6 CH1:FEY
500mV/div.
7 CH2:FD
500mV/div.
4 CH3:RFO
1V/div.
Setup(FE Bias adjustment)
→
VREF
→
VREF
→
VREF
9 CH1:SINY 100mV/div.
Play
→
VREF
4 CH1:RFO
2V/div.
( CH2:dfct
5V/div.
7 CH3:FD
1V/div.
# CH4:TD
2V/div.
Play(The defect part passes)
→
VREF
→
VREF
→
VREF
→
VREF
4 CH1:RFO
1V/div.
5 CH2:TEY
1V/div.
# CH3:TD
1V/div.
Test mode 100TRjump
→
VREF
→
VREF
→
VREF
4 CH1:RFO
10ms/div.
Play
→
VREF
6 CH1:FEY
200ms/div.
7 CH2:FD
5 CH3:TEY
# CH4:TD
Play
→
VREF
→
VREF
→
VREF
→
VREF
4 CH1:RFO
5 CH2:TEY
500µs/div.
( CH3:dfct
CRG move
→
VREF
→
VREF
→
VREF
4 CH1:RFO
5ms/div.
5 CH2:TEY
# CH3:TD
Test mode 1TRjump
→
VREF
→
VREF
→
VREF
0.5V/div.
0.5µs/div.
500mV/div.
500mV/div.
1ms/div.
500mV/div.
500mV/div.
5 CH1:TEY
1V/div.
) CH2:CIN
500mV/div.
50µs/div.
5V/div.
4 CH1:RFO
1V/div.
5 CH2:TEY
500mV/div.
500µs/div.
# CH3:TD
1V/div.
DEH-P90HDD,P900HDD
500mV/div.
200ms/div.
500mV/div.
Search
→
VREF
→
VREF
1V/div.
1V/div.
1V/div.
Test mode 32TRjump
→
VREF
→
VREF
→
VREF
5ms/div.
53