Omron CS1W-V680C11 User Manual page 99

Test Settings
The test settings are used to set the operation, Antenna, and number of test bytes used in Test Mode.
DM Area address Bit No.
Test Settings
(Both Antennas 1 and 2)
08 to 15
m+50
00 to 07
m+51 00 to 15
First word allocated to Unit in DM Area: m = D20000 + 100 × Unit number
Run/Test Switching Method Setting
You can switch between Run Mode and Test Mode by using the test switch or by using bit 15 of CIO
n+0.
DM Area address Bit No.
Run/Test Switching Method
00 to
m+80 Setting
03
(Both Antennas 1 and 2)
First word allocated to Unit in DM Area: m = D20000 + 100 × Unit number
After setting DM Area data with the Support Software, reset the power supply to the PLC or turn ON the Special I/O Unit
Restart Bit. The DM Area settings will be transferred to the ID Sensor Unit when the power supply turns ON or when the
Special I/O Unit Restart Bit is turned ON.
RF Tag Memory Setting
This setting can be used to set the RF Tag memory map to the map that is used with ID Controllers for
Heat-resistant RFID Systems (V680-CA1D/-CA2D).
DM Area address Bit No.
00 to RF Tag Memory Setting
m+81
03 (Both Antennas 1 and 2)
Type Description
Test Operation
Test Antenna
Number of Test Bytes
Type Description
Run/Test Switching
Method Setting
Type Description
RF Tag Memory Setting
SECTION 5
ID Sensor Unit Functions
Setting value
00: Communications test
A0: Range level
B0: Read speed level
B1: Write speed level
C0: Noise level
C1: Communications success rate
01: Antenna 1
02: Antenna 2
0000 to 0800 hex (bytes)
Set value
1: CPU Unit
0: Test switch
Set value
1: CA1D Mode
0: Standard Mode
RFID System
User's Manual
97