Self-Test Procedures; Self-Test Error - Keysight Technologies EDU33210 Series Service Manual

Self-Test Procedures

A power-on self-test occurs automatically when you turn on the waveform generator. This limited test assures you
that the waveform generator is operational.
Press [System] > Instr. Setup > Self Test to perform the complete self-test of the waveform generator. It takes
approximately 12 seconds for the self-test to complete.
You can also perform a complete self-test from the remote interface, see Programming Guide for details.
– If the self-test is successful, "Self test passed" is displayed on the front panel.
– If the self-test fails, "
code and message and contact Keysight support if necessary.
– If the self-test is successful, this indicates a high chance that the waveform generator is operational.

Self-Test Error

The self test (see the *TST? command) performs a series of tests on the instrument hardware.
A failure can generate multiple error messages; the first one should be considered the primary cause of failure.
Some error messages include a failing channel number (1 or 2), shown as n in the messages below.
Error Code Error Messages
601 Self-test failed; real time clock settings lost
602 Self-test failed; main CPU power supply out of range
603 Self-test failed; main CPU error accessing boot env
604 Self-test failed; front panel processor ping failed
605 Self-test failed; waveform FPGA not programmed
606 Self-test failed; waveform FPGA revision check failed
607 Self-test failed; waveform FPGA read back error
608 Self-test failed; waveform FPGA security check failed
609 Self-test failed; waveform FPGA security check failed
610 Self-test failed; main PLL not locked
611 Self-test failed; FPGA PLL not locked
612 Self-test failed; Chan n, waveform memory PLL not locked
613 Self-test failed; Chan n, waveform memory not initialized
615 Self-test failed; modulation ADC offset too low (too high)
616 Self-test failed; modulation ADC reference too low (too high)
620 Self-test failed; Chan n, waveform memory test failed on idle
621 Self-test failed; Chan n, waveform memory test failed
625 Self-test failed; Chan n, waveform DAC gain[idx] too low (too high)
630 Self-test failed; Chan n, sub attenuator failure 0dB
10
" is displayed on the front panel. Press [System] > Help > Error View to record the error
Keysight EDU33210 Series Service Guide