NEC FDl165 Product Description page 25

Flexible disk drive
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c.
Select HL2and connect HL2 to ground.
d.
Turn on the power and the auto tap test starts.
AUTO SEEK TEST
The auto seek test consists of a seek action from track 0
to track 76 with the read/write heads unloaded.
To select
the auto seek test:
a.
Turn off the power.
b.
Connect diagnostic pin T3 to the center pin.
c.
Turn on the power and the auto seek test starts.
AUTO SEEK AND
TJ~P
TEST
This test performs both auto seek and auto tap functions.
To select the auto seek and tap test:
a.
Turn off the power.
b.
Connect diagnostic pins T2 and T3 to the center pin.
c.
Select HL2 and connect HL2 to ground.
d.
Turn on the power and the auto seek and tap test
starts.
HEAD UNLOAD DELAY (Tl)
To delay the head unload action 250 ms, short pin Tl to
ground.
With Tl shorted, head load/unload commands are ig-
nored when they occur less than 250 ms apart.
Normally this
pin is open.
2.4G2.5
Test Pins (TP)
The TP numbers and the signals availale are listed in Table
2-2 G Test pins not listed in 'the table are used in manu-
facturing only.
2-11

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