Table of Contents
Advertisement
4. TROUBLE SHOOTING
4.17 Micro SD Trouble
4.17 Micro SD Trouble
TEST POINT
CIRCUIT
3V3_VUSB
2V8_VEXT
R332
R333
R334
470K
56K
56K
TP2
TF_DATA1
TF_DATA0
TF_CLK
TF_CMD
TF_DATA3
TF_DATA2
TF_DET
LGE Internal Use Only
TP1
u-SD CARD
3V3_TF
R326
R327
0
DNI
R337
R335
R336
56K
56K
56K
J302 AXA463062P
DAT1_2
DUMMY1
DAT0
VSS
CLK
VDD
CMD
CD_DAT3
DUMMY2
DAT2
DETECT_A
DETECT_B
DUMMY3
C353
GND
DNI
J302
MM_USB LDO
VBAT
ONNOFF
R419
C424
1u
100K
- 82 -
Copyright © 2009 LG Electronics. Inc. All right reserved.
3V3_VUSB
EUSY0353801
RP103K331D
U403
TP1
4
1
VDD
VOUT
3
2
CE
GND
Only for training and service purposes
TP2
C422
1u
Advertisement
Table of Contents
