Page 1 User Manual CSA8000B Communications Signal Analyzer TDS8000B Digital Sampling Oscilloscope 071-1099-03 This document applies to firmware version 2.0 and above. www.tektronix.com...
Page 2 Copyright © Tektronix, Inc. All rights reserved. Licensed software products are owned by Tektronix or its suppliers and are protected by United States copyright laws and international treaty provisions. Use, duplication, or disclosure by the Government is subject to restrictions as set forth in subparagraph (c)(1)(ii) of the Rights in Technical Data and Computer Software clause at DFARS 252.227-7013, or subparagraphs (c)(1) and (2) of the...
Page 3 WARRANTY Tektronix warrants that the products that it manufactures and sells will be free from defects in materials and workmanship for a period of one (1) year from the date of shipment. If this product proves defective during its warranty period, Tektronix, at its option, will either repair the defective product without charge for parts and labor, or provide a replacement in exchange for the defective product.
Page 5: Table Of Contents
........... . Contacting Tektronix .
Page 6 Table of Contents Operating Basics Operational Maps ......... 2- -1 Documentation Map .
Page 7 Table of Contents Triggering ..........3- -39 Edge Triggering .
Page 8 Table of Contents Operations on Math Waveforms ........3- - 107 Why Use? .
Page 9 Table of Contents Using Waveform Databases ........3- - 159 Why Use? .
Page 10 Table of Contents List of Figures Figure 1- -1: Compartments for sampling modules ....1- -11 Figure 1- -2: Maximum inputs in three configurations ... . 1- -11 Figure 1- -3: Locations of peripheral connectors on rear panel .
Page 11 Table of Contents Figure 3- -12: Triggered versus untriggered displays ... . . 3- -41 Figure 3- -13: Trigger inputs ....... . . 3- -42 Figure 3- -14: Holdoff adjustment can prevent false triggers .
Page 12 Table of Contents List of Tables Table 1- -1: Additional accessory connection information ..1- -13 Table 1- -2: Line fuses ........1- -13 Table 1- -3: Standard accessories .
Page 13: General Safety Summary
General Safety Summary Review the following safety precautions to avoid injury and prevent damage to this product or any products connected to it. To avoid potential hazards, use this product only as specified. Only qualified personnel should perform service procedures. While using this product, you may need to access other parts of the system.
Page 14 General Safety Summary Provide Proper Ventilation. Refer to the manual’s installation instructions for details on installing the product so it has proper ventilation. Symbols and Terms Terms in this Manual. These terms may appear in this manual: WARNING. Warning statements identify conditions or practices that could result in injury or loss of life.
Page 15: Preface
Preface This is the user manual for the CSA8000B Communications Signal Analyzer and TDS8000B Digital Sampling Oscilloscope. It covers the following information: H Describes the capabilities of the instrument: how to install it and reinstall its software H Explains how to operate the instrument: how to control acquisition of, processing of, and input/output of information H Lists the specifications and accessories of the instrument About This Manual...
Page 16: Related Manuals And Online Documents
Electrical Sampling Modules User Manual The user manual for the electrical sampling modules. Included as a PDF file on the product software CD or the PDF file can be downloaded from the Tektronix website. 80C00 Series Optical Sampling Modules The user manual for the optical sampling modules. Included as a PDF file on the product User Manual software CD or the PDF file can be downloaded from the Tektronix website.
Page 17: Contacting Tektronix
6:00 a.m. - - 5:00 p.m. Pacific time This phone number is toll free in North America. After office hours, please leave a voice mail message. Outside North America, contact a Tektronix sales office or distributor; see the Tektronix web site for a list of offices. xiii...
Page 18 Preface CSA8000B & TDS8000B User Manual...
Page 19: Product Description
Product Description This chapter describes your instrument, which is either the CSA8000B Commu- nications Signal Analyzer or the TDS8000B Digital Sampling Oscilloscope, and its options. Following this description are four sections: H Check the Package Contents, on page 1- -7, shows you how to verify that you have received all of the parts of your instrument.
Page 20 Product Description front-panel controls with the mouse and keyboard or with the touch screen. The installed Windows operating system (MS Windows 98 or MS Windows 2000) is dependent on the purchase date or product upgrade status. Key features include: H industry-leading waveform acquisition and measurement rate, with Sample, Envelope, and Average acquisition modes.
Page 21: Product Software
Product Description FibreChannel signals, and 1, 2, and 10 Gigabit FibreChannel signals as well as 2.5 Gb/s Infiniband signals. NOTE. Support for conformance testing rates is determined by the specific modules that are installed. H high precision time base with two modes of operation, locked and short-term jitter-optimized H negligible long-term jitter degradation (<0.1 ppm), which substantially improves the ability to view signals that are delayed far from the trigger...
Page 22: Firmware Upgrade
New versions of the software may become available at our web site. See Contacting Tektronix on page xiii in Preface. Firmware Upgrade Tektronix may offer firmware upgrade kits for the instrument. Contact your Tektronix service representative for more information (see Contacting Tektronix on page xiii).
Page 23 Product Description H 80C07 - - 155/622/2488 Mb/s amplified optical module. Clock Recovery for all rates added with option CR1. This module has been superseded by the 80C07B. H 80C07B - - 155/622/1063/1250/2125/2488/2500 Mb/s amplified optical module. (The module is limited to five receivers configured at the time of order.) Clock Recovery for all rates (plus 2666 Mb/s) added with option CR1.
Page 24 H 80A02 EOS/ESD Protection Module - - A module that protects the sensitive input stage of instruments (such as the sampling bridge of Tektronix electrical TDR sampling modules) from damage due to electro-overstress (EOS) and electro static discharge (ESD) from the device under test (DUT).
Page 25: Check The Package Contents
NOTE. New versions of the product and/or demo application software may become available at our web sit. See Contacting Tektronix on page xiii. Remember to fill out and send in the customer registration card. The registration card is packaged in an envelope in the shipping package.
Page 26 Check the Package Contents 1- 8 CSA8000B & TDS8000B User Manual...
Page 27: Installation
Installation This section covers installation of the instrument, addressing the following topics: H Check the Environment Requirements on page 1- -9 H Install the Sampling Modules on page 1- -10 H Connect the Peripherals on page 1- -12 H Power On the Instrument on page 1- -13 H Powering Off the Instrument on page 1- -15 H Brightness and Contrast Adjustment (Gamma) on page 1- -15 H Back Up User Files on page 1- -15...
Page 28: Install The Sampling Modules
Installation Operating Requirements Specifications in Appendix A list the operating requirements for the instrument. Power source and temperature, humidity, and altitude are listed. Rackmount Requirements If this instrument is rackmounted, see the TDS8000 & CSA8000 Rackmount Instructions for additional site considerations or operating requirements. This document ships with the Option 1R (rackmount kit).
Page 29: Figure 1- 1: Compartments For Sampling Modules
Installation Large-module compartments (2) Small-module compartments (4) Connect ESD wrist strap here Figure 1- 1: Compartments for sampling modules Maximum Configuration You can install up to two large sampling modules and four small modules for a total of 10 inputs. Of these 10 inputs, only eight inputs can be active at one time (see Figure 1- -2, top two configurations).
Page 30: Connect The Peripherals
Installation Connect the Peripherals The peripheral connections are mostly the same as those you would make on a personal computer. The connection points are shown in Figure 1- -3. See Table 1- -1 on page 1- -13 for additional connection information. WARNING.
Page 31: Power On The Instrument
Installation Table 1- 1: Additional accessory connection information Item Description Monitor If you use a non-standard monitor, you may need to change the the Windows display settings to achieve the proper resolution for your monitor. Printer Connect the printer to the EPP (enhanced parallel port) connector directly.
Page 32: Figure 1- 5: On/Standby Switch Location
Installation CAUTION. Connect the keyboard, mouse, and other accessories before applying power to the product. Connecting the accessories after powering on the instrument can damage the accessories. Two exceptions are the USB keyboard and mouse that ships with the instrument. Both can be plugged or unplugged without first turning power off.
Page 33: Powering Off The Instrument
Installation Powering Off the Instrument The instrument has a built-in soft power-down function that safely powers down the instrument when you push the On/Standby button. You do not need to close the UI application or Windows before using the On/Standby button. To completely remove power to the instrument, first soft power-down the instrument using the On/Standby button, and then set the power switch on the rear panel to off.
Page 34: Description
Installation Description There are two sets of CDs that ship with this instrument: H OS Rebuild CD. This 2-disk set contains the operating system for the instrument. This CD set, which can be used to rebuild the instrument hard drive, includes the Windows operating system installation. H Product Software CD.
Page 35: Incoming Inspection
To complete the incoming inspections procedures requires the following test equipment: H One SMA cable, such as Tektronix part number 174-1427-00. H One 50 Ω BNC cable, such as Tektronix part number 174-1341-00. 1- 17 CSA8000B & TDS8000B User Manual...
Page 36: Perform The Diagnostics
H One or more (quantity to match number of electrical channels to compen- sate) 50 Ω terminators, such as Tektronix part number 015-1022-01 H One 50 Ω terminator cap, such as Tektronix part number 011-0049-02 H One 80E00-series electrical sampling modules installed as outlined in its User manual.
Page 37 Incoming Inspection 2. Select a diagnostics suite: a. In the dialog box, click the Subsystem Level tab. b. Select the all the entries by clicking the first entry Control Proc and dragging down to select the rest. All entries should be highlighted as shown above.
Page 38: Perform The Compensation
50 Ω terminations on all electrical module channels (Tektronix part number 015-1022-xx). Dust covers on all optical module channels. The sampling modules ship from Tektronix with the proper termina- tions and dust covers installed. Prerequisites First, all sampling modules to be compensated must be installed as outlined in their user manuals.
Page 39: Perform The Functional Tests
Incoming Inspection b. Wait until the Status for all items you wish to compensate changes from Warm Up to Pass, Fail, or Comp Req’d. c. Under Select Action, click the Compensate option button. d. From the top pulldown list, choose All (default selection) to select the main instrument and all its modules as targets to compensate.
Page 40 Verify Electrical Input Install the test hookup and preset the instrument controls: Channels Equipment One SMA cable, such as Tektronix part number 174-1427-00. required Prerequisites At least one electrical (80E00 series) sampling module must be installed as outlined in its user manual.
Page 41: Figure 1- 7: Hookup For Electrical Functional Tests
Incoming Inspection CSA8000/TDS8000 SMA cable from DC calibration output to 80E00 C3 input Figure 1- 7: Hookup for electrical functional tests 4. Set the DC CALIBRATOR OUTPUT: a. Push the Vertical MENU front-panel button. This displays the Vert Setup dialog box. NOTE.
Page 42 Incoming Inspection 6. Verify that the channel is operational: Confirm that the following statements are true: H The vertical scale readout for the channel under test shows a setting of 100 mV, and a DC level is at about 2 divisions above center screen. H The front-panel vertical POSITION knob (for the channel you are testing) moves the DC level up and down the screen when rotated.
Page 43 Incoming Inspection c. Set the Vertical Scale, Vertical Offset, and DC Calibration Output to the levels shown in the first row of the table that follows. d. In Measurement readout on screen, verify that the Mean measurement for the channel under test falls within the limits given in the table. e.
Page 44: Figure 1- 9: Channel Button Location
Incoming Inspection 3. Select the channel to test: Push the channel button for the channel you want to test. The button lights amber and the channel displays. See Figure 1- -9. Channel buttons Figure 1- 9: Channel button location 4. Verify that the channel is operational: Confirm that the following statements are true.
Page 45: Figure 1- 10: Optical Channel Verification
Incoming Inspection NOTE. If the position knob was set to 0.000, you can confirm this in the Vertical menu (use Basic button in the dialog box). Baseline Vertical offset Control bar Vertical offset setting Figure 1- 10: Optical channel verification 5.
Page 46: Figure 1- 11: Hookup For The Time Base Tests
After verifying the channels, you can now verify that the time bases function. Time Bases Work This verification is done using a front-panel signal. Equipment One SMA cable, such as Tektronix part number 174-1427-00. required One 10x SMA attenuator, such as Tektronix 015-1003-00. One electrical (80E00-series) sampling module.
Page 47: Figure 1- 12: Channel Button Location
Incoming Inspection d. Push the channel button for the channel you connected to in step 2. See Figure 1- -12 on page 1- -29. The button lights and the channel display comes on. e. Turn the Vertical SCALE knob to set the vertical scale to 20 mV/div. The channel scale readout is displayed in the Control bar at the bottom of the graticule.
Page 48: Figure 1- 13: Main Time Base Verification
Incoming Inspection NOTE. At some temperatures, there may be extraneous data points after the first half cycle when viewing the front-panel Internal Clock output (as is done in this step). This behavior may also occur when viewing multiple cycles in TDR mode. In both cases, this behavior is normal.
Page 49: Figure 1- 14: Mag Time Base Verification
Incoming Inspection 6. Set up the Mag1 time base: a. Push the Horizontal View MAG1 button on the front panel. The Mag1 time base view will display under the Main time base view. b. Set the Horizontal SCALE to 1 s/div. The horizontal scale readout is displayed in the Control bar at the bottom of the graticule and is now reading out the scale of the Mag1 time base view.
Page 50: Figure 1- 15: Channel Button Location
This test verifies that the Gated Trigger (GT Option) is functional. This test is Test done using a front-panel signal and a rear-panel TTL connection. One 50 Ω BNC cable, such as Tektronix part number 174-1341-00 Equipment required One SMA cable, such as Tektronix part number 174-1427-00 One 50 Ω...
Page 51: Figure 1- 16: Hookup For The Gated Trigger Tests
Incoming Inspection 3. Hook up the signal source: Connect the SMA cable from the Internal Clock output through a 10x attenuator to 80E00 sampling module input channel 3 as shown in Figure 1- -16. Connect BNC cable to External Gate input at rear panel.
Page 52: Figure 1- 17: Signal Triggered
Incoming Inspection 7. Push the Horizontal MENU button, the Mode in All Timebases must be set to Lock to Int. 10 MHz. 8. Verify that Triggering occurs: Verify signal is triggered with waveform on-screen. See Figure 1- -17 on page 1- -34. Triggered signal indicator Internal clock...
Page 53: Figure 1- 18: Signal Not Triggered (Signal Frozen)
Incoming Inspection Untriggered signal indicator Control Vertical scale setting Horizontal scale setting Figure 1- 18: Signal not triggered (signal frozen) 1- 35 CSA8000B & TDS8000B User Manual...
Page 54: Figure 1- 19: Signal Not Triggered (No Signal)
Incoming Inspection Untriggered signal indicator Control Vertical scale Horizontal setting scale setting Figure 1- 19: Signal not triggered (no signal) 11. Verify that the Gated Trigger function is enabled: Disconnect 50 Ω terminator cap from the end of the cable. Verify signal is triggered (gate enabled) with waveform on-screen.
Page 55: Figure 1- 20: Signal Triggered
Incoming Inspection Triggered signal indicator Internal clock signal Control Vertical scale setting Horizontal scale setting Figure 1- 20: Signal triggered 12. Disconnect the test hook up. End of Functional Test Procedures 1- 37 CSA8000B & TDS8000B User Manual...
Page 56: Perform The Hardware And Operating System Tests (Windows 98 Only)
Incoming Inspection Perform the Hardware and Operating System Tests (Windows 98 Only) NOTE. The procedures in this section only apply to instruments using the MS Windows 98 operating system. Instruments using the MS Windows 2000 operating system do not include the QAPlus/Win software. These procedures verify the instrument hardware functions.
Page 57 Incoming Inspection Checking the Cooling Fan Power on the instrument and visually inspect the left side panel of the instrument Operation to verify that all six cooling fans are rotating. Equipment None required Prerequisites The instrument must be powered on and running. Checking the Hardware To perform a minimal check of the hardware and Windows 98 operating system and Operating System...
Page 58 Incoming Inspection NOTE. A test button is not highlighted until you select it. As you select the button for each test (tool tip appears when you point to the button), a highlight box appears around the button. When you click Start, the button blinks until the test is complete and the highlight box changes color to indicate the test is complete.
Page 59: Accessories And Options
Accessories and Options This section lists the standard and optional accessories, as well as the product options available for the instrument at the time this manual was published. Accessories Standard Table 1- -3 lists the standard accessories that ship with the instrument. NOTE.
Page 60: Optional
Accessories and Options Optional The following accessories are orderable for use with the instrument at the time this manual was originally published. Consult a current Tektronix catalog for additions, changes, and details. Table 1- 4: Optional accessories Item Part number...
Page 61: Options
Accessories and Options Options The following options can be ordered for the instrument: H Option 1K: Cart H Option 1R: Rack Mount Kit (includes hardware and instructions for converting to rackmount configuration) H Option GT: Gated Trigger option. H International Power Cords Options: H Option A1 - - Universal Euro 220 V, 50 Hz H Option A2 - - UK 240 V, 50 Hz H Option A3 - - Australian 240 V, 50 Hz...
Page 62 Accessories and Options 1- 44 CSA8000B & TDS8000B User Manual...
Page 63: Operational Maps
Operational Maps This chapter acquaints you with how the instrument functions and operates. It consists of several maps that describe the system, its operation, and its documen- tation: H Documentation Map, on page 2- -2, lists the documentation that supports the instrument.
Page 64: Documentation Map
The user manual for Electrical and Optical Modules are provided on the product software CD as PDF files. These are also available for download on the Tektronix Web site. Other module user manuals are provided with the module. 2- 2...
Page 65 Read about communication, error handling, and other information on GPIB usage. Information about other products is available on the Tektronix website. See Contacting Tektronix for information on how to access our website. Analysis and Connectivity Tools Oscilloscope Analysis and...
Page 66: System Overview Maps
System Overview Maps The instrument and its sampling modules comprise a highly capable waveform acquisition, test, and measurement system. The following model provides background information on its operation, which, in turn, may provide you insight on how the instrument can be used. Functional Model Map Modular Sampling Signal Processing...
Page 67 System Overview Maps H Digital Signal Acquisition System. Acquires a waveform record from each signal you apply to each channel using the following subsystems: H Acquisition System. Sets vertical offset for the vertical acquisition window for each channel. Performs the actual A/D conversion and storing of digitized samples.
Page 68: Process Overview Map
System Overview Maps Process Overview Map Process overview Process block description The instrument starts in the idle state; it enters this state Idling... Reset upon power up, upon receiving most control setting changes, Abort or upon finishing acquisition tasks. Power On When you toggle its RUN/STOP control to RUN, the Stop condition?
Page 69: User Interface Map - - Complete Control And Display
User Interface Map - - Complete Control and Display Menu Bar: Access to data I/O, Status Bar. Trigger status printing, online help system, and waveform count and set-up functions Tool Bar: Handy access to key features, including the setup dialogs, acquisition modes, triggering modes, and online help Measurements Bar: Quick...
Page 70: Front Panel Map - - Quick Access To Most Often Used Features
Front Panel Map - - Quick Access to Most Often Used Features Turn knob to adjust most control fields in setup dialogs. Press the Select button to switch among fields. Press the Fine button to toggle between normal and fine adjustment. Press to start and stop acquisition or clear all channel waveforms at once.
Page 71: Display Map - - Single Graticule View
Display Map - - Single Graticule View Drag cursors to measure waveforms on screen. Drag the Horizontal Reference to move the point around which horizontal scaling expands and contracts the waveforms. Drag the Waveform Icon vertically to position waveform. Right click on a waveform or its icon for handy access to often used setup controls and properties.
Page 72: Display Map - - Multiple Views
Display Map - - Multiple Views Drag the markers to enclose the portion of waveform to appear in Mag 2 View. Drag the markers to enclose the portion of waveform to appear in Mag 1 View. MAIN View Drag the border between graticules to vertically size View Main, Mag1, and Mag2...
Page 73: Front Panel I/O Map
Front Panel I/O Map Floppy disk drive accessible from Windows Compartments for large modules, up to two channels INTERNAL CLOCK OUTPUT DC CALIBRATION OUTPUT Compartments for small EXTERNAL 10 MHZ REFERENCE INPUT modules, up to eight channels ANTISTATIC CONNECTION wrist strap, 1 MΩ to ground TRIGGER TRIGGER TRIGGER...
Page 74: Rear Panel I/O Map
Rear Panel I/O Map Removable hard disk drive to provide individual environment for each user or to secure data, press to release CDROM drive accessible from Windows, press to open USB connector for mouse or keyboard and mouse PS-2 connectors for mouse and keyboard Upper VGA port to connect a second monitor for side-by-side display Lower VGA port to connect a...
Page 75: Overview
Overview This chapter describes how the many features of the instrument operate. Please note the following points on using this chapter: H Each section in this chapter provides background information needed to operate the instrument effectively as well as the higher-level procedures for accessing and using the features.
Page 76 Overview 3- 2 CSA8000B & TDS8000B User Manual...
Page 77: Acquiring Waveforms
Acquiring Waveforms Before you can display, measure, or analyze a waveform, you must acquire it from a signal. This instrument comes equipped with the features you need for capturing your waveforms. The following topics provide an overview of captur- ing signals and digitizing them into waveform records: H Signal Connection and Scaling: How to connect signals to the instrument channels;...
Page 78: Signal Connection And Scaling
Acquiring Waveforms Signal Connection and Scaling This section presents an overview of the instrument features related to setting up the input signal for digitizing and acquisition. It addresses the following topics: H Where to find information for installing sampling modules and connecting input signals H How to turn on channels and adjust their vertical scale, position, and offset H How to set the horizontal scale, position, and record length of the Main (time...
Page 79: What's Special
(Insert your sampling-module user manual(s) in Appendix C at the back of this manual for ready reference.) You can also check your Tektronix catalog for connection accessories that may support your application.
Page 80 Acquiring Waveforms CAUTION. Install sampling modules before applying power and before connect- ing them to the signals you want to test. See your sampling-module user manual for instructions. CAUTION. Sampling modules are inherently vulnerable to static damage. Always observe static-safe procedures and cautions as outlined in your sampling-module user manual.
Page 81 Acquiring Waveforms Clipped H Set horizontal scale, position, and resolution (record length) so that the acquired waveform record includes the signal attributes of interest with good sampling density on the waveform. The settings you make define the horizontal acquisition window, described in Horizontal Acquisition Window Considerations on page 3- -17.
Page 82: To Set Up The Signal Input 3
Acquiring Waveforms Flexible Control Access. The product provides multiple methods for adjusting acquisition controls. This manual focuses on basic setup through the front panel, and the use of the User Interface (UI) Application displayed full screen. See the display maps, beginning on page 2- -9, for UI alternatives to controlling vertical and horizontal setup.
Page 83 Acquiring Waveforms Overview To set the signal input (cont.) Related control elements and resources Push the channel button (turns amber) to assign Select the input the waveform buttons, 1 - - 8, to operate on signal channel channel waveforms. Push a waveform button to select the signal channel (it displays).
Page 84 Acquiring Waveforms Overview To set the signal input (cont.) Related control elements and resources Set the Push the View Main button to make sure the main time horizontal base view is selected. Use horizontal knobs to scale and acquisition position the waveform on screen and to set sample window resolution.
Page 85: To Autoset The Instrument
Acquiring Waveforms To Autoset the Instrument With an input signal connected, use the procedure that follows to autoset based on the characteristics of the input signal. Autoset operates on the selected channel only. Overview To autoset Control elements and resources Prerequisites 1.
Page 86 Acquiring Waveforms Overview To autoset (cont.) Control elements and resources Define 4. Click Define Autoset in the Utilities menu to display the Autoset properties dialog box. To change the autoset criteria, select from: Edge to setup the default autoset for instrument to acquire the waveform data such that the center 20% of the record contains a rising edge.
Page 87: To Reset The Instrument
Acquiring Waveforms NOTE. Autoset sets the vertical position to zero and adjusts the vertical offset to center the signal in the display. If a standard mask is active for the selected waveform, Autoset adjusts the selected waveform record to match the mask, if possible. Autoset adjusts the vertical scale and offset, horizontal scale, position, and reference parameters as required for the mask standard.
Page 88 Acquiring Waveforms Autoset Considerations. Autoset acquires samples from the input signal and attempts to take the following actions based on the input data: H Evaluate the amplitude range of the input signals and offset of the vertical acquisition window to acquire the signal without clipping. H Set the trigger level to the approximate midlevel of the trigger signal being applied (either an external trigger or a clock-recovery trigger).
Page 89: Figure 3- 2: Setting Vertical Scale And Position Of Input Channels
Acquiring Waveforms The vertical scale and position controls do not affect the vertical acquisition window, rather they adjust the display system to display the waveform as follows: H The vertical scale (per division) setting determines the portion of the vertical acquisition window that appears in the graticule, allowing you to scale it to contain all of the window or only part.
Page 90 Acquiring Waveforms NOTE. Amplitude-related automatic measurements (for example, peak-to-peak and RMS) will be accurate for vertical windows like those shown in Figure 3- -2 a and b on page 3- -15 because neither waveform is clipped (that is, both waveforms are acquired). But if the signal amplitude were to extend outside the vertical acquisition window, the data acquired becomes clipped.
Page 91: Figure 3- -3: Varying Offset Positions Vertical Acquisition
Acquiring Waveforms Vertical window = 1 V peak-to-peak (fixed by sampling module used) Acquisition window shifts Offset +300 mV positive to capture overshoot (Near waveform top level) Offset 0.0 V (At waveform ground reference) Offset - - 300 mV Acquisition window shifts (Waveform bottom level) negative to capture preshoot Figure 3- 3: Varying offset positions vertical acquisition window on waveform...
Page 92: Figure 3- 4: Horizontal Acquisition Window Definition
Acquiring Waveforms applied to all channels in parallel. (See Independent vs. Shared Window on page 3- -20.) These parameters are: H The external trigger signal that you input and set the trigger system to recognize determines the point relative to the input waveform that triggers the instrument.
Page 93 Acquiring Waveforms Horizontal Scale vs. Record Length vs. Sample Interval vs. Resolution. These parameters all relate to each other and specify the horizontal acquisition window. Because the horizontal acquisition window must fit in the 10 horizontal division display, for most cases, you just set the duration of the horizontal acquisition window (10 divs x the scale setting) as described in (1) below.
Page 94: Figure 3- 5: Common Trigger, Record Length, And Acquisition Rate For All Channels
Acquiring Waveforms NOTE. Resolution and the equivalent elements, sample interval and sample rate (see equation 3 above), are not settable directly, but are derived. You can, however, check the resolution at anytime in the resolution readout (push the Horizontal Menu button). Also note, that the Resolution knob actually adjusts the record length to increase sample density (detail).
Page 95: Setting Acquisition Controls
Acquiring Waveforms Setting Acquisition Controls This section overviews the instrument acquisition features—those that start and stop acquisitions and those that control how the instrument processes the data as it is acquired (just sampled, or averaged or enveloped). Special features, keys to using, and operation controls are covered.
Page 96: What's Excluded
Acquiring Waveforms What’s Excluded? Envelope acquisition mode can not be used with FrameScan acquisitions; you must use Sample or Average modes. Keys to Using The key points that follow describe operating considerations for setting up the acquisition system so the waveforms acquired best fit your requirements. Acquisition Modes.
Page 97: Figure 3- 6: Aliasing
Acquiring Waveforms Global Controls. Like the horizontal controls, the acquisition controls apply to all active channels. For example, channel 1 cannot acquire in Sample mode while channel 2 acquires in Envelope mode; you cannot stop channel 8 from acquiring (if turned on) while other channels continue to acquire. Unlike horizontal controls, acquisition settings extend across time bases: you cannot set a different sample mode for channels acquired in the Mag1 time base;...
Page 98: To Set Acquisition Modes
Acquiring Waveforms To Set Acquisition Modes Use the procedure that follows to set the data-acquisition mode and specify acquisition start and stop methods. For more detailed information, display online help when performing the procedure. Overview To set acquisitions modes Control elements and resources Prerequisites 1.
Page 99 Acquiring Waveforms Overview To set acquisitions modes (cont.) Control elements and resources Set the Stop Under Stop After, click one of the following options: mode and action Run/Stop Button Only Condition If you selected Condition, choose a condition from the drop-down list, such as Number of Acquisitions or Mask Total Hits, to stop on.
Page 100: To Start And Stop Acquisition
Acquiring Waveforms To Start and Use the procedure that follows to start and stop acquisition. Stop Acquisition Overview To start and stop acquisition Control elements and resources Prerequisites 1. Instrument must be installed with sampling modules in place before powering on the instrument. Instrument must be powered up, with horizontal and vertical controls set up.
Page 101: Acquisition Control Background
Acquiring Waveforms Acquisition Control Background This section contains background information on the data sampling and acquisition process that can help you more effectively setup the acquisition window of each channel. This section: H describes the acquisition hardware. H defines the sampling process, sampling modes, and the waveform record. H describes the acquisition cycle in Normal and FrameScan modes.
Page 102: Sampling Modes
Acquiring Waveforms repeated trigger events, also provides the digitized signal data from which the instrument assembles the waveform record (see Figure 3- -9 on page 3- -29). The signal parts within the vertical range of the sampler are digitized. See Figure 3- -8.
Page 103: Acquisition Cycle
Acquiring Waveforms Sample interval First sampled and digitized point Waveform record acquired Recurring trigger events over many acquisitions, from trigger signal 1 sample per acquisition Record length Horizontal delay Figure 3- 9: The waveform record and its defining parameters As Figure 3- -9 shows, the instrument acquires points in order from left to right, with each point from a separate trigger event, and delayed from that event by: horizontal delay + (sample interval x (sample number - - 1)) When all the points in the waveform record have been sampled and digitized, the...
Page 104: Framescan Acquisitions
Acquiring Waveforms FrameScan Acquisitions This instrument can modify its normal acquisition process to help you analyze pattern-dependent failures in high bit-rate communications signals. Why Use? FrameScan acquisitions allow detailed display and analysis of individual, complete waveforms or of the bit sequences leading up to a failure. This ability to identify the specific patterns that caused the failures makes using FrameScan mode superior to traditional methods.
Page 105: What's Excluded
Acquiring Waveforms What’s Excluded? The instrument must be in Average or Sample acquisition modes; FrameScan excludes Envelope acquisition mode. Keys to Using The key points that follow describe FrameScan mode operating behavior and provide background to help you to use this feature. Determine Start Bit and Scan Bits.
Page 106: Figure 3- 10: How Framescan Acquisition Works (Scanning On A 127-Bit Prbs Shown)
Acquiring Waveforms for the frame, or until acquisition stops due to a specific test condition, such as the failure of a mask test. The resulting horizontally skewed FrameScan acquisitions display successive individual bits acquired in increasing time order. FrameScan acquisitions can continue through an entire frame of data if needed to help you to uncover faulty bit sequences leading up to pattern-dependent failures.
Page 107: To Acquire In Framescan Mode 3
Acquiring Waveforms To Acquire in Use the procedure that follows to set up the instrument to acquire in FrameScan FrameScan Mode mode. Overview To acquire in FrameScan mode Control elements and resources Prerequisites 1. The instrument must have an appropriate sampling module in place before powering on the instrument.
Page 108 Acquiring Waveforms Overview To acquire in FrameScan mode (cont.) Control elements and resources Set the bit rate 8. Set the horizontal scale so one acquisition record is equal to one bit. Use one of the two methods that follow: Select a comm. standard, or...
Page 109 Acquiring Waveforms Overview To acquire in FrameScan mode (cont.) Control elements and resources Set a display 12. If you want to display the frame-scanned acquisition as mode an eye diagram, set one of the following display modes: Select Infinite Persistence or Variable Persis- tence in the Display Setup dialog box (from the application menu bar, select Setup, and then select Display).
Page 110: To Acquire In Framescan Mode
Acquiring Waveforms To Catch a Bit Error FrameScan Acquisition, when coupled with mask testing, provides the tool you need to capture a defective bit and examine the pattern leading up to it. Overview To catch a bit error Control elements and resources Prerequisites 1.
Page 111 Acquiring Waveforms Overview To catch a bit error (cont.) Control elements and resources Set conditional From the application menu bar, select Setup, and then acquisition and select Acquire. start testing In the Acq Setup dialog box (see right), check the Condition option under Stop After.
Page 112 Acquiring Waveforms 3- 38 CSA8000B & TDS8000B User Manual...
Page 113: Triggering
Triggering To properly acquire waveforms — to sample a signal and assemble it into a waveform record — you need to set up the instrument trigger conditions. This section provides an overview of the instrument trigger features and their use. Signal processing Acquisition Output and...
Page 114: Keys To Using
Triggering Gated Triggering. For instruments equipped with Option GT, the system allows triggering to be enabled and disabled (gated) based on a TTL signal at a rear panel input. See To Use Gated Trigger on page 3- -50. Keys to Using The key points that follow describe operating considerations for setting up to trigger on your waveforms.
Page 115: Figure 3- 11: Slope And Level Define The Trigger Event
Triggering Positive-going edge Negative-going edge Trigger level can be adjusted vertically. Trigger slope can be positive or negative, with trigger point occurring on the slope specified. Figure 3- 11: Slope and level define the trigger event Trigger Modes. The trigger modes control the behavior of the instrument when not triggered: H Normal mode sets the instrument to acquire a waveform only when triggered.
Page 116: Optional 1
Triggering Trigger Sources. The trigger source provides the signal that the trigger system monitors. The source can be: H the internal clock of the instrument (TDR clock rate), with user-selectable clock frequencies. The Internal Clock Out connector supplies a replica of the internal clock at the instrument front panel.
Page 117: Options 1
Prescaler input and the input channel, so that the sampled signal is also the trigger signal. Any application requiring that Set source to External Direct, and use a Tektronix probe as you probe the trigger source described in Probe-to-Trigger Source Connection on page 3- - 44.
Page 118 Triggering Trigger Source Connectors. External triggers can be connected to either the Trigger DIRECT or Trigger PRESCALE connectors on the front panel (see Figure 3- -13): H Signals connected to the PRESCALE connector are divided by eight and then fed to the trigger circuits. H Signals connected to the DIRECT connector are fed directly to the trigger circuitry.
Page 119 Triggering Gated Trigger Connector (Option GT equipped). You can attach a BNC cable to the External Gate input at rear panel (TTL connection). Two conditions must be satisfied to get a stable display of waveform data: H The channel and trigger must be otherwise triggerable without the trigger gate.
Page 120: Figure 3- -14: Holdoff Adjustment Can Prevent False Triggers 3
Triggering recognize when the next trigger conditions are satisfied and cannot generate the next trigger event. When instrument is triggering on undesired events (Figure 3- -14, top waveform), you adjust holdoff to obtain stable triggering. Holdoff Holdoff Holdoff Trigger level Indicates trigger points Holdoff Holdoff...
Page 121: Figure 3- -15: Trigger To End Of Record Time (Eort) 3
Triggering For example: EORT = 6 s + (1- -0.1(.5) x 1 s/div x 10 div + 0 = 6 s + 5 = 11 s, when: Horizontal position = 6 s Horizontal Ref = 50% Time/Division = 1 s/div Channel Deskew = 0 (set to minimum) In this example, because 11 s is greater than 5 s, the current control settings determine the minimum usable holdoff the instrument can use.
Page 122: To Trigger
Triggering To Trigger Use the procedure that follows when setting up the instrument to trigger acquisitions. Overview To trigger Control elements and resources Prerequisites 1. The instrument must be installed with sampling modules in place. Acquisition system should be set to Run, and the vertical and horizontal controls should be set appropriately for the signal to be acquired.
Page 123 Triggering Overview To trigger (cont.) Control elements and resources Verify When the instrument is triggered, the word Triggered is triggering displayed in the toolbar on screen. You can use also the trigger lights to verify triggering status as follows: READY lights when the instrument acquisition system is running but the trigger system is not receiving valid trigger events.
Page 124: To Use Gated Trigger
Triggering To Use Gated Trigger Use the procedure that follows when setting up the instrument to use the gated trigger. Gated trigger is only available with Option GT installed. Overview To use gated trigger Control elements and resources Prerequisites 1. The Acquisition system should be set to Run, and the vertical and horizontal controls should be set appropri- ately for the signal to be acquired.
Page 125 Triggering Overview To use gated trigger (Cont.) Control elements and resources Enable gated In the Enhanced Triggering options section of the dialog triggering box, check Gated Trigger. Check to enable Complete set up 5. Attach an appropriate TTL-gating signal to the TRIGGER GATE (TTL) rear-panel connector.
Page 126 Triggering 3- 52 CSA8000B & TDS8000B User Manual...
Page 127: Displaying Waveforms
Displaying Waveforms To make use of the waveforms you acquire, you will often want to display them. This instrument includes a flexible, customizable display that you can control to examine and analyze acquired waveforms. This section presents an overview of display operation in the topics Using the Waveform Display and Customizing the Display.
Page 128: Figure 3- -16: Display Elements 3
Displaying Waveforms (2) Graticule (5) Horizontal reference (6) Preview mode indicator (3) Upper limit of graticule (selected waveform) (7) Main view (1) Waveform display (3) Lower limit of graticule (selected waveform) (7) Mag1 view (4) Horizontal scale readout (selected waveform) Figure 3- 16: Display elements (1) Waveform display: the area where the waveforms appear.
Page 129: Why Use
Displaying Waveforms view is a representation of a signal on an associated time base—the Main time base with the Main view, which is always displayed, or one of the two Mag views, each with its own time base and graticule. The display of the Mag views can be turned on or off.
Page 130: Keys To Using
Displaying Waveforms Keys to Using The key points that follow describe operating considerations for setting up the instrument time base views so that they best support your data-analysis tasks. Waveform Display. In general, the method of displaying a waveform is to define the waveform, and then turn it on.
Page 131: Table 3- 3: Operations Performed Based On The Selected Waveform
Displaying Waveforms Table 3- 3: Operations performed based on the selected waveform Control function Waveform supports? Operating notes Math Vertical Scale If more than one time base is displayed, these controls adjust the selected channel waveform in all time bases selected channel waveform in all time bases.
Page 132 Displaying Waveforms and then adjust it using the Horizontal Scale, Resolution, and Position knobs. Only channel waveforms can have their horizontal parameters set directly. Table 3- -3 shows how horizontal operations relate to the waveform types; the key points to remember follow: H As Table 3- -3 shows, horizontal operations affect all channel waveforms, but in the selected view only.
Page 133: Figure 3- -17: Horizontal Position Includes Time To Horizontal Reference 3
Displaying Waveforms Mag1 and Mag2 are Magnifying Timebases. The Mag1 and Mag2 time bases are so named because they cannot be set to a more coarse (slower) horizontal scale than that of the Main. When set to a more fine (faster) horizontal scale, they can be thought of as magnifying a segment of the Main time base.
Page 134 Displaying Waveforms Horizontal Units. You can specify the time values in seconds, bits or distance from the Horizontal Setup dialog box. When you select Distance as the timebase units, the timebase scale and position controls and the readouts use (appear with) distance units.
Page 135: Table 3- 4: Equivalent Mouse And Touchscreen Operations
Displaying Waveforms Table 3- 4: Equivalent mouse and touchscreen operations Operations Mouse Stylus or finger Select waveforms Left click object on screen Touch object on screen Push toolbar and dialog box buttons Display menus and select menu items Activate list boxes Position cursors on screen, draw a zoom Left click and drag Touch and drag...
Page 136: To Display Waveforms In The Main Time Base View 3
Displaying Waveforms To Display Waveforms in Use the procedure that follows to become familiar with the display adjustments the Main Time Base View you can make. Overview To control the Main view Related control elements and resources Prerequisites 1. The instrument must be installed with sampling modules in place.
Page 137 Displaying Waveforms Overview To control the Main view (cont.) Related control elements and resources Set the horizon- Push the View Main button to make sure the Main time tal display base view is selected. Use the Horizontal knobs to scale parameters and position the waveform on screen and to set sample resolution.
Page 138: To Display Waveforms In A Mag View 3
Displaying Waveforms Overview To control the Main view (cont.) Related control elements and resources Explore the 10. The next procedure describes how to set up and Mag time base control the Mag time bases. controls See To Display Waveforms in a Mag View on page 3- - 64. End of Procedure To Display Waveforms Use the procedure that follows to become familiar with the display adjustments...
Page 139 Displaying Waveforms Overview To control a Mag view (cont.) Related control elements and resources Set horizontal Use the Horizontal knobs (see right) to achieve a good display display of the waveform in the Mag time base. parameters Time base settings for Channel waveforms will be adjusted as you use the controls;...
Page 140: Customizing The Display
Displaying Waveforms Customizing the Display Why Use? Use the display customizing features this instrument provides to present the display elements—color, graticule style, waveform representation, and so on—according to your preferences. What’s Special? Color grading. You can select color grading of a waveform so that its data color or intensity reflects the frequency of occurrence of the data.
Page 141 Displaying Waveforms Normal and Persistence Displays. Use display persistence to control how waveform data ages: H Normal style displays waveforms without persistence: each new waveform record replaces the previously acquired record for a channel. You can choose to display normal waveforms as vectors, which displays lines between the record points, or dots (vectors off) which displays the record points only.
Page 142: To Set Display Styles
Displaying Waveforms To Set Display Styles Use the procedure that follows to become familiar with the display styles you can set. Overview To set display styles Related control elements and resources Prerequisites 1. The instrument must be powered up, with any waveform you want to display on screen.
Page 143: To Customize The Graticule And Waveforms 3
Displaying Waveforms Overview To set display styles (cont.) Related control elements and resources Select a From the the Setup Display dialog box (see right), persistence choose: Mode Infinite Persistence to make data persist until you change some control (such as scale factor) or explicitly clear the data.
Page 144: Use A Waveform Database
Displaying Waveforms Overview Customizations you can make (cont.) Related control elements and resources Change wave- Right click on the waveform or its icon. See right. Waveform Icon form color Choose Properties from the menu that pops up. or label Type a new name in the Waveform Label box. The instrument will use the new label to mark the selected waveform in the graticule area.
Page 145 Displaying Waveforms Overview Customizations you can make (cont.) Related control elements and resources Reduce a wave- Right click on the waveform or its icon. See right. form to its icon 10. Choose Show from the menu that pops up to toggle the waveform between shown (checked) and hidden (unchecked).
Page 146 Displaying Waveforms 3- 72 CSA8000B & TDS8000B User Manual...
Page 147: Measuring Waveforms
Measuring Waveforms To assist you in analyzing the waveforms you acquire, the instrument comes equipped with cursors and automatic measurements. This section describes these tools and how you use them: H Taking Automatic Measurements, on page 3- -74, describes how you can set up the instrument to automatically measure and display a variety of waveform parameters.
Page 148: Taking Automatic Measurements
Measuring Waveforms Taking Automatic Measurements Why Use? This powerful and flexible tool provides automatic extraction of various parameters from the waveforms that this instrument acquires. Automated measurements quickly give you immediate, continuously updating, measurement results for a rich selection of waveform parameters, such as risetime or extinction ratio.
Page 149: Figure 3- -19: Measurement Annotations On A Waveform 3
Measuring Waveforms Annotations indicate the waveform region determining measurement Figure 3- 19: Measurement annotations on a waveform Use Databases as Sources. If you define the source you want to measure as a database in the Meas Setup dialog box, you can use the database of that waveform as source.
Page 150: What's Excluded
Measuring Waveforms What’s Excluded? The following exclusions apply when using automatic measurements: H More than eight measurements at one time are not allowed. H Except for Average Optical Power, all measurements of the category RZ or NRZ must be performed on a waveform database (see Use Databases as Sources on page 3- -75).
Page 151 Measuring Waveforms waveform database. You can measure the waveform instead of its database if you turn off Use Wfm Database in the Meas setup dialog box. H If you assign a database to a waveform already being used as a source for an automatic measurement, it will not automatically measure the waveform database;...
Page 152: Figure 3- -20: High/Low Tracking Methods 3
Measuring Waveforms High (min/max) High (mean) High (mode) Mid reference Low (mode) Low (mean) Low (min/max) Figure 3- 20: High/Low tracking methods H Mean (of Histogram) sets the values statistically. Using a histogram, it selects the mean or average value derived using all values either above or below the midpoint (depending on whether it is defining the high or low reference level).
Page 153: Figure 3- -21: Reference-Level Calculation Methods 3
Measuring Waveforms Reference Levels Method. You can choose the method that the instrument uses to determine a second group of levels when taking time-related measurements. These levels are the High, Mid, and Low references. For example, the measure- ment system takes risetime from the waveform-edge segment that transitions from the Low to the High reference levels.
Page 154 Measuring Waveforms The AOP method is the Average Optical Power reference level. This reference level selection is best used when taking the Optical Modulation Amplitude (OMA) measurement on a pulse waveform. (The AOP setting is ignored for NRZ waveforms.) This method is selected by default when measurement type is set to OMA.
Page 155: To Take Automatic Measurements
Measuring Waveforms Overview To take automatic measurements (cont.) Related control elements and resources Take Automatic Select one of the signal (waveform) types and then measurements select a category from the measurement bar. Click the measurement you want in the measure- ment tool bar.
Page 156 Measuring Waveforms Overview To take automatic measurements (cont.) Related control elements and resources To measure a From the application menu bar, select Setup, and then database select Measurement. See right. In the Meas Setup dialog box, make sure the measurement (one of Meas1 through Meas8) is selected.
Page 157: To Localize A Measurement
Measuring Waveforms To Localize a Use the procedure that follows to set gates on a measurement source, which Measurement forces the measurement to be taken over a segment of the waveform (otherwise, the entire waveform feeds the measurement). Overview To gate a measurement Related control elements and resources Prerequisites 1.
Page 158 Measuring Waveforms Overview To gate a measurement (cont.) Related control elements and resources Gate G1 Gate G2 End of Procedure 3- 84 CSA8000B & TDS8000B User Manual...
Page 159: Taking Cursor Measurements
Measuring Waveforms Taking Cursor Measurements Why Use? Use cursors to measure amplitude and time quickly and with more accuracy than when using graticule measurements. Because you position cursors wherever you want on the waveform, they are easier to localize to a waveform segment or feature than automatic measurements.
Page 160: What Sources Can I Measure
Measuring Waveforms What Sources Cursors can measure channel, reference, and math waveforms, as well as Can I Measure? waveform databases. You may set the source of each cursor explicitly in the Cursor Setup dialog box. Keys to Using Cursors The key points that follow describe operating considerations for setting up cursors to obtain best measurement results.
Page 161 Measuring Waveforms cursor. Up to the time you turn cursors on, you can select a waveform on screen to use it as the source for the cursors. H Once cursors are on, selecting a different waveform does not change the source the cursors measure.
Page 162: Figure 3- -23: Components Determining Time Cursor Readout Values 3
Measuring Waveforms Horizontal Ref = 0% First sampled point Trigger point of cursor source Cursor readout (tn) = Time to first point Horizontal divs x sec/div Cursor Figure 3- 23: Components determining Time cursor readout values Note that a vertical cursor readout (t1 or t2) includes and varies directly with the time-to-first-point component, which varies directly with the horizontal position set for the time base used by the cursor-source waveform.
Page 163 Measuring Waveforms To Take a Cursor Use the procedure that follows to take cursor measurements on waveforms. Measurement Overview To take cursor measurements Related control elements and resources Prerequisites 1. At least one waveform must be selected on screen. Or you can set cursor values directly using the procedure referenced at right.
Page 164: To Take A Cursor Measurement
Measuring Waveforms Overview To take cursor measurements (cont.) Related control elements and resources To reassign cur- Press the Cursor button repeatedly to toggle through the sors cursor selections until the cursors are off. Then select a new waveform on screen. Tip.
Page 165 Measuring Waveforms Overview To set the cursor sources (cont.) Related control elements and resources Select the cur- From the pop-up list (see right) for each of Cursor 1 and Click to access sources sor sources Cursor 2, select a source: Select source from To measure a single source, choose the same pop-up list...
Page 166: Optimizing Measurement Accuracy
Measuring Waveforms Optimizing Measurement Accuracy Why Use? The procedures given here will increase the accuracy of the measurements you take. Compensation This instrument can compensate itself and the sampling modules installed, optimizing the internal signal path used to acquire the waveforms you measure. Compensation optimizes the capability of the instrument to make accurate measurements based on the ambient temperature.
Page 167 Measuring Waveforms Overview To perform a compensation (cont.) Related control elements and resources 3- 93 CSA8000B & TDS8000B User Manual...
Page 168 Measuring Waveforms Overview To perform a compensation (cont.) Related control elements and resources Select the Wait until the Status for all items you want to scope of the compensate changes from Warm Up to Comp Req’d or compensation Pass. In the Select Action fields, select Compensate. From the top pulldown list, select the target to Click to select compensate.
Page 169: Compensation
Measuring Waveforms Overview To perform a compensation (cont.) Related control elements and resources Save the In the Select Action fields, select Save. compensation Click the Execute button to save the new compensation results. The new compensation results will be lost when the instrument is powered down if they are not saved.
Page 170 Measuring Waveforms To Deskew Channels When making differential, common-mode, or other measurements, you may need to null out the propagation delay contributed by the input cabling between two or more channels. Use the following procedure to adjust the deskew between channels.
Page 171 Measuring Waveforms Overview To deskew between channels (cont.) Control elements and resources Set up the Set up the channel to be used as the reference channel: reference Push the channel numbered button under Vertical channel on the front panel. Use the Vertical SCALE knob and POSITION knobs to display the waveform edge to be deskewed to fill the screen vertically.
Page 172: To Perform Dark-Level And User Wavelength Gain Compensations 3
Measuring Waveforms To Perform Dark-Level Performing a dark-level compensation maximizes the accuracy of the extinction and User Wavelength Gain ratio and other optical automatic measurements you take. Performing a User Wavelength Gain compensation optimizes an optical channel for your custom Compensations input signal.
Page 173 Measuring Waveforms Overview To perform optical compensations (cont.) Control elements and resources Run the dark- In Vert Setup dialog box, click the Dark Level button level compensa- under Compensation. See right. Follow the instructions tion on screen. Repeat steps 2 and 4 for any additional optical channels you want to compensate.
Page 174 Measuring Waveforms 3- 100 CSA8000B & TDS8000B User Manual...
Page 175: Creating Math Waveforms
Creating Math Waveforms Once you have acquired waveforms or taken measurements on waveforms, the instrument can mathematically combine them to create a waveform that supports your data-analysis task. For example, you can define a math waveform that combines waveforms mathematically (+, - -, /, x). You can also integrate a single waveform into an integral math waveform as is shown below.
Page 176: Why Use
Creating Math Waveforms Why Use? Create math waveforms to support the analysis of your channel and reference waveforms. By combining and transforming source waveforms and other data into math waveforms, you can derive the data view that your application requires. You can create math waveforms that result from: H mathematical operations on one or several waveforms or measurements: add, subtract, multiply, and divide.
Page 177: Keys To Using
Creating Math Waveforms Keys to Using The key points that follow describe considerations for creating math waveforms that best supports your data-analysis tasks. How to Create. You create math waveforms when you create a math expression. You do so by applying numerical constants, math operators, and functions to operands, which can be channel, waveforms, reference waveforms, measure- ments (scalars), or fixed scalars.
Page 178 Creating Math Waveforms Source Dependencies. In general, math waveforms that include sources as operands are affected by updates to those sources: H Shifts in amplitude or DC level of input sources that cause the source to clip also clip the waveform data supplied to the math waveform. H Changes to the vertical offset setting for a channel source that clip its data also clip the waveform data supplied to the math waveform.
Page 179: To Define A Math Waveform
Creating Math Waveforms <Term> := <Waveform> | ( <Expression> ) <Scalar> := <Integer> | <Float> | <Meas-Result> <Waveform> := <ChannelWaveform> | <ReferenceWaveform> <ChannelWaveform> := C1 | C2 | C3 | C4 | C5 | C6 | C7 | C8 <ReferenceWaveform> := R1 | R2 | R3 | R4 | R5 | R6 | R7 | R8 <UnaryOperator>...
Page 180 Creating Math Waveforms Overview To define a math waveform (cont.) Related control elements & resources Select a math Click the Math Waveform drop-down list in the dialog waveform box and select a one of the eight available math waveforms, M1 through M8. Be sure to click to check the On box, so that the waveform displays.
Page 181: Operations On Math Waveforms
Creating Math Waveforms Overview To define a math waveform (cont.) Related control elements & resources Apply the Once you have defined the math expression to your expression satisfaction, click the Apply button. Then click on the OK button to dismiss the dialog box. See To Use Math Waveforms on page 3- - 109 for more procedures.
Page 182: Keys To Using
Creating Math Waveforms You can adjust these controls for the source waveforms and your adjustments will reflect in the math waveform as the sources update. You can also magnify math waveforms using the Mag1 or Mag2 derived time bases. H Independent vertical offset. You cannot adjust the offset for a math wave- form;...
Page 183: To Use Math Waveforms 3
Creating Math Waveforms To Use Math Waveforms The procedure that follows demonstrates some common operations you can perform on math waveforms: Overview To use math waveforms Related control elements & resources Prerequisites 1. The Math waveform must be defined and displayed. See the reference listed at right.
Page 184 Creating Math Waveforms Overview To use math waveforms (cont.) Related control elements & resources Take automatic Press the Vertical MATH button, and use the measurements numbered front-panel button to choose a math waveform from M1 - - M8. (See right.) Select one of the signal types, such as Pulse, and then select a measurement category from the measurement bar.
Page 185: To Use Math Waveforms
Creating Math Waveforms Overview To use math waveforms (cont.) Related control elements & resources Take cursor Press the Vertical MATH button, and use the measurements numbered front-panel button to choose a math waveform from M1 - - M8. The button will light amber when you have chosen the waveform.
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Page 187: Data Input And Output
Data Input and Output This section describes the input and output capabilities of your instrument. Specifically, it covers: H Saving and Recalling Setups on page 3- -113 H Saving and Recalling Waveforms on page 3- -120 H Exporting Waveforms and Histograms on page 3- -128 H Printing Waveforms on page 3- -132.
Page 188: What's Special
Data Input and Output What’s Special? Some features of note follow: Commenting. The Save-Setup and the Recall-Setup dialog boxes provide for including and viewing comments with your saved setups. That way, you can store information, readable upon recall, that describes each setup you save and its intended application.
Page 189: To Save Your Setup
Data Input and Output Avoiding Setup and Waveform Mismatches. Saved setups may contain settings inappropriate for waveforms currently in your instrument. For example, you might have saved a setup that displayed a fiber channel mask, such as FC531, for testing channel 1. If later you display a gigabit ethernet signal in channel 1 and recall your saved setup, the FC531 mask will display.
Page 190 Data Input and Output Overview To save your setup Control elements & resources Prerequisites 1. The instrument must have appropriate sampling modules in place before powering on the instrument. Instrument must be powered up. See Sampling Module User Manuals for Set up the instrument controls as you want them saved sampling module installation.
Page 191 Data Input and Output Overview To save your setup (cont.) Control elements & resources Name your Name your setup file by either: setup accepting the default file name that appears in the File name: text box. clicking in the File name text box and typing a new name, replacing the default file name.
Page 192 Data Input and Output To Recall Your Setup Use the procedure that follows to recall a setup to the instrument. Remember that recalling a setup replaces the existing setup, which is lost. Overview To recall your setup Control elements & resources Prerequisites 1.
Page 193: To Recall Your Setup
Data Input and Output Overview To recall your setup (cont.) Control elements & resources Select your If not selected, select *.stp in the Save as type list box setup of file to include in the dialog box file listing. (Setup files are always type *.stp).
Page 194: Saving And Recalling Waveforms
Data Input and Output Saving and Recalling Waveforms This instrument can save any number of waveforms, limited only by the space you have to store them. Why Use? By saving a waveform, you can recall it at a later time for comparison, evalua- tion, and documentation.
Page 195: To Save Your Waveform 3
Data Input and Output To Save Your Waveform Use the procedure that follows to save a waveform or waveforms to the instrument hard disk, a floppy disk, or third party storage device. Overview To save a waveform Control elements & resources Prerequisites 1.
Page 196 Data Input and Output Overview To save a waveform (cont.) Control elements & resources Select a Navigate to the directory in which to store your destination waveform. You can: Save to a reference: Click to check Reference, and then use the pulldown list to select any reference (R1-R8).
Page 197: To Save Your Waveform
Data Input and Output Overview To save a waveform (cont.) Control elements & resources Add a comment For saves to files or to references, you can enter a (optional) useful comment about the each waveform you save. Write each comment such that it explains the purpose of the saved waveform when its waveform file is later accessed (see right).
Page 198: To Recall Your Waveform
Data Input and Output To Recall Your Waveform Use the procedure that follows to recall a waveform to a reference. You can only recall waveforms into references. NOTE. Reference waveforms do not recall because they are already instrument resident. You can copy a reference waveform to another reference: first display the reference to be copied, and then use the Save Waveform procedure to save it to another reference (R1-R8).
Page 199 Data Input and Output Overview To recall a waveform (cont.) Control elements & resources Name a Use the Look in: drop down list and buttons (see right) destination to navigate to the directory which contains a waveform that you want to recall. Select your If not selected, select *.wfm in the Files of type field to waveform...
Page 200 Data Input and Output Overview To recall a waveform (cont.) Control elements & resources For more For more help on recalling waveforms, press the Help information button in the dialog box to access contextual online help. See page 3- - 167 to learn about using online help. End of Procedure 3- 126 CSA8000B &...
Page 201: To Clear References
Data Input and Output To Clear References You can clear individual references of data individually or all at once. If a reference is listed as active and you are sure you do not want the data it contains, use the procedure that follows to clear it. You can clear any of the active references R1-R8.
Page 202: Exporting Waveforms And Histograms
Data Input and Output Exporting Waveforms and Histograms This instrument also supports export of a waveform or histogram to a file. The instrument exports the data as comma-separated ASCII text. Why Use? By exporting a waveform or a histogram, you can use it with other analysis tools, such as spreadsheets or math-analysis applications.
Page 203: To Export Your Histogram
Data Input and Output Figure 3- 25: Export dialog box To Export Your Histogram Use the process just described for exporting a waveform on page 3- -128, select the Histogram button in the Export dialog box (see Figure 3- -25). Also skip selecting a source.
Page 204 Data Input and Output Overview To use exported waveforms (cont.) Control elements & resources Import the In Excel, select Open from the File menu. Use the waveform data dialog box that pops up to navigate to the directory containing the file. In the dialog that displays, make the selections as shown right as you navigate through the Text Import Wizard.
Page 205 Data Input and Output Overview To use exported waveforms (cont.) Control elements & resources Specify a From the Chart Wizard, make sure Built In is checked. line-graph Then select the either Lines in the Standards Types chart tab or Smooth lines in the Custom Types tab. (See illustration at right.) Finish the Click Next to step through the next two steps...
Page 206: Printing Waveforms
Data Input and Output Printing Waveforms You can print the display screen, including any waveforms displayed. Before doing so, you must install and set up your printer. To Print Waveforms To print the display and its waveforms, do the following steps: Overview To print waveforms Control elements &...
Page 207 Data Input and Output Overview To Print Waveforms (cont.) Control elements & resources Configure and Configure your print job using the the standard Print Microsoft Windows Print dialog box that displays. Press the OK button to print your display. Tip. Access the printer instructions or the Windows Help system if you require more information on printing.
Page 208 Data Input and Output To Print Using To conserve ink and improve print quality when printing images of waveform Ink-saver Mode displays, you can use Ink-saver mode. Do the following steps: Overview To print using ink-saver mode Control elements & resources Prerequisites 1.
Page 209 Data Input and Output Overview To print using ink-saver mode (cont.) Control elements & resources Set Ink-saver In the Page Setup dialog box that displays, click mode Ink-saver Mode. Click OK to set the instrument to use Ink-saver mode, or click Print... to set up your print job and print the display.
Page 210 Data Input and Output To Print to a File You can also print the instrument screen and its waveforms to a file. This instrument currently supports printing to BMP, JPEG, TIFF, PNG and Targa image-file formats. NOTE. Screen images saved using the PNG (Portable Network Graphics) format can consistently achieve compression ratios better than 10:1, and often better than 50:1 compared to a BMP screen image file.
Page 211 Data Input and Output If the display screen printouts have missing information such as blacked-out Set High Color readouts, your instrument may need to be set to a higher color setting. To do so, follow the steps below: Overview To set high color Control elements &...
Page 212 Data Input and Output Overview To set high color (cont.) Control elements & resources Select the Set- In the Display Properties dialog box that displays, click tings Tab the Settings tab. Select and Set Click the monitor 1 icon (if necessary) in the Settings High Color dialog box.
Page 213: Remote Communication
Data Input and Output NOTE. If you print the screen infrequently, you may want to return the colors setting to 256 colors except when printing. To return to 256 colors, repeat the procedure above, but select 256 colors in step 4. Remote Communication Remote communication is performed through the GPIB interface.
Page 214 Data Input and Output 3- 140 CSA8000B & TDS8000B User Manual...
Page 215: Using Masks, Histograms, And Waveform Databases
Using Masks, Histograms, and Waveform Databases The instrument comes equipped with statistical tools to help you display, test, and evaluate waveforms. This section describes these tools and how you use them: H Mask Testing Waveforms, on page 3- -141, describes how you can use standard or user-defined masks to set up the instrument to automatically detect mask violations in communications and other waveforms.
Page 216: What's Excluded
Using Masks, Histograms, and Waveform Databases Mask-Specific Autoset. You can set Autoset to either Auto or Manual in the Mask Setup dialog box. When set to Auto, the instrument automatically performs a standard, mask-specific autoset whenever you select a standard mask. What’s Excluded? GPIB editing.
Page 217 Using Masks, Histograms, and Waveform Databases Mask Counts. The instrument lists statistics for each mask (polygon) in the enabled standard (or user) in the Mask readout on the right side of the instrument screen. Each mask is listed by its number, with its count of hits, the number of hits common to all masks, and the total count of waveforms acquired.
Page 218: Figure 3- -26: Creating A User Mask 3
Using Masks, Histograms, and Waveform Databases These points form Top/bottom dividing line the top of the mask (not displayed) Left-most point Right-most point These points form the bottom of the mask Figure 3- 26: Creating a user mask Note in Figure 3- -27 that a new vertex has been added to the mask shown in Figure 3- -26.
Page 219: To Mask Test A Waveform
Using Masks, Histograms, and Waveform Databases H Masks are saved with setups, so you can save sets of masks by defining them, and then storing the instrument setup. Displayed masks are overwrit- ten when you recall a stored setup, select a standard mask, or initialize the instrument.
Page 220 Using Masks, Histograms, and Waveform Databases Overview To mask test a waveform (cont.) Related control elements & resources Select the mask Select the waveform to be mask tested from the drop-down source and turn on list under Source. a mask Use the Comm Standard drop-down list to select a standard or user-defined mask.
Page 221 Using Masks, Histograms, and Waveform Databases Overview To mask test a waveform (cont.) Related control elements & resources Autoset the wave- Click the Autoset button to perform a manual autoset on form to mask the mask-source waveform. Tip. You can choose to autoset the mask-source waveform to the mask anytime you select a new mask standard;...
Page 222 Using Masks, Histograms, and Waveform Databases Overview To mask test a waveform (cont.) Related control elements & resources Restart testing 14. To restart after a Stop After condition occurs, push the front-panel CLEAR DATA front-panel button. Tip. If you want to acquire one, and only one, more waveform after the Stop After condition occurs, push the RUN/STOP front-panel button instead of CLEAR DATA.
Page 223: To Edit A Mask
Using Masks, Histograms, and Waveform Databases To Edit a Mask When you edit a mask in an existing communications standard, the mask type switches from the selected standard to type User, and uses the masks from the Standard as a basis for editing. Use the procedure that follows. Overview To edit a mask Related control elements &...
Page 224 Using Masks, Histograms, and Waveform Databases Overview To edit a mask (cont.) Related control elements & resources Select a Select a mask to edit from the Mask list. This section of mask to edit the Mask Edit dialog box lists all masks available for edit and the number of vertices each mask has.
Page 225: Counting Masks
Using Masks, Histograms, and Waveform Databases Counting Masks Mask-counting statistics are displayed in the mask readout at the right-side of the display. Mask counting statistics are displayed as soon as you enable a mask, and stay visible even if the mask isn’t displayed on screen. Mask number and hits count Total number of hits in all masks Total number of waveforms for all masks...
Page 226: To Create A New Mask
Using Masks, Histograms, and Waveform Databases To Create a New Mask Masks are created by connecting the points independently of the order they are entered. Points are connected by sorting the points in left-to-right order and grouping them across a diagonal from the left-most point to the right-most point. If two points share a horizontal position along either the left or right edge of the mask, the diagonal runs from the top left-most point to the bottom right-most point.
Page 227 Using Masks, Histograms, and Waveform Databases Overview To create a new mask (cont.) Related control elements & resources Create a Click Mask Edit to display the Mask Edit dialog box. new mask In Mask list, select the user-defined mask you wish to edit.
Page 228: Taking Histograms
Using Masks, Histograms, and Waveform Databases Taking Histograms The instrument can display histograms constructed of waveform data. You can display both vertical (voltage) and horizontal (time) histograms, but only one at a time. Histogram box Histogram readout Histogram Figure 3- 28: Vertical histogram view and statistics on data Why Use? Use histogram statistics to analyze a range of data that you select.
Page 229: What's Excluded
Using Masks, Histograms, and Waveform Databases selected as its source. Histogram data is continuously accumulated and displayed until you explicitly turn it off or clear the waveform data of the histogram source. What’s Excluded? Histograms longer than 500 bins. Histograms are limited to the on screen resolution, limiting horizontal sizes of 500 bins.
Page 230: To Take A Histogram
Using Masks, Histograms, and Waveform Databases To Take a Histogram Use the procedure that follows to quickly take a measurement based on the default settings for histograms. Overview To take a histogram Related control elements & resources Prerequisites 1. The instrument must have at least one waveform displayed to access the Hist Setup dialog box.
Page 231 Using Masks, Histograms, and Waveform Databases Overview To take a histogram (cont.) Related control elements & resources Set histogram dis- Use the Histogram to turn on and off the display of the play options selected histogram (histogram counting remains enabled). Use the color list to select a color for the histogram.
Page 232: Histogram Statistics
Using Masks, Histograms, and Waveform Databases Histogram After you check Enable Histogram in the Histogram Setup dialog box, histogram Statistics statistics appear on the right-hand side of the screen. The following table is a list of the available histogram statistics and a brief description of each. Table 3- 10: Histogram statistics Name Description...
Page 233: Using Waveform Databases
Using Masks, Histograms, and Waveform Databases Using Waveform Databases A waveform database is a three-dimensional accumulation of a source waveform as it is repeatedly acquired. In addition to the standard vertical and horizontal dimensions, each waveform sample in a waveform database has a third dimen- sion of count.
Page 234: Keys To Using
Using Masks, Histograms, and Waveform Databases H If all four databases are assigned and you attempt to implicitly assign a waveform source to a database (for example, by right clicking a waveform icon in the Waveform bar and selecting color grading), the instrument will display a notice that no databases are available.
Page 235 Using Masks, Histograms, and Waveform Databases H Grading Method: The Grading Method control determines the method by which database data (bin counts) are converted into display colors/intensi- ties. EMPH8 selects a curve-driven grading method that utilizes eight display colors/intensities. The curve is specified by the Emphasize Counts setting, see Emphasize Counts, below.
Page 236: To Set Up A Waveform Database 3
Using Masks, Histograms, and Waveform Databases To Set Up a Waveform To assign a waveform to one of the four waveform databases of the instrument, Database use the procedure that follows: Overview To set up a waveform database Related control elements & resources Prerequisites 1.
Page 237: Figure 3- -29: Normal Vector View Of A Waveform 3
Using Masks, Histograms, and Waveform Databases As you can see in the illustrations below, the normal vector view of a waveform displays the waveform data in dot mode: the waveform display is updated with each acquisition to reflect the current data. In Fig 3- -30, waveform database display has been turned on and you can see the waveform data accumulation is displayed all at once, with subsequent acquisition data being “added”...
Page 238: To Customize The Database Display 3
Using Masks, Histograms, and Waveform Databases To Customize the To change the display options of waveform database data on the graticule, use Database Display the procedure that follows: Overview To customize the database display Related control elements & resources Prerequisites 1. The instrument must have a waveform assigned to one of the waveform databases.
Page 239 Using Masks, Histograms, and Waveform Databases Overview To customize the database display (cont.) Related control elements & resources Set display options 4. Choose from the following display options: Color: Choose color to draw the waveform database in colors that vary with how frequently each sample value occurs in the database.
Page 240 Using Masks, Histograms, and Waveform Databases Overview To customize the database display (cont.) Related control elements & resources Notice the difference in intensities of the same data between these two illustrations. In the top illustration, this portion of data is lighter in intensity signalling it is least-occurring.
Page 241: Accessing Online Help
NOTE. A PDF version of the Programmer Reference Guide is available on the Tektronix Web site (see Contacting in the Preface on page xiii. Go to the link for User Manuals and select the document name from the download selection list.
Page 242: Documentation Map 2
Accessing Online Help continue your setup. Overview help is there when you need to probe more deeply into feature operation. H Use the manuals to read instructions on putting the instrument into service, procedures on reinstalling its product software, listings of specifications, and overviews of features and their operation.
Page 243 Accessing Online Help Overview To use the online help (cont.) Control elements & resources Click the What’s This? button in the main display or in a For a more robust dialog box. The button varies in form as shown at right. description After clicking, the mouse pointer changes to the following icon:...
Page 244 Accessing Online Help Overview To use the online help (cont.) Control elements & resources 3- 170 CSA8000B & TDS8000B User Manual...
Page 245 Accessing Online Help Overview To use the online help (cont.) Control elements & resources To dig deeper 6. You can search for in depth help using methods with which most users of PCs are familiar: from the application menu bar, select Help, and then select Contents &...
Page 246 Accessing Online Help Overview To use the online help (cont.) Control elements & resources For instruction You can display step-by-step setup instructions for procedures setups you want to make: From the application menu bar, select Help, and then select Help Contents and Index.
Page 247 Accessing Online Help Overview To use the online help (cont.) Control elements & resources To enable full- 11. If you cannot find the information in the Contents or text search Index tabs of the online finder, you may want to enable full text search: From the application menu bar, select Help, and then select Contents &...
Page 248 Accessing Online Help Overview To use the online help (cont.) Control elements & resources To Access Op- 14. Click the minimize button to reduce the User Interface Click to minimize to the toolbar erating System Application to an icon on the operating system Help toolbar.
Page 249: Cleaning The Instrument
Use a 75% isopropyl alcohol solution as a cleaner and wipe with a clean cloth dampened with deionized water. (Use only deionized water when cleaning the menu buttons or front-panel buttons.) Before using any other type of cleaner, consult your Tektronix Service Center or representative. 3- 175...
Page 250: Flat Panel Display Cleaning
Cleaning the Instrument Flat Panel Display Cleaning The instrument display is a soft plastic display and must be treated with care during cleaning. CAUTION. Improper cleaning agents or methods can damage the flat panel display. Avoid using abrasive cleaners or commercial glass cleaners to clean the display surface.
Page 251: Appendix A: Specifications
Appendix A: Specifications NOTE. This specification is for the instrument; there are also specifications associated with the optical and electrical modules. Please refer to the user manual that shipped with your module for those specifications. This appendix contains the specifications for the CSA8000B Communica- tions Signal Analyzer and the TDS8000B Digital Sampling Oscilloscope.
Page 252: Table A- 2: System - Timebase
Appendix A: Specifications Table A- 1: (cont.) System - Signal acquisition Description Characteristics Small Sampling Mod- Tekprobe-Sampling Level 3. Hot switching is not permitted on this ule Interface interface. Large Sampling Mod- Tekprobe-Sampling Level 3. Hot switching is not permitted on this ule Interface interface.
Page 253: Table A- 3: System - Trigger
Appendix A: Specifications Table A- 2: (cont.) System - Timebase Description Characteristics n Time internal ac- Strobe placement accuracy for a given horizontal interval and position curacy, locked to in- on same strobe line per table below. Contribution from 80E04 sampling ternal 10 MHz refer- module is included in specification.
Page 254 Appendix A: Specifications Table A- 3: (cont.) System - Trigger Description Characteristics External direct trigger Direct edge triggering on signal applied to dedicated front panel capabilities and connector with Holdoff, Level Adjust, Auto/Normal, High Frequency conditions On/Off, and Enhanced Triggering On/Off controls. External direct trigger specifications apply only under the condition that no other trigger signal is applied to respective connectors.
Page 255 Appendix A: Specifications Table A- 3: (cont.) System - Trigger Description Characteristics External direct trigger Metastability Reject on: Zero, typical metastability External direct trigger Tekprobe-SMA, Levels 1 and 2. Hot switching is permitted on this real real time accessory time accessory interface. interface External prescaled Prescaled triggering on signal applied to dedicated front panel...
Page 256: Table A- 4: System - Environmental
30 minutes total) non-operating. Atmospherics Temperature: Operating: 10 °C to +40 °C 0 °C to +35 °C for 80E0X modules on Tektronix part number 012-1569-00 2-meter extender Nonoperating: - - 22 °C to +60 °C Relative humidity: Operating: 20% to 80%, with a maximum wet bulb temperature of 29 °C at or below +40 °C (upper limits derates to 45% relative...
Page 257: Table A- 5: Power Consumption And Cooling
Appendix A: Specifications Table A- 5: Power consumption and cooling Specifications Characteristics Power requirements 240 watts (fully loaded); 160 watts (mainframe alone with no modules) An example of a “fully loaded” mainframe for these characteristic loads has installed optical modules, electrical modules, and active probes comprised of 1x80C02-CR, 1x80C04-CR2, 3x80E04, 1x80A01, and 7xP6209.
Page 258: Table A- 7: Ports
Appendix A: Specifications Table A- 7: Ports Specifications Characteristics Video outputs Two 15-pin D-subminiature connectors on the rear panel. Useable to connect external monitors that provide a duplicate of the primary display and/or a second monitor on which to view other applications. Support at least the basic requirements of the PC99 specification.
Page 259: Table A- 8: Data Storage
Appendix A: Specifications Table A- 7: Ports (cont.) Specifications Characteristics Gated Trigger Input - - 3 trigger cycles, where each cycle is defined as (holdoff time + trigger Enable-to-Acquire latency). For example: Delay With holdoff set to its minimum 5 s setting, and a 2.500 GHz clock (Option GT equipped signal applied to the External Direct Trigger input (a period of 400 ps), instruments only)
Page 260: Table A- 9: Mechanical
Appendix A: Specifications Table A- 9: Mechanical Specifications Characteristics Construction material Chassis: Aluminum alloy Cosmetic covers: PC/ABS thermoplastic Front panel: Aluminum alloy with PC/thermoplastic overlay Module doors: Nickel plated stainless steel Bottom cover: Vinyl clad sheet metal Circuit boards: Glass-laminate. Cabinet: Aluminum.
Page 261: Certifications
Appendix A: Specifications Certifications Table A- 10: Certifications and compliances Category Standards or description EC Declaration of Conformity - - Meets intent of Directive 89/336/EEC for Electromagnetic Compatibility when configured with sampling head modules designed for use with this instrument as identified in this manual. Compliance was demonstrated to the following specifications as listed in the Official Journal of the European Union: EN 61326...
Page 262 Appendix A: Specifications Table A- 10: Certifications and compliances (cont.) Category Standards or description EN 61010-1/A2:1995 Safety requirements for electrical equipment for measurement control and laboratory use. U.S. Nationally Recognized UL3111-1 Standard for electrical measuring and test equipment. Testing Laboratory Listing, mainframe Canadian Certification, CAN/CSA C22.2 No.
Page 263: Appendix B: Automatic Measurements Reference
Appendix B: Automatic Measurements Reference This reference describes the automatic measurement system of this instrument. Automatic measurements support Pulse, Return-to-Zero (RZ), and Non-Return- to-Zero (NRZ) signals, providing measurements in three categories, Amplitude, Timing, and Area. This reference gathers reference information for automatic measurements. Specifically, it lists: H A definition for each auto-measurement type (for example, risetime, period, and suppression ratio), organized according to the signal measured (Pulse,...
Page 264: Pulse Measurements - Amplitude
Appendix B: Automatic Measurements Reference Pulse Measurements - Amplitude Table B- -1 describes on page B- -2 describes each pulse measurement in the amplitude category. See Table B- -2 on page B- -8 for timing category measure- ments; see Table B- -3 on page B- -14 for area category measurements. Table B- 1: Pulse Measurements —...
Page 265 Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition Average Optical Power DC Signal current (DC amps) Average Optical Power (watts) = (watts) Conversion Gain (amps watts) Where: DC Signal Current is the O/E-converter photo detector current in DC amps Conversion Gain is the O/E-converter photo detector gain in amps/watt Note: Average optical power measurements return valid results only on channels that contain average power monitors.
Page 266 Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition Gain The amplitude gain between two waveforms. The measurement returns the ratio between the amplitudes measured within the measurement regions of the two sources. Amplitude1 Gain = Amplitude2 Where Amplitude1 and Amplitude2 are the Amplitude measurements of the two source...
Page 267 Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition The computation of the middle point between the maximum and minimum amplitude peaks of the waveform over the measurement region. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2).
Page 268 Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition +Overshoot The ratio of the maximum peak to the signal amplitude over the measurement region, expressed as a percentage. (Max − High) + Overshoot = 100 × (High −...
Page 269 Appendix B: Automatic Measurements Reference Table B- 1: Pulse Measurements — Amplitude (cont.) Name Definition Peak-to-Peak Noise The maximum range of the waveform amplitude variance sampled within a fixed width vertical slice located at the center of the measurement region. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2).
Page 270: Pulse Measurements - Timing
Appendix B: Automatic Measurements Reference Pulse Measurements - Timing Table B- -2 describes each pulse measurement in the timing category. See Table on B- -1 on page B- -2 for amplitude category measurements; see Table B- -3 on page B- -14 for area category measurements. Table B- 2: Pulse Measurements - Timing Name Definition...
Page 271 Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition Delay The time interval between the crossings of the two mid-reference levels on the two sources of the measurement. Delay = Tcross(source1) – Tcross(source2) Where Tcross is the first positive or negative crossing time at mid-reference level. See Pulse Crossings and Mid-reference Level on page B- - 58.
Page 272 Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition - Duty Cycle The ratio (expressed as a percentage) of the first negative pulse width within the measurement region to the period of the signal. The time intervals are determined at mid-reference level. If Tcross1 is positive, then: (Tcross3 −...
Page 273 Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition Period The time interval between two consecutive crossings on the same slope of the signal at the mid-reference level. Period = Tcross3 – Tcross1 Where Tcross3 and Tcross1 are the times of the first two consecutive crossings on the same slope at the mid-reference level.
Page 274 Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition Rise Time The time interval between the low-reference level and the high reference level crossings on the positive slope of the pulse. RZ Rise Time = TcrossH – HcrossL Where: TcrossH is the time of crossing of the high reference level.
Page 275 Appendix B: Automatic Measurements Reference Table B- 2: Pulse Measurements - Timing (cont.) Name Definition +Width The horizontal interval between the crossings of the rising and falling edges at the mid-refer- ence level of the first positive pulse in the measurement region. +Width = Tcross2 –...
Page 276: Pulse Measurement - Area
Appendix B: Automatic Measurements Reference Pulse Measurement - Area Table B- -3 describes each pulse measurement in the area category. See Table B- -1 on page B- -2 amplitude-category measurements; see Table B- -2 on page B- -8 for timing-category measurements. Table B- 3: Pulse Measurements - Area Name Definition...
Page 277: Return-To-Zero (Rz) Measurements - Amplitude
Appendix B: Automatic Measurements Reference Return-to-Zero (RZ) Measurements - Amplitude Table B- -4 describes each RZ measurement in the amplitude category. See Table on B- -5 on page B- -29 for timing category measurements; see Table B- -6 on page B- -36 for area category measurements.
Page 278 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Average Optical The true average component of an optical signal, expressed in decibels. This measurement Power (dBm) results from the use of a hardware average power monitor circuit rather than from the calculation of digitized waveform data.
Page 279 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Extinction Ratio The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an optical RZ signal. All level determinations are made within the RZ Eye Aperture. High RZ ExtRatio = Where High and Low are the logical 1 and 0 levels.
Page 280 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Extinction Ratio (dB) The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an optical RZ signal, expressed in decibels, dB.
Page 281 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Eye Opening Factor RZ Eye Opening Factor is a measure of how noise affects the vertical opening between High and Low levels of an RZ pulse. The RZ pulse is sampled within the Eye Aperture, where the High and Low levels are determined as the mean of the histogram of the data distribution in the upper and lower half of the pulse, respectively.
Page 282 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ High The logical 1 level of the RZ signal. The data within the Eye Aperture is sampled, a histogram is built from the upper half of the RZ eye, and the mean of the histogram yields the High level. The Eye Aperture is adjustable and defaults to 5% of the RZ pulse width.
Page 283 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Max The maximum vertical value of the waveform that is sampled within the measurement region. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2).
Page 284 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Min The minimum vertical value of the waveform that is sampled within the measurement region. If enabled, measurement gates constrain the measurement region to the area between the Start Gate (G1) and Stop Gate (G2).
Page 285 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Peak-to-Peak Noise The maximum range of the data distribution sampled within a fixed width vertical slice located at the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture Parameters on B- - 62.
Page 286 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Q Factor A figure of merit of an eye diagram, reporting the ratio between the amplitude of the RZ pulse to the total RMS noise on the High and Low levels. The RZ pulse is sampled within the Eye Aperture, where the High and Low levels are determined as the mean of the histogram of the data distribution in the upper and lower half of the pulse, respectively.
Page 287 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ RMS Noise One standard deviation of the data distribution sampled within a fixed width vertical slice located at the center of the Eye Aperture at the High (logical 1) or Low (logical 0) levels. RMS noise = Highσ...
Page 288 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Suppression Ratio The ratio of the average power level of the logic High to the Suppressed level measured between two consecutive RZ pulses. The RZ pulse is sampled within the Eye Aperture where the High is determined as the mean of the histogram of the data distribution in the upper half of the pulse.
Page 289 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Suppression Ratio The inverse ratio of the average power level of the logic High to the Suppressed level measured between two consecutive RZ pulses, with the result expressed in percentage. The RZ pulse is sampled within the Eye Aperture where the High is determined as the mean of the histogram of the data distribution in the upper half of the pulse.
Page 290 Appendix B: Automatic Measurements Reference Table B- 4: RZ Measurements - Amplitude (cont.) Name Definition RZ Suppression Ratio The ratio of the average power level of the logic High to the Suppressed level measured (dB) between two consecutive RZ pulses, with the result expressed in decibels. The RZ pulse is sampled within the Eye Aperture where the High is determined as the mean of the histogram of the data distribution in the upper half of the pulse.
Page 291: Return-To-Zero (Rz) Measurements - Timing
Appendix B: Automatic Measurements Reference Return-to-Zero (RZ) Measurements - Timing Table B- -5 topic describes each RZ measurement in the timing category. See Table B- -4 on page B- -15 for amplitude category measurements; see Table B- -6 on page B- -36 for area category measurements. Table B- 5: RZ Measurements - Timing Name Definition...
Page 292 Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Cross+ The time of a positive crossing, defined as the mean of the histogram of the data sampled at the mid-reference level. Cross+ = Tcross Where Tcross is the mean of the histogram of a positive crossing.
Page 293 Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Delay The time interval between the crossings of the mid-reference levels on the two sources of the measurement. The crossing times are computed as the mean of the histogram of the data slice at the mid-reference level.
Page 294 Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Eye Width The 3σ guarded delta between the rising and falling edge crossings. Eye Width = (Tcross2 – 3 * Tcross2σ) – (Tcross1 + 3 * Tcross1σ) Where Tcross1 and Tcross2 are the mean of the histogram of the two crossings.
Page 295 Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition Phase = Tcross1 of source2 − Tcross1 of source1 RZ Phase ⋅ 360 Tcross3 of source1 − Tcross1 of source1 Where: Tcross1 of source1 is mean of the histogram at the time of the first crossing of either polarity on source 1.
Page 296 Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ Pulse Symmetry RZ Pulse Symmetry measures to what extent the RZ pulse is symmetrical around the peak at the mid-reference level. The pulse peak is the center of the interval, sized to Eye Aperture, which yields the maximum mean vertical value.
Page 297 Appendix B: Automatic Measurements Reference Table B- 5: RZ Measurements - Timing (cont.) Name Definition RZ RMS Jitter Jitter is the measure of time variance at the location where the signal crosses the mid-reference level. RMS Jitter is defined as one standard deviation (σ) of that variance. The mean of the histogram of the crossing data distribution is Tcross.
Page 298: Return-To-Zero (Rz) Measurements - Area
Appendix B: Automatic Measurements Reference Return-to-Zero (RZ) Measurements - Area Table B- -6 describes each RZ measurement in the area category. See Table B- -4 on page B- -15 for amplitude category measurements; see Table on B- -5 on page B- -29 for timing category measurements Table B- 6: RZ Measurements - Area Name...
Page 299: Non-Return-To-Zero (Nrz) Measurements - Amplitude
Appendix B: Automatic Measurements Reference Non-Return-to-Zero (NRZ) Measurements - Amplitude Table B- -7 topic describes each NRZ measurement in the amplitude category. See Table B- -8 on page B- -50 for timing category measurements.; see Table B- -9 on page B- -55 for area category measurements. Table B- 7: NRZ Measurements - Amplitude Name Definition...
Page 300 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Average Optical The true average component of an optical signal, expressed in decibels. This measurement Power (dBm) results from the use of a hardware average power monitor circuit rather than from the calculation of digitized waveform data.
Page 301 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Crossing % The height of eye crossing as a percentage of eye height measured in the Eye Aperture. (Eye Cross − Low) NRZ Crossing % = 100 × (High −...
Page 302 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Extinction Ratio The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an optical NRZ signal. All level determinations are made within the NRZ Eye Aperture. NRZ ExtRatio = 100 ×...
Page 303 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Extinction Ratio The ratio of the average power levels of the logic 1 level (High) to the logic 0 level (Low) of an (dB) optical NRZ signal, expressed in decibels (dB).
Page 304 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Gain The amplitude gain between two waveforms. The measurement returns the ratio between the amplitudes measured within the Eye Aperture of each of the waveforms. Ampl2 NRZ Gain = Ampl1...
Page 305 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Low The logical 0 of the NRZ signal. The data within the Eye Aperture is sampled, a histogram is built from the lower half of the NRZ eye, and the mean of the histogram yields the Low level. The Eye Aperture is adjustable and defaults to 20% of the NRZ bit time.
Page 306 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Mid The middle level between the Max and Min vertical values of the selected waveform within the measurement region. (Max + Min) NRZ Mid = Where Max and Min are the maximum and minimum measurements.
Page 307 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ +Overshoot The ratio of the maximum value of the measured signal to its amplitude, expressed as a percentage. The waveform is scanned for the maximum value within the measurement region, while the amplitude is measured in the Eye Aperture.
Page 308 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Optical Modulation An approximation defined as the difference of the logical power 1 and 0 determined in a vertical Amplitude slice through the eye crossing. The levels are determined as the means of the histograms of the vertical data slice through the High (logical 1) and Low (logical 0) levels.
Page 309 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Peak-to-Peak Noise The maximum range of the amplitude variance sampled within a fixed width vertical slice located at the center of the Eye Aperture at the High or Low levels. See RZ Eye Aperture Parameters on B- - 62.
Page 310 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ Q Factor NRZ Q Factor is a figure of merit of an eye diagram, reporting the ratio between the amplitude of the NRZ eye to the total RMS noise on the High and Low levels. The NRZ eye is sampled within the Eye Aperture, where the High and Low levels are determined as the mean of the histogram of the data distribution in the upper and lower half of the eye, respectively.
Page 311 Appendix B: Automatic Measurements Reference Table B- 7: NRZ Measurements - Amplitude (cont.) Name Definition NRZ RMS Noise One standard deviation of the amplitude variance sampled within a fixed width vertical slice located at the center of the Eye Aperture at the High (logical 1) or Low (logical 0) levels. RMS noise = Highσ...
Page 312: Non-Return-To-Zero (Nrz) Measurements - Timing
Appendix B: Automatic Measurements Reference Non-Return-to-Zero (NRZ) Measurements - Timing Table B- -8 topic describes each NRZ measurement in the timing category. See Table B- -7 on page B- -37 for amplitude category measurements.; see Table B- -9 on page B- -55 for area category measurements. Table B- 8: NRZ Measurements - Timing Name Definition...
Page 313 Appendix B: Automatic Measurements Reference Table B- 8: NRZ Measurements - Timing (cont.) Name Definition NRZ Delay The time interval between the crossings of the mid-reference levels on the two sources of the measurement. NRZ Delay = Tcross(source1) – Tcross(source2) Where Tcross is the positive or negative crossing time at mid-reference level.
Page 314 Appendix B: Automatic Measurements Reference Table B- 8: NRZ Measurements - Timing (cont.) Name Definition NRZ Fall Time NRZ Fall Time characterizes the negative slope of the NRZ eye by computing the time interval between the mean crossings of the high reference level and the low reference level. RZ Fall Time = TcrossL - - TcrossH Where TcrossL is the mean of the histogram of the crossing of the low reference level, and TcrossH is the mean of the histogram of the crossing of the high reference level.
Page 315 Appendix B: Automatic Measurements Reference Table B- 8: NRZ Measurements - Timing (cont.) Name Definition Phase = Tcross1 of source2 − Tcross1 of source1 NRZ Phase ⋅ 360 Tcross3 of source1 − Tcross1 of source1 Where: Tcross1 of source1 is the time of the first crossing of either polarity on source 1. Tcross3 of source1 is the time of next crossing on source 1of the same polarity as Tcross1.
Page 316 Appendix B: Automatic Measurements Reference Table B- 8: NRZ Measurements - Timing (cont.) Name Definition NRZ Rise Time Computes the time interval between the mean crossings of the low reference level and the high reference level to characterize the positive slope of the eye. NRZ Rise Time = TcrossH - - HcrossL Where TcrossH is the mean of the histogram of the crossing of the high reference level, and TcrossL is the mean of the histogram of the crossing of the low reference level.
Page 317: Non-Return-To-Zero (Nrz) Measurements - Area
Appendix B: Automatic Measurements Reference Non-Return-to-Zero (NRZ) Measurements - Area Table B- -9 topic describes each NRZ measurement in the area category. See Table B- -7 on page B- -37 for amplitude category measurements.; see Table B- -8 on page B- -50 for timing category measurements. Table B- 9: NRZ Measurements - Area Name Definition...
Page 318: Measurement Reference Parameters And Methods
Measurement Reference Parameters and Methods This reference topic describes the reference parameters (levels and crossings) used in taking the measurements. All Sources Reference-Level The methods available for calculating reference levels used in taking automatic Calculation Methods measurement follow. The methods are shown using a pulse, but they also apply to RZ and NRZ waveforms.
Page 319: Pulse Sources
Measurement Reference Parameters and Methods Pulse Sources The automatic measurement system uses the following levels when measuring Pulse source waveforms. For the Pulse measurements, and their definitions that use the levels described here, see page B- -2. Pulse Measurement Reference Levels High TcrossH High reference...
Page 320 Measurement Reference Parameters and Methods Pulse Crossings and Mid-reference Level Mid-reference Tcross1 Tcross2 Tcross3 Figure B- 3: Pulse crossings and mid-reference level Pulse Crossings and The following measurement parameters are normally used when measuring Mid-reference Level (AOP) Optical Modulation Amplitude on a pulse. Crossings at the measured Average Optical Power level determine the positions of the eye apertures for the logical 1 and logical 0 of the pulse (size set in the measurement Region control).
Page 321 Measurement Reference Parameters and Methods Eye aperature Power logic 1 Average optical power Tcross3 Tcross1 Tcross2 Power logic 0 Figure B- 4: AOP pulse crossings and mid-reference level Overshoot Levels High Figure B- 5: Overshoot levels B- 59 CSA8000B & TDS8000B User Manual...
Page 322: Rz Sources
Measurement Reference Parameters and Methods RZ Sources The automatic measurement system uses the following levels when measuring RZ source waveforms. For the RZ measurements, and their definitions that use the levels described here, see page B- -15. RZ Measurement The following levels are used when deriving measurements on RZ waveforms. Reference Levels TcrossH High reference...
Page 323 Measurement Reference Parameters and Methods RZ Crossings The following measurement parameters are used when deriving RZ measure- ments. Mid reference Tcross1 Tcross3 Tcross2 Figure B- 7: RZ crossings B- 61 CSA8000B & TDS8000B User Manual...
Page 324: Nrz Sources
Measurement Reference Parameters and Methods RZ Eye-Aperture The following parameters are used when deriving measurements on RZ Parameters waveforms. Eye aperture High reference High reference Low reference Figure B- 8: RZ eye- aperture parameters NRZ Sources The automatic measurement system uses the following levels when measuring NRZ source waveforms.
Page 325 Measurement Reference Parameters and Methods NRZ Measurement The following levels are used when deriving measurements on NRZ waveforms. Reference Levels High TcrossH High reference Low reference TcrossL Figure B- 9: NRZ measurement reference levels B- 63 CSA8000B & TDS8000B User Manual...
Page 326 Measurement Reference Parameters and Methods NRZ Crossings The following measurement parameters are used when deriving NRZ measure- ments. Tcross Cross level Figure B- 10: NRZ crossings B- 64 CSA8000B & TDS8000B User Manual...
Page 327 Measurement Reference Parameters and Methods NRZ Eye-Aperture The following parameters are used when deriving measurements on NRZ Parameters waveforms. High Eye aperture Figure B- 11: NRZ eye-aperture parameters B- 65 CSA8000B & TDS8000B User Manual...
Page 328 Measurement Reference Parameters and Methods NRZ Overshoot Levels The following measurement parameters are used when deriving overshoot measurements on NRZ waveforms. High Figure B- 12: NRZ overshoot levels B- 66 CSA8000B & TDS8000B User Manual...
Page 329 Measurement Reference Parameters and Methods NRZ Crossings (OMA) The following measurement parameters are used when approximating Optical Modulation Amplitude (OMA) on NRZ waveforms. As shown, OMA on NRZ waveforms is determined from the means of histograms of the data from level 1 and level 0, taken on a vertical slice through the NRZ eye crossing.
Page 330: Tracking Methods
Measurement Reference Parameters and Methods Tracking Methods This topic describes measurements methods tracking the High and Low values used in taking automatic measurements. The levels that the automatic measurement system derives as the High (Top) or Low (Bottom) for a waveform influence the fidelity of amplitude and aberration measurements.
Page 331: Mid-Reference Level
Measurement Reference Parameters and Methods Mode (of Histogram) sets the values statistically. Using a histogram, it selects the most common Mode Tracking Method value either above or below the midpoint (depending on whether it is defining the high or low reference level).
Page 332: Use A Waveform Database
Measurement Reference Parameters and Methods Use a Waveform Database This measurement needs to be performed using a statistical (waveform) database. When one is specified, the instrument acquires or computes the targeted measurement source, then accumulates it into in the waveform database, and then takes the measurement on the database data.
Page 333: Glossary
Glossary Accuracy The closeness of the indicated value to the true value. Acquisition The process of sampling signals from input channels, digitizing the samples into data points, and assembling the data points into a waveform record. The waveform record is stored in memory. The trigger marks time zero in that process.
Page 334 Glossary Autoset A function of the instrument that attempts to automatically produce a stable waveform of usable size. Autoset sets up the acquisition controls based on the characteristics of the selected waveform. A successful autoset will produce a coherent and stable waveform display. Average acquisition mode In this mode, the instrument displays and updates a waveform that is the averaged result of several waveform acquisitions.
Page 335 Glossary Channel number The number assigned to a specific signal input channel of an installed sampling module. Assignment of channel numbers is described in Maximum Configuration on page 1- -11. Channel waveforms Waveforms resulting from signals input into sampling-module channels and digitized and acquired by the instrument.
Page 336 Glossary Error detection Checking for errors in data transmission. A calculation is made on the data being sent and the results are sent along with it. The receiving station then performs the same calculation and compares its results with those sent. Each data signal conforms to specific rules of construction so that departures from this construction in the received signals can be detected.
Page 337 Glossary instruments in a network under the control of a controller. Also known as IEEE 488 bus. It transfers data with eight parallel data lines, five control lines, and three handshake lines. Graticule A grid on the display screen that creates the horizontal and vertical axes. You can use it to visually measure waveform parameters.
Page 338 Glossary when horizontal scale adjustments are made. The horizontal reference point remains anchored as the rest of the waveform grows or shrinks around it. Icon See Channel Icon. Initialize Setting the instrument to a completely known, default condition by pressing executing a Default Setup.
Page 339 Glossary Measurement See Automatic Measurement. Measurement statistics The accumulation of a history of individual measurement readouts, showing the mean and standard deviation of a selected number of samples. Measurement updating The process of automatically adjusting the measurement parameters to reflect changes in the waveform targeted by an automatic measurement.
Page 340 Glossary Quantizing The process of converting an analog input that has been sampled, such as a voltage, to a digital value. Return to Zero (RZ) A waveform type for of a source to be measured (see waveform types). Real-time sampling An alternate sampling mode where the instrument samples to completely fill a waveform record from a single trigger event.
Page 341 Glossary Sequential equivalent-time sampling A type of equivalent-time sampling in which one sample is taken per acquisition, with each sample skewed incrementally with respect to an external trigger event. This instrument acquires using sequential equivalent- time sampling. Saved waveform A collection of sampled points that constitute a single waveform that is saved in any one on reference locations R1 - R8 or to the file system.
Page 342 Glossary View Any one of the three waveform displays the instrument provides: Main, Mag1, and Mag2. Each view has its own graticule and time base. The instrument always displays the Main view; the Mag1 and Mag2 views can be added and removed from the display using the View buttons on the front panel.
Page 343 Acquisition settings, purpose, 3- - 21 mask-specific, 3- - 142 Active cursor, Glossary- - 1 overview, 3- - 14 Address, Tektronix, xiii Average acquisition mode, Glossary- - 2 Aliasing, 3- - 23, Glossary- - 1 AOP, average optical power, Glossary- - 2...
Page 344 3- - 54 locations and purpose, 1- - 12 elements of, 3- - 54 PRESCALE, 3- - 42, 3- - 44 flexible control, 3- - 55 Contacting Tektronix, xiii graticule, defined, 3- - 54 Index- 2 CSA8000B & TDS8000B User Manual...
Page 345 Index horizontal reference, defined, 3- - 54 horizontal scale readout, defined, 3- - 54 and sampling modules, 3- - 6 how to customize, 3- - 69 and trigger source inputs, 3- - 43 how to set style of, 3- - 68 Exporting waveforms, 3- - 128 limit readouts, defined, 3- - 54 Extinction ratio, Glossary- - 4...
Page 346 Index size, 3- - 155 Inspection and cleaning supported statistics, table of, 3- - 158 exterior, 3- - 175 taking, 3- - 154 flat panel display, 3- - 176 to take, 3- - 156 Installation, 1- - 9 usage limitations, 3- - 155 environmental requirements, 1- - 9 valid sources of, 3- - 154 incoming inspection procedure, 1- - 17...
Page 347 Index Measurement level acquisition process, 2- - 6 HighRef, Glossary- - 5 documentation, 2- - 2 LowRef, Glossary- - 6 front panel, 2- - 8 MidRef, Glossary- - 7 input/output (front panel), 2- - 11 MidRef2, Glossary- - 7 input/output (rear panel), 2- - 12 Measurement Reference Parameters and Methods, system, 2- - 4 B- - 56...
Page 348 NRZ measurements-area, B- - 55 infinite, 3- - 67 NRZ measurements-timing, B- - 50 variable, 3- - 67 Phone number, Tektronix, xiii Pixel, Glossary- - 7 PNG file format, 3- - 136 Pop up menu, Glossary- - 7 Offset, vertical, 3- - 14...
Page 349 Index To gated trigger, 3- - 50 Recalling a setup, 3- - 113 To Localize a Measurement, 3- - 83 Recalling a waveform, 3- - 120 To Mask Test a Waveform, 3- - 145 Record To Perform Dark-Level and User Wavelength Gain acquisition, shared by all channels, 3- - 20 Compensations, 3- - 98 length, defined, 3- - 28...
Page 350 Selected cursor, Glossary- - 1 TDS8000, description, 1- - 1 Selected waveform, Glossary- - 8 Technical support, contact information, xiii defined, 3- - 7 Tektronix Service support, contact information, xiii contacting, xiii Setup toll-free number, xiii recalling, 3- - 113 Temperature compensation, 3- - 92–3- - 100...
Page 351 Update, software, 1- - 4 Virtual keyboard, Glossary- - 10 Upgrade, firmware, 1- - 4 dialog box, 3- - 114, 3- - 120 URL, Tektronix, xiii Virtual keypad, Glossary- - 10 Usable holdoff, 3- - 46 User Interface Controls bar, 2- - 7...
Page 352 3- - 141 special features, 3- - 159 virtual keyboard with, 3- - 120 To customize display of, 3- - 164 Web site address, Tektronix, xiii to set up, 3- - 162 WfmDB, Glossary- - 10 four database limit, 3- - 159...

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