Hitachi RASC-4HNPE Service Manual page 280

10 Troubleshooting
Checking procedure for main parts
5 Touch [+] of the tester to [P] of DIP-IPM (soldered
part), and [-] to DIP-IPM U, V, W terminals to
measure the resistance. Normal if all three terminals
have 1 kΩ or greater.
6 Contrary to [5], touch [-] of the tester to [P] of DIP-
IPM (soldered part), and [+] to DIP-IPM U, V, W
terminals to measure the resistance. Normal if all
three terminals have 30 kΩ or greater. (Resistance
gradually increases during measurement.)
7 Touch [-] of the tester to [N] of DIP-IPM (soldered
part), and [+] to DIP-IPM U, V, W terminals to
measure the resistance. Normal if all three terminals
have 1 kΩ or greater.
8 Contrary to [7], touch [+] of the tester to [N] of DIP-
IPM (soldered part), and [-] to DIP-IPM U, V, W
terminals to measure the resistance. Normal if all
three terminals have 30 kΩ or greater. (Resistance
gradually increases during measurement.)
ACT circuit of inverter PCB
Non-faulty if [9] – [13] are checked and satisfied.
(Measure with 1 kΩ range of a tester.)
9 Check items [1] – [8].
10 Touch [+] of the tester to DIP-IPM DCL2 terminal,
and [-] to [P] of ISPM/DIP-IPM (soldered part) to
measure the resistance. Normal if all three terminals
have 100 kΩ or greater.
11 Contrary to [10], touch [-] of the tester to DIP-IPM
DCL2 terminal, and [+] to [P] of DIP-IPM (soldered
part) to measure the resistance. Normal if all three
terminals have 1 kΩ or greater.
12 Touch [+] of the tester to DIP-IPM DCL2 terminal,
and [-] to [N] of DIP-IPM (soldered part) to measure
the resistance. Normal if all three terminals have 100
kΩ or greater.
13 Contrary to [12], touch [-] of the tester to DIP-IPM
DCL2 terminal, and [+] to [N] of DIP-IPM (soldered
part) to measure the resistance. Normal if all three
terminals have 10 kΩ or greater. (Resistance
gradually increases during measurement).
270 SMGB0091 rev.2 - 11/2015
Contact with specified
Tester
terminals to measure.
Internal circuit of ACT part of inverter module
External Appearance and Internal Circuit of
Transistor Module
Contact with specified
Tester
terminals to measure.