National Instruments DAQ 6527 User Manual page 37

Isolated digital i/o interface for pci, pxi, and compactpci
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Physical
Environment
Note
Non-operational random vibration profiles were developed in accordance
with MIL-T-28800E and MIL-STD-810E Method 514. Test levels exceed those
recommended in MIL-STD-810E for Category 1 (Basic Transportation, Figures 514.4-1
through 514.4-3).
Safety
© National Instruments Corporation
Dimensions (not including connectors)
PCI-6527 ......................................... 17.5
PXI-6527......................................... 16
I/O connector.......................................... 100-pin keyed female
Operating temperature............................ 0 to 50 C
Storage temperature ............................... –20 to 70 C
Relative humidity ................................... 10% to 90% noncondensing
Functional shock (PXI-6527)................. MIL-T-28800 E Class 3 (per
Operational random vibration
(PXI-6527) ............................................. 5 to 500 Hz, 0.31 g
Nonoperational random vibration
(PXI-6527) ............................................. 5 to 500 Hz, 2.5 g
Designed in accordance with IEC/EN 61010-1, UL 3111-1, and
CAN/CSA C22.2 No. 1010.1 for electrical measuring and test equipment.
Maximum altitude .................................. 2000 m
Pollution degree ..................................... 2
Overvoltage category ............................. CAT I
Indoor use only
ribbon-cable connector
Section 4.5.5.4.1); half-sine shock
pulse, 11 ms duration, 30 g peak,
30 shocks per face
A-3
Appendix A
Specifications for
10.7 cm (6.9
4.2 in.)
10 cm (6.3
3.9 in.)
, 3 axes
rms
, 3 axes
rms
6527 User Manual

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