CCS Technical Documentation
Memory Troubleshooting
Most memory related errors are found through flashing the device, flashing the device is
therefore recommended before any of the steps described in this chapter. Check flashing
Troubleshooting section first.
There are however a few memory related errors that cannot be found through flashing.
•
SDRAM(D312) partially damaged. This can mean that the SDRAM component itself is partially
damaged and all the memory locations cannot be successfully read or there is a soldering prob-
lem somewhere either under UPP or SDRAM. There is a BB self test for testing SDRAM component
quite thoroughly, but the problem is that if SDRAM doesn't function properly one may not be able
to run those tests as SDRAM is used during the device boot and selftest cannot be run if the
device hasn't booted.
•
DEVICE may inform about being "out of memory " more often than it should
•
flash1 (D310) or flash 2 (D313) is partially/totally damaged. During flashing the manufacturer,
device and revision id's are read, but flashing is done based on id's of the flash0 (D311). This
means that one cannot see any error messages displayed on Phoenix window during flashing if
flash1 or flash 2 is failing. Id's are however displayed on the Phoenix window and successful read
of flash1 id's can be checked from there.
Issue 1 09/2003
Company Confidential
Copyright 2003 Nokia Corporation
Company Confidential
NEM-4
BB Troubleshooting
Page 6(a)-37