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Tektronix Keithley S530 Option Manual
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Tektronix Keithley S530 Option Manual

Tektronix Keithley S530 Option Manual

Parametric test system
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S530 Parametric Test System
Frequency Analysis Option Manual
S530-923-01 Rev. A / January 2014
*PS53092301A*
S530-923-01
A Greater M esure of Confidence
A T ektr onix Company

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Summary of Contents for Tektronix Keithley S530

  • Page 1 All manuals and user guides at all-guides.com www.keithley.com S530 Parametric Test System Frequency Analysis Option Manual S530-923-01 Rev. A / January 2014 *PS53092301A* S530-923-01 A Greater M esure of Confidence A T ektr onix Company...
  • Page 2 All manuals and user guides at all-guides.com S530 Parametric Test Systems Frequency Analysis Option Manual © 2014, Keithley Instruments, Inc. Cleveland, Ohio, U.S.A. All rights reserved. Any unauthorized reproduction, photocopy, or use of the information herein, in whole or in part, without the prior written approval of Keithley Instruments, Inc.

  • Page 3: Safety Precautions

    All manuals and user guides at all-guides.com Safety precautions The following safety precautions should be observed before using this product and any associated instrumentation. Although some instruments and accessories would normally be used with nonhazardous voltages, there are situations where hazardous conditions may be present.
  • Page 4 All manuals and user guides at all-guides.com For safety, instruments and accessories must be used in accordance with the operating instructions. If the instruments or accessories are used in a manner not specified in the operating instructions, the protection provided by the equipment may be impaired.

  • Page 5: Table Of Contents

    All manuals and user guides at all-guides.com Table of Contents General information ....................1-1 Introduction .......................... 1-1 Package contents ......................... 1-1 Prerequisites ........................1-1 Basic Operations ...................... 2-1 Ring oscillator structures and measurement................ 2-1 Software description ......................2-1 Making a measurement......................2-2 Create a KITT macro (S530) .....................

  • Page 6: General Information

    It is assumed that you are familiar with fundamental C programming software language, as well as with the operation of your Keithley S530 parametric tester. If you are not familiar with this programming language or the parametric tester, it is recommended that you review this software...

  • Page 7: Basic Operations

    All manuals and user guides at all-guides.com Section 2 Basic Operations In this section: Ring oscillator structures and measurement ......2-1 Software description ..............2-1 Making a measurement ............2-2 Ring oscillator structures and measurement The main purpose of ring oscillator structures is to allow chip designers to characterize the switching speed and propagation delays of logic gates.

  • Page 8: Making A Measurement

    All manuals and user guides at all-guides.com Section 2: Basic Operations S530 Parametric Test Systems Frequency Analysis Option Manual Making a measurement Measurements taken using the scope card require the following basic sequence of events: initialize, setup, and acquire. To take a measurement using the basic sequence of required events: To use the scope card when composing a Keithley Interactive Test Tool (KITT) macro, open the scope card user library using the KITT libraries menu.

  • Page 9: Create A Kitt Macro (S530)

    All manuals and user guides at all-guides.com S530 Parametric Test Systems Frequency Analysis Option Manual Section 2: Basic Operations Create a KITT macro (S530) The following code creates a KITT macro (S530) that you can use to make a scope card measurement: double vcc = 5.0 conpin(SMU1, vcc_pin, vccb_pin, 0)

  • Page 10: Software Reference

    All manuals and user guides at all-guides.com Section 3 Software Reference In this section: Measurement routines ............. 3-1 Control routines ................ 3-7 Measurement routines The measurement routines (ring oscillator measurement), are C-language commands that measure the following signal characteristics: • Inverter chain CMOS ring oscillators (see next figure) •...

  • Page 11: Ring_Lcc

    All manuals and user guides at all-guides.com Section 3: Software Reference S530 Parametric Test Systems Frequency Analysis Option Manual ring_lcc Purpose: This algorithm detects frequencies of the top five amplitudes that are longer than a given level (default 0.5 mV)(see next figure). Otherwise, zero will be the output if the amplitude threshold is not met.

  • Page 12: Ring_Max

    All manuals and user guides at all-guides.com S530 Parametric Test Systems Frequency Analysis Option Manual Section 3: Software Reference Figure 4: Detected Peaks Sample ring_max Purpose: This algorithm detects frequency at maximum amplitude. The next figure shows an example of a detected maximum amplitude. Parameters: Inputs Type...

  • Page 13: Ring_Meas

    All manuals and user guides at all-guides.com Section 3: Software Reference S530 Parametric Test Systems Frequency Analysis Option Manual Figure 5: Maximum signal detected sample ring_meas Purpose: This test routine determines the ring oscillator frequency. The module sets the user defined noise level and performs several frequency measurements until it finds the frequency peak in the desired frequency range.
  • Page 14 All manuals and user guides at all-guides.com S530 Parametric Test Systems Frequency Analysis Option Manual Section 3: Software Reference Outputs Type Description freq double Ring oscillator frequency, Hz; 1e30 if fails level_freq double Signal level, dB; 1e30 if fails status double Measure status 1: valid measurement in the first try...
  • Page 15 All manuals and user guides at all-guides.com Section 3: Software Reference S530 Parametric Test Systems Frequency Analysis Option Manual ring_ref Purpose: This algorithm detects the frequency that is closest to the specified reference, or target frequency (see next figure). The span of the scan will be from 0.65 * target_freq to 1.35 * target_freq.

  • Page 16: Control Routines

    All manuals and user guides at all-guides.com S530 Parametric Test Systems Frequency Analysis Option Manual Section 3: Software Reference Control routines The provided control routines are C-language commands. Using the control routines provides lower- level (and more direct) control of the scope card compared to using the measurement routines. The provided control routines are included to allow you to build custom routines (if desired).

  • Page 17: Freq_Setup

    All manuals and user guides at all-guides.com Section 3: Software Reference S530 Parametric Test Systems Frequency Analysis Option Manual freq_setup Purpose: This command sets the start, stop, and step (scan resolution or res_bandwidth) frequencies of a scan. The recommended relationship of res_bandwidth for different spans of a scan is listed in the next table.

  • Page 18: Freq_Measure

    All manuals and user guides at all-guides.com S530 Parametric Test Systems Frequency Analysis Option Manual Section 3: Software Reference freq_measure Purpose: This routine measures frequency and amplitude of the strongest signal. Format: int freq_measure( double *freq_result, double *amp_result ); Parameters: None Returns: This command returns a 1, if executed without error;...

  • Page 19: Freq_Measure_Next

    All manuals and user guides at all-guides.com Section 3: Software Reference S530 Parametric Test Systems Frequency Analysis Option Manual freq_measure_next Purpose: This routine returns the frequency and amplitude of the next highest peak in the frequency spectrum. Format: int freq_measure_next( double *freq_result, double *amp_result ); Parameters: None Returns:...

  • Page 20: Freq_Detect_Peaks

    All manuals and user guides at all-guides.com S530 Parametric Test Systems Frequency Analysis Option Manual Section 3: Software Reference freq_detect_peaks Purpose: This command returns frequencies in signal amplitude order (see next figure). You get to choose the total number of peaks. If a given peak detected is not greater than the minimum level (min_level), that peak will be dropped and the frequency will be returned as zero.
  • Page 21 All manuals and user guides at all-guides.com Section 3: Software Reference S530 Parametric Test Systems Frequency Analysis Option Manual Format: int freq_detect_peaks(double min_level, double lower_bound, double upper_bound, double *freq_array, int nPeaks, double *amp_array, int nPeak1); Parameters: min_level Minimum amplitude in dB; the peak detected must be higher than the min_level lower_bound The measured peak will be ignored if the ratio of measured freq vs.

  • Page 22: Freq_Close

    All manuals and user guides at all-guides.com S530 Parametric Test Systems Frequency Analysis Option Manual Section 3: Software Reference freq_close Purpose: This routine disconnects communications to the scope card. Format: int freq_close(); Parameters: None Returns: This command returns a 1, if executed without error; otherwise, a negative number is returned to indicate an error.
  • Page 23 All Keithley trademarks and trade names are the property of Keithley Instruments, Inc. All other trademarks and trade names are the property of their respective companies. Keithley Instruments, Inc. Corporate Headquarters 28775 Aurora Road Cleveland, Ohio 44139 440-248-0400 Fax: 440-248-6168 1-888-KEITHLEY www.keithley.com A Greater Measure of Confidence A Tektronix Company 7/13...