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NXP Semiconductors
12. Test information
Test data is given in
All input pulses are supplied by generators having the following characteristics: PRR
The outputs are measured one at a time with one transition per measurement.
Definitions for test circuit:
R
= Load resistance.
L
C
= Load capacitance including jig and probe capacitance.
L
R
= Termination resistance should be equal to output impedance Z
T
V
= External voltage for measuring switching times.
EXT
Fig 7.
Test circuit for measuring switching times
Table 9.
Test data
Supply voltage
V
= 5.0 V
0.5 V
CC
CBT3384_6
Product data sheet
V
I
90 %
negative
pulse
0 V
V
I
positive
pulse
10 %
0 V
G
Table
9.
Input
V
t
, t
I
r
f
GND to 3.0 V
2.5 ns
Rev. 06 — 2 November 2009
10-bit bus switch with 5-bit output enables
t
W
V
M
10 %
t
f
t
r
90 %
V
M
t
W
V
CC
V
V
I
O
DUT
R T
of the pulse generator.
o
Load
C
R
L
L
50 pF
500
V
M
t
r
t
f
V
M
V
EXT
R L
C L
R L
001aae331
10 MHz; Z
= 50 .
o
V
EXT
t
, t
t
PLH
PHL
PLZ
open
7.0 V
CBT3384
, t
t
, t
PZL
PHZ
PZH
open
© NXP B.V. 2009. All rights reserved.
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