Wavecom TnT ELB G4-Series User Manual page 10

Wavecom Instruments Portable Appliance Testers Instruction Manual
Class 1 - Earthed Appliance Test - F1
Please Note: A Visual Inspection test must be carried out before any others (refer to First Test Section)
The Class 1- Earth Appliance Test completes the following sequences as part of its procedure:
1. Integrated Supply Mains Test
2. Integrated NCNT Test
3. Earth Bond Test (@ 200mA): 200mA test current, pass level less than 1Ω
4. Insulation Test (@ 250V or 500V): pass level greater than 1MΩ
Please Note: 250V insulation testing applies to Class 1 appliances if selected (refer to Technical Information for
details to change test voltage)
In some situations if the DUT is labelled with "Surge Protection Fitted" or if it contains MOV's (Metal Oxide
Varistors), conduct a 250V-insulation test.
*If unsure refer to the AS3760 Standard. Should it still fail, remove it from service. (Refer to the Technical
Information section to change test voltage).
Procedure:
1.
Complete a Visual Inspection. Only proceed if test passed.
2.
Plug device into appliance socket.
3.
Connect earth clip to any exposed metal on the device.
4.
Press the F1 key and wait for results (ensure that device is powered on)
5.
Read and record results appropriately
6.
Unplug device
7. Tester will return to Main menu A automatically
If the result was a pass - Tag with PASS tag showing "next test due" date and return the device to service.
If the result was a fail - Tag the DUT with a
Please Note: Ensure that the device is isolated from any ground loop.
Class 2 Test - Double Insulation Test - F2
Please Note: A Visual Inspection test must be carried out before any others (refer to First Test Section)
The Double Insulation Test completes the following test sequences as part of its procedure
1. Integrated Supply Mains Test
2. Integrated NCNT Test
3. Double Insulation Test (@250V or 500V): pass level greater than 1MΩ
Extension Lead Test
Refer to Integrated Test section
Refer to Integrated Test section
DANGER tag and remove the device from service.
Refer to Integrated Test section
Refer to Integrated Test section
10