Hameg HM303-6 Manual
  1. Manuals
  2. Brands
  3. Hameg Manuals
  4. Test Equipment
  5. HM303-6
  6. Manual

Hameg HM303-6 Manual

Hide thumbs Also See for HM303-6:
Table of Contents

Advertisement

Quick Links

O s c i l l o s c o p e
H M 3 0 3 - 6
Manual
English

Advertisement

Table of Contents
loading
Need help?

Need help?

Do you have a question about the HM303-6 and is the answer not in the manual?

Questions and answers

Related Manuals for Hameg HM303-6

Summary of Contents for Hameg HM303-6

  • Page 1 O s c i l l o s c o p e H M 3 0 3 - 6 Manual English...

  • Page 2: Table Of Contents

    ............ 12 Front Panel Elements HM 303-6 X-Y Operation ..............13 (Brief Description - Front View) ....... 20 Phase comparison with Lissajous figures ....13 Phase difference measurement ........13 Short Instruction for HM303-6 ........22 Subject to change without notice...

  • Page 3: General Information Regarding The Ce Marking

    General information regarding the CE marking HAMEG instruments fulfi ll the regulations of the EMC directive. The conformity test made by HAMEG is based on the actual generic- and product stan- dards. In cases where different limit values are applicable, HAMEG applies the severer standard. For emission the limits for residential, commercial and light industry are applied.
  • Page 4 HM303-6 3 5 M H z A n a l o g O s c i l l o s c o p e H M 3 0 3 - 6 Maximum signal fidelity with minimum overshoot No signal distortion resulting from overshoot 2 Channels with deflection coefficients of 1 mV –...
  • Page 5 HM303-6E/260107/ce · Subject to alterations · © HAMEG Instruments GmbH · ® Registered Trademark · DQS-certified in accordance with DIN EN ISO 9001:2000, Reg.-No.: DE-071040 QM HAMEG Instruments GmbH · Industriestr. 6 · D-63533 Mainhausen · Tel +49 (0) 6182 800 0 · Fax +49 (0) 6182 800 100 · www.hameg.com · info@hameg.com...

  • Page 6: General Information

    PUOPFGkT PUOPFGkT PUkT PUkT PUkT INPUT CHI PUkT INPUT CHI INPUT CHI HAMEG PUkT ment must be placed so that it can not fall (e.g. PUOPFGkT PUOPFGkT HJKL HJKL HJKL placed on a table). Then the handle locking knobs must be simultaneously pulled outwards and STOP rotated to the required position.

  • Page 7: Warranty

    Statutory warranty regulations apply in the country where the categories II, III, or IV are prohibited! HAMEG product was purchased. In case of complaints please contact the dealer who supplied your HAMEG product. The measuring circuits are considered not connected to the mains if a suitable isolation transformer fulfi...

  • Page 8: Type Of Signal Voltage

    The minimum signal voltage which must be applied to the Y input for a trace of 1div. height is 1mVpp when the Y-MAG. x5 With the HM303-6, most repetitive signals in the frequency pushbutton is depressed, the VOLTS/DIV. switch is set to range up to at least 35MHz (-3dB) can be examined.

  • Page 9: Total Value Of Input Voltage

    This causes the attenuator to be disabled again, but now for both DC and AC voltages. With the above listed exceptions HAMEG 10:1 probes can be used for DC measurements up to 600V or AC voltages (with a mean value of zero volt) of 1200Vpp.

  • Page 10: Connection Of Test Signal

    For amplifiers with approximately constant group delay ordered from HAMEG and replaced by oneself. The probes (therefore good pulse transmission performance) the following mentioned have a HF-calibration in addition to low frequency numerical relationship between rise time tr (in ns) and bandwidth calibration adjustment.

  • Page 11: First Time Operation

    (approx. 20 pF for optimum sharpness of the trace. The oscilloscope is now the HM303-6). By this adjustment, the capacitive division ready for use. assumes the same ratio as the ohmic voltage divider to...

  • Page 12: Adjustment At 1Mhz

    (typically 4 ns), and low output impedance (approx. 50Ω), providing 0.2V at a frequency of approx. 1MHz. The calibrator output of the HM303-6 meets The vertical amplifier is set to the desired operating mode by these requirements when the CAL. pushbutton is depressed.

  • Page 13: X-Y Operation

    - Do not use a too high test frequency. The phase shift of the ends above ground). Two identical probes should be used for two oscilloscope amplifiers of the HM303-6 in the X-Y both vertical inputs. In order to avoid ground loops, use a mode can exceed an angle of 3°...

  • Page 14: Phase Difference Measurement In Dual Mode

    (AT/NM button depressed) using a suitable LEVEL setting and possibly The internal trigger threshold of the HM303-6 is given as £ also using the time variable adjustment. 0.5div. When the trigger voltage is externally supplied, it can be measured in V at the TRIG.

  • Page 15: Automatic Peak (Value) - Triggering

    Triggering and time base Automatic Peak (value) - Triggering However the trigger point may be varied within certain limits on the chosen edge using the LEVEL control. The slope direction is If the AT/NM pushbutton is in the out position AT, the sweep always related to the input signal and the non inverted display.

  • Page 16: Line Triggering (~)

    Triggering and time base External triggering triggering should be noted. Again the correct slope setting is critical, because the external trigger signal may not have the same polarity or pulse edge as the test signal. This can be The internal triggering is disconnected by depressing the TRIG. checked, if the external trigger voltage itself is displayed first EXT.

  • Page 17: Component Tester

    The test pattern expected from a resistor is therefore a sloping straight line. The angle of slope The HM303-6 has a built-in electronic Component Tester is determined by the resistance of the resistor under test. With (COMP.

  • Page 18: Testing Semiconductors

    Component Tester Testing Semiconductors For a transistor the figures b-e and b-c are important. The figure e-c can vary; but a vertical line only shows short circuit Most semiconductor devices, such as diodes, Z-diodes, condition. transistors, FETs can be tested. The test pattern displays vary according to the component type as shown in the figures These transistor test patterns are valid in most cases, but below.
  • Page 19 Component Tester In-circuit tests are possible in many cases. However, they are not well defined. This is caused by a shunt connection of real or complex impedances - especially if they are of relatively low impedance at 50Hz - to the component under test, often results differ greatly when compared with single components.

  • Page 20: Front Panel Elements Hm 303-6

    Front Panel Elements HM 303- (Brief Description - Front View) Element Function Element Function POWER Turns scope on and off. SLOPE / = rising edge; (pushbutton + LED) LED indicates operating (pushbutton switch) \ = falling edge. condition. LED lights, if sweep is triggered. INTENS Intensity control (LED)
  • Page 21 Front Panel Elements HM 303- (Brief Description - Front View) Element Function Element Function DUAL Button released: Selects X-Y operation, one channel only. (pushbutton switch) stops sweep. (pushbutton Button depressed: channel I X signal via CH I. switch) and channel II in alternating Attention! mode.

  • Page 22: Short Instruction For Hm303-6

    In-circuit test: Circuit under test must be disconnected from battery or power (pull out power plug), signals and ground (earth). Remove all signal connections to HM303-6 (cable, probe), release X-MAG. X10 pushbutton, then start testing. Subject to change without notice...
  • Page 23 M A N U A L • H A N D B U C H • M A N U E L...
  • Page 24 . h a m e g . c o m Subject to change without notice 41-0303-06E0 / 20012007-gw HAMEG Instruments GmbH © HAMEG Instruments GmbH Industriestraße 6 A Rohde & Schwarz Company D-63533 Mainhausen ® registrierte Marke Tel +49 (0) 61 82 800-0 DQS-Zertifi...

Table of Contents