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Opto-electronic Network Analyzer
Systems
ME7848A-0240, 40 GHz 850 nm System
ME7848A-0270, 70 GHz 1550 nm System
ME7848A-0271, 70 GHz 1310 nm System
ME7848A-0272, 70 GHz 1310/1550 nm System
ME7848A-0140 40 GHz, 850 nm System (VNA and O/E module only)
ME7848A-0170 70 GHz, 1550 nm System (VNA and O/E module only)
ME7848A-0171 70 GHz, 1310 nm System (VNA and O/E module only)
ME7848A-0172 70 GHz, 1310/1550 nm System (VNA and O/E module only)
Anritsu Company
Part Number: 10410-00777
490 Jarvis Drive
Revision: B
Morgan Hill, CA 95037-2809
Published: January 2022
USA
Copyright 2022 Anritsu Company. All rights reserved.
http://www.anritsu.com
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Summary of Contents for Anritsu Company VectorStar ME7848A-0240
- Page 1 ME7848A-0171 70 GHz, 1310 nm System (VNA and O/E module only) ME7848A-0172 70 GHz, 1310/1550 nm System (VNA and O/E module only) Anritsu Company Part Number: 10410-00777 490 Jarvis Drive Revision: B Morgan Hill, CA 95037-2809 Published: January 2022 Copyright 2022 Anritsu Company. All rights reserved. http://www.anritsu.com...
- Page 2 NOTICE Anritsu Company has prepared this manual for use by Anritsu Company personnel and customers as a guide for the proper installation, operation and maintenance of Anritsu Company equipment and computer programs. The drawings, specifications, and information contained herein are the property of Anritsu Company, and any unauthorized use or disclosure of these drawings, specifications, and information is prohibited;...
- Page 3 1. Minimum Configurations Opto-electronic Network Analyzer System The ME7848A opto-electronic network analyzer (ONA) system comprises a VNA, a calibration O/E module, and a laser/modulator converter assembly. Together, they allow calibrated RF response measurements of E/O, O/E, and certain O/O devices. This document describes the system components, basic connection and operation information, and some simple test steps to assure that the system is operating normally.
- Page 4 1. Minimum Configurations Table 1. ME7848A ONA System Configuration Options (2 of 2) MS4747B 70 GHz VectorStar VNA with Option 051, 061, or 062 MN4765B-0071 70 GHz 1310 Calibration Module (with characterization files) MN4775A-0071 70 GHz 1310 nm E/O Converter 2000-1958-R Accessory Kit which includes: ME7848A-0271 •...
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Page 5: System Connections
2. System Connections System Connections The basic system connections are illustrated in Figure 1. Port 1 of the VNA is connected to the E/O modulator (the MN4775A in the -02xx systems) and Port 2 of the VNA is connected to the MN4765B O/E calibration module. - Page 6 2. System Connections The user's DUT (an E/O, O/E or O/O device) would substitute into one of the positions shown in the figure and the remaining system components calibrated or de-embedded out to reveal the DUT response. The MN4765B can also be connected to VNA Port 1 (and E/O converter to VNA Port 2) if desired. Figure 2.
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Page 7: System Check
3. System Check Consult the ME7848A Technical Data Sheet – 11410-01145 for more information on the amount of dynamic range/noise floor improvement possible with the ‘reversed’ vs. the ‘normal’ coupler arrangement, but it is generally on the order of 10 dB at low frequencies, decreasing to 0 dB slightly above 40 GHz. Figure 4. - Page 8 3. System Check 5. For the ME7848A-0240: a. Configure the MN4775A-0040 E/O Converter: i. Turn the laser on. ii. Set modulator bias to quadrature and dither. A. Initiate a bias calibration. iii.Set VOA (variable optical amplifier) to constant power output and -3 dBm. 6.
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Page 9: Functional Test
3. System Check Figure 2. Example Plot of |S21| for the System Check on a ME7848A-0270 System at +5 and +2 dBm Optical Power Levels. The absolute values and approximate shape are of interest. Figure 2, the blue curve is at 5 dBm optical power out of the modulator which is the test condition mentioned above. - Page 10 4. Making Opto-electronic Component Measurements 3. The response is the absolute detected power and will have a similar shape to the |S21| plots in the previous section but the numerical levels will be different. Figure 3. Example Plot of the Functional Test at +5 and +2 dBm Optical Power Levels An example plot of the functional test is shown in Figure 3 for the ME7848A-0270 system at +5 dBm optical...
- Page 11 4. Making Opto-electronic Component Measurements • To study individual components (i.e., an E/O converter of interest is to be inserted into the path), the other components need to be de-embedded. There are many ways to start this process, but for reasons of maximum accuracy and traceability, the MN4765B O/E module is delivered with a characterization file describing its behavior).
- Page 12 4. Making Opto-electronic Component Measurements Figure 4. E/O Measurement Dialog O/E Measurements In this case, the E/O device must be de-embedded. Sometimes, the .s2p file of that device is available but, if not, a two-step process is used. The MN4765B is connected to the E/O device (the MN4775A usually) and the VNA tools are used to generate the .s2p file for the MN4775A by de-embedding the MN4765B.
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Page 13: Regulatory Compliance
5. Regulatory Compliance O/O Measurements These measurements require de-embedding of both O/E and E/O devices and the pattern should be obvious from the previous subsections. The O/O measurements described here are slightly different from those one might conduct with optical power meters or optical spectrum analyzers in that the system monitors what happens to the RF envelope. - Page 15 Anritsu Company 490 Jarvis Drive Anritsu utilizes recycled paper and environmentally conscious inks and toner. Morgan Hill, CA 95037-2809 http://www.anritsu.com...
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