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Agilent 16451B DIELECTRIC MATERIAL TEST FIXTURE Operation Manual
Change 1
Following note is added on the following designated locations.
NOTE
Be careful not to contaminate or not to make a scratch on the surface of the electrode. A scratch or contamination of
the electrode's surface sometimes prevents the measured capacitance from falling within the limits shown in
"Electrode Adjustment" (Page 3-36). If it happens, replace the scratched/contaminated electrode or contact your
nearest Agilent Technologies Sales and Service Office. As long as the measured capacitance falls within the limits, the
electrode doesn't need to be replaced or repaired.
Locations:
1. Page 3-29
2. Page 3-37
3. Page 3-41
4. Page 3-44
5. Page 4-8
Change 2
Correct Table 1-2 (Page1-4) as follows.
Compatible Instrument Model
4192A LF Impedance Analyzer
4194A Impedance/Gain-Phase Analyzer
4263B LCR Meter
4268A 120Hz/1kHz Capacitance Meter
4278A 1 kHz/1 MHz Capacitance Meter
4279A 1 MHz C-V Meter
4284A Precision LCR Meter
4285A Precision LCR Meter
4288A 1 kHz/1 MHz Capacitance Meter
4294A Precision Impedance Analyzer
E4980A Precision LCR Meter
Change 3
Correct the note for table 1-2 in page 1-4.
*1: The upper frequency of the 4194A is 40 MHz but it is limited to 30 MHz when used with the 16451B.
*2: The upper frequency of the 4294A is 110 MHz but it is limited to 30 MHz when used with the 16451B.
Copyright 2008 Agilent Technologies
C
Advanced Test Equipment Rentals
www.atecorp.com 800-404-ATEC (2832)
Manual Change
Measurement
Frequency Range
5 Hz - 13 MHz
*1
100 Hz - 40 MHz
100Hz - 100kHz
120Hz/1kHz
1 kHz/1 MHz
1 MHz
20 Hz - 1 MHz
75kHz - 30MHz
1 kHz/1 MHz
*2
40Hz - 110MHz
20 Hz – 20 MHz
Agilent Part No. N/A
June 2008

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Summary of Contents for Agilent Technologies 16451B

  • Page 1 Correct the note for table 1-2 in page 1-4. *1: The upper frequency of the 4194A is 40 MHz but it is limited to 30 MHz when used with the 16451B. *2: The upper frequency of the 4294A is 110 MHz but it is limited to 30 MHz when used with the 16451B.
  • Page 2 Correct the text in page 2-3 as follows. Function Test fixture for measuring dielectric constant and dissipation factor. Permits connecting solid materials to the unknown terminals(4-terminal pair configuration) of the 4192A, 4194A, 4263B, 4268A, 4278A, 4279A, 4284A, 4285A, 4288A ,4294A and E4980A. Copyright 2008 Agilent Technologies ○...
  • Page 3 Replace the contents of page 2-4 by the following, Dissipation Factor Accuracy (Δ tan δ) The surfaces of material are assumed to be ideally parallel, flat and smooth. The above equation is only compatible for electrodes A and B. Copyright 2008 Agilent Technologies ○...
  • Page 4 Change 7 Correct the sentence at “16451B Overview” in page 3-1. The 16451B is a test fixture for measuring disc and lm dielectric materials when connected to Agilent’s LCR meters or impedance analyzers, and is usable up to 30 MHz.
  • Page 5 Agilent 16451B DIELECTRIC MATERIAL TEST FIXTURE Operation Manual マニュアル チェンジ Agilent Part No. N/A June 2008 変更 1 下記脚注を以下に指定するページに追加してください。 記: 電極の表面は汚したりキズをつけることのないよう取り扱いには十分注意してください。電極表面上の汚れやキズ によって容量を測定する際、“電極の調節” (Page 3-33) で提示されるリミットの範囲に収まらない可能性が発生し ます。 このような状況が発生した場合には電極を交換するかお近くのアジレントテクノロジーの営業、もしくはサービスまで お問い合わせください。 容量を測定した際、その測定結果がリミットに収まっている場合には、電極を交換する必要はありません。 追加箇所: 1. Page 3-26 2. Page 3-33 電極の平行度の粗調節の項の前 3. Page 3-37 電極水平置きの微調節の項の前...
  • Page 6 変更 3 1-4 ページの表 1-2 の脚注を下記に変更してください。 *1: 16451B を使用する際の 4194A の測定周波数の上限は、30 MHz となります。 *2: 16451B を使用する際の 4294A の測定周波数の上限は、30 MHz となります。 変更 4 1-5 ページの 表 1-3 を以下の表に差し替えてください。 Instrument Model Correction Function 1m Cable Compensation Number 4192A OPEN/SHORT available 4194A OPEN/SHORT...
  • Page 7 6-2: 2-4 ページ 測定確度の項に下記を追加してください。 電極 A と電極 B だけに対応する確度を表す。 被測定材料の両面が理想的に平行・平坦で滑らかであることを前提とする。 Copyright 2008 Agilent Technologies ○...
  • Page 8 Copyright 2008 Agilent Technologies ○...
  • Page 9 信号レベル: 500 mV BW: 5 ケーブル長: 1m 補正: オープン/ショート/ロード 変更 7 3 章 16451B の概要のテキストを以下に変更してください。 16451B の概要 16451B は、Agilent 製 LCR メータやインピーダンス・アナライザに接続して、板状およびフィルム状の誘電材料を測 定するためのテスト・フィクスチャで最高 30MHz までの周波数で使用できます。 16451B はフィクスチャ・アセンブリと 4 種の交換可能はガード付主電極、および誤差補正用治具によって構成されて います。図3-1は 16451B のフィクスチャ・アセンブリを、図3-2は 16451B に付属しているアクセサリを示していま す。 Copyright 2008 Agilent Technologies ○...
  • Page 11 NOTE Manual change supplement are revised as often as necessary to keep manuals as current and accurate as possible. Agilent Technologies recommends that you periodically request the latest edition of this supplement. Free copies are available from all Agilent Technologies offices.
  • Page 12 Page 4-5, Table 4-3. Replaceable Parts List (3 of 5) Reference   Designator Part Number Description 16451-20022 Base...
  • Page 13 Agilent 16451B DIELECTRIC TEST FIXTURE OPERATION AND SERVICE MANUAL SERIAL NUMBERS Agilent Part No. 16451-90020 Printed in JAPAN October 2000...
  • Page 14 Notice...
  • Page 15 Manual Printing History : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : :...
  • Page 16: Safety Summary

    Safety Summary WARNINGS The Agilent Technologies assumes no liability for the customer's failure to comply with these requirements. DO NOT Operate In An Explosive Atmosphere DO NOT Substitute Parts Or Modify Instrument Dangerous Procedure Warning Warnings Warning Dangerous voltages, capable of causing death, are present in this xture.
  • Page 17 How To Use This Manual Chapter 1 Installation Chapter 2 General Information Chapter 3 Operation Chapter 4 Service Appendix A Manual Changes Appendix B Recommended Capacitance Range Appendix C Error Correction Procedure Appendix D Sample Program Appendix E Bibliography...
  • Page 18: Warranty

    Typeface Bold Conventions icons Italics lename HARDKEYS NNNNNNNNNNNNNNNNNNNNNNNNNN NNNNN Warranty...
  • Page 19: Limitation Of Warranty

    tness for a particular purpose. Exclusive The remedies provided herein are buyer's sole and exclusive Remedies remedies. Agilent Technologies shall not be liable for any direct, indirect, special, tract, tort, or any other legal theory. Assistance...
  • Page 21 Contents 1. Installation 2. General Information Contents-1...
  • Page 22 3. Operation Contents-2...
  • Page 23 4. Service A. Manual Changes B. Recommended Capacitance Range C. Correction Procedure Contents-3...
  • Page 24 D. Sample program E. Bibliography Index Contents-4...
  • Page 25 Figures Contents-5...
  • Page 26 Contents-6...
  • Page 27 Tables Contents-7...
  • Page 29: Installation

    Installation Introduction WARNING CAUTION NOTE Product Description Installation...
  • Page 30: Initial Inspection

    Initial Inspection Installation...
  • Page 31 Figure 1-1. Product Overview Table 1-1. Contents Description Agilent Part Number QTY Installation...
  • Page 32 Compatible Measurement Instruments Table 1-2. Measurement Frequency Range of Compatible Instruments Compatible Instrument Model Measurement Frequency Range Error Correction Installation...
  • Page 33 Table 1-3. Correction Functions of the Compatible Instruments Instrument Correction 1 m Cable Model Number Function Compensation Installation...
  • Page 35: General Information

    General Information Introduction Note dielectric constant Safety Considerations General Information...
  • Page 36 Serial Number Figure 2-1. Serial Number Plate Appendix A, Manual Changes. General Information...
  • Page 37: Speci Cations

    Speci cations Function Frequency Range Applicable Voltage Range Cable Length (setting) Operating Temperature Operating Humidity Weight Furnished Accessories and Quantity Description Quantity General Information...
  • Page 38: Supplemental Performance Characteristics

    Supplemental Performance Characteristics " 0 Measurement " " 0 Accuracy when using contact electrode  < method " 0 " 0 " " 0  < " 0 " tan  " 0 " 0 " " General Information...
  • Page 39 Permittivity Measurement Accuracy including 4294A (Supplemental Characteristics) Figure 2-2. Electrode A, MUT Thickness: 1mm General Information...
  • Page 40 Figure 2-3. Electrode B, MUT Thickness: 1mm General Information...
  • Page 41 Electrode Dimensions Guarded/Guard Electrode (4 types, changeable) Figure 2-4. Dimensions of Electrode-A Figure 2-5. Dimensions of Electrode-B General Information...
  • Page 42 Figure 2-6. Dimensions of Electrode-C Figure 2-7. Dimensions of Electrode-D General Information...
  • Page 43 Unguarded Electrode Figure 2-8. Dimensions of Unguarded Electrode Available Test Material Dimensions Table 2-1. Available Test Material Dimensions Electrode Diameter Thickness Guarded Used Electrode Diameter General Information...
  • Page 44 Micrometer Resolution Dimensions of Fixture Assembly Figure 2-9. Dimensions of Test Fixture Assembly 2-10 General Information...
  • Page 45 Storage and Repacking Environmental Requirements Original Packaging FRAGILE Other Packaging FRAGILE General Information 2-11...
  • Page 47: Operation

    DO NOT apply more than 42 V total test signal level and peak dc bias voltage to the unknown terminals. An electrical shock hazard will exist during operation when the DC bias voltage is greater than 42 V DC. 16451B Overview Fixture Assembly Operation...
  • Page 48 Figure 3-1. Fixture Assembly Operation...
  • Page 49 Table 3-1. Name of Fixture Assembly Name of Part Description Caution Operation...
  • Page 50 Furnished Accessories Figure 3-2. Furnished Accessories Operation...
  • Page 51 Table 3-2. Name of Furnished Accessories Name of accessory Description Operation...
  • Page 52 Dielectric Measurement Basic Basic theory Figure 3-3. Basic Model for Dielectric Measurement Operation...
  • Page 53 Operation...
  • Page 54 Guard Electrode Figure 3-4. Capacitance Measurement using Unguarded Electrode System Figure 3-5. Capacitance Measurement using Guarded Electrode System Operation...
  • Page 55: Measurement Method

    Measurement Method Contacting Electrode method (Rigid Metal electrode) Contacting Electrode method (Thin Film electrode) Non-Contacting Electrode method (Air Gap method) Operation...
  • Page 56 Figure 3-6. Summary of Measurement Methods 3-10 Operation...
  • Page 57 Contacting Electrode Method (used with Rigid Metal Electrode) Principle Figure 3-7. Contacting Electrode Method (Rigid Metal Electrode) Operation 3-11...
  • Page 58 3-12 Operation...
  • Page 59 Electrodes of the 16451B Figure 3-8. Electrode of the 16451B for Contacting Electrode Method (Rigid Metal Electrode) Operation 3-13...
  • Page 60 Applicable Size of Test Material for Electrode-A (38 mm Guarded/Guard Electrode) Figure 3-9. Applicable Size of Test Material for Electrode-A 3-14 Operation...
  • Page 61 Applicable Size of Test Material for Electrode-B (5 mm Guarded/Guard Electrode) Figure 3-10. Applicable Size of Test Material for Electrode-B Operation 3-15...
  • Page 62 Contacting Electrode Method (used with Thin Film Electrode) Principle Figure 3-11. Contacting Electrode Method (Thin Film Electrode) 3-16 Operation...
  • Page 63 Thin Film Electrode Operation 3-17...
  • Page 64 Electrodes of the 16451B Figure 3-12. Electrode of the 16451B for Contacting Electrode Method (Thin Film Electrode) 3-18 Operation...
  • Page 65 Applicable Size of Test Material for Electrode-C (Guarded/Guard Electrode for Large Thin Film Electrode) Figure 3-13. Applicable Size of Test Material for Electrode-C Operation 3-19...
  • Page 66 Applicable Size of Test Material Electrode-D (Guarded/Guard Electrode for Small Thin Film Electrodes) Figure 3-14. Applicable Size of Test Material for Electrode-D 3-20 Operation...
  • Page 67 Non-contacting Electrode Method (Air Gap Method) Principle Figure 3-15. Non-contacting method (Air Gap method) Operation 3-21...
  • Page 68 3-22 Operation...
  • Page 69 Electrodes of the 16451B Figure 3-16. Electrode of the 16451B for Non-Contacting Electrode Method (Air Gap Method) Operation 3-23...
  • Page 70 Applicable Size of Test Material for Electrode-A (38 mm Guarded/Guard Electrode) Figure 3-17. Applicable Size of Test Material for Electrode-A 3-24 Operation...
  • Page 71 Applicable Size of Test Material for Electrode-B (5 mm Guarded/Guard Electrode) Figure 3-18. Applicable Size of Test Material for Electrode-B Operation 3-25...
  • Page 72 Preparation of Test Material Shape and Size of Test Material Caution Thickness of Test Material Note 3-26 Operation...
  • Page 73 Flatness of Test Material's Surface Thin Film Electrode Metal Foil, Conductive Paint, Fired on Silver, Sprayed Metal, Evaporated Metal Metal Spattering ASTM Standards:D150-81,\Standard Test Method for A-C Loss Characteristics and Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials" Operation 3-27...
  • Page 74: Connecting To The Instrument

    Connecting to the Instrument Changing the Guarded/Guard Electrode Figure 3-19. Screw Position to Attach Guarded/Guard Electrode 3-28 Operation...
  • Page 75 Note Operation 3-29...
  • Page 76: Error Correction

    Error Correction Open Correction (ZERO OPEN O set Adjustment) Figure 3-20. Connecting the Attachment to the Guarded/Guard Electrode for OPEN Correction 3-30 Operation...
  • Page 77 Figure 3-21. OPEN Correction Operation 3-31...
  • Page 78 Short Correction (ZERO SHORT O set Adjustment) For Electrode-A and Electrode-B (Rigid Metal Electrode) Figure 3-22. Connecting the Attachment to the Unguarded Electrode for SHORT Correction 3-32 Operation...
  • Page 79 Figure 3-23. SHORT Correction for Rigid Metal Electrode Operation 3-33...
  • Page 80 For Electrode-C and Electrode-D (Electrode for Thin Film Electrodes) Figure 3-24. SHORT Correction for Thin Film Electrodes Note 3-34 Operation...
  • Page 81 LOAD Correction (LOAD Compensation) Electrodes Value of Load (Air Capacitor) Operation 3-35...
  • Page 82: Electrode Adjustment

    Electrode Adjustment Note Caution Caution Note 3-36 Operation...
  • Page 83 Operation 3-37...
  • Page 84 Rough Adjustment to Make Electrodes Parallel Figure 3-25. Vertical Position and Electrode Adjustment Screws 3-38 Operation...
  • Page 85 Figure 3-26. Rough Adjustment Procedure Operation 3-39...
  • Page 86 Accurate Adjustment to Make Electrodes Parallel Accurate Adjustment in Vertical Position Figure 3-27. Vertical Position 3-40 Operation...
  • Page 87 Figure 3-28. The Micrometer Scale Adjusted to 0.01 mm Table 3-3. Measured Capacitance Limits When the Micrometer is Set to 0.01 mm Electrode Capacitance Value Caution Operation 3-41...
  • Page 88 Accurate Adjustment in Horizontal Position Figure 3-29. Horizontal Position 3-42 Operation...
  • Page 89 Table 3-4. Capacitance Point for Starting to Press the Pressure Adjuster Electrode Capacitance Value Caution Table 3-5. Capacitance Limits at Vertical Position Electrode Capacitance Value Table 3-6. Capacitance Limits at Horizontal Position Electrode Capacitance Value Operation 3-43...
  • Page 90 Note Electrode Capacitance Value 3-44 Operation...
  • Page 91 Typical Measurement Procedure by the Measurement Methods Caution Note Contacting Electrode Method Operation 3-45...
  • Page 92 Figure 3-30. Contacting Electrode Method (Rigid Metal Electrode) Figure 3-31. Contacting Electrode Method (Thin Film Electrode) Procedure 3-46 Operation...
  • Page 93 Operation 3-47...
  • Page 94 Equations Note Note 3-48 Operation...
  • Page 95 Non-Contacting Electrode Method Figure 3-32. Non-Contacting Electrode Method (Air Gap Method) Procedure Operation 3-49...
  • Page 96 Equations Note Note 3-50 Operation...
  • Page 97 Check Electrode Parallelism Table 3-7. Measured Capacitance Limits for Check Electrode Parallelism Electrode Capacitance Value Operation 3-51...
  • Page 98: Measurement Examples

    Measurement Examples Caution Using the 4194A LINE ENTER/EXECUTE NNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNN NNNNNNNNNNNNNN FUNCTION NNNNNNNNNNNNNNNNNNNNNNNNNNNNN SWEEP START STOP NNNNNNNNNNNNNNNNNNNNNNNNNNNNN COMPEN ENTER/EXECUTE NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN COMPEN ENTER/EXECUTE 3-52 Operation...
  • Page 99 NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN START NNNNNNNNNNNNNN DISPLAY NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN ENTER/EXECUTE NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN DISPLAY Note Operation 3-53...
  • Page 100 Figure 3-33. Sample Result of Cp-D Measurement Using the 4194A Figure 3-34. Sample Result of Dielectric Constant Using the 4194A 3-54 Operation...
  • Page 101 Using the 4284A NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN MEAS SETUP NNNNNNNNNNN DISPLAY FORMAT NNNNNNNNNNNNNN NNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN MEAS SETUP NNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNN DISPLAY FORMAT DISPLAY FORMAT Operation 3-55...
  • Page 102 Note 3-56 Operation...
  • Page 103 Measurement Error Analysis Note Error Factor using Contacting Electrode Method Capacitance measurement Error Operation Manual Technical Data Sheet Operation 3-57...
  • Page 104 Tolerance of Guarded Electrode Diameter Table 3-8. Tolerance of Electrode Diameter Electrode Tolerance (typical) Gap Error 3-58 Operation...
  • Page 105 Figure 3-35. Airgap E ects Table 3-9. Measurement Error Caused by Airgap t/d er'=2 er'=5 er'=10 er'=20 er'=50 er'=100 E ective Area of Electrode   g Operation 3-59...
  • Page 106 3-60 Operation...
  • Page 107 Table 3-10. E ective Area Constant Operation 3-61...
  • Page 108 Error Factor using Non-contacting Electrode Method Capacitance measurement Error Gap Error 3-62 Operation...
  • Page 109 Operation 3-63...
  • Page 110 Compensation Result Example Table 3-11. Compensation Result Example [pF] [pF] :  m E ective Area of Electrode 3-64 Operation...
  • Page 111: Assembly Replacement

    Service Introduction Assembly Replacement Assembly and Disassembly Hints Slide Stand Assembly Figure 4-1. Slide Stand Assembly Service...
  • Page 112 Micrometer Stand Replacement Figure 4-2. Micrometer Stand Replacement Micrometer Replacement Figure 4-3. Micrometer Replacement Service...
  • Page 113 Replaceable Parts List Table 4-1. Replaceable Parts List (1 of 5) Reference Part Number Description Designator Service...
  • Page 114 Table 4-2. Replaceable Parts List (2 of 5) Reference Part Number Description Designator Service...
  • Page 115 Table 4-3. Replaceable Parts List (3 of 5) Reference Part Number Description Designator Service...
  • Page 116 Table 4-4. Replaceable Parts List (4 of 5) Reference Part Number Description Designator Service...
  • Page 117 Table 4-5. Replaceable Parts List (5 of 5) Description Part Number Service...
  • Page 118: Troubleshooting

    Troubleshooting Mechanical Trouble Electrical Trouble Operation Check Service...
  • Page 119 Figure 4-4. Cable Connection Diagram Service...
  • Page 121 Manual Changes Introduction Manual Changes yellow MANUAL CHANGES Table A-1. Manual Changes by Serial Number Serial Pre x Make Manual Changes or Number Manual Changes...
  • Page 123 Recommended Capacitance Range Using Electrode-A 38 mm electrode) Figure B-1. Recommended Capacitance Range Using Electrode-A Recommended Capacitance Range...
  • Page 124 Using Electrode-C 5 mm electrode) Figure B-2. Recommended Capacitance Range Using Electrode-B Recommended Capacitance Range...
  • Page 125 Correction Procedure 4192A BLUE SHORT BLUE OPEN Correction Procedure...
  • Page 126 4194A NNNNNNNNNNNNNNNNNNNNNNNNNNNNN COMPEN ENTER/EXECUTE NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN COMPEN ENTER/EXECUTE NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN Correction Procedure...
  • Page 127 4274A and 4275A Caution ZERO OPEN OPEN ZERO SHORT Correction Procedure...
  • Page 128 4276A and 4277A ZERO OPEN ZERO OPEN ZERO OPEN ZERO SHORT ZERO SHORT > ZERO SHORT Correction Procedure...
  • Page 129 4278A NNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN TRIGGER NNNNNNNNNNNNNNNNNNNNNNN TRIGGER NNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNN Correction Procedure...
  • Page 130 4284A FREQ1 FREQ2 FREQ3 MEAS SETUP NNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN MEAS SETUP NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNN Correction Procedure...
  • Page 131 MEAS SETUP NNNNNNNN ENTER ENTER NNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNN NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN NNNNNNNN NNNNNNNNNNN Correction Procedure...
  • Page 133: Sample Program

    Sample program Sample ASP Program for the 4194A 4194A Operation Manual Sample program...
  • Page 134 Sample Program for the 4284A 4284A Operation Manual Sample program...
  • Page 135 Sample program...
  • Page 136 Sample program...
  • Page 137 Bibliography \Standard Test Method for A-C Loss Characteristics and Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials", Annual Book of ASTM Standards Bibliography...
  • Page 139 Index Index-1...
  • Page 140 Index-2...
  • Page 141 Index-3...
  • Page 142 Index-4...
  • Page 143 Index-5...
  • Page 144 Index-6...
  • Page 145 3-26 Index-7...
  • Page 146 Index-8...
  • Page 147 Index-9...
  • Page 148 Index-10...
  • Page 149 REGIONAL SALES AND SUPPORT OFFICES For more information about Agilent Technologies test and measurement products, applications, services, and for a current sales office listing, visit our web site: http://www.agilent.com/find/tmdir. You can also contact one of the following centers and ask for a test and measurement sales representative.

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