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Scientific SM6030A Operation Manual

Automatiic transformer test system
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  • Page 1 SM6030A...

  • Page 2: Table Of Contents

    Contents Chapter 1 Out of Box Audit ......................1 To Inspect the package ....................1 Power connection ......................1 Fuse ..........................1 Environment ......................... 1 Use of Test Fixture ....................... 2 Warm-up ........................2 Other features ....................... 2 Chapter 2 Introduction ........................
  • Page 3 <MEASURE SETUP> ....................23 3.5.1 Trigger mode ....................24 3.5.2 Auto level control function ................ 25 3.5.3 Average ...................... 25 3.5.4 Voltage/Current Level Monitor function ............ 25 3.5.5 Trigger Delay ..................... 26 3.5.6 Step delay ....................26 3.5.7 Output Impedance ..................27 3.5.8 DCR Polarity ....................
  • Page 4 Correct connection of DUT ..................51 Eliminate the influence of stray impedance ............... 52 Operation example for testing inductance with SM6030A ........53 Operation example of testing capacitance by multi-frequency list sweep ....54 Operation Example of Load Correction ..............56 Chapter 6 Transformer Stand Alone Test ..................
  • Page 5 PRI Page-Turning Function ..............102 7.13.4 <FILE MANAGE> .................. 102 7.13.5 Operation Steps for File Manage .............. 103 7.13.6 Stored File of SM6030A ................105 7.13.7 Compatibility of Stored Files ..............105 7.13.8 Transformer Deviation-Deduction ............106 7.13.9 Save Scan Test Results by U Disk ............109 7.14...
  • Page 6 7.15 Frequently asked questions and answers in transformer scan test......110 7.15.1 High & Low Limits .................. 110 7.15.2 Measurement item loss ................110 7.15.3 Measurement Interruption ................ 110 7.15.4 Poor DCR Accuracy ................. 111 7.15.5 Poor Lk Accuracy ..................111 7.15.6 Inaccurate Turn ..................
  • Page 7 8.6.9 Accuracy of Z ................... 130 8.6.10 Accuracy of DCR ..................130 Chapter 9 Command Reference ....................131 Subsystem commands for SM6030A ............... 131 9.1.1 DISPlay subsystem commands ..............131 9.1.2 FREQuency subsystem commands ............133 9.1.3 VOLTage subsystem commands .............. 134 9.1.4...
  • Page 8 GPIB Common Commands ..................166 Chapter 10 The description for Handler (optional) ..............170 10.1 Technical description ....................170 10.2 The operation description ..................170 10.2.1 The definition for the signal line .............. 170 10.2.2 Electrical feature ..................177 10.2.3 HANDLER Interface board circuit ............

  • Page 9: Chapter 1 Out Of Box Audit

    Chapter 1 Out of Box Audit When you receive the instrument, some inspections are necessary, and the condition must be understood and available before installing the instrument. 1.1 To Inspect the package Inspect the shipping container for damage after unpacking it. It is not recommended to power on the instrument in the case of a damaged container.

  • Page 10: Use Of Test Fixture

    or where there is corrosive air. The normal working temperature is 0℃~40℃, relative humidity ≤75%, so the instrument should be used under above condition to guarantee the accuracy. There is heat abstractor on the rear panel to avoid the inner temperature rising. In order to keep good airiness, please don’t obstruct the left and right airiness holes to make the instrument maintain the accuracy.

  • Page 11: Chapter 2 Introduction

    Chapter 2 Introduction In this chapter, the basic operation features of SM6030A series are described. Please read the content carefully before using SM6030A series instruments, thus you can learn the operation of SM6030A. 2.1 Introduction to front panel Figure 2-1 shows the front panel of SM6030A.

  • Page 12: Introduction To Rear Panel

    Five soft keys are used to select parameters. The corresponding function of each soft key has been displayed above. The function definition varies with different pages. 15) POWER Power switch 2.2 Introduction to rear panel Figure 2-2 shows the rear panel of SM6030A.

  • Page 13: Introduction To Display Zone

    The tester can communicate with PC through GPIB interface. ——————————————————————————————————————— Warning: Be sure that the direction of fuse is accordant with power-supply voltage range before charging. ——————————————————————————————————————— 2.3 Introduction to display zone SM6030A applies a 65k, 4.3-inch TFT display. The display screen is divided into the following...

  • Page 14: Main Menu Keys And Corresponding Displayed

    zones: Figure 2-3 display zones Display page name Indicate the name of the currently displayed page. Soft keys The zone is used to display the function definition of soft key. The definition of soft key can be different as the difference of cursor’s direction in the zone. Test result/ condition display zone In this zone, test result information and current condition are displayed.

  • Page 15: Setup]

    <TRANS MEAS DISP> <FILE MANAGE> When the transformer sweep function is active, it is used to enter the transformer sweep display page. The function pages of this section are: <TRANS DEVIATION SETUP> When positioning scan function is active, there is no function page here. 2.4.2 [SETUP] When the LCR function is active, press this key-[SETUP], the following soft keys will be displayed...

  • Page 16: Basic Operation

    <DEFAULT SETTING> <SYSTEM RESET> 2.5 Basic Operation Basic operation of SM6030A is as follows:  Use menu keys ([DISP], [SETUP]) and soft keys to select the desired page.  Use cursor keys ([←][→] [↑] [↓]) to move the cursor to the desired zone. When the cursor moves to a specified zone, the zone will become reverse expression.

  • Page 17: Chapter 3 Introduction To [Disp]

    Open, short, load correction ON/OFF status (CORR) 3.1.1 Test function In a measurement period, SM6030A can test four parameters for an impedance component: two primary parameters and two secondary parameters. Parameters that can be tested are as follows: Primary parameters ...
  • Page 18  |Y| (Module of admittance)  L (Inductance)  C (Capacitance)  R (Resistance)  G (Conductance)  DCR (DC resistance) Secondary Parameters  D (Dissipation factor)  Q (Quality factor)  (Equivalent Series Resistance ESR)  (Equivalent Parallel Resistance) ...
  • Page 19 —…→, the following parameters will be shown for your choice. 4) Press L    MORE→  RETURN←  Press the soft key corresponding to your desired parameter. Then press RETURN← to return to upper soft key menu. 5) Press MORE→, the following parameters will be shown for your choice. ...

  • Page 20: Test Range

    Measurement range should be selected in accordance with the impedance value of the tested LCR component. SM6030A has 10 AC measurement ranges: 3Ω, 10Ω, 30Ω, 100Ω, 300Ω, 1kΩ, 3kΩ, 10kΩ, 30kΩ, 100kΩ. SM6030A has 11 DCR measurement ranges: 1Ω, 3Ω, 10Ω, 30Ω, 100Ω, 300Ω, 1kΩ, 3kΩ, 10kΩ, 30kΩ, 100kΩ.

  • Page 21: Test Frequency

    DCR, the FREQ zone will display “---”. The total frequency points are 15025. Operation steps for setting test frequency: SM6030A provides two methods to set measurement frequency. The first one is to use soft keys and the other one is to input data by using numeric keys.

  • Page 22: Test Level

    Refer to <MEASURE SETUP> for more information. Operation steps for setting test level: SM6030A provides two methods to set the level of test signal source. The first one is to use soft keys, while the second one is to input data by numeric keys.

  • Page 23: Test Speed

    SM6030A provides two methods to set the DC bias. The first one is to use soft keys, while the second one is to input data by numeric keys. Move the cursor to BIAS, the following soft keys will be displayed.

  • Page 24: Use Usb To Save Lcr Test Results

    Decimal point function can make SM6030A output the test result in fixed way, meanwhile this function can change the displayed digits of test result. Follow the steps below to set the result display of decimal point. Operation steps for tools Set the display mode of decimal point in fixed mode according to the following operation steps.

  • Page 25: Bin No. Disp

    Pic302 Here, #00021 is the E:\CSV\ is the save path; number of save times. 002 means the 2nd, 1011 means the date. 3.2 <BIN NO. DISP> Press [DISP] firstly and then the BIN NO. soft key to enter into <BIN NO. DISP> display page. On this page, BIN NO.

  • Page 26: Comparator Function

    3.2.1 Comparator function SM6030A has an inserted compare function which can divide DUT to up to 10 bins (from BIN1 to BIN9 and BIN OUT). Users can set 9 pairs of primary parameter limit and one pair of secondary bin limit.

  • Page 27: Param

    Pic304 The following control parameters can be set on the <BIN COUNT> page.  Count function ON/OFF (COUNT) There are 2 zones are displayed in this page: BIN COUNT DISP, COUNT. The function of each zone will be introduced as below. The following test result/ condition can be displayed in this page but cannot be set in this page.

  • Page 28: Count

    3.4 <LIST SWEEP DISP> The list sweep function of SM6030A can make automatic sweep test for up to 201 points’ test frequencies, test levels or DC bias. Each list sweep test point can be set to its high and low limits.

  • Page 29: Sweep Mode

    <LIST SWEEP SETUP>. 3.4.1 Sweep mode The list sweep function of SM6030A can make automatic scan test for up to 201 points’ test frequencies, test levels or DC bias. Two sweep modes are available on SM6030A: SEQ and STEP.

  • Page 30: Freq (Hz)

    Press SEQ to set the sweep mode as sequential sweep test mode. Press STEP to set the sweep mode as single step sweep test mode. 3.4.2 FREQ (Hz) This zone shows the currently swept parameter mode and its unit. What are right below this item are parameters of the sweep list.

  • Page 31: Trigger Mode

    SM6030A will execute a test. The BUS mode cannot be set on the front panel. ——————————————————————————————————————— Note: In the process of testing, when SM6030A receives a trigger signal, it will be ignored. So the trigger signal should be sent after the test is done.

  • Page 32: Auto Level Control Function

       Use above soft keys to set the trigger mode. 3.5.2 Auto level control function Auto level control function can adjust the real test level (voltage across or current through DUT) to the test level value. This function can guarantee the test voltage or current being constant. When using this function, the test level can be set within the range below: The range of constant voltage: 10 mV to 1 V...

  • Page 33: Trigger Delay

    OFF. 3.5.5 Trigger Delay SM6030A trigger delay means the delay time from triggering to test-start. Delay function can set the trigger delay time. When the list sweep test function is used, all set delay time will be delayed at each sweep test point.

  • Page 34: Output Impedance

    30Ω. 3.5.8 DCR Polarity SM6030A can provide two DC resistance test mode: ALT and FIX. At present, only ALT mode can be used. ALT mode is positive and negative DC voltage measurement. FIX is to fix positive voltage measurement.

  • Page 35: Deviation Test Function

    MEASURE When the reference component is connected to the test terminal, you should press MEASURE. Then SM6030A will test the reference component and the test result will be automatically input as the value of REF B. Use MEAS or numeric keys to input the reference value of the secondary parameter. If the reference values of primary and secondary parameters have been set in steps 2), you can skip this step.

  • Page 36: Correction

    Open, short and load correction on the <CORRECTION> page can be used to eliminate the distribution capacitance, spurious impedance and other measurement errors. SM6030A provides two correction modes: the first one is executing open and short correction on all frequency points through interpolation method;...

  • Page 37: Open

    The real test results of the load correction can be tested in the FREQ zone. 3.6.1 OPEN The open correction function of SM6030A can eliminate the error caused by the stray admittance (G, B) parallel-connected with DUT, shown as figure below.

  • Page 38: Short

    Press OFF to turn off the open correction function. In later measurement, no open correction calculation will be taken. 3.6.2 SHORT The short correction function of SM6030A can eliminate the error caused by spurious inductance (R, X) in serial with DUT as shown in figure below. Spurious Inductance SM6030A adopts two kinds of short correction data.

  • Page 39: Load

    FREQ2……FREQ201) and the standard reference value at the preset frequency (FREQ), the load correction of SM6030A can eliminate the test error. It is obvious that open, short, and load correction can be performed at preset frequencies. 201 load points can be set in the setup zone of LOAD, the frequency can be set in the setup zones of FREQ.
  • Page 40 Press this soft key to execute open correction at FREQ.  MEAS SHORT Press this soft key to execute short correction at FREQ.  MEAS LOAD Press this soft key to execute the load correction at FREQ. Press the soft key ON, the original preset open/short/load correction frequency is displayed on the frequency setting zone.

  • Page 41: Load Correction Test Function

    Pic308 Compare function can be set on this page. SM6030A can set 9 bin limits of primary parameters and one of secondary parameters. The tested result can be divided into up to 10 bins (BIN 1 to BIN 9 and BIN OUT).

  • Page 42: Swap Parameter

     Compare function ON/OFF (COMP)  Low limit of each bin (LOW)  High limit of each bin (HIGH) 3.7.1 Swap parameter The swap parameter function can swap the primary and the secondary parameter in PARAM. For example, when the test parameter is Cp-D, the swap parameter function can change the test parameter as D-Cp.

  • Page 43: Set Nominal Value Of Tolerance Mode

    Figure 3-3 Tolerance mode and Sequential mode ——————————————————————————————————————— Note: When setting limit values of tolerance mode, the error range should be set in the order from small to large. If the error range of BIN1 is the largest one, then all DUT will sort into BIN 1. Under tolerance mode, the low limit is not necessary to be smaller than the nominal value and the high limit is not necessary to be larger than the nominal value.

  • Page 44: Comparator Function On/Off

    DUT is within the limit range from BIN 1 to BIN 9, but the secondary parameter is out of the limit range, in this case the DUT will be sorted into aux bin. When SM6030A installs the HANDLER interface and it is used in the automatic sorting system, the compare function will be especially useful.

  • Page 45: High/Low

    Use above soft keys to set the auxiliary function as ON or OFF. 3.7.6 HIGH/LOW SM6030A can set bin limits of 9 primary parameters and one secondary parameter. The test results can be sorted into 10 bins at most (BIN 1 to BIN 9 and BIN OUT). The high/low limits of primary parameters can be set in high limit and low limit of bins from BIN 1 to BIN 9.

  • Page 46: List Sweep Setup

    Press [SETUP] and then LIST SETUP to enter into the <LIST SWEEP SETUP> page as shown below. Pic309 The list sweep function of SM6030A can perform auto sweep test for the test frequency, test level or bias voltage of 201 points. On <LIST SWEEP SETUP> page, the following list sweep parameters can be set.

  • Page 47: Sweep Parameter Setup

     FREQ [Hz]  LEVEL [V]  LEVEL [A]  BIAS [V]  BIAS [A] Press one of above soft keys to select the list sweep parameter. 3.8.3 Sweep parameter setup Move the cursor to the table to perform the setup of each sweep parameter: FREQ (HZ), LMT, HIGH and LOW.

  • Page 48: Chapter 4 [System] And

    Chapter 4 [SYSTEM] and <FILE MANAGE> 4.1 <SYSTEM SETUP> Press [SETUP] and then SYSTEM SETUP to enter into the <SYSTEM SETUP> page shown as below. Pic401 On this page, most system setup items are displayed, such as instrument main function, beeper, PASS beeper, FAIL beeper, language, PASS word, bus mode, GPIB address, TALK only, Bias SRC, baud rate, menu display and data/time.

  • Page 49: Pass Beep

    Move the cursor to the THEME area. The following soft keys are displayed in the soft key area of the screen.  Theme1 This soft key is used to select the interface color style of the instrument as theme 1. ...

  • Page 50: Language

    4.1.5 LANGUAGE This zone is used to control and display the current language mode of the operating instrument. Operation steps for setting language Move the cursor to LANGUAGE, the following soft keys will be displayed.  ENGLISH This soft key is used to select English as the operation language. ...

  • Page 51: Gpib Addr

    Use above soft keys to select the required interface bus. ——————————————————————————————————————— Note: GPIB optional must be installed before GPIB mode is available. ——————————————————————————————————————— 4.1.8 GPIB ADDR This zone is used to control and display the current GPIB address. Operation steps for setting GPIB address: Move the cursor to GPIB ADDR, the following soft keys will be displayed.

  • Page 52: Baud Rate

    LCR <FILE LIST> SM6030A series instrument can save the user-set parameter to the nonvolatile memory in the form of file, so when use the same setting next time user can load a corresponding file to obtain the parameter set and used last time.

  • Page 53: Setup File For Single-Group Component (*.Sta)

    4.2.1 Setup file for single-group component (*.STA) 40 groups of different single groups of component set file (*.STA file) can be saved in the instrument (it is 6 groups when LCR and transformer functions are turned on at the same time), but external storage U-disk can display/operate 500 groups of different single groups of component set file (note: U-disc is an optional accessory).

  • Page 54: U-Disk Manage Performance

    Low limit of Inductance-Q, Capacitance-D, Impedance-θ, ACR –X and DCR 4.2.2 U-disk manage performance As described above, SM6030A has a standard configuration of USB HOST interface, so the external U-disk can be used as the memory media. In this condition, it breaks the memory limit of 100 groups of *.LCR files.
  • Page 55 Press No to cancel the current save operation and return step 2. Press Yes, and “LCR file name:” will be displayed on the assistant line Use the numeric keys to enter the current file name and press [ENTER]. SM6030A saves the current control setting parameters with the file name.
  • Page 56 Pic403 NOTE: Please make sure that your U-disk meets the standard that described in this chapter and no write-read protection.

  • Page 57: Chapter 5 Execute Lcr Operation And Some Examples

    Chapter 5 Execute LCR operation and some examples 5.1 Correction operation To execute correction operation (in order to prevent the stray impedance from affecting the test accuracy, it is necessary to make open/short correction), users can select one of the two correction modes.

  • Page 58: Correct Connection Of Dut

    Press ON to turn on the open correction function. Move the cursor to the SHORT zone, ON, OFF, MEAS OPEN and DCR SHORT will be displayed in the soft key zone. Press ON to turn on the short correction function. Move the cursor to the LOAD zone, ON, OFF will be displayed in the soft key zone.

  • Page 59: Eliminate The Influence Of Stray Impedance

    components. Contact resistance must be reduced to Min. Short and open must be available between contact points. Open and short correction can easily reduce the influence of distribution impedance of the test fixture on measurement. For open correction, the clearance between test terminals should be the same with that when they connects with DUT.

  • Page 60: Operation Example For Testing Inductance With Sm6030A

    By this way, the magnetic fields produced by these currents can be mutually offset and further eliminate the influence of mutual inductance coupling on test results. 5.4 Operation example for testing inductance with SM6030A Test Condition...

  • Page 61: Operation Example Of Testing Capacitance By Multi-Frequency List Sweep

    Mount the tested inductance to the test fixture. Execute test operation. Press [DISP] to enter SM6030A into the <MEAS DISP> page. The instrument can test continuously and the test result will be displayed in upper case character in the center of the page. As shown in...
  • Page 62 Turn on the instrument. Set basic parameters. Press [DISP] to enter into the <MEAS DISP> page. The FUNC zone is currently displayed as Cp-D and the Level zone is 1.000V. Press [SETUP] to enter into the <MEAS SETUP> page, meanwhile the following soft keys will be displayed in the soft key zone: MEAS SETUP, CORRECTION, LIMIT SETUP, SWEEP SETUP and FILE MANAGE.

  • Page 63: Operation Example Of Load Correction

    Press [SYSTEM] to enter into the <System Setup> page. Move the cursor to the FAIL BEEP zone to select HIGH LONG. Mount the test fixture (26005) to the test terminals of SM6030A. Execute correction function (To avoid the influence of the stray impedance on the measurement accuracy, it is necessary to execute open/short correction (refer to chapter 5.1.1 Sweep...
  • Page 64 Press [SETUP], the following soft keys will be displayed in the soft key zone: MEAS SETUP, CORRECTION, LIMIT TABLE, LIST SETUP, FILE MANAGE and TOOLS. Press CORRECTION to enter into the <CORRECTION> page. Move the cursor to OPEN, the following soft keys will be displayed in the soft key zone: ON, OFF and MEAS OPEN And DCR OPEN.

  • Page 65: Chapter 6 Transformer Stand Alone Test

    Chapter 6 Transformer Stand Alone Test 6.1 Circuit for Transformer Stand Alone Test 6.1.1 Some Parameters of Transformer 6.1.2 Capacitance Test between Transformer Windings TH2832X 6.2 <TRANS TEST SET> interface Press [SYSTEM] to enter into the system setup main menu.

  • Page 66: Delay

    Pic601 Move the cursor to MAIN FUNC and then press the soft key TRANS MEAS to enter into the <TRANS TEST SET> interface. On this page, the following measurement parameters of the transformer can be set: test conditions of turns, test conditions of primary inductance, test conditions of primary leakage inductance, test conditions of primary DC resistance, where, test conditions include test voltage, frequency, switch, etc.

  • Page 67: Bias

     msec  6.2.2 Bias There are two modes for setting DC bias. The first one is using soft keys and the other one is using numeric keys. 1) Move the cursor to DC BIAS, the following soft keys will be displayed. ...

  • Page 68: Setting Lx Test Conditions

    6.2.4 Setting Lx Test Conditions Pic603 6.2.5 Setting DCR Test Conditions Pic604 6.2.6 Test Frequency, Voltage and Switch The parameter column consists of Lx, Cx, Zx, ACR, and DCR. Each parameter corresponds to three parameter variables: frequency, level and ON/OFF. Move the cursor to the corresponding setting area and change the (test) frequency and (test signal) level according to the screen prompts to meet the user's needs.

  • Page 69: Trans Limit Set> Interface

    6.3 <TRANS LIMIT SET> interface Press SETUP key and then press LIMIT SET to enter into the <TRANS LIMIT SET> page as shown in the following figure Pic605 On this page, the following parameters can be set: turn ratio, primary inductance, secondary inductance, primary DC resistance, nominal value used for judge and display, high and low limits, high/ low limit mode.

  • Page 70: Save Transformer Single-Group Test Result By U Disk

    Pic606 On this page, results of the transformer test parameters will be displayed. If the test result is in red, it means Fail. 6.4.1 Save Transformer Single-Group Test Result by U Disk Use U disk to save the test result, the following test results and formats can be saved: 1：TrLx: Lx, primary parameter, secondary parameter, compare result;...

  • Page 71: Chapter 7 Transformer Auto Scanning Test

    1. Use 25PIN double-headed cable (26067 transformer test control cable) to connect the SCANNER socket on the rear panel of 1831 and the SCANNER socket on the rear panel of SM6030A as shown in the following figure.
  • Page 72 3. If the scanning box is 1831, user should connect the trachea to the valve controller. 4. Connect 1831L 4-terminal scanning box to the corresponding terminal on the front panel of SM6030A and lock it as shown in the following figure. Pic702...

  • Page 73: Upper Panel Of Scanning Box

    7.3 Upper Panel of Scanning Box SMA1831 Transformer Test Fixture GOOD WARNING： ※ Mold the pins of transformers before measurement； ※ Clean the fixture in time for accurate measurement； ※ Cover the fixture after use to avoid dust. START RESET 1831 Upper panel of Manual Fixture Introduction to the marking numbers: 1) Model Label...
  • Page 74 SMA1831 Transformer Test Fixture GOOD WARNING： ※ Mold the pins of transformers before measurement； ※ Clean the fixture in time for accurate measurement； ※ Cover the fixture after use to avoid dust. START RESET 1831 Upper Front Panel of Pneumatic test fixture Introduction to the marking numbers: 8) Silencer: This is a silencer used for noise reduction and dust proof.

  • Page 75: Lower Panel Of Scanning Box

    3. FOOT. C: Used to connect footswitch. 4. SCANNER: Signal control port. Use 26067 control line to connect the scanning box with SM6030A through SCANNER port. 5. HANDLER: HANDLER port. Refer to section 7.5 for instruction of HANDLER port. 7.5 HANDLER Interface 7.5.1 Timing Diagram of HANDLER signal...
  • Page 76 HANDLER PIN & Function Pin1 NS1, Open Drain Output Pin14 Pin2 NS2, Open Drain Output Pin15 Pin3 NS3, Open Drain Output Pin16 Pin4 NS4, Open Drain Output Pin17 Pin5 NS5, Open Drain Output Pin18 air pump power 24V- Pin6 NS6, Open Drain Output Pin19 GND_EXT Pin7...

  • Page 77: Example Of Transformer

    The interface can be configured as a photoelectric isolated interface, use external power supply and external reference ground, the current jumpers J7, J8, and J9 are set in the 2-3 state, please be careful not to use an external voltage that exceeds the limit.

  • Page 78: Clear Ram

    secondary numbers, rescan interval, scan display mode, FAIL RESCAN, DCR measure delay, DCR over delay, I-bias ON delay, ignore nominal, trigger delay, cylinder control. 7.7.1 CLEAR RAM When setting a new transformer ID test condition, user must execute CLEAR RAM to clear the unexpected data stored in the memory of the instrument (by this way, the new test conditions may occur unexpected error, the method is as below: On <TRANSFORMER ID>...

  • Page 79: Handler Mode

    Pic706 Here is user defined pin label. 7.7.3 Handler Mode ①When measuring several transformers, Handler can output the judgment results of each transformer (single page or two pages): On <TRANSFORMER ID> page, press TOOL to enter into the <TOOLS> page and press HANDLER MODE to enter into the <HANDLER MODE>...

  • Page 80: Autotrig Delay

    NOTE: PASS is the output of PIN1, FAIL is the output of PIN2; L PASS is the output of PIN3, FAIL is the output of PIN4. GD1|GD2: only test 2 pages of data, if 1 page of the 2 pages of data is PASS, output PASS signal PIN25, or output the FAIL signal PIN24.

  • Page 81: Pass Disp Time

    7.7.5 PASS DISP TIME On <TOOLS> page, move the cursor to PASS DISP TIME and press the number key (0-200) to confirm the display time. Pic710 This function is used to set the PASS display time after scanning. If the test result is FAIL, the result will be displayed all the time.

  • Page 82: Hdl Valid Time

    generated under the CSV folder, then through the host computer software analysis (HEX + settings file) to view the saved data content. HDL VALID TIME 7.7.7 On <TOOLS> page, move the cursor to HDL VAL ID TIME and press the number to confirm. It ranges from 1-255 and indicates the valid time of handler signal is 1-255ms.

  • Page 83: Lk. Relay Dly

    7.7.9 LK. RELAY DLY+ This area is the relay delay time for the LK leakage test. Press the soft key to change or press the numeric key to enter, range (0 ~ 5ms), the actual delay time is this time plus the relay action time. Pic714 7.7.10 DCR RELAY DLY+ This area is the relay delay time for the DCR test, range (0 ~ 5ms), the actual delay time is this time...

  • Page 84: Primary Nums

    Pic716 Press any key to enter the input character pop-up box, and then use the arrow keys to move to the corresponding input characters. Press 【ENTER】 to confirm 7.7.12 PRIMARY NUMS This zone is used to input the transformer primary winding group. For transformers with multi-magnetic core, it is necessary to set more PRI.

  • Page 85: Fail Rescan

    but PASS/FAIL will not be displayed. By doing this, users can check more test details.  ALL: It means the test data of each parameter will be displayed one by one and PASS/FAIL will also be displayed.  FAIL LIST: It means the test data of each parameter will be displayed one by one and FAIL parameters and its limit value setting will be displayed on the center screen.

  • Page 86: Trigger Delay

     FORCE DEV: When selecting this item, deducting deviation cannot be limited by STD. This is to say, the deduction can be performed even the deviation between the test value and STD is large. For example, transformer pins are inserted wrong. ...

  • Page 87: Pin Setup

    corresponding fixture position and input the corresponding transformer pin 1. Pin# of Transformer Pic717 Pin# of Fixture Press this key EXIT to quit pin# to switch page 7.9 PIN SETUP Press PIN SETUP in <TRANSFORMER ID> interface to enter into the <TRANSFORMER PIN SET>...
  • Page 88 pic718 Connect Ns1 and Ns2 in series Connect Ns1 and Ns2 in parallel to execute test. It is necessary to to execute test. It is necessary to set pins in series connection. set pins in parallel connection. The following figure is the pin setup page of PRI:2 (PRI: 2 is available when Np2 is used as primary winding group.) Pic719...

  • Page 89: Series Pin Short Setup

    7.10 SERIES PIN SHORT SETUP Pic720 Press this key to select the parameters of the series pin and switch the parameters with knob. current parameter Note: When Lx is selected, other parameters are invalid. Above figure shows the short pin setup when series transformers Ns1 and Ns2 test Lx. Pic721 Press the key to select the parameters of the series pin and press this key continuously to switch parameters.

  • Page 90: Test Condition> Interface

    Pic722 Press the key to switch the parallel parameter setup: single / all parameters. Above figure shows the short pin setup of the “+” terminal when series transformers Ns1 and Ns2 tests. Pic723 Above figure shows the short pin setup of the “-“ terminal when series transformers Ns1 and Ns2 tests.

  • Page 91: Frequency, Voltage, Switch And Scanning Sequence

    7.12.1 Frequency, Voltage, Switch and Scanning Sequence Each parameter has 4 variables: frequency, level, ON/OFF and scanning sequence. Move the cursor to the corresponding setting zones to modify frequency and level. Note:  Frequency: 20Hz to 200kHz  Turn ratio (test level): 5mV to 10V ...
  • Page 92 Pic725 7.12.2.1 TURN MODE Eight modes can be selected when SM6030A tests TURN.  TURN_v= primary nominal * secondary voltage/ primary voltage. This mode is used test transformer turn number.  TURN = primary nominal * secondary turn/ primary turn. When the primary inductance is small, using this mode can test the turn number more accurately.
  • Page 93 Secondary turn/ primary turn ≤100/1. Pic726 7.12.2.2 TURN Source Internal Resistance When testing TURN, SM6030A provides 2 source internal resistance modes:  30Ω This mode is most commonly used in testing TURN.  100Ω When testing the magnetic core with high magnetic inductivity, using 100Ω internal resistance can reduce the polarization to improve the accuracy and stability of testing Lx.

  • Page 94: Setting Lx Test Conditions

    7.12.2.4 Turn-Ration Short Set When testing transformer turn number, user can set the shorted pins on this page. Pic728 Input pins shorted. 7.12.3 Setting Lx Test Conditions On <TEST CONDITION> page, move the cursor to the Lx zone. Pic729 Press this key to select Series mode or Parallel mode (commonly use Series) 7.12.3.1 Setting Lx Multi-Frequency If it is necessary to test different pins with different frequencies, move the cursor to the Lx frequency zone on <...
  • Page 95 Lx multi-frequency test, as shown below: pic732 MULTI indicates that SM6030A is in the process of multi-frequency test. 7.12.3.2 Setting Lx Multi-Level If it is necessary to test different pins with different levels, move the cursor to the Lx level zone on...
  • Page 96 On Lx multi-level test setup page, the level setup of different pins is as the figure below: Pic734 After exiting from multi-frequency setup, MULTI will be displayed in the Lx frequency zone indicating that the instrument is in Lx multi-level test, as shown below: Pic735 MULTI indicates that SM6030A is in the process of multi-level test.
  • Page 97 Press this key to switch Q compare switch. 7.12.3.5 Setting Lx DC Bias SM6030A provides 50mA internal DC bias source as the standard bias source. Note: If users do not install corresponding DC bias source board, then the instrument will...

  • Page 98: Setting Lk Test Conditions

    Pic738 7.12.4 Setting Lk Test Conditions On <TEST CONDITION> page, move the cursor to Lk zone. Pic739 Press this key to select Series mode or Parallel mode (commonly use Series) 7.12.4.1 Lk Test Setup Page The pin input of Lk can be performed automatically or manually. ...

  • Page 99: Setting Cx Test Conditions

    Pic740 Input the frequency required to make multi-frequency test. The next item is Press this key to switch Press this key to switch the Lk the voltage level. If this zone is blank, the Lk serial number, the winding, and then automatically the frequency and the voltage on maximum number is 10.
  • Page 100 7.12.5.1 Cx Test Setup Page The following figure shows the example transformer. Test the capacitance between two turns: Np1 and Np2. Pic742 Cx serial number, the maximum Input a winding Input another number is 10. pin here. winding (一般使用并联) here. Input frequency required...

  • Page 101: Setting Zx Test Conditions

    7.12.6 Setting Zx Test Conditions On <TEST CONDITION> page, move the cursor to the Zx zone. Pic743 7.12.6.1 Zx Limit Setup Page Pic744 No nominal value here and no test in the process of scanning, except Ignore: TEST, the following is the same. 7.12.6.2 Zx Multi-Frequency Setup Page If it is necessary to test different pins with different frequencies, move the cursor to the Zx frequency zone on <...

  • Page 102: Setting Acr Test Conditions

    < TEST CONDITION > page. Press multi-level setup page to enter into the page setup and press EXIT key to quit after setup. Detailed operation, please refer to “7.12.3.2 Setting Lx multi-level”. 7.12.7 Setting ACR Test Conditions On <TEST CONDITION> page, move the cursor to the ACR zone. Pic745 7.12.7.1 ACR Limit Setup Page Pic746...

  • Page 103: Setting Dcr Test Conditions

    7.12.7.3 ACR Multi-Level Setup If it is necessary to test different pins with different levels, move the cursor to the ACR level zone on < TEST CONDITION > page. Press multi-level setup page to enter into the page setup and press EXIT key to quit after setup.
  • Page 104 Pic749 Press this button to switch the end delay of the PS test to 1-5ms. 7.12.9.1 PS Limit Setup Page Pic750 This page is used to set the low limit of the short pin. When the test result is smaller than the low limit, the test result is not good.

  • Page 105: Setting Bl Test Conditions

    Pic751 7.12.10Setting BL Test Conditions On <TEST CONDITION> page, move the cursor to the BL zone. Pic752 7.12.10.1 BL Test Setup Page BL (balance) is parameter used to compare the conformity of two windings.

  • Page 106: Trans Scan Test

    Pic753 Press the key to select the BL parameter: Press the key to switch the BL Lx, DCR, Lk, Cx, Lk/Lk. serial number, maximum number is 5. Users can compare Lx, Lk, Cx or DCR BL of two windings. BL provides three judge modes: ...

  • Page 107: Display Zone

    <Transformer ID> page. In scanning, if some pins of Lx or Zx sets DC bias current, the instrument would add corresponding DC bias current automatically, and [BIAS] key will be lighted. Note: I f user does not install DC bias current board, the instrument would display “NO BIAS CARD”, and [BIAS] will not light up.

  • Page 108: Function Key

    7.13.2 Function Key  [TRIGGER] Being used to startup the instrument to perform the scanning test.  [RESET] Being used to interrupt the scanning test.  [KEYLOCK] User can still perform other operations after the keyboard is locked, but the parameter setup cannot be modified.

  • Page 109: Pri Page-Turning Function

    Pic756 Now, put an open transformer sample with the same pin as tested product to the test fixture, and press SHORT, then the instrument will perform open scanning correction to the test fixture. The function can improve the test accuracy of small DC resistance and small inductance. 7.13.3 PRI Page-Turning Function On <TRANS SCAN TEST>...

  • Page 110: Operation Steps For File Manage

    7.13.4.2 U-Disk Manage Performance Just as the description mentioned above, USB HOST interface is a standard configuration of SM6030A, so external U disks can be used as the storage media and can store setup files of 500 groups. SM6030A supports the following storage devices (U disk): ...
  • Page 111 5) If No is selected, the save operation will be cancelled and return to Step 2) 6) If Yes is selected, SM6030A will have the default transformer name as the file name prompt to save, you can directly press the enter key to save the current control setting parameters, or use [←] to re-edit the file name to save.

  • Page 112: Stored File Of Sm6030A

    3) If No is selected, the current load operation will be cancelled and return to step 1). 4) If Yes is selected, the selected file will be loaded. Then SM6030A will return to the current displayed page. D. Copy a File 1) Supposing the file is required to be copied to the external memory.

  • Page 113: Transformer Deviation-Deduction

    Pic762 Note: Ensure the U disk you are using meets the standard mentioned above and has not been write-protected. 7.13.8 Transformer Deviation-Deduction If user has the standard samples of untested transformer, and its data of each test can serve as the measurement standard, the deviation-deduction function is available.
  • Page 114 4. Set [DEDUCT] as ON; 5. Set the correction parameter switch as ON; And set the deduction mode of the corresponding parameter; 6. Set the high and low limits allowed for deduction of each parameter. Pic764 7.Press [DEDUCT] to perform correction and back to <SCAN TEST> page. Pic765 When <TRANS ID>...
  • Page 115 Pic766 8. After deduction finishes, user press [START], the test value is displayed same as standard value. 9. If the deviation value needs to be viewed, enter into the <TRANS DEVIATION DEDUCT SETUP> page and select <DEVIATION SETUP> key to enter into the setup page of the deviation value.

  • Page 116: Save Scan Test Results By U Disk

    7.13.9 Save Scan Test Results by U Disk Pic768 Save the data on this page. E:\CSV\ is the saving path, while 1225_001.CSV is the saved file, and #00003 is the saving times. The saved data format is as follow: SN: serial number of the instrument TRS ID: name of the instrument Date: date No.

  • Page 117: Reset Statistic Count Value

    total column will add by 1.  [Fail] It means fail count value of L.K.~DCR each parameter;  [Fail] + [Total]: in one test, one or one more parameter of L.K.~DCR is unqualified, then the value of total column will add by 1. ...

  • Page 118: Poor Dcr Accuracy

    menu or set “Ignore Std.” as ON. 7.15.4 Poor DCR Accuracy If the sheet metal is oxygenized, tore and defaced, or user makes a fixture without applying 4-cable test method, it will cause the deviation of DCR. Solution: 1. Keep the sheet metal being new, so it can contact with transformer pin well. 2.

  • Page 119: Poor Stability Of Cx And Zx Open Test Data

    7.15.9 Poor Stability of Cx and Zx Open Test Data If the shielding and ground of test system is not good, it will cause the test value unstable when testing Cx or Zx. Solution: Through a thick metal lead, connect ground poles of the instrument and the scan box as well as the metal frame of the test fixture together and ground it reliably.
  • Page 120 Double row pad, socket inserted or direct wire bonding The theory of 4-cable measurement is the test cable of DRIVE and SENSE should be divided. In this figure, 1D means the drive terminal of pin1, 1S means sense terminal of pin1.

  • Page 121: Example Of Using 1801-Ext11A(5.0)-B Pin Signal

    7.16.2 Example of using 1801-EXT11A(5.0)-B pin signal The theory of 4-cable measurement is the test cable of DRIVE and SENSE should be divided. In this figure 1D means the drive terminal of pin1, 1S means sense terminal of pin 1. 7.17 Self-check Function of Scanner Relay 7.17.1 Operation steps for scan self-check 1.

  • Page 122: Displayed Information On Screen

    3. Enter self-check figure to perform scan self-check, as the figure below: Press the key to stop scanning. Quit Pic770 Press the key to start when scanning stops. scan test. 7.17.2 Displayed Information on Screen  OP: Open, the relay is not closed when it is controlled. ...

  • Page 123: Detection Method For Relay Short

    7.18 RELAYS ACT COUNT 7.18.1 View Steps of Scan Box for <RELAYS ACT COUNT> 1. The scan box should be properly connected to the SM6030A in order to see the number of relay actions. 2. On <TOOLS> Page, press More 1/2 to enter the 2nd page, press <RELAYS ACT DOUNT> to check 3.

  • Page 124: Screen Display Information Description

    7.18.2 Screen Display Information Description ST：Short relay act count   HP：HP terminal relay act count HC：HC terminal relay act count  LP：LP terminal relay act count  LC：LC terminal relay act count ...

  • Page 125: Chapter 8 Performance And Test

    Chapter 8 Performance and Test 8.1 Test Function 8.1.1 Parameter and Symbol C：capacitance L：Inductance R：resistance Z：impedance Y：admittance X：reactance B：susceptance G：conductance ：phase angle D：dissipation Q：quality factor Lk: leakage inductance DCR: DC resistance Turn-Ratio Turns Phase 8.1.2 Test combination Parameters described above are combined in the following modes: Primary Z, Y L, C...

  • Page 126: Trigger

    Delay time: time from trigger to start. 0 to 60s are programmable with a resolution of 1ms. 8.1.8 Connection modes of test terminals SM6030A adopts 4-terminal test method. HD (Hcur): current sample high terminal LD (Lcur): Current sample low terminal...

  • Page 127: Signal Mode

    8.2.2 Signal mode Normal: When testing, on measurement display page, voltage across test terminals may be smaller than preset voltage. Constant level: The auto adjustment of internal level makes the voltage of DUT accordant with preset voltage. 8.2.3 Test signal level Mode Range Accuracy...

  • Page 128: Dc Bias Voltage Source

    8.2.7 DC bias voltage source 100Ω 0V—± 5V Minimum resolution: .05mV, Accuracy: 1% x preset voltage+5mV 0mA—± 50mA Minimum resolution: 5μA 30Ω 0V—± 3V Minimum resolution: 0.5mV, Accuracy: 1% x preset voltage+5mV 0mA—± 100mA Minimum resolution: 5μA 8.3 Measurement accuracy Test accuracy includes stability, temperature coefficient, linear degree, test repeatability and calibration inter-error.

  • Page 129: Accuracy Of Q

     ≤0.1. The formula is only available when D ） When D >0.1, D should be multiplied by（1+D 8.3.3 Accuracy of Q The accuracy of Q is given by the formula below:     Where, Q is the value of the tested Q. is the accuracy of D Above formula should be used when Q ×...

  • Page 130: The Accuracy Of Rs

    is the value of test D with the unit [F]. is the accuracy of D. 8.3.7 The accuracy of Rs (value of tested D) ≤0.1 When D The accuracy of R is given by the formula below: × D [Ω] = 2πfL ...
  • Page 131 100kH 10kH [OHM] 10pF 100fF 10pF 100H 100pF 100M 100n 1.5M 10nF 100mH 100nF 100k 10mH 100u 0.05 10uF 100uH 100uF 10uH 100m 10mF 0.25 0.35 100nH 100mF 100m 0.65 10nH 20Hz 100Hz 1kHz 10kHz 100kHz 300kHz 50Hz 30kHz 200kHz In figure A, on the boundary line, choose a smaller value.
  • Page 132 Figure B Basic Accuracy Correction Curve 100m 150m [Vrms] 200m 500m Title Size Num ber Revision Date: 1-Nov-2001 Sheet 赵 浩 华 产 品 设 计 图 File: \th2816A\th2816.ddb Drawn By : Table A Impedance rate factors: K Speed Frequency ...

  • Page 133: Accuracy Of Dcr

    When the impedance is smaller than 500Ω, K is unavailable. When the impedance is larger than 500Ω, K is unavailable. Table B calibrated interpolating factor K Test frequency Direct calibrated frequency Other frequency 0.0003 Table C Direct Calibrated frequency [Hz] [Hz] [kHz] [kHz]...

  • Page 134: Turns To Ratio Accuracy

    8.3.11 Turns to Ratio accuracy （1+1Ω/Zp+1/Q）[%]± 0.002 ± A × A Fast: A = 0.5 Middle and slow: A = 0.25 Zp is the impedance of the tested primary inductance is the test signal accuracy modification value in figure B The accuracy index is used when the coupling coefficient is 1 or next to 1.

  • Page 135: Performance Test

    Performance test 8.6.1 Working condition All tests should be performed under the working condition listed in Chapter 1. In this part, only the main indexes are listed. Users can make test under the specified condition mentioned in this manual. Performance test can be worked in the warm up conditions discussed in Chapter 1. 8.6.2 The used instruments and devices Instrument and Device...

  • Page 136: Function Check

    8.6.3 Function check Ensure function keys, displayer and terminal etc. can work normally. 8.6.4 Test signal level Adjust multimeter in AC voltage range, where one test cable is connected to H and the other is connected to ground terminal. Change level as: 10mV, 20mV, 100mV, 200mV, 1V, 2V, the reading should meet the demand of test signal level in this chapter.

  • Page 137: Accuracy Of Z

    Open and short correction should be made before testing. Connect standard inductors: 100μH, 1mH, 10mH, 100mH and change the frequency. The error between reading and nominal value should be in the range ruled in this chapter. 8.6.9 Accuracy of Z Test condition: Function Z-θ...

  • Page 138: Chapter 9 Command Reference

    The signs in this manual are as follows: NR1: integer, e.g.:123 NR2: fix-point number, e.g.: 12.3 NR3: floating-point number, e.g.: 12.3E+5 ˆEND: EOI signal in IEEE-488 NL: carriage key, ASCII code: 10 Subsystem commands for SM6030A ●DISPlay ●ORESister ●TRIGger ●CORRection ●FREQuency ●BIAS ●INITiate...
  • Page 139 The :PAGE command sets the display page. The :DISPlay:PAGE? query returns the current page. Command syntax: DISPlay:PAGE<page name> <Page name> can be set as the following items: MEASurement Set the display page as the LCR measurement display. BNUMber Set the display page as the bin number display. BCOunt Set the display page as the bin count display.

  • Page 140: Frequency Subsystem Commands

    The :LINE command is used to set the current measurement item which can be a substring with up to 16 characters. The :LINE? query returns the current measurement item. The character string of the measurement item can be used as the file name when saving a file. Command syntax: DISPlay:LINE”<string>”...

  • Page 141: Voltage Subsystem Commands

    9.1.3 VOLTage subsystem commands The VOLTage subsystem commands are mainly used to set the measurement voltage. The VOLTage? query returns the current measurement voltage. Command syntax: <value> VOLTage Where, <value> NR1, NR2 or NR3 data format followed by V. Set the measurement voltage as 5mV. Set the measurement voltage as 2V.

  • Page 142: Output Resister Subsystem Commands

    AMPLitude:ALC Where, Character 1 (49) is equal to ON. Character 0 (48) is equal to OFF. For example: WrtCmd (“AMPL:ALC 0”) Set the ALC function as OFF. Query syntax: AMPLitude:ALC? Return format: <NR1><NL^END> 9.1.6 Output RESister subsystem commands The Output RESister subsystem commands are mainly used to set the output internal resistor mode. The Output RESister? query returns the current output internal resistance status.
  • Page 143 Command syntax: BIAS:STATe Where, Character 1 (49) is equal to ON. Character 0 (48) is equal to OFF. For example: WrtCmd (“BIAS:STATe 0”) Set the DC bias function as OFF. Query syntax: BIAS:STATe? Return format: <NR1><NL^END> The BIAS:VOLTage command is used to set the internal bias voltage. The BIAS:VOLTage? query returns the current bias voltage.

  • Page 144: Function Subsystem Commands

    Query syntax: BIAS:CURRent? Return format: <NR3><NL^END> (NOTE: when the internal resistance is 30Ω, the range of bias voltage is ±1.5V and the range of bias current is ± 100mA; when the internal resistance is 100Ω, the range of bias voltage is ±...
  • Page 145 OFF (0) :DEV1 :MODE ABSolute PERcent :REFerence <value> :FILL :StepDELay <value> The FUNCtion:IMPedance command is used to set instrument functions. The FUNCtion:IMPedance? query returns the current function parameters. Command syntax: FUNCtion:IMPedance <function> <function> can be one of the following items. Set the function as Cp-D LPRP Set the function as Lp-Rp...
  • Page 146 Return format: <value><NL^END> Where, <value> can be 1000 3000 10000 30000 100000 The FUNCtion:IMPedance:RANGe:AUTO command is used to set the automatic range selection status. The FUNCtion:IMPedance:RANGe:AUTO? query returns the current range status. Command syntax: ON (1) FUNCtion:IMPedance:RANGe:AUTO OFF (0) Where, Character 1 (49) is equal to ON.

  • Page 147: List Subsystem Commands

    Real value display Where, <n> is Character 1 (49) is equal to the nominal value of primary parameter. Or character 2 (50) is equal to the nominal value of the secondary parameter. For example: WrtCmd (“FUNC:DEV1:MODE ABS”) Query syntax: FUNCtion:DEV<n>:MODE? Return format: PERC <NL^END>...
  • Page 148 Command tree: LIST :FREQuency <sweep point>[,<sweep point> *] :VOLTage <sweep point>[,<sweep point> *] :CURRent <sweep point>[,<sweep point> *] :BIAS :VOLTage <sweep point>[,<sweep point> *] :CURRent <sweep point>[,<sweep point> *] :MODE SEQuence STEPped :BAND<n> A[,<low limit n>,<high limit n>] :CLEar:ALL The LIST:FREQuency command is used to clear the original sweep points and set the frequencies of the sweep points.
  • Page 149 For example: WrtCmd (“LIST:VOLT 1.5”) Set the frequency of the sweep point 1 as 1.5V. WrtCmd (“LIST:VOLT 1E-2, 2E-2, 3E-2, 4E-2”) Set the frequencies of sweep point 1, 2, 3 and 4 respectively as 10mV, 20mV, 30mV and 40mV. NOTE: This command can be followed by suffix unit V. Query syntax: LIST:VOLTage? Return format:<NR3>[,<NR3>*]<NL^END>...
  • Page 150 Query syntax: LIST:BIAS:CURRent? Return format: <NR3> [,<NR3>*]<NL^END> NOTE: SM6030A instrument has installed a 5V/50mA internal DC bias current source. The instrument can be used with 1778 DC Bias Source (providing DC current from 0 to 20A and can be bought from our company).

  • Page 151: Aperture Subsystem Commands

    <n> 1 to 10 (NR1 format): sweep points on the n line <parameter> Compare the primary parameter of the test results with the high and the low limits. Compare the secondary parameter of the test results with the high and the low limits. No comparison <low limit n>...

  • Page 152: Trigger Subsystem Commands

    9.1.11 TRIGger subsystem commands The TRIGger subsystem commands are mainly used to set the instrument trigger source, trigger delay and trigger measurement. Command tree: TRIGger [:IMMediate] :SOURce INTernal EXTernal HOLD :DELay <value> The TRIGger[:IMMediate] command is used to trigger a test. Command syntax: TRIGger[:IMMediate] For example: WrtCmd(“TRIG”) The TRIGger:SOURce command is used to set the trigger source mode.

  • Page 153: Fetch? Subsystem Commands

    Command tree: FETCh [:IMP]? :Source MONitor :VAC? :IAC? The FETCh[:IMP]? query directs SM6030A to input the last measurement result to the output buffer zone. Query syntax: FETCh[:IMP]? For example: WrtCmd (“TRIG:SOUR BUS”) WrtCmd (“TRIG”) WrtCmd (“FETC?”) SM6030A applies ASCII to delivery result, details are follows.
  • Page 154 Status Description (In data buffer memory) no data Common measurement data Analog LCR unbalance A/D converter is not working. Signal source is over loading. Constant voltage cannot be adjusted. <status> format: When above measurement data is used, <status> data will display measurement status.
  • Page 155 <Input/Output> format: The data displays the compare result of the list sweep.. Data Result pass high When the compare function of the list sweep measurement is turned off, the output result of <Input/Output> is 0. <Input/Output> data output format applies 2-digits ASCII format: SN (S: +/_, N: from 0 to 1) On transformer single-machine measurement display page, ASCII data output format is as below: SN ，...

  • Page 156: Correction Subsystem Commands

    9.1.13 CORRection subsystem commands The CORRection subsystem commands are mainly used to set the correction function, OPEN, SHORT, LOAD. Command tree:...
  • Page 157 CORRection :LENGth <value> :METHod SINGle MULTiple :OPEN :STATe ON (1) OFF (0) :SHORt :STATe ON (1) OFF (0) :LOAD :STATe ON (1) OFF (0) :TYPE CPRP CSRS LPRP LPRD LSRS LSRD :SPOT<1-201> :STATe ON (1) OFF (0) :FREQuency <value> :OPEN :SHORt :LOAD :STANdard <REF.A>,<REF.B>...
  • Page 158 Command syntax: CORRection:LENGth<value> Where, <value> is 0, 1, 2 or 4 followed by M. For example: WrtCmd (“CORR:LENG 1M”) Set the cable length as 1 meter. Query syntax: CORRection:LENGth? Return format: <NR1><NL^END> CORReciton:METHod command used correction mode. CORRection:METHod? query returns the current correction mode. Command syntax: CORRection:METHod SINGle MULTi...
  • Page 159 CORRection:SHORt:STATe? query returns the current short correction status. Command syntax： CORRection:SHORt:STATe Where, 1 (decimal 49) is equal to ON. 0 (decimal 48) is equal to OFF. For example: WrtCmd (“CORR:SHOR:STAT ON”) Query syntax: CORRection:SHORt:STATe? Return format: <NR1><NL^END> CORRecition:LOAD:STATe command used load correction.
  • Page 160 For example: WrtCmd (“CORR:LOAD:TYPE CPD”) Query syntax: CORRection:LOAD:TYPE? Return format: <function><NL^END> The CORRection:SPOT<n>:STATe command is used to set the state of some specific frequency spots. The CORRection:SPOT<n>:STATe query returns the current state of each frequency spot (FREQ 1, FREQ 2…FREQ 201). Command syntax: CORRection:SPOT<n>:STATe Where,...
  • Page 161 Where, Frequency spot 1~201 For example: WrtCmd (“CORR:SPOT1:OPEN”) Execute open correction for correction point 1. The CORRection:SPOT<n>:SHORt command is used to execute short correction for specific frequency spots (frequency 1, frequency 2 … frequency 201). Command syntax: CORRection:SPOT<n>:SHORt Where, Frequency spot 1~201 For example: WrtCmd (“CORR:SPOT1:SHOR”) Execute short correction for correction point 1.

  • Page 162: Comparator Subsystem Commands

    <open1/2/……/201 B> is NR3 data format and the secondary open correction data at frequency spot 1/2……/201. <short 1/2/……/201 A> is NR3 data format and the primary short correction data at frequency spot 1/2/……/201. <short 1/2/……/201 B> is NR3 data format and the secondary short correction data at frequency spot 1/2/……/201.
  • Page 163 Command syntax: COMParator[:STATe] Where, 1 (decimal 49) is equal to ON. 0 (decimal 48) is equal to OFF. For example: WrtCmd (“COMP ON”) Query syntax: COMParator[:STATe]? Return format: <NR1><NL^END>. The COMParator:MODE command is used to set the comparator mode. The COMParator:MODE? query returns the current mode.
  • Page 164 COMParator:TOLeance:BIN<n>? query returns the current high and the low limits of each bin. Command syntax: COMParatro:TOLerance:BIN<n><low limit><high limit> Where, <n> is the bin number from 1 to 9. <low limit> is the low limit in NR1, NR2 or NR3 data format. <high limit>...
  • Page 165 Query syntax: COMParator:SLIMit? Return format: <NR3>, <NR3> <NL^END> The COMParator:Auxiliary BIN command is used to set the auxiliary bin as ON or OFF. The COMParator:Auxiliary BIN? query returns the current auxiliary bin state. Command syntax: COMParator:Auxiliary BIN Where, 1 (decimal 49) is equal to ON. 0 (decimal 48) is equal to OFF.

  • Page 166: Mass Memory Subsystem Commands

    The COMParator:BIN:COUNt[:STATe] command is used to set the bin count function as ON or OFF. The COMParator:BIN:COUNt[:STATe]? query returns the current state of the bin count function. Command syntax: COMParator:BIN:COUNt[:STATe] Where, 1 (decimal 49) is equal to ON. 0 (decimal 48) is equal to OFF. For example: WrtCmd (“COMP:BIN:COUN ON”) Query syntax: COMParator:BIN:COUNt[STATe]? Return format: <NR1><NL^END>...

  • Page 167: Tran Subsystem Commands

    The MMEMory:STORe:STATe command is used to storing the current setting to a file. Command syntax: MMEMory:STOR:STATe<value>, “<string>” Where, <value> is the file number ranging from 0 to 39 (NR1). <string> can be ASCII character string (maximum length is 16). For example: WrtCmd (“MMEM:STOR:STAT 1, “Resistor meas””) or WrtCmd (“MMEM:STOR:STAT 1”), IF “,”<string>””...
  • Page 168 The TRAN:Lx:STAT command is used to set the primary Lx ON or OFF. The TRAN:Lx:STAT? query returns the current state of the primary Lx. Command syntax: TRAN:Lx:STAT Where, 1 (decimal 49) is equal to ON. 0 (decimal 48) is equal to OFF. For example: WrtCmd (“TRAN:Lx:STAT:ON”) Set all Lx parameters to be valid.
  • Page 169 Where, <value> is the Lx nominal value in NR1, NR2 or NR3 data format followed by H. <low limit> is the Lx low limit in NR1, NR2 or NR3 data format. <high limit> is the Lx high limit in NR1, NR2 or NR3 data format. NOTE: The low limit should be smaller than the high limit, or error information will be reported.
  • Page 170 NOTE: <value> ranges from 5mV to 2V. Beyond this range, error information will be reported. For example: WrtCmd (“TRAN:Zx:LEVel 1V”) Query syntax: TRAN:Zx:LEVel? Return format: <NR3><NL^END> The TRAN:ACR:STAT command is used to set the ACR test parameter to be ON or OFF. The TRAN:ACR:STAT query returns the current state of the ACR test parameter.
  • Page 171 Query syntax: TRAN:ACR:LEVel? Return format: <NR3><NL^END> The TRAN:Cx:STAT command is used to set the Cx test parameter to be ON or OFF. The TRAN:Cx:STAT query returns the current state of the Cx test parameter. Command syntax: TRAN:Cx:STAT Where, 1 (decimal 49) is equal to ON. 0 (decimal 48) is equal to OFF.
  • Page 172 Return format: <NR3><NL^END> The TRAN:Cx:LIMit command is used the set the Cx nominal value, high and low limits. The TRAN:Lx:LIMit? query returns the current Cx nominal value, high and low limits. Command syntax: TRAN:Cx:LIMit <value>,<low limit>,<high limit> Where, <value> is the Cx nominal value in NR1, NR2 or NR3 data format followed by H. <low limit>...

  • Page 173: Gpib Common Commands

    The *CLS command clears the standard event status register and the service request status register. Command syntax: *CLS For example: WrtCmd (“*CLS”)  The *IDN? query returns SM6030A ID. Query syntax: *IDN? Return format: <manufacturer>,<model>,<firmware><NL^END> Where, <manufacturer> Name of Manufacturer <model>...
  • Page 174  The *TST? query executes an internal self test and returns the test result as the sum of all existing errors codes. If there are no error SM6030A returns 0. Query syntax: *TST? Return format: 0<NL^END> Where, 0（NR1 format） For example: WrtCmd(“*TST?”);...
  • Page 175 The *OPC command equals to set the OPC bit of the standard event status register when SM6030A finishes all parameter measurements. Ever since all pending operations have been completed, this command will inform the instrument to add a ASCII number “1” (decimal number: 49) into the output buffer.
  • Page 176 Query syntax: *OPC? Return format:１<NL^END> Where, ASCII number 1（decimal number: 49） For example: WrtCmd(“*OPC?”)

  • Page 177: Chapter 10 The Description For Handler (Optional)

    Chapter 10 The description for Handler (optional) The SM6030A provides the Handler interface for you. The interface is mainly used for the output of the sorted result. The interface offers the communication signal and the signal for the output of the sorted result.
  • Page 178 /BIN8 /BIN9 /OUT /AUX /EXT.TRIG External trigger: when the trigger mode is EXT.TRIG, SM6030A will be triggered by the positive-edge pulse signal in this pin. External DC voltage 2: The DC provider pin for the optoelectronic EXT.DCV2 coupling signal(/EXT_TRIG, /KeyLock,...
  • Page 179 The external DC voltage 1: the pull-up DC power provider pin for optoelectronic EXT.DCV1 coupling signal (/BIN-/BIN9,/AUX, /OUT,/PHI,/PLO,/SREJ). /ALARM When circuit is interrupted, /ALARM is effective. /INDEX When the analog test is finished and the UNKNOWN terminal can be connected to another DUT, /INDEX is effective.
  • Page 180 /BIN 1 /P HI /BIN 2 /P LO /BIN 3 /SREJ /BIN 4 /BIN 5 /BIN 6 /BIN 7 /KEY LOCK /BIN 8 /BIN 9 EXT.DCV1 /OUT EXT.DCV1 /AUX /ALARM /EXT TRI G /I NDEX /EXT TRI G /EOM EXT.DCV2 COM2 EXT.DCV2 COM2...
  • Page 181 Delay 1 Measurement 2Comparison 3Display time time time time Time The maximum minimum T1: trigger pulse-width T2:delay time 200us Display time T3:the trigger waiting time after /EOM 200us output 1. For the measurement time, please refer to the operation manual; 2.
  • Page 182 SEQ sweep mode: /INDEX is defined as the effective signal when the last sweep point of the analog test is finished. /EOM is defined as the effective signal when all the test results are effective after every list sweep task is finished. STEP sweep mod: /INDEX is defined as the effective signal when the analog test of every sweep point is finished.
  • Page 183 /BIN1 /BIN2 /BIN3 /BIN4 /BIN5 /BIN6 /BIN7 /BIN8 /BIN9 /OUT the measurement data the high limit the good area the low limit the sweep point Figure 4 the signal area of the list sweep comparison...

  • Page 184: Electrical Feature

    Note: (1) The setting time includes the correction ON/OFF time. (2)The comparison and display time is 4.5ms approximately. T1,T2,T3, refer to Figure 3 Figure 5 the time counting 10.2.2 Electrical feature As it is shown above, the signal definition for the comparison and the list sweep comparison are different.

  • Page 185: Handler Interface Board Circuit

    The reference ground for the voltage signal current circuit HIGH Compared signal Internal pull-up voltage: /BIN1 - /BIN9 SM6030A GND ≤0.5V /AUX +5V--+24V /OUT EXTV1: /PHI COM1 /PLO Internal pull-up voltage : Control signal SM6030A GND /INDEX ≤0.5V...
  • Page 186 EXT.DCV1 PULL-UP RESISTOR /OUT /BIN1 /BIN8 /BIN9 /AUX /PHI /PLO /SREJ COM1 SM6030A Common Figure 6 the output circuit for the comparison result The output circuit for control signal is shown in the figure 7 below.
  • Page 187 EXT.DCV2 PULL-UP RESISTOR /ALARM /INDEX /EOM COM2 SM6030A Common Figure 7 the output circuit for control signal The input circuit for control signal is shown in the figure 8 below. Figure 8 the input circuit for control signal...

  • Page 188: Operation

    10.2.4 Operation Before you use the HANDLER function, you should ensure that your instrument has install the HANDLER interface board.The following procedure will show you how to use the interface comparison and the list sweep comparison. The procedure for comparison setting: (1) Press the softkey [LIMIT TABLE].

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