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Summary of Contents for Pasco Scientific OS-8523
- Page 1 012-05880B Instruction Manual and 3/97 Experiment Guide for the PASCO scientific Model OS-8523 SLIT ACCESSORY FOR THE BASIC OPTICS SYSTEM © 1997 PASCO scientific $5.00...
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Page 3: Table Of Contents
012-05880B Slit Accessory Table of Contents Section Page Copyright, Warranty, and Equipment Return ............. ii Introduction ...................... 1 Equipment ......................2 Assembly ......................3 Experiments Exp. 1: Diffraction from a Single Slit ............5 Exp. 2: Interference from a Double Slit ............9 Exp. -
Page 4: Copyright, Warranty And Equipment Return
ACCEPTED FOR RETURN WITHOUT AN Limited Warranty AUTHORIZATION FROM PASCO. PASCO scientific warrants the product to be free from When returning equipment for repair, the units defects in materials and workmanship for a period of one must be packed properly. Carriers will not accept year from the date of shipment to the customer. -
Page 5: Introduction
012-05880B Slit Accessory Introduction The PASCO OS-8523 Slit Accessory is used with the NOTE: Due to limitations of the photographic PASCO OS-8525 Laser Diode on the optics bench in the process used to produce the slit film, the line and PASCO OS-8515 Basic Optics System. -
Page 6: Equipment
Slit Accessory 012-05880B Equipment lens holder with thumbscrew (2) Single Slit Disk Multiple Slit Disk OS-8523 Slit Accessory Equipment The OS-8523 Slit Accessory includes the following: – Single Slit Disk – Multiple Slit Disk – lens holder with thumbscrew (2) -
Page 7: Assembly
012-05880B Slit Accessory Assembly slit disk attachment mounted slit OS-8525 accessory Diode Laser ring adjusting screws thumbscrew input jack (9VDC) o i d lens holder optics bench Figure 3: Slit Accessory and Lens Holder Figure 4: Using the Slit Accessory with the Diode Laser Mounting the Slit Accessory to the Optics Bench... - Page 8 Slit Accessory 012-05880B Notes:...
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Page 9: Exp. 1: Diffraction From A Single Slit
Experiment 1: Diffraction from a Single Slit EQUIPMENT REQUIRED – track and screen from the Basic Optics System (OS-8515) – Diode Laser (OS-8525) – Single Slit Disk (OS-8523) – white paper to cover screen – metric rule Purpose The purpose of this experiment is to examine the diffraction pattern formed by laser light pass- ing through a single slit and verify that the positions of the minima in the diffraction pattern match the positions predicted by theory. - Page 10 Slit Accessory 012-05880B Setup Set up the laser at one end of the optics bench and place the Single Slit Disk in its holder about 3 cm in front of the laser. See Figure 1.2. Cover the screen with a sheet of paper and attach it to the other end of the bench so that the paper faces the laser.
- Page 11 012-05880B Slit Accessory Make a sketch of the diffraction pattern to scale. Change the slit width to 0.02 mm and 0.08 mm and make sketches to scale of each of these diffraction patterns. Analysis Divide the distances between side orders by two to get the distances from the center of the pat- tern to the first and second order minima.
- Page 12 Slit Accessory 012-05880B Notes:...
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Page 13: Exp. 2: Interference From A Double Slit
Experiment 2: Interference from a Double Slit EQUIPMENT REQUIRED – track and screen from the Basic Optics System (OS-8515) – Diode Laser (OS-8525) – Multiple Slit Disk (OS-8523) – white paper to cover screen – metric rule Purpose The purpose of this experiment is to examine the diffraction and interference patterns formed by laser light passing through two slits and verify that the positions of the maxima in the interfer- ence pattern match the positions predicted by theory. - Page 14 Slit Accessory 012-05880B While the interference fringes are created by the interference of the light coming from the two slits, there is also a diffraction effect occurring at each slit due to Single Slit diffraction. This causes the envelope as seen in Figure 2.2. Setup Set up the laser at one end of the optics bench and place the Multiple Slit Disk in its holder about 3 cm in front of the laser.
- Page 15 012-05880B Slit Accessory Make a sketch of the interference pattern to scale. Change to a new double slit with the same slit width (0.04 mm) but different slit separation (0.50 mm) and make a sketch to scale of this new interference pattern. Change to another double slit with a slit width of 0.08 mm and the original slit separation (0.25 mm) and make a sketch to scale of this new interference pattern.
- Page 16 Slit Accessory 012-05880B e when the slit separation is increased? Does the distance to the first minima in the diffraction envelope increase, decrease, or stay the same when the slit width is increased?
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Page 17: Exp. 3: Comparisons Of Diffraction And Interference Patterns
EQUIPMENT REQUIRED – track and screen from the Basic Optics System (OS-8515) – Diode Laser (OS-8525) – Single and Multiple Slit Disks (OS-8523) – white paper to cover screen Purpose The purpose of this experiment is to compare the diffraction and interference patterns formed by laser light passing through various combinations of slits. - Page 18 Slit Accessory 012-05880B Cover the screen with a sheet of paper and attach it to the other end of the bench so that the paper faces the laser. slit laser screen Figure 3.3: Optics Bench Setup Select the single-double slit comparison by rotating the slit disk until the desired slit set is centered in the slit holder.
- Page 19 012-05880B Slit Accessory Replace the Multiple Slit Disk with the Single Slit Disk. Select the line/slit comparison. Sketch the two side-by-side patterns roughly to scale. Select the dot pattern on the Single Slit Disk. Sketch the resulting diffraction pattern roughly to scale.
- Page 20 Slit Accessory 012-05880B How does the diffraction pattern from a slit differ from the diffraction pattern from a line? How does the diffraction pattern from the dot pattern differ from the diffraction pattern from the hole pattern?
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Page 21: Technical Support
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