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Summary of Contents for GigaDevice Semiconductor GD32
- Page 1 GigaDevice Semiconductor Inc. GD32 MCU Power Consumption Testing Process Application Note AN105...
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Page 2: Table Of Contents
AN105 GD32 MCU Power Consumption Testing Process Table of Contents Table of Contents ......................1 List of Figures ........................ 2 List of Tables ........................3 1. Introduction ......................4 2. Power consumption testing process ..............5 2.1. Preparation of test tools ......................5 2.2. -
Page 3: List Of Figures
AN105 GD32 MCU Power Consumption Testing Process List of Figures Figure 2-1. Schematic diagram of hardware connection for test ............ 6 Figure 2-2. Hardware cable connections for Battery supply test ........... 7 Figure 2-3. Power consumption characteristic ................. 8... -
Page 4: List Of Tables
AN105 GD32 MCU Power Consumption Testing Process List of Tables Table 4-1. Revision history ....................... 10... -
Page 5: Introduction
GD32 MCU Power Consumption Testing Process Introduction This article is designed for GD32 MCU, mainly introduces the power testing process, including the selection and use of test instrument specifications, hardware circuit design, software code use, test data recording, so as to achieve accurate power data. -
Page 6: Power Consumption Testing Process
AN105 GD32 MCU Power Consumption Testing Process Power consumption testing process Preparation of test tools 2.1. MCU power consumption testing generally requires the following tools: 1. MCU chip to be tested. In general, at least three samples of the same batch and process of MCU should be taken as the tested objects. -
Page 7: Testing Process
AN105 GD32 MCU Power Consumption Testing Process frequency 4MHz / 2MHz, VPP=3.3V, OFFSET=1.65V. Software configuration Peripheral enabled / disabled. The software developer turns on / off the relevant peripheral clock by manipulating library functions in the code according to the user manual. -
Page 8: General Problems
AN105 GD32 MCU Power Consumption Testing Process separately test the input current of the VBAT pin in each mode of Battery supply when the MCU VDD is disconnected. Generally, the common VBAT supply voltage is 3.6V, 3.3V, 2.6V, 1.8V. According to the four modes, it is divided into four codes. Each code is directly compiled and downloaded, and tested and recorded by changing different power supply voltages. -
Page 9: Case Description
AN105 GD32 MCU Power Consumption Testing Process Flash Size is added to Programing Algorithm in the Debug-Flash Download and whether the RAM for Algorithm is set correctly. Data deviation Each test will have a reference value. When the measurement contrast deviation is large, the following checks can be done: Check whether the hardware test system is connected to other wire paths, resulting in system leakage;... -
Page 10: Summary
AN105 GD32 MCU Power Consumption Testing Process Summary According to the measured application time and current consumption of each MCU mode, the average current consumption can be estimated in the actual application program, so that users can calculate the sustainable working time of MCU under the condition of battery power. -
Page 11: Revision History
AN105 GD32 MCU Power Consumption Testing Process Revision history Table 4-1. Revision history Revision No. Description Date Initial Release Apr.7, 2023... - Page 12 Important Notice This document is the property of GigaDevice Semiconductor Inc. and its subsidiaries (the "Company"). This document, including any product of the Company described in this document (the “Product”), is owned by the Company under the intellectual property laws and treaties of the People’s Republic of China and other jurisdictions worldwide.
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