Table of Contents
Advertisement
Quick Links
The bq77910AEVM-001 evaluation module (EVM) is a complete evaluation system for the bq77910A, a 4-
cell to 10-cell Li-Ion battery protection integrated circuit. The EVM consists of a bq77910A circuit module
and a resistor cell simulator module which can be used for simple evaluation of the bq77910A functions.
The circuit module includes one bq77910A integrated circuit (IC), sense resistor, power FETs, and all
other onboard components necessary to protect the cells from overcharge, over discharge, short circuit,
and overcurrent discharge in a 10-series cell Li-Ion or Li-Polymer battery pack. The circuit module
connects directly across the cells in a battery. With a compatible interface board and Windows
software, the user can view the bq77910A registers and program the IC configuration and protection
limits.
......................................................................................................................
1
1.1
1.2
2
2.1
2.2
3
3.1
3.2
3.3
3.4
3.5
3.6
4
4.1
4.2
4.3
5
5.1
5.2
5.3
5.4
5.5
6
7
7.1
7.2
7.3
7.4
7.5
7.6
7.7
7.8
7.9
Windows, Vista are registered trademarks of Microsoft Corporation.
Aardvark is a trademark of Total Phase.
SLUU855 - February 2012
Submit Documentation Feedback
Contents
.........................................................................................................
...............................................................................................
................................................................................
......................................................................................
................................................................................................
..............................................................................................
....................................................................................
....................................................................................
..................................................................................................
....................................................................................................
...................................................................................................
........................................................................................................
.............................................................................................
...................................................................................................
........................................................................................................
.................................................................................................
...................................................................................
.....................................................................................................
.................................................................................
.........................................................................
...........................................................................................
.....................................................................................................
.........................................................................
...............................................................................................
.....................................................................................
..................................................................................................
.......................................................................................................
................................................................................................
.................................................................................
Copyright © 2012, Texas Instruments Incorporated
.................................................................
....................................................
......................................................................
...............................................................
User's Guide
SLUU855 - February 2012
bq77910AEVM
-based PC
®
bq77910AEVM
3
3
3
3
3
4
5
5
6
6
6
7
8
8
8
8
10
10
12
14
16
17
17
18
18
18
18
18
20
20
21
21
21
22
1
Advertisement
Table of Contents
Subscribe to Our Youtube Channel
Related Manuals for Texas Instruments bq77910AEVM
Summary of Contents for Texas Instruments bq77910AEVM
-
Page 1: Table Of Contents
SLUU855 – February 2012 bq77910AEVM The bq77910AEVM-001 evaluation module (EVM) is a complete evaluation system for the bq77910A, a 4- cell to 10-cell Li-Ion battery protection integrated circuit. The EVM consists of a bq77910A circuit module and a resistor cell simulator module which can be used for simple evaluation of the bq77910A functions. - Page 2 Status Section Indicator Colors ................... Cell Count Component Configuration ................bq77910A Circuit Module Bill of Materials ................... Performance Specification Summary ..................Resistor Simulator Bill of Materials bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
-
Page 3: Features
IC and connections to the board. Circuit Module Connections Connections are provided for the following interfaces: • Direct cell connections • PACK connections • Programming interface SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 4: Signal Descriptions
Signal reference for the IC ECLK Serial interface clock connection EDATA Serial interface data connection Regulated 14V input for IC programming Signal reference for the IC bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 5: Bq77910A Evm Hardware Connection And Operation
Cell monitor terminal blocks and the control signal terminal blocks are rated at lower currents and should not be used for high current paths. SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 6: Connecting The Cell Simulator
The thermal sensor on the board may not respond to protect the FETs from damaging temperatures due to its location and possible thermal gradients on the board. bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 7: Basic Operation
3. Connect a 15k-Ω 1/4W resistor to the CHGCTL terminal of the board. 4. Set the bench supply to approximately 36V. 5. Connect a disabled load between the DSG– (negative) and PACK+ (positive) terminals. SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 8: Cell Connections
6. When removing cells, remove any charger and CHGCTL connection, then disconnect in the reverse order. Software Installation This section describes how to install the software for the bq77910AEVM-001. The bq77908-10-GUI-SW supports the bq77910A and is described in this document as bq77910A evaluation software. -
Page 9: Successfully Updated Ti Usb Interface Adapter
EVM from Texas Instruments and its default firmware is not compatible with the bq77910A. If the firmware has already been updated to version 2.0.19 to work with other BMS-HCE products, additional update is not required. If required, update the firmware using the following steps. -
Page 10: Installing The Bq77908-10-Gui-Sw Evaluation Software
Although the software will run without connection to a powered device it is recommended to have the device on when starting the software. Figure 3 shows connections for operation with the GUI software. bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 11: Evm Connection For Communication And Programming
4. Connect the "battery" power supply to the EVM, adjust to approximately 30 to 40VDC. 5. Wake the bq77910A by connecting CHGCTL high. 6. Start the software, typically using Start > All Programs > Texas Instruments > bq77908-bq77910 Evaluation. When started, the software will look for the communication interface and the device. When communication... -
Page 12: Menu Commands
(red X button). Selection of an adapter other than the 2 shown is not supported. bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 13: Communication Selection Window
EEPROM settings, the left side can display the volatile registers waiting to be programmed in the EEPROM. When the software is first started, all values are shown as zero. SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 14: Working With Register Values
Reading the registers or copying EEPROM values to the volatile registers is recommended before any change. bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... - Page 15 Accidental manipulation of the data between when the file is loaded and when the programming command is sent is not prohibited. SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
-
Page 16: Status Section
Figure 9 shows a typical status display polling with undervoltage. Figure 9. Polling Status with Under-Voltage Condition bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 17: Basic Operation With Software
(not provided) at J6 pins 1 to 2, or a signal at ZD on J3. To program, the on-board programming voltage switch can be used by controlling the PGM signal on J3. Signals should be 3.3V CMOS levels. SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 18: Related Documents From Texas Instruments
Related Documents From Texas Instruments To obtain a copy of any of the following TI document, call the Texas Instruments Literature Response Center at (800) 477-8924 or the Product Information Center (PIC) at (972) 644-5580. When ordering, identify this document by its title and literature number. Updated documents can also be obtained through the TI Web site at www.ti.com. -
Page 19: Cell Count Component Configuration
— — < 25V — installed installed installed installed installed installed installed installed Remove Remove Remove Remove Remove Remove installed installed Remove Remove Remove Remove Remove SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 20: Ground Connection
Ground Connection The IC VSS (ground) reference on the bq77910AEVM-001 circuit module is connected to the BATT– at the sense resistor. Note the range of the inputs when considering moving the ground location in an application design. -
Page 21: Filter Capacitors
BAT to CPCKN during transients or situations when the applied charger voltage exceeds the device absolute maximum. D8 also functions in the series FET configuration to prevent CPCKN from significantly exceeding BAT. SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 22: Output Protection Components
7.12 Thermal Sensor The thermal protection on the bq77910AEVM circuit module is set to provide a trip threshold between 65 and 70°C with nominal values. Component tolerances and substitute values may alter this trip point. An on-board thermistor RT1 is mounted near the center top of the board. -
Page 23: Bq77910A Circuit Module Physical Construction
8.1.1 Board Layout The bq77910AEVM circuit module is a 4.5-inch × 3.25-inch 2-layer circuit card assembly. It is designed for easy connection with cell connections on the left side and load connection on the right using standard wires to the terminal blocks. The board was planned for 30A current flow. Wide trace areas are used to reduce voltage drops. -
Page 24: Top Assembly
Circuit Module Physical Construction www.ti.com Figure 11. Top Assembly Figure 12. Top Layer bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 25: Layer 2
Circuit Module Physical Construction www.ti.com Figure 13. Layer 2 Figure 14. Layer 3 SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 26: Bottom Layer
Circuit Module Physical Construction www.ti.com Figure 15. Bottom Layer Figure 16. Bottom Silkscreen bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 27: Bottom Assembly
Circuit Module Physical Construction www.ti.com Figure 17. Bottom Assembly SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 28: Bq77910A Circuit Module Bill Of Materials
0603 R55, R56, R57, R58, R60, R61, R62, R63, R65 Resistor, Metal Film, 1/4 watt, ± 5% 1206 R48, R49 5.1M Resistor, Chip, 1/16W, 5% 0603 bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... - Page 29 6. Provide connectors (##) with assembly, install on J4 and J5 after test 7. Install shunt on J1 during test 8. Install standoffs at board corners, nut on top SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
-
Page 30: Schematic Diagram
Circuit Module Physical Construction www.ti.com Figure 18. Schematic Diagram Page 1 bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 31: Schematic Diagram
Circuit Module Physical Construction www.ti.com Figure 19. Schematic Diagram Page 2 SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 32: Resistor Cell Simulator
Additional patterns are included on the board for test points. Figure 20. Resistor Simulator Top Silkscreen bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 33: Resistor Simulator Top Layer
Circuit Module Physical Construction www.ti.com Figure 21. Resistor Simulator Top Layer SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 34: Resistor Simulator Bottom Layer
Circuit Module Physical Construction www.ti.com Figure 22. Resistor Simulator Bottom Layer bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 35: Resistor Simulator Top Assembly
Circuit Module Physical Construction www.ti.com Figure 23. Resistor Simulator Top Assembly SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... -
Page 36: Resistor Simulator Bottom Assembly
Pad, TH 0.038 inch – PCB, 2 In x 1.75 In x 0.062 In HPA582 Notes: 1. These assemblies are ESD sensitive, ESD precautions shall be observed. bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... - Page 37 3. These assemblies must comply with workmanship standards IPC-A-610 Class 2. 4. Ref designators marked with an asterisk ('**') cannot be substituted. All other components can be substituted with equivalent MFG's components. SLUU855 – February 2012 bq77910AEVM Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated...
-
Page 38: Resistor Simulator Schematic Diagram
Circuit Module Physical Construction www.ti.com Figure 25. Resistor Simulator Schematic Diagram bq77910AEVM SLUU855 – February 2012 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated... - Page 39 Any exceptions to this is strictly prohibited and unauthorized by Texas Instruments unless user has obtained appropriate experimental/development licenses from local regulatory authorities, which is responsibility of user including its acceptable authorization.
- Page 40 REGULATORY COMPLIANCE INFORMATION (continued) FCC Interference Statement for Class B EVM devices This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications.
- Page 41 Japan with respect to this product. Also, please do not transfer this product, unless you give the same notice above to the transferee. Please note that if you could not follow the instructions above, you will be subject to penalties of Radio Law of Japan. Texas Instruments Japan Limited (address) 24-1, Nishi-Shinjuku 6 chome, Shinjukku-ku, Tokyo, Japan http://www.tij.co.jp 【ご使用にあたっての注】...
- Page 42 FDA Class III or similar classification, then you must specifically notify TI of such intent and enter into a separate Assurance and Indemnity Agreement. Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2012, Texas Instruments Incorporated...
- Page 43 Any exceptions to this are strictly prohibited and unauthorized by Texas Instruments unless user has obtained appropriate experimental/development licenses from local regulatory authorities, which is responsibility of user including its acceptable authorization.
- Page 44 FCC Interference Statement for Class B EVM devices This equipment has been tested and found to comply with the limits for a Class B digital device, pursuant to part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interference in a residential installation. This equipment generates, uses and can radiate radio frequency energy and, if not installed and used in accordance with the instructions, may cause harmful interference to radio communications.
- Page 45 Also, please do not transfer this product, unless you give the same notice above to the transferee. Please note that if you could not follow the instructions above, you will be subject to penalties of Radio Law of Japan. Texas Instruments Japan Limited (address) 24-1, Nishi-Shinjuku 6 chome, Shinjuku-ku, Tokyo, Japan http://www.tij.co.jp...
- Page 46 FDA Class III or similar classification, then you must specifically notify TI of such intent and enter into a separate Assurance and Indemnity Agreement. Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2012, Texas Instruments Incorporated...
- Page 47 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue.
- Page 48 Authorized Distribution Brand： Website： Welcome to visit www.ameya360.com Contact Us： Address： 401 Building No.5, JiuGe Business Center, Lane 2301, Yishan Rd Minhang District, Shanghai , China Sales： Direct +86 (21) 6401-6692 Email amall@ameya360.com 800077892 Skype ameyasales1 ameyasales2 Customer Service： Email service@ameya360.com Partnership：...
Need help?
Do you have a question about the bq77910AEVM and is the answer not in the manual?
Questions and answers