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MODEL 5000 SERIES TEST SYSTEMS
Manual
Scientific Test, Inc.
1110 E. Collins Blvd., #130
Richardson, Texas 75081
www.scitest.com
Email: info@scitest.com
Voice: 972●479●1300
FAX: 972●479●1301
Version 1.23
March 25, 2008
Copyright© 2005 Scientific Test, Inc. All rights reserved

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  • Page 1 MODEL 5000 SERIES TEST SYSTEMS Manual Scientific Test, Inc. 1110 E. Collins Blvd., #130 Richardson, Texas 75081 www.scitest.com Email: info@scitest.com Voice: 972●479●1300 FAX: 972●479●1301 Version 1.23 March 25, 2008 Copyright© 2005 Scientific Test, Inc. All rights reserved...
  • Page 3 LIMITED WARRANTY SCIENTIFIC TEST, INC. (STI) WILL REPAIR (OR AT ITS OPTION, REPLACE) THE SERIES 5000 TESTER (PRODUCT) FREE OF CHARGE FOR PARTS AND LABOR FOR A PERIOD ONE (1) YEAR FROM THE DATE OF PURCHASE IF STI FINDS IT TO BE DEFECTIVE IN MATERIAL OR WORKMANSHIP, PROVIDED THE PRODUCT IS RETURNED (SHIPPING PREPAID AND PROPERLY PACKED) TO STI.
  • Page 5 IEC 801-4 1988 EN 61010-1 Following provisions of the Electromagnetic Compatibility (89/336/EEC) Directive and Low Voltage (73/23/EEC) Directive. The Technical Construction File is maintained at Scientific Test, Inc. at the address listed above. The authorized representative located in the community is:...
  • Page 6 Safety Summary Please take a moment to review these safety precautions. They are provided for your protection and to prevent damage to the system. This safety information applies to all operators and service personnel. Symbols and Terms These symbols appear on the equipment: Protective ATTENTION DANGER...
  • Page 7 Service Safety Summary Only qualified personnel should perform service procedures. This safety information applies to all service personnel. Do Not Perform Service Alone Do not perform internal service or adjustments of this product unless another person capable of rendering first aid and resuscitation is present. Use Care When Servicing With Power On Dangerous voltages which may exceed 2KV exist at several points in this product.
  • Page 8 Specific Precautions Observe all the following precautions to ensure your personal safety and to prevent damage to either the system or equipment connected to it. Power Source The system is grounded through the power cord. To avoid electrical shock, plug the power cord into a properly wired receptacle with an earth ground connection.
  • Page 9 Power and Environmental Characteristics Power Requirements and Frequency 100 to 132 VAC , for 47 Hz through 63 Hz 200 to 240 VAC , for 47 Hz through 63 Hz Temperature 25ºC ± 5ºC Relative Humidity To 50% at or below 30ºC Ventilation Requirements Equipment should be located no closer than 4 cm from the wall in a well ventilated room.

  • Page 11: Table Of Contents

    Start / Stop Push-Button ....................1-6 1.3.8 Repetitive / Single Test Switch (LED) ................1-6 1.3.9 Numbered Lamps ......................1-6 1.3.10 Display and Keyboard ................... 1-7 1.3.11 Adaptor Control / Relay Control Connector ............1-7 Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 12: Table Of Contents

    Electronic Start-Test ...................... 2-4 2.2.3 Mechanical Start-Test ....................2-5 2.2.4 Handler Interface Timing ....................2-5 2.2.5 5000 Series Tester Handler Control Cable Wire List ............ 2-5 2.2.6 Handler Interface Schematic ..................2-6 2.2.7 Optional Prober Interface ....................2-6 Adaptor Control ..................2-6 CNTL-12 Auxiliary Board ................
  • Page 13 Copy to Clipboard ....................6-19 6.4.13 Clear Window ...................... 6-19 6.4.14 Clear Error ......................6-19 6.4.15 Auto Verify ......................6-19 Lot Summary Popup Menu ..............6-19 6.5.1 Lot Summary ........................ 6-19 6.5.2 Start..........................6-19 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 14 Bin 1 Only for Pass ...................... 6-31 6.7.2 Device Retest ......................6-31 6.7.3 Excel Spreadsheet ...................... 6-31 6.7.4 Real Time SPC ......................6-31 Communicating With STI 5000 Series Tester ......... 6-31 6.8.1 Serial Communications ....................6-31 6.8.2 Sending Information ....................6-31 6.8.3 Receiving Information ....................6-37 7 MAINTENANCE / TROUBLESHOOTING .....
  • Page 15 Calibration ........................8-4 Self-Test ....................8-4 8.4.1 Self-Test after unpacking ....................8-4 8.4.2 5000 Series Tester Self-Test ..................8-5 8.4.3 Lo Current Deck Self-Test ..................... 8-5 8.4.4 Low Current Deck Self-Test Error Codes Table ............8-7 9 HIGH CURRENT DECK ..........9-1 Installation ....................
  • Page 16 Appendix A Oscilloscope Guidelines ......13-3 Anode Monitor ....................13-3 to K Monitor ....................13-3 Monitor ......................13-3 Appendix B Regulator (ADP-320) ......... 13-5 Overview ......................13-5 Appendix C Opto Adaptor (ADP-310) ......13-9 Overview ......................13-9 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 17 Appendix H SSOVP Tests / Adaptors ......13-23 ADP-360 ......................13-23 13.1.5 SSOVP Tests ....................13-23 ......................... 13-23 13.1.6 CLAMP 13.1.7 ........................13-23 13.1.8 ........................13-24 13.1.9 ........................13-24 13.1.10 ........................13-26 13.1.11 ........................13-26 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 18 Appendix J Zener Impedance ........13-51 Zener Impedance Tests: ZZ , ZZ ..............13-51 Appendix K EXT-100 Interface Board ......13-53 Overview ......................13-53 Definitions ......................13-54 Appendix L Quadrac/Diac Adaptor (ADP-350) ..13-57 Version 1.23 viii MODEL 5000 SERIES MANUAL...
  • Page 19 Device Connector Pin Assignments ..............13-65 Test Operation ....................13-66 Test ......................13-66 COIL Test ....................... 13-66 OPER Test ......................13-66 Test ....................... 13-67 CONT Test ..................... 13-67 TIME Test....................13-67 TIME Notes ....................... 13-67 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 20 15.3 Self-Test Fixture ..................15-2 15.4 Front Panel Board ................... 15-3 15.5 High Source Board .................. 15-4 15.6 Low Source Board .................. 15-7 15.7 80 Volt Gate Modification ................ 15-9 15.8 Analog Board Assembly ................ 15-10 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 21 125 AMP PA#1 & PA#3 Board Assembly ............15-18 15.12.7 125 AMP PA#2 & PA#4 Board Assembly ............15-20 15.13 Prober / Handler Board Assembly ............. 15-20 15.14 Extended Range Board Assembly ............ 15-20 Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 22: List Of Figures

    Figure 7-10 Self-Test Block 9 ......................7-29 Figure 7-11 Self-Test Block 10 ......................7-30 Figure 7-12 Self-Test Block 11 ......................7-31 Figure 7-13 Self-Test Block 12 ......................7-32 Figure 7-14 Self-Test Block 13 ......................7-33 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 23 Figure 7-47 Self-Test Block 46 ......................7-66 Figure 7-48 Self-Test Block 47 ......................7-67 Figure 7-49 Self-Test Block 48 ......................7-68 Figure 7-50 Self-Test Block 49 ......................7-69 Figure 7-51 Self-Test Block 50 ......................7-70 Version 1.23 MODEL 5000 SERIES MANUAL xiii...
  • Page 24 Figure 7-84 Self-Test Block 83 ....................... 7-103 Figure 7-85 Self Test Block 84 ......................7-104 Figure 7-86 Self-Test Block 90 ....................... 7-105 Figure 7-87 Self-Test Block 91 ....................... 7-106 Figure 7-88 Self-Test Block 92 ....................... 7-107 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 25 Figure 13-18 VB Breakdown Test Circuit Diagram ................. 13-31 Figure 13-19 VB Breakdown Test Waveform .................. 13-31 Figure 13-20 Continuity Test Circuit Diagram ................. 13-32 Figure 13-21 Coil Resistance Test Circuit Diagram ................ 13-32 Figure 13-22 ADP-340-5G Interconnect ..................13-33 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 26 Figure 14-5 APP-002 Edit Screen ..................... 14-7 Figure 14-6 APP-002 Bin/Sort Screen ....................14-8 Figure 14-7 APP-004 Data Information Screen ................14-11 Figure 14-8 APP-005 Test Step Screen ..................14-13 Figure 14-9 APP-005 Bin Plan Screen ................... 14-14 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 27 Figure 14-11 APP-005 Datalog Screen for STI Bin Plan..............14-15 Figure 14-12 APP-005 Datalog Screen STI Sort Plan ..............14-15 Figure 14-13 Opto-Switch Test Program ..................14-17 Figure 14-14 Typical Opto-Switch ....................14-17 Version 1.23 MODEL 5000 SERIES MANUAL xvii...

  • Page 28: List Of Tables

    Table 4-3 Model 5300HX Test Specifications ..................4-6 Table 4-4 Model 5300HX Device Tests ....................4-7 Table 6-1 Communication Commands to 5000 Series Tester ............6-35 Table 7-1 External Relay Driver Board Jumper Settings ..............7-6 Table 7-2 Handler Board Jumper Settings ..................7-6 Table 7-3 DC Power Supplies ......................
  • Page 29 Table 15-21 HCD HC Relay Board Assembly (600-119 Rev B) ............ 15-18 Table 15-22 HCD PA#1 & PA#4 Board Assembly (700-001 Rev E) ..........15-19 Table 15-23 HCD PA#2 & PA#4 Board Assembly (700-001 Rev E) ..........15-20 Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 30 TABLE OF CONTENTS Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 31: Overview

    1 OVERVIEW 1.1 System Description This manual covers the 5000 Series Tester (Models 5000E and 5300HX). The 5000 Series Tester is an extension of the proven Model 5150, adding improved Analog Board and modern CPU. Upgrading becomes much easier since all systems now use the same hardware and software.

  • Page 32: 5300Hx Test System

    (1-8 or 1-16). Personality modules are available for various packages. 1.1.6 Mux Capabilities The Multiplex Option allows three or four stations to be connected to the 5000 Series Tester. This can be configured as any combination of Manual Stations or Handler/Probers.

  • Page 33: System Checkout

    Also a Multiplexer Option allows up to 4 test stations to be operated by 5000 Series Test System (each station can run a different test program). See Figure 1-1 for a system a 3-station Multiplexer, a Manual Station (MUX 1 DUT), a High Current Deck and/or Low Current Deck (MUX 2 DUT) and a handler (MUX 3 DUT).

  • Page 34: Software

    EOT (see Section 2.2 for handler interface details). 1.1.10.3 IEEE-488 The 5000 Series Tester can, optionally, be controlled via the IEEE-488 interface. The user, with this option, supplies the PC Interface and any software required to complete the connection.

  • Page 35: Front Panel Description

    The external load is attached between the appropriate pair of labeled jacks in the 5000 Series Tester front panel. The load is switched into the circuit only when required by a particular test; other tests that do not call for the load are not affected.

  • Page 36: Safety Interlock

    1.3.9 Numbered Lamps If your 5000 Series Tester has the 32 lamps on the front panel, they represent one of the first 32 available test steps in the test program. The lamp associated with the test step will be on while that test step is being executed. When running a complete test Version 1.23...

  • Page 37: Display And Keyboard

    1.3.10 Display and Keyboard If your 5000 Series Tester has a display and keyboard on the front panel, the 18 character display is used to display system menus, bin results, measured values and error messages.
  • Page 38 1 - OVERVIEW Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 39: Installation

    If damages or deficiencies exist, determine if they occurred during transit. If so, file a claim with the shipping agent. If the 5000 Series tester is to be returned for repair or service, contact the factory for authorization and shipping procedures. It is highly recommended to save and reuse your original shipping container.

  • Page 40: Line Noise

    Then apply power to tester by turning on power switch located at rear above fan. Connect the PC to the 5000 Series Tester via the 9-pin D-Sub cable and null modem supplied and run the System Self-Test from the 5000 Series Interface Software.

  • Page 41: Standard Interface Controls

    It is supplied by the 5000 Series Tester or the handler but never both, as explained in the following sections. This is extremely important as: Ground on the 5000 Series Tester should not be tied to any other equipment ground.

  • Page 42: Electronic Start-Test

    Note that EOT has a separate return which may need to be tied to handler common (dependent on handler). Make connection to handler from the 5000 Series Tester using standard 25-pin D type connector cable. Use TRW cinch type DBM-25P for solder connections, 3M P/N 3482-1000 for ribbon cable, or other equivalent.

  • Page 43: Mechanical Start-Test

    Be sure main power is off before removing board. Connect the switch contacts to pins 25 and 13 of the rear panel 25-pin D connector. Pin 13 returns to 5000 Series Tester system ground and should be tied to no other system ground.

  • Page 44: Handler Interface Schematic

    For isolation, connect prober +5V to pin 13 and 5V return to pin 12 of the 25-pin D- Sub connector labeled “HANDLER” at rear of the 5000 Series Tester. If pulse level is 5V, jumper the header labeled “+5” located to right of U2, otherwise connect pulse level voltage (1 to 30V) to pin 24 (Hi Level).

  • Page 45: Cntl-12 Auxiliary Board

    Relay 5 Relay 4 CT7 Relay 3 CT6 Relay 2 CT5 Relay 1 CT4 +12V +12V Relay 9 Relay 10 Relay 11 Relay 12 Relay 13 Relay 14 Relay 15 Relay 16 Table 2-3 CNTL-12 Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 46: Product Support

    Click the “Check Mainframe” button to obtain the STI 5000 Series Tester configuration data (Note: the PC being used must be connected to the 5000 Series Tester); double click inside the data box to print. If your 5000 Series Tester is an older model that does not support the Windows based software please provide the 5000 Series Tester mainframe serial number located on the rear panel.

  • Page 47: Theory

    3 THEORY 3.1 Overview The 5000 Series Tester is a test system of power sources exercised under computer control to test 2 and 3 lead semiconductor components. These sources, along with conditioning loads, are connected as required to obtain the exact conditions required for a particular test.

  • Page 48: Analog Board

    Board drives through the buffer directly to the Relay Board where anode/collector loads are applied if required. Drive is then applied to the device. For voltages greater than 50 volts, the high source is amplified through a transformer booster Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 49: Hi Source Board

    One or the other is put on the bus for return to the Analog I/O Board for result decision. The booster function is contained on the Relay Board for generating voltages above 50 volts. The sep-up transformer is off board and is driven via connector J3. Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 50: Power Supplies And Transformers

    Test times grow longer at low and high-end current ranges to allow longer soak and off times respectively RESULT RELAY SET-UP SOAK TIME R HI OFF TIME HI SOURCE LO SOURCE R LO TEST TIME Figure 3-2 Test Timing Diagram Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 51: Oscillation Suppression

    8mA. Precautions have been taken to minimize these effects in the 5000 Series Tester. In general, transistors with current gain tests made at 50mA or greater will not require stabilization components at the fixture.
  • Page 52 3 - THEORY Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 53: Specifications

    Power 17”(432)x20”(508)x10.5”(267) MODEL 5000 SERIES 55lbs(25) 120/240VAC(+5%, -15%) Tester Mainframe 50/60Hz, Fused 2A/1A 16.5”(419)x10.5”(267)x8”(203) MODEL LC-1000 11lbs(5) Powered from 5000 Series Lo Current Deck Tester 17”(432)x20”(508)x10.5”(267) MODEL HC-500 35lbs(15.9) Powered from 5000 Series Hi Current Deck Tester 17”(432)x20”(508)x10.5(267) MODEL 6010 40lbs(18.2)
  • Page 54 4 – SPECIFICATIONS SCIENTIFIC TEST INC. 5000E TEST SPECIFICATIONS TEST SPECIFICATION PARAMETER V RANGE I RANGE ACCURACY RES. .10V to 999V (2000V) 1NA to 50MA 0.1NA 1% + 0.5NA + 20PA/V CEO/R/S/X DSS/X DOFF LEAKAGE .10V to 20V (80V) 1NA to 3A 0.1NA...

  • Page 55: Model 5000E Device Tests

    +, V +, I +, V +, I IGBT GESF GETH CESAT GESR GEON STS, SBS ADP-350 +, I +, V +, V +, S RELAY ADP-390 Contact / Coil Operate / Resistance Release Voltage Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 56: Model 5300Hx Test Specifications

    4 – SPECIFICATIONS 4.4 Model 5300HX Test Specifications Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 57 4 – SPECIFICATIONS SCIENTIFIC TEST INC. 5300HX TEST SPECIFICATIONS TEST SPECIFICATION PARAMETER V RANGE I RANGE ACCURACY RES. .10V to 999V (2000V) 1.0NA (20PA) to 50MA 0.1NA(1PA) 1% + 0.5NA + 20PA/V CEO/R/S/X (1% + 200PA + 2PA/V) DSS/X DOFF LEAKAGE .10V to 20V (80V)

  • Page 58: Table 4-3 Model 5300Hx Test Specifications

    4 – SPECIFICATIONS SCIENTIFIC TEST INC. 5300HX TEST SPECIFICATIONS GATED DEVICES TEST SPECIFICATION PARAMETER V RANGE I RANGE ACCURACY RES. .10V to 600V 1.0NA (20PA) to 200MA 0.1NA(1PA) 1% + 0.5NA + 20PA/V LEAKAGE (1% + 200PA + 2PA/V) .10V to 5.00V 10µA to 49.9A...

  • Page 59: Model 5300Hx Device Tests

    CESAT GESR GEON STS, SBS ADP-350 +, I +, V +, V +, S RELAY ADP-390 Contact / Coil Operate / Resistance Release Voltage GATED ADP-340-5G I DEVICE Table 4-4 Model 5300HX Device Tests Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 60: Maximum Power Curves

    80V Gate Option VOLTS FOR SSOVP OPTION CURRENT IS 900mA / 1.5A NOTE 1: SEE TABLE 4-2 NOTE 2: 2KV OPTION NOTE 3: 40A GATE OPTION Figure 4-1 Power Curve for Leakage and Breakdown Tests Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 61: Figure 4-2 On-State And Gain Tests

    HC-500 (HC-1000) 500 (1000 250A (500A 250 (500 AMPS 50A (100A VOLTS GAIN = FULL CURVE MAX ON-STATE VOLTS = 10V NOTE 1: SEE TABLE 4-2 NOTE 2: HC-1000 OPTION Figure 4-3 High Current Options Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 62 4 – SPECIFICATIONS Version 1.23 4-10 MODEL 5000 SERIES MANUAL...

  • Page 63: Basic Operation

    STI 5000 Series Interface can found in Section 6. 5.1 Power-up The STI 5000 Series Interface software will auto run when the CD is first installed in the CD drive. Included on the CD are some sample test programs and this manual in Acrobat PDF format (if you do not have Adobe Acrobat Reader installed on the computer, it may be installed from the file included on the CD).
  • Page 64 5 – BASIC OPERATION Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 65: Pc Software

    Select the Systems – Communications menu and change, if required, the selected serial port used to connect the PC to the STI 5000 Series Tester. The message at the bottom left of the STI window should say “Com Port open”. If the message “error opening port”...

  • Page 66: The Pcw Main Menu

    Test Program and launch the STI PCW program and automatically download the selected STI Test Program to the STI Series 5000 Tester. Turn on the STI 5000 Series Tester and, if possible, allow it to warm up (approx. 15 minutes).
  • Page 67 Calibrate System See STI 5000 Series Tester Manual. Enter the voltage to be set. Calibrate ADC See STI 5000 Series Tester Manual. Enter the voltage to be set and read back the ADC reading. Calibrate RMS See STI 5000 Series Tester Manual. Enter the voltage to be set and read back the RMS reading.
  • Page 68 Auto Verify (Manual) Requires the STI AC-500 Auto Verification Option (contact factory). The STI 5000 Series Tester Auto Verify steps can be run individually. To run all Auto Verify steps and create a report, use the Exact Value window. 6.3.1.4 Tester Control...
  • Page 69 The width of the panels may be changed by placing the mouse on the panel divider, holding the left mouse button and moving the divider to the desired location. If Lot Summary is enabled current data is retrieved from the STI 5000 Series Tester for display and then updated after each test sequence.
  • Page 70 Microsoft‟s EXCEL .  “.COL” STI data file in columnar format. The STI comma delimited file uses scientific notation and the STI Statistics file and the STI Columnar file use engineering notation for all values where:  M ...
  • Page 71 Create STI Translated Files menu selection. 6.3.1.7.6 Wafer Mapping Option The Wafer Mapping Option requires STI 5000 Series Tester firmware with the Wafer Mapping Option Enabled. In addition, the prober being used must provide Wafer row and column information for each die. This row and column data along with the Bin and Sort results is encoded in the datalog data file.

  • Page 72: Figure 6-1 Wafer Map Initial Screen

     In every case, the color black does not represent a failed die, but rather a die that does fall within the wafer map configuration settings. Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 73: Figure 6-2 Example Wafer Map (Test Parameter)

    Figure 6-2 Example Wafer Map (Test Parameter) 6.3.1.7.7 Curve Trace Option The Curve Trace Option requires STI 5000 Series Tester firmware with the Curve Trace Option Enabled. Creating a curve trace requires, first, generating or loading a test program that contains a test step with the test to be used in the curve trace.

  • Page 74: Figure 6-3 Curve Trace Setup Window (Mosfet Is Test)

    Figure 6-3 Curve Trace Setup Window (MOSFET IS Test) Figure 6-4 Curve Trace Setup Window (MOSFET RDSON Test) Note: for the R test the I current must be set in the test program. DS(ON) Version 1.23 6-10 MODEL 5000 SERIES MANUAL...

  • Page 75: Figure 6-6 Igbt Icon Vs Vce Curve Trace

    Once all of entries have made, click the “Start Curve Trace” button. The software sends the test program to the STI 5000 Series Tester followed by the Curve Trace data entered (this takes approximately 15 seconds). The actual curve trace test steps begin at this point and a graphical representation of the curve is plotted on the screen (see Figure 6-6).

  • Page 76: Test Programs

    With the PC connected to the STI 5000 Series tester, click the “Check Mainframe” button. The PCW Software will interrogate the STI 5000 Series Tester and fill in the information shown box below the button. Also a message box will appear if any of the configuration settings are different from those set.

  • Page 77: Figure 6-8 Mainframe Configuration Screen

    5000 Series Tester. 6.3.2.1.7 Mainframe Configuration Select the Mainframe Configuration Button to retrieve Firmware, Switch Settings and Auto-Calibrate data from the STI 5000 Series Tester. Double click on any item shown to obtain a hard copy of the data. Version 1.23...
  • Page 78 Type the desired name or select the test program from the file list. If the file selected is an old style STI Test Program (“.T53” extension), the test program will automatically be converted to the new style. Version 1.23 6-14 MODEL 5000 SERIES MANUAL...

  • Page 79: System

    Provides for installing updated firmware into the STI 5000 Series Tester. This is used only for STI 5000 Series Testers with the A486 CPU. Insert the disk with the STI 5000 Series firmware into the floppy drive and then follow the instructions provided on screen to complete the download.

  • Page 80: Window

    NOTE: if the display on the STI 5000 Series Tester shows “STI Download …” when the tester is turned on, use this selection to reload the operating firmware into the tester or see Section 7.1.4.

  • Page 81: Exact Value Popup Menu

    Note: selecting “Every Nth”, “Every Nth Sort 1”, “If Sort” or “If Not Sort” opens a box for entering the count or Sort Number and a check box to select if Sort Result is to be Version 1.23 MODEL 5000 SERIES MANUAL 6-17...

  • Page 82: Start

    PC and stored in the datalog file; and if not checked, then only the full datalogged data will be sent to the PC. Note: any changes to the datalog mode made from the STI 5000 Series Tester front panel will not be reflected in the checked datalog mode.

  • Page 83: Retest

    “ok”, the data for that device is not sent to the datalog file and the serial number of the device is sent to the STI 5000 Series Tester. The next start will use the serial number of the device selected for retest. Note: this should only be used when manually testing devices.

  • Page 84: Include Fail Counts

    6.6 STI Test Program (Tabbed) Several “speed buttons” are provided for commonly used functions. They are:  Send Button -- Sends the test program (in memory) to the STI 5000 Series Tester (NOTE: after the test program is successfully sent, the Exact Value window will be opened or brought to the front, if already open).

  • Page 85: Figure 6-9 Test Program Test Step Tab

    Figure 6-9 Test Program Test Step Tab 6.6.1.1 Device Test Step Figure 6-10 Test Program Device Test Edit Window Version 1.23 MODEL 5000 SERIES MANUAL 6-21...

  • Page 86: Figure 6-11 Test Program Calculation Step Edit Window

     Example: Calculation test step is step 6:  (s3 – s5) * 2.3 is a valid expression,  (s3 – s8) / 1.5 is an invalid test step because test step 8 is subsequent to step 6 Version 1.23 6-22 MODEL 5000 SERIES MANUAL...
  • Page 87 The expression is checked for syntactical errors and if an error is found, a message box is displayed explaining the error and the cursor is placed at the most likely position of the error. Version 1.23 MODEL 5000 SERIES MANUAL 6-23...
  • Page 88 (SCPI Command “FETCh?”) from the external tester that is then used to determine the pass / fail result. Also provides for the selection of RS232 (STI Series 5000 Tester COM Port 2) or IEEE488 as the communications mode between the STI 5000 Series Tester and the external tester. 6.6.1.4...

  • Page 89: Options Tab

    Fail Bin may be checked. The default A/K Short Bin is Bin 8. 6.6.2.3 Low Current Deck Answer Mode Selects the desired answer mode to be used when the Low Current Deck Option is required. Version 1.23 MODEL 5000 SERIES MANUAL 6-25...
  • Page 90 Select this option if the Low Current Deck Option or Kelvin Contact Cables are part of STI 5000 Series Tester and Kelvin Check is desired. If selected, the kelvin test is run at the start of each test sequence and if failed, the test sequence is aborted, the selected Kelvin Bin is asserted at the handler and the message “KELVIN”...

  • Page 91: Bin / Sort Plan Tab

    Else, If Sort 8 qualifies, report Sort 8, Bin 6 Else, no programmed sort qualifies, report Sort Fail NOTE: the actual tests run are dependent on the bin mode selected and the specific test results. Version 1.23 MODEL 5000 SERIES MANUAL 6-27...

  • Page 92: Sorting And Binning Modes

    6 – PC SOFTWARE 6.6.3.2 Sorting and Binning Modes The 5000 Series Tester supports two different sorting/binning modes. The STI Bin Mode executes all of the programmed test steps in the order they were programmed and then determines the qualifying sort, if any. See Section 6.6.3.3 for detailed description.
  • Page 93 Double click to enter or edit a sort name. The name may be any combination of alphanumeric characters up to ten characters long. If used, this label is displayed at the front panel of STI 5000 Series and used in the datalog results. 6.6.3.6 Double click to enter or change the sort logical bin assignment.

  • Page 94: Relay Plan Tab

    The first four relays are controlled at the front panel of STI 5000 Series Tester as well as in the CNTL-100 option. Some device families (e.g.: 5 Pin Module) set the relay plan automatically when a test is created or edited.

  • Page 95: Special Software Options

    This option provides, in the Exact Value window, the ability to retest any device before the datalog data for that device is saved to the STI Datalog file. If the device is to be tested again, the serial number of that device is sent to the STI 5000 Series Tester. 6.7.3 Excel Spreadsheet This option provides, in the Exact Value window, the ability to send datalog data directly to an Excel spreadsheet.
  • Page 96 „R‟ NULL NULL NULL System Configuration (see Notes) NULL NULL GO-NOGO Sets Go-No-Go Mode NULL NULL DATALOG Sets Datalog Mode NULL NULL SINGLE TEST<test> Test only the specified Version 1.23 6-32 MODEL 5000 SERIES MANUAL...
  • Page 97 „2‟=57.6K, „3‟=115K) NULL NULL Reserved NULL NULL Save Sort Counters NULL NULL Restore Sort Counters NULL NULL Toggle Serial communications NULL NULL Read current settings (see Notes) <sta> CLEAR BINS Clear sort counts of Version 1.23 MODEL 5000 SERIES MANUAL 6-33...
  • Page 98 <sta> SINGLE TEST<test> Test only the specified test for the specified station. <sta> MEASURE<test> Measure only the specified test for the specified station. <sta> MUXSTART Issue a start test for the specified station. Version 1.23 6-34 MODEL 5000 SERIES MANUAL...

  • Page 99: Table 6-1 Communication Commands To 5000 Series Tester

    = ( *crc ^ ch ) & 0x000000ffL; *crc = (( *crc >> 8 ) & 0x00ffffffL ) ^ crc32_table[k];  System configuration data, from the STI 5000 Series Tester, is as follows: 0x04 „1‟ or „2‟ for 5300HX or 5000E „1‟, „2‟...
  • Page 100 48 characters for Autocalibration factors (12 factors) „0‟ or „1‟ for Auxiliary Low Source Option „0‟ or „1‟ for 500A or 1000A High Deck Reserved 0x03  System settings data, from the STI 5000 Series Tester, is as follows: 0x07 Customer Specific Customer Specific Customer Specific Bin Alarm Flag Baud Rate („0‟=9.6K, „1‟=38.4K, „2‟=57.6K, „3‟=115.2K)

  • Page 101: Receiving Information

     All other data is assumed to be datalog data 6.8.3 Receiving Information All information sent by the STI 5000 Series Tester is in ASCII format. Some of the information in the serial data stream is preceded by an ASCII control character.
  • Page 102 6 – PC SOFTWARE Version 1.23 6-38 MODEL 5000 SERIES MANUAL...

  • Page 103: Maintenance / Troubleshooting

     Install the new flash memory chips as shown in Figure 7-1 (NOTE: the order of these chips must be as shown or the system will not operate).  Re-install the STI PC104 card.  Re-install any cables removed.  Re-install the system back panel. Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 104: Self-Test

    7.2.2 Auto Calibration The Auto Calibrate routine measures and stores offsets in the 5000 Series Tester and eliminates the need for manual calibration unless one or more of power source boards or relay board becomes damaged or any of the Auto Calibrate factors becomes larger than an absolute value of 350.

  • Page 105: Led Check (If Applicable)

    AC power connected and should only be operated by qualified personnel. Access to the interior of the 5000 Series Tester is by removal of the top cover. The top cover is held in place by two screws on each side just above the handles.
  • Page 106 Individual PC boards may be extended above the card cage for troubleshooting. Included with the 5000 Series Tester is an extender board and extension cables. With AC power off, remove the suspect board, plug the extender board into the same slot, plug the suspect board into the extender board and reconnect all cables via the extension cables.

  • Page 107: Replacing Components

    If the error code calls for a fuse, replace with only the type specified. AC Line: The two fuses protecting the incoming AC line are mounted in the AC power receptacle mounted on the back panel. They are type AGC slow-blow rated as follows: Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 108: External Relay Driver/Handler Board Jumper Settings

    Std. Handler, MUX Station 1, Prober II MUX Station 2 MUX Station 3 MUX Station 4 Relay Driver Bd. 2 (NT Ext. Rly. Drvr.) Relay Driver Bd. 1 (NT Holdover) Table 7-2 Handler Board Jumper Settings Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 109: Interchanging Individual Boards

    Tester POWER SWITCH should always be OFF before attaching or disconnecting cables and inserting or removing any board. When using the Extender Board, be certain to use extension cables to make these connections and that they are connected properly (Pin 1 to Pin 1). Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 110: Trim Pot Adjustments / Board Calibration (5000E / 5300Hx)

    A to A . If a Scientific Test fixture is used, these connections are made. If a load is required for the calibration step, connect the load to the fixture (be sure the correct fixture is used, that is A-K or G-K). It is not recommended that these calibration steps be made without using the proper fixture.

  • Page 111: Table 7-4 Calibration/Trim Pot Adjustments (Models 5000E And 5300Hx)

    @ ICE < 10nA, VCE = 100V in the single test measure mode and re-adjust R143 until both the NPN and PNP readings are balanced around 10nA; then run Auto-Calibrate and save the factors (Note: does not apply of Low Current Deck used). Table 7-4 Calibration/Trim Pot Adjustments (Models 5000E and 5300HX) Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 112: Μsec V L Calibration

    These steps require entering or loading the CALCHECK.T60 test program. This test program may be found on the CD supplied with the system.  Load CALCHECK.T60 test program from the STI 5000 SERIES INTERFACE (See Chapter 6 for more information).

  • Page 113: Auxiliary Low Source Calibration

    Current Deck leakage adjustment (LCD “G-K” PCB revision D or later only). 7.5 System Verification The 5000 Series Tester may be manually verified by using the following procedures. The test programs required are included on the System CD shipped with the system.

  • Page 114: High Source Board Verification

    100KΩ, 10KΩ, 1KΩ, : 0.1%, ¼ W 1.0Ω : 0.25% (Riedon Type 101 or equivalent) 0.1Ω : 0.25%, 5W Note: Test Programs are available by resistor value HI-SRC-RG-500M.T60 HI-SRC-RG-1K.T60 HI-SRC-RG-100K.T60 HI-SRC-RG-1OHM.T60 HI-SRC-RG-10K.T60 HI-SRC-RG-TENTH_OHM.T60 Table 7-8 High Source Board Verification Version 1.23 7-12 MODEL 5000 SERIES MANUAL...

  • Page 115: Low Source Board Verification

    1.0Ω : 0.25% (Riedon Type 101 or equivalent) Note: Test Programs are available by resistor value LO-SRC RG 100MEG.T60 LO-SRC RG 100 OHM.T60 LO-SRC RG 1MEG.T60 LO-SRC RG 1 OHM.T60 LO-SRC RG 10K OHM.t60 Table 7-9 Low Source Verification Version 1.23 MODEL 5000 SERIES MANUAL 7-13...

  • Page 116: Self Test Error Code Reference Table

    RB: K19, K20, K21 Self-Test Block 15 RB: K4, K20, K31, K32 Self-Test Block 16 RB: K20 RB: K13, K26, K36, U11 Self-Test Block 17 RB: K22 Table 7-10 Self-Test Error Codes (01-33) Version 1.23 7-14 MODEL 5000 SERIES MANUAL...

  • Page 117: Table 7-11 Self-Test Error Codes (34- 6A)

    Self-Test Block 30 HS: K2, K3, R19 See Block Self-Test Block 23 HS: K14, R21 Self-Test Block 24 HS: K12 Self-Test Block 79 HS: K14, R23 Table 7-11 Self-Test Error Codes (34- 6A) Version 1.23 MODEL 5000 SERIES MANUAL 7-15...

  • Page 118: Table 7-12 Self-Test Error Codes (70 - B1)

    Self-Test Block 44 RB: R16, R21, C41 LS: U29 LS: U1 Self-Test Block 45 RB: S1, K28 Self-Test Block 46 RB: K29 Self-Test Block 47 Table 7-12 Self-Test Error Codes (70 - B1) Version 1.23 7-16 MODEL 5000 SERIES MANUAL...

  • Page 119: Table 7-13 Self-Test Error Codes (B2-E3)

    LS: K6, K7, R22 LS: R20 Self-Test Block 61 LS: K4, K5 LS: R20 Self-Test Block 78 LS: K2, K3 Self-Test Block 62 LS: F2, F4 Self-Test Block 63 Table 7-13 Self-Test Error Codes (B2-E3) Version 1.23 MODEL 5000 SERIES MANUAL 7-17...

  • Page 120: Table 7-14 Self-Test Error Codes (E4-10E)

    HS: C5 RB: K33 NB: K2 HS: K2 NB: C68, K15, U2 Self-Test Block 91 NB: K2 HS: C68, U2, U3 NB: C104, K2 NB: C104 HS: K17 Table 7-14 Self-Test Error Codes (E4-10E) Version 1.23 7-18 MODEL 5000 SERIES MANUAL...

  • Page 121: Table 7-15 Self-Test Error Codes (110-123)

    > 42.6V VCEO If the 5000 Series tester appears to lock-up, turn the power off and then back on and run Self-Test Block 92. Again, if the tester appears to lock-up, check the zero-cross circuit on the Control Board.

  • Page 122: Error Code Block Diagrams

    The following block diagrams provide simplified circuits of the portion of the tester being checked, waveforms and fault conditions to help troubleshoot error codes that occur during self-test. The limits shown are for the standard 5000 Series tester (1KV, 50V Anode, 20V Gate). All relays are shown as positioned to pass.
  • Page 123 This test uses the positive rail of the Hi Src to confirm correct Hi Src pre-regulation voltage. A positive 80 volt pulse is programmed which results in the output voltage going to the rail. Items in parentheses are for 100V Hi Src Option. Figure 7-2 Self-Test Block 1 Version 1.23 MODEL 5000 SERIES MANUAL 7-21...
  • Page 124 U5, U15 This test uses the negative rail of the Hi Src to confirm correct Hi Src pre-regulation voltage. Items in parentheses are for 100V Hi Src Option. Figure 7-3 Self-Test Block 2 Version 1.23 7-22 MODEL 5000 SERIES MANUAL...
  • Page 125 K18, K27 Open > 52V K1 Open K106 Stuck < 48V Trace Voltage Path A positive 50V is programmed at the Anode terminal. Confirms Gain of 10 operation. Figure 7-4 Self-Test Block 3 Version 1.23 MODEL 5000 SERIES MANUAL 7-23...
  • Page 126 HI SRC K3, K5, K6, K7, K17 Shorted > 1.4V High Resistance Leakage K4 Stuck This test applies +50V ahead of load relays. Confirms load relays are open. Figure 7-5 Self-Test Block 4 Version 1.23 7-24 MODEL 5000 SERIES MANUAL...
  • Page 127 R Ext is not in. Shutdown U27, output low A +30V pulse is applied ahead of the Lo Source load relays. Confirms that these relays are open Figure 7-6 Self-Test Block 5 Version 1.23 MODEL 5000 SERIES MANUAL 7-25...
  • Page 128 K27 Stuck > 70V U5 not Operated K2 Open, K16 Stuck < 60V F1 Open, K101 Open A positive 65V is programmed. Checks functionality of booster and associated relays. Figure 7-7 Self-Test Block 6 Version 1.23 7-26 MODEL 5000 SERIES MANUAL...
  • Page 129 R15 Low < 340V K18 Shorted (680V) A positive 350V is programmed. Checks Gain of 100 and monitor divide by 200. Items in parentheses are for 2KV Option. Figure 7-8 Self-Test Block 7 Version 1.23 MODEL 5000 SERIES MANUAL 7-27...
  • Page 130 < 850V Breakdown, Leakage, Q1, K10 Open (1700V) A positive 900V pulse is programmed. Checks circuitry and relays for breakdown and leakage. Items in parentheses are for 2KV Option. Figure 7-9 Self-Test Block 8 Version 1.23 7-28 MODEL 5000 SERIES MANUAL...
  • Page 131 HI SRC Trace voltage path, > 53V Re-check Block 3 (EC 07) < 45V K17 Open, K2 shorted to NO A positive 50V is programmed. Checks K17 operation. Figure 7-10 Self-Test Block 9 Version 1.23 MODEL 5000 SERIES MANUAL 7-29...
  • Page 132 = 50V 10mA RANGE ERROR FAULT RELAY BOARD HI SRC > 52V Re-check Block 3 (EC 07) < 45V K5 Open A positive 50V is programmed. Checks K5 operation. Figure 7-11 Self-Test Block 10 Version 1.23 7-30 MODEL 5000 SERIES MANUAL...
  • Page 133 = 50V 10mA RANGE ERROR FAULT RELAY BOARD HI SRC > 52V Re-check Block 3 (EC 07) < 45V K6 Open A positive 50V is programmed. Checks K6 operation. Figure 7-12 Self-Test Block 11 Version 1.23 MODEL 5000 SERIES MANUAL 7-31...
  • Page 134 = 50V 10mA RANGE ERROR FAULT RELAY BOARD HI SRC > 52V Re-check Block 3 (EC 07) < 45V K7 Open A positive 50V is programmed. Checks K7 operation. Figure 7-13 Self-Test Block 12 Version 1.23 7-32 MODEL 5000 SERIES MANUAL...
  • Page 135 A positive 50V is programmed. Checks K3 and K26 operation. EC 27 will occur if Self Test Fixture is not installed (this the first block that requires the Self Test Fixture). * Self-Test Fixture Figure 7-14 Self-Test Block 13 Version 1.23 MODEL 5000 SERIES MANUAL 7-33...
  • Page 136 A positive 5V is programmed. R7 and ANET External (R1 of Self-Test Fixture) create a divide by 2 network. Checks operation of ANET and divide by 1 relays, and that K4 and K35 are open. * Self-Test Fixture Figure 7-15 Self-Test Block 14 Version 1.23 7-34 MODEL 5000 SERIES MANUAL...
  • Page 137 A positive 5V is programmed. Checks operation of K4. Also checks for incorrect closure of divider relays in return side of monitor networks (K31 and K32). * Self-Test Fixture Figure 7-16 Self-Test Block 15 Version 1.23 MODEL 5000 SERIES MANUAL 7-35...
  • Page 138 RANGE ERROR FAULT RELAY BOARD HI SRC < 4.8V K20 Shorted A positive 5V is programmed across A to G terminals unless K20 is shorted. * Self-Test Fixture Figure 7-17 Self-Test Block 16 Version 1.23 7-36 MODEL 5000 SERIES MANUAL...
  • Page 139 K26, K36 Stuck Operated > 3.0V K22 Open A positive 5V is programmed to the Anode. The Gate is tied to the Anode. Checks relays shown. * Self-Test Fixture Figure 7-18 Self-Test Block 17 Version 1.23 MODEL 5000 SERIES MANUAL 7-37...
  • Page 140 K11, K12, K22 Shorted < 4.5V A positive 50V is programmed across the Anode (the Gate is tied to the Anode). Confirms K11, K12 and K22 are open. * Self-Test Fixture Figure 7-19 Self-Test Block 18 Version 1.23 7-38 MODEL 5000 SERIES MANUAL...
  • Page 141 K13, K36 Open > 0.3V K4, K20 High Resistance A positive 5V is programmed across the Anode (the Gate, Cathode and Anode are tied together). Confirms operation of identified relays. Figure 7-20 Self-Test Block 19 Version 1.23 MODEL 5000 SERIES MANUAL 7-39...
  • Page 142 Re-check Blocks 17 and 18. < 4.45V Trace path using Block 20 repetitively A positive 5V is programmed across the Anode. Divider is formed by operation of K11. * Self-Test Fixture Figure 7-21 Self-Test Block 20 Version 1.23 7-40 MODEL 5000 SERIES MANUAL...
  • Page 143 Clean board < 1.5V K21 Shorted A positive 7V is programmed across high value external loads. Checks for board leakage and confirms operation of identified relays. * Self-Test Fixture Figure 7-22 Self-Test Block 21 Version 1.23 MODEL 5000 SERIES MANUAL 7-41...
  • Page 144 10μA range. <3.0μA automatically sequences to block 23 and continues through block 30 to check ** I for shorted range relays when running System Test. * Self-Test Fixture Figure 7-23 Self-Test Block 22 Version 1.23 7-42 MODEL 5000 SERIES MANUAL...
  • Page 145 K14 Shorted, R21 Low failing Block 22 Calibrate A positive 5V is programmed across the 10MΩ resistor and to produce 0.5μA. Confirms the 1μA range. * Self-Test Fixture Figure 7-24 Self-Test Block 23 Version 1.23 MODEL 5000 SERIES MANUAL 7-43...
  • Page 146 Passes after K12 Shorted failing block 23. Shutdown K12 Open A positive 75V is programmed across the 1.5MΩ resistor to produce 50μA. Confirms 100μA range. * Self-Test Fixture Figure 7-25 Self-Test Block 24 Version 1.23 7-44 MODEL 5000 SERIES MANUAL...
  • Page 147 Passes after K11 Shorted failing Block 24. K11 Open, U29, Check Shutdown Daughter Board A positive 0.5V is programmed across the 1KΩ to produce 0.5mA. Confirms 1mA range. Figure 7-26 Self-Test Block 25 Version 1.23 MODEL 5000 SERIES MANUAL 7-45...
  • Page 148 < 4.4mA R26 Low Passes after K10 Shorted failing Block 25. Shutdown K10 Open A positive 5V is programmed across the 1KΩ resistor to produce 5mA. Confirms 10mA range. Figure 7-27 Self-Test Block 26 Version 1.23 7-46 MODEL 5000 SERIES MANUAL...
  • Page 149 K8, K9 Shorted failing Block 26 Incorrect shutdown, trace Shutdown path. A positive 15V is programmed across the 300Ω resistor to produce 50mA. Confirms 100mA range. * Self-Test Fixture Figure 7-28 Self-Test Block 27 Version 1.23 MODEL 5000 SERIES MANUAL 7-47...
  • Page 150 K6, K7 Shorted failing Block 27 Incorrect shutdown, trace Shutdown path. A positive 25V is programmed across the 100Ω resistor to produce 0.25A. Confirms 1A range. * Self-Test Fixture Figure 7-29 Self-Test Block 28 Version 1.23 7-48 MODEL 5000 SERIES MANUAL...
  • Page 151 Passes after K4, K5 Shorted failing Block 28 Incorrect shutdown, trace Shutdown path. A positive 27.9V is programmed across the 10.7Ω resistor to produce 2.6A. Confirms 10A range. Figure 7-30 Self-Test Block 29 Version 1.23 MODEL 5000 SERIES MANUAL 7-49...
  • Page 152 K2, K3 Shorted failing Block 29 Incorrect shutdown, trace Shutdown path. U16, U29, U5 A positive 27.9V is programmed across the 10.7Ω resistor to produce 2.6A. Confirms 50A range. Figure 7-31 Self-Test Block 30 Version 1.23 7-50 MODEL 5000 SERIES MANUAL...
  • Page 153 Incorrect shutdown, trace Shutdown path. A positive 30V is programmed across the 200Ω resistor, current limit should occur at 75mA, reducing the voltage to 15V. * Self-Test Fixture Figure 7-32 Self-Test Block 31 Version 1.23 MODEL 5000 SERIES MANUAL 7-51...
  • Page 154 Incorrect shutdown, trace Shutdown path. A positive 3V is programmed across the 200Ω resistor, current limit should occur at 12.5mA, reducing the voltage to 2.5V. * Self-Test Fixture Figure 7-33 Self-Test Block 32 Version 1.23 7-52 MODEL 5000 SERIES MANUAL...
  • Page 155 < 48V Trace Path A negative 50V is programmed across the Anode. Confirms negative voltage operation at a gain of 10. Block 33 is the reverse of Block 3. Figure 7-34 Self-Test Block 33 Version 1.23 MODEL 5000 SERIES MANUAL 7-53...
  • Page 156 Trace Path A negative 75V is programmed across the 1.5MΩ at the Anode. Confirms negative voltage operation. Block 34 is the reverse of Block 24. * Self-Test Fixture Figure 7-35 Self-Test Block 34 Version 1.23 7-54 MODEL 5000 SERIES MANUAL...
  • Page 157 U3, U28, Trace Path, CR11 Failed A positive 5V is programmed with loads open. The load relay K17 is closed through a short circuit producing a shutdown. Confirms positive shutdown operation. Figure 7-36 Self-Test Block 35 Version 1.23 MODEL 5000 SERIES MANUAL 7-55...
  • Page 158 U2, U28, Trace Path, CR10 Shutdown Failed A negative 5V is programmed with loads open. The load relay K17 is closed through a short circuit producing a shutdown. Confirms negative shutdown operation. Figure 7-37 Self-Test Block 36 Version 1.23 7-56 MODEL 5000 SERIES MANUAL...
  • Page 159 If not functional, the total voltage across A to K will be in error, producing an error in the monitored current. * Self-Test Fixture Figure 7-38 Self-Test Block 37 Version 1.23 MODEL 5000 SERIES MANUAL 7-57...
  • Page 160 K terminal not S1, S2, U29, U30 functional Checks offset voltage in the negative polarity. Block 38 is the reverse of Block 7. Items in parentheses are for 2KV Option. Figure 7-39 Self-Test Block 38 Version 1.23 7-58 MODEL 5000 SERIES MANUAL...
  • Page 161 > 85mA Clamp Network U9, Q25 Clamp High < 65mA Trace Path Confirms negative clamp on the 100mA range. This is the reverse of Block 31. * Self-Test Fixture Figure 7-40 Self-Test Block 39 Version 1.23 MODEL 5000 SERIES MANUAL 7-59...
  • Page 162 Shutdown path) IHI < 9mA U29 (trace path) Clamp low Confirms negative clamp on the 10mA range. This block is the reverse of Block 32. * Self-Test Fixture Figure 7-41 Self-Test Block 40 Version 1.23 7-60 MODEL 5000 SERIES MANUAL...
  • Page 163 = 2.5mA ERROR FAULT RELAY BOARD HI SRC < 2mA K11, K12, K13, K20 = 10KΩ. Confirms operation of Relay Board A positive 25V is programmed across R K12. Figure 7-42 Self-Test Block 41 Version 1.23 MODEL 5000 SERIES MANUAL 7-61...
  • Page 164 U29, U1, U4 A positive 50V is programmed which drives the Lo Src to +28V. Confirms Lo Src positive power supply. Items in parentheses are for 80V Gate Option. Figure 7-43 Self-Test Block 42 Version 1.23 7-62 MODEL 5000 SERIES MANUAL...
  • Page 165 CR11, U2 A negative 50V is programmed which drives the Lo Src to –28V. Confirms Lo Src negative power supply. This block is the reverse of Block 42. Figure 7-44 Self-Test Block 43 Version 1.23 MODEL 5000 SERIES MANUAL 7-63...
  • Page 166 K28, K37 Open > 25V *K1, *K17, K16 Open R21 High, R16 Low < 18V C41 (leaking) A positive 20V is programmed. Confirms positive gain of 10 operation. *5300HS only Figure 7-45 Self-Test Block 44 Version 1.23 7-64 MODEL 5000 SERIES MANUAL...
  • Page 167 IN BUS ÷2 DIFF J1-31 INBUS V ÷ 20 -1.0V ERROR FAULT RELAY BOARD LO SRC > 22V < 18V Block 45 is the reverse of Block 44. Figure 7-46 Self-Test Block 45 Version 1.23 MODEL 5000 SERIES MANUAL 7-65...
  • Page 168 ÷ 2 2.5V ERROR FAULT RELAY BOARD LO SRC > 5.3V S1, K28 Open < 4.5V K29 Stuck A positive 5V is programmed. Confirms positive gain of 1 operation. Figure 7-47 Self-Test Block 46 Version 1.23 7-66 MODEL 5000 SERIES MANUAL...
  • Page 169 IN BUS ÷2 DIFF J1-31 INBUS V ÷ 2 -2.5V ERROR FAULT RELAY BOARD LO SRC > 5.3V < 4.5V Block 47 is the reverse of Block 46 Figure 7-48 Self-Test Block 47 Version 1.23 MODEL 5000 SERIES MANUAL 7-67...
  • Page 170 R10, R90, K5, U111 U12, K14, K8, K9, K10 K15 Stuck < 0.43V K10, K14 Open, S1 A positive 1.6V is programmed. Confirms Pulse BV path and associated components. Figure 7-49 Self-Test Block 48 Version 1.23 7-68 MODEL 5000 SERIES MANUAL...
  • Page 171 ÷ 2 < 0.05V ERROR FAULT RELAY BOARD LO SRC > 0.1V K14, K10 Stuck Block 49 is a repeat of Block 48 with Pulse BV relays open. Figure 7-50 Self-Test Block 49 Version 1.23 MODEL 5000 SERIES MANUAL 7-69...
  • Page 172 IN BUS J1-31 INBUS V ÷ 2 < 0.05V ERROR FAULT RELAY BOARD LO SRC > 0.1V Block 50 is repeat of Block 48 with Pulse BV open. Figure 7-51 Self-Test Block 50 Version 1.23 7-70 MODEL 5000 SERIES MANUAL...
  • Page 173 IN BUS J1-31 INBUS V ÷ 2 2.5V ERROR FAULT RELAY BOARD LO SRC < 4.4V K25 Open, U111 A positive 10V is programmed. Confirms path K25 through 1KΩ. Figure 7-52 Self-Test Block 51 Version 1.23 MODEL 5000 SERIES MANUAL 7-71...
  • Page 174 IN BUS J1-31 INBUS V ÷ 2 2.5V ERROR FAULT RELAY BOARD LO SRC > 4.4V K24 Open A positive 5V is programmed. Confirms path through K24. *Self-Test Fixture Figure 7-53 Self-Test Block 52 Version 1.23 7-72 MODEL 5000 SERIES MANUAL...
  • Page 175 IN BUS J1-31 INBUS V ÷ 2 2.5V ERROR FAULT RELAY BOARD LO SRC < 4.4V K15 Open, K37 A positive 5V is programmed. Confirms path through K15. Figure 7-54 Self-Test Block 53 Version 1.23 MODEL 5000 SERIES MANUAL 7-73...
  • Page 176 A positive 1V is programmed through the 1.5MΩ to the Hi Src to confirm the 10μA range. The Lo Src K11 is energized towards the end of the test, verify that no ringing occurs after K11 is de-energized. Figure 7-55 Self-Test Block 54 Version 1.23 7-74 MODEL 5000 SERIES MANUAL...
  • Page 177 Lo Src K11 is energized near the end of the test, verify that no ringing occurs after K11 is de-energized. On Model 5300HS, EC D0 confirms Normalize Board S1, S2, S3, S4 and S5 operation. * - Self-Test Fixture Figure 7-56 Self-Test Block 55 Version 1.23 MODEL 5000 SERIES MANUAL 7-75...
  • Page 178 ERROR FAULT RELAY BOARD LO SRC Passes Block 56 K12 Stuck after failing Block 54 > 53μA K12, K25 Open K12 Open, R28 High < 45μA R28 Low Figure 7-57 Self-Test Block 56 Version 1.23 7-76 MODEL 5000 SERIES MANUAL...
  • Page 179 SETTING 1mA Range ERROR FAULT RELAY BOARD LO SRC Passes Block 57 K11 Stuck after failing Block 54 > 0.53mA K11 Open, R27 High < 0.45mA R27 Low Figure 7-58 Self-Test Block 57 Version 1.23 MODEL 5000 SERIES MANUAL 7-77...
  • Page 180 SETTING 10mA Range ERROR FAULT RELAY BOARD LO SRC Passes Block 58 K10 Stuck after failing Block 54 > 5.3mA K10 Open, R26 High < 4.5mA R26 Low Figure 7-59 Self-Test Block 58 Version 1.23 7-78 MODEL 5000 SERIES MANUAL...
  • Page 181 Passes Block 59 K8, K9 Stuck after failing Block 54 > 53mA K21 High Resistance F1, F3, R24 High < 45mA R24 Low, K9 Open, K8, U1 * Self-Test Fixture Figure 7-60 Self-Test Block 59 Version 1.23 MODEL 5000 SERIES MANUAL 7-79...
  • Page 182 FAULT RELAY BOARD LO SRC Passes Block 60 K6, K7 Stuck after failing Block 54 > 520mA K16 Stuck, R22 High K6, K7 Open < 480mA R22 Low Figure 7-61 Self-Test Block 60 Version 1.23 7-80 MODEL 5000 SERIES MANUAL...
  • Page 183 RELAY BOARD LO SRC Passes Block 61 K4, K5 Stuck after failing Block 54 > 1.9A R20 High < 1.2A K4, K5 Open Fails all Blocks 54 through 61 Figure 7-62 Self-Test Block 61 Version 1.23 MODEL 5000 SERIES MANUAL 7-81...
  • Page 184 11.1K = 1.5A K4,K5 10A RANGE 100K 11.1K 11.1K F.B. J1-27 J1-28 GAIN BUFFERED K SETTING ERROR FAULT RELAY BOARD LO SRC > 1.9A < 1.2A F2, F4 Figure 7-63 Self-Test Block 62 Version 1.23 7-82 MODEL 5000 SERIES MANUAL...
  • Page 185 100K 11.1K 11.1K F.B. J1-27 J1-28 GAIN BUFFERED K SETTING ERROR FAULT RELAY BOARD LO SRC > 0.53mA < 0.45mA Block 63 is the reverse of Block 57. Figure 7-64 Self-Test Block 63 Version 1.23 MODEL 5000 SERIES MANUAL 7-83...
  • Page 186 K18 Open, K8, K9, U29, > 85mA U6, U14, R121 < 65mA U29, R121 A positive 7.5V is programmed across the 100Ω G-K load. Confirms Lo Src positive clamp. * Self-Test Fixture Figure 7-65 Self-Test Block 64 Version 1.23 7-84 MODEL 5000 SERIES MANUAL...
  • Page 187 BUFFERED K SETTING ERROR FAULT RELAY BOARD LO SRC > 7mA U29, R152 < 9mA U29, R152 Confirms Lo Src positive clamp at 10mA range. * Self-Test Fixture Figure 7-66 Self-Test Block 65 Version 1.23 MODEL 5000 SERIES MANUAL 7-85...
  • Page 188 > 9.4V K21 High Resistance U29, Check drive circuit < 8.6V Check drive circuit Confirms Lo Src positive current drive. Confirms V of U20 (R105, R104). * Self-Test Fixture Figure 7-67 Self-Test Block 66 Version 1.23 7-86 MODEL 5000 SERIES MANUAL...
  • Page 189 DIFF J1-31 INBUS V ÷ 2 -4.5V ERROR FAULT RELAY BOARD LO SRC U29, Q25, check drive > 9.4V circuit < 8.6V Check drive circuit * Self-Test Fixture Figure 7-68 Self-Test Block 67 Version 1.23 MODEL 5000 SERIES MANUAL 7-87...
  • Page 190 Check CR27 and clamp < 4.8V network Clamped I drive is set to a positive 50μA across 100Ω ANET load. Confirms positive clamped I drive operation. * Self-Test Fixture Figure 7-69 Self-Test Block 68 Version 1.23 7-88 MODEL 5000 SERIES MANUAL...
  • Page 191 Check CR24 and clamp < 4.8V network Clamped I drive is set to a negative 50μA across 100Ω ANET load. Confirms negative clamped I drive operation. * Self-Test Fixture Figure 7-70 Self-Test Block 69 Version 1.23 MODEL 5000 SERIES MANUAL 7-89...
  • Page 192 Hi Src I drive is set to a positive 200mA and passed through ANET and GNET loads to develop 40V A-K. Confirms I drive operation. * Self-Test Fixture Figure 7-71 Self-Test Block 70 Version 1.23 7-90 MODEL 5000 SERIES MANUAL...
  • Page 193 ERROR FAULT RELAY BOARD HI SRC > 7.25V K31 Open A positive 75V is programmed across the 1.5MΩ resistor. Confirms V divide by 10 operation. * Self-Test Fixture Figure 7-72 Self-Test Block 71 Version 1.23 MODEL 5000 SERIES MANUAL 7-91...
  • Page 194 < 145V (290V) K32 Open A positive 150V is programmed across the 1.5MΩ resistor. Confirms V divide by 100 operation. Self-Test Fixture Items in parentheses are for 2KV Option. Figure 7-73 Self-Test Block 72 Version 1.23 7-92 MODEL 5000 SERIES MANUAL...
  • Page 195 > 8.5V Check I drive < 6.5V Check I drive A positive 75mA is generated across the 100Ω G-K load. Confirms Lo Src positive I drive. * Self-Test Fixture Figure 7-74 Self-Test Block 73 Version 1.23 MODEL 5000 SERIES MANUAL 7-93...
  • Page 196 > |8.5V| Check I drive < |16.5V| Check I drive A negative 75mA is generated across the 100Ω G-K load. Confirms Lo Src negative I drive. * Self-Test Fixture Figure 7-75 Self-Test Block 74 Version 1.23 7-94 MODEL 5000 SERIES MANUAL...
  • Page 197 < 8V K101 Stuck, Gate Protect of 1KΩ. Confirms K106 is A positive 65V is programmed, A to G is shorted and R energized and K101 is not energized. Figure 7-76 Self-Test Block 75 Version 1.23 MODEL 5000 SERIES MANUAL 7-95...
  • Page 198 INBUS - V ÷20 ~0.06V ERROR FAULT RELAY BOARD HI SRC > 10V K101, K106 Stuck Block 76 is a repeat of Block 75. Confirms K101 is energized. Figure 7-77 Self-Test Block 76 Version 1.23 7-96 MODEL 5000 SERIES MANUAL...
  • Page 199 Block 77 is a repeat of Block 9 with K105 energized, which causes the divider to drive the divide by 20 to the rail. The actual voltage at the Anode is 50V, the apparent voltage at the 1N135 is greater than 100V. Confirms K105 operation. Figure 7-78 Self-Test Block 77 Version 1.23 MODEL 5000 SERIES MANUAL 7-97...
  • Page 200 < 3.0A K2, K3 Open Fails all Blocks 54 through 61 and 78 Block 78 is only valid if 50A Lo-Source Option has been installed. * Self-Test Fixture Figure 7-79 Self-Test Block 78 Version 1.23 7-98 MODEL 5000 SERIES MANUAL...
  • Page 201 < 0.8μA K14 Shorted, R23 High A positive 5V is programmed across the 10MΩ resistor with all current ranges open. Confirms 1μA range, K14 is open. * Self-Test Fixture Figure 7-80 Self-Test Block 79 Version 1.23 MODEL 5000 SERIES MANUAL 7-99...
  • Page 202 Confirms 1μA range relay opens. The Lo Src K11 is energized towards the end of the test, verify that no ringing occurs after K11 is de-energized. * Self-Test Fixture Figure 7-81 Self-Test Block 80 Version 1.23 7-100 MODEL 5000 SERIES MANUAL...
  • Page 203 K4, K6, K7 > 180mA K4, K6, K7 A negative 140V is programmed to AUX Bd resistor, current flow confirms operation. This Block is used with the Auxiliary Source Option. Figure 7-82 Self-Test Block 81 Version 1.23 MODEL 5000 SERIES MANUAL 7-101...
  • Page 204 K4, K6, K7 > 180mA K4, K6, K7 A positive 140V is programmed to AUX Bd resistor, current flow confirms operation. This Block is used with the Auxiliary Source Option. Figure 7-83 Self-Test Block 82 Version 1.23 7-102 MODEL 5000 SERIES MANUAL...
  • Page 205 -140V J5-3,4 F.B. ERROR FAULT RELAY BOARD AUX SRC > 100mA A negative 140V is programmed. Confirms K4 operation. This Block is used with the Auxiliary Source Option. Figure 7-84 Self-Test Block 83 Version 1.23 MODEL 5000 SERIES MANUAL 7-103...
  • Page 206 U102, S101, K102 Open VAK > 4.7V K102 Confirms operation of the gain of 10 VAK (RDSON) circuit. This Block is used with the improved VAK (RDSON). Figure 7-85 Self Test Block 84 Version 1.23 7-104 MODEL 5000 SERIES MANUAL...
  • Page 207 A voltage is programmed to Hi Src input to clock ramp ratios of 3 separate compensation conditions. Timing is such that each group should be approx. 26V. First strobe is ~115uS after start of Outbus ramp. Figure 7-86 Self-Test Block 90 Version 1.23 MODEL 5000 SERIES MANUAL 7-105...
  • Page 208 SLOW CAP < 21V K2 Stuck C68 High, U2, U3 > 32V C104 Low, K2 NORM CAP < 20V C104 High Block 91 is reverse of Block 90. Figure 7-87 Self-Test Block 91 Version 1.23 7-106 MODEL 5000 SERIES MANUAL...
  • Page 209 Trace ZZ circuitry ZZ > 108Ω Trace ZZ circuitry A negative 50mA I drive is modulated at 1KHz, 10% RMS to confirm Zener impedance circuitry. * Self-Test Fixture Figure 7-88 Self-Test Block 92 Version 1.23 MODEL 5000 SERIES MANUAL 7-107...
  • Page 210 Check circuit, K17 etch cut > 5.722mA Check I 10 circuit A programmed 5mA pseudo I drive results in 5.555mA of current. 5300HS Model, check for jumper to J1-29. * Normalize Board Figure 7-89 Self-Test Block 93 Version 1.23 7-108 MODEL 5000 SERIES MANUAL...
  • Page 211 NORMALIZE BOARD LO SRC < 5.388mA K3 Open Check circuit, K17 etch cut > 5.722mA Check I 10 circuit Block 94 is reverse of Block 93. * Normalize Board Figure 7-90 Self-Test Block 94 Version 1.23 MODEL 5000 SERIES MANUAL 7-109...
  • Page 212 < 0.44mA K5 Shorted Three positive 0.5V pulses are applied across the 1K resistor to produce 0.5mA. Confirms operation of K5 and S2 on Normalize Board (Auxiliary Charging Range). Figure 7-91 Self-Test Block 95 Version 1.23 7-110 MODEL 5000 SERIES MANUAL...
  • Page 213 > 40V K1 stuck NC, K2 stuck NO A positive rail voltage is applied of approximately 60V. K1 is energized. Confirms K1 is on and K2 is not on. Figure 7-92 Self-Test Block 96 Version 1.23 MODEL 5000 SERIES MANUAL 7-111...
  • Page 214 Gate is connected to drive A. A series of three (3) 6.5V pulses are applied. Relays K7 and K8 are energized as shown in table to confirm operation. Figure 7-93 Self-Test Block 97 Version 1.23 7-112 MODEL 5000 SERIES MANUAL...
  • Page 215 Block 98 is similar to Block 96. K2 is energized. Confirms K2 operates. NOTE: On Relay Bds. Without R11, if fault will result in approximately 0V on the INBUS. Figure 7-94 Self-Test Block 98 Version 1.23 MODEL 5000 SERIES MANUAL 7-113...
  • Page 216 Block 99 is similar to Block 96. A positive rail voltage of approximately 60V is applied. Relay K4 is energized. A is shorted to K. Current clamps V at approximately 0V. Figure 7-95 Self-Test Block 99 Version 1.23 7-114 MODEL 5000 SERIES MANUAL...
  • Page 217 Gate is connected to A. Two (2) 6.5V pulses are applied. Relay K3 is operated for the first pulse and released for the second pulse. Relays K1 and K7 are energized. Figure 7-96 Self-Test Block 100 Version 1.23 MODEL 5000 SERIES MANUAL 7-115...
  • Page 218 7 – MAINTENANCE / TROUBLESHOOTING Version 1.23 7-116 MODEL 5000 SERIES MANUAL...
  • Page 219 #4 (dipswitch located on the Analog Board of the 5000 Series Tester). Position switch #4 ON to enable or OFF to disable the Low Current Deck. Any changes made to the switch setting should also be made to the “Mainframe Configure”...
  • Page 220 5000 Series Tester turned on. The connector contacts may be damaged. If a handler is used, connect a handler control cable from the back of the 5000 Series Tester marked “Handler” to the handler.
  • Page 221 Note: The zero-crossing detector is included on the Control Board (in the 5000 Series Tester). If the detector malfunctions, the tester will appear to have “locked-up” as it waits for the zero-cross signal. Power the 5000 Series Tester off and correct this malfunction before continuing testing.
  • Page 222 Low Current Deck to reduce the effects of lead wire. 8.3.2 Testing Either the start button on the 5000 Series Tester front panel or the start button on the Low Current Deck panel may be used to start the test for manual operation. The interlock on the Low Current Deck must be jumpered for the Low Current Deck start button to operate.
  • Page 223 To test the 5000 Series Tester, remove the Low Current Deck device cable from the front panel of the 5000 Series Tester (it is not necessary to remove the Low Current Deck control cable) and attach the 5000 Series Tester Self-Test Fixture as described in Section 2.1.4.
  • Page 224 8 – LOW CURRENT DECK It is good practice to run both the 5000 Series Tester self-test and Low Current Deck self-test at least on every system power up. Version 1.23 MODEL 5000 SERIES MANUAL...

  • Page 225: Table 8-1 Low Current Deck Self-Test Error Codes

    K12 open, U3, K8, U1 (K1, K13) stuck, K2, K9 open, K8, U1, U3 K13 open, K9, U2 K12 stuck, K3 open Cal G-K Board K3 stuck HI SRC F1/F3 Table 8-1 Low Current Deck Self-Test Error Codes Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 226 8 – LOW CURRENT DECK Version 1.23 MODEL 5000 SERIES MANUAL...
  • Page 227 The High Current Deck, in conjunction with the 5000 Series Tester, amplifies the High Source current to provide 500/1000 amp drive to the anode (collector). Base current of 10 amps is standard and is supplied from the 5000 Series Tester Low Source power supply.
  • Page 228 Series Tester and the High Current Deck. Connect the Low Current Deck device cable to the 5000 Series Tester and the High Current Deck device cable to the Low Current Deck. You can now do all testing at the High Current Deck terminals.

  • Page 229: Table 9-1 High Current Deck Calibration

    The High Current Deck is a pass through except on tests where currents are programmed above 50 amps. In all other respects, the High Current Deck operates the same as the 5000 Series Tester. If using a test fixture (those provided by Scientific Test)
  • Page 230 A terminal on the 5000 Series Tester front panel. The voltage at this terminal should be stable during the last 50 microseconds of the test application for the test to be valid. Adjust the parallel R and L if necessary to eliminate oscillation.
  • Page 231  External Relay Driver Board (ER-100). If the Pin Programmable Scanner was not part of the original equipment, this card will have to be installed into 5000 Series Tester small card cage and the 26 Pin Header to 25 Pin D-Sub cable connected to the 5000 Series Tester rear panel.
  • Page 232 10-3). For each device pin, select the signal to be applied when the test step is run. Repeat this process for each test step. Save the test program, this includes the pin assignments for the ADP-401A-8/16. NOTE: 0 indicates no assignment. Figure 10-3 ADP-401A Scanner Tab Version 1.23 10-2 MODEL 5000 SERIES MANUAL...
  • Page 233 Test->ADP401A). Click the “Start” button at the bottom of the PCW main window. The 5000 Series Tester will then perform a complete check of all the relays in the Pin Programmable Scanner (note: the 5000 Series Tester automatically detects if 1 or 2 Scanner Boards are installed in the ADP-401A Scanner.
  • Page 234 10 – PIN PROGRAMMABLE SCANNER Version 1.23 10-4 MODEL 5000 SERIES MANUAL...
  • Page 235 OPTIONAL Figure 11-1 Model 6010 Installation Diagram If the 5000 Series Tester is setup for Multiplex operation or a Low Current Deck is used, skip to the next step. If the Kelvin Test option was ordered, connect the 9-pin D-Sub connector to the 5000 Series Tester front panel (see Appendix D for Kelvin operation).
  • Page 236 11 – MODEL 6010 SCANNER 11.2 Programming Scan controls are added to the test plan within the 5000 Series Interface (PCW) ® Windows PC software. Highlight the desired test step (using the up or down arrow keys or mouse click) and then press the F3 key or right mouse click and select “Set Scan”...
  • Page 237 The Multiplex Adaptor is a separate chassis. A cable connects the Multiplex Adaptor to the front panel jacks of the 5000 Series Tester. A 9-pin D-Sub cable connects from the Multiplex Adaptor to the Adaptor Control connector on the front panel of the 5000 Series Tester.
  • Page 238  Run the 5000 Series Tester mainframe self-test.  Re-install the Multiplex Adaptor Device cable to the front panel of the 5000 Series Tester and confirm that all cables from the 5000 Series Tester to the Multiplex Adaptor are connected correctly.
  • Page 239  Run the Multiplex Self-Test for this station.  Repeat above two steps for each Manual Station. The 5000 Series Tester display will show “MUX „x‟ OK” („x‟ refers to the Multiplex Station being tested) each time the Multiplex Self-Test is run if the Multiplex Adaptor and Manual Stations are functioning properly.

  • Page 240: Table 12-1 Multiplex Adaptor Error Code Table

    K10 failed to close after opening “106” K12 failed to close after opening “106” K14 failed to close after opening “106” K16 failed to close after opening Table 12-1 Multiplex Adaptor Error Code Table Version 1.23 12-4 MODEL 5000 SERIES MANUAL...
  • Page 241 APPENDICES 13 APPENDICES The following appendices provide information concerning the various adaptors that can be used with the STI 5000 Series Tester to extend the device families that can be run. Version 1.23 MODEL 5000 SERIES MANUAL 13-1...
  • Page 242 APPENDICES Version 1.23 13-2 MODEL 5000 SERIES MANUAL...
  • Page 243 If, for example, 10 volts is applied to the gate and a 10 MΩ scope probe is attached, an error of approximately 1μA will result. Version 1.23 MODEL 5000 SERIES MANUAL 13-3...
  • Page 244 APPENDIX A Version 1.23 13-4 MODEL 5000 SERIES MANUAL...

  • Page 245: Table 13-1 Regulator Terminal Designations

    Overview Three-pin series regulators are tested on the 5000 Series Tester using a Regulator Adaptor that plugs into the 5000 Series Tester front panel and into which a standard test fixture is plugged. The adaptor (see Figure 13-1) ties the High Source (A) to the regulator input and the Low Source (G) to the regulator output.
  • Page 246 APPENDIX B LOAD SELECT Figure 13-1 Regulator Adaptor Version 1.23 13-6 MODEL 5000 SERIES MANUAL...
  • Page 247 Additional tests can be entered to test the regulator under other load conditions. Use R load on the 5000 Series Tester front panel for any loads not supplied internally. To test V of 5V with a 5mA load, make the...
  • Page 248 Note: S4 (Test 4) is V @ 500mA and S2 (Test 2) is V @ 5mA. Step 5: Select Proper Test Fixture (See Figure 12-2) Use a TO-220 inline fixture with KGA pinout for the LM317 regulator. Version 1.23 13-8 MODEL 5000 SERIES MANUAL...
  • Page 249 OPTO ADAPTOR ENCLOSURE 5000 SERIES TRANSISTOR (BASE) G OPTO ADAPTOR JACKS FRONT OF ADAPTOR (COLLECTOR) A (EMMITTER) K +12V USE ONLY EXACT REPLACEMENT RELAYS RELAY 1 RELAY 2 Figure 13-3 Opto Adaptor Schematic Version 1.23 MODEL 5000 SERIES MANUAL 13-9...
  • Page 250 APPENDIX C Version 1.23 13-10 MODEL 5000 SERIES MANUAL...
  • Page 251 Kelvin relays are located in the Handler Device Cable with Kelvin enclosure or within the Low Current Deck (LC-1000). Kelvin is not included in the standard 5000 Series Tester mainframe. A Kelvin test is performed by completing a path through all drive...
  • Page 252 APPENDIX D Version 1.23 13-12 MODEL 5000 SERIES MANUAL...

  • Page 253: Table 13-2 Options Dipswitch Settings

    Kelvin Test (external) Disabled Enabled Low Current Deck Disabled Enabled High Current Deck Limit 500A 1000A High Current Deck Disabled Enabled High Source Limit 1000V 2000V Not Used Table 13-2 Options Dipswitch Settings Version 1.23 MODEL 5000 SERIES MANUAL 13-13...
  • Page 254 APPENDIX E Version 1.23 13-14 MODEL 5000 SERIES MANUAL...
  • Page 255 Alternatively, an external capacitor can be attached form the collector to base at the 5000 Series Tester front panel ANET terminals with Version 1.23...
  • Page 256 Two of these methods are listed as preferred, one of which is used in the 5000 Series Tester. That method uses a fixed load resistor and reduces the principal supply voltage until the thyristor reaches the specified holding current.
  • Page 257 6 volts for the minimum expected holding current. It is recommended that the V entry for this condition in the 5000 Series Tester be at least 24 volts. This assures sufficient initial current to cause the device to latch.
  • Page 258 APPENDIX F Version 1.23 13-18 MODEL 5000 SERIES MANUAL...
  • Page 259 Figure 13-6 illustrates the basic operation of the Opto-Logic Adaptor with a Series 5000 Tester. An external load (R Ext.) is programmable In/Out and the 5 Volt bias supply is normally On. Figure 13-7 Opto Logic I and I FOFF Version 1.23 MODEL 5000 SERIES MANUAL 13-19...
  • Page 260 (see Figure 13-7).  Logic: Pos/Neg  5V Bias: On  R EXT: On/Off  Entries: (limit) and I (Pos Logic) and I (Neg Logic) Version 1.23 13-20 MODEL 5000 SERIES MANUAL...
  • Page 261  R EXT: On/Off  Entries: (limit) FOFF and I (Pos Logic) and I (Neg Logic) Hysteresis (Calculation) Hysteresis is the computed value of I divided by I FOFF HYST = I FOFF Version 1.23 MODEL 5000 SERIES MANUAL 13-21...
  • Page 262 APPENDIX G Version 1.23 13-22 MODEL 5000 SERIES MANUAL...
  • Page 263 The measured level is compared against the entered V limit and if the value is less than the limit, the device has fired. Version 1.23 MODEL 5000 SERIES MANUAL 13-23...
  • Page 264 After firing, the Low Source applies a current of two times the programmed I , then reduces it to the programmed I value (soak time up to 25 mSecs can be added). Version 1.23 13-24 MODEL 5000 SERIES MANUAL...
  • Page 265 Example: 20 Volt Low Source compliance (I test limit = 300 mA) = 20 / 600 mA = 33 Ω = 20 / 2 * I should never be less than 10 Ω. Note: R Version 1.23 MODEL 5000 SERIES MANUAL 13-25...
  • Page 266 This is a zener test that provides measurement of the zener voltage of the device at the programmed current level. 13.1.12 This is a leakage test that provides measurement of the device leakage current at the programmed voltage level. Version 1.23 13-26 MODEL 5000 SERIES MANUAL...
  • Page 267 Installation of the 5 Pin Module Adaptor consists of (see installation diagram supplied):  Connect the device cable from the 5000 Series Tester front panel jacks to the rear panel of the adaptor.  Connect the 25-pin D-Sub control cable from the 5000 Series Tester rear panel (labeled “Handler/Prober”) to the rear panel of the adaptor (J3).
  • Page 268 APPENDIX H Version 1.23 13-28 MODEL 5000 SERIES MANUAL...
  • Page 269 The adaptor provides TIP-COM, RING-COM and TIP-RING connections. The tests provided (in addition to the tests described in Appendix H) are described below. The STI 5000 Series Interface software automatically sets the appropriate Relays in the test program Relay Plan.
  • Page 270 START 100V/uS CLOSE K31 ANODE VOLTAGE, 1800V EDGE DET SHUTS DOWN SET UP RB K33, K106 K27 OFF DISABLE SHUTDOWN PK MEASURE EXPANDED 100V/uS AT CAPS Figure 13-17 V Breakdown Circuit Diagram and Waveform Version 1.23 13-30 MODEL 5000 SERIES MANUAL...
  • Page 271 TRIPLE Figure 13-19 VB Breakdown Test Waveform Continuity (Test Access) Test A continuity test is available as a resistance test from TIP to RING. Figure 13-20 shows the circuit diagram for this test. Version 1.23 MODEL 5000 SERIES MANUAL 13-31...
  • Page 272 Figure 13-21 shows the circuit diagram for this test. COMPLIANCE RING Figure 13-21 Coil Resistance Test Circuit Diagram Note See Appendix H for details of the other tests defined in the 5 Pin Module device family. Version 1.23 13-32 MODEL 5000 SERIES MANUAL...
  • Page 273 (RING OR TIP) (RING OR TIP) (A1 OR A2) (K1 OR K2) GATE GATE (G1 OR G2) (G1 OR G2) COM (K) COM (A) NEGATIVE RAIL POSITIVE RAIL Figure 13-23 Single Device Connection Version 1.23 MODEL 5000 SERIES MANUAL 13-33...
  • Page 274 G2 / K1 The PCW software defaults the connections to G1/K1 and G2/K2 when a new test is entered. These can be changed to provide the G1 / K2 and G2 / K1 connections. Version 1.23 13-34 MODEL 5000 SERIES MANUAL...
  • Page 275 APPENDIX I : to 9.999A : to 600V Negative Positive POSITIVE RAIL NEGATIVE RAIL Figure 13-26 Gated Test (80V Opt.) : to 600V Negative Positive POSITIVE RAIL NEGATIVE RAIL Figure 13-27 Gated V Test Version 1.23 MODEL 5000 SERIES MANUAL 13-35...
  • Page 276 : to 50A Negative Positive POSITIVE RAIL NEGATIVE RAIL Figure 13-28 Gated V Test : to 200mA : to 2KV VDRM VDRM Positive Negative POSITIVE RAIL NEGATIVE RAIL Figure 13-29 Gated I Test Version 1.23 13-36 MODEL 5000 SERIES MANUAL...
  • Page 277 GA / GK Positive Negative 220nF 220nF POSITIVE RAIL NEGATIVE RAIL Figure 13-30 Gated V Test : to 200mA : to 2KV GK / GA POSITIVE RAIL NEGATIVE RAIL Figure 13-31 Gated I Test Version 1.23 MODEL 5000 SERIES MANUAL 13-37...
  • Page 278 POSITIVE RAIL NEGATIVE RAIL Figure 13-32 Gated I Test : to 1A +20V -20V : to 600V DRIVE DRIVE GK / GA 220nF 220nF POSITIVE RAIL NEGATIVE RAIL Figure 13-33 Gated I Test Version 1.23 13-38 MODEL 5000 SERIES MANUAL...
  • Page 279 Figure 13-34 Gated I Test : to 9.999V +20V -20V : to 49.9A : to 900mA : to 600V GK / GA 220nF 220nF POSITIVE RAIL NEGATIVE RAIL Figure 13-35 Gated V Test Version 1.23 MODEL 5000 SERIES MANUAL 13-39...
  • Page 280 APPENDIX I : to 200mA : to 2KV : to 600V GK / GA Negative Positive POSITIVE RAIL NEGATIVE RAIL Figure 13-36 Gated I Test Version 1.23 13-40 MODEL 5000 SERIES MANUAL...
  • Page 281 If the device recovers within a time less than the specified limit, the test passes. POS OR NEG (POS SHOWN) 10X1000 PULSE 10 AMP AUX SRC BIAS VOLTAGE 52V (PROGRAMMABLE) LOAD CURRENT (TYP) Figure 13-37 10x1000 Simplified Schematic Figure 13-38 10x1000 Pulse Test Screen Version 1.23 MODEL 5000 SERIES MANUAL 13-41...
  • Page 282 4/5/5G Block” menu selection. This opens the Adaptor Self Test Box. Be sure the ADP-340-4 / 5 / 5G Self Test Fixture is installed and the ADP-340-4 / 5 / 5G is connected correctly to the STI 5000 Series Tester. Press the “Start” button on the 5000 Series Tester.

  • Page 283: Table 13-3 Adp-340-5 Self Test Blocks (1-18)

    Confirms operation of K31, K33 on Dual OVP Board K33 stuck NC Confirms operation of K33 on Dual OVP Board K6-9, K24 stuck NO Confirms operation of K6-9, K24 on Dual OVP Board Table 13-3 ADP-340-5 Self Test Blocks (1-18) Version 1.23 MODEL 5000 SERIES MANUAL 13-43...

  • Page 284: Table 13-4 Adp-340-5 Self Test Blocks (19-42)

    Confirms operation of K17, K27 on Gated Board K27 stuck NO Confirms operation of K27 on Gated Board K17, K19, K26 or K28 stuck NO Confirms operation of K17 on Gated Board Table 13-4 ADP-340-5 Self Test Blocks (19-42) Version 1.23 13-44 MODEL 5000 SERIES MANUAL...

  • Page 285: Table 13-5 Adp-340-5 Self Test Blocks (43-51)

    Confirms operation of K28 on Gated Board C1 or C2 bad Confirms value of C1, C2 on Gated Board C3 bad Confirms value of C3 on Gated Board Table 13-5 ADP-340-5 Self Test Blocks (43-51) Version 1.23 MODEL 5000 SERIES MANUAL 13-45...

  • Page 286: Table 13-6 10X1000 Self Test Blocks (70-88)

    D5 open Confirms D5 K14, K16 stuck open Confirms K14, K16 operated K16 stuck closed Confirms K16 not operated K14 stuck closed Confirms K14 not operated Table 13-6 10x1000 Self Test Blocks (70-88) Version 1.23 13-46 MODEL 5000 SERIES MANUAL...

  • Page 287: Table 13-7 10X1000 Self Test Blocks (89-96)

    Confirms K5 operated K6 stuck open, R3/R8 High Confirms K6 operated K7 stuck open, R4/R9 High Confirms K7 operated K8 stuck open, R5/R10 High Confirms K8 operated Table 13-7 10x1000 Self Test Blocks (89-96) Version 1.23 MODEL 5000 SERIES MANUAL 13-47...
  • Page 288  These calibration factors are stored in memory and will be used until the 5000 Series Test System is powered down. To save these calibration factors for use after the system is powered down, click the “Save / Exit” button.
  • Page 289 APPENDIX I Figure 13-39 10x1000 Pulse Option Calibration Screen Version 1.23 MODEL 5000 SERIES MANUAL 13-49...
  • Page 290 APPENDIX I Version 1.23 13-50 MODEL 5000 SERIES MANUAL...
  • Page 291 RMS value. An exact value is thereby obtained in a single test application (test time is approximately 14 mSecs). 1 KHZ DETECT DETECTED V AC 1 KHz 10% RMS Figure 13-40 Zener Impedance Test Version 1.23 MODEL 5000 SERIES MANUAL 13-51...
  • Page 292 APPENDIX J Version 1.23 13-52 MODEL 5000 SERIES MANUAL...
  • Page 293 Overview The EXT-100 is an interface board that provides controls for use with auxiliary equipment in conjunction with the 5000 Series Tester. The controls are activated using an “EXTN” (external) test programmed in the STI 5000 Series Interface software. The Pass/Fail result returned from the auxiliary equipment can be used in the Bin/Sort Plan of the test program.
  • Page 294 Start Test, the auxiliary equipment must set the EOT high (relay off) and then when the auxiliary equipment is finished must set the EOT low (relay on); this transition indicates the end of test (low level must sink at least 35 mA). FAIL Version 1.23 13-54 MODEL 5000 SERIES MANUAL...
  • Page 295 3 milliseconds. A low level (relay on), capable of sinking at least 35 mA, will be interpreted as a Fail and a high level (relay off) will be interpreted as a Pass. Version 1.23 MODEL 5000 SERIES MANUAL 13-55...
  • Page 296 APPENDIX K Version 1.23 13-56 MODEL 5000 SERIES MANUAL...
  • Page 297 Initial VB O Final VB O Measured V Figure 13-43 Quadrac/Diac V Test ΔV Symmetry is obtained using a real-time math step to compute the absolute difference in the positive and negative V Version 1.23 MODEL 5000 SERIES MANUAL 13-57...
  • Page 298 Valley voltage is measured using a separate standard test. A math step is then used to subtract the valley voltage from the V All of these Triac tests are included as standard tests in the 5000 Series Tester. ADP-350 ADAPTOR...
  • Page 299 V at which switching occurred. is computed in a manner similar to I . Use the equation: – V Is = (V ) / 200K Version 1.23 MODEL 5000 SERIES MANUAL 13-59...
  • Page 300 (PNP) for negative blocking (leakage) current tests. 13.1.16 Tests Use V (NPN) for positive VF and V (PNP) for negative VF tests. BESAT BESAT – V 13.1.17 Compute this value using the equation: – V = ABS(V Version 1.23 13-60 MODEL 5000 SERIES MANUAL...
  • Page 301 Diac device V test (see Appendix L – Figure 13-43). The maximum current allowed is 20 mA and the peak-measured voltage is reported as the V answer. Version 1.23 MODEL 5000 SERIES MANUAL 13-61...
  • Page 302 R is greater than the maximum limit (500 ohms). At I equal to 10mA, the delta V (V ) would be less than 5 volts for the Version 1.23 13-62 MODEL 5000 SERIES MANUAL...
  • Page 303 Note: To improve overall test time and datalog clarity, both Autorange and Datalog should be turned off on steps 1, 2, 3, 4 and 7 Figure 13-47 Sidac Test Program Screen Version 1.23 MODEL 5000 SERIES MANUAL 13-63...
  • Page 304 APPENDIX M Version 1.23 13-64 MODEL 5000 SERIES MANUAL...
  • Page 305  Plug the ADP-390 into the 5000 Series tester front panel jacks.  Connect the 5000 Series Tester rear panel (ADP-390 Control 1 and ADP-390 Control 2) to the ADP-390 (Control 1 and Control 2) via the two 25-pin to 25- pin D-Sub cables provided.
  • Page 306 The VREL test finds the voltage at which the relay contacts drop back into the non- operate position. The limit entry specifies the applied voltage after the VOPER voltage is applied when in the Go/No-Go mode. As with the VOPER test, selections Version 1.23 13-66 MODEL 5000 SERIES MANUAL...
  • Page 307 A relay with contacts welded in the non-operated position can be determined by checking that it fails V , OP and R (both a-Form and C-Form). OPER TIME CONT All tests report the worst case answer if more than one pole. Version 1.23 MODEL 5000 SERIES MANUAL 13-67...
  • Page 308 APPENDIX N Version 1.23 13-68 MODEL 5000 SERIES MANUAL...
  • Page 309 The inductor kicks back into the collector of the DUT when the base is opened or has reverse bias applied. The adaptor is shown schematically in Figure 13-48. The energy storage inductor is attached externally. Figure 13-48 VCESUS Adaptor (ADP-410) Version 1.23 MODEL 5000 SERIES MANUAL 13-69...
  • Page 310 Transistor Device family. This test is used only as a reverse bias test. For I or I , use the I test in the same device family. The ADP-410 contains a floating bias supply used for the I test. Version 1.23 13-70 MODEL 5000 SERIES MANUAL...
  • Page 311  100V Hi Source Option is required  The ADP-100V is detected when installed. If not installed, programmed of 100V or greater will not run. below 100V, internal RL’s can be used.  At V Version 1.23 MODEL 5000 SERIES MANUAL 13-71...
  • Page 312 APPENDIX P Version 1.23 13-72 MODEL 5000 SERIES MANUAL...
  • Page 313  A Pins 9-16  K Pins 8-16  GND Pins 1-8 As an example, for a quad opto-coupler, pins would be assigned as follows (see Figure 13-50): Figure 13-50 Quad Opto Scanner Example Version 1.23 MODEL 5000 SERIES MANUAL 13-73...
  • Page 314 APPENDIX Q  Tests on first Opto-Coupler Pin 1 Pin 2 A(Collector) Pin 16 K(Emitter) Pin 15 Version 1.23 13-74 MODEL 5000 SERIES MANUAL...
  • Page 315 14 - APPLICATION NOTES 14 APPLICATION NOTES The following application notes provide the user details about using the STI 5000 Series Tester and STI 5000 Series Interface software to accomplish various tasks. Version 1.23 MODEL 5000 SERIES MANUAL 14-1...
  • Page 316 14 - APPLICATION NOTES Version 1.23 14-2 MODEL 5000 SERIES MANUAL...
  • Page 317  Enter sort 3 voltage limit (steps 5 and 10)  Set binning as sown in Figure 14-3 (note: must use the STI Bin/Sort mode)  Add additional sorts and bins as required Version 1.23 MODEL 5000 SERIES MANUAL 14-3...
  • Page 318 APP-001 Figure 14-2 APP-001 Test Screen Version 1.23 14-4 MODEL 5000 SERIES MANUAL...
  • Page 319 APP-001 Figure 14-3 APP-001 Bin/Sort Screen Figure 14-4 APP-001 Calculation Screen Version 1.23 MODEL 5000 SERIES MANUAL 14-5...
  • Page 320 APP-001 Version 1.23 14-6 MODEL 5000 SERIES MANUAL...
  • Page 321 Tip/Common is the default, which also sets all the correct relays for the SSOVP tests using the ADP360 adaptor. Figure 14-5 APP-002 Edit Screen Step 2: In the Bin/Sort Tab set the test to End on Fail by double clicking on the EOF section as shown below. Version 1.23 MODEL 5000 SERIES MANUAL 14-7...
  • Page 322 APP-002 Figure 14-6 APP-002 Bin/Sort Screen Version 1.23 14-8 MODEL 5000 SERIES MANUAL...
  • Page 323 Set for the same count.  Set Baud rate to 38.4 K.  Set initialization to “01A”.  Set delimiter to CR. Run the STI 5000 Series Tester to load desired data directly into the SPC/PI+ software. Version 1.23 MODEL 5000 SERIES MANUAL 14-9...
  • Page 324 APP-003 Version 1.23 14-10 MODEL 5000 SERIES MANUAL...
  • Page 325 The STI Lot Summary file can also include this Data Information file by checking the Include Information File menu item in the Lot Summary popup menu. See the Section 6 for more detailed information. Version 1.23 MODEL 5000 SERIES MANUAL 14-11...
  • Page 326 APP-004 Version 1.23 14-12 MODEL 5000 SERIES MANUAL...
  • Page 327 The STI test program, shown in Figure 14-8, is used to demonstrate some of the binning, sorting and data logging facilities available with STI 5000 Series Tester and STI PCW software. In this example, the transistor is to be sorted into categories based on the HFE test.
  • Page 328 APP-005 Figure 14-9 APP-005 Bin Plan Screen Figure 14-10 APP-005 Sort Plan Screen Version 1.23 14-14 MODEL 5000 SERIES MANUAL...
  • Page 329 Sort/Bin result is reported. On Sort: only devices that qualify to a sort (specified by operator) are data logged, all other devices are tested but only the Sort/Bin result is reported. Version 1.23 MODEL 5000 SERIES MANUAL 14-15...
  • Page 330 Left in this mode, the lot summary pane will be updated after each test sequence (Note: this can dramatically reduce test throughput and is not recommended when the STI Tester is connected to a handler or prober). Version 1.23 14-16 MODEL 5000 SERIES MANUAL...
  • Page 331 Opto Switch The STI test program shown in Figure 14-13 provides an example of using the STI 5000 Series Tester to test opto-switch devices such as those shown in Figure 14-14. Figure 14-13 Opto-Switch Test Program Figure 14-14 Typical Opto-Switch Version 1.23...
  • Page 332 APP-006 Version 1.23 14-18 MODEL 5000 SERIES MANUAL...
  • Page 333 “S0:28000” example: Returns - nothing Must be a valid STI test program (.T60). If a valid program, the STI 5000 Series Tester display will indicate “PROGRAM RECEIVED” other was it will indicate “INVALID PROGRAM”.  Execute an STI Go-NoGo sequence.
  • Page 334 Toggles the Remote / Local switch (also updates display) Returns - nothing  STI Repeat/Single. - “V:REPEAT” Command Toggles the Repeat / Single switch (also updates display) Returns - nothing  STI RS232 Mode. Version 1.23 14-20 MODEL 5000 SERIES MANUAL...
  • Page 335 - nothing Example programming using National Instruments IBIC.EXE interface software.  Turn on the STI 5000 Series Tester (default RS232 mode)  Using the STI 5000 Series Software, select the IEEE-488 mode as defined above  Find the device: ibdev 0,7,0,13,1,0 ...
  • Page 336 APP-007 Version 1.23 14-22 MODEL 5000 SERIES MANUAL...
  • Page 337 Multiple Testers on One PC The STI PCW Software can be used to operate multiple STI 5000 Series Testers with one PC. This technique is not recommended if more than one of the testers is connected to a handler or prober with full Datalog turned on;...
  • Page 338 APP-008 Version 1.23 14-24 MODEL 5000 SERIES MANUAL...
  • Page 339  Values in black text represent values that passed the test criteria of the STI 5000 Series Tester Test Program  Values in red text represent values that failed the test criteria of the STI 5000 Series Tester Test Program ...
  • Page 340 APP-009 Version 1.23 14-26 MODEL 5000 SERIES MANUAL...

  • Page 341: Table 15-1 Component Level Spares Kit (Includes Relay Spares Kit)

    TIP142 Coto 2721-12-0(1) SPDT Hg relay TIP147 (C Form) DAC709 Burr Brown HGJM5111POO Clare SPDT Hg V12R15-5 Reliability Inc. relay VJ247, VJ447 DG202CJ Table 15-1 Component Level Spares Kit (Includes Relay Spares Kit) Version 1.23 MODEL 5000 SERIES MANUAL 15-1...
  • Page 342 18 MΩ, ½W 1.5 MΩ, ¼W Banana Plug (PCB) Concord 01-2255-6-01 ¼” 1680-632-SS Spacer 6-32 x 5/16” SS (Pexi-glass side) Screws Screws 6-32 x ¼ (PCB side) Plex-Glass Table 15-3 Self-Test Fixture (600-001) Version 1.23 15-2 MODEL 5000 SERIES MANUAL...
  • Page 343 LED JUMPER ANSLEY FSP-21A 18 PIN DISPLAY CABLE SOUTHWEST ASSEMBLY #CA2224 NUMBERED KEYSWICH MARQUARDT 6450.0015 THRU 6450.0105 BLANK KEYSWICH MARQUARDT 6450.0001 28 PIN EDGE CONNECTOR VIKING 3VT28/2CNK5 24 PIN EPROM ZIF SOCKET TEXTOOL 224-3344-00-0602 Version 1.23 MODEL 5000 SERIES MANUAL 15-3...
  • Page 344 CR41, CR42, CR43, CR44, CR50, CR51, CR52, CR53, CR54, CR55, CR56, CR57, CR58, CR59, CR60, CR61, CR62, CR63, CR64, CR65, CR48, CR49 1N4735 6.2V ZENER CR1, CR6, CR35, CR45 1N5225 3.0V ZENER CR30, CR31, CR32, CR33 1N5402 Version 1.23 15-4 MODEL 5000 SERIES MANUAL...
  • Page 345 R75, R84, R113, R122, R37, R38, R53, R54, R74, R82, R111, 20K 1/4W R121, R141, R142 R42, R43, R58, R59 30K 1/4W R48, R49 56K 1/4W 68K 1/4W R114, R115 100K 1/4W R32, R33 120K 1/4W Version 1.23 MODEL 5000 SERIES MANUAL 15-5...
  • Page 346 40 PIN SOCKETS BURNDY DILB 40P-108 SMALL SINGLE PIN SOCKETS FOR K2 CONCORD 09-9015-1-03 LARGE PIN SOCKETS FOR U1 CONCORD 09-9006-1-03 TP1,TP2 TEST LOOP - OVERLAND 330. 100 “HI SOURCE” 700-001 REV E PC BOARD Version 1.23 15-6 MODEL 5000 SERIES MANUAL...
  • Page 347 DA1A12DWD, (A-FORM) 27 UH HJE350 MJE340 Q3, Q4 MJE15031 Q5, Q6 MJE15030 Q7, Q8 TIP35B/C (CUT TIPS OF TABS) Q21, Q22 TIP36B/C (CUT TIPS OF TABS) IRF612 IRF9612 Q12, Q13 2N6072B / 2N6071B 2N2222 Version 1.23 MODEL 5000 SERIES MANUAL 15-7...
  • Page 348 BURR BROWN OPA445BM U2, U3 4N38 LF353N U4, U5, U9, U10, U15, U16, U17, U19, U20 LF411CN U21. U22 LF398N 74LS04 U12, U13 ULN2003A/SN75468 74LS32 Z80-PIO 74LS245 74LS138 74LS365 LMC13204/LF13202 694-3R10K-A RESISTOR NETWORK V12R15-15 RELIABILITY Version 1.23 15-8 MODEL 5000 SERIES MANUAL...
  • Page 349 4.7 OHM 5W (SPACE OFF BOARD) R132, R133, R136, R137 .33 OHM 1 WATT R16, R64, R70, R72 47 OHM 1/4W R17.R65, R71, R73 JUMPER Q9, Q20 TIP35E Q23, Q24 TIP36E REMOVE: R80, R81 Version 1.23 MODEL 5000 SERIES MANUAL 15-9...
  • Page 350 .01UF 200V BYPASS, AVX SR202C103KAA 10PF 100V NPO, CENT CN15A100K C24, C41 1000PF 100V (MUR RPE11) X7R102K100V C27, C44 2700PF 100V, CW15A100K C315C272K1 C3, C6, C15, C70, C71, C112 .01UF 100V POLY, STK 80KPS Version 1.23 15-10 MODEL 5000 SERIES MANUAL...
  • Page 351 TP1, TP2, TP3, TP8, TP10, TP11, TP16 CONCORD 09-9112-1-4410 Table 15-8 Analog Board Assembly (600-036 Rev B) 15.9 Relay Board Assembly 600-048 Rev. C Reference Designation Description C40, C104 47PF 200V NPO 100PF 100V NPO Version 1.23 MODEL 5000 SERIES MANUAL 15-11...
  • Page 352 100 1W R101 100K 1W R4, 5 24 2W 30 2W 300 2W R65, 103 1K 2W (SPACE OFF BOARD) R1, 108 10K 2W 100K .1% RN60 R23, 32, 57 1K .1% RN60 Version 1.23 15-12 MODEL 5000 SERIES MANUAL...
  • Page 353 .1UF 50V BYPASS C11, C12, C13, C14, C18, C19, C20, C21, C22, C23, C24, C25 C15, C16, C17 22UF 35V RADICAL 50 PIN PCB HEADER J4, J5 26 PIN PCB HEADER R9, R10 1K 1/4W Version 1.23 MODEL 5000 SERIES MANUAL 15-13...
  • Page 354 Reference Designation Description 16P CHASSIS PLUG WIRE PRO 26-4100-16P 25 D-SUB COVER DAN PEPPER 10-25 3 PIN HOUSING MOLEX 09-05-3031 REAR PANEL STI 500-101 Table 15-12 LCD Rear Panel Assembly 15.11.3 Base Plate Assembly Version 1.23 15-14 MODEL 5000 SERIES MANUAL...
  • Page 355 49.9M 1/4W 1% 40.2M 1/4W 1% 8.2K 2W 10K 2W NOT USED TEST POINT SINGLE PIN SOCKETS CONCORD 09-9015-1-03 Table 15-15 LCD "A" Board Assembly (600-014 Rev C) “G-K” Board Assembly 15.11.6 600-015 Rev. E Version 1.23 MODEL 5000 SERIES MANUAL 15-15...
  • Page 356 TEST POINT OVERLAND 330.100 16P “BLUE RIBBON” CHASSIS PLUG AMPHENOL 26-4401-16P HI CURRENT JACK (RED) SUPERIOR RS50GR HI CURRENT JACK (BLK) SUPERIOR RS50GB FRONT PANEL (STI) 500-000HC Table 15-17 HCD Front Panel Assembly Version 1.23 15-16 MODEL 5000 SERIES MANUAL...
  • Page 357 Base Plate Assembly Reference Designation Description SINGLE (+12) POWER SUPPLY POWER ONE HB 12-1.7A 2300UF 40V CAP (+SCREWS) MALLORY CGS233V040V4C LARGE CAP BRACKET (+SCREWS) MALLORY VR8A DISCHARGE RES. FOR CGS233 2K 5W DALE RW67V202 Version 1.23 MODEL 5000 SERIES MANUAL 15-17...
  • Page 358 Description VJ247 47PF 100V NPO 220PF 100V NPO C48, C49, C71 100PF 100V NPO C69, C73 470PF 100V NPO 2700PF 100V STABLE C11, C12, C18, C30, C31, C32, C33, C56, .1MF 100 BYPASS Version 1.23 15-18 MODEL 5000 SERIES MANUAL...
  • Page 359 R112 1K 2W R153 25K POT U4, U5, U10, U19, U20 LF356 LF353 694-3-R10K PRECISION NETWORK * SCREEN TO 500 A SPEC. Table 15-22 HCD PA#1 & PA#4 Board Assembly (700-001 Rev E) Version 1.23 MODEL 5000 SERIES MANUAL 15-19...
  • Page 360 *SCREEN TO 400A SPEC. R153 25K POT U4, U5, U10 LF356 694-3-R10K PRECISION NETWORK Table 15-23 HCD PA#2 & PA#4 Board Assembly (700-001 Rev E) 15.13 Prober / Handler Board Assembly 15.14 Extended Range Board Assembly Version 1.23 15-20 MODEL 5000 SERIES MANUAL...

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