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JDS Uniphase CT-650 Reference Manual

Wideband test unit command-line reference guide
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CT-650 Wideband Test Unit
Release 9.4
Command-Line Reference Guide

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  • Page 1 CT-650 Wideband Test Unit Release 9.4 Command-Line Reference Guide...
  • Page 3 CT-650 Wideband Test Unit Release 9.4 Command-Line Reference Guide...
  • Page 5 Ordering Information This guide is a product of JDSU's Technical Information Development Department, issued as part of the CT-650 Documentation Release CD. This CD is available as part of the CT-650 System Software, ordering number CT650-REV-9.4-U1. CT-650 Command-Line Reference Guide...
  • Page 6 Refer all servicing to qualified service personnel. 5 All connections to the CT-650 are intrabuilding and must not be connected directly to outside plant leads. Save these instructions CT-650 Command-Line Reference Guide Release 9.4...
  • Page 7 Symbols The following safety symbols are used on the CT-650. All safety precautions must be observed when operating, servicing, or repairing the CT-650. Failure to comply with the following safety precautions or with hazard cautions and warnings used throughout this manual violates the intended use of this instrument.
  • Page 8 JDSU. Industry Canada This Class A digital apparatus complies with Canadian ICES-003. Requirements Cet appareil numérique de la classe A est conforme à la norme NMB- 003 du Canada. viii CT-650 Command-Line Reference Guide Release 9.4...

  • Page 9: Table Of Contents

    Logging on ..........5 Understanding the CT-650 screens ......6 Menu screens .
  • Page 10 Remarks ........25 CT-650 Command-Line Reference Guide...
  • Page 11 Remark........33 CT-650 Command-Line Reference Guide...
  • Page 12 Example ........39 CT-650 Command-Line Reference Guide...
  • Page 13 Example ........47 xiii CT-650 Command-Line Reference Guide Release 9.4...
  • Page 14 Remarks ........54 CT-650 Command-Line Reference Guide...
  • Page 15 Remarks........61 CT-650 Command-Line Reference Guide...
  • Page 16 Example ........70 CT-650 Command-Line Reference Guide...
  • Page 17 Backup_Files ........85 xvii CT-650 Command-Line Reference Guide Release 9.4...
  • Page 18 Syntax........101 xviii CT-650 Command-Line Reference Guide Release 9.4...
  • Page 19 Logic ..........143 CT-650 Command-Line Reference Guide...
  • Page 20 Loop codes ......... . 206 CT-650 Command-Line Reference Guide...
  • Page 21 Training options........213 Index CT-650 Command-Line Reference Guide Release 9.4...
  • Page 22 Contents xxii CT-650 Command-Line Reference Guide Release 9.4...

  • Page 23: About This Guide

    About This Guide – “Purpose and scope” on page xxiv – “Assumptions” on page xxiv – “Related information” on page xxiv – “Conventions” on page xxiv xxiii CT-650 Command-Line Reference Guide Release 9.4...

  • Page 24: Purpose And Scope

    Purpose and scope The purpose of this guide is to help you successfully use the features and capabilities of the CT-650 as part of your network service fulfill- ment and assurance solution. This reference guide contains concise information on the command-line interface provided by terminals connected to the CT-650, as well as test results and configuration information.
  • Page 25 A vertical bar | means “or”: only platform [a|b|e] one option can appear in a single command. Square brackets [ ] indicate an login [platform name] optional argument. Slanted brackets < > group <password> required arguments. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 26 A plus sign + indicates simulta- Press Ctrl+s neous keystrokes. A comma indicates consecutive Press Alt+f,s key strokes. A slanted bracket indicates choos- On the menu bar, click ing a submenu from menu. Start > Program Files. xxvi CT-650 Command-Line Reference Guide Release 9.4...

  • Page 27: Getting Started

    Getting Started Chapter 1 This chapter presents basic information on operating the CT-650 using the command-line interface. Topics discussed in this chapter are as follows: – “About the new USPII processor module” on page 2 – “About the new RTU cards” on page 2 –...

  • Page 28: About The New Uspii Processor Module

    About the new RTU cards Due to part obsolescence of the existing DT1, DTU, and DT3 RTU cards distributed with the CT-650 product line prior to release 9.0, new RTU cards have been developed. They are referred to as follows: CT-650 Command-Line Reference Guide Release 9.4...
  • Page 29 Differences in functionality between older RTU cards and ‘R2’ RTU cards Old RTU cards Rev2 RTU cards Compatible with any CT-650 soft- Compatible with CT-650 software ware version. version 9.0 or newer only. If the new RTU is installed in a system that uses a software version older than 9.0, the two green front...
  • Page 30 SUCPLNMAAB Figure 1 shows the difference in LED configuration on the front panel of the R2 RTUs for CT-650 versus that of the old RTUs. Figure 1 Front panel LEDs for R2 RTUs versus old RTUs, for CT-650 CT-650 Command-Line Reference Guide...

  • Page 31: Logging On

    Figure 2 Front panel LEDs for R2 RTUs versus old RTUs, for CT-650s Logging on To start a session with the CT-650, you need to log on with a user name and password. To log onto the CT-650 1 At the system prompt, log on using your user name and password.

  • Page 32: Understanding The Ct-650 Screens

    Figure 3 on page 6 is an example of a menu screen. – The banner displays the name of the CT-650, the software version, your user name, and the name of the current foreground test. – Available test commands appear in the middle portion of the screen.

  • Page 33: Supervisor Screens

    CT-650. Supervisor Another type of menu screen is the Supervisor Menu, which is avail- able when you log onto the CT-650 as super (Figure 4 on page screens The menu displays additional commands available to supervisors. You can use these commands to manage user accounts, archive or restore system files, and restart the CT-650.

  • Page 34: Command Screens

    6ECS3 7ECS3 ================================================================================ DS3>monitor _ Figure 5 Command screen for Monitor command Confirmation After you specify all the parameters required for a test, the CT-650 displays a confirmation screen (see Figure screens *** ct14 **************************CT-650**********************Version 7.4V1**** DS3 MONITOR: System/RTU Name...

  • Page 35: Results Screens

    Chapter 1 Getting Started Understanding the CT-650 screens Results screens The CT-650 displays test results in a results screen (see Figure *** ct14 **************************CT-650**********************Version 7.4V1**** TEST: 1test DG: 43 SIG SRC: RCVD T3 RTU: 1_4A Header SYS: 1st_dcs TP: 4...

  • Page 36: Loopback Status Line

    Chapter 1 Getting Started Understanding the CT-650 screens Loopback status The loopback status line appears after starting a loopback test (Figure line ***<System_name>*******************CT-650**********************Version x.xx *** DS1 Test Menu User: maint11 Test: test234 Enter one of the following: Abort DS1_Measure Report...

  • Page 37: Information Screens

    Entering commands The general form of a command is command_name parameter1 parameter2 ... parameter(n) Each time you press Space, the CT-650 prompts you with the next parameter to type as well as the available values. See Appendix B a detailed listing and definitions of all parameters.

  • Page 38: Editing Commands

    MAIN> MAIN> daytime MAIN> If you type d and press Enter, the CT-650 displays an error message Ambiguous command entered, because the commands Daytime, DCS_Direct and Delete_Log all start with the letter d. Control Table 3 lists the available control characters to quickly type commands from specific screens.

  • Page 39: Sample Test Procedure

    Sample test procedure Depending on the installed options, additional hotkeys are available. NOTE: If you use the CT-650 through an X.25 network, the Ctrl key may not function properly. In these environments, use the period . for the Ctrl key.

  • Page 40: Step 1: Initiate The Test

    Chapter 1 Getting Started Sample test procedure Step 1: Initiate the 1 From the main menu, type DS3. The DS3 Menu appears. test *** ct14 **************************CT-650**********************Version 7.4V1**** DS3 Menu User: maint11 Test: Enter one of the following: Exit Monitor _______________________________________________________________________________...
  • Page 41 Chapter 1 Getting Started Sample test procedure 3 Type the name of your 3/3 device and press Space. The next command screen prompts for the digroup. *** ct14 **************************CT-650**********************Version 7.4V1**** DS3 Menu User: maint11 Test: Enter the digroup number to be monitored: =============================================================================== DS3>monitor 1st_dcs _...
  • Page 42 Chapter 1 Getting Started Sample test procedure 5 Type a name for the test and press Space. The next screen prompts for a log file name. *** ct14 **************************CT-650**********************Version 7.4V1**** DS3 Menu User: maint11 Test: Select or enter a log file name or hit return for the default log file:...
  • Page 43 Chapter 1 Getting Started Sample test procedure 7 Type auto and press Space to use automatic framing. The next screen prompts for the test’s duration. *** ct14 **************************CT-650**********************Version 7.4V1**** DS3 Menu User: maint11 Test: Enter <return> for the default test length of Continuous, Continuous the test duration (format is <hhh-mm-ss>)
  • Page 44 Do you want to EXECUTE this command? (Y/N) =============================================================================== DS3>monitor 1st_dcs 25 1test 1test auto 24-30-00 ------------------------------------------------------------------------------- 10 Type your confirmation by pressing Y and Enter. The CT-650 runs the test, and then displays summary results. *** ct14 **************************CT-650**********************Version 7.4V1**** TEST: 1test...

  • Page 45: Step 2: Split The Circuit

    Chapter 1 Getting Started Sample test procedure 12 To display the DS3 Monitor menu, press Q. The DS3 Monitor menu appears. The test continues to run. *** ct14 **************************CT-650**********************Version 7.4V1**** DS3 Monitor Menu User: maint11 Test: 1test Enter one of the following:...

  • Page 46: Step 6: Disconnect The Test

    Release_Test No. This disconnects the test from the circuit. Disconnect the test Logging off Be sure to log off the CT-650 when you are not performing any tests or before leaving the terminal unattended. This precaution prevents unauthorized access to the CT-650. To log off the CT-650...

  • Page 47: Auxiliary And Common Commands

    The definitions for command parameters appear in Appendix B starting on page 173. Topics discussed in this chapter are as follows: – “Auxiliary commands” on page 22 – “Common test commands” on page 37 CT-650 Command-Line Reference Guide Release 9.4...

  • Page 48: Auxiliary Commands

    – You must perform the next command immediately after Choose. – You can issue several consecutive Choose commands to specify more than one resource, and the next Monitor command will use all those resources. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 49: Example

    – If a command requires multiple parameters, press Space after each parameter. Example The following command queries a Cisco 15454 DCS for the equipment list. dcs_direct CISCO15454 rtrv-eqpt::slot-all:@; Delete_Log Deletes log files. Syntax Delete_Log < > log_file CT-650 Command-Line Reference Guide Release 9.4...

  • Page 50: Remarks

    Chapter 2 Auxiliary and Common Commands Auxiliary commands Remarks – If you do not specify a log_file, the CT-650 deletes all the log files created under your account ID. – If you want to delete a log file associated with an active test, first terminate the test by issuing the Disconnect command.

  • Page 51: Remarks

    25) to list all files within a user account, including the log files. – When the CT-650 displays a log file, function keys appear at the bottom of the screen. You can use these function keys to navigate through the file.

  • Page 52: Help

    Displays information on a command. Syntax Help < > command_name Remarks If you don’t specify command_name, the CT-650 displays the main help screen. Information Displays information on account names, alarms, CT-650 configura- tion, communication ports, and status of active tests and slots. Information Accounts Displays list of user accounts.
  • Page 53 Displays information about the type and status of cards in each slot, and if the slot is available or configured. Information Tests <System < > | Test_Name system_name < > | User < > | All> test_name user_name CT-650 Command-Line Reference Guide Release 9.4...

  • Page 54: Inject_Errors

    1 At the DS3 menu prompt, type Error_Rate 1E-3. The DS3 test menu appears. 2 Type inject_errors both bit continuous 3 Confirm executing the test by pressing Y. The CT-650 continu- ously injects bit errors at a rate of 10E CT-650 Command-Line Reference Guide...

  • Page 55: Line_Coding

    Loopback < > DS3 {Up Down} < > digroup_side ds3_device Sends the DS3 FEAC loop-up or loop-down codes on the chosen digroup side. Remark – This command is available only after executing a Measure command. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 56: Main_Exit

    OS_Command < > UNIX_shell_level_command Password Changes the user’s current password. Syntax Password Remark – Passwords must include at least six characters with at least one digit and two alphabetical characters. – Passwords are case sensitive. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 57: Port_Connect

    – This command is available only from a test menu. – Type the bit pattern as ones and zeros. – The CT-650 transmits the loop code left to right after entering a Loopback command. – You can set default loop-up and loop-down codes using the Configure Defaults DS3 or Configure Defaults DS1/ FT1 commands.

  • Page 58: Example

    Remarks – You can edit a log file with the UNIX vi text editor. – When you type Record Off, the CT-650 asks if you want to save a copy of the batch file in the common system directory. This allows any user to execute the batch file.

  • Page 59: Release

    Remarks – user_name defaults to your logon ID. – If you type Yes, the CT-650 releases tests even if the DCS denies the operation. If you type No, the test continues running even if the DCS denies the operation.

  • Page 60: Example

    Select_Test command and then issue the Restart command. – The CT-650 stores the selftest log file under the user’s account. Example The following procedure performs a selftest on an RTU at location 1_3A, and stores the resulting log file in test4.log.

  • Page 61: Remarks

    Runs the text editor and opens a file with the indicated file name. Syntax Text_Editor < > file_name Remark The CT-650 text editor operates the same as the standard UNIX vi editor. User_Pattern Defines a user-programmable 3- to 24-bit test pattern. Syntax User_Pattern {User1 | User2} <...

  • Page 62: Example

    Information Configure Default. Example Define a user1 test pattern equal to 2 User_Pattern User1 1111111 Version Displays the version of the CT-650 software and Solaris operating system installed on your system. Syntax Version View_Results Displays results of a currently running test.

  • Page 63: Remarks

    Displays or executes previously entered commands. Syntax ! < > command_digit Executes the command associated with the command_digit. If you do not specify command_digit, the CT-650 displays a list of the last 20 commands you entered. < >!! digroup_side Executes the last command entered.

  • Page 64: Disconnect

    (tells the DCS to release the tested circuit and reallocates the RTUs). The RTU enters a disconnected state by transmitting a framed idle signal or thru mode depending on the default idle condition specified in the RTU configuration. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 65: Example

    Select_Test Brings a background test to the foreground. Syntax Select_Test < > test_name Remark When you select a test, the CT-650 displays the commands available for the test. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 66 Chapter 2 Auxiliary and Common Commands Common test commands CT-650 Command-Line Reference Guide Release 9.4...

  • Page 67: Ds3 Test Commands

    DS3 Test Commands Chapter 3 This chapter describes the commands available for testing DS3 circuits. These commands are available if you configured a 3/3 or 3/1 DCS to the CT-650. The definitions for command parameters appear Appendix B starting on page 173.

  • Page 68: Description Of Ds3 Test Commands

    – For a listing of split modes, see the split_mode parameter on page 183. For a listing of signal flows, see the signal_flow parameter on page 182. – The default values for split-mode and signal_flow depend on the DCS configuration. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 69: Example

    – The parameter fad_type is available only for DCSs that are configured for single and dual FAD test port types. – If the framing_format is AUTO, the CT-650 automatically synchronizes to the received signal framing. If one of the other...

  • Page 70: Example

    > digroup_side x_bits Remarks – If you do not specify x_bits, the CT-650 uses the value appearing in the Information Configure Defaults DS3 screen. – X-BITS can only be manipulated when the RTU idle condition is set for IDLE mode.

  • Page 71: Ds1 Test Commands

    DCS FAD connection. The definitions for command parameters appear in Appendix B starting on page 173. Topics discussed in this chapter are as follows: – “Description of DS1 test commands” on page 46 – “Considerations for SLC-96 testing” on page 50 CT-650 Command-Line Reference Guide Release 9.4...

  • Page 72: Description Of Ds1 Test Commands

    DS1_DI_Measure < > < > digroup_side test_pattern_type < > < > test_pattern test_duration Remarks – This command is available only after executing a DS1_DI_Split command. – Not all test pattern types require a test_pattern parameter. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 73: Example

    – Not all test_pattern_types require a test_pattern param- eter. Example The following command continuously tests the connected side of a DS1 line with a 2 -1 test pattern. Measure connected PRBS 2^23-1 continuous CT-650 Command-Line Reference Guide Release 9.4...

  • Page 74: Pre-Existing_Loop

    The following command performs an EF split using an idle-code signal flow. DS1_Split ef_split idle_code Log_Errors Starts logging of errors detected during a test. Syntax Log_Errors < > < > log_bit_error_sec log_sev_bit_error_sec < > < > log_frame_error_sec log_frame_sev_error_sec CT-650 Command-Line Reference Guide Release 9.4...

  • Page 75: Example

    Monitors a DS1 signal from a DSX or direct connection source. Remarks – If any framing other than SLC is chosen, the CT-650 tries to allo- cate DT1 cards first, then DTU cards. – If a dual-FAD connection is requested, the CT-650 allocates both test card RTUs.

  • Page 76: Example

    Yellow_Alarm < > Off|On digroup_side Considerations for SLC-96 testing Below are special considerations for testing SLC-96 systems. – SLC-96 is supported on the DTU card only. – The DTU autoframes to SLC-96 DS1 circuits. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 77 – Any DTU with the default framing is set to SLC will not be allocated for FT1 testing. – If a CT-650 has both DTUs and DT1s, you must select SLC framing in the Monitor command. This enables the CT-650 to allocate the DTU for the test.
  • Page 78 Chapter 4 DS1 Test Commands Considerations for SLC-96 testing CT-650 Command-Line Reference Guide Release 9.4...

  • Page 79: Chapter 5 Ft1 Test Commands

    These commands are available if you configured a 1/0 DCS connection. The definitions for command parameters appear in Appendix B starting on page 173. Topics discussed in this chapter are as follows: – “Description of FT1 test commands” on page 54 CT-650 Command-Line Reference Guide Release 9.4...

  • Page 80: Description Of Ft1 Test Commands

    – Not all test_pattern_types require a test_pattern param- eter. FT1_DI_Split Establishes an EF split using the desired signal flow. Syntax FT1_DI_Split < > signal_flow Remark This command is available only after executing a DI_Monitor. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 81: Ft1_Measure

    – The logged errors are in addition to logged results displayed by the Information Configure Miscellaneous command (see page 27). – To verify the default settings for logging errors, use the Informa- tion Configure Default DS1/FT1 command. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 82: Monitor

    < > < > < > channel_type test_name log_file Remark For an explanation of shared splits, see the CT-650 User’s Guide. UF_Split Initiates a Universal FAD split. Syntax UF_Split < > < > < > system_name digroup_number regroom_npc <...
  • Page 83 Chapter 5 FT1 Test Commands Description of FT1 test commands – The serial communications link between the CT-650 and DCS must have administrative or supervisor rights given to the link to allow degrooming and grooming of the digroup being tested.
  • Page 84 Chapter 5 FT1 Test Commands Description of FT1 test commands CT-650 Command-Line Reference Guide Release 9.4...
  • Page 85 173. You can also perform drop and insert tests on DS0 channels through a 3/1 DCS using a dual-FAD test port. Topics discussed in this chapter are as follows: – “Description of DDS test commands” on page 60 CT-650 Command-Line Reference Guide Release 9.4...

  • Page 86: Description Of Dds Test Commands

    DS0 channel configured in an EF split. DDS_Measure Executes an intrusive test on the chosen side of the circuit under test. Syntax DDS_Measure < > < > digroup_side test_pattern_type < > < > < > test_pattern test_type test_duration CT-650 Command-Line Reference Guide Release 9.4...

  • Page 87: Remarks

    – For TAD testing, set the DTU default framing to match the DCS TAD framing or frame sync. – The DS0A_subrate parameter is required only if channel_type is DS0A. – The tap parameter is required only for DCSs with TAD test ports. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 88: Mju

    MJU. Example Figure 10 illustrates two cascading MJU branches, with Printer 1 connected to a secondary MJU device. To access Printer 1, you need to type the following MJU commands: MJU selected select_branch 2 CT-650 Command-Line Reference Guide Release 9.4...

  • Page 89: Monitor

    234, and a 64K subrate. The test name is tst1, and the log file name is log1. The test runs continuously, and uses test access port 6. Monitor tlbs32 234 10 64k tst1 log1 continuous 6 CT-650 Command-Line Reference Guide Release 9.4...

  • Page 90: Log_Errors

    – The logged errors are in addition to logged results displayed by the Information Configure Miscellaneous command (see page 27). – To verify the default settings for logging errors, use the Informa- tion Configure Default DS1 command. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 91: Ds0 Vf Test Commands

    Certain features and options, such as Dial Out and Answer Call, depend on optional hardware features which may not be installed on your CT-650. As a result, the syntax described here may differ slightly from that displayed by your CT-650.

  • Page 92: Trunk Types And Seizure Sequences

    Transmits a series of answer call sequences over the channel selected with the last Monitor command. The command enables switch-to- switch or PBX-to-switch testing. Syntax Answer_Call < > < > digroup_side seizure_type < > < > number_of_phone_digits answer_sequence < > < > number_dialed seizure_type_parameter CT-650 Command-Line Reference Guide Release 9.4...

  • Page 93: Remarks

    Description of VF test commands Remarks – This command is available only after executing a VF_DI_Split command. – This command is available only if your CT-650 supports the enhanced signaling feature. – For a discussion of seizure types, see page...

  • Page 94: Remarks

    Transmits loop-up and loop-down tones on the chosen side of the circuit. Syntax Loopback < > DTMF_Loopback < > digroup_side digit_string < > < > < > low_freq upper_freq low_output_level < > < > high_output_level tone_time CT-650 Command-Line Reference Guide Release 9.4...

  • Page 95: Remarks

    > < > < > log_file test_duration Use this syntax for a signaling monitor of a VF channel from a 1/0 DCS. The tap parameter is required only for DCS with TAD test ports. Remark CT-650 Command-Line Reference Guide Release 9.4...

  • Page 96: Talk/Listen

    3 VF_Split or VF_DI_Split the circuit. 4 Use Talk/Listen . TLHangup Hangs up a Listen or Talk/Listen session. Syntax TLHangup < > digroup_side Remark The parameter digroup_side is required for drop and insert testing. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 97: Tlstatus

    The results appear in dBrn, and range from 20 dBrn to 70 dBrn. A quiet termination at the circuit’s originating end is required. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 98 (S/N) ratio (dB). If the C-Notch Noise level is less than 10 dBrnC or greater than 90 dBrnC, the CT-650 indicates that the value is out of range. A holding tone of 1004 Hz is required to perform this test.
  • Page 99 1004 Hz holding tone at -13.0 dBm. This test is essentially the same as the Send or Receive Tone test, except that the transmit level and frequency are fixed values rather than data entered by the user. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 100 To measure the harmonics, the <tx_level> tion CT-650 uses a test tone that comprises four equal-level tones. Two of the tones are centered at 858.95 Hz and are 53 Hz apart; the other two tones are centered at 1379.1 Hz and are 10.7 Hz apart.
  • Page 101 Peak-to- Measures the P/AR rating of a channel. During PAR <tx_level> average this test, the CT-650 transmits a complex pulse ratio (P/AR) train with known peak-to-average ratio. Distor- tions in the channel modify the P/AR signal. Delay distortion, for example, causes the pulses to spread in time as the different frequencies experience different delays.

  • Page 102: Remarks

    VF_DI_Split Establishes an intrusive connection between the monitored TAP from a 3/1 DCS and a DTU RTU. Syntax VF_DI_Split < > < > split_mode signaling_bits_selected < > signaling_bits_connected CT-650 Command-Line Reference Guide Release 9.4...

  • Page 103: Remarks

    – This command is available only after executing a Monitor command. – This command establishes an EF split across the DS1 signal. – The parameters signaling_bits_selected and signaling_bits_connected are available for split modes other than transparent. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 104 Chapter 7 DS0 VF Test Commands Description of VF test commands CT-650 Command-Line Reference Guide Release 9.4...

  • Page 105: Batch Files

    Chapter 8 If you perform a test repeatedly, you can automate the testing proce- dure using a batch file. A batch file contains a series of CT-650 commands and instructions that you group together. You can execute the commands in the batch file as a single command to run the test automatically.

  • Page 106: Creating And Running Batch Files

    3 Save the file. To run a batch file 1 Type the command Batch_Command <file_name>, where file_name is the name of the file containing CT-650 commands. To interrupt a batch file that is in progress, press Ctrl+c . Available commands for batch files Table 5 lists which CT-650 commands you can use in batch files.

  • Page 107: Unavailable Commands For Batch Files

    Table 6 lists the commands you cannot use in batch files. Table 6 Disallowed commands for batch files Backup_Files Examine_Log Restore_Files Configure Set_Date Create_Account Password Shutdown Delete_Account Port_Connect Text _Editor Delete_Log Reboot Write Email Record CT-650 Command-Line Reference Guide Release 9.4...
  • Page 108 Chapter 8 Batch Files Unavailable commands for batch files CT-650 Command-Line Reference Guide Release 9.4...

  • Page 109: Supervisor Commands

    Supervisor Commands Chapter 9 This chapter describes the commands available from the Supervisor Menu. Supervisors use these commands to configure the CT-650, manage user accounts, and to backup and restore system files. The definitions for command parameters appear in Appendix B...

  • Page 110: Descriptions Of Supervisory Commands

    Descriptions of supervisory commands This section describes the supervisory commands. Accounts Creates, deletes, and sets security levels for CT-650 accounts. For detailed information about user security, see Chapter 3 of the CT-650 Installation and Maintenance Guide . Syntax Accounts {Create_Account Delete_Account} <...

  • Page 111: Backup_Files

    Backup_Files All < > file_name Backs up all files into the specified file_name . If you don’t specify a file_name , the CT-650 saves the backup under the default file archive.cpio . Backup_Files Account_Info < > file_name Archives all account information into the specified file_name .

  • Page 112: Configure

    Configure Displays and modifies the system configuration and default values. Adding and modifying The CT-650 displays configurations in a series of screens on your configurations terminal. You can modify the configurations by navigating through the screens and fields. The following figure is an example of a configura- tion screen.
  • Page 113 6 If you change a configuration field marked with an asterisk ( * ), you must reboot the CT-650 before the change takes effect. If a test card is in use when you change a configuration, the CT-650 applies the new settings when the test terminates. If a test card is not in use when you change a configuration, the new settings are effective immediately.

  • Page 114: Deleting Configurations

    Description Old processor module—Number of TTY communication port: 2–11 for Port Number the CT-650, or 2–7 for the CT-650s. New processor module—Number of TTY communication port: 2–5 for the CT-650, or 2–5 for the CT-650s. Baud rate used for RS-232 communication.

  • Page 115: Configure Dcs

    Protocol/SW Flow Test port type supported by the DCS. Test Port Type The host name for the CT-650 on the network. If the host name identifies Testhead Hostname the CT-650 connected to the DCS control port, the remaining parame- ters in this screen configure the TTY port connected to the DCS. If the hostname identifies another CT-650, the local CT-650 gains access to the DCS control port through the indicated CT-650.

  • Page 116: Configuring Rtus

    Parameter Definition Shelf number. 1 indicates the master shelf. Shelf Number Slot location within a shelf. 1–15 for CT-650; 1–7 for CT-650s. Slot Number Select DT3 to configure a DT3 test card. RTU Type RTU side to configure, A or B.
  • Page 117 The timing source for the DT3 transmitters. If the idle condition is set to Timing Source LOCAL LOOPBACK and an idle condition occurs, the timing source defaults to RECOVERED. The wiring for the DT3 transmitters: Normal and Cross Wired. Transmitter Wir- CT-650 Command-Line Reference Guide Release 9.4...

  • Page 118: Configuring Dt1 Rtus

    DT1 test cards: Parameter Description Always 1. Shelf Number Slot location within a shelf. 1–15 for CT-650; 1–7 for CT-650s. Slot Number Select DT1 to configure a DT1 test card. RTU Type RTU side to configure, A or B. Card Side Signal source for the tested circuit.

  • Page 119: Configuring Dtu Rtus

    DTU test cards: RTUs Parameter Description Always 1. Shelf Number Slot location within a shelf. 1–15 for CT-650; 1–7 for CT-650s. Slot Number Select DT1 to configure a DT1 test card. RTU Type RTU side to configure, A or B. Card Side CT-650 Command-Line Reference Guide Release 9.4...
  • Page 120 – 1100 (IDLE) Transmits a DCS keep-alive pattern with the default fram- ing. – THRU Retransmits received data to the transmit lines. The transmit signal level. If EXTERNAL (M13 MUX) is selected for Signal TX Level Source, this field defaults to N/A. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 121: Configuring Sts-1 Rtus

    Parameter Description Shelf number is always 1. Shelf Number Slot location within a shelf. 1–15 for CT-650; 1–7 for CT-650s. Slot Number Select STS-1 RTU to configure the STS-1 interface card. RTU Type RTU side to configure, A or B.

  • Page 122: Configure Defaults

    Node Number Name of the node to which the CT-650 is connected. Node Name Host name or IP address of the host to which the CT-650 is connected. Node Hostname/IP Port number of the node to which the CT-650 is connected.

  • Page 123: Configure Security

    Descriptions of supervisory commands Parameter Description Test port of the node to which the CT-650 is connected. Node side of the Node Test Port link between the node and the hub. Hub port of the node to which the CT-650 is connected. Hub side of the Node Hub Port link between the node and the hub.

  • Page 124: Configure Answer_Seq

    Reboots the CT-650. Syntax Reboot Remarks – Users should log off the CT-650 before a reboot. – Rebooting while a test is running can lock DCS test ports. Be sure to Release or Disconnect all tests before rebooting. CT-650 Command-Line Reference Guide...

  • Page 125: Release

    Remarks – This command overwrites existing configuration files. – After restoring files, you must reboot the CT-650 for the configura- tion to take effect. Shutdown Performs an orderly shutdown of the CT-650, and releases all in- progress tests.

  • Page 126: Auxiliary Supervisor Commands

    DS1 Test Feature Option. – The format of a test pattern is a two-digit number for representing the number of times the pattern is to be repeated, a space, and a hexadecimal value for the pattern. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 127: Example

    Use the following procedure to create a user pattern that transmits the pattern 00011010 twelve times, and store the pattern in the file mypattern . 1 Type . The CT-650 creates the file in the / LUP Create mypattern ttc/centest/lup directory. 2 In the text editor, type...

  • Page 128: System_Test

    (1992) to 79 (2079). The year is optional. System_Test Tests all of the installed test cards. Syntax System_Test < > < > logfile_update log_file Example The following command updates a log file called test_file every three minutes. System_Test 3 test_file CT-650 Command-Line Reference Guide Release 9.4...

  • Page 129: Appendix A Test Results Definitions

    Test Results Definitions Appendix A This chapter describes the test results displayed by the CT-650. Topics discussed in this appendix are as follows: – “Information results” on page 104 – “DS3 results” on page 121 – “DS1 results” on page 134 –...

  • Page 130: Information Results

    Description Old processor module—Number of TTY communica- Port Num tion port: 2–11 for the CT-650, or 2–7 for the CT-650s. New processor module—Number of TTY communica- tion port: 2–5 for the CT-650, or 2–5 for the CT-650s. Baud rate of the communication port. If TTY3 is con- Baud Rate figured for X.25 operation, EXT appears, which indi-...

  • Page 131: Dcs

    Description Old processor module—Number of TTY communica- TTY Port tion port: 2–11 for the CT-650, or 2–7 for the CT-650s. New processor module—Number of TTY communica- tion port: 2–5 for the CT-650, or 2–5 for the CT-650s. Name assigned to the DCS or RTU.

  • Page 132: Rtu

    Appendix A Test Results Definitions Information results Field Description Type of DCS connected to the CT-650: 3/3,3/1, or 1/0. Type DCS model connected to the CT-650. Model Communication language used by the DCS. Lang DCS test port type connected to the test card.
  • Page 133 – LLB (Local Loopback) Regenerated receive signal is transmitted through the RTU. – 1100 (IDLE) Transmits a DCS keep-alive pat- tern with the default framing. – THRU Retransmits received data to the transmit lines. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 134 During a selftest, the RCVD T3 signal is an inter- nally generated DS3 signal from the RTU. Reference clock for timing slips measurements. Possi- Slip Clk ble values are as follows: INT (internal clock), EXT (external clock), or RCVD (received t1). CT-650 Command-Line Reference Guide Release 9.4...

  • Page 135: Defaults Ds3

    User-defined 3- to 24-bit default test pattern for a USER1 PAT- DS1_Measure, DS3_Measure, or DDS_Measure TERN command. User-defined 3- to 24-bit default test pattern for a USER2 PAT- DS1_Measure, DS3_Measure, or DDS_Measure TERN command. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 136: Defaults Ds1/Ft1

    LOG ES AND SES onds are logged to a user log file during test- ing. Text to display when an unrecognized DS1 UNRECOGNIZED pattern is received. Choices are N/A (default) PATTERN DISPLAY and LIVE. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 137: Defaults Ds0

    Number of times (1–50) a Test Results screen is BATCH MODE updated when executing the Report command in a REPORT batch file. This allows the Test Results screen to UPDATE appear on the terminal long enough to be viewed. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 138 Number of seconds (0–200) used to control the pro- BATCH MODE cessing rate of a batch file when it is executed. If 0, INPUT COM- the CT-650 executes the batch file at the maximum MAND DELAY speed. If 200, the CT-650 displays the execution of the batch file.

  • Page 139: Security

    Appendix A Test Results Definitions Information results Field Description Indicates if the CT-650 ignores a dial tone when IGNORE DIAL attempting to dial. This option is useful for networks TONE with non-US Talk/Listen interface dial tones. Security The following fields appear after entering the Information Configure Security command.

  • Page 140: Trunk_Types

    On-hook and off-hook bit states for the originating sig- ORIG SIG- nal on a DS0 circuit. NAL BIT STATES On-hook and off-hook bit states for the terminating sig- TERM SIG- nal on a DS0 circuit. NAL BIT STATES CT-650 Command-Line Reference Guide Release 9.4...

  • Page 141: Answer_Seq

    Configure Dial_Seq command. Field Description ID of a dial sequence. DIAL SEQUENCE NUMBER Name of a dial sequence. SEQUENCE NAME Sequence used to answer or dial a call on a VF circuit. SEQUENCE STRING CT-650 Command-Line Reference Guide Release 9.4...

  • Page 142: Crs

    Slots The following fields appear after entering the Information Slots command. Field Description Slot location within a shelf. 1–15 for CT-650; 1–7 for Slot CT-650s. Type of RTU installed in the slot. Possible values are Card Type DT3, DT1, DTU, and STS-1.

  • Page 143: Tests

    Digroup being tested. UNKNOWN appears if the digroup Digroup/ cannot be identified. N/A appears for a selftest. Channels Test direction of the chosen digroup. Possible values Test Dir are SEL (selected), CON (connected), or N/A (single FAD). CT-650 Command-Line Reference Guide Release 9.4...

  • Page 144: Talk/Listen

    CIRCUIT (CUT) VF channel being tested. DIGROUP CHAN- NEL(S) Digroup and/or DS1 channel being tested. Digroup/Chan- UNKNOWN appears if the digroup cannot be iden- nel(s) tified. DSO channel under test. DS1 UFAD CIR- CUIT(CUT) CT-650 Command-Line Reference Guide Release 9.4...
  • Page 145 Appendix A Test Results Definitions Information results Field Description Last signaling bits received by the CT-650 dur- Last Rx Signal- ing testing. ing Bits Status indicating signal loss. Possible values are Signal Missing as follows: – Y Signal loss has occurred.

  • Page 146: Taps

    Test Name Type of test being performed. ACCESS TYPE DCS test access port or fault access digroup. LOGICAL FAD/TAP Digroup and/or DS1 channel being tested. UNKNOWN Circuit appears if the digroup cannot be identified. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 147: Ds3 Results

    Test card RTU being used for the test. Appears in the form of <shelf>_<slot><side>. DCS or DSX transmitting the test signal. Port used for the test. N/A appears when an RTU port is idle. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 148 F split. Type of framing being transmitted. Examples include TX FRM D4, C-BIT, UNFRAMED, or N/A. UNDEFINED appears if the CT-650 cannot determine the framing. Pattern transmitted by the RTU. TX PAT Elapsed time since the test started. E. TIME CT-650 Command-Line Reference Guide Release 9.4...
  • Page 149 Possible values are as follows: – INTERNAL Internal timing selected. – EXTERNAL External timing selected. – RECOVERED or REC Recovered timing selected, or split is set for local loopback. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 150 – SIGNAL PRESENT Signal present with other alarms detected. – UNAVAILABLE Signal status cannot be deter- mined. Split type established with the split command. N/A SPLIT TYPE indicates the split type does not apply to the test. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 151: Bipolar Violations

    Number of seconds during which the bipolar violation BPV Thr Err rate exceeded or equaled the defined threshold. To display the threshold, use the command Informa- tion Configure Defaults DS3. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 152: C-Bit

    The error rate is computed while DS3 C-bit frame synchronization is present. To verify that the CT-650 is using bit mode or block mode, use the com- mand Information Configure Defaults DS3. Number of seconds during which 2 to 44 C-bit parity...

  • Page 153: Frame

    Number of errors detected in the multiplexed frame DS2 Frame between DS1 to DS3. Number of seconds during which an out-of-frame con- NEOOF Sec dition or an alarm indication signal is detected (Near- End Out-Of-Frame Seconds). CT-650 Command-Line Reference Guide Release 9.4...

  • Page 154: Logic

    Ratio of error-free seconds, expressed as a percent- Bit % EFS age, during which no pattern bit errors were detected to the total number of seconds since DS3 pattern syn- chronization. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 155: Line Status

    Configure Defaults DS3. Total number of pattern slips since the beginning of the Pattern test. When a slip is detected, the CT-650 automatically Slips resynchronizes to the received pattern. However, pat- tern bit errors are not suppressed during this process.
  • Page 156 At least one loss of DS2 frame synchronization was DS2 Frame detected but no longer exists. Loss Hist At least one loss of pattern synchronization was Pattern detected but no longer exists. Loss Hist CT-650 Command-Line Reference Guide Release 9.4...

  • Page 157: Parity

    Err Rate ber of DS3 M-frames received (Block mode). The error rate is computed while DS3 frame synchronization is present. To verify that the CT-650 is using bit mode or block mode, use the command Information Con- figure Defaults DS3.
  • Page 158 DS3 M-frames received (Block mode). The error rate is computed over the previous block of 10 bits. To verify the CT-650 is using bit mode or block mode, use the command Information Configure Defaults DS3. Number of seconds during which one or more parity...

  • Page 159: Signal

    Time remaining for a timed test in hours, minutes, and Time Left seconds. N/A appears for tests with continuous length. Elapsed time since the test started. Elapsed Time Length of test for a timed test, in hours and minutes. Test Length CT-650 Command-Line Reference Guide Release 9.4...

  • Page 160: Ds1 Results

    Test card RTU being used for the test. Appears in the form of <shelf>_<slot><side>. DCS or DSX transmitting the test signal. Port used for the test. N/A appears when an RTU port is idle. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 161 F split. Type of framing being transmitted. Examples include TX FRM D4, C-BIT, UNFRAMED, or N/A. UNDEFINED appears if the CT-650 cannot determine the framing. Pattern transmitted by the RTU. TX PAT Elapsed time since the test started. E. TIME CT-650 Command-Line Reference Guide Release 9.4...
  • Page 162 Possible values are as follows: – INTERNAL Internal timing selected. – EXTERNAL External timing selected. – RECOVERED or REC Recovered timing selected, or split is set for local loopback. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 163 – UNAVAILABLE Signal status cannot be deter- mined. Split type established with the split command. N/A SPLIT TYPE indicates the split type does not apply to the test. Pattern received by the RTU. RX PAT CT-650 Command-Line Reference Guide Release 9.4...

  • Page 164: Bipolar Violations

    A–D signalling bits B - busy (not idle) I - idle Columns correspond to the 24 DS0 Columns correspond to the 24 DS0 channels in a DS1 circuit. channels in a DS1 circuit. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 165: Frame

    CRC Errors frame synchronization. CRC errors are counted only when ESF or optional ESFz framing is present in the received T1 data. Number of seconds during which one or more CRC CRC Errored errors occurred. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 166: G.821

    Sec to 10 Ratio, expressed as a percentage, of error-free sec- % Error onds to the total number of seconds since pattern syn- Free Sec chronization. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 167: Line Status

    Description Signal currently detected. Signal Present Indicates frame synchronization was detected. Frame Sync Yellow Alarm signal is being detected. Yellow Alarm Pattern synchronization detected. Pattern Sync An Alarm Indication Signal is detected. AIS Present CT-650 Command-Line Reference Guide Release 9.4...
  • Page 168 Zeros Alarm B8ZS coding. Flag indicating the type of line coding. If Yes, the B8ZS CT-650 detected B8ZS coding; if No, the CT-650 Detected detected AMI coding. At least one loss of signal was detected but no longer Signal Loss exists.

  • Page 169: Logic

    Loss Sec- onds Total number of pattern slips since the beginning of the Pattern test. When a slip is detected, the CT-650 automatically Slips resynchronizes to the received pattern. However, pat- tern bit errors are not suppressed during this process.

  • Page 170: Signal

    Time Current day and month. Date Time remaining for a timed test in hours, minutes, and Time Left seconds. N/A appears for tests with continuous length. Elapsed time since the test started. Elapsed Time CT-650 Command-Line Reference Guide Release 9.4...

  • Page 171: Ft1 Results

    – RCVD T3 is the only source that indicates the DS3 signal is not being dropped from a higher rate. During a selftest, the RCVD T3 signal is an inter- nally generated DS3 signal from the RTU. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 172 – SEL/F Selected side of digroup being tested from an F split. Type of framing being transmitted. Examples include TX FRM D4, C-BIT, UNFRAMED, or N/A. UNDEFINED appears if the CT-650 cannot determine the framing. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 173 Possible framing formats include: – C-bit DS3 C-bit framed signal detected. – M13 DS3 M13 framed signal detected. – N/A No signal is detected. – UNFRAMED Unframed DS3 signal detected. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 174 Pattern received by the RTU. RX PAT Speed of a tested DS0 channel: 56K or 64K. CH TYPE Number of the DS0 channel under test (1 to 24). CT-650 Command-Line Reference Guide Release 9.4...

  • Page 175: Channel

    Mode Idle Number of abnormal station condition codes Abnormal (S0011110) detected since the test started. Station Cond Number of transition in progress codes (S0111010) Transition detected since the test started. in Progress CT-650 Command-Line Reference Guide Release 9.4...
  • Page 176 Number of test alert codes (S1101100) detected since Test Alert the test started. Test name. N/A appears for selftests. Test Number of undefined control codes detected since the Undefined test started. Control Codes CT-650 Command-Line Reference Guide Release 9.4...
  • Page 177 Minutes utes. Ratio, expressed as a percentage, of seconds the % Avail- channel was available to the total elapsed seconds able Sec since pattern synchronization. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 178: Line Status

    Hist At least one loss of frame synchronization was Frame Loss detected but no longer exists. Hist At least one loss of pattern synchronization was Pattern detected but no longer exists. Loss Hist CT-650 Command-Line Reference Guide Release 9.4...

  • Page 179: Logic

    Loss Sec- onds Total number of pattern slips since the beginning of the Pattern test. When a slip is detected, the CT-650 automatically Slips resynchronizes to the received pattern. However, pat- tern bit errors are not suppressed during this process.

  • Page 180: Time

    The following fields appear in the header of the DS0 DDS test results screens. Field Description Test name. N/A appears for selftests. Test Digroup being tested. UNKNOWN appears if the digroup cannot be identified. N/A appears for a selftest. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 181 DCS or DSX transmitting the test signal. Port used for the test. N/A appears when an RTU port is idle. Status of the test. Possible values are ABORTED, COM- TYPE PLETE, MEASURE, and MONITOR. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 182 F split. Type of framing being transmitted. Examples include TX FRM D4, C-BIT, UNFRAMED, or N/A. UNDEFINED appears if the CT-650 cannot determine the framing. Pattern transmitted by the RTU. TX PAT Elapsed time since the test started. E. TIME Type of framing detected by the receiver.
  • Page 183 Pattern received by the RTU. RX PAT DS0 test access path being used (1 to 12). Speed of a tested DS0 channel: 56K or 64K. CH TYPE CT-650 Command-Line Reference Guide Release 9.4...

  • Page 184: Channel

    Mode Idle Number of abnormal station condition codes Abnormal (S0011110) detected since the test started. Station Cond Number of transition in progress codes (S0111010) Transition detected since the test started. in Progress CT-650 Command-Line Reference Guide Release 9.4...
  • Page 185 Number of test alert codes (S1101100) detected since Test Alert the test started. Test name. N/A appears for selftests. Test Number of undefined control codes detected since the Undefined test started. Control Codes CT-650 Command-Line Reference Guide Release 9.4...

  • Page 186: Line Status

    The following fields appear in the Line Status category of the DS0 DDS test results screens. Field Description Signal currently detected. Signal Present Indicates frame synchronization was detected. Frame Sync Pattern synchronization detected. Pattern Sync CT-650 Command-Line Reference Guide Release 9.4...

  • Page 187: Logic

    Rate Number of seconds during which one or more pattern Bit Err Sec bit errors occurred since initial pattern synchroniza- tion. Number of times pattern synchronization was lost Pattern since initial pattern synchronization. Losses CT-650 Command-Line Reference Guide Release 9.4...

  • Page 188: Time

    Loss Sec- onds Total number of pattern slips since the beginning of the Pattern test. When a slip is detected, the CT-650 automatically Slips resynchronizes to the received pattern. However, pat- tern bit errors are not suppressed during this process.

  • Page 189: Ds0 Vf Results

    Test card RTU being used for the test. Appears in the form of <shelf>_<slot><side>. DCS or DSX transmitting the test signal. Port used for the test. N/A appears when an RTU port is idle. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 190 F split. Elapsed time since the test started. E. TIME DS0 test access path being used (1 to 12). State of the echo canceller. Number of the DS0 channel under test (1 to 24). CT-650 Command-Line Reference Guide Release 9.4...

  • Page 191: Answer Call

    A–D signalling bits B - busy (not idle) I - idle Columns correspond to the 24 DS0 Columns correspond to the 24 DS0 channels in a DS1 circuit. channels in a DS1 circuit. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 192: Terse

    The following fields appear after entering a Listen command from the VF Drop & Insert Monitor Menu. Field Description Volume of the received signal. Volume Device to which the listen test is connected. Listen Src CT-650 Command-Line Reference Guide Release 9.4...

  • Page 193: Vf_Di_Measure

    Signal-to-noise ratio, measured as the ratio of the usable signal to the noise or unusable signal. Level of the transmitted signal during an echo return Transmit loss, insertion loss, PAR test, or send-receive tone Level measure test, measured in dBm. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 194 Frequency Strength of the signal received during an Intermodula- Signal tion Distortion test. Level Level of second- and third-order distortions in the 2nd/3rd received signal during intermodulation distortion tests. Order Dis- tortion CT-650 Command-Line Reference Guide Release 9.4...

  • Page 195: Supervisor Results

    The following section describes the fields available for the supervisor’s test command. System_Test The following fields appear after entering the System_Test command from the Supervisor Menu. Field Description Type of test being performed. Test Type Shelf number. 1 indicates the master shelf. Shelf CT-650 Command-Line Reference Guide Release 9.4...

  • Page 196: Loopback Status Information

    B Side Sta- is not occupied or the side is being tested. tus/Reason Loopback status information When you type the Loopback command, the CT-650 displays the loop- back status line (see Figure 8 on page 10).The following fields appear in the loopback status line.
  • Page 197 In Progress — Loop code being transmitted. Sent — Loop code transmitted, no confirmation is performed. Confirmed — Loopback confirmed with two BERT patterns. Not Confirmed — Loopback could not synchronize to the BERT patterns. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 198 Appendix A Test Results Definitions Loopback status information CT-650 Command-Line Reference Guide Release 9.4...

  • Page 199: Appendix B Command Parameter Definitions

    Command Parameter Appendix B Definitions This appendix describes command-line parameters for the CT-650. There are also explanations on how to format digroup numbers for various DCSs, and how to specify FEAC alarm messages. Topics discussed in this appendix are as follows: –...

  • Page 200: Parameter Listing

    Parameter listing Many CT-650 commands require parameters to properly execute. As you type commands, the CT-650 prompts you for the parameters, and displays the domain of accepted values. For an example of how to type parameters, see the sample test procedure on...
  • Page 201 Table 8 Command-line parameter definitions (Continued) Parameter Definition circuit_type One of the circuits the CT-650 can test: DS3, DS1/FT1, or DS0. command_digit Digit associated with a previously entered command. Type ! to dis- play the digits associated with previous commands. command_name Any valid CT-650 command.
  • Page 202 For other commands, any UNIX path is valid. disconnect_timeout The time after which the CT-650 disconnects from a VF circuit if no test response is received during the indicated time. Use No to remain connected even if no test response is received.
  • Page 203 Sets frequency step size from 10 to 1000 Hz in 1 Hz steps. Default is 100 Hz. gain_hit_thres_1 Sets first gain hit threshold from 2 to 10 dB in 1 dB steps. Default is 2 dB. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 204 Minutes between logfile updates from 1 to 999. Default is 5 min- utes. logon_id ID used to log into the CT-650. log_frame_error_sec Determines if the CT-650 logs frame errors. Possible values are y and n. log_frame_sev_error_sec Determines if the CT-650 logs severe frame errors. Possible values are y and n.
  • Page 205 Number of digits expected to be received in the answer sequence. offhook_timeout The time after which the CT-650 disconnects from a VF circuit if no off-hook response is received during the indicated time. Use No to remain connected even if no off hook is received.
  • Page 206 Identifier of the RTU in the format <shelf>_<slot><side>. For exam- ple, 1_2A is on shelf 1, slot 2, side A. rtu_type The type of RTU connected to the CT-650. Typical values include DT1, DT3, and DTU. CT-650 Command-Line Reference Guide...
  • Page 207 Shelf location or address of the RTU in the system. This parameter is always 1 for the 650 and the 650-S. side The side of the RTU being tested. Possible values are A and B. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 208 VF circuit. Type two digits for SF framing, or four digits for signaling bits_selected ESF framing. slot Slot in which the RTU is installed. The typical range for slot num- bers is 1–15 for the 650 and 1–6 for the 650-S. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 209 The name of a file to back up or restore. test_duration For continuous testing and test result accumulation, use Continu- ous; for a fixed testing period, use a value in the format hhh-mm- CT-650 Command-Line Reference Guide Release 9.4...
  • Page 210 A name assigned to a test. You can use up to 11 characters from the set A–Z, a–z, 0–9, and you can also use the underscore. If you don’t specify a test_name in the command, the CT-650 assigns a test name (such as TST0 or TST1).
  • Page 211 The tone level, from 0 dBm to -40 dBm. tone_time The duration of the tone, from 10 to 8000 ms, in increments of 10 tone_time_period The duration of the tone, from 10 to 8000 ms, in increments of 10 CT-650 Command-Line Reference Guide Release 9.4...
  • Page 212 Tone, and Three Tone. transport_type The protocol by which a DCS communicates through a port to the CT-650. Typical values include RS232, IP and X.25. trunk_type The type of trunk under test. For an explanation of VF trunk types, page –...

  • Page 213: Specifying Digroup Numbers

    Sets the upper measurement frequency from 20 to 3904 Hz in 1 Hz steps. Frequency must be above low_freq. Default is 3200 Hz. user_name The ID of a user’s session on the CT-650. You can list user IDs by using the Who command. vf_test_type One of the tests available for measuring VF signals.

  • Page 214: Feac Alarm Messages And Loop Codes

    DS1 Single Loss-of-Signal/High Bit Error DS1_S_LOS/HBER Ratio DS3 Alarm Indication Signal Received DS3_AIS_Rcvd DS3 Idle Signal Received DS3_Idle_Rcvd DS3 Loss-of-Signal/High Bit Error Ratio DS3_LOS/HBER DS3 Non-Service Affecting Equipment DS3_NSA_Eq_Fl Failure (Type 2 equipment failure) CT-650 Command-Line Reference Guide Release 9.4...
  • Page 215 100111 DS1 Line - No. 7 010011 DS1 Line All 101000 DS1 Line - No. 8 011001 DS3_SA_Eq_Fl 101001 DS1 Line - No. 9 001110 DS3_LOS/HBER 101010 DS1 Line - No. 10 000000 DS3_OOF CT-650 Command-Line Reference Guide Release 9.4...
  • Page 216 DS1 Line - No. 15 010101 DS1_M_LOS/HBER 110000 DS1 Line - No. 16 000101 DS1_SA_Eq_Fl 110001 DS1 Line - No. 17 011110 DS1_S_LOS/HBER 110010 DS1 Line - No. 18 000011 DS1_NSA_Eq_Fl 110011 DS1 Line - No. 19 CT-650 Command-Line Reference Guide Release 9.4...

  • Page 217: Appendix C Test Patterns And Loop Codes

    Test Patterns and Loop Appendix C Codes This appendix describes the available test patterns and loop codes provided in the CT-650 system. Topics discussed in this appendix are as follows: – “Test patterns” on page 192 – “Bridgetap/Multipat patterns” on page 198 –...

  • Page 218: Test Patterns

    Test patterns Test patterns Table 12 provides a list of CT-650 test patterns along with a descrip- tion of how they work. Unless otherwise indicated, these test patterns are transmitted from left to right in a framed or unframed format.
  • Page 219 21 test patterns that have a variety of ones and zeros densi- ties. Sequence takes approximately 10.5 minutes to transmit. Use AMI coding to transmit patterns properly; B8ZS encoding makes testing less effective. Refer to Table 13 on page 198 specific test pattern sequences. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 220 When frame aligned, pattern contains a maximum of eight zeros and meets the ones density criteria. Refer to Table 20 on page 203 for specific test pattern sequence. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 221 Multipat patterns to test a T1 span without having to select each test pat- tern individually. The CT-650 monitors the received test patterns for bit errors, BPVs, and frame errors. This sequence takes about 15 minutes to transmit. Refer to Table 14 on page 199 specific test pattern sequence.
  • Page 222 DDS Rate — Used to test DDS and other circuits operating between 9.6 and 56 kb/s. 511-bit pseudorandom pattern generates a maximum of 8 PRBS 511 sequential zeros and 9 sequential ones. Used to test DDS and other circuits operating below 9.6 kb/s. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 223 The bit pattern and pattern name are pro- grammed from the Supervisor Menu. This is the default pattern name and 1010 is the default test pattern. This allows the CT-650 to transmit specific patterns to test circuit sensitivity. CT-650 Command-Line Reference Guide Release 9.4...

  • Page 224: Bridgetap/Multipat Patterns

    Supervisor Menu. This is the default pattern name and 1010 is the default test pattern. This allows the CT-650 to transmit specific patterns to test circuit sensitivity. a. These long user patterns (LUP) are only available when the LUP Option is installed.

  • Page 225: Lup Option Test Patterns

    The following test patterns are only available when the LUP option is installed. – IBM80 (see Table 16 on page 200) – MIN_MAX (see Table 17 on page 201) – T1_2 (see Table 18 on page 201) – T1_3 (see Table 19 on page 202) CT-650 Command-Line Reference Guide Release 9.4...
  • Page 226 8421 8421 0000 1000 0001 1001 0010 1010 0011 1011 0100 1100 0101 1101 0110 1110 0111 1111 For example, the MSB and LSB 74H is 0111 01000. Table 16 IBM80 test pattern sequence CT-650 Command-Line Reference Guide Release 9.4...
  • Page 227 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 1111 CT-650 Command-Line Reference Guide Release 9.4...
  • Page 228 0000 0000 0000 0000 0000 0001 0001 0011 0001 0001 0001 0001 0111 0001 0000 0000 0000 0101 0101 0101 0101 1010 1010 1010 0001 0001 0001 0101 0101 0101 0101 1010 1010 1010 CT-650 Command-Line Reference Guide Release 9.4...
  • Page 229 1010 1010 0001 0001 0001 0001 1010 1010 1010 1010 0000 0000 0000 0000 0001 0001 0001 0001 0001 0001 0001 0001 0001 0001 0000 0000 0000 0000 0000 0000 0000 0000 0000 0000 CT-650 Command-Line Reference Guide Release 9.4...
  • Page 230 0001 1111 1010 1111 0001 0001 0001 0001 1111 1111 1111 1111 0000 0000 0000 0000 1111 1111 1111 1111 1111 1111 1111 1111 0001 0001 0001 0001 1111 1111 1111 1111 1100 1011 CT-650 Command-Line Reference Guide Release 9.4...
  • Page 231 0000 0000 0000 0000 0001 0001 0001 0011 0001 0001 0001 0001 0111 0001 0000 0000 0000 0101 0101 0101 0101 1010 1010 1010 0001 0001 0001 0101 0101 0101 0101 1010 1010 1010 CT-650 Command-Line Reference Guide Release 9.4...

  • Page 232: Loop Codes

    1111 1111 0111 0000 and a loop-down code of 1111 1111 0001 1100. Selects ESF out-of-band facility or network loop codes. Transmits a ESF-FAC loop-up code of 1111 1111 0100 1000 and a loop-down code of 1111 1111 0010 0100. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 233 Selects latching DS0 Line Side Interface (HL222) loop codes. Selects latching DS0 V.54 loop codes. V.54 Selects a latching Multipoint Junction Unit loopback to loop all MJU branches and the control leg. CT-650 Command-Line Reference Guide Release 9.4...
  • Page 234 For looping HDSL HTU-R, HTU-C, and Doublers, also transmits an arming code of 11000 and a disarming code of 11100. b. The CSU and OCU commands send DDS DS0A loopcodes, not the inband DS1 codes (smart jack). CT-650 Command-Line Reference Guide Release 9.4...

  • Page 235: Appendix D Customer Services And Support

    JDSU. Topics discussed in this appendix include: – “About our services” on page 210 – “Standard support services” on page 210 – “Add-on services” on page 211 – “Training options” on page 213 CT-650 User’s Guide Release 9.3...

  • Page 236: About Our Services

    Product Repair — All equipment returned for service is tested to the same rigorous standards as newly manufactured equipment. This ensures products meet all published specifications, including any applicable product updates. Calibration — JDSU’s calibration methods are ISO approved and based on national standards. CT-650 User’s Guide Release 9.3...

  • Page 237: Technical Assistance (Business Hour)

    Web site. For more information, go to: www.jdsu.com/en-us/Test-and- library Measurement/support/Technical-Library/Pages/TechLibrary.aspx. Add-on services JDSU offers a broad portfolio of add-on services to enable customers to aggressively build their competitive advantage within the markets they serve. Available services include: CT-650 User’s Guide Release 9.3...

  • Page 238: Extended Product And Systems Support Services

    For information about JDSU’s Assets and Certified Equipment (ACE) Program (for the resale of certified preowned equipment), go to: www.jdsu.com/en-us/Test-and-Measurement/services/a-z-service- list/Pages/ace-prgm.aspx. For information about tailored support services for your JDSU system, go to: www.jdsu.com/en-us/Test-and-Measurement/services/prod- ucts-and-systems-support/systems-support/Pages/default.aspx. CT-650 User’s Guide Release 9.3...

  • Page 239: Professional And Consulting Services

    – On-site training – Virtual classroom – Self-paced training – Certifications – Workshops and blended learning – Train-the-trainer/course licensing – Free Webinars – Contact training For more information about available training options, go to: www.jdsu.com/en-us/Test-and-Measurement/Training/Pages/ default.aspx. CT-650 User’s Guide Release 9.3...
  • Page 240 Appendix D Customer Services and Support Training options CT-650 User’s Guide Release 9.3...

  • Page 241: Index

    Prog_Loop Auxiliary commands Record ! (history) Release abbreviated entry Restart account information RTU configuration alarm information Screen_Refresh answer sequence security Batch_Command Self_Test Slots Daytime Supervisor DCS configuration Talk/Listen DCS_Direct TAP_Loopback defaults TAPS Delete_Log Tests CT-650 Command-Line Reference Guide Release 9.4...
  • Page 242 DS3 testing 54–57 FT1 test commands unavailable for batch files viewing Common commands Delete_Log command abbreviated entry Abort DI_Monitor command Disconnect Log_Errors DS0 VF Report Select_Test Configuration information Dial sequence settings answer sequence Dial_Out command CT-650 Command-Line Reference Guide Release 9.4...
  • Page 243 FT1_DI_Split Monitor FT1_Measure results FT1_Split SLC-96 systems Monitor UF_Split results viewing defaults Shared_Split Yellow_Alarm UF_Split viewing defaults DS1_DI_Monitor command FT1_DI_Measure command DS1_DI_Split command FT1_DI_Split command DS1_Measure command FT1_Measure command DS1_Split command FT1_Split command CT-650 Command-Line Reference Guide Release 9.4...
  • Page 244 Loop codes DS1 testing Reboot command FEAC Record command Loopback command auxiliary Release command 33, DS0 VF Report command status information status line Restart command LUP command Restore_Files command test pattern sequences Results screens RTUs CT-650 Command-Line Reference Guide Release 9.4...
  • Page 245 TLHangup command Restore_Files Set_Date TLStatus command Shutdown Trunk types System_Test description for DS0 VF test results settings Trunk_Types Trunk_Types command Supervisor Menu screen TTY port configuration System test patterns 191–206 Tx_X_Bit command System_Test command CT-650 Command-Line Reference Guide Release 9.4...
  • Page 246 Who command User_Pattern command Write command Version command X.25 VF test commands, See DS0 VF test emulating Ctrl key commands enabling for Alcatel 1631 VF_DI_Measure command X-bits VF_DI_Split command VF_Measure command VF_Split command Yellow_Alarm command CT-650 Command-Line Reference Guide Release 9.4...
  • Page 248 Test and Measurement Regional Sales North America Latin America Asia Pacific EMEA www.jdsu.com Toll Free: +1 800 638 2049 Tel: +1 954 688 5660 Tel: +852 2892 0990 Tel: +49 7121 86 2222 Tel: +1 240 404 2999 Fax:+1 954 345 4668 Fax:+852 2892 0770 Fax:+49 7121 86 1222 Fax:+1 240 404 2195...

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