Toshiba Satellite L300 Maintenance Manual page 106

3.6 Memory Test
1. Bit Stuck High Test
2. Bit Stuck Low Test
3. Checker Board Test
4. CAS Line Test
5. Incremental Test
6. Decrement Test
7. Incremental / Decrement Test
Subtest 04
Satellite L300D,Satellite Pro L300, EQUIUM L300,SATEGO L300 Maintenance Manual
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test coverage would be based on the setting and the value in 'Percent (%)
mentioned at below.
Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL.
Percent (%): Choose the percentage of the defined range of the memory to
be tested.
Time Limit(h): Choose or Input the time (hour) of the defined range of the
memory to be tested.
Time Limit(m): Choose or Input the time (minute) of the defined range of
the memory to be tested.
Data pattern: Every bit is '1' (Each bit is high)
Data pattern: Every bit is '0'(Each bit is low);
Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010
(0xA);
Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and
1111(0xF);
Data pattern: A series of increasing data from 0 by adding 1 each time;
Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by
subtracting 1 each time;
Data Pattern is a series of data whose low byte is increasing data from 0x00
and high byte is decreasing data from 0xFF.
Extended Pattern
3 Diagnostic Programs
37