Pickup Settings; Self-Test Report; Overcurrent Simulation - GE TVRMS2 Series User Manual

TVRMS2 Digital Test Kit
Chapter 5. MicroVersaTrip Plus™ and MicroVersaTrip
5–2 Pickup Settings
The Test Kit cannot be used to check the pickup settings
of MicroVersaTrip Plus and MicroVersaTrip PM Trip
Units.
NOTE: Settings of MicroVersaTrip Plus and Micro-
VersaTrip PM Trip Units should be verified at the Trip
Unit display. The Trip Unit LCD always displays the
correct stored settings. The Test Kit is not designed to
read the settings of these Trip Units.
NOTE: Les réglages des MicroVersaTrip Plus et
MicroVersaTrip PM sont vérifiés sur l'écran des
déclencheurs. Cet écran indique les réglages memorisés.
Ces valeurs ne peuvent pas être visualisées avec l'écran du
Test Kit.
5–3 Self-Test Report
Select ( ) from the Trip Unit tests menu to
F3
SELF TEST
initiate the Trip Unit self-test. The test verifies the
operation of the following:
• Analog-to-digital converter
• Read-only memory (ROM)
• Random-access memory (RAM)
• Nonvolatile memory
If all modules pass the self-test, the following message is
displayed:
Trip Unit is OK
Trip Unit self-test display.
Press the ( ) key to return to the Trip Unit test
F3
MORE
menu or ( F4 ) to return to the function test menu.
EXIT
If the Trip Unit fails the self-test, a failure message is
displayed for each of the subunits that failed. If more than
one subunit failed, press the
all. The failure messages are displayed as follows:
A/D Converter Failed
... ..... ..... ..... ..... ..... .....
A/D converter failure message.
RAM Failed
... ..... ..... ..... ..... ..... ..... ..
RAM failure message.
|– MORE –|– EXIT –|
( ) key to display them
F3
MORE
|– MORE –|– EXIT –|
|– MORE –|– EXIT –|
PM Trip Units
™
ROM Failed
... ..... ..... ..... ..... ..... ..... ....
ROM failure message.
Non-volatile Memory Failed
... ..... ..... ..... ..... ..... ..... ..... .
Nonvolatile memory failure message.
Press the ( ) key after the last failure message to
F3
MORE
return to the Trip Unit test menu, or
to function test menu.
In the event of any subunit failure, remove the breaker
from service and refer the Trip Unit to an authorized GE
service representative.
5–4 Overcurrent Simulation
The Test Kit can simulate time-overcurrent conditions for
each of the following fault types:
• Long Time fault
• Short-time fault
• Ground fault
However, overcurrent simulations for MicroVersaTrip Plus
and MicroVersaTrip PM Trip Units may require that the
Long Time current, Short Time Pickup, and Ground Fault
Pickup settings be entered manually into the Test Kit. The
following sequence should be followed in order to perform
an overcurrent simulation with one of these Trip Units:
1. Connect the TVRMS2 Test Kit to the MicroVersaTrip
Plus or MicroVersaTrip PM Trip Unit and turn on
the Test Kit.
2. Select the Trip Unit on the appropriate Trip Unit
selection menu, then select
main test-selection menu and
the Trip Unit tests menu.
3. The Test Kit displays a Long Time Pickup value, as
shown:
LT Pickup .90X
|– MORE –|– VALUE –|– ENTER –|– EXIT –|
... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... ..... . . .
Long Time Pickup setting display #1.
In Setup mode on the Trip Unit, read the Long Time
Pickup setting from the Trip Unit display.
4. If the Long Time Pickup setting on the Test Kit
display does not match the value on the Trip Unit
display, press the
VALUE
the value displayed on the Test Kit matches the value
displayed on the Trip Unit.
16
|– MORE –|– EXIT –|
|– MORE –|– EXIT –|
) to return
EXIT (F4
( ) from the
F1
FUNCTION
( ) from
F1
TRIP TEST
( ) key on the Test Kit until
F2