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Anritsu MU181040A Operation Manual

Anritsu MU181040A Operation Manual

12.5 gbit/s ed, 14 gbit/s ed
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MU181040A
12.5 Gbit/s ED
MU181040B
14 Gbit/s ED
Operation Manual
23rd Edition
• For safety and warning information, please read this
manual before attempting to use the equipment.
• Additional safety and warning information is provided
in the MP1800A Signal Quality Analyzer Installation
Guide and the MT1810A 4 Slot Chassis Installation
Guide. Please also refer to one of these documents
before using the equipment.
• Keep this manual with the equipment.
ANRITSU CORPORATION
Document No.: M-W2753AE-23.0

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Summary of Contents for Anritsu MU181040A

  • Page 1 MU181040A 12.5 Gbit/s ED MU181040B 14 Gbit/s ED Operation Manual 23rd Edition • For safety and warning information, please read this manual before attempting to use the equipment. • Additional safety and warning information is provided in the MP1800A Signal Quality Analyzer Installation Guide and the MT1810A 4 Slot Chassis Installation Guide.
  • Page 2 Ensure that you clearly understand the meanings of the symbols BEFORE using the equipment. Some or all of the following symbols may be used on all Anritsu equipment. In addition, there may be other labels attached to products that are not shown in the diagrams in this manual.
  • Page 3 In addition, this warranty is valid only for the original equipment purchaser. It is not transferable if the equipment is resold. Anritsu Corporation shall assume no liability for damage or financial loss of the customer due to the use of or a failure to use this equipment, unless the damage or loss is caused due to Anritsu Corporation’s intentional or gross...
  • Page 4 Anritsu Corporation Contact In the event of this equipment malfunctions, please contact an Anritsu Service and Sales office. Contact information can be found on the last page of the printed version of this manual, and is available in a separate file on the...
  • Page 5 Notes On Export Management This product and its manuals may require an Export License/Approval by the Government of the product's country of origin for re-export from your country. Before re-exporting the product or manuals, please contact us to confirm whether they are export-controlled items or not. When you dispose of export-controlled items, the products/manuals need to be broken/shredded so as not to be unlawfully used for military purpose.
  • Page 6 Anritsu electronic equipment, etc.). By using this Software, you shall be deemed to have agreed to be bound by the terms of this EULA, and Anritsu Corporation (hereafter Anritsu) hereby grants you the right to use this Software with the Anritsu-specified equipment (hereafter Equipment) for the purposes set out in this EULA.
  • Page 7 Software with members of such organization. except as authorized by the laws and 2. You and Anritsu may terminate this EULA regulations of Japan and the United States, by a written notice to the other party 30 etc.
  • Page 8 MU181040B 14 Gbit/s ED 2. Applied Standards When the MU181040A 12.5 Gbit/s ED or MU181040B 14 Gbit/s ED is installed in the MP1800A or MT1810A, the applied directive and standards of this unit conform to those of the MP1800A or MT1810A main frame.

  • Page 9: About This Manual

    LAN interface. Module Operation Manual Operation manual for the module. Module Operation Manual varies depending on the module(s) used. MU181040A 12.5 Gbit/s ED MU181040B 14 Gbit/s ED Operation Manual Describes MU181040A/B configured as well as how to operate and maintain it.

  • Page 10: Table Of Contents

    Table of Contents About This Manual........Chapter 1 Overview ........Product Overview ............Product Composition ............. Specifications ..............Chapter 2 Preparation before Use .... Installation to Signal Quality Analyzer ......How to Operate Application .......... Preventing Damage ............Chapter 3 Panel Layout and Connectors . Panel Layout ..............
  • Page 11 Chapter 6 Measurement Example ..... Measuring Optical Transceiver Module (error rate measurement using PRBS pattern) ......Measuring 1:4 DEMUX (reception of 40 Gbit/s PRBS pattern using four MU181040A units) ......Burst Measurement ............ONU-OLT Uplink Test (Burst signal error rate measurement) ...............
  • Page 12 Chapter 8 Maintenance ......Daily Maintenance ............Cautions on Storage ............. Transportation ............... Calibration ..............Disposal ................ Chapter 9 Troubleshooting ....... Problems Discovered during Module Replacement ..Handling Suspected Failure .......... Appendix A Pseudo-Random Pattern ..Appendix B List of Initial Settings ..... Appendix C Setting Restrictions ....

  • Page 13: Chapter 1 Overview

    Chapter 1 Overview This chapter provides an overview of the MU181040A 12.5 Gbit/s ED and the MU181040B 14Gbit/s ED (hereinafter, referred to as “MU181040A”). However, this document only explains the MU181040A, unless there is a special item. Product Overview ............1-2 Product Composition ............

  • Page 14: Product Overview

    Chapter 1 Overview 1.1 Product Overview The MU181040A is a plug-in module that can be built into a Signal Quality Analyzer Series mainframe. It can measure a variety of patterns within the operating frequency range, including PRBS, Data, Zero-Substitution, Mixed, and Sequence patterns.

  • Page 15: Product Composition

    Product Composition 1.2 Product Composition 1.2.1 Standard composition Table 1.2.1-1 and Table 1.2.1-2 show the standard compositions of MU181040A/B. Table 1.2.1-1 Standard composition of MU181040A Item Model name Product name Q’ty Remarks Mainframe MU181040A 12.5 Gbit/s ED Z0897A MP1800A Manual CD...

  • Page 16: Options

    Chapter 1 Overview 1.2.2 Options Table 1.2.2-1 and Table 1.2.2-2 show the options for the MU181040A/B. Table 1.2.2-3 and Table 1.2.2-4 show the Accessories for options for the MU181040A/B. All options are sold separately. Table 1.2.2-1 Options for MU181040A Model name...
  • Page 17 Product Composition Table 1.2.2-3 Standard Accessories for MU181040A Options Model name/ Applicable Option Product name Q’ty Remarks symbol MU181040A-001 J1341A Open MU181040A-002 J1137 Terminator J1359A Coaxial adapter (compatible among K-P, K-J, SMA-) J1341A Open MU181040A-x20 J1137 Terminator Table 1.2.2-4 Standard Accessories for MU181040B Options...

  • Page 18: Application Parts

    Chapter 1 Overview 1.2.3 Application parts Table 1.2.3-1 and Table 1.2.3-2 shows the application parts for the MU181040A/B. All application parts are sold separately. Table 1.2.3-1 Application parts for MU181040A Model name/ Product name Remarks symbol J1360A Measurement kit Coaxial cable 0.8 m  2 Coaxial cable 1.0 m ...

  • Page 19: Specifications

    Specifications 1.3 Specifications 1.3.1 Specifications for MU181040A Table 1.3.1-1 Specifications for MU181040A Item Specifications Remarks Operating bit rate 9.8 to 12.5 Gbit/s When MU181040A Resolution 1 kbits step -001 is Clock source Recovered Clock installed Rated frequency selection 10 GFC over FEC, 10 GbE over FEC, OTU2, G975 FEC, 10 GFC, 10 GbE, and OC192/STM64 can be set.
  • Page 20 Chapter 1 Overview Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Mixed Number of blocks 1 to the smallest number among a to d, below, in 1-block steps a) 511 b) INT (128 Mbits  x/(Number of rows  Data Length’))
  • Page 21 Specifications Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Mixed Number of rows 1 to the smallest number among a to c, below, in (continued) 1-row steps a) 16 b) INT (128 Mbits  x/Data Length’) where Data Length’ is: - When Data Length is indivisible by (128 ...
  • Page 22 Chapter 1 Overview Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Gating Time, Clock Count, Error Count, and Block Count can be set. Time 1 second to 99 days 23 hours 59 minute 59 seconds Clock Count 1  10...
  • Page 23 Specifications Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Automatic ISI analysis Available. Number of blocks: 64 measurement In the case of 2 Ch Combination, the number of function blocks at the lowest layer is 128. In the case of 4 Ch Combination, the number of blocks at the lowest layer is 256.
  • Page 24 Chapter 1 Overview Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Data input Number of 2 (Data/XData Differential) When inputs MU181040A- 001 is Input signal installed format Input Condition Single-ended and Differential can be set. Data and XData can be set.
  • Page 25 Specifications Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Clock input Number of input 1 (Single-ended) (Continued) Input waveform Rectangular wave (<0.5 GHz), Duty: 50%, Rectangular or sine wave (0.5 GHz), Duty: 50% Input amplitude 0.25 to 2 Vp-p Termination 50 /GND, 50 /Variable...
  • Page 26 Chapter 1 Overview Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks AUX output Pattern Sync When PRBS, Position: 1 to {(Least common multiple of Data or Zero-sub Pattern Length* and 64) 79}, in 16-bit steps. is set The maximum settable number is 68 719 476 657.
  • Page 27 Specifications Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks AUX input Number of inputs Input signal In the case of Combination, input only to Master Module is enabled. Burst: External-Trigger (Data is enabled at rising edge detection) External-Enable (L: Data disabled, H: Data output)
  • Page 28 Remarks Clock Recovery Clock polarity POS and NEG can be set. (Cont’d) switching (when MU181040A-x30 is not installed) Maximum length of 72 bits successive 0 (Zero-Sub 15 stages, polarity: POS or NEG) Lock range 500 ppm (at 9.8 to 12.5 Gbit/s, 4.9 to 6.25 Gbit/s), 100 ppm (at 4.25 Gbit/s)
  • Page 29 Specifications Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Jitter Jitter tolerance mask When MU18104 0A-x30 is 4000 installed Slope：-20 dB/dec 0.22 0.001 FM Frequency ［Hz］ Fc [GHz] Fm1 [Hz] Fm2 [Hz] Fm3 [Hz] 6.4 < Fc  12.5 80 M 3.2 <...
  • Page 30 Chapter 1 Overview Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Jitter Jitter tolerance When (continued) MU18104 (80 MHz or 0A-x20 higher and x30 modulation) installed Jitter FM Frequency Fc [GHz] Amplitude [Hz] [Uip-p] (Max.) 250 M to 1 G 11.3 <...
  • Page 31 Specifications Table 1.3.1-1 Specifications for MU181040A (Cont’d) Item Specifications Remarks Size Dimension 234 mm(W)  21 mm(H)  175 mm(D) (with Compact-PCI 1 slot but excluding protrusions) Mass 2.5 kg max. (including options) Environmental Operation +5 to +40C (ambient temperature around...

  • Page 32: Specifications For Mu181040B

    Chapter 1 Overview 1.3.2 Specifications for MU181040B Table 1.3.2-1 Specifications for MU181040B Item Specifications Remarks Operating frequency range 0.1 to 14 GHz (When MU181040B-002 is installed) 0.1 to 14.05 GHz (When MU181040B-002 and 003 are installed.) 0.1 to 14.1 GHz (When MU181040B-002 and 005 are installed.) Clock source External clock and Recovered clock can be set.
  • Page 33 Specifications Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Mixed Number of blocks 1 to the smallest number among a to d, below, in 1-block steps a) 511 b) INT (128 Mbits  x/(Number of rows  Data Length’)) where Data Length’...
  • Page 34 Chapter 1 Overview Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Mixed Number of rows 1 to the smallest number among a to c, below, in (continue 1-row steps a) 16 b) INT (128 Mbits  x/Data Length’) where Data Length’ is: - When Data Length is indivisible by (128 ...
  • Page 35 Specifications Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Gating Time, Clock Count, Error Count, and Block Count can be set. Time 1 second to 99 days 23 hours 59 minute 59 seconds Clock Count 1  10 (n = 4 to 16) Error Count 1 ...
  • Page 36 Chapter 1 Overview Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Burst Source Internal, External-Enable, External-Trigger measurement Burst Cycle 25 600 to 2 147 483 648 bits (in 128-bit steps) function In the case of 2 Ch Combination: 51 200 to 4 294 967 296 bits, in 256-bit steps In the case of 4 Ch Combination: 102 400 to 8 589 934 592 bits, in 512-bit steps Enable Period...
  • Page 37 Specifications Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Data input Number of 2 (Data/ Data Differential) When inputs MU181040B- 002 is Input signal installed format Input condition Single-ended, Differential 50 , and Differential 100  can be set. Data and Data can be set.
  • Page 38 Chapter 1 Overview Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks AUX output Number of outputs Output Signal 1/N Clock, Pattern Sync, Sync Gain, Error Selection Output Output signal 1/N: N=8, 9, 10 … 510, 511 Pattern Sync When PRBS, Position: 1 to {(Least common multiple of Data or Zero-sub Pattern Length*...
  • Page 39 Specifications Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks AUX input Number of inputs Input signal In the case of Combination, input only to Master Module is enabled. Burst: External-Trigger (Data is enabled at rising edge detection) External-Enable (L: Data disabled, H: Data output) External Mask: (L: Measurement masked, H: Measurement) Capture External Trigger:...
  • Page 40 Chapter 1 Overview Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Clock Recovery Preset standards 10 GFC over FEC, 10 GbE over FEC, OTU2, (Cont’d) G975 FEC, 10 GFC, 10 GbE, OC192/STM64, SATA 6 Gbit/s, PCI Express II, 4 GFC, XAUI, SATA 3 Gbit/s, OTU1, PCI Express I, OC48/STM16, 2 GFC, SATA 1.5 Gbit/s, GbE, 1 GFC, OC12/STM4, OC3/STM1...
  • Page 41 Specifications Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Clock phase Phase variable range In the case of 2 or 4 Ch Combination: When variable MU18104 –1000 to +1000 mUI, in 1-mUI step 0B-x30 is In the case of Channel Synchronization: installed –64 000 to +64 000 mUI, in 1-mUI steps Phase setting error...
  • Page 42 Chapter 1 Overview Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Jitter Jitter tolerance mask When MU18104 0B-x30 is 4000 installed Slope：-20 dB/dec 0.22 0.001 FM Frequency ［Hz］ Fc ［GHz］ Fm1 ［Hz］ Fm2 ［Hz］ Fm3 ［Hz］ 6.4 < Fc  14* 80 M 3.2 <...
  • Page 43  Measurement pattern: PRBS 2  1  Use Recovered Clock at the clock recovery operation frequency (except 4.25 GHz) of the MU181040A (with Option x20 installed) (At other frequencies, use External input clock to assure the above performance).  Ambient temperature: 25 5C...
  • Page 44 Chapter 1 Overview Table 1.3.2-1 Specifications for MU181040B (Cont’d) Item Specifications Remarks Size Dimension 234 mm(W)  21 mm(H)  175 mm(D) (with Compact-PCI 1 slot but excluding protrusions) Mass 2.5 kg max. (including options) Environmental Operation +15 to +35C (ambient temperature around performance temperature equipment when installed in the mainframe)

  • Page 45: Chapter 2 Preparation Before Use

    Chapter 2 Preparation before Use This chapter describes preparations required before using the MU181040A. Installation to Signal Quality Analyzer ......2-2 How to Operate Application .......... 2-2 Preventing Damage ............2-3...

  • Page 46: Installation To Signal Quality Analyzer

    Chapter 2 Preparation before Use 2.1 Installation to Signal Quality Analyzer For information on how to install the MU181040A to the Signal Quality Analyzer and how to turn on the power, refer to Chapter 2 “Preparation before Use” in the Signal Quality Analyzer Series Installation Guide.

  • Page 47: Preventing Damage

    Preventing Damage 2.3 Preventing Damage Be sure to observe the rating ranges when connecting input and output of the MU181040A. Otherwise, the MU181040A may be damaged. CAUTION When signals are input to the MU181040A, avoid • excessive voltage beyond the rating. Otherwise, the circuit may be damaged.
  • Page 48 Chapter 2 Preparation before Use 2-4.

  • Page 49: Chapter 3 Panel Layout And Connectors

    Chapter 3 Panel Layout and Connectors This chapter describes the panel and connectors of the MU181040A. Panel Layout ..............3-2 Inter-Module Connection ..........3-3...

  • Page 50: Panel Layout

    Data Monitor and The Data and XData input signals are branched within the XData Monitor Output MU181040A, and then output from these connectors, connectors respectively. Equipped for MU181040A-002. Clock Input connector Inputs clock signals. Equipped when MU181040A-002 is installed.

  • Page 51: Inter-Module Connection

    Clock Input connector of the MU181020A, using a coaxial cable. Connect the Data Output connector of the MU181020A and the Data Input connector of the MU181040A, using a coaxial cable. Also connect the XData Output connector of the MU181020A and the XData Input connector of the MU181040A, using a coaxial cable.
  • Page 52 Chapter 3 Panel Layout and Connectors CAUTION • When signals are input to this device, avoid excessive voltage beyond the rating. Otherwise, the circuit may be damaged. • As a countermeasure against static electricity, ground other devices to be connected (including experimental circuits) with ground wires before connecting the I/O connector.

  • Page 53: Chapter 4 Configuration Of Setup Dialog Box

    Chapter 4 Configuration of Setup Dialog Box This chapter describes the configuration of the MU181040A setup dialog box. Configuration of Entire Setup Dialog Box ..... 4-2 Operation Tab Windows ..........4-3...

  • Page 54: Configuration Of Entire Setup Dialog Box

    Chapter 4 Configuration of Setup Dialog Box 4.1 Configuration of Entire Setup Dialog Box The configuration of the setup dialog box when the MU181040A is inserted into a mainframe is shown below. Figure 4.1-1 Configuration of entire setup dialog box for MU181040A The setup dialog box mainly consists of four blocks ([1] to [4] in the figure above).

  • Page 55: Operation Tab Windows

    Operation Tab Windows 4.2 Operation Tab Windows The MU181040A operation tab windows are listed below. See Chapter 5 “Operation Method” for details on each operation tab window. Figure 4.2-1 Function setting selection tabs Table 4.2-1 List of function setting selection tabs...
  • Page 56 Chapter 4 Configuration of Setup Dialog Box 4-4.

  • Page 57: Chapter 5 Operation Method

    Chapter 5 Operation Method This chapter describes the functions provided in the tab windows on the module operation window of the MU181040A. Displaying Measurement Result ........5-3 5.1.1 Setting items when Gating is selected ..... 5-5 5.1.2 Setting items when Auto Sync is selected ..5-8 5.1.3 Setting items when Sync Control is selected .
  • Page 58 Chapter 5 Operation Method 5.6.3 Setting AUX Input ......... 5-111 5.6.4 Measurement Restart area ......5-112 Executing Auto Search ..........5-113 5.7.1 Input setting items in Auto Search dialog box ..............5-113 Executing Auto Adjust ..........5-116 5.8.1 Input setting items in Auto Adjust dialog box 5-116 ISI Measurement Function ........

  • Page 59: Displaying Measurement Result

    The Result tab window consists of the item setting area (upper) and the result display area (lower). Measurement results can be viewed while changing the setting items of the MU181040A. Item setting area Result display area Figure 5.1-1 Result tab window The setting items change according to the item selected in the list box (“1”...
  • Page 60 Chapter 5 Operation Method Table 5.1-1 Setting items in list box in item setting area Item Description Input Select to configure the settings related to the input signal interface. Gating Select to configure the settings related to the measurement period. Condition Select to configure the settings related to the measurement conditions.

  • Page 61: Setting Items When Gating Is Selected

    Displaying Measurement Result 5.1.1 Setting items when Gating is selected This section describes the setting items when Gating is selected from the list box in the item setting area (“1” in Figure 5.1-1). Figure 5.1.1-1 Items when Gating is selected [1] Select the unit of the measurement period from the Unit list box, and set the measurement period in the upper-right textbox.
  • Page 62 Chapter 5 Operation Method Measurement ends. 1 second Measurement starts. The specified number is reached. Figure 5.1.1-2 Measurement end timing [2] Select the measurement operation from the Cycle list box. Table 5.1.1-2 Measurement operation setting Cycle Description Repeat Specified-period measurement is performed repeatedly. Single Measurement ends when it is performed once for the specified period.
  • Page 63 Displaying Measurement Result Table 5.1.1-3 Measurement progress display setting Current Description The accumulated measurement result, up to the current time, is displayed in the specified interval (cycle time). Select 100 (ms) or 200 (ms) from the Interval list box for the cycle time. Select “Progressive”...

  • Page 64: Setting Items When Auto Sync Is Selected

    Chapter 5 Operation Method 5.1.2 Setting items when Auto Sync is selected This section describes the setting items when Auto Sync is selected from the list box in the item setting area (“1” in Figure 5.1-1). Figure 5.1.2-1 Items when Auto Sync is selected [1] Specify whether to start resynchronization automatically when the synchronization threshold is exceeded from Sync Gain to Sync Loss.
  • Page 65 Displaying Measurement Result Table 5.1.2-2 Synchronization thresholds when INT is set Error Count Threshold error rate = Sync Clock Count Test Pattern Data Length Control Sync Gain → Sync Loss Sync Loss → Sync Gain − PRBS, and − 1 (n = 7, (256) (256) ×...
  • Page 66 Chapter 5 Operation Method Table 5.1.2-2 Synchronization thresholds when INT is set (Cont’d) Error Count Threshold error rate = Sync Clock Count Test Pattern Data Length Control Sync Gain → Sync Loss Sync Loss → Sync Gain Frame Zero-Substit 160,001 to (256) ×...
  • Page 67 Displaying Measurement Result Table 5.1.2-2 Synchronization thresholds when INT is set (Cont’d) Error Count Threshold error rate = Sync Clock Count Test Pattern Data Length Control Sync Gain → Sync Loss Sync Loss → Sync Gain Frame Zero-Substit 16,777,217 to (256) (256) ×...
  • Page 68 Chapter 5 Operation Method Table 5.1.2-2 Synchronization thresholds when INT is set (Cont’d) Error Count Threshold error rate = Sync Clock Count Test Pattern Data Length Control Sync Gain → Sync Loss Sync Gain → Sync Loss Frame ON, Mixed Data 102,401 to (256) (256)
  • Page 69 Displaying Measurement Result Table 5.1.2-2 Synchronization thresholds when INT is set (Cont’d) Error Count Threshold error rate = Sync Clock Count Test Pattern Data Length Control Sync Gain → Sync Loss Sync Gain → Sync Loss Frame ON, Mixed Data 4,194,305 to (256) (256)
  • Page 70 Chapter 5 Operation Method Table 5.1.2-3 Synchronization thresholds when one of E-2 to E-8 is set Error Count Threshold error rate = Clock Count Sync Control Sync Gain → Sync Loss Sync Loss → Sync Gain (256) 2,000 × (256) (4,096) ×...

  • Page 71: Setting Items When Sync Control Is Selected

    Displaying Measurement Result 5.1.3 Setting items when Sync Control is selected This section describes the setting items when Sync Control is selected from the list box in the item setting area (“1” in Figure 5.1-1). Figure 5.1.3-1 Items when Sync Control is selected [1] Select the test pattern synchronization method.
  • Page 72 Chapter 5 Operation Method Table 5.1.3-2 Synchronization method setting Description Test Pattern Frame ON/OFF* Quick Fast PRBS Not available Not available Not available Zero-Substitution Available Available Not available Data Available Available Not available Mixed Available Not available Not available Sequence Not available Not available Available...
  • Page 73 Displaying Measurement Result Note: When Frame ON is set, synchronization may take a long time if there is another pattern that is the same as the set frame pattern. The frame pattern is therefore recommended to be specific. 5-17...

  • Page 74: Setting Items When Condition Is Selected

    Chapter 5 Operation Method 5.1.4 Setting items when Condition is selected This section describes the setting items when Condition is selected from the list box in the item setting area (“1” in Figure 5.1-1). Figure 5.1.4-1 Items when Condition is selected [1] Select the error detection method from the Error Detection list box.
  • Page 75 Displaying Measurement Result (a) Input pattern (b) Internally-generated pattern (c) Total error (d) Insertion error (e) Omission error Figure 5.1.4-2 Error detection (Total, Insertion, and Omission errors) (a) Input pattern (b) Internally-generated pattern (c) Total error (d) Transition error (e) Non Transition error Figure 5.1.4-3 Error detection (Total, Transition, and Non Transition errors) 5-19...
  • Page 76 Chapter 5 Operation Method [2] Select the interval for error interval and error free interval measurements from the EI/EFI Interval list box. Table 5.1.4-2 Interval time setting EI-EFI Interval Description 1 ms Sets the interval to 1 ms. The interval counter value indicates the number of intervals.

  • Page 77: Setting Items When Input Is Selected

    [1], [2] Set the threshold voltage for Data input and XData input. The Data signal is input from the Data Input connector of the MU181040A, and the XData signal is input from the Data Input connector. Hereinafter, the settings for the Data Input connector are described as the settings for XData.
  • Page 78 Chapter 5 Operation Method [3] Set the difference between the threshold voltages for Data and XData inputs. This item is enabled when “Differential 50 Ohm” or “Differential 100 Ohm” is selected and “Alternate” is selected in the Input tab window. Figure 5.1.5-2 Input voltage threshold difference setting items Select “Data - XData”...
  • Page 79 If calibration is not performed at this time, the error in the phase setting may be greater than at a normal phase setting. Values displayed in ps units vary as the frequency changes, • because the MU181040A sets phases in mUI units as an internal standard. 5-23...

  • Page 80: Setting Items When Error/Alarm Is Selected

    Chapter 5 Operation Method 5.1.6 Setting items when Error/Alarm is selected This section describes the items displayed when Error/Alarm is selected from the list box in the result display area (“2” in Figure 5.1-1). Figure 5.1.6-1 Items when Error/Alarm is selected [1] Select the measurement time display type.
  • Page 81 Displaying Measurement Result [3] Enable or disable enlarged display of Error/Alarm measurement result. Zoom: Click to enlarge the display of the error count, error rate, error interval count, Clock Loss interval count, Sync Loss interval count, Clock Loss occurrence state, Sync Loss occurrence state, and error occurrence state.
  • Page 82 Chapter 5 Operation Method Table 5.1.6-1 Items (controls) when Zoom is not selected Item Function Total Displays the total error rate. Displays the insertion error rate. Displays the omission error rate. Transition Displays the transition bit error rate. Non Transition Displays the non-transition bit error rate.
  • Page 83 Displaying Measurement Result When the enlarged display is enabled (Zoom is selected), the items shown in Table 5.1.6-2 are displayed in the result display area with Error/Alarm selected. Figure 5.1.6-3 Items when Zoom is selected Table 5.1.6-2 Items (controls) when Zoom is selected Item Function Displays the error rate.
  • Page 84 Chapter 5 Operation Method [4] Showing/hiding Error/Alarm measurement result sub-window Click to show/hide the measurement result sub-window (Result Sub Display window). The Result Sub Display window contains the items shown in Table 5.1.6-3. Figure 5.1.6-4 Result Sub Display window Table 5.1.6-3 Items in Result Sub Display window Item Function Threshold EI %EFI...
  • Page 85 Displaying Measurement Result Table 5.1.6-3 Items in Result Sub Display window (Cont’d) Item Function %EFS Displays the threshold EI/%EFI and error performance measurement results. %SES 5-29...

  • Page 86: Setting Items When Logging Is Selected

    Chapter 5 Operation Method 5.1.7 Setting items when Logging is selected This section describes the setting items when Logging is selected from the list box in the result display area (“2” in Figure 5.1-1). With the logging function, the intermediate data for the items set in the Logging setup dialog box can be displayed.
  • Page 87 Displaying Measurement Result Figure 5.1.7-2 Log Condition setup dialog box 5-31...
  • Page 88 Data Threshold Adds the data input threshold to the logging item. Clock Phase Adds the clock phase set value to the logging item. This can be selected only when Variable Clock Delay (MU181040A-x30, MU181040B-x30) is installed. Finalize the selection. Cancel Cancels the selection.
  • Page 89 Displaying Measurement Result Use the following procedure to save the logging results. Select “Save” from the File menu. Select MU181040A for Module. Select Error/Alarm Logging for Data Type. Specify the file name and save destination, and then click [OK]. 5-33...

  • Page 90: Setting Items And Displayed Items When Histogram Is Selected

    Chapter 5 Operation Method 5.1.8 Setting items and displayed items when histogram is selected This section describes the setting items and items displayed when Histogram is selected from the list box in the result display area (“2” in Figure 5.1-1). The error count, error rate, and error interval count are displayed as a histogram.
  • Page 91 Displaying Measurement Result [4] Select the measurement item to be added to the histogram. Table 5.1.8-2 Histogram measurement items Item Description Error Count Select to calculate the error count and add it to the histogram. Error Rate Select to calculate the error rate and add it to the histogram. Select to calculate the error interval count and add it to the histogram.
  • Page 92 (see “[4]” above). Use the following procedure to save the histogram results. Select “Save” from the File menu. Select MU181040A for Module. Select Histogram Result for Data Type. Select the file saving format from Text or CSV.

  • Page 93: When Setting Jitter-Modulated Signals

    Modulation of the MU181000A/B to ON. • When executing Calibration of Delay, set jitter modulation of input signal to non-modulation. • When using the MU181040A-x20 or MU181040B-x40 Clock Recovery, use the following procedure for measurement. Set the jitter modulation for input signals to OFF or set the modulation amount to 0 mUI.

  • Page 94: Setting Measurement Conditions

    Chapter 5 Operation Method 5.2 Setting Measurement Conditions The measurement conditions can be set in the Measurement tab window. The Measurement tab window consists of four setting and displaying areas. Figure 5.2-1 and Table 5.2-1 show the configuration of the Measurement tab window.

  • Page 95: Gating Area

    Setting Measurement Conditions 5.2.1 Gating area The setting operations in the Gating area are the same as those in the setting item area of the Result tab window when Gating is selected. See Section 5.1.1 “Setting items when Gating is selected” for details. Figure 5.2.1-1 Measurement period setting items in Gating area 5.2.2 Auto Sync area The setting operations in the Auto Sync area are the same as those in the...

  • Page 96: Sync Control Area

    Chapter 5 Operation Method 5.2.3 Sync Control area In the Sync Control area, the setting operations for the test pattern synchronization method, frame length, and start position of the pattern for frame detection are the same as those in the setting item area of the Result tab window when Sync Control is selected.

  • Page 97: Error/Alarm Condition Area

    Setting Measurement Conditions 5.2.4 Error/Alarm Condition area In the Error/Alarm Condition area, the setting operations for the error detection method, error interval, and error free interval are the same as those in the setting item area of the Result tab window when Condition is selected.
  • Page 98 Chapter 5 Operation Method The display and setting vary depending on the clock (Clock Recovery or External Clock) selected in the Clock area on the Input tab window. [5] Select whether to include intervals where Sync Loss occurs to the Performance calculation target.

  • Page 99: Setting Test Patterns

    Setting Test Patterns 5.3 Setting Test Patterns Click the [Pattern] tab on the operation tab window to display the Pattern tab window. A test pattern can be selected and the settings for the test pattern can be configured in this tab window. The Pattern tab window consists of two item setting and displaying areas.

  • Page 100: Test Pattern Type

    Chapter 5 Operation Method 5.3.1 Test Pattern type The following five test patterns can be selected. • PRBS • Zero-Substitution • Data • Mixed • Sequence Figure 5.3.1-1 Selecting test pattern How to set each test pattern is described in the subsequent sections. 5-44...

  • Page 101: Setting Prbs Pattern

    Setting Test Patterns 5.3.2 Setting PRBS pattern This section describes how to set the parameters for a PRBS pattern. Figure 5.3.2-1 Items for setting PRBS pattern [1] Select PRBS from the Test Pattern list box list box. [2] Set the number of the PRBS pattern stages. Set the PRBS pattern length in the format of 2 −...
  • Page 102 [b] Clear All: All 32 routes of the Bit Window Data are unmasked when this button is clicked. [c] The MU181040A has internal 32 error counters. Select the corresponding checkbox for the route to be masked. Note: See Section 5.3.7 “Mask selection”...

  • Page 103: Setting Zero-Substitution Pattern

    Setting Test Patterns 5.3.3 Setting Zero-Substitution pattern This section describes how to set the parameters for a Zero-Substitution pattern. Figure 5.3.3-1 Setting items for Zero-Substitution pattern [1] Select “ZeroSubstitution” from the Test Pattern list box. Test pattern loading starts and the “Loading…” LED lights. [2] Set the configuration (number of stages) of the zero-insertion pattern signal.
  • Page 104 Chapter 5 Operation Method [5] Set the final bit of the zero-insertion pattern. Note that this setting is invalid when Length is set to 2 − 1. Table 5.3.3-2 Setting of last bit of zero-insertion pattern Setting Description The 2 th bit is set to “1”...

  • Page 105: Setting Data Pattern

    Setting Test Patterns 5.3.4 Setting Data pattern This section describes how to set the parameters for a Data pattern. Figure 5.3.4-1 Setting items for Data pattern [1] Select “Data” from the Test Pattern list box. Test pattern loading starts and the “Loading…” LED lights. [2] Set the logic of the test pattern.

  • Page 106: Setting Mixed Pattern

    Chapter 5 Operation Method 5.3.5 Setting Mixed pattern When “Mixed” is selected, a block consisting of programmable test patterns and PRBS patterns can be set. [10] Block configuration display area [12] [11] [13] Figure 5.3.5-1 Setting items for Mixed pattern [1] Select “Mixed”...
  • Page 107 Setting Test Patterns [6] Set the logic of the test pattern. Table 5.3.5-1 Test pattern logic setting Setting Description POS (positive logic) The high level of a signal is defined as “1”. NEG (negative logic) The high level of a signal is defined as “0”. [7] Set the number of the PRBS pattern stages.
  • Page 108 Chapter 5 Operation Method [11] Set Descramble ON/OFF. When Descramble is set to ON, descramble is executed for the part that is set to be PRBS7-scrambled, according to the settings in the Descramble Setup dialog box (see [12] below). When [Descramble] is clicked while the LED on the button is off, the LED lights and the scramble setting for the specified reception signals is cancelled (descramble).
  • Page 109 Setting Test Patterns [13] Set the PRBS signal generation method. Set the continuity of the PRBS pattern strings in a Mixed pattern. Table 5.3.5-2 PRBS signal generation method setting Setting Description Restart The end of the PRBS of the specified last block and the start of the PRBS of the next subsequent block are not continuous.

  • Page 110: Setting Sequence Pattern

    MU181020B (hereinafter, MU181020A/B) and this equipment as a pair for measurement when receiving and transmitting signals using this test pattern. The MU181020A/B and MU181040A to be paired can be selected from the Pair ED list box in the Pattern tab window for sequence test pattern on the MU181020A/B operation tab window.
  • Page 111 Set the same test pattern data for each block and the same • number of registered blocks for both the MU181020A/B and the MU181040A. Otherwise, measurement may not be performed correctly. The pattern length of each block has to be shorter than the •...
  • Page 112 Chapter 5 Operation Method 5.3.6.1 Setting sequence pattern conditions Clicking [Condition] on the right of “Sequence Pattern” in the Pattern tab window for sequence pattern opens the Sequence Pattern Setting dialog box. Sequence pattern setting display area Figure 5.3.6.1-1 Sequence Pattern Setting dialog box [1] Buttons used to set the blocks.
  • Page 113 Setting Test Patterns [2] Sequence pattern setting display area containing the block number and pattern length. [3] Sets the test pattern for the block selected in the sequence pattern setting display area. Refer to Section 5.3.8 “Editing test pattern in Pattern Editor dialog box”...
  • Page 114 Chapter 5 Operation Method 5.3.6.2 Setting match pattern conditions Clicking [Condition] on the right of “Match Pattern” in the Pattern tab window for sequence pattern opens the Match Pattern Condition dialog box. Figure 5.3.6.2-1 Match Pattern Condition dialog box [1] Displays the block number for Match Pattern setting. [2] Select whether to use pattern A or pattern B as the match pattern.

  • Page 115: Mask Selection

    Setting Test Patterns 5.3.7 Mask selection This section describes the controls in the mask area, which are used to mask a route and bit for the test pattern. The mask positions can be set in the Pattern Editor dialog box. Figure 5.3.7-1 Controls in Mask area Enables (ON) or disables (OFF) the Block Window function.
  • Page 116 Chapter 5 Operation Method [2] Enables (ON) or disables (OFF) the Bit Window function. While test pattern measurement is usually performed using 32 error counters, the Bit Window function can mask measurement of the specified counter (route). The following figure shows an example where the test pattern is a 32-bit length Data pattern and the error counters 2 and 4 are masked.

  • Page 117: Editing Test Pattern In Pattern Editor Dialog Box

    Setting Test Patterns 5.3.8 Editing test pattern in Pattern Editor dialog box Editing of test patterns with the following patterns selected in the Pattern tab window is described below. (1) Zero-Substitution (2) Data (3) Mixed (4) Sequence 5.3.8.1 Common setting items The Pattern Editor dialog box is displayed when [Edit] or [Pattern Edit] (in the case of Sequence pattern) is clicked.
  • Page 118 Chapter 5 Operation Method [1] Menu items on menu bar Table 5.3.8.1-1 Menu bar configuration Menu Menu item Description File Open Opens a setting file saved in the binary pattern (Binary Pattern), binary text pattern (BIN Text Pattern), or hexadecimal text pattern (HEX Text Pattern) format.
  • Page 119 Setting Test Patterns Table 5.3.8.1-1 Menu bar configuration (Cont’d) Menu Menu item Description Edit Line Specifies the number of characters per line in the Pattern View area. This is enabled when the pattern setting item Display is (continued) set to “Table”. [2] Pattern setting items Table 5.3.8.1-2 Pattern setting items Setting item...
  • Page 120 Chapter 5 Operation Method Table 5.3.8.1-2 Pattern setting items (Cont’d) Setting item Description Fill Edits the pattern part highlighted by the cursor. The highlighted part in the Pattern View area is set to “0”. The highlighted part in the Pattern View area is set to “1”. Reverse: The highlighted part in the Pattern View area is logically inverted.
  • Page 121 Setting Test Patterns Figure 5.3.8.1-2 Input Range setup dialog box Figure 5.3.8.1-3 Input Pattern setup dialog box [3] Pattern View area The edited pattern is displayed in this area. Double-click a bit value on the pattern to edit it. Note, however, that the pattern cannot be edited by a mouse operation when Display is set to Table and Format is set to Hex.
  • Page 122 Chapter 5 Operation Method 5.3.8.2 Editing Zero-Substitution pattern When [Edit] is clicked while Zero Substitution is selected for the test pattern, the Pattern Editor dialog box shown in Figure 5.3.8.2-1 is displayed. Note, however, that only Block Window and Bit Window can be edited, and Data Length and other settings cannot be configured.
  • Page 123 Setting Test Patterns 5.3.8.3 Editing Data pattern When [Edit] is clicked while Data is selected for the test pattern, the Pattern Editor dialog box shown in Figure 5.3.8.3-1 is displayed. Figure 5.3.8.3-1 Pattern Editor dialog box for Data pattern [1] Pattern setting item Table 5.3.8.3-1 Pattern setting items (when Data is selected) Setting item Description...
  • Page 124 Chapter 5 Operation Method 5.3.8.4 Editing Mixed pattern When [Edit] is clicked while Mixed is selected for the test pattern, the Pattern Editor dialog box shown in Figure 5.3.8.4-1 is displayed. Figure 5.3.8.4-1 Pattern Editor dialog box for mixed pattern [1] Pattern setting items Table 5.3.8.4-1 Pattern setting items (when Mixed is selected) Setting item...
  • Page 125 Setting Test Patterns Note: The number of blocks and the number of rows are restricted as follows. Number of blocks 1 to the smallest number among a to d, below, in 1-block steps a) 511 b) INT (128 Mbits × x/(Number of rows × Data Length’)) where Data Length’...
  • Page 126 Chapter 5 Operation Method where Data Length’ is: - When Data Length is indivisible by (128 × x) =(INT(Data Length/(128 × x))+1) × 128 × x - When Data Length is divisible by (128 × x) =Data Length The maximum number of rows fulfilling the following formula applies: Data Length’...
  • Page 127 Data Length Set the length of the Sequence pattern. The setting unit is one bit. The MU181040A can be set from 8,192 to 1,048,576 bits in 128-bit steps. The MU181040B can be set from 16,384 to 1,048,576 bits in 128-bit steps.
  • Page 128 Chapter 5 Operation Method 5.3.8.6 Creating and editing test pattern How to create and edit a test pattern in the Pattern Editor dialog box is described below. Display setting area Figure 5.3.8.6-1 Display list box Select the Pattern View area display format from the Display list box.
  • Page 129 Setting Test Patterns For how to edit a test pattern in the Pattern Editor dialog box, see the corresponding section according to the display mode, as follows: When Time is selected: See Section 5.3.8.7 “Editing in Time display mode.” When Table is selected: See Section 5.3.8.8 “Editing in Table display mode.”...
  • Page 130 Chapter 5 Operation Method 5.3.8.7 Editing in Time display mode How to create and edit a test pattern in the Time display mode is described below. Cursor Marker Figure 5.3.8.7-1 Editing in Time display mode [1] Select the display format from the Format list box in the Pattern Editor dialog box.
  • Page 131 Setting Test Patterns [2] The address of the cursor is displayed in. [3] Set marker display ON/OFF. The marker is displayed when the [Marker] is clicked and displayed as “ON”. The marker is not displayed when the button is clicked and displayed as “OFF”. The address of the marker and the distance between the cursor and marker are displayed in “Marker Addr”...
  • Page 132 Chapter 5 Operation Method 5.3.8.8 Editing in Table display mode How to create and edit a test pattern in the Table display mode is described below. Figure 5.3.8.8-1 Editing in Table display mode [1] Select the display format from the Format list box in the Pattern Editor dialog box.
  • Page 133 Setting Test Patterns [2] The amount of data to be displayed in one line can be changed. Select “Line” from the Edit menu to open the Line dialog box. Enter the number of bytes per line in the textbox, and then click [OK].
  • Page 134 Chapter 5 Operation Method 5.3.8.9 Editing area In the Pattern Editor dialog box, batch editing is possible for an area by selecting it consisting of multiple bits. In this area, perform replace input using the Fill group box, or use Cut, Copy, and Paste editing commands.
  • Page 135 Setting Test Patterns  How to specify the selection area using the [Direct] is as follows. Click [Direct]. The [Direct] is depressed and the Direct mode is entered. Note that pattern input and editing cannot be performed in the Direct mode. Specify the start position of the selection area by double-clicking the desired position or by moving the cursor to that position and pressing the [Enter] key.
  • Page 136 5.3.8.11 Compatibility with test pattern files of existing models Pattern files (.PTN) created for the following existing models can be loaded into the Pattern Editor dialog box of the MU181040A. • MP1632C Digital Data Analyzer • MP1761A/B/C Pulse Pattern Generator •...

  • Page 137: Setting Input Interface

    Click the [Input] tab on the operation tab window to set the input interface. The displayed items and setting items on the Input tab window vary depending on the option installed in the MU181040A. Go to the corresponding section according to the option installed as follows: •...
  • Page 138 Chapter 5 Operation Method Set the data input conditions. • When Differential 50 Ohm is selected: The differential input setting window is displayed. • When Single-Ended is selected: The single-end input setting window is displayed. Enabled when “Alternate” is selected Figure 5.4.1-2 Setting Data input conditions Table 5.4.1-1 Data input condition setting items Data input condition setting items...
  • Page 139 Variable Sets the operating bit rate for the clock recovery block in the MU181040A. The setting range is from 9.8 to 12.5 Gbit/s, in 1 kbit/s steps. Set a value close to the desired bit rate. 10 G FC over Presets the operating bit rate to 11.316800Gbit/s.

  • Page 140: Input Setting Items (When Mu181040A-002 And Mu181040B-002 Are Installed)

    The Input tab window consists of two areas: a Data setting area (upper) and a Clock setting area (lower). Data setting area Clock setting area Figure 5.4.2-1 Input tab window (MU181040A-002 + MU181040A-x20 + MU181040A-x30) Set the data input condition. Differential input setting window (Termination: 50 Ω) Differential input setting window (Termination: 100 Ω)
  • Page 141 Setting Input Interface Table 5.4.2-1 Data input condition setting items Data input condition setting items Description Independent Uses Data, XData as the differential input. The Data threshold and XData threshold can be changed independently Tracking Uses Data, XData as the differential input. Differential The Data threshold and XData threshold can be 100 Ohm...
  • Page 142 − 2.5 to +3.5 V. The voltage can be set in 10 mV steps. Notes: Do not allow an excessively large current to flow to the • terminator in the MU181040A. Otherwise, performance may become degraded or failure may occur. If a differential signal is input via the Data or XData connector •...
  • Page 143 Setting Input Interface Select whether to use an external input clock or a recovery clock. Note that only External Clock can be selected when the MU181040A-x20 and MU181040B-x20 Clock Recovery is not installed. When Recovered Clock is selected (with When External Clock is selected...
  • Page 144 Variable Sets the operating bit rate for the clock recovery block in the MU181040A. The settable bit rates are as follows. 0.100000 Gbit/s, 0.125000 Gbit/s, 0.140600 Gbit/s, 0.155520 Gbit/s, 0.156300 Gbit/s, 0.171900 Gbit/s, 0.187500 Gbit/s, 0.200000 Gbit/s, 0.250000 Gbit/s, 0.281300 Gbit/s, 0.312500 Gbit/s, 0.343800 Gbit/s, 0.375000 Gbit/s, 0.400000 Gbit/s, 0.500000 Gbit/s, 0.562500 Gbit/s,...
  • Page 145 OC-12/STM4 becomes available. OC-3/STM1 Presets the operating bit rate to 0.155520 Gbit/s. OC-3/STM1 becomes available. Notes: The MU181040A-x20 and MU181040B-x20 Clock Recovery • must be installed. • Be sure to observe the range in which locking is possible when selecting the operating bit rate.
  • Page 146 Figure 5.4.2-4 Clock delay setting items [1] Click this radio button to set the clock delay in 1 mUI units. The MU181040A operates based on the UI units. Setting a greater value increases the clock delay. [2] Click this radio button to set the clock delay 2 PS units. The frequency counter value is converted into PS units, based on the UI units.
  • Page 147 Values displayed in ps units vary as the frequency changes, • because the MU181040A sets phases in mUI units as an internal standard. When Burst is selected for Pattern Sequence in the Misc tab •...

  • Page 148: Capturing Test Patterns

    Chapter 5 Operation Method 5.5 Capturing Test Patterns Click the Pattern tab on the MU181040A module operation window to display the Pattern tab window. In the Pattern tab window, the input test pattern data can be captured into the MU181040A.
  • Page 149 Click to start capturing of a test pattern. The LED on the Capture button lights in green during test pattern capturing. The MU181040A enters and stays in the standby state until the trigger conditions match. When the trigger conditions match and the test pattern has been captured into the internal memory, the capturing operation is stopped and the LED on the Capture button turns off.
  • Page 150 [1] Select the number of blocks of the test pattern to be captured into the MU181040A, from 1, 2, 4, 8, 16, 32, 64, or 128. The size of each block to be captured can be calculated from the following expression: Block size = 128 Mbits ÷...
  • Page 151 When setting a match pattern while the 2Ch Combination is configured, set it in 2-bit units, as displayed in the Pattern Editor dialog box of the MU181040A in hexadecimal. Match patterns that cross the delimiter of 2-bit units, in hexadecimal, are invalid, which causes capturing not to start.
  • Page 152 Description Acquisition Click to open the Capture View dialog box to acquire the results of capturing a test pattern into the MU181040A. The captured results can be viewed in three display formats: Bit Pattern, Bitmap, and Block. When [Acquisition] is clicked and the test pattern capture results are acquired, the Bit Pattern, Bitmap, and Block buttons on the right become enabled and the display format can be switched.
  • Page 153 Capturing Test Patterns [6] Clicking [OK] starts acquisition of the captured data for the blocks specified by the parameters [1] through [4]. The acquisition time depends on the number of blocks selected from the Number of Block list box in the Condition Setting dialog box. See the table below. Table 5.5.1-6 Capture data acquisition time Selection in Number Acquisition Time for...

  • Page 154: Displaying Captured Test Pattern (Bit Pattern)

    Chapter 5 Operation Method 5.5.2 Displaying captured test pattern (Bit Pattern) After the captured data is acquired by clicking [Acquisition], clicking [Bit Pattern] (see Figure 5.5.1-5) displays the Bit Pattern window. In this window, the captured test patterns are displayed in a bit pattern string so that Insertion Error and Omission Error can be distinguished.

  • Page 155: Displaying Captured Test Pattern (Bitmap)

    Capturing Test Patterns 5.5.3 Displaying captured test pattern (Bitmap) After the captured data is acquired by clicking [Acquisition], clicking [Bit Map] (see Figure 5.5.1-5) displays the Bitmap window. In this window, the captured test pattern is displayed in bitmap format, so that the correlation between bits in which errors occur can be easily assumed.
  • Page 156 Chapter 5 Operation Method [5] The captured results are displayed in several colors according to the error type. Insertion errors (0 → 1) are displayed in red, omission errors (1 → 0) are in yellow, and bits with no error are in light blue. When the display scale is set to other than ×...

  • Page 157: Displaying Captured Test Pattern (Block)

    Capturing Test Patterns 5.5.4 Displaying captured test pattern (Block) After the captured data is acquired by clicking [Acquisition], clicking [Block] (see Figure 5.5.1-5) displays the Block window. In this window, the captured test pattern is displayed for each block, so that the correlation between bit patterns of each captured block can be understood.

  • Page 158: Misc Function

    Chapter 5 Operation Method 5.6 Misc Function Click the [Misc] tab on the operation tab window to display the Misc tab window. In the Misc tab window, other settings such as auxiliary input/output can be configured. Figure 5.6-1 Misc tab window Table 5.6-1 Setting items Setting area Description...

  • Page 159: Setting Pattern Sequence

    Misc Function 5.6.1 Setting Pattern Sequence Select the method for generating test patterns to be measured. Figure 5.6.1-1 Selecting pattern sequence Table 5.6.1-1 Pattern sequence setting Selection item Description Repeat Select when receiving Repeat data of the test pattern. Mainly used for electric device evaluation. Burst Select when receiving Burst data of the test pattern.
  • Page 160 Select this item when setting the gate signal that determines the measuring period of the intermittently-input test pattern within the MU181040A, instead of inputting it from external equipment. Select this item when the input signal valid period and the repetition cycle are known.
  • Page 161 MU181040A. When “Manual” is selected, set the number of relative delay bits used in the MU181040A. At this time, the signal input from the AUX Input connector indicates the period during which the test pattern is valid.
  • Page 162 Chapter 5 Operation Method Table 5.6.1.2-2 Setting ranges for Enable Period and Burst Cycle (Cont’d) No. of Slot Enable Period (bits) Burst Cycle (bits) Setting Steps (bits) Combinations When Internal is set: 102,400 to 8,589,934,592 51,200 to 8,589,932,544 When External-Trigger is set: 51,200 to 8,589,934,080 Notes:...

  • Page 163: Setting Aux Output

    [2] The division ratio for the synchronization clock can be set. The setting range for the setting frequency dividing ratio (N) varies depending on the options installed, as follows. 9.8 to 12.5 Gbit/s (for MU181040A-001): 16, 32, or 64 0.1 to 12.5 Gbit/s (for MU181040A-002): 8 to 511, in single steps 0.1 to 14 Gbit/s (for MU181040B-002):...
  • Page 164 Chapter 5 Operation Method [1] When “Pattern Sync” is selected from the AUX Output list box, a pulse signal can be output from the AUX Output connector in synchronization with the set data pattern period. [2] The synchronization signal pulse generation position can be set. The setting method varies depending on the test pattern.
  • Page 165 Misc Function At Independent, when the pattern length is 128 bits or less, specify the length as an integer multiple so that it becomes 129 bits or more. At 2 Ch Combination, when the pattern length is 256 bits or less, specify the length as an integer multiple so that it becomes 257 bits or more.
  • Page 166 Chapter 5 Operation Method 5.6.2.3 Setting Sync Gain A signal indicating synchronization establishment can be output. When this signal is high, it indicates that synchronization is established. 5.6.2.4 Setting Error Output A signal indicating error detection can be output. When this signal is low, it indicates that an error is detected within the MU1801040A.

  • Page 167: Setting Aux Input

    Misc Function 5.6.3 Setting AUX Input Use the AUX Input connector when receiving a Burst signal or capturing a reception signal based on the externally-generated timing signal. This section describes the function that uses the AUX Input connector. Figure 5.6.3-1 Selecting auxiliary input Table 5.6.3-1 Setting items Setting item Description...

  • Page 168: Measurement Restart Area

    Chapter 5 Operation Method 5.6.4 Measurement Restart area The items to restart the measurement when its setting is changed can be selected. Figure 5.6.4-1 Selecting measurement restart item Table 5.6.4-1 Items in Measurement Restart area Setting item Description Data Threshold Measurement is restarted when the Data/XData Threshold in the Input tab window is changed.

  • Page 169: Executing Auto Search

    When the pointer is closed to the [Auto Search], “ ” is displayed for help. The Auto Search function is enabled only when MU181040A-002 (0.1 to 12.5 Gbit/s) ,MU181040B-002 (0.1 to 14 Gbit/s) is installed, and cannot be used even when MU181040A-001 (9.8 to 12.5 Gbit/s) is installed.
  • Page 170 Auto Search is executed for Phase. Note: Auto Search can be executed by selecting the number of the slot in the MU181040A, in which the MU181040A-x30 and MU181040B-x30 Clock Phase Variable is installed, from the Slot checkboxes. [3] Select the checkboxes of the slot numbers to be targeted for Auto Search.
  • Page 171 Executing Auto Search [6] Auto Search results are displayed. Table 5.7.1-3 Result display items Displayed result Description ---- Indicates items for which Auto Search is not executed. Failed Indicates items for which Auto Search has failed. XXXX mV Indicates the result of Data/XData Threshold Auto Search in mV units.

  • Page 172: Executing Auto Adjust

    The Auto Adjust function automatically adjusts the threshold voltage and phase to the optimum values when the interface conditions for the signals to be input to the MU181040A have changed. Click the [Auto Adjust] module function button to display the Auto Adjust dialog box.
  • Page 173 Auto Adjust. Note: Auto Adjust can be executed by selecting the number of the slot in the MU181040A, in which the MU181040A-x30 and MU181040B-x30 Clock Phase Variable is installed, from the Slot checkboxes. [2] Select the checkbox of the slot number to be targeted for Auto Adjust.

  • Page 174: Isi Measurement Function

    Chapter 5 Operation Method 5.9 ISI Measurement Function ISI stands for Inter Symbol Interface. ISI measurement function is used for analysis of interferences between bits and block, by visually displaying a distribution of errors that occur between measuring bits and blocks.

  • Page 175: Displaying Isi Measurement Results In Isi Window

    ISI Measurement Function 5.9.1 Displaying ISI measurement results in ISI window Figure 5.9.1-1 ISI window The ISI window consists of the following four areas. 1. Measurement graph display area 2. Display control area 3. Measurement status display area 4. Menu bar The setting items in each area are described below.
  • Page 176 Chapter 5 Operation Method Measurement graph display area Figure 5.9.1-2 Measurement graph display area [1] Switch between “Error Rate” and “Error Count” for Y-axis display. [2] Set the Y-axis display range. Table 5.9.1-1 Y-axis display range Graph display target Setting range for upper limit Setting range for lower limit Error Rate E −...
  • Page 177 ISI Measurement Function Display control area Figure 5.9.1-3 Display control area [1] Move the cursor horizontally, using these left and right arrow keys. The marker position is displayed in the Position textbox in bit units, and the number of blocks is displayed in the Block textbox. [2] Switch the display window using [Zoom In] and [Zoom Out].
  • Page 178 Chapter 5 Operation Method Measurement status display area Figure 5.9.1-4 Measurement status display area [1] Displays the measurement statuses for measuring items in the measurement graph display area. Table 5.9.1-2 Display items Item Description Pattern Length Total pattern data length Measurement Length Length of the data displayed in the measurement graph display area...
  • Page 179 ISI Measurement Function Menu bar Table 5.9.1-4 Menu items on menu bar Menu Item Function File Open Opens a file. The file name is displayed as a screen title. Save Data ISI Result Saves the ISI measurement Type results. File Type Binary Saves results in binary format.

  • Page 180: Restrictions On Isi Measurement

    Chapter 5 Operation Method 5.9.2 Restrictions on ISI measurement The following restrictions for ISI measurement apply. Table 5.9.2-1 Restrictions on ISI measurement Pattern Possible/impossible Impossible when the pattern length is 2^n − 1 (n = 7, PRBS 9, 10, 11) Impossible when the pattern length is 2^n or 2^n −...

  • Page 181: Eye Margin Measurement

    The bit error rate for the clock phase and threshold voltage at the start of Eye Margin measurement must be less than the specified rate, in order to obtain valid results. Also, synchronization with the MU181040A must be established (i.e., without Sync Loss) before the start of Eye Margin measurement. 5-125...
  • Page 182 Note: Eye Margin measurement cannot be performed for the following cases. • When MU181040A-001 (9.9 to 12.5 Gbit/s) is installed • When Burst is selected in the Pattern Sequence area on the Misc tab window • When Alternate is selected for the test pattern •...

  • Page 183: Eye Margin Window

    [3] Displays the slots to be selected for the Eye Margin measurement target, and the measurement results. The number of the slot where the MU181040A is inserted is displayed. Select the checkbox for the slot to be measured. When the Eye Margin measurement is finished, the measurement results of phase margin, threshold margin, and period are displayed.
  • Page 184 Chapter 5 Operation Method [5] Stop button Click to stop the Eye Margin measurement. [6] Close button Click to close the Eye Margin window. [7] The definition of the amplitude, period, threshold margin, and phase margin values are illustrated in an eye pattern. [8] Error Threshold Select the error threshold to be measured, from E −...
  • Page 185 Table 5.10.1-3 Error display Displayed Error Cause Sync Loss A Sync Loss error has occurred in the MU181040A. Clock Loss A Clock Loss error has occurred in the MU181040A. CR Unlock A CR Unlock error has occurred in the MU181040A.
  • Page 186 Chapter 5 Operation Method Display example: Slot1: Measuring… Slot1: Measurement Completion Slot2: Measuring… Slot2: Sync Loss [12] Displays the time related to the measurement. The displayed time can be selected from the list box on the left (see [14] below). [13] Indicates the measurement progress as a percentage and a gauge.

  • Page 187: Menu Items

    5.10 Eye Margin Measurement 5.10.2 Menu items Table 5.10.2-1 lists the menu items provided in the Eye Margin window. No menu items can be selected during measurement. Table 5.10.2-1 Menu items in Eye Margin window Menu Menu Item Function File Open Opens a file.

  • Page 188: How To Perform Eye Margin Measurement

    This section provides a basic procedure for performing Eye Margin measurement. Checking connection Check that the MU181020A, DUT (Device Under Test), and MU181040A are correctly connected. Setting frequency Set the frequency by the synthesizer window. Figure 5.10.3-1 MU181000A 12.5 GHz Synthesizer window Selecting slot to be measured Open the Eye Margin window and select the slot to be measured.
  • Page 189 The bit error rate for the clock phase and threshold voltage at the start of Eye Margin measurement must be less than the specified rate in order to obtain valid results. Also, synchronization with the MU181040A must be established (i.e., without Sync Loss) before the start of Eye Margin measurement. Starting measurement Click [Start] to start Eye Margin measurement.
  • Page 190 Chapter 5 Operation Method Checking measurement results When the Eye Margin measurement is finished, “Measurement Completion” is displayed in the Status field, and the measurement results of phase margin, threshold margin, and period are displayed in the result display area (indicated by [3] in Table 5.10.1-1). Figure 5.10.3-6 Eye Margin window with measurement results displayed 5-134...

  • Page 191: Eye Diagram Measurement

    5.11 Eye Diagram Measurement 5.11 Eye Diagram Measurement An eye diagram is a means for measuring digital signal quality. It visualizes an open-eye margin two-dimensionally. For example, an eye diagram measurement can be used when it is required to measure the margin in the setting range for the threshold voltage and clock phase of a decision circuit, while quality with an error rate of E −...

  • Page 192: Eye Diagram Window

    Chapter 5 Operation Method 5.11.1 Eye Diagram window Figure 5.11.1-1 shows the Eye Diagram window. Figure 5.11.1-1 Eye Diagram window [1] Menu bar See Section 5.11.9 “Menu items” for details. [2] [Condition] tab Click to open the Condition tab window. [3] [Diagram] tab Click to open the Diagram tab window.

  • Page 193: Condition Tab Window

    Reset All: Clicking this button deselects all the displayed slots. [2] Select the slot targeted for the Eye Diagram measurement. The number of the slot where the MU181040A is inserted is displayed. Select the checkbox for the slot to be measured. The Eye Diagram measurement is performed for the Eye Diagram and Mask Test of the selected slot.
  • Page 194 Chapter 5 Operation Method Table 5.11.2-1 Error count and clock count for each error threshold Error Count/Clock Count Error Threshold Coarse Fine E − 3 1/1,000 100/100,000 E − 4 1/10,000 100/1,000,000 E − 5 1/100,000 100/10,000,000 E − 6 1/1,000,000 100/100,000,000 E −...
  • Page 195 5.11 Eye Diagram Measurement Non-transition bits High Transition bits Figure 5.11.2-2 Transition bits and non-transition bits Transition bit eye Non-transition bit diagram eye diagram Figure 5.11.2-3 Eye diagrams of transition and non-transition bits When “Transition bit” or “Non Transition bit” is selected, the number of bits to be measured decreases compared with when “OFF”...

  • Page 196: Diagram Tab Window

    [12] [13] [14] [15] [18] Figure 5.11.3-1 Diagram tab window [1] Select the number of the slot where the MU181040A to be measured is inserted. Only slots where an MU181040A is inserted can be selected. [2] Mask Select a mask to be displayed in the graph (“[10]” in Figure 5.11.4-1) from Edit1 through Edit4, which are created in the Mask Edit tab window.
  • Page 197 5.11 Eye Diagram Measurement [5] [Condition] tab Click to open the Condition tab window. [6] [Detail] tab Click to open the Diagram tab window. [7] [Result] tab Click to open the Result tab window. [8] Scale button When this button is clicked and depressed, the Max and Step textboxes (indicated by “[9]”...
  • Page 198 Chapter 5 Operation Method [14] Cursor Select the Marker1/2 operation. Free: The Marker operation is not restricted. Point: The Marker can select the measured diagram points only. [15] Max and Step textboxes These are displayed when the Scale button (indicated by [16] in Figure 5.11.3-1) is depressed.
  • Page 199 5.11 Eye Diagram Measurement [20] The measurement status and result (whether the measurement was finished normally) are displayed for each slot. Measuring: The Eye Diagram measurement is being performed. Measurement Completion: The Eye Diagram measurement has finished normally. Failure: The Eye Diagram measurement has failed.

  • Page 200: Condition Tab Window

    Chapter 5 Operation Method 5.11.4 Condition tab window Figure 5.11.4-1 shows the Condition tab window. [10] [11] [13] [12] Figure 5.11.4-1 Condition tab window [1] Error rate Shows the correspondence between the color of a diagram displayed in the graph and the error rate. [2] Meas.
  • Page 201 5.11 Eye Diagram Measurement [5] Meas. reset All Eye Diagram measurement is not performed for all error rates when this button is clicked. [6] Display set All A measurement result diagram is displayed in the graph for all error rates when this button is clicked. [7] Display reset All A measurement result diagram is not displayed in the graph for any error rates when this button is clicked.

  • Page 202: Actual Measurement And Estimate Measurement

    Chapter 5 Operation Method 5.11.5 Actual measurement and Estimate measurement The Eye Diagram measurement is provided with two measurement modes: Actual measurement and Estimate measurement. In Actual measurement, the contours of the displayed bit error rate are based on actual measurements. The measurement error rate range is from E −...
  • Page 203 5.11 Eye Diagram Measurement Noise distribution parameters, σ , σ , μ , and μ can be obtained by measuring the correlation between the bit error rate and the threshold voltage in a certain range (see Figure 5.11.5-1). The bit error rate for an arbitrary threshold voltage can be calculated using the distribution and the expression shown in Figure 5.11.5-2.
  • Page 204 Chapter 5 Operation Method Note: During the Eye Diagram measurement, the Estimate function traces an Eye diagram for the error threshold, which was specified based on the measuring points in the Threshold and Phase directions, using both the point calculated from the Threshold direction and the point calculated from the Phase direction.

  • Page 205: Detail Tab Window

    5.11 Eye Diagram Measurement 5.11.6 Detail tab window 5.11.6.1 When Point Test is selected Figure 5.11.6.1-1 shows the Detail tab window when Point Test is selected. Figure 5.11.6.1-1 Detail tab window when Point Test is selected [1] Mask Adjust Adjust the displayed mask to the measurement result diagram. At this time, the measurement result diagram does not change and the threshold voltage and phase value of the mask are offset.
  • Page 206 Chapter 5 Operation Method [4] Test Mode Select the test mode. Point Test: Eye Diagram measurement is performed at all the points of the mask displayed in the graph. Mask Line Test: See Section 5.11.6.2 “When Mask Line Test is selected”...
  • Page 207 5.11 Eye Diagram Measurement 5.11.6.2 When Mask Line Test is selected Figure 5.11.6.2-1 shows the Detail tab window when Mask Line Test is selected. Figure 5.11.6.2-1 Detail tab window when Mask Line Test is selected [1] Test Mode Select the test mode. Mask Line Test: Measurement is performed for the sides of the displayed mask.
  • Page 208 Chapter 5 Operation Method [3] The phase values and threshold voltages of Marker1 and Marker2 are displayed. [4] Click to move the marker selected by the button indicated by [6] in Figure 5.11.6.2-1. <: The marker moves clockwise when clicked. >: The marker moves counterclockwise when clicked.

  • Page 209: Result Tab Window

    5.11 Eye Diagram Measurement 5.11.7 Result tab window Figure 5.11.7-1 shows the Result tab window. Figure 5.11.7-1 Result tab window [1] Mask Test Result Slot column: The mask test results for each slot are displayed. Judgment column OK: Displayed when all the mask points satisfy the set error rate. NG: Displayed when a mask point that does not satisfy the set error rate exists.

  • Page 210: Mask Edit Tab Window

    Chapter 5 Operation Method 5.11.8 Mask Edit tab window Figure 5.11.8-1 shows the Mask Edit tab window. [14] [9] [10] [11] [13] [12] Figure 5.11.8-1 Mask Edit tab window [1] Sample button Click to open a mask pattern sample file conforming to typical standards.
  • Page 211 5.11 Eye Diagram Measurement [2] Parameter Displays the point coordinates (Phase mUI and Threshold mV) of the mask displayed in the graph. [3] Mask Cursor (orange) Indicates the point to be edited by the controls in the Mask Edit field ([10] in Figure 5.11.8-1).
  • Page 212 Chapter 5 Operation Method [8] Arrow keys Click an arrow key to move the marker in the corresponding direction (up/down/left/right). When “Fine” is selected from the Fine/Coarse list box in the Condition tab window, the marker moves by 1 mUI or 1 mV each time a key is clicked once. When “Coarse” is selected, the marker moves by 10 mUI or 5 mV each time a key is clicked once.

  • Page 213: Menu Items

    5.11 Eye Diagram Measurement 5.11.9 Menu items Table 5.11.9-1 lists the menu items provided in the Eye Diagram window. No menu items can be selected during measurement. Table 5.11.9-1 Menu items in Eye Diagram window Menu Menu Item Function File Open Opens a file.
  • Page 214 Chapter 5 Operation Method Table 5.11.9-1 Menu items in Eye Diagram window (Cont’d) Menu Menu Item Function File(Cont ’ d) Exit Closes the Eye Diagram window. Display Sets the phase unit to mUI. Sets the phase unit to ps. Note: The settings will not be read from the saved file if the file name is changed.

  • Page 215: How To Perform Eye Diagram Measurement

    5.11.10 How to perform Eye Diagram measurement This section provides a basic procedure for performing Eye Diagram measurement. Checking connection Check that the MU181020A, DUT, and MU181040A are correctly connected. Setting frequency Set the frequency by the synthesizer. Figure 5.11.10-1 MU181000A 12.5 GHz Synthesizer window...
  • Page 216 Chapter 5 Operation Method Setting measurement conditions Set Error Threshold and Actual/Estimate. Figure 5.11.10-3 Setting measurement conditions Starting measurement Click [Start] to start Eye Diagram measurement. Figure 5.11.10-4 Measurement start button Stopping measurement Click [Stop] to stop the Eye Diagram measurement. Figure 5.11.10-5 Measurement stop button 5-160...
  • Page 217 5.11 Eye Diagram Measurement Checking measurement results When the Eye Diagram measurement is finished, an Eye diagram of the measurement result is displayed in the graph. Eye diagrams for the error rates whose Display button is set to ON are displayed. The color of a displayed Eye diagram accords to the color selected in the Condition tab window.

  • Page 218: How To Perform Mask Test Measurement

    5.11.11 How to perform Mask Test measurement This section provides a basic procedure for performing Mask Test measurement. Checking connection Check that the MU181020A, DUT, and MU181040A are correctly connected. Setting frequency Set the frequency by the synthesizer. Figure 5.11.11-1 Setting frequency...
  • Page 219 5.11 Eye Diagram Measurement Setting a mask Configure the mask settings in the Mask Edit tab window. One of Edit1 to Edit4 can be set as the mask. Figure 5.11.11-3 Mask Edit tab window Set a mask for each slot, and set the error threshold. Figure 5.11.11-4 Selecting mask Starting measurement Click [Start] to start Eye Diagram measurement.
  • Page 220 Chapter 5 Operation Method Checking measurement results When the measurement is finished, the measurement results for each slot are displayed in the Result tab window. Figure 5.11.11-7 Eye Diagram window with measurement results displayed 5-164...

  • Page 221: Q Analysis Function

    5.12 Q Analysis Function 5.12 Q Analysis Function The Q analysis function has the following features. • Conforms to OSFTP-9. • Capable of calculating two Q values: Threshold vs. Q and Phase vs. Q. • Provides rich graph displaying modes. •...
  • Page 222 Chapter 5 Operation Method The setting items in each area are described below. Measurement graph display area Figure 5.12.1-2 Measurement graph display area [1] Click to switch between the Threshold vs Q tab window and the Phase vs Q tab window, changing the measurement system. 5-166...
  • Page 223 5.12 Q Analysis Function [2] Select the graph display method. Table 5.12.1-1 Graph display items Item X-axis (Setting range) Y-axis (Setting range) Vth vs BER (Y = Log) Threshold voltage Log (BER) ( − 3.990 to 4.0 V) (1.0 E − 2 to 1.0 E − 14) Vth vs BER (Y = Log ( −...
  • Page 224 Chapter 5 Operation Method Measurement control area [10] Figure 5.12.1-3 Measurement control area [1] Start button: Start measurement. Stop button: Stop measurement. Close button: Close the measurement window. [2] Select the slot to be measured from the Slot list box. 5-168...
  • Page 225 5.12 Q Analysis Function [3] Select the measurement mode from the Measurement Mode list box. Single: Measurement is finished when a Q value is measured once. Repeat: Measurement is finished when a Q value is measured for the specified number of times. Untimed: Measurement is performed continuously from the measurement start instruction to the measurement end instruction.
  • Page 226 Chapter 5 Operation Method Display control area Figure 5.12.1-4 Display control area [1] Select the cursor movement method from the Cursor Step list box, “Free” (minimum resolution) or “Point” (measurement point). [2] Set the marker ON or OFF by clicking the ON/OFF button. Select Marker1 or Marker2 for the cursor by clicking the corresponding button.
  • Page 227 5.12 Q Analysis Function Measurement result display area Figure 5.12.1-5 Measurement result display area (for Immediate Data) [1] Select “Immediate Data” or “Statistic Data”. [2] Displays the results when a Q value is measured once. Table 5.12.1-2 Result display items (Immediate Data) Item Description Q Value...
  • Page 228 Chapter 5 Operation Method Figure 5.12.1-6 Measurement result display area (for Statistic Data) [7] Displays the statistical measurement results obtained when a Q value is measured several times. Table 5.12.1-3 Result display items (Statistic Data) Item Description Total Data Total measurement count Valid Data Number of valid Q values Q Mean...
  • Page 229 5.12 Q Analysis Function Menu bar Figure 5.12.1-7 Menu bar [1] Menu bar Select a File and Display menu item. Table 5.12.1-4 Menu bar configuration Menu Item Function File Open Opens a file. The file name is displayed as a screen title. Save Data Vth vs Q Result...
  • Page 230 Chapter 5 Operation Method Table 5.12.1-4 Menu bar configuration (Cont’d) Menu Item Function File (continued) Initialize Initializes all the settings and measurement results. Exit Closes the Q Analysis window. Display Overlapping Select to configure the display settings for multiple displays. (Selectable when multiple measurements are performed.) History Select to display the results of the latest 15...

  • Page 231: Window

    5.12 Q Analysis Function 5.12.2 Displaying results of Phase vs Q measurement in Phase vs Q tab window Figure 5.12.2-1 Phase vs Q tab window The Phase vs Q tab window consists of five areas. 1. Measurement graph display area 2.
  • Page 232 Chapter 5 Operation Method Measurement graph display area Figure 5.12.2-2 Measurement graph display area [1] Click to switch between the Threshold vs Q tab window and the Phase vs Q tab window, changing the measurement system. [2] Select the graph display method. Table 5.12.2-1 Graph display items Item X-axis (Setting range)
  • Page 233 5.12 Q Analysis Function Table 5.12.2-1 Graph display items (Cont’d) Item X-axis (Setting range) Y-axis (Setting range) Phase vs Q Q value − 40 to 60 (dB) 10 to 1000 (Linear) Phase vs σ σ of Gaussian (0.0010 to 1.0000) Phase vs μ...
  • Page 234 Chapter 5 Operation Method Measurement control area [10] Figure 5.12.2-3 Measurement control area [1] Start button: Start measurement. Stop button: Stop measurement. Close button: Close the measurement window. [2] Select the chassis or slot to be measured from the list box. 5-178...
  • Page 235 5.12 Q Analysis Function [3] Select the measurement range from the list box and textboxes in Measurement Range. Range: The measurement range can be specified by entering the measurement start value, end value, and variation width (step). Width: The measurement range can be specified by entering the center value, span, and variation width (step).
  • Page 236 Chapter 5 Operation Method Measurement result display area Figure 5.12.2-4 Measurement result display area [1] Displays the measurement number of the displayed measurement result. [2] Displays the results of each phase measurement. Table 5.12.2-2 Result display items Item Description Q Value Measured Q value (Unit: dB/ −...

  • Page 237: Bathtub Function

    5.13 Bathtub Function 5.13 Bathtub Function The Bathtub function has the following features. • Provides rich graph displaying modes. • Calculates TJ, DJ, RJ, as well as optimum phase and optimum bit error rate. • Calculates J2 and J9. To use the Bathtub function, click the Auto Measurement module MX180000A function button, and then select Bathtub.

  • Page 238: Displaying Bathtub Measurement Results In Bathtub Window

    Chapter 5 Operation Method 5.13.1 Displaying Bathtub measurement results in Bathtub window Figure 5.13.1-1 Bathtub window The Bathtub window consists of five areas. 1. Measurement graph display area 2. Measurement control area 3. Display control area 4. Measurement result display area 5.
  • Page 239 5.13 Bathtub Function Measurement graph display area Figure 5.13.1-2 Measurement graph display area [1] Select the graph display method. Table 5.13.1-1 Graph display items Item X-axis (Setting range) Y-axis (Setting range) Phase vs BER (Y = Log) Phase Log (BER) ( ...
  • Page 240 Chapter 5 Operation Method Measurement control area [11] [12] [10] Figure 5.13.1-3 Measurement control area [1] Start button: Start measurement. Stop button: Stop measurement. Close button: Close the measurement window. [2] Select the slot to be measured from the Slot list box. [3] Select the measurement mode from the Measurement Mode list box.
  • Page 241 5.13 Bathtub Function [4] Set the data threshold position for measurement in the Delay textbox. Setting range: − 3.5 to +3.3 V, in 0.001 V steps (for Single-Ended) − 3.0 to 3.0 V, in 0.001 V steps (for Differential) [5] Set the phase variation step for measurement in the Phase Resolution textbox.
  • Page 242 Chapter 5 Operation Method [12] When setting J2 Measurement, select calculation method for J2. Estimate ： Estimates J2 value using Best Fit Line calculated by the setting of Calculation Error Threshold. Actual ： Find the closest point to 2.5E-3 in BER measurement, and calculate J2 value.
  • Page 243 5.13 Bathtub Function Display control area Figure 5.13.1-5 Display control area [1] Select the cursor movement method from “Free” (minimum resolution) or “Point” (measurement point). [2] Set the marker ON/OFF by clicking the ON/OFF button. Select Marker1 or Marker2 for the cursor, by clicking the corresponding button.
  • Page 244 Chapter 5 Operation Method Measurement result display area Figure 5.13.1-6 Measurement result display area [1]-1 Immediate Data field Displays the results when Bathtub measurement is performed once. Table 5.13.1-2 Result display items (Immediate Data) Item Description Optimum Phase Optimum phase value (Display format: XXX.XX (ps) or XXX (mUI)) Optimum BER Optimum error rate (Display format: X.XXXXE −...
  • Page 245 5.13 Bathtub Function [1]-2 Statistic Data field Displays the statistical measurement results obtained when Bathtub measurement is performed several times. Table 5.13.1-3 Result display items (Statistic Data) Item Description Total Data Total measurement count (Display format: XXXX) Valid Data Number of valid measurement results (Display format: XXX.XX(ps) or XXXX) TJ mean Average of total jitter measurement...
  • Page 246 Chapter 5 Operation Method Menu bar Figure 5.13.1-7 Menu bar [1] Select File and Display menu item. Table 5.13.1-4 Menu bar configuration Menu Item Function File Open Opens a file. The file name is displayed as a screen title. Save Data Phase vs Q BER Saves the Phase vs Q BER Result...
  • Page 247 5.13 Bathtub Function Table 5.13.1-4 Menu bar configuration (Cont’d) Menu Item Function Display Overlapping Select to configure the display settings for multiple displays. (Selectable when multiple measurements are performed.) History Select to display the results of the latest 15 measurements. Best Fit Line Select whether to display or hide approximated curves.

  • Page 248: Multi Channel Function

    Chapter 5 Operation Method 5.14 Multi Channel Function When multiple MU181040A modules are installed into the MP1800A/MT1810A, synchronized operation of multiple channels is enabled. Multi-channel functions include the Combination function. Combination Function Types (1) 4ch Combination: when four PPG/ED modules installed...

  • Page 249: Combination Setting

    Figure 5.14.2-1 Combination Setting dialog box Table 5.14.2-1 Screen Layout of Combination Setting Operation Settings Contents Independent Select when performing MU181020A/B or MU181040A/B independently Combination Select when performing 25G tests Select when performing 40 tests 25Gx2ch Select when generating/receiving 25G 2 Ch data...

  • Page 250: Ed Result All Dialog Box

    5.14.3 ED Result All dialog box The ED Result All dialog box shows the error measurement results for each MU181040A module inserted, Combination measurement results, and Logging results. Click the [ED Result All] module function button. Figure 5.14.3-1 ED Result All button Figure 5.14.3-2 ED Result All dialog box...
  • Page 251 5.14 Multi Channel Function 5.14.3.1 Setting and result display of Error/Alarm measurement This section describes the setting and result display of Error/Alarm measurement. Figure 5.14.3.1-1 Error/Alarm measurement results [1] Menu bar Table 5.14.3.1-1 Menu bar configuration Menu Item Function File Save Data Type Error/Alarm Result...
  • Page 252 Chapter 5 Operation Method Note: The settings will not be read from the saved file if the file name is changed. [2] Switches display between Error/Alarm and Logging. [3] Click the [Select] to display the dialog box for selection of the display items for Error/Alarm measurement.
  • Page 253 5.14 Multi Channel Function Table 5.14.3.1-2 Error/Alarm measurement display item list Item Function Error Rate Displays the error rate. Error Count Displays the error count. Clock Count Displays the clock count. Frequency Displays the frequency. Error Interval Displays the error interval count. %Error Free Interval Displays the error free interval rate.
  • Page 254 Chapter 5 Operation Method 5.14.3.2 Setting and result display of logging This section describes the setting and result display of Logging. Figure 5.14.3.2-1 Logging results [1] Menu bar Refer to Table 5.14.3.1-1 “Menu bar configuration.” Turns the logging function on/off. 5-198...
  • Page 255 5.14 Multi Channel Function [3] Click the [Condition] to display the dialog box for selection of the logging items. The items selected here appear in the measurement results display area [4]. Refer to Table 5.1.7-1 “Items in Log Condition setup dialog box” for details on the logging items.
  • Page 256 Chapter 5 Operation Method 5-200.

  • Page 257: Chapter 6 Measurement Example

    Chapter 6 Measurement Example This chapter provides measurement examples using the MU181040A. Measuring Optical Transceiver Module (error rate measurement using PRBS pattern) ..... 6-2 6.1.1 Test method ............6-2 Measuring 1:4 DEMUX (reception of 40 Gbit/s PRBS pattern using four MU181040A units) ......6-5 6.2.1 Test method ............

  • Page 258: Measuring Optical Transceiver Module (Error Rate Measurement Using Prbs Pattern)

    MP1800A Signal Quality Analyzer (hereafter, referred to as “MP1800A”). 6.1.1 Test method The following shows a test example where the MU181020A, MU181040A, and MU181600A Optical Transceiver (XFP) (hereinafter, referred to as “MU181600A”) are mounted onto the MP1800A. The options configuring the test system are as follows:...
  • Page 259 “Differential 100 ohm” and “Tracking”. Specify the clock for error measurement. In the Clock field on the Input tab window of the MU181040A, select “Recovered Clock” from the Selection list box and specify the operating bit rate.
  • Page 260 Optical Output list box and set the [Output] module function button to “ON”. Set the optimum thresholds for the MU181040A. When the Auto Adjust function is enabled by clicking the [Auto Adjust] module function button, the thresholds are automatically adjusted and set to optimum values for the DUT.

  • Page 261: Measuring 1:4 Demux (Reception Of 40 Gbit/S Prbs Pattern Using Four Mu181040A Units)

    Measuring 1:4 DEMUX (reception of 40 Gbit/s PRBS pattern using four MU181040A units) 6.2 Measuring 1:4 DEMUX (reception of 40 Gbit/s PRBS pattern using four MU181040A units) This section provides an example of how to test the performance of the 40 GHz band 1:4 DEMUX IC by using two MP1800A units.
  • Page 262 Chapter 6 Measurement Example Turn on the MP1800A, on which the MU181040A units are mounted, and set the measurement conditions as follows. Adjust the data input interface for the MU181040A to the output of the DUT. Set a test pattern. In the MU181040A Pattern tab window, select the test pattern that is selected in the MU181020A Pattern tab window.
  • Page 263 Measuring 1:4 DEMUX (reception of 40 Gbit/s PRBS pattern using four MU181040A units) MP1800A MP1803A Clock In MU181020A Data Data 1 Clock In MU181020A Data Data 2 Data Out Clock In MU181020A Data Data 3 CK Out Clock In MU181020A...
  • Page 264 Chapter 6 Measurement Example Turn on the measuring instruments in the following order: MP1800A, on which the MU181040A units are installed → DUT → MP1803A → MP1800A on which the MU181020A units are installed CAUTION The DUT may be damaged if a signal line is connected or disconnected while the output is ON.

  • Page 265: Burst Measurement

    A typical system for the optical circulating loop test is shown in Figure 6.3.1-1. The following shows a test example where the MU181000A, MU181020A, and MU181040A are mounted onto one MP1800A mainframe. The options configuring the test system are as follows:...
  • Page 266 • Set the Enabled Period It must be shorter than the Burst data to be received. • Set the Burst Cycle From the Test Pattern area in the MU181040A Pattern tab window, set a test pattern to be received. Set “PRBS31” in this example.
  • Page 267 ON. Be sure to set the output to OFF before changing the cable connection. Adjust the threshold voltage and phase of the MU181040A to the optimum values. The BER measurement results are displayed in the MU181040A Result tab window.

  • Page 268: Onu-Olt Uplink Test (Burst Signal Error Rate Measurement)

    MU181040A-002/x30/x20 Connect the MP1800A, MU181000A, MU181800A, MU181020A, MU181040A, ONU1, ONU2, and OLT as shown in Figure 6.4-1. Set the frequency of the MU181000A to 1.25 GHz, and set the output signal level of the MU181020A according to the input levels of the ONU1, ONU2, and OLT.
  • Page 269 ONU-OLT Uplink Test (Burst signal error rate measurement) Configure the setting for the transmission side. Set the output pattern and data timing of the MU181020A PPG 1 and PPG2 as shown in Figure 6.4.1-1. In the MU181020A Misc tab window, set as follows: Pattern Sequence: Burst Source: Internal...
  • Page 270 Set the period to be filled with a “0” pattern and the data pattern, according to the PPG1 data. In the Clock area on the MU181040A Input tab window, select “Recovered Clock” from the Selection list box and set the clock rate to 12.5000 Gbit/s.

  • Page 271: Chapter 7 Performance Test

    Chapter 7 Performance Test This chapter describes the performance testing of the MU181040A. Overview ............... 7-2 Devices Required for Performance Tests ..... 7-3 Performance Test Items ..........7-4 7.3.1 Operating frequency ......... 7-4 7.3.2 Input level ............7-7 7.3.3 Pattern .............. 7-9...

  • Page 272: Overview

    Chapter 7 Performance Test 7.1 Overview Performance tests are executed to check that the major functions of the MU181040A meet the required specifications. Execute performance tests at acceptance inspection, operation check after repair, and periodic (once every six months) testing.

  • Page 273: Devices Required For Performance Tests

    Devices Required for Performance Tests 7.2 Devices Required for Performance Tests Before starting performance tests, warm up the MU181040A and the measuring instruments for at least 30 minutes. Table 7.2-1 shows the devices required for performance tests. Table 7.2-1 Devices required for performance tests...

  • Page 274: Performance Test Items

    4.9 to 6.25 GHz, 9.8 to 12.5 GHz (3) Connection Figure 7.3.1-1 shows a connection example when the MU181040A (installed MU181040A-002), MU181000A, and MU181020A (with MU181020A-x12 and -x21 installed) are used. Before connecting the devices, be sure to use a sampling oscilloscope to check if the frequency and level of the signals output from the MU181000A and MU181020A are proper.
  • Page 275 (c) Connect the Data output connector of the MU181020A and the Data input connector of the MU181040A, using a coaxial cable. Also connect the XData output connector of the MU181020A and the XData input connector of the MU181040A, using a coaxial cable.
  • Page 276 Input tab window must be the same with the input frequency. Phase adjustment is not required in this event. (h) When MU181040A-x20 is installed, in the Input tab window, select “Recovered Clock” for the clock and set the clock recovery frequency to the input frequency value.

  • Page 277: Input Level

    Data. (b) Set the output level of the MU181020A and the threshold voltage of the MU181040A as shown in Table 7.3.2-2 or Table 7.3.2-3. Next, set the output of the MU181020A to ON and press Start of the MU181040A. Adjust the phase as required, and check that no error occurs.
  • Page 278 [2] Set the termination condition for the MU181040A to GND. [3] Change the termination condition for the MU181020A. [4] Set the termination condition for the MU181040A to that for the MU181020A set in Step [3]. (c) Remove the cable from the Data Input connectors, and then connect the XData Input connectors, using a coaxial cable.

  • Page 279: Pattern

    − 1, changing the value of n to 7, 9, 10, 11, 15, 20, 23, and 31, and check that no error occurs. For the MU181040A, the PRBS pattern length can be set in the Pattern tab window. Set the PRBS pattern length to 2 −...

  • Page 280: Error Detection

    Cycle to Single, and set the measurement time to 10 seconds. 5. Press the Start of the MU181040A to start measurement. Next, press the error insertion Single button of the MU181020A once during the measurement (10 seconds). When the measurement has finished, check that the measurement results are as follows.
  • Page 281 Chapter 8 Maintenance This chapter describes maintenance of the MU181040A. Daily Maintenance ............8-2 Cautions on Storage ............. 8-2 Transportation ............... 8-3 Calibration ..............8-3 Disposal ................ 8-4...

  • Page 282: Daily Maintenance

    • Tighten any loose parts fixed with screws, using the specified tools. 8.2 Cautions on Storage Wipe off any dust, soil, or stain on the MU181040A prior to storage. Avoid storing the MU181040A in any of the following locations: • Where there is direct sunlight •...

  • Page 283: Transportation

    8.3 Transportation Use the original packing materials, if possible, when packing the MU181040A for transport. If you do not have the original packing materials, pack the MU181040A according to the following procedure. When handling the MU181040A, always wear clean gloves, and handle it gently so as not to damage it.

  • Page 284: Disposal

    Chapter 8 Maintenance 8.5 Disposal Confirm the notes described in the Signal Quality Analyzer Series Installation Guide and observe national and local regulations when disposing of the MU181040A. 8-4.
  • Page 285 Chapter 9 Troubleshooting This chapter describes how to check whether a failure has arisen when an error occurs during the operation of the MU181040A. Problems Discovered during Module Replacement ..9-2 Handling Suspected Failure .......... 9-3...
  • Page 286 Chapter 9 Troubleshooting 9.1 Problems Discovered during Module Replacement Table 9.1-1 Remedies for problems discovered during replacement of MU181040A Symptom Location to Check Remedy A module is not Is the module Install the module again by referring to Section 2.3 recognized.
  • Page 287 Handling Suspected Failure 9.2 Handling Suspected Failure • Synchronization cannot be established (error measurement cannot be performed) Table 9.2-1 Items to be checked Item Location to Check Remedy Input conditions Do the quality, status and Replace with a suitable cable. length of the connection cables comply with the specifications? Is the cable connection correct...
  • Page 288 If a problem cannot be solved using any of the items listed above, perform initialization and check the items again. If the problem still occurs, contact an Anritsu Service and Sales office. Contact information can be found on the last page of the printed version of this manual, and is available in a separate file on the CD version.
  • Page 289 Appendix A Pseudo-Random Pattern Pseudo-Random Pattern ..........A-2 Zero Substitution Pattern ..........A-3...
  • Page 290 Appendix A Pseudo-Random Pattern A.1 Pseudo-Random Pattern Table A.1-1 shows the principle of pseudo-random pattern generation. A pseudo-random pattern is expressed in an N-th degree generating polynomial shown in Table A.1-1, with one cycle of 2 − 1. For a PRBS pattern with a cycle of 2 −...
  • Page 291 Zero Substitution Pattern A.2 Zero Substitution Pattern A string of successive “0s” for the number of set bits is made by substituting “0” for the pattern that follows the longest bit string of successive 0s in a PRBS pattern. In this event, if the bit immediately after the bit substituted to “0”...
  • Page 292 Appendix A Pseudo-Random Pattern A-4.
  • Page 293 Appendix B B.1 List of Initial Settings This section lists the initial values at factory shipment of the setting items related to the MU181040A. Selecting “Initialize” from the File menu resets all setting items to their initial values. Table B.1-1 List of initial settings...
  • Page 294 Appendix B List of Initial Settings Table B.1-1 List of initial settings (Cont’d) Main Function Sub-Category Individual Setting Item Initial Setting Category Measure- Measurement Measurement period unit (Unit) Time ment Period Measurement period time 00 00:00:01 (Gating) Clock count for measurement period >E+10 Error count for measurement period >E+10...
  • Page 295 Data input termination setup dialog box display – Data input termination condition Data input termination voltage 0.00 V Clock Input Selection External Clock Recovered Clock (MU181040A-001) Recovered clock frequency selection Variable Recovered clock frequency setting 12.500000 Gbit/s Recovered clock output polarity (MU181040A-x20) Clock phase unit (MU181040A-x30)
  • Page 296 Appendix B List of Initial Settings Table B.1-1 List of initial settings (Cont’d) Main Function Sub-Category Individual Setting Item Initial Setting Category Capture Capture con- Capture block division number dition dialog Capture trigger Match Pattern box display Capturing start position Capture trigger match pattern length 4 bits Capture trigger pattern format...
  • Page 297 List of Initial Settings Table B.1-1 List of initial settings (Cont’d) Main Function Sub-Category Individual Setting Item Initial Setting Category Misc Synchronized Synchronized output position (for output (Cont’d) Sequence pattern) (Aux Output) (Cont’d) Aux Input Connector External Mask (Repeat) Burst (Burst) Measurement Measurement restart upon input threshold False...
  • Page 298 Appendix B List of Initial Settings B-6.
  • Page 299 Appendix C Setting Restrictions Combination Function Configuration ......C-2 Restrictions on operations when multiple modules are mounted ................ C-3 Settings Common in Combination System ....C-6...
  • Page 300 All of the following conditions must be satisfied to execute the Combination function. Enabling conditions for Combination function Two or more MU181040A modules are mounted on one • mainframe. When the mainframe option is 015, they shall be mounted from Slot 1, from the top downward; while in the case of 016 they shall be mounted from the bottom upward starting from Slot 6.
  • Page 301 MU181040A,MU181040B: Slot1 However, the following modules become the master module, when the MU181020A/B is installed in Slot1 and 2 and when the MU181040A/B is installed in Slot 3 and 4. (Refer to Figure C.2-3 Restrictions of the case c) MU181020A，MU181020B: Slot1 MU181040A，MU181040B: Slot3...
  • Page 302 Appendix C Setting Restrictions • If the MU181040A-x20 or MU181040B-x20 Clock Recovery option is mounted and selected in an MU181040A/B module, adjust the clock recovery setting bit rate according to the frequency band for the other MU181040A/B modules. MP1800A-016 with four MU181020A and two MU181040A...
  • Page 303 Master module of MU181040A Figure C.2-3 Restrictions of the case c) When mounting MU181020A/B or MU181040A modules onto the MP1800A/MT1810A, note that the number of modules that can be mounted and the mounting positions (slots) vary depending on the option additionally installed in the MP1800A/MT1810A.
  • Page 304 Appendix C Setting Restrictions C.3 Settings Common in Combination System When the MU181040A is used in a Combination system, some setting items will apply to all the other modules in the Combination system. Table C.3-1 shows whether the setting items are common or independent in a Combination system.
  • Page 305 Settings Common in Combination System Table C.3-1 Common/Independent Setting Items in Combination System (Cont’d) Common/ Function Main Category Sub-Category Individual Setting Item Independent Measurement period unit (Unit) Common Measurement period time Common Clock count for measurement period Common Error count for measurement period Common Measurement Block count for measurement period...
  • Page 306 Appendix C Setting Restrictions Table C.3-1 Common/Independent Setting Items in Combination System (Cont’d) Common/ Function Main Category Sub-Category Individual Setting Item Independent Input condition Independent Differential type Independent Data/XData selection Independent Data input threshold Independent XData input threshold Independent Data input Data input threshold differential type Independent Data input threshold differential...
  • Page 307 Settings Common in Combination System Table C.3-1 Common/Independent Setting Items in Combination System (Cont’d) Common/ Function Main Category Sub-Category Individual Setting Item Independent Signal generation method Common Burst signal input Common Signal Burst trigger delay Independent generation (Pattern Burst trigger delay automatic adjustment Common Sequence) Burst signal interval...
  • Page 308 Appendix C Setting Restrictions Table C.3-1 Common/Independent Setting Items in Combination System (Cont’d) Common/ Function Main Category Sub-Category Individual Setting Item Independent Item Common Auto Adjust Slot selection Independent Measurement mode Common Auto Search Item Common Slot selection Independent Switching all measurement results display Common Measurement result display Common...
  • Page 309 Appendix D Performance Test Result Sheet D.1 Performance Test Result Sheet D.1.1 MU181040A 12.5Gbit/s Equipment Name: MU181040A 12.5Gbit/s ED Module Serial No.: Ambient Temperature: °C Relative Humidity: Table D.1.1-1 Operating Frequency Range Option Configuration Operating Frequency Range Specification Results MU181040A-001 No error occurs within the range from 9.8 to 12.5 GHz...
  • Page 310 Appendix D Performance Test Result Sheet D.1.2 MU181040B 14Gbit/s Equipment Name: MU181040B 14Gbit/s ED Module Serial No.: Ambient Temperature: °C Relative Humidity: Table D.1.2-1 Operating Frequency Range Option Configuration Operating Frequency Range Specification Results MU181040B-002 No error occurs within the range from 0.1 to 14 GHz MU181040B-003 No error occurs within the range from 0.1 to 14.05 GHz...

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