Dbgjtag Swd Integrity Test; Dbgjtag Scan Path Test - Texas Instruments XDS110 User Manual

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The SWD connection is tested by reading the target IDCODE register multiple times. Look for the test to
report that it has succeeded to know that the debug connection is working correctly. This is the test
performed by the Test Configuration button in CCS.
How to measure the scan path length in JTAG and cJTAG modes:
For JTAG:
dbgjtag -f @xds110 -S pathlength
For cJTAG:
dbgjtag -f @xds110cjtag -S pathlength
The result of the test appears as in
The IR and DR paths are measured separately. The IR measurement is the sum of all of the IR lengths in
the scan path. The DR measurement is the sum of all of the DR lengths, with all of the devices in the scan
path put into BYPASS. Because the DR length while in BYPASS is 1 bit, the DR measurement can be
used as a count of the number of devices in the scan path. In the pictured example, the scan path
consists of a single device with an IR length of 6 bits.
How to do a board reset with the XDS110:
dbgjtag -f @xds110 -Y reset, system=yes
dbgjtag toggles the board reset pin on the debug header (nSRST). This the same type of reset done by
the xds110reset utility, but the xds110reset utility has additional control over the duration of the reset.
SPRUI94 – January 2017
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Figure 13. dbgjtag SWD Integrity Test
Figure 14.
Figure 14. dbgjtag Scan Path Test
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Functional Description and Operation
XDS110 Debug Probe
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