System Description; Who Should Make Pulsed-Rf Measurements - HP 8510 User Manual

System Description

This chapter contains the following information.
A description of the HP 8510 Pulsed-RF Network Analyzer System.
A simpli ed block diagram of the HP 8510 Pulsed-RF Network Analyzer System.
A signal ow diagram of the HP 85110-series S-parameter Test Set.

Who Should Make Pulsed-RF Measurements?

Pulsed-RF stimulus may be required in cases where continuous application of the test signal
could destroy the device, such as when testing occurs prior to packaging, or where the device
must be tested using a PRF and duty cycle that accurately represents its nal application.
The HP 8510 pulsed-RF network analyzer con guration adds specialized hardware and an
optimized rmware feature set to make fully error-corrected S-parameter measurements of
pulsed-RF responses. For the rst time, the combination of wideband IF and accurate timing
circuits provides precise synchronization with the pulse, allowing S-parameters to be measured
at a precisely known, repeatable time during the pulse. This extends the HP 8510 applications
into two major areas: tests in which the stimulus signal to the device is pulsed, and tests of
devices which accept a CW input and produce a pulsed output.
The HP 8510 pulsed-RF network analyzer system allows you to calibrate in the same
environment as your measurement. For example, if you are making a high power, pulsed-RF
measurement, you can calibrate in the same high power, pulsed-RF mode. Calibration data is
taken only while the pulse is on. This type of calibration may prevent damage to calibration
standards that would be damaged in high power, CW calibrations.
The recommended con guration of the HP 85108 Pulsed-RF Network Analyzer consists of the
following items.
HP 8510B/C network analyzer equipped with Option 008, Wideband IF, and HP 8510
rmware revision B.05.11 or greater (for the HP 8510B), or revision C.06.54 or greater (for
HP 8510C).
HP 83622 synthesized sweeper with options 001, 003, 004, and 008.
HP 83624 synthesized sweeper with options 003, 004, and 008.
HP 85110-series pulsed-RF fundamentally mixed S-parameter test set
Also, other external equipment such as power ampli ers, bias supplies and pulse generators
may be included in the system.
2
System Description 2-1