Operation; Handling The Probe; Connecting The Probe To The Test Instrument; Connecting The Probe To The Test Circuit - LeCroy HFP1500 Instruction Manual

Operation

4 Operation

HANDLING THE PROBE

Exercise care when handling and storing the probe. Always handle the probe by the probe body or
compensation box. Avoid putting excessive strain or exposing the probe cable to sharp bends.

CONNECTING THE PROBE TO THE TEST INSTRUMENT

The HFP1500 probe has been designed for use with LeCroy's WavePro™, Waverunner™ and LC
oscilloscopes equipped with the ProBus interface. When you attach the probe output connector to
the oscilloscope's input connector, the oscilloscope will recognize the probe, provide proper termi-
nation and activate the probe control functions in the user interface.

CONNECTING THE PROBE TO THE TEST CIRCUIT

To maintain the high performance capability of the probe in measurement applications, care must
be exercised in connecting the probe to the test circuit. Increasing the parasitic capacitance or
inductance in the input paths may introduce a "ring" or slow the rise time of fast signals. Input
leads which form a large loop area will pick up any radiated electromagnetic field which passes
through the loop and may induce noise into the probe input.
Using one of the available accessories makes the HFP1500 probe with its small profile and low
mass head ideally suited for applications in dense circuitry.

OPERATION WITH A LECROY OSCILLOSCOPE

When the HFP1500 probe is connected to any LeCroy oscilloscope, the displayed scale factor and
measurement values will be automatically adjusted.
Control through the oscilloscope's interface can be found in the 'Coupling' menu of the channel to
which the probe is connected.
Turning the Volts/Div knob will control the oscilloscope's scale factor to give full available dynamic
range up to 2 V/div.
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HFP1500-OM-E Rev E