HP 3000 Series Installation And Service Manual page 46

Maintenance
The INP Dump facility is used only as a factory-level support
tool. It dumps the contents of the INP memory for analyzing the
exact state of the INP. The INP Dump facility is described
further in Appendix B.
5-4. SELF TEST
A self-test capability is included in the read-only memory (ROM)
of the INP. A small set of routines, diagnostics, and check-
points are included. The intention of the self-test feature is
to provide a quick indication of whether the communications board
is functioning properly, without either shutting down the system
or changing the hardware components. This self test can be
actuated either by a software command from the host computer
system or by the pressing of a hardware pushbutton switch. Re-
sults of the test are available to the host system as a status
word or to the pushbutton operator visually through an LED
indicator bank located on the front edge of the INP-MPU printed
circuit assembly (PCA) board.
When the self test is initiated (either manually or
programmatically), a series of tests or checks is set into
operation. These tests that comprise the self-test program in-
clude the following:
•
Basic Instruction Set Test
•
ROM Test
•
Timer Interrupt Test
•
RAM Test
•
BISYNC Chip Test
•
SDLC Chip Test
As each test is successfully completed, the next test in the
sequence is started until the self-test cycle has been completed.
The red LED indicators (located on the edge of the INP-MPU board,
near the self-test initiating RESTART switch, as shown in figure
5-1) wink on and off during the test cycle (approximately 2
seconds in duration) and stop in a pattern that shows the test
results. If LEDs
O
and 7 (the ones at each end of the array) are
the only ones lighted, all tests have been completed success-
fully. Any other pattern indicates a failure. Table 5-1 (under
"Troubleshooting") shows the meanings of various LED patterns.
5-3