Texas Instruments bq25606 User Manual
Texas Instruments bq25606 User Manual

Texas Instruments bq25606 User Manual

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This user's guide provides detailed testing instructions for the bq25606 evaluation module (EVM). Also
included are descriptions of the necessary equipment, equipment setup, test procedures, the printed-
circuit board layouts, schematics, and the bill of materials (BOM).
Throughout this user's guide, the abbreviations EVM, bq25606EVM, PWR772, and the term evaluation
module are synonymous with the bq25606 evaluation module, unless otherwise noted.
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Schematic
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Bill of Materials
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Original Test Setup for bq25606 EVM
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Device Data Sheets
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EVM Connections
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EVM Jumper Connections and Shunt Installation
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Recommended Operating Conditions
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Trademarks
All trademarks are the property of their respective owners.
SLUUBL3A - June 2017 - Revised October 2017
Submit Documentation Feedback
bq25606 PWR772 Evaluation Module
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Copyright © 2017, Texas Instruments Incorporated
SLUUBL3A - June 2017 - Revised October 2017
Contents
List of Figures
List of Tables
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bq25606 PWR772 Evaluation Module
User's Guide
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Summary of Contents for Texas Instruments bq25606

  • Page 1: Table Of Contents

    SLUUBL3A – June 2017 – Revised October 2017 bq25606 PWR772 Evaluation Module This user's guide provides detailed testing instructions for the bq25606 evaluation module (EVM). Also included are descriptions of the necessary equipment, equipment setup, test procedures, the printed- circuit board layouts, schematics, and the bill of materials (BOM).
  • Page 2: Introduction

    Device Data Sheet EVM Label Variant bq25606 SLUSCK6 BQ25606EVM-772 The bq25606 evaluation module (EVM) is a standalone charger module without I C control. I/O Descriptions Table 2 lists the jumper connections available on this EVM. Table 2. EVM Connections Jack...
  • Page 3: Test Summary

    The sensing resistor is 10 mΩ. An alternate method is to use the optional current meter in series to measure the battery current. SLUUBL3A – June 2017 – Revised October 2017 bq25606 PWR772 Evaluation Module Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 4 Test Summary www.ti.com 6. Install shunts as shown in Table Figure 1. Original Test Setup for bq25606 EVM bq25606 PWR772 Evaluation Module SLUUBL3A – June 2017 – Revised October 2017 Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 5: Test Procedure

    BAT pin and battery and measure the voltage across that resistor. The bq25606EVM has the sensing resistors onboard. SLUUBL3A – June 2017 – Revised October 2017 bq25606 PWR772 Evaluation Module Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 6: Pcb Layout Guideline

    See the EVM design for the recommended component placement with trace and via locations. For the QFN information, see Quad Flatpack No-Lead Logic Packages QFN/SON PCB Attachment. bq25606 PWR772 Evaluation Module SLUUBL3A – June 2017 – Revised October 2017 Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 7: Board Layout

    Figure 2. bq25606EVM Top Overlay Figure 3. bq25606EVM Top Solder Mask Figure 4. bq25606EVM Top Layer Figure 5. bq25606EVM Signal Layer 1 SLUUBL3A – June 2017 – Revised October 2017 bq25606 PWR772 Evaluation Module Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 8: Bq25606Evm Signal Layer

    Figure 6. bq25606EVM Signal Layer 2 Figure 7. bq25606EVM Bottom Layer Figure 8. bq25606EVM Bottom Solder Mask Figure 9. bq25606EVM Bottom Overlay bq25606 PWR772 Evaluation Module SLUUBL3A – June 2017 – Revised October 2017 Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 9: Schematic For Bq25606Evm-772

    Schematic www.ti.com Schematic Figure 10 shows the schematic for the bq25606 EVM. 1µH TP25 TP26 TP24 TP27 0.005 Vbus: 3.9V to 14V VBUS System PMID 0.01 1µH 5,6,8 0.01 REGN 0.047µF 1,2, CSD17571Q2 JP16 1µF 1µF 1µF 1000pF 10µF 10µF 0.1µF...
  • Page 10: Bq25606Evm-772 Bom

    1 × 2 Shunt, 100 mil, Gold plated, Black Shunt 969102-0000-DA SNT-100-BK-G Samtec JP4, SH-JP6, SH-JP7, SH-JP10, SH-JP12, SH- JP13, SH-JP14 bq25606 PWR772 Evaluation Module SLUUBL3A – June 2017 – Revised October 2017 Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 11 Resistor, 10, 5%, 0.063 W, 0402 0402 CRCW040210R0JNED Vishay-Dale Switch, Normally open, 2.3-N force, 200-k operations, SMD KSR221GLFS CampersandK Components SLUUBL3A – June 2017 – Revised October 2017 bq25606 PWR772 Evaluation Module Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 12 Compact Probe Tip Circuit Board Test Points, TH, 25 per TH Scope Probe 131-5031-00 Tektronix TP12 Test Point, Miniature, White, TH White Miniature Testpoint 5002 Keystone bq25606 PWR772 Evaluation Module SLUUBL3A – June 2017 – Revised October 2017 Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 13 Changes from June 2, 2017 to September 30, 2017 ....................... Page .................... • Changed Schematic for bq25606EVM-772 ..................... • Changed bq25606EVM-772 BOM SLUUBL3A – June 2017 – Revised October 2017 Revision History Submit Documentation Feedback Copyright © 2017, Texas Instruments Incorporated...
  • Page 14 IMPORTANT NOTICE FOR TI DESIGN INFORMATION AND RESOURCES Texas Instruments Incorporated (‘TI”) technical, application or other design advice, services or information, including, but not limited to, reference designs and materials relating to evaluation modules, (collectively, “TI Resources”) are intended to assist designers who are developing applications that incorporate TI products;...

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Pwr772

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