– Outperforms X16 Parallel Flash – 24-ball TFBGA 8x6-mm (6x4/5x5 ball array) Low Power, Wide Temperature Range – Contact Winbond for KGD and other options – Single 2.7 to 3.6V supply – 4mA active current, <1µA Power-down current Note 1. More than 100,000 Block Erase/Program cycles for Industrial and Automotive temperature; more than 10,000 full chip Erase/Program cycles tested in compliance with AEC-Q100.
W25Q80BV 2. Some package types are special orders, please contact Winbond for ordering information. 3. PACKAGE TYPES AND PIN CONFIGURATIONS W25Q80BV is offered in an 8-pin SOIC 150-mil or 208-mil (package code SN & SS), an 8-pin VSOP 150- mil or 208-mil (package code SV & ST), an 8-pad WSON 6x5-mm (package code ZP), an 8-pad USON 2x3-mm (package code UX), an 8-pin PDIP 300-mil (package code DA) and a 24-ball 8x6-mm TFBGA (5x5 ball array - package code TB, 6x4 ball array –...
W25Q80BV 4. PIN DESCRIPTIONS 4.1 Chip Select (/CS) The SPI Chip Select (/CS) pin enables and disables device operation. When /CS is high the device is deselected and the Serial Data Output (DO, or IO0, IO1, IO2, IO3) pins are at high impedance. When deselected, the devices power consumption will be at standby levels unless an internal erase, program or write status register cycle is in progress.
W25Q80BV 6. FUNCTIONAL DESCRIPTION 6.1 SPI OPERATIONS 6.1.1 Standard SPI Instructions The W25Q80BV is accessed through an SPI compatible bus consisting of four signals: Serial Clock (CLK), Chip Select (/CS), Serial Data Input (DI) and Serial Data Output (DO). Standard SPI instructions use the DI input pin to serially write instructions, addresses or data to the device on the rising edge of CLK.
One Time Program (OTP) write protection * Note: This feature is available upon special order. Please contact Winbond for details. Upon power-up or at power-down, the W25Q80BV will maintain a reset condition while VCC is below the threshold value of V , (See Power-up Timing and Voltage Levels and Figure 38).
W25Q80BV CONTROL AND STATUS REGISTERS The Read Status Register-1 and Status Register-2 instructions can be used to provide status on the availability of the Flash memory array, if the device is write enabled or disabled, the state of write protection, Quad SPI setting, Security Register lock status and Erase/Program Suspend status. The Write Status Register instruction can be used to configure the device write protection features, Quad SPI setting and Security Register OTP lock.
Notes: 1. When SRP1, SRP0 = (1, 0), a power-down, power-up cycle will change SRP1, SRP0 to (0, 0) state. 2. This feature is available upon special order. Please contact Winbond for details. 7.1.8 Erase/Program Suspend Status (SUS) The Suspend Status bit is a read only bit in the status register (S15) that is set to 1 after executing a Erase/Program Suspend (75h) instruction.
W25Q80BV 7.1.10 Quad Enable (QE) The Quad Enable (QE) bit is a non-volatile read/write bit in the status register (S9) that allows Quad SPI operation. When the QE bit is set to a 0 state (factory default), the /WP pin and /HOLD are enabled. When the QE bit is set to a 1, the Quad IO2 and IO3 pins are enabled, and /WP and /HOLD functions are disabled.
Read Status Register will be ignored until the program or erase cycle has completed. 7.2.1 Manufacturer and Device Identification MANUFACTURER ID (MF7-MF0) Winbond Serial Flash Device ID (ID7-ID0) (ID15-ID0) Instruction ABh, 90h, 92h, 94h...
W25Q80BV 7.2.5 Write Enable (06h) The Write Enable instruction (Figure 4) sets the Write Enable Latch (WEL) bit in the Status Register to a 1. The WEL bit must be set prior to every Page Program, Quad Page Program, Sector Erase, Block Erase, Chip Erase, Write Status Register and Erase/Program Security Registers instruction.
W25Q80BV 7.2.7 Write Disable (04h) The Write Disable instruction (Figure 6) resets the Write Enable Latch (WEL) bit in the Status Register to a 0. The Write Disable instruction is entered by driving /CS low, shifting the instruction code “04h” into the DI pin and then driving /CS high.
W25Q80BV 7.2.8 Read Status Register-1 (05h) and Read Status Register-2 (35h) The Read Status Register instructions allow the 8-bit Status Registers to be read. The instruction is entered by driving /CS low and shifting the instruction code “05h” for Status Register-1 or “35h” for Status Register-2 into the DI pin on the rising edge of CLK.
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W25Q80BV To complete the Write Status Register instruction, the /CS pin must be driven high after the eighth or sixteenth bit of data that is clocked in. If this is not done the Write Status Register instruction will not be executed.
W25Q80BV 7.2.10 Read Data (03h) The Read Data instruction allows one or more data bytes to be sequentially read from the memory. The instruction is initiated by driving the /CS pin low and then shifting the instruction code “03h” followed by a 24-bit address (A23-A0) into the DI pin.
W25Q80BV 7.2.11 Fast Read (0Bh) The Fast Read instruction is similar to the Read Data instruction except that it can operate at the highest possible frequency of F (see AC Electrical Characteristics). This is accomplished by adding eight “dummy” clocks after the 24-bit address as shown in figure 10. The dummy clocks allow the devices internal circuits additional time for setting up the initial address.
W25Q80BV 7.2.12 Fast Read Dual Output (3Bh) The Fast Read Dual Output (3Bh) instruction is similar to the standard Fast Read (0Bh) instruction except that data is output on two pins; IO and IO . This allows data to be transferred from the W25Q80BV at twice the rate of standard SPI devices.
W25Q80BV 7.2.13 Fast Read Quad Output (6Bh) The Fast Read Quad Output (6Bh) instruction is similar to the Fast Read Dual Output (3Bh) instruction except that data is output on four pins, IO , IO , IO , and IO .
W25Q80BV 7.2.14 Fast Read Dual I/O (BBh) The Fast Read Dual I/O (BBh) instruction allows for improved random access while maintaining two IO pins, IO and IO . It is similar to the Fast Read Dual Output (3Bh) instruction but with the capability to input the Address bits (A23-0) two bits per clock.
W25Q80BV 7.2.15 Fast Read Quad I/O (EBh) The Fast Read Quad I/O (EBh) instruction is similar to the Fast Read Dual I/O (BBh) instruction except that address and data bits are input and output through four pins IO , IO , IO and IO and four Dummy...
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W25Q80BV Mode 3 Mode 0 IOs switch from A23-16 A15-8 A7-0 M7-0 Dummy Dummy Input to Output Byte 1 Byte 2 Byte 3 Figure 14b. Fast Read Quad I/O Instruction Sequence (Previous instruction set M5-4 = 10) Fast Read Quad I/O with “8/16/32/64-Byte Wrap Around” The Fast Read Quad I/O instruction can also be used to access a specific portion within a page by issuing a “Set Burst with Wrap”...
W25Q80BV 7.2.16 Word Read Quad I/O (E7h) The Word Read Quad I/O (E7h) instruction is similar to the Fast Read Quad I/O (EBh) instruction except that the lowest Address bit (A0) must equal 0 and only two Dummy clock are required prior to the data output.
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W25Q80BV Mode 3 Mode 0 IOs switch from A23-16 A15-8 A7-0 M7-0 Dummy Input to Output Byte 1 Byte 2 Byte 3 Figure 15b. Word Read Quad I/O Instruction Sequence (Previous instruction set M5-4 = 10) Word Read Quad I/O with “8/16/32/64-Byte Wrap Around” The Word Read Quad I/O instruction can also be used to access a specific portion within a page by issuing a “Set Burst with Wrap”...
W25Q80BV 7.2.17 Octal Word Read Quad I/O (E3h) The Octal Word Read Quad I/O (E3h) instruction is similar to the Fast Read Quad I/O (EBh) instruction except that the lower four Address bits (A0, A1, A2, A3) must equal 0. As a result, the dummy clocks are not required, which further reduces the instruction overhead allowing even faster random access for code execution (XIP).
W25Q80BV 7.2.18 Set Burst with Wrap (77h) The Set Burst with Wrap (77h) instruction is used in conjunction with “Fast Read Quad I/O” and “Word Read Quad I/O” instructions to access a fixed length of 8/16/32/64-byte section within a 256-byte page. Certain applications can benefit from this feature and improve the overall system code execution performance.
W25Q80BV 7.2.19 Continuous Read Mode Bits (M7-0) The “Continuous Read Mode” bits are used in conjunction with “Fast Read Dual I/O”, “Fast Read Quad I/O”, “Word Read Quad I/O” and “Octal Word Read Quad I/O” instructions to provide the highest random Flash memory access rate with minimum SPI instruction overhead, thus allow true XIP (execute in place) to be performed on serial flash devices.
W25Q80BV 7.2.21 Page Program (02h) The Page Program instruction allows from one byte to 256 bytes (a page) of data to be programmed at previously erased (FFh) memory locations. A Write Enable instruction must be executed before the device will accept the Page Program Instruction (Status Register bit WEL= 1). The instruction is initiated by driving the /CS pin low then shifting the instruction code “02h”...
W25Q80BV 7.2.22 Quad Input Page Program (32h) The Quad Page Program instruction allows up to 256 bytes of data to be programmed at previously erased (FFh) memory locations using four pins: IO , IO , IO , and IO . The Quad Page Program can improve performance for PROM Programmer and applications that have slow clock speeds <5MHz.
W25Q80BV 7.2.23 Sector Erase (20h) The Sector Erase instruction sets all memory within a specified sector (4K-bytes) to the erased state of all 1s (FFh). A Write Enable instruction must be executed before the device will accept the Sector Erase Instruction (Status Register bit WEL must equal 1).
W25Q80BV 7.2.24 32KB Block Erase (52h) The Block Erase instruction sets all memory within a specified block (32K-bytes) to the erased state of all 1s (FFh). A Write Enable instruction must be executed before the device will accept the Block Erase Instruction (Status Register bit WEL must equal 1).
W25Q80BV 7.2.25 64KB Block Erase (D8h) The Block Erase instruction sets all memory within a specified block (64K-bytes) to the erased state of all 1s (FFh). A Write Enable instruction must be executed before the device will accept the Block Erase Instruction (Status Register bit WEL must equal 1).
W25Q80BV 7.2.26 Chip Erase (C7h / 60h) The Chip Erase instruction sets all memory within the device to the erased state of all 1s (FFh). A Write Enable instruction must be executed before the device will accept the Chip Erase Instruction (Status Register bit WEL must equal 1).
W25Q80BV 7.2.27 Erase / Program Suspend (75h) The Erase/Program Suspend instruction “75h”, allows the system to interrupt a Sector or Block Erase operation or a Page Program operation and then read from or program/erase data to, any other sectors or blocks. The Erase/Program Suspend instruction sequence is shown in figure 25. The Write Status Register instruction (01h) and Erase instructions (20h, 52h, D8h, C7h, 60h, 44h) are not allowed during Erase Suspend.
W25Q80BV 7.2.28 Erase / Program Resume (7Ah) The Erase/Program Resume instruction “7Ah” must be written to resume the Sector or Block Erase operation or the Page Program operation after an Erase/Program Suspend. The Resume instruction “7Ah” will be accepted by the device only if the SUS bit in the Status Register equals to 1 and the BUSY bit equals to 0.
W25Q80BV 7.2.29 Power-down (B9h) Although the standby current during normal operation is relatively low, standby current can be further reduced with the Power-down instruction. The lower power consumption makes the Power-down instruction especially useful for battery powered applications (See ICC1 and ICC2 in AC Characteristics). The instruction is initiated by driving the /CS pin low and shifting the instruction code “B9h”...
W25Q80BV 7.2.30 Release Power-down / Device ID (ABh) The Release from Power-down / Device ID instruction is a multi-purpose instruction. It can be used to release the device from the power-down state, or obtain the devices electronic identification (ID) number. To release the device from the power-down state, the instruction is issued by driving the /CS pin low, shifting the instruction code “ABh”...
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W25Q80BV Mode 3 Mode 3 Mode 0 Mode 0 tRES2 Instruction (ABh) 3 Dummy Bytes Device ID High Impedance = MSB Power-down current Stand-by current Figure 28b. Release Power-down / Device ID Instruction Sequence Diagram - 50 -...
The instruction is initiated by driving the /CS pin low and shifting the instruction code “90h” followed by a 24-bit address (A23-A0) of 000000h. After which, the Manufacturer ID for Winbond (EFh) and the Device ID are shifted out on the falling edge of CLK with most significant bit (MSB) first as shown in figure 29.
24-bit address (A23-A0) of 000000h, 8-bit Continuous Read Mode Bits, with the capability to input the Address bits two bits per clock. After which, the Manufacturer ID for Winbond (EFh) and the Device ID are shifted out 2 bits per clock on the falling edge of CLK with most significant bits (MSB) first as shown in figure 30.
Address bits four bits per clock. After which, the Manufacturer ID for Winbond (EFh) and the Device ID are shifted out four bits per clock on the falling edge of CLK with most significant bit (MSB) first as shown in figure 31. The Device ID values for the W25Q80BV is listed in Manufacturer and Device Identification table.
W25Q80BV 7.2.34 Read Unique ID Number (4Bh) The Read Unique ID Number instruction accesses a factory-set read-only 64-bit number that is unique to each W25Q80BV device. The ID number can be used in conjunction with user software methods to help prevent copying or cloning of a system.
2003. The instruction is initiated by driving the /CS pin low and shifting the instruction code “9Fh”. The JEDEC assigned Manufacturer ID byte for Winbond (EFh) and two Device ID bytes, Memory Type (ID15-ID8) and Capacity (ID7-ID0) are then shifted out on the falling edge of CLK with most significant bit (MSB) first as shown in figure 33.
SFDP register contents are shifted out on the falling edge of the 40 CLK with most significant bit (MSB) first as shown in figure 34. For SFDP register values and descriptions, please refer to the Winbond Application Note for SFDP Definition table.
W25Q80BV 7.2.37 Erase Security Registers (44h) The W25Q80BV offers three 256-byte Security Registers which can be erased and programmed individually. These registers may be used by the system manufacturers to store security and other important information separately from the main memory array. The Erase Security Register instruction is similar to the Sector Erase instruction.
W25Q80BV 7.2.38 Program Security Registers (42h) The Program Security Register instruction is similar to the Page Program instruction. It allows from one byte to 256 bytes of security register data to be programmed at previously erased (FFh) memory locations. A Write Enable instruction must be executed before the device will accept the Program Security Register Instruction (Status Register bit WEL= 1).
W25Q80BV 7.2.39 Read Security Registers (48h) The Read Security Register instruction is similar to the Fast Read instruction and allows one or more data bytes to be sequentially read from one of the three security registers. The instruction is initiated by driving the /CS pin low and then shifting the instruction code “48h”...
W25Q80BV Power-up Timing and Write Inhibit Threshold spec Parameter Symbol Unit VCC (min) to /CS Low µs Time Delay Before Write Instruction Write Inhibit Threshold Voltage Note: 1. These parameters are characterized only. (max) Program, Erase and Write Instructions are ignored /CS must track VCC (min) tVSL...
W25Q80BV 8.5 AC Measurement Conditions SPEC PARAMETER SYMBOL UNIT Load Capacitance Input Rise and Fall Times Input Pulse Voltages 0.2 VCC to 0.8 VCC Input Timing Reference Voltages 0.3 VCC to 0.7 VCC Output Timing Reference Voltages 0.5 VCC to 0.5 VCC Note: 1.
W25Q80BV 8.6 AC Electrical Characteristics SPEC DESCRIPTION SYMBOL UNIT Clock frequency for all instructions except Read Data instruction (03h) D.C. 2.7V-3.6V VCC Clock frequency for all instructions except Read Data instruction (03h) D.C. 3.0V-3.6V VCC Clock frequency for Read Data instruction (03h) D.C.
W25Q80BV cont’d) 8.7 AC Electrical Characteristics ( SPEC DESCRIPTION SYMBOL UNIT /HOLD Active Hold Time relative to CLK CHHH /HOLD Not Active Setup Time relative to CLK HHCH /HOLD Not Active Hold Time relative to CLK CHHL /HOLD to Output Low-Z HHQX /HOLD to Output High-Z HLQZ...
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0.026 Notes: 1. Advanced Packaging Information; please contact Winbond for the latest minimum and maximum specifications. 2. BSC = Basic lead spacing between centers. 3. Dimensions D and E do not include mold flash protrusions and should be measured from the bottom of the package.
The following table provides the valid part numbers for the W25Q80BV SpiFlash Memory. Please contact Winbond for specific availability by density and package type. Winbond SpiFlash memories use an 12- digit Product Number for ordering. However, due to limited space, the Top Side Marking on all packages use an abbreviated 10-digit number.
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1. WSON package type ZP is not used in the top side marking. 2. These Package types are Special Order only, please contact Winbond for more information. 3. For Industrial Plus, Automotive Grade 2 & Grade 3 Temperature parts, please contact Winbond for more information and availability.
Further more, Winbond products are not intended for applications wherein failure of Winbond products could result or lead to a situation wherein personal injury, death or severe property or environmental damage could occur. Winbond customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Winbond for any damages resulting from such improper use or sales.
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