.50 and above support the ramp load.
Page 434: Overview
Ramp Load Ramp Load Overview Follow in the order as shown in Figure H-2 to prepare the measurement with the ramp load. Figure H-2 Preparation and Measurement Flowchart Ramp Loading Mechanism Installation The ramp loading mechanism can be installed on the media support of the E5013A spinstand.
Page 435: Ramp And Hga Cassette For Ramp Load Preparation
Ramp Load Ramp Load Ramp and HGA Cassette for Ramp Load Preparation Agilent does not supply the ramp and HGA cassette for the ramp load. You need to prepare them yourself. Agilent submits the information about the ramp and cassette dimensions to make them in advance.
Page 436: Head Loading Aux Controller Setting
Ramp Load Ramp Load Figure H-4 Ramp Plate Thickness Head Loading Aux Controller Setting Follow the procedure below to set the head loading Aux controller. The head loading Aux controller can be used both the tilt loading mechanism and the ramp loading mechanism.
Page 437: Ramp Cylinder Installation
Ramp Load Ramp Load suddenly. It is more dangerous, when the plug for air stopper blows off from the air fitting. Figure H-6 Plug the Air Fitting using Air Stopper Assembly The LED on it shows the status of the ramp loading mechanism. Assignment of the LED is as follows.
Page 438: Ramp Load Position And Media Load Position Determining
Ramp Load Ramp Load Figure H-7 Ramp Cylinder Installation (UP Face) Figure H-8 Ramp Cylinder Installation (DOWN Face) Ramp Load Position and Media Load Position Determining Store the ramp load position and media load position to the E5023 system with referring “Ramp Load Positioning Utility”...
Page 439 Ramp Load Ramp Load Configuration Menu” on page 229. Next, specifies the speed on ramp, init radius, init skew, head position restriction, and the other parameters. The init radius and the init skew are defined as follows. init radius A radius that the head is moved to after the head is loaded. init skew A skew angle that the head is moved to after the head is loaded.
Page 440 Ramp Load Ramp Load 3. The head moves to the ramp load position with the specified speed. 4. The head is unloaded. 5. The ramp moves to the Ramp Out position from the Ramp In position. The Ramp In position and the Ramp Out position are defined as follows. Ramp In A position where the ramp onto the media as shown in Figure H-10.
Page 441: Ramp Loading Mechanism Maintenance
Ramp Load Ramp Load Ramp Loading Mechanism Maintenance It requires to check a rod of the air cylinder every 10,000 head down action. If it is stained, clean the rod with cloth and grease the rod. It requires to check a floating joint of the air cylinder every 50,000 head down action. If it is stained, clean the rod with cloth and grease the floating joint.
Page 442: Ramp Load Positioning Utility
Ramp Load Ramp Load Positioning Utility Ramp Load Positioning Utility Before the hard disk head measurement with the ramp load, it is necessary to specify the ramp load position and the media load position as shown in Figure H-11. The Ramp Load position and the Media Load position are defined as follows. Ramp Load Position A load position where the head onto the ramp.
Page 443: Overview
Ramp Load Ramp Load Positioning Utility Overview The ramp load positioning utility has the following menu windows. Main Menu The task list of the buttons in the main menu is as follows. Figure H-12 Main Menu Positioning Step Select the amount of the step. Each step is defined as the distance travelled by the stage each time the direction button is pressed.
Page 444: Procedure Of Ramp Load Positioning
Ramp Load Ramp Load Positioning Utility Ramp Load Test Menu (Sub Menu) The task list of the buttons in the “Ramp Load Test” menu is as follows. Figure H-13 Ramp Load Test Menu Head Speed On Ramp Specifies the head movement speed between the ramp load position and the media load position.
Page 445 Ramp Load Ramp Load Positioning Utility Figure H-14 Error Information Step 5. Select the amount of the step from . Move the head above the ramp load 0.1mm 20mm position as shown in Figure H-11 using the buttons. Down Right Left Step 6.
Page 446 Ramp Load Ramp Load Positioning Utility NOTE The current head position is specified as the ramp load position. And, the position is specified as the media load position which is the distance you entered away from the current head position toward to the media. Step 8.
Page 447 Ramp Load Ramp Load Positioning Utility Appendix H Artisan Technology Group - Quality Instrumentation ... Guaranteed | (888) 88-SOURCE | www.artisantg.com...
Page 448: Glossary
Glossary Popcorn Noise Popcorn Noise are random noise spikes that occur when Absolute Polarity The absolute the head changes its operation from polarity test is used to detect the pinned write to read. layer reversal of the GMR head. PW reference A rough PW value to make measurements on a parametric module.
Page 449 somewhere between 20 C to 50 C above normal temperature inside the disk drive. When the MR sensor travels at high velocity with respect to the media and hits a high spot on the media such as mechanical scratch, debris or corrosion spots.
Page 450 Index Numerics demo program, 33 Detector, 265 5th Harmonic (NLTS), 151 Dipulse Extraction (NLTS), 149 747 Test, 268 dll, 33 747 Test (BER), 187 Documentation Warranty, 7 drive configuration, 310 drive control, 310 Absolute Polarity, 97, 254 drive setup, 310 Absolute Stability Measurement, 85 acrobat reader, 32 Auto Alignment, 211...
Page 451 Index hpe5022_ERROR_INV_PARAMETER, 382 hpe5022_ERROR_INV_POSITION, 382 Narrow Band TAA, 92 hpe5022_ERROR_INV_SEQUENCE, 382 Narrow Band TAA Measurement, 248 hpe5022_ERROR_INV_TRIG_PORT, 382, 383 NLTS, 259 hpe5022_ERROR_MEM_ALLOC, 383 NRZ (non-return to zero), 264 hpe5022_ERROR_MICRO_TRACK_FAILED, 383 hpe5022_ERROR_MOTOR_FAULT, 383 hpe5022_ERROR_NDEF_HGA, 383 off-track capability(OTC), 268 hpe5022_ERROR_NO_OPTION, 383 On-Track BER Measurement, 170, 266 hpe5022_ERROR_NSUP_CHAN_IC, 384 operating system, 32 hpe5022_ERROR_NSUP_HAMP, 384...
Page 452 Index Ramp Loading Mechanism, 432 Stability Measurement, 78, 248 installation, 433 Standard Triple Track Measurement, 126 maintenance, 440 Standard Triple Track Test, 293 ramp in position, 438 Sub Harmonic Noise Ratio, 271 ramp out position, 438 system block diagram, 30 UP/DOWN face, 436 system software, 32 ramp plate...

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