Sst Test Set; Resistance Values 52 - GE AKR-30 Series Maintenance Manual

Low-voltage power circuit breakers
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SECTION 1 0-Type SST Overcurrent Trip Device {Cont.)
1 0.4.1

SST TEST SET

The TAK-TS1 and TAK-TS2 Test Sets are portable in­
stru m ents des ig ned for field-checking the t i m e-cu rrent
characteristics and pickup cali bration of the SST's
vario u s trip elements.
Fl ux-Shift Trig Device to trip the breaker and, i n add i­
tion, incl udes m eans for continu ity ch e cking the ph ase
sensors. A TAK-TS 1 Test Set is shown in Fig. 67. The
TAK-TS2 funct ions identically to and s u persedes the
TAK-TS1 device. The TAK-TS2 can also test the Ver­
saTri p Mod 2 trip device.
WARNING :
BEFORE CONNECTING THE TEST SET
TO THE BREA KER TRIP DEVICE S YS TEM, EN­
S URE THA T THE CIRCUIT BREA KER IS COM­
PLETEL Y DISCONNEC TED FR O M I TS PO WER
SOURCE. ON DRA WOUT EQUIPMENT, RACK THE
BREA KER TO ITS DISCONNEC TED POSITION.
VERIFY THA T THE B REAKER IS TRIPPED.
Either of two test modes may be e mployed:
"A" - Programmer Unit Only. These tests are con­
d ucted with the programmer unit discon nected from the
breaker. During test, the unit can remain attached to the
breaker or may be completely removed from it.
CAUTIO N :
NEVER DISENGAGE THE HARNESS
CONNECTOR FROM THE PROGRAMMER UNIT
ON A BREA KER THA T IS ENERGIZED AND CARR Y­
ING LOAD CURRENT. THIS WILL OPEN-CIRCUIT
THE CURRENT SENSORS, A L L O WING DANGER­
OUS AND DAMAGING VOL TA G ES TO DEVELOP.
Test scope:
1 . Verify the ti me-current characteristics and pickup
calibration of the various trip elements.
2. Verify operation of the SST target indicators on pro­
grammer un its so equipped .
" B" - Complete Trip Device System . For these tests,
the programmer unit m ust be mounted on the breaker and
connected to its wiring harness.
Test scope :
1 . All "A" tests previously described, plus provision for
optionally switching the programm er's output to activate
the Flux-Shift Trip Device and verify its operation by physi­
cally tripping the breaker.
2. Check phase sensor continuity.
In the event that any com ponent of the SST system does
not perform within the limits prescribed in test instructions
G EK-64454, it should be replaced.
52
It can verify the abil ity of the
1 0.4.2
R ES ISTANCE VAL U ES
For use in troubleshooting, the Com mon to Tap resist­
ance for SST current sensors is given in Table 8. These
values apply to both phase and neutral sensors.
TABLE 8 - SENSOR R ESISTANCE VALUES
Ampere
TAP
1 00
1 50
225
300
300
400
600
800
600
800
1 200
1 600
800
1 200
1 600
2000
The coi l resistance of the SST
approximately 16 ohms.
Resistance i n Ohms
between COMMON
and TAP Terminals
2.2 - 2.6
3.3 - 3.9
5 . 1 - 5.8
6.8 - 7.8
5.3 - 6 . 1
7.2 - 8.2
1 0 .8 - 1 2 .4
1 4.6 - 1 6.9
6.4 - 7.6
8.8 - 1 0 .4
1 3.5 - 1 5 .8
1 9 .4 - 22.8
1 0 .2 - 1 2 .4
1 5.8 - 1 9.2
22.0 - 26 . 7
28.5 - 34.7
I
E CS Flux shifter device is

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