Thermal Alarm; Fault Isolation Methodology; Basic Steps - Seagate Exos AP 4U100 Installation And Maintenance Manual

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Thermal alarm

Symptom
1. Front panel Module Fault
LED is amber.

Fault isolation methodology

This section presents the basic methodology used to locate faults within a storage system, and to identify the pertinent
CRUs affected.

Basic steps

Gather fault information, which includes use of system LEDs.
Determine where in the system the fault is occurring.
Review logs from the operating system.
Review ddump output from both controllers:
The ddump CLI command is described in the GEM Command-line Interface document.
ddump can be captured via the following interfaces: serial, Telnet, WCLI/SES.
Invoke help ddump for additional information about capturing ddump output.
See also
"GEM Command-line interface (CLI)" (page
If required, isolate the fault to a data path component or configuration as described in
Gather fault information
When a fault occurs, it is important to gather as much information as possible. Doing so will help you determine the
correct action needed to rectify the fault.
Begin by reviewing the reported fault:
Is the fault related to an internal data path or an external data path?
Is the fault related to a hardware component such as a drive module, controller module, or power supply unit?
Cause
Internal temperature exceeds a
preset threshold for the
enclosure.
44).
Recommended action
1. Verify that the local ambient environment
temperature is within the acceptable range.
See Note on
page
113.
2. Check the installation for any airflow
restrictions at either the front or back of the
enclosure. A minimum gap of 25 mm (1") at
the front and 50 mm (2") at the rear is
recommended.
3. Check for restrictions due to dust build-up.
Clean as appropriate.
4. Check for excessive re-circulation of heated
air from rear to front. Use of the enclosure in
a fully enclosed rack is not recommended.
5. If possible, shut down the enclosure and
investigate the problem before continuing.
"Isolate the fault" (page
Fault isolation methodology
86).
85

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