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1.2.14
Raster Size Regulation
Raster Size change caused by change of CRT beam current
0 to 200µA is less than 2 mm.
1.2.15
Linearity and Geometry
Linearity measured and calculated
by
the following
formula is less
t~an
7%.
Formula
MAX -
MIN
MEAN
1
x -2- x 100
(%)
Raster distortion is less than
2%
of
~~ster
height.
1.2.16
Indentification and Marking
~arki~g
and
:Qbe~s
are as follows.
a)
HEW labels on CRT and Chassis
b)
High Voltage warning labels on the cover and
chassis
c)
Rating label
d)
Serial Number labels on chassis and on the Package
1.2.17
Arrangement of controls
The following fr:-nt panel controls are provided, which
which are easily accessible
~~
the operator:
1)
BRIGHTNESS CONTROL
2)
GAIN
CONTROL
3)
DEGAUSS SW
4)
POWER SW
1.2.18
Configura~ion
1)
Dimension
Refer to attached Drawings Fig.1-2.
1-7
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