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INSTRUCTION
MANUAL
Digital Multimeter
Models 112A. 173A
SECTION 6.
MAINTENANCE.
6-l.
GENERAL.
This
section
contains
information
necessary
to maintain
the
instrument.
Included
are
procedures
for
electrical
Performance
Verification,
Adjustment/Calibration
Troubleshooting,
and Fuse
Replacement.
6-2.
REQUIRED TEST EQUIPMENT.
Recommended
test
equipment
for
Performance
Verification
is given
in Table
6-1.
Test
equipment
for
Adjustment/Calibration
is
given
in Table
6-6
Alternate
test
equipment
may be substituted
if
specifications
equal
or
exceed
the
stated
characteristics.
TABLE 6-1.
List
of
Test
Equipment
for
Performance
Verification.
l-FM
I ,.I I
I
"FZr*lPTl"M
"*"",.,,
.-8.
I
<PFTIFlCATl"N
-. _-.. ._... ._,.
1 MFR
1 MFR MODEL
A
DC Calibrator
cO.ZV
through
?I000
Vdc
FLUKE
343A
+0.002%
or
2OuV
B
AC Calibrator
0.2
through
20 v rms
HP
745A
?0.022%
+ 1ouv
C
High
Voltage
Amplifier
ZOOV through
1000.0
v rms
HP
746A
(Used
with
Model
745A)
iO.O4%
D
Decade
Resistor
2KR through
IOMR
ESI
DE62
kO.Ol%
200MR +O.l%
CADDOCK
HG750
E
Current
Source
200uA
through
20 mA
FLUKE
33308
to.
006%
200mA and 2A +0.02%
FLUKE
382A
F
Ohmmeter
IO'21 21% 10sn ?5%
KI
616
G
IMn Resistor
~I/Ew,
+I% tolerance
KI
R-88-lMQ
-
6-3.
PERFORMANCE VERIFICATION.
Performance
Verification
should
be performed
by qualified
personnel
using
accurate
and reliable
test
equipment
as given
in Table
6-l.
Use the
following
procedures
to verify
basic
operation
and accuracy
of
the
instrument.
All
measurements
should
be made at
an ambient
temperature
within
the
range
of
20°C
to 3O'C
and with
a relative
humidity
of
less
than
80%.
If
the
instrument
is out
of
specification
at any
point,
perform
a complete
calibration
as given
in Paragraph
6-4.
If
the
instru-
ment
is
"IN
WARRANTY",
contact
your
Keithley
representative
or
the
factory.
NOTE
This
procedure
is
intended
to verify
only
the
basic
accuracy
of
the
Node1
l72A/
l73A
in voltage,
current,
and resistance
modes.
Test
equipment
accuracy
should
be X5 better
than
the
measurement
accuracy.
In many cases
the
equipment
listed
in Table
6-l
is not
X5 better,
because
such
equipment
is
not
readily
available.
'V
For
this
reason,
the
expected
error
contribution
of
the
listed
test
equipment
is
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