ON Semiconductor ECLLQFP32EVB User Manual

ECLLQFP32EVB
Evaluation Board User's
Manual for High Frequency
LQFP32
INTRODUCTION
ON Semiconductor has developed an evaluation board
for the devices in 32−lead LQFP package. These evaluation
boards are offered as a convenience for the customers
interested in performing their own engineering assessment
on the general performance of the 32−lead LQFP device
samples. The board provides a high bandwidth 50 W
controlled impedance environment. Figures 1 and 2 show
the top and bottom view of the evaluation board, which can
be configured in several different ways, depending on
device under test (see Table 1. Configuration List).
This evaluation board manual contains:
•
Information on 32−lead LQFP Evaluation Board
•
Assembly Instructions
•
Appropriate Lab Setup
•
Bill of Materials
© Semiconductor Components Industries, LLC, 2012
January, 2012 − Rev. 3
Figure 1. Top View of the 32−lead LQFP Evaluation Board
EVAL BOARD USER'S MANUAL
This manual should be used in conjunction with the device
data sheet, which contains full technical details on the device
specifications and operation.
Board Lay−Up
The 32−lead LQFP evaluation board is implemented in
four layers with split (dual) power supplies (see Figure 3.
Evaluation Board Lay−Up). For standard ECL lab setup and
test, a split (dual) power supply is essential to enable the
50 W internal impedance in the oscilloscope as a termination
for ECL devices. The first layer or primary trace layer is
0.008" thick Rogers RO4003 material, which is designed to
have equal electrical length on all signal traces from the
device under the test (DUT) to the sense output. The second
layer is the 1.0 oz copper ground. The FR4 dielectric
material is placed between second and third layer and
between third and fourth layer. The third layer is the power
plane (V and V ) and a portion of this layer is a ground
CC EE
plane. The fourth layer is the secondary trace layer.
1
http://onsemi.com
Publication Order Number:
EVBUM2055/D