Smart Trip - Seagate XF1230-1A0240 Product Manual

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Table 15 SMART Attributes (continued)
ID
172 Erase Fail Count
174 Unexpected Power Loss Count
175 Maximum Program Fail Count
176 Maximum Erase Fail Count
177 Endurance Used
178 Used Reserved Block Count
179 Used Reserved Block Count
180 End to End Error Detection Rate
181 Program Fail Count
182 Erase Fail Count
183 SATA Downshift Count
184 End to End Error Detection Count
187 Uncorrectable Error Count
188 Command Timeout Count
194 Temperature (Celsius)
195 ECC Uncorrectable Error Rate
197 Current Pending Sector Count
201 Uncorrectable Soft Read Error Rate (UECC)
204 Soft ECC Correction Rate
231 SSD Life Left (%)
234 Vendor Specific
241 Total LBAs Written
242 Total LBAs Read
250 Read Error Retry Rate
6.3

SMART Trip

SMART trip (threshold exceeded condition) indicates impending degradation or fault condition. The host can issue a
SMART return status command (B0h/DAh) to communicate the reliability status of the drive. The threshold-exceeded
condition is also checked during drive self tests.
Seagate Nytro XF1230 SATA SSD Product Manual, Rev. B
Attribute ID
Number of Error Events on Erase
Number of Issue on Unexpected Power Loss
Maximum number of Program Error Events per die
Maximum number of Erase Error Events per die
Indicates the number of NAND wear
Number of used reserved blocks
Number of used reserved blocks in SSD
Number of error detections of the data path between host and NAND in SSD
during last power-on
Number of Error Events on Program (Lifetime)
Number of Error Events on Erase (Lifetime)
Number of times that SATA interface speed reduced
Number of error detection of the data path between host and NAND in SSD of
lifetime
Uncorrectable Error Count
Number of total uncompleted commands
Temperature of the SSD
Uncorrectable Error Count vs. Total read sector count
Number of unstable sectors which will be remapped on next write
Number of soft read errors (Count of UECC Error)
Count of errors corrected by software ECC [citation needed]
Indicates the approximate SSD life left, in terms of program/erase cycles or Flash
blocks currently available for use
Information of Vendor
The total number of 512-byte sectors written during the entire lifetime of the
device.
The total number of 512-byte sectors read during the entire lifetime of the
device.
There is no reliable information available about this attribute.
Description
SMART Support
18