Pulse Measurements Overview; Pulsed-Rf S-Parameters Versus Frequency - HP 8510 User Manual

Pulse Measurements Overview

This chapter contains information about how the HP 8510 pulsed-RF network analyzer system
measures pulsed-RF S-parameters versus frequency and versus time.
The pulsed-RF con guration allows use of vector network analysis techniques for two types of
measurements:
Pulsed-RF S-Parameters versus Frequency . The measurement is synchronized with the
pulse so that the measurement result is the S-parameter at a speci c user-speci ed point in
the pulse at each frequency of the sweep
Pulse Pro le . The system is tuned to a single frequency and the measurement is
synchronized with the pulse so that the measurement result is the S-parameter as a function
of time during the pulse.

Pulsed-RF S-parameters versus Frequency

Pulsed-RF tests in the frequency domain are accomplished by synchronizing the measurement
process with the pulse so that the measurement is made at a single, user-speci ed time
during the pulse. At each frequency, the sources are tuned, the RF is turned on, then the
measurement is made after a certain delay. Figure 4-1 shows an example of this \frequency
domain point-in-pulse" measurement using the internal pulse output and the internal
measurement trigger. For internal trigger mode, each data point of the trace represents the
response of the device to the pulsed stimulus at the same interval after the pulse is turned on.
For external trigger mode, each data point of the trace represents the response of the device to
the pulsed stimulus after the falling edge of the externally-generated measurement trigger.
Pulse Measurements Overview 4-1
4