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4.17 Micro SD Trouble
TEST POINT
CIRCUIT DIAGRAM
T-FLASH
R201
100K
TF_DAT2
TF_DAT3
TF_CMD
Copyright © 2007 LG Electronics. Inc. All right reserved.
Only for training and service purposes
R202
R203
NA
100K
J200
1
8
DAT2
DAT1
2
7
DAT3
DAT0
3
6
CMD
VSS
4
5
VDD
CLK
9
11
GND1
GND3
10
12
GND2
GND4
R206
470K
4. TROUBLE SHOOTING
Figure 4.18
2V85_TF
TFLASH_EN
R204
R205
100K
100K
C202
NA
- 79 -
VBAT
2V85_TF
U200
BH28FB1WHFV
1
5
STBY
NC
2
6
GND
BGND
3
4
VIN
VOUT
C200
1u
TF_DAT1
TF_DAT0
TF_CLK
LGE Internal Use Only
J200
C200
U200
C201
10u
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