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CEh
ALDC ERROR
CFh
ILLEGAL DMA COMPLETION
E0h
DMA is Aborted
E4h
FMK Encountered
E5h
SMK Encountered
E6h
BOP Encountered
E7h
EOD Encountered
E9h
DMA ERROR
F0h
MIC BROKEN ERROR
F7h
APPEND POSITION ERROR
F8h
ILLEGAL TAPE
F9h
ILLEGAL FIRMWARE
FAh
UNDEFINED TAPE
Diagnostic Tests Requiring Additional Parameters
7.2.7.
The diagnostic tests which require additional information in the Parameter A, B & C bytes are:
02
Error Rate Test
43
Read Data Exerciser
Error Rate Test (02) Diagnostic Parameters
7.2.7.1.
This test reads or writes the number of groups defined by the Group Count. Any RAW retries, C3 ECC retries and
Read/Write hard errors encountered during the test are reported in the Error Rate Log which may then be examined
to determine tape performance.
Bit
7
Byte
0
1
2
Test Pattern
3
(MSB)
4
The Test Pattern and RND fields are only relevant if the test includes a write pass, otherwise their values are
ignored.
Test Pattern: 0-all ZEROs
1-All ones
2-Alternating ones and ZEROs
3-Rotating data bytes (0,1,2,...,255)
4-Pseudo-random data
5-Worst case (C6h) bytes
BOT:
0-Space to EOD before beginning write test
1-Rewind to BOT before beginning read or write test
RND:
0-Randomizer is disabled during test
1-Randomizer is enabled during test
WRT & RD control bits: The following table shows the operation of the Error Rate Test with different combinations of
the WRT & RD bits.
SONY AIT-E Turbo drive SDX-250V series Ver.1.0
Table 7-5: Error Rate Test Data
6
5
4
Diagnostic Test Number (02h)
BOT
Error set 2–Diagnostic error
02h
MAIN PROCESSOR ROM CHECK SUM TEST
FAILURE
06h
MAIN PROCESSOR DESTRUCTIVE RAM TEST
FAILURE
07h
MAIN PROCESSOR NON DESTRUCTIVE RAM
TEST FAILURE
11h
EEPROM CHECKSUM TEST FAILURE
12h
BUFFER RAM TEST FAILURE
14h
INTERNAL MESSAGE BUS TEST FAILURE
15h
DATA COMPRESSION DMA LINE TEST
FAILURE
20h
MECHANISM CONTROLLER
MICROPROCESSOR TEST FAILURE
3
2
Loop Count
RND
WRT
Group Count
7.Drive Diagnostics
1
0
RD
NLR
(LSB)
7-7
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