Eye Diagram Of Data On Header J4 - Texas Instruments 27 User Manual

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3.2.6 Test Points
For added EVM visibility and control, several test points are provided.
available.
SLWU028B – January 2006 – Revised November 2006
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Figure 3. Eye Diagram of Data on Header J4.
Circuit Description
Table 4 summarizes the test points
C001
11