operation.Impedancevoltageisusuallyexpressedinperunitorinpercentoftheratedvoltageofthewinding
across which the voltage is applied and measured
Dielectric Strength
The dielectric test of the transformer is intended to check the ability of main insulation to earth, inter turn and
line end insulation to earth. It is generally performed in two different steps, likewise, Separate applied voltage
withstand test (Hi-Pot) and induced voltage withstand test
8.2 Special/Design Tests
Insulation Power Factor (Tan δ)
The insulation power factor is the ratio of the power dissipated in the insulation in watts to the product of
The effective voltage and current in volt-amperes when tested under a sinusoidal voltage and prescribed
Conditions.
Insulation Resistance
Insulation resistance tests are made to determine the insulation resistance from individual windings to ground
or between individual windings. Insulation resistance tests are commonly measured in mega ohms or may be
calculated from measurements of applied voltage and leakage current.
Temperature Rise
Atemperature-rise test isdefined asa testto determinethetemperaturerise above ambientofoneormore
ofthetransformer'swindings,asmeasuredattheterminals.Theresultforagiventerminalpairorwindingis
the average value of the temperature of the entire circuit; it is not the temperature at any given point in a
specificwinding.Thetermaveragetemperaturerisereferstothevaluedeterminedbymeasurementsona
given terminal pair of the winding. It does not refer to the arithmetic average of results determined from
different terminal pairs of the transformer
Lightning Impulse
Lightning impulse tests shall consist of and be applied in the following order: one reduced full wave, two
chopped waves, and one full wave. The time interval between applications of the last chopped wave and the
final full wave should be minimized without intentional delays, to avoid recovery of dielectric strength if a
failure were to occur prior to the final full wave. Impulse tests shall be made without excitation.
Please refer to IEEE Standard C57.98-2011.
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