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61 PHREFI
I
Phase reference signal input for DSD output phase modulation.
62 PHREFO
O Phase reference signal output for DSD output phase modulation.
63 ZDFL
O Lch zero data detection fl ag (when set by the microcomputer). Goes high when silent data continues for 300ms.
64 DSAL
O Lch DSD data output.
65 ZDFR
O Rch zero data detection fl ag (when set by the microcomputer). Goes high when silent data continues for 300ms.
66 DSAR
O Rch DSD data output.
67 VDDSD
— Power supply for DSD data output. Supply +3.3V separated from other digital power supplies.
68 ZDFC
O Cch zero data detection fl ag (when set by the microcomputer). Goes high when silent data continues for 300ms.
69 DSAC
O Cch DSD data output.
70 ZDFLFE
O LFEch zero data detection fl ag (when set by the microcomputer). Goes high when silent data continues for
300ms.
71 DSALFE
O LFEch DSD data output.
72 VSDSD
— GND for DSD data output.
73 ZDFLS
O LSch zero data detection fl ag (when set by the microcomputer). Goes high when silent data continues for
300ms.
74 DSALS
O LSch DSD data output.
75 ZDFRS
O RSch zero data detection fl ag (when set by the microcomputer). Goes high when silent data continues for
300ms.
76 DSARS
O RSch DSD data output.
77 VDDSD
— Power supply for DSD data output. Supply +3.3V separated from other digital power supplies.
78 TESTO
O Test output. Leave open.
79 TESTO
O Test output. Leave open.
80 VSC
— Core GND.
81 TESTO
O Test output. Leave open.
82 TESTO
O Test output. Leave open.
83 VDC
— Core power supply. Supply +2.5V.
84 TESTO
O Test output. Leave open.
85 TESTO
O Test output. Leave open.
86 VSIO
— I/O GND.
87 TESTO
O Test output. Leave open.
88 TESTI
I
Test input. Fix to low.
89 TESTI
I
Test input. Fix to low.
90 VDIO
— I/O power supply. Supply +3.3V.
91 TESTO
O Test output. Leave open.
92 TESTO
O Test output. Leave open.
93 TESTO
O Test output. Leave open.
94 VSC
— Core GND.
95 TESTI
I
Test input. Fix to high.
96 TESTI
I
Test input. Fix to low.
97 TESTI
Ipu Test input. Fix to high.
98 TESTO
O Test output. Leave open.
99 VDC
— Core power supply. Supply +2.5V.
100 TESTI
I
Test input. Fix to low.
101 TESTI
I
Test input. Fix to low.
102 TESTI
I
Test input. Fix to low.
103 TESTI
I
Test input. Fix to low.
104 TESTI
I
Test input. Fix to low.
105 TESTI
I
Test input. Fix to low.
106 VSIO
— I/O GND.
107 TESTI
I
Test input. Fix to low.
108 TESTI
I
Test input. Fix to low.
109 TESTI
I
Test input. Fix to low.
110 VDIO
— /O power supply. Supply +3.3V.
111 WAD0
I
External A/D data input for PSP physical disc mark detection. (LSB) This is used only when not using the
internal A/D converter and connecting an external A/D converter.
112 WAD1
I
External A/D data input for PSP physical disc mark detection.
113 WAD2
I
External A/D data input for PSP physical disc mark detection.
114 WAD3
I
External A/D data input for PSP physical disc mark detection.
115 VSIO
— I/O GND.
116 VSC
— Core GND.
117 WAD4
I
External A/D data input for PSP physical disc mark detection.
118 WAD5
I
External A/D data input for PSP physical disc mark detection.
119 WAD6
I
External A/D data input for PSP physical disc mark detection.
120 WAD7
I
External A/D data input for PSP physical disc mark detection. (MSB)
121 VDC
— Core power supply. Supply +2.5V.
122 TESTI
I
Test input. Fix to low.
123 WCK
I
Operating clock for PSP physical disc mark detection. Input the PLL clock corresponding to 1T of RF.
124 WAVDD
— A/D power supply for PSP physical disc mark detection. Input +2.5V separated from the digital block.
125 WAVDD
— A/D power supply for PSP physical disc mark detection. Input +2.5V separatedfrom the digital block.
33
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