Exposure Metering Methods - Leica X Manual

EN EXPOSURE METERING AND CONTROL

Exposure metering methods

To adjust to the prevailing lighting conditions, the situation and your
working method and compositional ideas, the Leica X provides you
with three exposure metering methods:
Select
Exposure Metering
the submenu
Multiple field metering -
With this metering method, the camera automatically analyses the
brightness differences in the subject and, by comparing them with
programmed brightness distribution patterns, arrives at the likely
position of the main subject and the corresponding best exposure.
As a result, this method is particularly suitable for spontaneous,
uncomplicated and yet reliable photography, even under difficult
conditions, and therefore for use in conjunction with automatic
program mode.
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in the menu, and the desired setting in
Center weighted metering -
This metering method allocates the highest weighting to the center of
the image field, but also records all other areas.
Particularly when used in conjunction with metering memory lock, it
allows the exposure to be selectively adjusted to particular parts of
the subject, while simultaneously taking account of the entire image
field.
Spot metering -
This metering method is concentrated exclusively on a tiny area in the
center of the image. It allows exact measurement of small or tiny
details for precise exposure – preferably in conjunction with a manual
setting.
For backlit pictures, for example, you normally need to prevent the
brighter surroundings causing underexposure of the main subject.
The much smaller metering field with spot metering enables these
subject details to be selectively evaluated.