GE AKR-30 Series Maintenance Manual page 230

Low-voltage power circuit breakers
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SECTION 1 0-Type SST Overcurrent Trip Device (Cont.)
1 0.4.1
SST TEST SET
The TA K-TS1 and TA K-TS2 Test Sets are portable in­
struments desig ned for field-checking the t i me-cu rrent
characteristics and pickup cali brat ion of the SST's
various trip elements.
Fl ux-Sh ift Trip, Device to tri p the breaker and, i n addi ­
t i o n , incl udes means for cont i n u ity che . cking t h e phase
sen sors. A TAK-TS1 Test Set is shown in Fig. 67. The
TAK-TS2 functions identical ly to and supersedes the
TAK-TS1 device. The TAK-TS2 can also test the Ver­
saTrip Mod 2 tri p device.
WARNING :
BEFORE CONNECTING THE TEST SET
TO THE BREA KER TRIP DEVICE S YS TEM, EN­
SURE THA T THE CIRCUIT B REAKER IS COM­
PLETEL Y DISCONNEC TED FROM I TS PO WER
SOURCE. ON DRA WO UT EQUIPMENT, RACK THE
B R EA KER TO I TS DISCONNEC TED P OSITION.
VERIFY THA T THE BREA KER IS TRIPPED.
Either of two test modes may be employed:
"A" - Programmer Unit O nly. These tests are con­
ducted with the programmer unit discon nected from the
breaker. During test, the unit can remain attached to the
breaker or may be completely removed from it.
CAUTION :
NEVER DISENGAGE THE HARNESS
CONNECTOR FROM THE PROGRAMMER UNIT
ON A BREAKER THA T IS ENERGIZED AND CAR R Y­
ING LOAD CURRENT. THIS WILL OPEN-CIRCUIT
THE CURRENT SENSORS, ALL O WING DANGER­
OUS AND DAMAGING VOLTA GES TO DEVELOP.
Test scope:
1 . Verify the time-current characteristics and pickup
calibration of the various trip elements.
2. Verify operation of the SST target
grammer units so equipped.
-
"B"
the programmer unit must be mounted on the breaker and
connected to its wiring harness.
Test scope:
1 . All "A" tests previously described, plus provision for
optionally switching the programmer's output to activate
the Fl ux-Shift Trip Device and verify its operation by physi­
cally tripping the breaker.
2. Check phase sensor conti nuity.
In the event that any component of the SST syste m does
not perform within the limits prescribed in test instructions
G EK-64454 , it should be replaced.
52
It can verify the abil i ty of the
indicators on pro­
1 0.4.2
R ES ISTANCE VAL U ES
For use in troubleshooting, the Common to Tap resist­
ance for SST cu rrent sensors is given in Table 8. These
values apply to both phase and neutral sensors.
TABL E 8 - SENSOR R ESISTANCE VALUES
Ampere
TAP
1 00
1 50
225
300
300
400
600
800
600
800
1 200
1 600
800
1 200
1 600
2000
The coil resistance of the SST/ ECS Flux shifter device i s
approximately 1 6 ohms.
Resistance i n Ohms
between COMMON
and TAP Termi nals
2 . 2 - 2.6
3 .3 - 3.9
5 . 1 - 5 . 8
6.8 - 7.8
5.3 - 6 . 1
7.2 - 8.2
1 0. 8 - 1 2 .4
1 4.6 - 1 6.9
6.4 - 7 . 6
8 . 8 - 1 0 .4
1 3 .5 - 1 5 . 8
1 9 .4 - 22.8
1 0.2 - 1 2.4
1 5 .8 - 1 9 .2
22.0 - 26 . 7
28.5 - 34 . 7

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