Toshiba Satellite C650D Maintenance Manual page 102

3.7 Storage
6. SMART Test
SMART stands for Self-Monitoring, Analysis and Reporting Technolo
SMART test will compare the attribute values with the threshold value in the
HDD's controller to confirm whether there is any failure in the HDD
Subtes t 02 ODD
The ODD test runs on IDE CDROM/DVD-ROM & CD-RW. It will check the ODD
driver's functionalit
1. Controller Test
Check the CDROM c
2. Data Transfer Rate
Check the data transfer rate of the ODD drive. It will read data from the ODD disc
and calculate the data tra
3. Data CD Butterfly Seek
Check the seek function of the ODD drive. It will perform a serial of seeking
operations. First, locate the minimum LBA address, then the maximum, the sub-
minimum, the sub-maxim
4. Data CD Random Seek
Check the random seek function of ODD drive. Random access will reflect the
performance of the heads'
5. Data CD Sequence Seek
Check the sequential seek function of ODD drive. Perform location test to CD-
RW under LBA
6. Tray Eject Test
Check the eject function of the ODD. It will eject the ODD and ask the user to
confirm if the operation succeeds.
y and performance.
ontroller's status.
nsfer rate. This test needs a data CD.
um and meet at center point. This test needs a data CD.
random movement and seek. It tests for 1000 times.
mode with the location address increasing in sequence.
Satellite/Satellite Pro/C650D/C655D Maintenance Manual
3 Diagnostic Programs
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