User Test Routines - EM TEST EFT 500 Series Manual For Operation

EM TEST
2.4.

User Test Routines

The user can program, save and recall his own specific test routines. The next pages shows the selection of the
functions.
USER TEST ROUTINES
F1 : Customized test routines
F2 : Voltage change after T by ∆V
F3 : Frequency change after T by ∆f
F4 : Frequency sweep in one single burst
F1 F2 F3
Each of these special functions can include 7 stored test routines.
CUSTOMISED TEST ROUTINES
F1 : Store F1
F2 : Store F2
F3 : Store F3
F4 : Store F4
F1 F2 F3
After selection of a stored test file the test parameters will be indicated on the display.
Customized test routines
The software controls standard test routines according to the specification of the user. All limitations are the same
as defined under Quick Start.
Voltage change after T by ∆V
The test voltage is increased from V1 to V2 by steps of ∆V
after the defined test time T. All limitations are the same as
defined under Quick Start. The limitation of the max.
generated number of spikes is related to the higher voltage
of V1 or V2.
Frequency change after T by ∆f
The spike frequency is increased from f1 to f2, and then
from f2 to f3 by steps of ∆f after the defined test time T. All
limitations are the same as defined under Quick Start. The
limitation of the max. generated number of spikes is related
to the higher frequency of f1 , f2 or f3.
Manual for Operation
Page 1 / 2
Page 2
F4 F5 F6 F7
F5 : Store F5
F6 : Store F6
F7 : Store F7
F4 F5 F6 F7
USER TEST ROUTINES
F1 : Change duration after T by ∆dt
F2 : Change polarity after T
F3 : Random burst release
F4 : Synchronized at fixed angle
F1 F2
V 2.00
EFT 500 Series
F3 F4 F5 F6
Page 2 / 2
Page 1
F7
7 / 21