Test Patterns.ml - Hameg HM 203-7 Manual

Test patterns
Single Components Single Transistors
Mains transformer prim. Capacitor 33 (iF Junction E-C FET
Single Diodes In-circuit Semiconductors
Rectifier Thyristor G + A together
Diode paraiieled by 680 Q 2 Diodes antiparallei
Diode in series with 51Q B-E paraiieled by 680 Q
B-E with 1 |rF +680 Q Si-diode with 10(iF
Ml 6 203-7
Subject to change without notice