Keithley Instruments
28775 Aurora Road
Cleveland, Ohio 44139
1-888-KEITHLEY
http://www.keithley.com
System Description
The S500 Integrated Test System is an instrument-based system configuration from Keithley Instruments used
primarily for semiconductor parametric characterization testing. The S500 has a wide degree of hardware
flexibility, allowing users to configure a system best suited for their applications. Table 1 lists general S500
configuration options, while Table 2 lists configurations used specifically for High Voltage and/or High Current
testing of high-power semiconductor devices.
Table 1
S500 system configuration choices
Series 2600 System SourceMeter
Model 4200-SCS/C Semiconductor
Characterization System
Switching
Cabinet selection
Computer selection – Industrial PC with RAID
®
Linux
or Microsoft Windows
system
Flat panel display selection
Other options
Specifications are subject to change without notice
PA-939 Rev. C / October 2014
•
®
Instruments
0 to 22*
•
Any combination of 2612s or 2636s
•
0 to 4*
•
With 4200-SMUs, 4210-SMUs, 4210-CVU, 4220-PGUs, 4225-PMUs,
or 4200-PAs
•
/F or /C chassis (with or without flat panel display, respectively)
One of the following four choices:
•
None
•
0 to 4 ea. 708B*. Choice of switching card:
•
0 to 3 ea. 707B*. Choice of switching cards:
•
0 to 6 ea. 3706A*. Choice of switching cards (per mainframe):
•
37U with or without vented front door
•
37U with or without advanced seismic reinforcement
•
23U with or without partially-vented front door
•
None
®
operating
•
Internal computer
•
None
•
Monitor with support arm
•
Monitor installed externally
•
Adjustable cable support arm
S500 Integrated Test System
Administrative Guide
a) 1 ea. 7072, or
b) 1 ea. 7072-HV, or
c) 1 ea. 7174A
a) 1 to 6 ea. 7072, or
b) 1 to 6 ea. 7072-HV, or
c) 1 to 6 ea. 7174A
a) 1 to 6 ea. 3720, or
b) 1 to 6 ea. 3721, or
c) 1 to 6 ea. 3722, or
d) 1 to 6 ea. 3723, or
e) 1 to 6 ea. 3730, or
f) 1 to 6 ea. 3740
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