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Tektronix 318 Technical Manual

Tektronix 318 Technical Manual

Logic analyzer

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TM 11-6625-3145-14

TECHNICAL MANUAL

OPERATOR'S, ORGANIZATIONAL, DIRECT SUPPORT,

AND GENERAL SUPPORT MAINTENANCE MANUAL

LOGIC ANALYZER

TEKTRONIX MODELS 318/338

H E A D Q U A R T E R S , D E P A R T M E N T O F T H E A R M Y

12 SEPTEMBER 1985

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Summary of Contents for Tektronix 318

Page 1 AND GENERAL SUPPORT MAINTENANCE MANUAL LOGIC ANALYZER TEKTRONIX MODELS 318/338 H E A D Q U A R T E R S , D E P A R T M E N T O F T H E A R M Y...
Page 2 TM 11-6625-3145-14 SAFETY STEPS TO FOLLOW IF SOMEONE IS THE VICTIM OF ELECTRICAL SHOCK DO NOT TRY TO PULL OR GRAB THE INDIVIDUAL IF POSSIBLE, TURN OFF THE ELECTRICAL POWER IF YOU CANNOT TURN OFF THE ELECTRICAL POWER, PULL, PUSH, OR LIFT THE PERSON TO SAFETY USING A DRY WOODEN POLE OR A DRY ROPE OR SOME OTHER INSULATING MATERIAL SEND FOR HELP AS SOON AS POSSIBLE...
Page 3 UNLESS YOU ARE QUALIFIED TO DO SO. Copyright c 1984 Tektronix, Inc. All rights reserved. Contents of this publication may not be reproduced in any form without the written permission of Tektronix, Inc. Products of Tektronix, Inc. and its subsidiaries are covered by U.S. and foreign patents and/or pending patents.
Page 4 The commercial manuals cited in paragraph la contain copyright material reproduced by permission of the TEKTRONIX, INC., BEAVERTON, OR 97075 TM 11-6625-3145-14 TECHNICAL MANUAL ) HEADQUARTERS DEPARTMENT OF THE ARMY No. 11-6625-3145-14 Washington, DC, 12 September 1985 OPERATOR’S, ORGANIZATIONAL, DIRECT SUPPORT, AND GENERAL SUPPORT...
Page 5 TM 11-6625-3145-14 TABLE OF CONTENTS Section Page INTRODUCTION Scope ............................ 0-1 Consolidated Index of Army Publications and Blank Forms ..........0-1 Maintenance Forms, Records and Reports ................0-1 Reporting Equipment Improvement Recommendations (EIR) ..........0-1 Administrative Storage ......................0-1 Destruction of Army Electronics Material ................0-1...
Page 6 TM 11-6625-3145-14 MANUAL REVISION STATUS PRODUCT: 318/338 Logic Analyzer Service Manual This manual supports the following versions of this product: All REV DATE DESCRIPTION JAN 1984 Original Issue NOV 1984 Revised Printing: Pages-X1, 1-3, 5-2,-15,-49,-50 and -51, Tab-Fig. 4 Accessories page, Fig. 9-11, Electrical Parts List, Diagrams <...
Page 7: Table Of Contents
TM 11-6625-3145-14 TABLE OF CONTENTS Page LIST OF ILLUSTRATIONS............................xv LIST OF TABLES ................................. xix OPERATOR’S SAFETY SUMMARY..........................xxi SERVICE SAFETY SUMMARY ........................... xxiii Section 1 INTRODUCTION AND SPECIFICATIONS INTRODUCTION ........................... 1-1 DESCRIPTION ............................1-1 MODES OF OPERATION ........................1-1 CONFIGURATIONS ..........................
Page 8 TM 11-6625-3145-14 TABLE OF CONTENTS (cont.) Section 3 OPERATING INSTRUCTIONS (cont.) DIAGNOSTICS............................3-5 Power-Up Self Test ........................3-5 Diagnostics Menu ........................... 3-6 User-Changeable Fields for Each Test’s Display................3-6 Diagnostic Test Descriptions......................3-8 KBD Test ..........................3-8 CRT Test ..........................3-8 CLK Test ..........................
Page 9 Serial Input Comparator ......................4-5 Serial I/O Controller........................ 4-5 DETAILED CIRCUIT DESCRIPTIONS FOR THE 318 ................4-5 318 A01 Input A Board <1> <2> A02 Input B Board <3> <4>............... 4-5 Overview ............................4-5 Address Decoder <2> ........................4-6 External Clock Input <4> ........................ 4-6 External Clock Comparator <4>...
Page 10 Bus Drivers ........................... 4-27 Keyboard and Keyboard Controller ....................4-27 Interrupt Gates ..........................4-27 Display Controller ......................... 4-27 318/338 A07 Serial, Non-Volatile Memory, RS-232C <17> <18> ............4-30 Serial Input <17> .......................... 4-30 Input Comparator ......................... 4-30 Offset Adjust......................... 4-30 Clock-Level Translator .
Page 11 RS-232 Control <18>........................4-34 Baud-Rate Selector ......................4-34 Level Converter ........................4-34 Serial I/O Controller......................4-34 318/338 A10 CRT Board <14> ......................4-35 Z-Axis Amplifier ..........................4-35 Horizontal Sweep Generator ......................4-36 Vertical Sweep Generator ......................4-37 318/338 A11 Power Supply <15> <16>....................4-37 Line Input <15>..........................
Page 12 TM 11-6625-3145-14 TABLE OF CONTENTS (cont.) Section 4 THEORY OF OPERATION (cont.) START/STOP Logic <6> ......................4-46 Trigger Qualify Flip-Flop <6>......................4-46 Retiming Clock <6> ........................4-46 Clock Qualify Flip-Flop <6> ......................4-46 Strobe Generator <6>........................4-47 External or Glitch Trigger Circuit <7> ................... 4-47 Retiming Flip-Flop <6>...
Page 13 Check 4. Threshold Voltage ....................5-9 Check 5. Parallel Data Acquisition with Test Output............5-11 Check 6. Glitch Data Acquisition with Test Output.............. 5-18 Check 7. Serial State Analyzer Check for the 318 .............. 5-19 ADJUSTMENT PROCEDURES FOR THE 318 ................... 5-22 Introduction........................... 5-22 Index of Adjustment Steps ......................
Page 14 TM 11-6625-3145-14 TABLE OF CONTENTS (cont.) Section 5 VERIFICATION AND ADJUSTMENT PROCEDURES (cont.) Mainframe ............................ 5-79 1. Adjust Power Supplies ....................5-79 2. Adjust CRT Circuit......................5-81 3. Adjust Threshold Voltages on the A05 ROM Board............5-82 Parallel Analyzer........................... 5-84 4.
Page 15 Removing the Cathode-Ray Tube (CRT)................6-12 Section 7 MAINTENANCE: TROUBLESHOOTING 318 DIAGNOSTIC TEST DESCRIPTIONS .................... 7-1 Index of 318 Diagnostic Test Descriptions ..................7-1 318 Diagnostic Test Common Signal Paths................... 7-1 Mainframe ............................7-3 1. Keyboard Test ........................7-3 2. CRT Test ........................... 7-4 3.
Page 16 TM 11-6625-3145-14 TABLE OF CONTENTS (cont.) Section 7 MAINTENANCE: TROUBLESHOOTING (cont.) 338 DIAGNOSTIC TEST DESCRIPTIONS ..................7-93 Index of 338 Diagnostic Test Descriptions ................... 7-93 338 Diagnostic Test Common Signal Paths................. 7-93 Mainframe ............................ 7-95 1. Keyboard Test ......................... 7-95 2.
Page 17: List Of Illustrations
Display for non-volatile memory tests ......................3-17 318 Input A and Input B block diagram ......................4-8 318 Simplified diagram of the ACQ control circuitry on schematics <5> and <6> ........4-9 318 Simplified diagram of the ACQ control circuitry on schematic <7> ............4-10 318 SQRAM data register format ........................
Page 18 318 Test equipment setup for the clock delay adjustment ................5-32 5-19 318 EXT CLK and DLD CLK signal adjustment locations................5-33 5-20 318 RET CLK, WE, ADRS CLK, and TRIG CLK adjustments ..............5-38 5-21 318 Capacitor adjustment oscilloscope setup waveform ................5-38 5-22 318 Capacitor adjustment waveform......................
Page 19 318 CRT calibration and check ........................7-5 318 Memory map ............................7-6 318 MPU memory address assignment ......................7-7 318 A03 and A04 partial ACQ address assignment..................7-10 318 Clock test..............................7-13 318 Word recognizer test ..........................7-16 318 ACQ memory test........................... 7-19 318 SQRAM test ............................
Page 20 TM 11-6625-3145-14 LIST OF ILLUSTRATIONS (cont.) Figure Page 7-17 Troubleshooting Tree 6: Clock A04....................... 7-52 7-18 Troubleshooting Tree 7: Word Recognizer (WR A01 A02) ................7-54 7-19 Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) ................7-57 7-20 Troubleshooting Tree 9: SQRAM A03......................7-63 7-21 Troubleshooting Tree 10: N&DL A03 ......................
Page 21 318 Clock Delay With Extender........................5-37 318 Clock Delay Without Extender........................ 5-37 318 Voltage Levels for Testing TTL ......................5-46 318 Voltage Levels for Testing V1, V2, and V3..................... 5-46 318 Parallel Data Test Conditions and Expectations ..................5-51 5-10 318 Positive Glitch Pulse Generator Setup ....................
Page 22 Page Relative Susceptibility of Semiconductors to Static Discharge Damage............6-3 318 Diagnostic Test Common Signal Paths....................7-2 318 Keyboard Test Key Code and Interrupt Assignment................7-3 318 ROM Test Address Assignment ......................7-9 318 Clock Test Program Ranges ........................7-12 318 Word Recognizer Test Port Addresses ....................
Page 23: Operator's Safety Summary
TM 11-6625-3145-14 OPERATOR’S SAFETY SUMMARY The general safety information in this summary is for both operator and service personnel. Specific cautions and warnings are found throughout the manual where they apply, but may not appear in this summary. TERMS IN THIS MANUAL CAUTION statements identify conditions or practices that could result in damage to the equipment or other property.
Page 24 TM 11-6625-3145-14 GROUNDING THE PRODUCT This product is intended to operate from a power source that does not apply more than 250 volts rms between the supply conductors or between either supply conductor and ground. This product is grounded through the grounding conductor of the power cord.
Page 25: Service Safety Summary
TM 11-6625-3145-14 SERVICE SAFETY SUMMARY FOR QUALIFIED SERVICE PERSONNEL ONLY Refer also to the Operator’s Safety Summary. DO NOT SERVICE ALONE Do not perform internal service or adjustment of this product unless another person capable of rendering first aid and resuscitation is present. USE CARE WHEN SERVICING WITH POWER ON Dangerous voltages exist at several points in this product.
Page 26: Introduction
REPORTING EQUIPMENT IMPROVEMENT RECOMMENDATIONS (EIR) If your Logic Analyzer, TEK Model 318/388 needs improvement, let us know. Send us an EIR. You, the user, are the only one who can tell us what you don’t like about your equipment. Let us know why you don’t like the design. Put if on an SF 368 (Quality Deficiency Report).
Page 27: Description
The digital delay counts up to 65,000 clock cycles. In the 318, data before or after the occurrence of a specified trigger sequence can be acquired and stored at sample intervals ranging from 20 ns to 500 ms with two lock and trigger qualifiers.
Page 28: Configurations
Analyzer to 338S1 status. The package adds serial analysis, an RS-232C interface, and non-volatile memory to the basic 338 features. RELATED DOCUMENTS In addition to this service manual, the 318/338 Operator's Manual, the 318/338 Logic Analyzer Reference Guide , and the 318/338 Logic Analyzer Workbook will also help you understand and operate the 318/338.
Page 29: Standard And Optional Accessories
TM 11-6625-3145-14 Introduction & Specifications-318/338 Service STANDARD AND OPTIONAL ACCESSORIES Standard Accessories: 016-0697-00 Accessory Pouch 070-4433-00 318/338 Logic Analyzer Operator’s Manual 070-4435-00 318/338 Logic Analyzer Reference Guide 318/338 Logic Analyzer Workbook 070-7061-00 010-6107-03 P6107 Probe (1 probe with 318/338) (2 probes with 318S1/338S1)
Page 30: Specifications
Tables 1-1 through 1-3 list the electrical, environmental, and physical characteristics of the 318, 338, 318S1 ,and 338S1 logic analyzers. The electrical characteristics are valid for logic analyzers that have been adjusted as described in this manual (refer to the Verification and Adjustment Procedures section).
Page 31 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information Sampling Clock source internal or external External clock mode Typically: (using P6107 Probe) Data setup time 13 ns min. 14 ns min. 8 ns...
Page 32 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information Data Memory Depth Acquisition memory 16 X 256 bits 32 X 256 bits Reference memory 16 X 256 bits 32 X 256 bits...
Page 33 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information Trigger position In delay mode, the trigger posi- Begin word 7 tion is assigned by the user as Center word 127 follows: word 247...
Page 34 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information Maximum logic swing -15 V to threshold voltage plus 10 V. ±40 V max. Maximum non-destructive Threshold Threshold level for qualifier input is same as data inputs.
Page 35 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information Geometry 1 mm bow maximum on any straight vertical or horizontal line. Linearity 1.4 times maximum or 0.9 times minimum at the corner of display...
Page 36 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information TEST SIGNAL OUTPUT Test Output Output level TTL level 0.7 V or less for low-level output. 2.4 V or more for high-level output.
Page 37 TM 11-6625-3145-14 Introduction & Specifcations-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information POWER SUPPLY Ranges of line voltages 90 V to 132 V AC or 180 V to 250 V AC, 48 Hz to 440 Hz, single phase Power consumption 95 W max, 150 VA max.
Page 38 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information SERIAL STATE ANALYZER FUNCTION Data Input (Using P6107 Probe) 10 MΩ ± 3%, paralleled by approx. 13 pF at Input R and C P6107 probe should be compen- probe tip.
Page 39 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information External clock for Up to 19200 bits per second. 1X or 16X, 1X sampling clock asynchronous mode selectable. External clock for Up to 19200 bits per second.
Page 40 TM 11-6625-3145-14 Introduction & Sp4clfications-318/338 Service Table 1-1 (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information RS-232C INTERFACE Data transmission timing asynchronous only Communication mode full duplex Bits/Characters 8 bits with parity ASCII characters Parity even Stop bit Responds to one or more, sends one.
Page 41 TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-1. (cont.) 318/338 ELECTRICAL SPECIFICATIONS Performance Supplemental Characteristics Requirements Information NON-VOLATILE MEMORY (Option 01) Memory size 3 pages for setup parameters; 1 page for 8 X 2048 bits ACQ or REF data. Non-volatile period Approx.
Page 42: 318/338 Environmental Specifications
TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-2. 318/338 ENVIRONMENTAL SPECIFICATIONS Characteristics Description Temperature Operating 0°C to +50°C Storage -55°C to +75°C (but contents of non-volatile memory may be lost with temperatures below -40°C) Altitude Operating To 4.5 km (15,000 feet). Maximum allowable ambient temperature decreased by 1°C/1000 feet from 5000 feet...
Page 43: 318/338 Physical Specifications
TM 11-6625-3145-14 Introduction & Specifications-318/338 Service Table 1-3. 318/338 PHYSICAL SPECIFICATIONS Characteristics Description Weight Net, without accessories about 5.1 Kg (about 12 lbs.) Dimensions Heights without accessory pouch 12.0 cm (4.7 in) with accessory pouch 17.4 cm (6.8 in) Width with handle 23.7 cm (9.3 in)
Page 44: Options
TM 11-6625-3145-14 OPTIONS This section briefly describes the options available for a Sony/Tektronix 318 or 338 Logic Analyzer. Further information regarding any option can be found in the manual section containing the type of information desired. For instance, to find information on the theory of operation of the non-volatile memory for 318S1/338S1, refer to the Theory of Operation section.
Page 45: Operating Instructions
OPERATING INSTRUCTIONS INTRODUCTION The 318/338 is a menu-driven system. This means that all operations are set up by means of menus displayed on the monitor screen. Refer to the 318/338 Logic Analyzer Operator’s Manual for additional information on the general operation and characteristics of the 318/338 menus.
Page 46: Menu Characteristics
Manual, and as each menu is called later in this section. POWER-UP CONFIGURATION DISPLAY When the 318/338 is first powered up, it lists the configuration of the 318/338 and identifies option modules. It then shows the results of the self test.
Page 47: Error Message And Acquisition Status Readout
INPUTS DURING ACQUISITION Even when acquiring data (when waiting for a trigger or in REPEAT mode), the 318/338 can accept any keys in any fields except for those that generate the message: PRESS STOP. This capability allows you to change the delay value or sample clock while looking at continuously acquired data, without pressing the STOP key.
Page 48: Trigger Menu
The values of setup parameters and acquisition or reference memory can be stored in NVM memory. This means that once the parameters and memory are saved, they will not change (in the NVM) when the 318/338 is powered off and back on again.
Page 49: Diagnostics
During the first phase of self test, the 318/338 tests the major blocks of system RAMs and ROMs. After RAM/ROM tests, the 318/338 is initialized. After several seconds, the display shows a configuration listing (see 3 in Figure 3-1). At the top of the screen (1 in Figure 3-1), the message SELF TEST VERSION X.X appears.
Page 50: Diagnostics Menu
To access the Diagnostics menu when no errors have been detected by the power-up tests, induce a power-up failure from the keyboard by holding down any key (except STOP) from the time the 318 338 is turned on to the time the power- up self tests are completed (approximately 7 seconds).
Page 51: Diagnostics Menu: First Display
TM 11-6625-3145-14 Operating Instructions-318/338 Service Figure 3-3. Diagnostics menu: first display. Figure 3-4. Display sample with ALL/SINGLE and data entry fields. Figure 3-5. Display sample with LOOP and DISP fields. 3 LOOP - You can set this field to OFF, I/O, ERROR, or TEST by pressing SELECT. When the field is set to I/O, the looping feature allows only I/O instructions to be run repeatedly.
Page 52: Diagnostic Test Descriptions
TM 11-6625-3145-14 Operating Instructions-318/338 Service When the field is set to I/O or ERROR, the prompt message START TO ADVANCE appears at the bottom of the screen. If START is pressed during LOOP tests, the current loop of tests stops and the next loop of tests is started. You can change fields during tests.
Page 53: Crt Test: Second Display
TM 11-6625-3145-14 Operating Instructions-318/338 Service Figure 3-8. CRT test: second display. Figure 3-9. CRT test: third display. Figure 3-10. CRT test: fourth display.
Page 54: Clk Test
TM 11-6625-3145-14 Operating Instructions-318/338 Service CLK Test. To enter this test, press 2 while in the Diagnostics menu. This is a test of the internal timebase. It is not a verification test; neither PASS nor FAIL will appear on the screen. If ALL is selected, the value of the clock interval being tested will appear on the screen.
Page 55: Acq Test
TM 11-6625-3145-14 Operating Instructions-318/338 Service ACQ Test. To enter this test, press 4 while in the Diagnostics menu. This test is for acquisition RAM. Refer to the Diagnostics menu or to the trouble-shooting tree in Section 7 for details. Figure 3-13 illustrates the ACQ test.
Page 56: N&Dly Test
TM 11-6625-3145-14 Operating Instructions-318/338 Service N&DLY Test. To enter this test, press 6 while in the Diagnostics menu. This test verifies that the N and DELAY counter will run continuously. Refer to the Diagnostics menu or to the trouble-shooting tree in Section 7 for details. Figure 3-15 illustrates the N&DLY test.
Page 57: Thrsh Test
TM 11-6625-3145-14 Operating Instructions-318/338 Service THRSH Test. To enter this test, press 8 while in the Diagnostics menu. This test verifies that the sawtooth wave or constant threshold level signal will be generated. Refer to the Diagnostics menu or to the trouble-shooting tree in Section 7 for details.
Page 58: P6107 Probe Assignment And Compensation For The 318S1 And 338S1
When FIT appears on the screen the probe compensation is properly adjusted (20 pF). The 318/338 will run continuously until STOP is pressed. The other keys are disabled during probe compensation. To exit this menu, press STOP and then press X.
Page 59: Ser Test
SER Test. This test is only available with the 318S1 and 338S1. It requires the optional Self Test Adapter (013-0173-01). Contact your Tektronix sales representative if you need assistance in ordering. To begin this test, press A while in the Diagnostics menu. This test is for the SIO used in the serial data acquisition mode.
Page 60: Rmt Test
TM 11-6625-3145-14 Operating Instructions-318/338 Service RMT Test. This test is available only with the 318S1/338S1. To begin this test press B while in the Diagnostics menu. This test is for the SIO used by the remote mode. Refer to the Diagnostics menu or to the trouble-shooting tree in Section 7 for details.
Page 61: Nvm Test
TM 11-6625-3145-14 Operating Instructions-318/338 Service NVM Test. This test is only available for the 318S1 /338S1. ’to begin this test press C while in the Diagnostics menu. This is the non-volatile memory test. Refer to the Diagnostics menu or to the trouble-shooting trees in Section 7 for details.
Page 62: Theory Of Operation
THEORY OF OPERATION SECTION ORGANIZATION This section contains a functional description of the circuitry used in the 318 and 338 Logic Analyzers. It is divided into two sub-sections: General System Description and Detailed Circuit Description . Block diagrams, wiring diagrams, and detailed schematics for the 318 and 338 are found in the tabbed Diagrams section at the rear of this manual.
Page 63: Acquisition Module
338 has four P6451 parallel data probes. Each probe accepts eight channels of data and one qualifier channel for either trigger or clock qualifications. Thus, 16 channels of data and 2 channels of qualifiers are available for the 318, and 32 channels of data and 4 channels of qualifiers are available for the 338.
Page 64: Data Buffers, Delay Lines, And First Lactches
1-2-5 sequence with LSI-B (A04 U140), to produce a 20 ns to 500 ms range. Sampled Data RAM and Glitch RAM. In the 318, a 32 X 256-bit high-speed RAM is used for storing both sampled data and glitch data.
Page 65: Mainframe
The keyboard serves as the operator’s interface. The operator selects the menu to be displayed and sets up the instrument from the keyboard. All functions of the 318/338 can be controlled from this keyboard in the local mode. Pressing any key will cause an interrupt to be sent to the MPU, along with the key code corresponding to the key pressed.
Page 66: Power Supply (A11And A12)
POWER SUPPLY (A11AND A12) The power supply provides dc voltages of -3.3 V, -12 V, + 12 V, -5 V, -2 V, and +5 V to operate the 318/338 circuitry. It also supplies voltage for the fan motor. It operates in the line input range of either 90 to 132 V ac or 180 to 250 V ac at 48 Hz to 440 Hz single-phase.
Page 67: Address Decoder <2
TM 11-6625-3145-14 Theory of Operation-318/338 Service A02U202 receives ECL-level differential data from channel 8 of the parallel data probe. The data enters the circuit board via pins 22 and 10 of J204, and connects to pins 10 and 9 of A02U202.
Page 68: Glitch Control <2> <3> <4
ACQ memory. WORD RECOGNIZER <1> <2> <3> The Word Recognizer (WR) consists of three 16-channel word recognizers with high-speed memories. The 318 offers three word recognizer functions where three different words may be set simultaneously. They are named trigger words A, B, and C.
Page 69: Probe Compensation <4
Threshold A.) 4434-580 Figure 4-1. 318 Input A and Input B block diagram. 318 A03 ACQ CONTROL BOARD <5> <6> <7> The A03 Acquisition Control board (parallel data) has two registers and memory that acquisition parameters are loaded into before data acquisition.
Page 70: Simplified Diagram Of The Acq Control Circuitry On Schematics <5> And <6>
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-2. 318 Simplified diagram of the ACQ control circuitry on schematics <5> and <6>.
Page 71: I/O Address Decoder <6
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-3. 318 Simplified diagram of the ACQ control circuitry on schematic <7>. I/O ADDRESS DECODER <6> The I/O address decoder consists of A03U110 and A03U112. The circuit provides a single pulse, used to activate a preselected device which then communicates with the MPU and controls the start logic and trigger sequencer circuits.
Page 72: Qualify/Sqram Data Register <5
During an acquisition, A03U106 and A03U108 are used as the qualify register. Qualify data and other control bits are written to them at I/O addresses 50 and 51 respectively. The format is illustrated in Figure 4-5. Figure 4-4. 318 SQRAM data register format. Figure 4-5. 318 Qualify register format. 4-11...
Page 73: Qualify Logic <5> <6
TM 11-6625-3145-14 Theory of Operation-318/338 Service QUALIFY LOGIC <5> <6> The qualify logic circuit consists of A03U 118A, B, A03U1 16A, B. The qualifier signals QA, QB, QA, and QB come from the A02 Input B board. Their signals are wire-ORed with the outputs of the Qualify Register, A03U106 and A03U108, and go to the EXOR gates A03U116 and A03U118 <5>...
Page 74: External Or Glitch Trigger Circuit <7
TM 11-6625-3145-14 Theory of Operation-318/338 Service The write enable (WE) Clock circuit consists of A03U132B, A03R1 12B, A03R132, and A03C106. The output of A03U132B is wire-ORed with the output of the STOP flag and goes to the write enable inputs of the ACQ memory devices on the A04 board <8>.
Page 75: Address Buffer <7
TM 11-6625-3145-14 Theory of Operation-318/338 Service TRIG A, TRIG B, and TRIG C are issued from the word recognizer on the A01 and the A02 boards. The outputs of these flip-flops are wire-ORed with the outputs of the address buffer (A03U140, A03U154B, and A03U154C) and go to the address inputs of the SQRAM (A03U144).
Page 76: Trig'd Flag Circuit
This circuit consists of A03U146. It is used only for the diagnostic test of the SQRAM and the word recognizer. LSI-A A03U158 <7> LSI-A is a bipolar LSI circuit designed by Sony/Tektronix. LSI-A includes an address decoder, 16- bit N register, 16-bit DL register, 16-bit synchronous preloadable counter with fast-carry propagation logic, the mask register, and the acquisition status logic.
Page 77: N Register
TM 11-6625-3145-14 Theory of Operation-318/338 Service N Register. The N register is a 16-bit register that holds the N value assigned in the Trigger menu. The MPU writes the N value into the N register at I/O addresses 41 and 42 DL Register.
Page 78: A04 Acq Memory Board <8> <9
Active high; CARRY is read as CARRY FLAG by the MPU issuing RDSTS. CAFLG is the output of the same latch which CARRY is latched into by RDSTS. 318 A04 ACQ MEMORY BOARD <8> <9> ACQUISITION MEMORY AND ACO ADDRESS COUNTER <8>...
Page 79: Acquisition Memory
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-6. 318 Simplified diagram of the acquisition memory and ACQ address counter circuit. Acquisition Memory. The 256-word X 32-bit high-speed memory consists of RAMs A04U116, A04U118, A04U120, A04U122, A04U124, A04U126, A04U128, and A04U130. The ACQ memory location of each data bit to be stored is controlled by the address counter.
Page 80: Timebase And Mpu Bus Interface <9
TM 11-6625-3145-14 Theory of uperation-318/338 Service TIMEBASE AND MPU BUS INTERFACE <9> The timebase and MPU bus interface circuit consists of the frequency divider, timer, slow clock detector, INTCLK buffer, data selector, full valid flag latch, TTL-to-ECL translater, ECL-to-TTL translator, and address decoder.
Page 81: Full Valid Flag Latch
SET F VALID signal and reset by the RESET signal from the A03 ACQ board. LSI-B (A04U140). A04U140 is a Sony/Tektronix-designed hybrid chip that provides simplified circuit construction and reduced circuit board space and power consumption. Its circuity consists of an address decoder, divider, timer, and slow- clock detector.
Page 82: Lsi-B (A04U 140)
TM 11-6625-3145-14 Theory of Operation-318/338 Service Table 4-3. 318 LSI-B (A04U140) INPUT SIGNALS Signal Names Description Generates data latch strobe. The data latch state is by this low-level signal. CS1X Chip select for A04U140. A1-A0 Address for data latch. (A1 = MSB, A0 = LSB) EDBO-EDB5 Data for internal selector.
Page 83: Internal Clock (Intclk)
TM 11-6625-3145-14 Theory of Operation-318/338 Service Table 4-5. INTERNAL CLOCK (INTCLK) Input of A04U140 Selected internal clock (EN, CS1X low) at of A04U140 pin 13 20ns 50ns 100ns 200ns 500ns 1µs 2µs 5µs 10µs 20µs 50µs 100µs 200µs 500µs 100ms...
Page 84: Simplified Diagram Of The Timebase And Mpu Bus Interface Circuit
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-7. 318 Simplified diagram of the timebase and MPU bus interface circuit. 4-23...
Page 85: 318/338 A05 Rom/Threshold Board --<10
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-8. 318 Timing diagram of the slow-clock detector and timer circuit. 318/338 A05 ROM/THRESHOLD BOARD <5> A simplified diagram of the ROM and the Threshold circuits is shown in Figure 4-9. ROM CIRCUITRY The 318/338 has 104 K-bytes of ROM and 8 K-bytes of RAM.
Page 86: Threshold Circuit
TM 11-6625-3145-14 Theory of Operation-318/338 Service Table 4-6. (cont.) MEMORY MAP Page Address Range Capacity and Use C000-DFFF ROM 7, 8K X 8; Jump Table E000-E7FF NVM RAM, 2K X 8 E800-EFFF Display RAM, 2K X 8 F000-F7FF RAM 1, 2K X 8...
Page 87: Simplified Diagram Of The Rom And Threshold Circuits
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-9. 318/338 Simplified diagram of the ROM and threshold circuits. 4-26...
Page 88: 318/338 A06 Mpu/Display Board <11
The Z-80A microprocessor unit (A06U200) is the heart of the 318/338. All other stages of the circuitry either provide data to the MPU and receive instructions from it, or they accept data from the MPU and issue instructions to it.
Page 89 Theory of Operation-318/338 Service A06U 130 is the TV timing generator for the display control of the 318 and the 338. It generates C-SYNC (Composite SYNC), HD (Horizontal Drive), VD (Vertical Drive), and CBL (Composite Blanking) from the output signal of A06U120B (244.4 ns clock).
Page 90: Simplified Diagram Of The Mpu/Display Board
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-10. 318/338 Simplified diagram of the MPU/Display board. 4-29...
Page 91: 318/338 A07 Serial, Non-Volatile Memory, Rs232C <17> <18
TM 11-6625-3145-14 Theory of Operation-318/338 Service 318/338 A07 SERIAL, NON-VOLATILE MEMORY, RS232C <17> <18> SERIAL INPUT <17> The serial input circuit consists of an input comparator, an offset adjustor, and a clock level translator. It provides serial data and external clock signals for serial operation. A simplified diagram of the serial input circuit is shown in Figure 4-11.
Page 92: Battery Switch
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-11. 318/338 Simplified diagram of the serial acquisition and RS-232C circuit. Battery Switch. The battery switch circuit consists of A07Q140, A07Q141, A07C160, and A07CR170. When the system power comes up, A07Q140 and A07Q141 turn ON. Pin 18, connected through a 2K resistor, and pin 24 of A07U7 are connected to the Vcc line.
Page 93: Serial Data Acquisition <18
TM 11-6625-3145-14 Theory of Operation-318/338 Service SERIAL DATA ACQUISITION <18> The serial data acquisition circuit consists of the data bus buffer, I/O selector, baud rate selector, external trigger latch, and serial I/O controller. It provides the serial data acquisition function. A simplified iagram is shown in Figure 4-11.
Page 94: External Trigger Latch And Data Polarity
TM 11-6625-3145-14 Theory of Operation-318/338 Service External Trigger Latch and Data Polarity. Latched data D3 of A07U31 is applied to pin 10 of A07U1 2C. This signal is used to select the external trigger polarity. If the polarity is positive, the external trigger’s positive-going edge sets A07U22B.
Page 95: Control <18
TM 11-6625-3145-14 Theory of Operation-318/338 Service RS-232 CONTROL <18> The RS-232 control circuit consists of the baud-rate selector, level converter, and serial I/O controller. This circuit provides the remote control operation. A simplified diagram of this stage is shown in Figure 4-11.
Page 96: 318/338 A10 Crt Board <14
A07Q100 increases. A less-positive voltage at the cathode brightens the display, while a more-positive voltage blanks it. The voltage at G1 of V200, supplied from potentiometers A07R245 and A07R247, controls the brightness of the display. Figure 4-12. 318/338 Simplified diagram of the CRT circuit. 4-35...
Page 97: Horizontal Sweep Generator
To clarify this circuit’s operation, a simplified diagram and associated waveforms are shown in Figure 4-13. The CHD (CRT Horizontal Drive) pulse is applied to the base of A10Q200, and the inverted CHD output is AC-coupled to the base of A10Q220. Figure 4-13. 318/338 Simplified diagram and waveform of the horizontal sweep generator. 4-36...
Page 98: Vertical Sweep Generator
A10C015 charge and discharge. The sawtooth signal is AC-coupled to pin 7 on A10U001. Amplifier A10U001 drives the vertical deflection yoke L1 50. 318/338 All POWER SUPPLY <15> <16> The power supply circuit provides the operating power for this instrument from the ac line-voltage source.
Page 99: Inverter Start Network <15
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-14. 318/338 Simplified diagram of the power supply circuit. Thermistors A11RT101 and A11RT102 limit the surge current when the power supply is first turned on. After the instrument is in operation, the resistance of the thermistors decreases so that they have little effect on the circuit. When the instrument is turned off, the Inverter Control stage turns off the inverter, preventing it from discharging A11C121 and A11C122;...
Page 100: Inverter Control <16
TM 11-6625-3145-14 Theory of Operation-318/338 Service INVERTER CONTROL <16> The inverter control stage, made up primarily of A12U21, provides voltage regulation, a dead-time controller, and a current limiter. For regulation purposes, A12U21 varies the hold-off time of the Inverter Switching transistor. Under normal operating conditions, only pin 2 of A12U21 controls the hold-off time.
Page 101: Fan Circuit And Fan <16
The following paragraphs contain theory of operation information for the 338 Logic Analyzer. For information on the theory of operation for the 318 Logic Analyzer, refer to the Table of Contents and preceding sections of this chapter. 338 A01 INPUT A BOARD <19> <20>...
Page 102: Glitch Control (Ch 0-7) <21
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-15. 338 Input A and Input B block diagram. word recognizer for channels 16 through 31. The I/O address 02 (A01U114 pin 12), resets the WR address counter. The I/O address 03 (A01U114 pin 14) is the clock selecter port. I/O address 02 also controls the glitch trigger shift register, which enables the glitch trigger circuit.
Page 103: Word Recognizer <19> <21
TM 11-6625-3145-14 Theory of Operation-318/338 Service M218’s glitch trigger outputs moves to high. A02U224 <21> receives the glitch trigger enable data serially and sends it to the M218s in parallel. A02U224 controls the M218's pin 15. This is a shift register and can have data written to it in serial.
Page 104: Simplified Diagram Of The Acq Control Circuitry On Schematics <5> And <6>
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-16. 338 Simplified diagram of the ACQ control circuitry on schematics <5> and <6>. Figure 4-17 shows the external and glitch trigger circuitry, retiming flip-flops, address buffer, SQRAM, trigger sequencer circuit, SQRAM Data/Word recognizer, data selection circuit, and LSI-A.
Page 105: I/O Address Decoder <6
TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-17. 338 Simplified diagram of the ACQ control circuitry on schematic <7>. I/O ADDRESS DECODER <6> The I/O address decoder consists of A03U110 and A03U112. The circuit provides a single pulse which activates the specific devices that communicate with the MPU and that control the start logic and the trigger sequence circuitry.
Page 106: Qualify/Sqram Data Register <5
TM 11-6625-3145-14 Theory of Operation-318/338 Service QUALIFY/SQRAM DATA REGISTER <5> The qualify/SQRAM data register consists of A03U106, A03U108, A03U102, and A03U104. The MPU writes the qualify data into U106 at I/O address 50 , U108 at I/O address 51 , and into A03U102 and A03U104 at I/O address 52 The data format is illustrated in Figures 4-18 and 4-19.
Page 107: Qualify Logic <5
TM 11-6625-3145-14 Theory of Operation-318/338 Service QUALIFY LOGIC <5> The qualify logic consists of A03U100, A03U114A, A03114B, A03U114C, A03U116A, A03U116B, A03U116C, A03U118A, and A03U118B. The qualifier signals QA, QB, QC, and QD from the A02 INPUT B board go to gate A03U100, where they are converted into inverting and non-inverting signals.
Page 108: Strobe Generator <6
TM 11-6625-3145-14 Theory of Operation-318/338 Service STROBE GENERATOR <6> The strobe generator contains the write enable (WE) circuit, teh address clock (ADRSCLK) circuit, and the trigger clock (TRIGCLK1, TRIGCLK2) circuits. The WE clock circuit consists of A03U132B, A03R112B, A03R132, and A03C106 <6>. The output of A03U132B is wire- ORed with the output of the STOP flag and goes to the write enable inputs of the ACQ memory on the A04 ACQ Memory board <8>.
Page 109: Address Buffer <7
TM 11-6625-3145-14 Theory of Operation-318/338 Service The signals TRIG A, TRIG B, TRIG C, EXTVG FLAG, and TRIG QUAL are latched into each flip-flop by the retiming clock. TRIG A, TRIG B, and TRIG C are issued by the word recognizers on the A01 and the A02 boards.
Page 110: N Flag Circuit
This circuit consists of U146<7> .It is used only for diagnostic testing of the SQRAM and the word recognizer. LSI A A03U158 <7> LSI-A (A03U158) is a bipolar LSI circuit designed by Sony/Tektronix. LSI-A includes an address decoder, 16-bit N register, 16-bit DL register, 16-bit synchronous preloadable counter with fast- carry propagation logic, the mask register, and the acquisition status logic.
Page 111: Address Decoder
TM 11-6625-3145-14 Theory of Operation-318/338 Service Address Decoder. The address decoder provides necessary pulses for the initialization and presetting of the above circuits. Circuit selection is made using the three LSBs of Address from the MPU, while CS0X is low.
Page 112: Lsi-A Output Signals
TM 11-6625-3145-14 Theory of Operation-318/338 Service Table 4-11. 338 LSI-A INPUT SIGNALS Signal Names Description TIMER Timer from the LSI-B occurs at a constant interval after it is cleared by the CLR INT signa l at I/O address 5F TRIG’D Active high;...
Page 113: A04 Acq Memory Board <8> <9
TM 11-6625-3145-14 Theory of Operation-318/338 Service 338 A04 ACQ MEMORY BOARD <8> <9> ACQUISITION MEMORY AND ACQ ADDRESS COUNTER <8> The acquisition memory and the ACQ address counter circuit consists of data memories for parallel acquisition and the address counter for these memories. A simplified diagram of the acquisition memory and the ACQ address counter is shown in Figure 4-20.
Page 114: Acq Address Counter And Carry Latch
TM 11-6625-3145-14 Theory of Operation-318/338 Service ACQ Address Counter and Carry Latch. The ACQ address counter designates the memory location for each data bit to be stored. The counter, consisting of A04U136 and A04U138, is a synchronous, 8-bit (divide by 256) binary counter which is reset to zero by the RESET signal from the A03 ACQ control board at the beginning of each acquisition.
Page 115 TM 11-6625-3145-14 Theory of Operation-318/338 Service Figure 4-21. 338 Simplified diagram of the timebase and MPU bus interface circuit. 4-54...
Page 116: Ecl-To-Ttl Translator And Ttl Bus Buffer
SET F VALID signal and reset by the RESET signal from the A03 ACQ Control board. LSI-B A04U140. The Sony/Tektronix A04U140 is a hybrid chip that provides simplified circuit construction, reduced circuit board space, and lower power consumption. Its circuitry consists of an address decoder, divider, timer, and slow clock detector.
Page 117: Lsi-B A04U140
The four conditions of the CLKSLW output (high, slow, low, and fast) must be read before the start of gate timing, because the CLKSLW signal is changed by the gated SYSCLK. The function of each signal in A04U140 is as follows: Table 4-13. 318 LSI-B (A04U140) INPUT SIGNALS Signal Names Description Generates data latch strobe.
Page 118: Internal Clock (Intclk)
TM 11-6625-3145-14 Theory of Operation-318/338 Service Table 4-15. INTERNAL CLOCK (INTCLK) Input of A04U140 Selected internal clock (EN, CS1X low) at of A04U140 pin 13 20ns 50ns 100ns 200ns 500ns 1µs 2µs 5µs 10µs 20µs 50µs 100µs 200µs 500µs 10ms...
Page 119: Verification And Adjustment Procedures
VERIFICATION AND ADJUSTMENT PROCEDURES...
Page 120: Introduction
We recommend that you construct the following test fixture to assist in checking the performance of the 318/338. The 318/338 multi-probe test fixture functions as a BNC-to-square pin adapter with 50 ohm termination. Its purpose is to connect multiple 318/338 probe leads to a single pulse generator output without causing excessive capacitive and inductive loading.
Page 121 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Parts list: Part number Quantity Connector (BNC), male 131-0602-00 Connector, Rcp. Elect. (oscilloscope probe) 131-0258-00 Plain 210-0413-00 Right-angle terminal set (right-angle square pins) 131-1425-00 Connector terminal set (straight square pins) 131-1343-00 Terminal lug 1/4 inch 210-0223-00 Terminal lug .391 inch l.D.
Page 122 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service d. Place the square pin strips back to back and solder the last pins on each end of the strips together. (You should now have the outermost four pins on each end of the assembly soldered together.) e.
Page 123: Test Setup Information
The procedures in this Verification and Adjustment Procedures section require some test equipment and general information relevant to all configurations of the 318/338 Logic Analyzer. This information is presented here at the front of the section to prevent duplication throughout the following procedures.
Page 124: Equipment Needed For The Adjustment Procedures And The Performance Check Procedures
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Table 5-1. EQUIPMENT NEEDED FOR THE ADJUSTMENT PROCEDURES AND THE PERFORMANCE CHECK PROCEDURES Perf. Adj. Tektronix Description Check Proc. Equivalent Oscilloscope 100 MHz dual trace (Mainframe) 7904 Vertical plug-in 7A26 Horizontal plug-in 7B80...
Page 125: Functional Check Procedures For The 318
FUNCTIONAL CHECK PROCEDURES FOR THE 318 The following procedures are for the 318 Logic Analyzer only. The Functional Check for the 338 Logic Analyzer begins in the second half of this section; refer to the margin tabs for help in locating the 338 procedures.
Page 126: Index Of Functional Checks
Refer to Figure 5-3. This key blinks when hit. Figure 5-3. 318 Successful Power-up Figure 5-4. 318 Keyboard test display diagnostics display. CHECK 2. KEYBOARD 1. Keyboard operation can be checked with the diagnostic program O.KBD. To start this program, turn on the power while pressing any numeric key until an error message appears on the CRT.
Page 127: Check 3. Crt
Verification and Adjustment Procedures-318/338 Service CHECK 3. CRT Refer to Figures 5-5, 5-6, 5-7, and 5-8. Figure 5-5. 318 CRT test cross-hatch pattern. Figure 5-6. 318 CRT test white pattern. Figure 5-7. 318 CRT test parallel acquisition Figure 5-8. 318 CRT test serial acquisition character fonts.
Page 128: Check 4. Threshold Voltage
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service The CRT test generates the following types of patterns for the CRT adjustment and visual check. • Cross-hatch pattern (Figure 5-5). Used to adjust the CRT circuit. • White pattern (Figure 5-6). Used to check for phosphor defects.
Page 129 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Threshold Level V2 Set Threshold LEVEL V2 to +0.3 V. b. Set both Pod A and Pod B equal to V2. c. Press the START key. The trigger position is displayed on the screen will be <T=7W>, <T=127W>, or <T=247W>...
Page 130: Check 5. Parallel Data Acquisition With Test Output
CHECK 5. PARALLEL DATA ACQUISITION WITH TEST OUTPUT 1. Parallel Data Acquisition a. Power-up the 318 and connect the P6107 External Clock probe tip to TEST OUTPUT-C on the right side pannel. Refer to Figure 5-9. b. Connect the data leads of the P6451 Parallel Data probe in Pod A to TEST OUTPUT as follows:...
Page 131 TM 11-6625-3145-14 Verification and Adjustment’Procedures-318/338 Service c. Power up the 318 and set up as follows: SETUP MENU GROUP ON = AAAAAAAA 76543210 THRESHOLD MENU LEVEL V1 = + 1.3V V2 = -1.3V INPUT EXT CLK = POD A =...
Page 132 Refer to Figure 5-10. Connect the data leads of the P6451 Parallel Data probe in Pod A to TEST OUTPUT as follows: P6451 Channel TEST OUTPUT See Text Not Connected Figure 5-10. 318 External trigger check setup. b. Connect TRIG INPUT, on the right side panel, to TEST OUTPUT-7. 5-13...
Page 133 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service c. Setup the 318 as follows: SETUP MENU GROUP AAAAA, 765413210 THRESHOLD MENU LEVEL +1 3V -1 3V INPUT EXT CLK= POD A= POD B= TRIGGER MENU Source EXT TRIG 10-µS TRIG IMMEDIATELY...
Page 134 ATRG=H B’TRG=H d. Press the START key. e. Check to make sure the 318 is never triggered. f. Press the STOP key. g. Connect the qualifier lead of the P6451 Parallel Data probe in Pod A to TEST OUTPUT-7 and the qualifier tip of the P6451 probe in Pod B to TEST OUTPUT-6.
Page 135 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-11. 318 Trigger qualifier check setup. 7. Clock Qualifier Check Setup a. Connect the data leads of the P6451 Parallel Data probe in Pod A to TEST OUTPUT as follows: P6451 Channel...
Page 136 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service c. Set up the 318 as follows: SETUP MENU GROUP ON = AAAAAAA (note: A0= off) 7654321 THRESHOLD MENU LEVEL + 1.3V - 1.3V INPUT EXT CLK = POD A = POD B = TRIGGER MENU 10 µS...
Page 137: Check 6. Glitch Data Acquisition With Test Output
1. Glitch Data Acquisition a. Connect the data leads of the P6451 Parallel Data probe in Pod A to TEST OUTPUT as follows: P6451 Channel TEST OUTPUT Not Connected b. Set up the 318 as follows: SETUP MENU GROUP ON = AAAAAAAA 76543210...
Page 138: Check 7. Serial State Analyzer Check For The 318
Set the terminal character format to 8 bits per character. c. Set the 318 POWER switch to ON and press the SETUP key after the diagnostic program has run. d. Set the major mode to SERIAL and press the EXECUTE key.
Page 139 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-12. 318 Setup for serial data analysis. 2. Remote Control Operation a. Connect the test setup as shown in Figure 5-13. b. Set the terminal character format to 8 bits per character, even parity, (on the 4025, type !parity even ) and set the echo mode to remote.
Page 140 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-13. 318 Setup for RS-232C control. 5-21...
Page 141: Adjustment Procedures For The 318
ADJUSTMENT PROCEDURES FOR THE 318 INTRODUCTION The following pages contains the Adjustment Procedures for the 318 Logic Analyzer. Information on the 338 Logic Analyzer is located later in Section 5; refer to the page-edge tabs for help in locating 338 information.
Page 142: Index Of Adjustment Steps
318. If further information is required, refer to the disassembly procedures in Section 6:General Maintenance. It is necessary to perform the following sequence step by step, because all timings in the 318 are level-sensitive. INDEX OF ADJUSTMENT STEPS...
Page 143: Adjustable Power Supply Tolerances
Move the DMM plus (+) lead to each point shown in Table 5-4. (Set the DMM range as required.) h. Check that the DMM readings are within the limits given in Table 5-4. 4434-584 Figure 5-14. 318 Power supply adjustments. Table 5-3. 318 ADJUSTABLE POWER SUPPLY TOLERANCES...
Page 144: Non-Adjustable Power Supply Tolerances
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Table 5-4. 318 NON-ADJUSTABLE POWER SUPPLY TOLERANCES J1 Pin Number Voltage Limits -12 V pin -11.0 V to -13.0 V +12 V pin +11.0 V to +13.0 V -2 V pin -1.80 V to -2.20 V 2.
Page 145 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 3. Adjust Threshold Voltages on the A05 ROM board Equipment Required 1 Digital Multimeter (DMM) Refer to: Figure 5-16. a. Reference Voltage Adjustment (1) Connect the P6451 probes to PARALLEL DATA INPUTS A and B.
Page 146: Parallel Analyzer
Enter the Threshold menu and set EXT CLK input to V1. d. Set CLK to EXT+. e. Select the TRIGGER Menu and set the events field: 00000*WA OFF:WB OFF:WC. This will cause the 318 to acquire data without triggering.
Page 147 Select Threshold for POD A = V1, and POD B = V1. e. Set CLK to EXTT. f. Select the TRIGGER Menu and set the events field: 00000*WA OFF:WB OFF:WC. This will cause the 318 to acquire data without triggering.
Page 148 Adjust R302 to the center position between the points marked in procedures (d) and (f). h. Press the STOP key. 4434-587 Figure 5-17. 318 Threshold voltage adjustments on the INPUT-B board (A02). 5-29...
Page 149 None If you are using a standard 318 Logic Analyzer you will have one P6107 probe labeled External Clock Probe. This probe needs to be compensated to 20 pF according to the procedure described in Section 3: Operating Instructions . See the Probe Compensation paragraph in the Diagnostic Test Descriptions.
Page 150 8. Connect the oscilloscope channel 2 probe tip to TP108 on the A01 INPUT-A board. 9. Enter the Threshold menu and set EXT CLK to V3 (0.00V). 10. Select the TRIGGER Menu and set the events field to: 00000*WA OFF:WB OFF:WC. This will cause the 318 to acquire data without triggering.
Page 151 5. Adjust EXT ↓ DELAY P202 (14 to 24) on the A02 INPUT-B board to place the rising edge of the channel 2 waveform within one graticule division of the falling edge of the channel 1 waveform. 6. Press the STOP key. Figure 5-18. 318 Test equipment setup for the Clock Delay adjustment. 5-32...
Page 152 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-19. 318 EXT CLK and DLD CLK signal adjustment locations. 7. Adjust DLD CLK Delay Equipment Required 1. Oscilloscope, Tektronix 7904 with plug in units 7A26, 7B80, and 7B85. 1. Pulse Generator 1.
Page 153 Select the Threshold menu and set INPUT EXT CLK = V3. k. Set CLK to EXT ↑. l. Select the Trigger menu and set the events field to 00000*WA OFF:WB OFF:WC. This will cause the 318 to acquire data without triggering.
Page 154 Verification and Adjustment Procedures-318/338 Service 8. Adjust RET CLK, WE , ADRS CLK, and TRIG CLK Delay and Width Equipment Required 1. Oscilloscope, Tektronix 7904 with plug-in modules 7A26, 7B80, and 7B85. 1. Pulse Generator 1. BNC 50 Ω termination 1.
Page 155 6. Select the Threshold menu and set INPUT EXT CLK = V3 (0.00 V). 7. Set CLK to EXTT. 8. Select the Trigger menu and set the Events field to: 00000*WA OFF:WB OFF:WC. This will cause the 318 to acquire data without triggering.
Page 156: Clock Delay With Extender
1. Refer to Figures 5-21 and 5-22. Select the Threshold menu and set INPUT EXT CLK = V3 (0.00 v). 2. Select the Trigger menu and set CLK = EXT ↑. 3. Set the Events field to: 00000*WA OFF:WB OFF:WC. This will cause the 318 to acquire data without triggering. 4. Press the START key.
Page 157 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-20. 318 RET CLK, WE , ADRS CLK, and TRIG CLK adjustments. Figure 5-20. 318 RET CLK, WE, ADRS CLK, and TRIG CLK adjustment. Figure 5-21. 318 Capacitor adjustment oscilloscope Figure 5-22. 318 Capacitor adjustment waveform. setup waveform.
Page 158: Serial State Analyzer
Press the STOP key. p. Set INPUT DATA = V3. q. Press the START key. r. Check that the DMM indication is V0 ± 0.001 V. s. Press the STOP key. Figure 5-23. 318 Serial Analysis/RS-232C/NVM test point and adjustment locations 5-39...
Page 159 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-24. 318 Side view of A07, Serial Analysis/ RS-232C/NVM board. 10. Adjust Input Capacitance and Serial Data Probe Compensation, 40 pf Equipment Required 1. Oscilloscope 1. Generator 1. 1 M Ω, 40 pF Normalizer 1.
Page 160 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service e. Select the Threshold menu and set LEVEL V1 = 0.0 V, and V2 = 0.0 V. f. Set INPUT DATA = V1. g. Press the START key. h. Set the oscilloscope controls so that channel 1 and channel 2 waveforms are superimposed.
Page 161 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-25. 318 Input capacitance adjustment setup. Figure 5-26. 318 Input capacitance waveform. 5-42...
Page 162: Performance Check For The 318
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service PERFORMANCE CHECK FOR THE 318 The Performance Check Procedure provides a detailed check of internal and external product characteristics. These checks can be extensive and time-consuming. Under normal circumstances the Functional Check Procedures will provide an adequate test of product performance in a less costly manner.
Page 163 1. Threshold Voltage Test Setup a. Install the P6107 EXT CLK Probe and both P6451 Parallel Data Probes in the 318. Connect a BNC T-connector to the pulse generator OUTPUT. Connect the P6107 External Clock probe tip to one side of the BNC T- connector.
Page 164 Connect the P6451 Probe GND leads from Pods A and B to the power supply reference (-) terminal. Connect the P6451 Probe DATA leads from Pods A and B to the Power Supply plus (-) terminal. g. Power-up and setup 318 as follows: THRESHOLD MENU...
Page 165: Voltage Levels For Testing Ttl
Check that data acquired are equal to the Expected Data given in Table 5-8. Set the 318 SRCH WORD to equal the Expected Data and then check that the quantity of SRCH words equals 256.
Page 166: Test 2. Parallel Data Acquisition Word Recognition And Trigger Sequencer Check With External Clock Minimum Period
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service TEST 2. Parallel Data Acquisition Word Recognition and Trigger Sequencer Check with External Clock Minimum Period. Equipment Required Tektronix Equivalent 1 Oscilloscope 7904 with 7A26 and 7B80 plug- in modules 2 Oscilloscope Probes 10X...
Page 167 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-28. 318 Parallel data acquisition test setup. 6. Set the #1 pulse generator’s Range Switches to 10 ns PERIOD and 5 ns DURATION. 7. Set the Digital Delay’s EVENT DELAY COUNT to 00001 and adjust the EVENTS and START LEVEL until triggered.
Page 168 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service TRIGGER MENU Source INT TRIG EXTI TRIG IMMEDIATELY POSN DELAY 00249 Events 00001*WA FLW’D BY:WB OFF:WC WA = WB = 10. Set the oscilloscope as shown:. 7904 Mainframe Horizontal Mode B 7A26 Channel 1...
Page 169 20. Adjust DD501 EVENTS LEVEL until the channel 2 waveform’s falling edge crosses channel 1’s falling edge at 0 V (mid-screen). See Figure 5-30 (14 ns setup, 0 ns hold). 21. Change the 318 CLK and QUALIFIERS for Conditions 4, 5, and 6 in Table 5-9. Repeat steps 15 to 17 for each Condition.
Page 170 DATA NOTE The ** means the 318 acquires data without triggering. Press the STOP key to stop data acquisition. 22. Switch the P6451 probes connected to the Parallel Data inputs A and B. All of the leads from Pod B and the Qualifier lead from Pod A should now be connected to the test fixture.
Page 171 (Trigger location) 30. Press the STOP key and change TRIGGER MENU Word C to WC = FF. 31. Press the START key and check that the 318 does not trigger. 32. Press the STOP key. 33. Change the TRIGGER MENU as follows:...
Page 172 EVENTS 00002 ’ WA OFF:WB RESET ON:WC WA = FF WC = 00 49. Press the START key and check that the 318 does not trigger. 50. Press the STOP key. 51. Change the TRIGGER MENU as follows: POSN DELAY = 00000...
Page 173 Pod B connector. Connect the P6451 probe that was connected to the Pod B connector to the Pod A connector (i.e. swap the P6451 probes connected to Pods A and B). 70. Change 318 SETUP to GROUP G1 ON = A7-A0. 71. Repeat steps 27 to 68.
Page 174: Test 3. Glitch Data Acquisition And Glitch Trigger
#2 pulse generator's OUTPUT. Make sure that the P6451 Probe GND lead is connected to one of the Test Fixture ground pins (those pins nearest the BNC connector). e. Connect the oscilloscope channel 2 10X Probe tip to the Test Fixture at the #2 pulse generator's OUTPUT. Power-up and set up the 318 as follows: SETUP MENU GROUP...
Page 175 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-31. 318 Glitch data acquisition test setup. TRIGGER MENU EXT↓ TRIG IMMEDIATELY Events 00000*WA OFF WB OFF WC GLITCH 76543210 ♦ POD A POD B QUALIFIERS (POD) A OFF B OFF 2. Positive Glitch a.
Page 176: Positive Glitch Pulse Generator Setup
Glitch may appear as data in this test. Glitch data width must be at least 5 ns as measured at 350 mv above threshold. b. Press the 318 DATA key until the State Table is displayed. c. Press the 318 START key.
Page 177: Test 4. Start Output And Trigger Output Test
Glitch Data, select the next channel and repeat until all channels have been tested. c. Move the P6451 Probe back to the Pod-A INPUT, setup the 318 for G1 = A7-AO and repeat step (b) for Pod-A. Table 5-11.
Page 178: Test 5. External Trigger Input Test
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 2. Connect Pod A and Pod B channel 0 leads to the 318 START OUTPUT mini-jack using another patch cord and grabber tips. 3. Power-up and setup the 318 as follows: SETUP MENU...
Page 179: Test 6. Serial State Analyzer (318S1)
5. Remove the 10X Probe and BNC-to-probe-tip adapter from the pulse generator. 6. Connect the BNC-to-mini-jack Cable from the 50 ohm terminator at the PG502 OUTPUT to the 318 TRIG INPUT mini- jack. Connect the cable braid lead to the 318 GND mini-jack.
Page 180 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-34. 318 Serial state analyzer performance test setup. 1. Set POWER switch to ON. 2. Set major mode to SERIAL and press the EXECUTE key. 3. Select the SETUP MENU and set the baud rate to 2400.
Page 181 15. Set the 318 baud rate to 19.2K (DATA screen). 16. Set the serial data generator baud rate to 19.2K. 17. Set the 318 and the serial data generator controls as indicated in step 1 of Table 5-12 and repeat preceding steps of Test 6 (11) through (14).
Page 182 VERIFICATION AND ADJUSTMENT PROCEDURES...
Page 183: Functional Check Procedures For The 318
FUNCTIONAL CHECK PROCEDURES FOR THE 338 The following procedures are for the 338 Logic Analyzer only. The Functional Check for the 318 Logic Analyzer begins in the first half of this section; refer to the margin tabs for help in locating the 318 procedures.
Page 184: Mainframe And Parallel Analyzer
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service MAINFRAME AND PARALLEL ANALYZER CHECK 1. POWER-UP DIAGNOSTICS 1. Turn on the 338. 2. Approximately seven seconds after power is turned on the screen display is initialized. Check to insure that FAIL is not displayed in any of the test fields.
Page 185 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service The CRT test generates the following types of patterns for the CRT adjustment and visual check. Cross-hatch pattern (Figure 5-37). Used to adjust the CRT circuit. White pattern (Figure 5-38). Used to check for phosphor defects.
Page 186: Check 4. Threshold Voltage
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service CHECK 4. THRESHOLD VOLTAGE 1. Connect all the data and ground leads of the P6451 Parallel Data probes (Pods A through D) together and connect them to the instrument ground. 2. Press the THRESHOLD menu key (normal operating mode).
Page 187: Check 5. Parallel Analyzer Check With Test Output
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Threshold Level V3 a. Set Threshold LEVEL V1 to +2.0V and V2 to -1.5 V. b. Check that the Threshold LEVEL V3 is +0.25 V. c. Set Pods A through D equal to V3.
Page 188 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service THRESHOLD MENU LEVEL V1 = +1.3V V2 = -1.3V INPUT EXT CLK = POD A = POD B = POD C = POD D = TRIGGER MENU Source INT TRIG EXTT TRIG IMMEDIATELY...
Page 189 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-41. 338 Parallel data acquisition check setup. 2. 20 MHz Acquisition a. Repeat steps (b) through (d), below, for each Pod (A through D). Change probe connections and SETUP Menu accordingly. b. Set CLK to 50 ns, and set the trigger position to DELAY 00250.
Page 190 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service c. Set up the 338 as follows: SETUP MENU GROUP ON - AAAAAAAA 76543210 THRESHOLD MENU LEVEL V1 = +1.3V -1.3V INPUT EXT CLK = POD A = POD B = POD C =...
Page 191 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-42. 338 External trigger check setup. 4. Trigger Qualifier Check a. Refer to Figure 5-43. Power up the 338 and connect the data leads of the P6451 Parallel Data probe in Pod B to...
Page 192 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service THRESHOLD MENU LEVEL V1 = +1.3V V2 = -1.3V INPUT EXT CLK = POD A = POD B = POD C = POD D = TRIGGER MENU Source INT TRIG 10 µs TRIG...
Page 193 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-43. 338 Trigger qualifier check setup. 5. Clock Qualifier Check Power up the 338 and connect the data leads of the P6451 Parallel Data probe in Pod-A to TEST OUTPUT as follows:...
Page 194: Check 6. Glitch Data Acquisition Using Test Output
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service TRIGGER MENU 10 µs TRIG IMMEDIATELY POSN DELAY 00249 Events 00016*WA FLW’D BY:WB RESET ON:WC; WA = XXXXXX 11 binary WB = 1111111Obinary (7Ehex) WC = GLITCH 76543210 POD A QUALIFIERS (POD) A CLK=L...
Page 195: Check 7. Serial State Analyzer Check For The 338S1
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service P6451 Channel TEST OUTPUT Not Connected Setup the 338 as follows: SETUP MENU GROUP ON = AAAAAAAA 76543210 TRIGGER MENU 10 ms TRIG IMMEDIATELY POSN DELAY 00250 Events 00000*WA OFF:WB OFF:WC GLITCH 76543210 ON ♦...
Page 196 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service i. Press the A key on the terminal keyboard 10 times. j. Press the STOP key. k. Check that the acquisition data matches 10 bytes of ASCII A on the screen. 2. Remote Control Operation a.
Page 197: Adjustment Procedures For The 338
This section contains the Adjustment Procedures for the 338 Logic Analyzer. Information on the Adjustment Procedures for the 318 Logic Analyzer is located in the first part of Chapter 5; refer to the page-edge tabs for help in locating 318 information.
Page 198: Index Of Adjustment Steps
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service LIMITS AND TOLERANCES All limits and tolerances given in this procedure are adjustment guides. They should not be interpreted as instrument specifications unless they are also found in the Specifications part of this manual.
Page 199: Mainframe
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Parallel Analyzer 4. Threshold Voltages on the A02 INPUT-B Board 5. Probe Compensation for the P6107 External Clock Probe 6. EXT CLK T and EXT CLK I Delay 7. RET CLK, WE , ADRS CLK and TRIG CLK Delay and Width Serial State Analyzer (338S1) 8.
Page 200: Non-Adjustable Power Supply Tolerances
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Table 5-13 338 ADJUSTABLE POWER SUPPLY TOLERANCES J1 Pin Label Voltage Limits Potentiometer each - 5 V pin -4.95 V to - 5.05 V R18 (labeled -5 V) +5 V pin +4.95 V to +5.05 V R 11 (labeled +5 V) -3.3 V pin...
Page 201: Adjust Crt Circuit
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 2. ADJUST CRT CIRCUIT Equipment Required None Refer to Figure 5-47. 1. Run the diagnostic program 1 CRT to generate a cross-hatch pattern. (To enter the diagnostic, turn on the power while pressing any numeric key until the display appears.) 2.
Page 202: Adjust Threshold Voltages On The A05 Rom Board
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 3. ADJUST THRESHOLD VOLTAGES ON THE A05 ROM BOARD Equipment Required 1 Digital Multimeter (DMM) Refer to Figure 5-48. Reference Voltage Adjustment 1. Make sure that all four P6451 Parallel Data Probes are installed.
Page 203 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 4. Adjust VB O-VOLT ADJ R088 on the A05 ROM board for a DMM indication of 0.000 + 0.010 V. 5. Press the STOP key. 6. Set Threshold LEVEL V2 to +10.0 V.
Page 204: Parallel Analyzer
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service PARALLEL ANALYZER 4. ADJUST THRESHOLD VOLTAGES ON THE A02 INPUT-B BOARD Equipment Required 1 Regulated DC Power Supply 1 Digital Multimeter (DMM) 1 Oscilloscope Refer to Figure 5-49. NOTE Before starting the following procedures, make sure that all probes are connected properly.
Page 205 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service DC Gain 1. Connect the P6107 External Clock probe ground clip to the power supply minus (-) terminal. 2. Connect the P6107 External Clock probe tip to the power supply plus (+) terminal.
Page 206: Probe Compensation For The P6107 External Clock Probe
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 4. Select the Trigger Menu and set Events to: 00000*WA OFF:WB OFF:WC. This will cause the 338 to acquire data without triggering. 5. Set the oscilloscope triggering source to channel 1 and the sweep rate to 1 us/div.
Page 207: Adjust Ext Clk↑ And Ext Clk↓ Delay
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Two nearly identical P6107 probes are supplied with the 338S1 Logic Analyzers; one is the External Clock Probe, and the other is the Serial Data Acquisition Probe. If the probes were supplied as original equipment, they will be labeled as either EXT CLOCK, or SERIAL DATA with a sticker on the compensation box.
Page 208 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 6. Set the pulse generator as follows: Termination BACK TERM (switch pulled out) 0.1 µs Period Duration 10 ns (5 ns X 3) High level +0.35 V Low level -0.35 V 7. Select the A timebase and place the rising edge of the channel 1 waveform on the center graticule of the oscilloscope screen.
Page 209: Adjust Delay Of Ret Clk, We, Adrs Clk And Trig Clk
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-50. 338 Test equipment setup for the clock delay adjustment. 7. ADJUST DELAY OF RET CLK, WE, ADRS CLK AND TRIG CLK Equipment Required 1 Oscilloscope 1 Pulse Generator 1 BNC 50 Ω termination...
Page 210 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 2. Connect the P6107 External Clock probe tip to the other side of the BNC T-connector. 3. Setup the oscilloscope as follows: Mainframe Horizontal Mode B 7A26 Position Rising edge at center screen...
Page 211 TM 11-6625-3145-14 Verification and Adjustment Procedures-3181/338 Service Figure 5-51. 338 RET CLK, WE , ADRS CLK, and TRIG CLK adjustments. 6. Set Threshold LEVEL to V3 (0.00 V). 7. Set CLK to EXTT. 8. Select the Trigger menu and set the Events field to: 00000*WA OFF:WB OFF:WC. This will cause the 338 to acquire data without triggering.
Page 212: Clock Delay With Extender
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 13. Adjust the corresponding jumper to place the rising or falling edge (indicated by ↑ or ↓ in Table 5-16) of the channel 2 waveform within one division of the graticule centered on the rising edge of the channel 1 waveform.
Page 213: Serial State Analyzer
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Table 5-17 338 CLOCK DELAY WITHOUT EXTENDER Delay Clock CH2 Edge (ns) Test Point Adjustable Capacitor ↑ RET CLK 46.60 + 0.50 TP400 (A03) C100(A03) ↓ 54.40 + 0.50 TP200-2(A04) C102(A03) ↑ 61.40 + 0.50...
Page 214 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 6. Connect the DMM plus (+) lead to TP11 (threshold) on the A07 board. 7. Select the Threshold menu and set DATA = V1. 8. Press the START key. 9. Measure and record the voltage, V0, at threshold 0 (V0 will be used as a reference later).
Page 215: Adjust Input Capacitance And Serial Data Probe Compensation
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-55. 338 Side view of A07 Serial Analysis/RS232C/NVM board. 9. ADJUST INPUT CAPACITANCE AND SERIAL DATA PROBE COMPENSATION, 40 pF Equipment Required 1 Oscilloscope 1 Pulse Generator 1 1M Ω, 40 pF Normalizer...
Page 216 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 4. Set the pulse generator as follows: BACK TERM Period 1 ms Duration SQ WAVE High level +5 V Low level -5 V Select the Threshold menu and set V1 and V2 to 0.0 V Set Threshold DATA = V1.
Page 217 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-57. 338 Input capacitance waveform. Figure 5-56. 338 Input capacitance adjustment. 5-97...
Page 218: Adjust Non-Volatile Memory Battery Backup Threshold
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 10. ADJUST NON-VOLATILE MEMORY BATTERY BACKUP THRESHOLD Equipment Required 1 Oscilloscope 1 Digital Multimeter (DMM) 1. Connect the DMM minus (-) lead to TP200 (GND) on the A07 S1 Board. 2. Connect the DMM plus (+) lead to TP101 (+5V) on the A07 Board.
Page 219: Test 1 - Threshold Voltages
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Test 4 - Start Output and Trigger Output Test 5 - External Trigger Input Test 6 - Serial State Analyzer 338S1 TEST 1 - THRESHOLD VOLTAGES Equipment Required Tektronix Equivalent 1 Oscilloscope 7904 with 7A26 and...
Page 220 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service 7. Connect all the P6451 Probe DATA leads for Pods A through D to the power supply plus (+) terminal. 8. Power-up and setup 338 as follows: THRESHOLD MENU INPUT EXT CLK =...
Page 221: Threshold Level Ttl
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service THRESHOLD LEVEL TTL 1. Repeat the following procedures, (2) through (4), for each of the two power supply voltage levels given in Table 5-18. 2. Set the pulse generator output level to that given in Table 5-18 as measured by the oscilloscope. Setup the oscilloscope as follows: Set the DVM for +1.40 V.
Page 222: Test 2 - Parallel Data Acquisition, Word Recognition, And Trigger Sequencer Checks With External Clock Minimum Period
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Table 5-19 338 VOLTAGE LEVELS FOR TESTING Vi, V2, AND V3 Power Threshold Test Supply Pulse Generator Threshold Level Input Expected Output (V) High (V) Low (V) V1 (V) V2 (V) V3 (V)
Page 223 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service (cont.) Equipment Required Tektronix Equivalent 1 BNC 50 Ω Cable 18 inches long 012-0076-00 1 BNC 50 Ω Cable 42 inches long 012-0057-01 1 Test Fixture See Figure 5-2 4 Flying Lead set 5 in. (short leads) 012-0987-00 Refer to Figures 5-59, 5-60, and 5-61.
Page 224 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service INPUT EXT CLK = POD A = POD B = POD C = POD D = TRIGGER MENU Source INT TRIG TRIG IMMEDIATELY POSN DELAY 00249 Events 00001*WA FLW’D BY:WB OFF WC WA =...
Page 225: Parallel Data Test Oscilloscope Setup
Adjust DD501 EVENTS LEVEL until the channel 2 waveform’s falling edge crosses the channel 1 waveform’s falling edge at 0 V (mid-screen). See Figure 5-61 (20 ns setup, 0 ns hold). Change the 318 CLK and QUALIFIERS for conditions 5 through 8 in Table 5-22. Repeat steps 14 through 16 for each condition.
Page 226 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Figure 5-59. 338 Parallel data acquisiton test setup. Figure 5-60. 338 Parallel data acquisition Figure 5-61. 338 Parallel data acquisition test waveform #1. test waveform #2. 5-106...
Page 227: Test Conditions And Expectations
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Table 5-22 338 TEST CONDITIONS AND EXPECTATIONS Condition Pulse Gen Norm Norm Norm Norm Comple- Comple- Comple- Comple- #1 OUTPUT ment ment ment ment Test Wave- form Figure 5-60 5-60 5-60 5-60 5-61...
Page 228 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Increase the length of the BNC cables on the pulse generators, if necessary, and adjust DD501 EVENTS LEVEL until the channel 2 waveform’s falling edge crosses the channel 1 waveform’s rising edge at 0 V level (14 ns setup, 0 ns hold).
Page 229 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Press the STOP key and then the TRIGGER key. Change TRIGGER Menu Word B to WB = 00. Press START key and check that the 338 does not trigger. Press STOP key. Change the TRIGGER Menu as follows: Events 00001 * WA FLW’D BY:WB FLW’D BY:WC...
Page 230 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Change the TRIGGER Menu as follows: TRIGGER MENU POSN DELAY 00000 Events 00001’WA OFF:WB RESET ON:WC Press the DATA key, ←↑ T key (scroll), and then the START key. Check for the following data and proper trigger location.
Page 231: Test 3 - Glitch Data Acquisition And Glitch Trigger
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Change the TRIGGER Menu as follows: TRIGGER MENU POSN DELAY 00000 Events 65000’WA OFF:WB RESET ON:WC WA = WB = WC = Press the DATA key and then the START key. Check for the following data and proper trigger location.
Page 232: Setup
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service SETUP Refer to Figure 5-62. Connect a 50 Ω terminator to the #1 pulse generator OUTPUT. Connect a BNC T-connector to the 50 Ωterminator. Connect the P6107 External Clock Probe tip to one side of the BNC T-connector. Connect the oscilloscope channel 1 probe to the other side of the BNC T-connector.
Page 233: Positive Glitch Pulse Generator Setup
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Connect the oscilloscope channel 2 10X Probe tip to the Test Fixture’s probe connection. Power up and set up the 338 as follows: SETUP MENU GROUP ON - AAAAAAAA 76543210 THRESHOLD MENU LEVEL V1 = 10.0V...
Page 234: Negative Glitch
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Press the DATA key until the State Table is displayed. Press the START key. Set the DATA State Table submenu to SRCH GLITCH mode and check that the Trigger location, and all data after the Trigger location, are displayed in inverse video (SRCH = 1/249, data = 00).
Page 235 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Power up and set up the 338 as follows: SETUP MENU ACQ. MODE REPEAT ACQ GROUP G1 ON - AAAAAAAA 76543210 G2 ON - BBBBBBBB 76543210 THRESHOLD MENU LEVEL V1 = +0.7V V2 = 2.4V...
Page 236: Test 5 - External Trigger Input
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service TEST 5 - EXTERNAL TRIGGER INPUT Equipment Required 1 BNC to Mini-Jack Cable, 175-1178-00 1 Oscilloscope 1 Pulse Generator 1 10X Probe 1 BNC-to-Probe Adapter 1 50 ohm Terminator Connect a 50 ohm terminator to the pulse generator OUTPUT.
Page 237: Test 6 - Serial State Analyzer (338S1)
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service TEST 6 - SERIAL STATE ANALYZER (338S1) Equipment Required 1 Serial Data Generator Set POWER switch to ON. Set major mode to SERIAL and press the EXECUTE key. Select the SETUP MENU and set the baud rate to 2400.
Page 238 TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Set the serial data generator power to ON, and select DTE SIMULATE mode. Set serial data generator SETUP as follows; CODE=ASCII, BAUD=2400, DUPLEX-FULL, SETUP=ASYNC, BITS/CHAR=8, PARITY= NONE, STOPBITS = 1, TIMING = NORMAL.
Page 239: Serial State Analyzer Test Setup
TM 11-6625-3145-14 Verification and Adjustment Procedures-318/338 Service Table 5-26 338 SERIAL STATE ANALYZER TEST SETUP Serial Data Step Generator Word Sequence BITS/WORD = 8 BITS/CHAR = 8 E0, E0, E2, E4, E6, E8 BITS/WORD = 7 BITS/CHAR = 7 60, 60, 62, 64, 66, 68...
Page 240: Maintenance: General Information
TROUBLESHOOTING TREES The troubleshooting trees are divided into two sets; one for the 318, and one for the 338. The trees for the 318 are located after the diagnostic test descriptions for the 318, in roughly the center of Section 7. The Diagnostic trees for the 338 are located after the diagnostic test descriptions for that logic analyzer, starting near the end of Section 7.
Page 241: Light-Emitting Diodes (Leds)
TM 11-6625-3145-14 Maintenance: General Information-318/338 Service LIGHT-EMITTING DIODES (LEDS) To avoid damage to the LEDs, always keep soldering time and temperature to a minimum. Do not bend the leads or apply force when inserting the leads into circuit board holes. Clean the circuit board holes of all excess solder before attempting to install a new LED.
Page 242: Lithium Battery Replacement
TM 11-6625-3145-14 Maintenance: General Information-318/338 Service Table 6-1 Relative Susceptibility of Semiconductors to Static Discharge Damage Semiconductor Class Danger Voltage a MOS or CMOS 100 -500 V 200 - 500 V Schottky signal diodes 250 V Schottky TTL 500 V...
Page 243: Interior Cleaning
TM 11-6625-3145-14 Maintenance: General Information-318/338 Service CAUTION To prevent water from getting inside the instrument during external cleaning, use only enough water to dampen the cloth or swab. DO NOT use chemical cleaning agents as they may damage the plastics used in the instrument.
Page 244: Corrective Maintenance
Some of the mechanical parts and electrical parts in this instrument are manufactured or selected by Tektronix to satisfy particular requirements, or are manufactured to certain specifications for Tektronix. To determine the manufacturer of a part, refer to the Parts List Cross Index of Code Number to Manufacturer.
Page 245: Circuit Board Pin Replacement
TM 11-6625-3145-14 Maintenance: General Information-318/338 Service Figure 6-2. Circuit board pin replacement. Figure 6-1. Multi-conductor terminal connectors CIRCUIT BOARD PIN REPLACEMENT A circuit-board pin replacement kit, including necessary tools, instructions, and replacement pins with attached spare ferrules, is available from Tektronix.
Page 246: Disassembly/Installation Procedures
Unless otherwise noted, screws mentioned in the text are the pan-head, POZIDRIV type. In the following procedures, directional terms (top, bottom, left, right, etc.) are based on the assumption that the 318/338 is in a normal, upright position and the user is facing the front of the instrument.
Page 247: Circuit Board Locations
TM 11-6625-3145-14 Maintenance: General Information-318/338 Service Figure 6-3. 318/338 circuit board locations. REMOVAL AND REPLACEMENT INSTRUCTIONS WARNING To avoid electric shock, disconnect the instrument from the power source before removing or replacing any component or assembly. The exploded-view drawing in the Replaceable Mechanical Parts section may be helpful in the removal or disassembly of individual components or sub-assemblies.
Page 248: Removing The Cabinet
Front panel removal is accomplished by using a 1/16-inch hex key wrench to remove the four screws holding the front panel in place. Unsolder the lead to the screw post, then carefully pull the front panel away from the 318/338 and lay it face-down in front of the instrument.
Page 249: Removing The Keyboard
Maintenance: General Information-318/338 Service Removing the Keyboard The keyboard is an assembled matrix that fits behind the 318/338’s front panel. Refer to Section 10 , Replaceable Mechanical Parts , for a detailed drawing and part numbers. To remove the keyboard, proceed as follows: Remove the front panel (see Removing the Front Panel ).
Page 250: Power Supply Removal
TM 11-6625-3145-14 Maintenance: General Information-318/338 Service WARNING Handle silicon grease with care. Avoid getting silicon grease in the eyes. Wash hands thoroughly after use. To reinstall the board, position it in place on the chassis and replace the four screws.
Page 251: Removing The Crt Circuit Board
TM 11-6625-3145-14 Maintenance: General Information-318/338 Service Removing the CRT Circuit Board Remove the cabinet (see Removing the Cabinet). WARNING The CRT anode and the output terminal of the high-voltage multiplier may retain a high-voltage charge after the instrument is turned off. To avoid electrical shock, ground both the output terminal of the multiplier and the CRT high-voltage anode lead to chassis ground before disconnecting the high-voltage lead.
Page 252 Carefully guide the CRT out of the front of the 318/338. To reinstall the CRT, carefully guide the replacement CRT into its housing from the front of the 318/338. Position the bezel and light filter over the face of the CRT and reinstall them. This will require some pressure on the face of the CRT to insert it to the proper depth.
Page 253 ___________________ TROUBLESHOOTING TREES...
Page 254: Maintenance: Troubleshooting
Diagnostic trees are divided into two sections. The first half of this section describes the Diagnostic tests available for the 318. The Diagnostic trees for the 318 are located at the end of the test descriptions. The Diagnostic test descriptions and trees for the 338 are located in the second half of this section. Refer to the page-edge tabs for help in locating the information you need.
Page 255: Diagnostic Test Common Signal Paths
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-1 lists the components common to the signal paths that cause multiple Diagnostic Test failures. Table 7-1 318 DIAGNOSTIC TEST COMMON SIGNAL PATHS Clock Threshold SQRAM N&DL Component A04 U152, A04 U150 A03 U126, A03 U112 A04 U110...
Page 256: Mainframe
A05 board when the MPU accesses I/O address E0 A key code with interrupt is expected as shown in Table 7-2. Table 7-2 318 KEYBOARD TEST KEY CODE AND INTERRUPT ASSIGNMENT ST:1 if any key is pressed, otherwise 0.
Page 257: Crt Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Key Code Assignment. Blocks correspond to the key position on the front panel. STOP Figure 7-1. 318 Keyboard test schematic. 2. CRT TEST Program: CRT Function: Power on - None. Troubleshooting - The CRT generates the following four kinds of patterns for the CRT adjustment and visual check.
Page 258: Crt Calibration And Check
Then the Display Controller issues Z, GLITCH, CHD, and VD signals to the A10 CRT board, along with these two bytes of data. These signals are buffered and/or controlled and sent the A10 board through the A08 Mother board. Figure 7-2. 318 CRT calibration and check schematic.
Page 259: Jump Table Rom Test
Description: Refer to Figures 7-3 and 7-4. The diagnostic routine is located in addresses C000 through DFFF in the Jump Table ROM, U026 (64 K-byte UV EPROM, 2764) on the A05 ROM/Threshold board. Figure 7-3. 318 Memory map. The MPU addresses the Jump Table ROM on board A05 through U210 and U212 (octal buffer/line receiver with...
Page 260: Display Ram Test
The MPU calculates the checksum with all the data contained in the Jump Table ROM, and compares it with the expected value, also stored in this ROM. If the values do not match, the MPU issues an error message. Figure 7-4. 318 MPU memory address assignment. 4. DISPLAY RAM TEST...
Page 261: System Ram Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Step 2. A word is read from a diagnostic cell and checked with the expected word 55. If it is not equal to word 55, an error message is displayed and the MPU is halted.
Page 262: Rom Test
Power on - ROM1 through ROM6 are checked by individually calculating their checksums. Troubleshooting - None. Description: Refer to Figure 7-5. All the ROMs (ROM1 through ROM7) are located on the A05 ROM/Threshold board. Table 7-3 318 ROM TEST ADDRESS ASSIGNMENT Address Enabled by ROM1...
Page 263: A03 And A04 Partial Acq Address Assignment
TM 11-625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-5. 318 A03 and A04 Partial ACQ address assignment. 7-10...
Page 264: Parallel Analyzer
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service PARALLEL ANALYZER 7. CLOCK TEST Program: CLK Function Power on - The timebase is programmed for several ranges; its operation is checked by the MPU, which monitors the slow clock flag on each timer interrupt.
Page 265: Clock Test Program Ranges
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-4 318 CLOCK TEST PROGRAM RANGES Gate Clock SYSCLK SLOW CLOCK flag 1 ms 20 ns reset 50 ns reset 100 µs reset 1 ms 200 µs reset 2 ms 50 µs reset 5 ms 500 µs...
Page 266: Word Recognizer Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-6. 318 Clock test. 8. WORD RECOGNIZER TEST Program: WR Function : Power on - The word recognition (WR) RAMs are checked with the checkerboard marching pattern from 00 through FF. Step 1. The word 15 is written into all RAM addresses.
Page 267: Word Recognizer Test Port Addresses
Unless STOP is pressed, this test will loop continuously without displaying the result of the verification. Use an oscilloscope to observe the word recognizers. Table 7-5 318 WORD RECOGNIZER TEST PORT ADDRESSES (Hex) Address Content of Looping Test increment WR-address counter for WRO test.
Page 268 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service word recognizer (WR) U120 (256 word x 4 bit RAM, HM10422) for trigger detection. These output lines are wired together with U124 and U126 <2> (4-bit counter, F10016) outputs, respectively, to set up the WR.
Page 269: Word Recognizer Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-7. 318 Word recognizer test.
Page 270: Acquisition Ram Test
Table 7-6 below will run. Unless the STOP key is pressed, the selected portions of the test will loop continuously without displaying the result of the verification. In this case, use an oscilloscope to observe the acquisition circuit board. Table 7-6 318 ACQ TEST PORT ADDRESSES (Hex) Address Content of Looping Test reset WR-address counter to increment WR-address counter to 55 to write 55 into the background of High-speed memory.
Page 271 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service When ERROR is selected in the looping test field, looping is available only if errors are detected. If no errors are detected, the test runs to completion just as if the looping function had been set to OFF. If some errors are detected, the ERROR looping feature is available for the read cycle of the test, and the result of the verification will appear on the screen.
Page 272: Acq Memory Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-8. 318 ACQ memory test Writing to I/O address 4A generates the internal clock from U140 (µPB3Z199R) on the A04 board. This clock is buffered by U112D (quad 2-input NOR gate, MC1662) and is sent to U222B (dual 3-input/3-output NOR gate, 10211) on the A02 board. Then this clock is returned to the Strobe Generator circuit on the A03 board, and is also sent to U222A (10211 ) on the A02 board to produce DLDCLK in conjunction with DL104 (delay line, ZD10-20) on the A01 board.
Page 273: Sequence Ram Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service During the read phase, the MPU receives data from U152 (octal buffer/line driver with 3-state output, 74LS 244) by issuing READ ACQ DATA at I/O address 59 . The READ ACQ DATA signal switches the inputs of U142 and U144 (quad 2- input multiplexer, 10158) on the A04 board to the output of the ACQ Memories.
Page 274: Sqram Test Port Addresses
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-7 318 SQRAM TEST PORT ADDRESSES (Hex) Address Content of Looping Test set CS all OFF into CS-latch to write 55 in the background of the SQRAM. set 1 into QUAL (DO & D2) register and set 0 into QUAL (D1 & D3) register.
Page 275: Sqram Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-9 318 SORAM TEST SORAM ADDRESS CONNECTIONS Setup SQRAM U144 TRIGGER F-F Gate MPU Data A0 (pin 13) U138 pin 15 U140 pin 2 A1 (pin 14) U150 pin 15 U140 pin3 A2 (pin 15)
Page 276: N & Delay Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service In order to set up the SQRAM, the MPU data (translated to ECL level) points to the address of the SQRAM. These data bits are gated as in the preceding table, enabled by LDSQRAM from U108 <5> (10176) bit 4 on the A03 board. Bit 4 is maintained high during this setup.
Page 277 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Latches U106 and U108 (hex D master-slave flip-flop, 10176) on the A03 board are set to hold data 1100 for the binary SQRAM. They also enable U140 (hex AND-gate, 10197) and U154 (quad 2-input AND-gate, 10104) on the A03 board.
Page 278: N And Delay Counter Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-31 8/338 Service Figure 7-10. 318 N and DELAY counter test. 7-25...
Page 279: Threshold Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service THRESHOLD TEST Program: THRSH Function: Power on - Threshold V1 and Threshold V2 are set for several levels to produce Threshold V3 at - 0.2V or +0.2V. For every setting the comparator will detect the Threshold V3 level relative to ground and the MPU checks the comparator’s output against the expected data (0 or 1).
Page 280: Threshold Test Data Values
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-10 318 THRESHOLD TEST DATA VALUES Expected +0.3V (83 -0.1V (7F +0.2V +0.7V (87 -0.5V (7B +0.2V +1.1V (8B -0.9V (77 +0.2V + 1.9V (93 - 1.7V (6F +0.2V + 3.5V (A3 -3.3V (5F + 0.2V...
Page 281: Seq Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-11. 318 Threshold test. 13. SEQ TEST Program: SEQ Function: Power on - A single acquisition with a full trigger sequence is simulated to check a whole operation. Troubleshooting - The content of this test is the same as that run automatically when the power is first turned on, but here the Looping feature is available.
Page 282: 318S1 Serial Analysis/Rs232C/Nvm
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service When I/O Looping is selected, only those selected OUT instructions (subroutines), including one of the addresses listed below, will run. Unless the STOP key is pressed, this test will continue looping without displaying the result of the verification.
Page 283: Non-Volatile Memory Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Description - Detected battery voltage status is shown in the status register at bit 07. TSTBTT this bit from 1/0 address 80. (Refer to the 318S1/338S1 I/O function list) Battery voltage is detected by Q170, and battery status is applied to bit #7 of the status register by U32.
Page 284 An 1/0 loop mode is available for TSTRM2. This mode is used to check the I/O address selection circuit. When the diagnostic program is running in the I/O loop mode, TSTRM2 executes the following program function continuously. Table 7-11 318 RS-232C I/O ADDRESSES Selected I/O Address Program Function Read content of address 80.
Page 285: Serial Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service 17. SERIAL TEST Program: TSTSR1 (power on), TSTSR2 (Troubleshooting) Setup: - Loop-back test data of TSTSR2 is supplied from the RS-232 port, so the P6107 SERIAL INPUT PROBE must be connected to pin #2 of the RS-232 connector.
Page 286: Option I/O Function List
The I/O loop feature is available for TSTSR2. This mode is used to check the I/O address selection circuit. When the diagnostic program is running in the I/O loop mode, TSTSR2 executes following program functions continuously. Table 7-12 318 SERIAL TEST I/O ADDRESSES Selected I/O Address Program Function Read content of address 80.
Page 287: Serial Test Baud Select Bits
S3 as S2 as S1 as SO Table 7-13 318 SERIAL TEST BAUD SELECT BITS Selected Baud Rate NO CLOCK (EXTERNAL CLOCK) {NO CLOCK (19.2K)} 134.5 2400 9600 4800 1800 1200 2400 NOTE: The baud rate in the bracket is a special speed;...
Page 288 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service I/O ADDRESS = CHIP FUNCTION SERIAL PARAMETER SETUP REGISTER CONTROL WRITE ONLY bit= baud baud baud baud external serial select select select select trigger data xxxxx xxxxx as S3 as S2 as S1 as S0 pol.
Page 289: Diagnostic Test Failure Codes
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-14 318 DIAGNOSTIC TEST FAILURE CODES PART 1 --- TSTRM2 (RS232 TEST) Code Error Information 150 (96) RTS NOT ON 151 (97) CTS NOT ON 152 (98) CD NOT ON 153 (99) RTS NOT OFF...
Page 290: Diagnostic Test Failure Codes
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-14 (cont.) 318 DIAGNOSTIC TEST FAILURE CODES PART 2 --- TSTSR2 (SERIAL TEST) Code Error Information 180 (B4) REG #0 READ ERROR (FOR SIO PORT-A) 181 (B5) RX READY NOT OFF " " 182 (B6) REG #1 READ ERROR "...
Page 291 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-14 (cont.) 318 DIAGNOSTIC TEST FAILURE CODES PART 3 --- TSTNV2 (NVM TEST) Code Error Information 200 (C8) DATA ERROR WHEN DATA PATTERN IS FF 201 (C9) " " " 202 (CA) " "...
Page 292: Troubleshooting Trees
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-14 FIGURE 7-15 FIGURE 7-13 FIGURE 7-16 Figure 7-12. Troubleshooting Tree 1: Power On. 7-39...
Page 293: Troubleshooting Tree 2: Startup Self Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-17 FIGURE 7-18 FIGURE 7-19 FIGURE 7-20 FIGURE 7-21 FIGURE 7-22 FIGURE 7-23 FIGURE 7-24 FIGURE 7-25 FIGURE 7-14 Figure 7-13. Troubleshooting Tree 2: Startup Self Test. 7-40...
Page 294: Troubleshooting Tree 3: Power Supplies A11, A12
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-14. Troubleshooting Tree 3: Power Supplies A11, A12 (Sheet 1 of 2) 7-41...
Page 295 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-14. Troubleshooting Tree 3: Power Supplies A11, A12 (Sheet 2 of 2) 7-42...
Page 296: Troubleshooting Tree 4: Crt A10
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-15. Troubleshooting Tree 4: CRT A10 (Sheet 1 of 4) 7-43...
Page 297 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-15. Troubleshooting Tree 4: CRT A10 (Sheet 2 of 4) 7-44...
Page 298 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-15. Troubleshooting Tree 4: CRT A10 (Sheet 3 of 4) 7-45...
Page 299 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-15. Troubleshooting Tree 4: CRT A10 (Sheet 4 of 4) 7-46...
Page 300: Troubleshooting Tree 5: Mpu A06
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-16. Troubleshooting Tree 5: MPU A06. (Sheet 1 of 5) 7-47...
Page 301 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-16. Troubleshooting Tree 5: MPU A06. (Sheet 2 of 5) 7-48...
Page 302 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-16. Troubleshooting Tree 5: MPU A06. (Sheet 3 of 5) 7-49...
Page 303 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-16. Troubleshooting Tree 5: MPU A06. (Sheet 4 of 5) 7-50...
Page 304 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-15 Figure 7-16. Troubleshooting Tree 5: MPU A06. (Sheet 5 of 5) 7-51...
Page 305: Troubleshooting Tree 6: Clock A04
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-17. Troubleshooting Tree 6. Clock A04 (Sheet 1 of 2) 7-52...
Page 306 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-17. Troubleshooting Tree 6. Clock A04 (Sheet 2 of 2) 7-53...
Page 307: Troubleshooting Tree 7: Word Recognizer (Wr A01 A02)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-18. Troubleshooting Tree 7: Word Recognizer (WR A01 A02) (Sheet 1 of 3) 7-54...
Page 308 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-18. Troubleshooting Tree 7: Word Recognizer (WR A01 A02) (Sheet 2 of 3) 7-55...
Page 309 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-17 Figure 7-18. Troubleshooting Tree 7: Word Recognizer (WR A01 A02) (Sheet 3 of 3) 7-56...
Page 310: Troubleshooting Tree 8: Data Acquisition (Acq A01 A02)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-19. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 1 of 6) 7-57...
Page 311 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-18 Figure 7-19. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 2 of 6) 7-58...
Page 312 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-19. Troubleshooting Tree 8: Data Acquisition (ACO A01 A02) (Sheet 3 of 6) 7-59...
Page 313 TM 11-6625-3145-14 Figure 7-19. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 4 of 6) 7-60...
Page 314 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-19. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 5 of 6) 7-61...
Page 315 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-17 Figure 7-19. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 6 of 6) 7-62...
Page 316: Troubleshooting Tree 9: Sqram A03
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-18 FIGURE 7-18 Figure 7-20. Troubleshooting Tree 9: SQRAM A03 (Sheet 1 of 4) 7-63...
Page 317 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-20. Troubleshooting Tree 9: SQRAM A03 (Sheet 2 of 4) 7-64...
Page 318 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-31 Figure 7-20. Troubleshooting Tree 9: SQRAM A03 (Sheet 3 of 4) 7-65...
Page 319 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-17 Figure 7-20. Troubleshooting Tree 9: SORAM A03 (Shoot 4 of 4) 7-66...
Page 320: Troubleshooting Tree 10: N&Dl A03
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-22 Figure 7-21. Troubleshooting Tree 10: NDL A03 (Sheet 1 of 2) 7-67...
Page 321 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-22 Figure 7-21. Troubleshooting Tree 10: NDL A03 (Sheet 2 of 2) 7-68...
Page 322: Troubleshooting Tree 11: Seq A03
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-18 Figure 7-22. Troubleshooting Tree 11: SEQ A03 (Sheet 1 of 4) 7-69...
Page 323 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-19 FIGURE 7-20 Figure 7-22. Troubleshooting Tree 11: SEQ A03 (Sheet 2 of 4) 7-70...
Page 324 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-19 Figure 7-22. Troubleshooting Tree 11: SEQ A03 (Sheet 3 of 4) 7-71...
Page 325 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-20 Figure 7-22. Troubleshooting Tree 11: SEQ A03 (Sheet 4 of 4) 7-72...
Page 326: Troubleshooting Tree 12: T/H A01, A02
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-24 Figure 7-23. Troubleshooting Tree 12: T/H A01, A02 7-73...
Page 327: Troubleshooting Tree 13: T/H A04
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-19 Figure 7-24. Troubleshooting Tree 13: T/H A04 7-74...
Page 328: Troubleshooting Tree 14: Ser A07 (Tstsr2)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-25. Troubleshooting Tree 14: SER A07 (TSTSR2) (Sheet 1 of 4) 7-75...
Page 329 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-25. Troubleshooting Tree 14: SER A07 (TSTSR2) (Sheet 2 of 4) 7-76...
Page 330 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-25. Troubleshooting Tree 14: SER A07 (TSTSR2) (Sheet 3 of 4) 7-77...
Page 331 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-16 FIGURE 7-16 Figure 7-25. Troubleshooting Tree 14: SER A07 (TSTSR2) (Sheet 4 of 4) 7-78...
Page 332: Troubleshooting Tree 15: Rmt A07 (Tstrm2)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-26. Troubleshooting Tree 15: RMT A07 (TSTRM2) (Sheet 1 of 4) 7-79...
Page 333 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-16 FIGURE 7-48 FIGURE 7-16 Figure 7-26. Troubleshooting Tree 15: RMT A07 (TSTRM2) (Sheet 2 of 4) 7-80...
Page 334 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-16 Figure 7-26. Troubleshooting Tree 15: RMT A07 (TSTRM2) (Sheet 3 of 4) 7-81...
Page 335 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-16 FIGURE 7-16 Figure 7-26. Troubleshooting Tree 15: RMT A07 (TSTRM2) (Sheet 4 of 4) 7-82...
Page 336: Troubleshooting Tree 16: Non-Volatile Memory (Nvm A07)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-16 Figure 7-27. Troubleshooting Tree 16: Non-Volatile Memory (NVM A07) (Sheet 1 of 2) 7-83...
Page 337 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-16 Figure 7-27. Troubleshooting Tree 16: Non-Volatile Memory (NVM A07) (Sheet 2 of 2) 7-84...
Page 338: Troubleshooting Tree 17: Can't Get Glitch
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-29 FIGURE 7-29 Figure 7-28. Troubleshooting Tree 17: Can’t Get Glitch. 7-85...
Page 339: Troubleshooting Tree 18: Can't Get Good Data
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-29. Troubleshooting Tree 18: Can’t Get Good Data (Sheet 1 of 2) 7-86...
Page 340 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-29. Troubleshooting Tree 18: Can’t Get Good Data (Sheet 2 of 2) 7-87...
Page 341: Troubleshooting Tree 19: Diagnostics Pass Can't Stop
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-29 Figure 7-30. Troubleshooting Tree 19: Diagnostics Pass Can’t Stop. (Sheet 1 of 2) 7-88...
Page 342 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-30. Troubleshooting Tree 19: Diagnostics Pass Can’t Stop. (Sheet 2 of 2) 7-89...
Page 343: Troubleshooting Tree 20: Can't Get Glitch Trigger
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-19 Figure 7-31. Troubleshooting Tree 20: Can’t Get Glitch Trigger 7-90...
Page 344: Troubleshooting Trees
TROUBLESHOOTING TREES...
Page 345: Troubleshooting Tree 21: Test Output - Doesn't Work
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-32. Troubleshooting Tree 21: Test Output - Doesn’t Work. 7-91/(7-92 blank)
Page 346: Diagnostic Test Descriptions
This part of Section 7 contains information about the 338 diagnostics tests and troubleshooting trees. The diagnostic test descriptions and trees for the 318 are located in the first half of this section. Refer to the page-edge tabs for help in locating the information you need.
Page 347: Diagnostic Test Common Signal Paths
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-15 338 DIAGNOSTIC TEST COMMON SIGNAL PATHS Clock Threshold SQRAM N&DL Component A04 U152, A04 U150 A03 U126, A03 U112 A04 U110 A04 U146, A04 U142 A04 U114, A03 U112 A04 U110 A03 U156, A03...
Page 348: Keyboard Test Key Code And Interrupt Assignment
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service MAINFRAME KEYBOARD TEST Program: KBD Function: Power on - When power is turned on, the KBD program checks the keyboard to see if any keys are stuck in the closed position. The MPU reads the resulting data at address E0 and verifies that all data bits are low.
Page 349: Crt Adjustment
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Key Code Assignment. Blocks correspond to the key position on the front panel. STOP 4434-550 Figure 7-33. 338 Keyboard test schematic. CRT TEST Program: CRT Function: Power on - None. Troubleshooting - The CRT generates the following four kinds of patterns for the CRT adjustment and visual check.
Page 350: Crt Calibration And Check
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service All character fonts for the parallel analyzer mode. To check the CRT circuit and the Character ROM (CROM) for parallel operation. All character fonts for the serial state analyzer mode. To check the CRT circuit and the CROM for serial operation.
Page 351: Jump Table Rom Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service JUMP TABLE ROM TEST Program: Function: Power on - The Jump Table ROM, which contains the diagnostic test routine, is checked by calculating its checksum from C000 to DFFF. Troubleshooting - None. Description: The diagnostic routine is located in addresses C000 through DFFF in the Jump Table ROM, U026 (64 K-byte UV EPROM, 2764) on the A05 ROM/Threshold board.
Page 352: Display Ram Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service ROM7 enables the read operation of the Jump Table ROM. It is generated by U005 (dual 2-line to 4-line decoder/demultiplexer, 74LS139). U001 (74LS139) on the A05 board decodes the BM1, BMREQ, and AB11 through AB15 signals.
Page 353: System Ram Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service SYSTEM RAM TEST Program: Function: Power on - System RAMs are checked with the chekcerboard marching pattern from addresses F000 through F7FF and from F800 through FFFF. Step 1. The word 55 is written into all RAM addresses.
Page 354: Rom Test Address Assignment
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-17 338 ROM TEST ADDRESS ASSIGNMENT Address Enabled by ROM1 U020 0000-3FFF /ROM1 ROM2 U021 4000-7FFF /ROM2 ROM3 U022 8000-BFFF /ROM3 ROM4 U023 8000-BFFF /ROM4 ROM5 U024 8000-BFFF /ROM5 ROM6 U025 8000-BFFF /ROM6 The chip-select signals for ROM1 and ROM2 are decoded by U001 (dual 2-line to 4-line decoder/demultiplexer, 74LS139) on the A05 ROM/Threshold board.
Page 355 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service The MPU reads data from these ROMs through U045 (octal bus transceiver with tri-state output, 74LS245) on the A05 board and through the A08 Mother board. The MPU addresses are sent to these ROMs and the decoders (74LS139) on the A05 board via U210 and U212 (octal buffer/line driver with tri-state output, 74LS 244) on the A06 MPU/Display board and through the A08 board.
Page 356: A03 And A04 Partial Acq Address Assignment
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-37. 338 A03 and A04 partial ACQ address assignment. 7-103...
Page 357: Parallel Analyzer
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service PARALLEL ANALYZER CLOCK TEST Program: CLK Function: Power on - The timebase is programmed for several ranges; its operation is checked by the MPU, which monitors the slow clock flag on each timer interrupt. Troubleshooting - This is not a verification test, but the user should observe the timebase with an oscilloscope or some similar instrument.
Page 358: Clock Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-38. 338 Clock test. gate, 10102). The status from U140 is selected by U144 (quad 2-input multiplexer, 10158) on the A04 board and is converted from ECL to TTL level. Then it is fed to U152 on the A04 board for the MPU. The MPU compares the slow clock flag with the expected value (see Table 7-18), and displays an error message if it does not match.
Page 359: Clock Test Program Ranges
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-18 338 CLOCK TEST PROGRAM RANGES Gate Clock SYSCLK SLOW CLOCK flag 20nS reset 50nS reset 100uS reset 200uS reset 50uS reset 10Ms 500uS reset 10mS WORD RECOGNIZER TEST Program: WR Function: Power on - The word recognition (WR) RAMs are checked with the checkerboard marching pattern from 00 through FF.
Page 360: Word Recognizer Test Port Addresses
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-19 338 WORD RECOGNIZER TEST PORT ADDRESSES (Hex) Address Content of Looping Test increment WR-address counter for WRO test. write WRO data 55 into data latch. write WRO data AA into data latch. increment WR-address counter for WR1 test.
Page 361 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service The write pulse to the WR U118 and U120 is generated by U1 12 (74LS138) and converted to ECL- level by U1114 (10124) at the time the MPU writes at I/O address 01 . The I/O address to generate the write pulse for the U218 and U122 is 00 .
Page 362: Word Recognizer Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service 4434-567 Figure 7-39. 338 Word recognizer test. 7-109...
Page 363: Acq Ram Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service ACQ RAM TEST Program : ACQ Function: Power on - All the ACQ RAMs are checked with the checkerboard marching pattern from 00 through FF. Step 1. The word 55 is written into all RAM addresses.
Page 364: Acq Test Port Addresses
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-20 338 ACQ TEST PORT ADDRESSES (Hex) Address Content of Looping Test reset WR-address counter to count up WR-address counter to 55 to write 55 into the background of high-speed memory. write CSO & CS1, CS2, CS3 into CS-latch to read 55 from high-speed memory.
Page 365: Acq Memory Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service 4434-568 Figure 7-40. 338 ACQ memory test. 3-input/3-output NOR gate, 10211 ) on the A02 board. This clock is returned to the strobe generator circuit on the A03 board. The Strobe Generator on the A03 board delivers WE and ADRS CLK to the A04 board when the clock qualifier is set to off.
Page 366: Sqram Test Port Addresses
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service SQRAM Test Program: SQRAM Function: Power on - The SQRAM is checked with the checkerboard marching pattern from 00 through FF. Step 1. The word 55 is written into all RAM addresses. Step 2. A word is read from a diagnostic cell and compared with the expected word 55. If the selected word is not equal to 55, an error message is displayed and the MPU is halted.
Page 367: Sqram Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service The data read is checked by the MPU and an error message is displayed if it is incorrect. The MPU also checks the interrupt from the carry flip-flop U139A on the A04 board. The carry is set when U136 and U138 (F10016) on the A04 board both issue a carry bit at the same time.
Page 368: Sqram Test Sqram Address Connections
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-22 338 SQRAM TEST SQRAM DATA CONNECTIONS Setup SQRAM U144 Latch MPU Data DI0 (pin 6) U106 Q1 (pin 3) DI1 (pin 7) U106 Q3 (pin 13) DI2 (pin 18) U108 Q1 (pin 3)
Page 369: N & Delay Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service N & DELAY TEST Program: N & DLY Function: Power on - The Event/Delay counter counts word "A" N times when functioning as the event counter, and counts a certain number of clock signals for delay when functioning as the delay counter.
Page 370 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service To keep the Event/Delay counter enabled during the test, the SQRAM must supply CE to the Event/Delay counter. So, the same setups mentioned above are repeated in order to load 0000 into the SQRAM. binary...
Page 371: N And Delay Counter Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service 4434490 Figure 7-42. 338 N and DELAY counter test. 7-118...
Page 372: Threshold Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service THRESHOLD TEST Program: THRSH Function: Power on - Threshold V1 and Threshold V2 are set for several levels to produce Threshold V3 at - 0.2V or +0.2V. For every setting the comparator will detect the Threshold V3 level relative to ground and the MPU checks the comparator’s output against the expected data (O or 1).
Page 373: Threshold Test Data Values
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service When the MPU writes at I/O address E0 the WR and CS signals are sent to U070 (DAC V1) to latch the data. WR and CS for U080 (DAC V2) are caused by the MPU’s access at I/O address E1 .
Page 374: Seq Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service During this test, all outputs of the ACQ Memories on the A04 board are disabled (maintained low) y forcing BS high from U114 (hex D master-slave flip-flop, 10176) on the A04 board. U1 14 is written by the MPU at I/O address 5A The MPU reads the data from the A04 board at I/O address 59 , i.e., with READ ACQ DATA from 112 (binary to 1-8...
Page 375: S1 Serial Analysis/Rs232C/Nvm
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service The words, WA, WB, and WC are set to 01 , 02 and 03 respectively. Then full trigger sequence, 5*WA FLW’D BY:WB RESET ON:WC is selected with 16 clocks of delay to stop after the trigger recognition.
Page 376: Rs-232 Test
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Description - The NVM address is from EOOO through E7FF; NVM address select signal (NVMCS) is supplied from the address decoder on the MPU (A06) board through bus connector 46B. The NVM chip is selected by the inverse NVMCS and the power(+5V) monitor signal.
Page 377 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service RS-232 data also passes through U40 and U41. This serial data is sampled at sixteen times the clock of the baud rate. This clock is supplied by U5 (baud rate generator). U45 latches the baud rate select data and its output defines the clock rate.
Page 378 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Function 2 includes two test programs. These programs control the external trigger transition, and check the trigger status in bit #1 of the option status register. Function 3 includes eight test programs. These programs generate serial data (shift pattern data: 01 02 04 08 10 20 40) at pin #2 of the RS-232 connector.
Page 379: Serial Test I/O Addresses
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-26 338 SERIAL TEST I/O ADDRESSES Selected I/O Address Program Function Read content of address 80. Write data to address 84. 1. Write data 10 to address 8C. “ “ ” “ “ “...
Page 380: Serial Test Baud Select Bits
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service bit = battery status xxxxx xxxxx xxxxx xxxxx xxxxx xxxxx xxxxx NOTE: "xxxxx" data bit has no function. I/O ADDRESS CHIP FUNCTION RS-232 BAUD RATE SETUP REGISTER CONTROL WRITE ONLY bit = baud baud baud...
Page 381 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service I/O ADDRESS CHIP RESET TO U31 FUNCTION SERIAL PARAMETER SETUP REGISTER CONTROL WRITE ONLY bit = baud baud baud baud extern. Serial select select select select trigger data xxxxx xxxxx as S3 as S2 as S1 as S0 pol.
Page 382 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-28 338 DIAGNOSTIC TEST FAILURE CODES PART 1 - TSTRM2 (RS-232 TEST) Code Error Information 150 (96) RTS NOT ON 151 (97) CTS NOT ON 152 (98) CD NOT ON 153 (99) RTS NOT OFF...
Page 383 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-28 (cont.) 338 DIAGNOSTIC TEST FAILURE CODES PART 2 - TSTSR2 (SERIAL TEST) Code Error Information 180 (B4) REG #0 READ ERROR (FOR SIO PORT-A) 181 (B5) RX READY NOT OFF “ “ 182 (B6) REG #1 READ ERROR “...
Page 384 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Table 7-28 (cont.) 338 DIAGNOSTIC TEST FAILURE CODES PART 3 - TSTNV2 (NVM TEST) Code Error Information 200 (C8) DATA ERROR WHEN DATA PATTERN IS FF 201 (C9) “ “ “ 202 (CA) “ “...
Page 385: Troubleshooting Tree 1: Power On
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-46 FIGURE 7-47 FIGURE 7-45 FIGURE 7-48 Figure 7-44. Troubleshooting Tree 1: Power On. 7-133...
Page 386: Troubleshooting Trees
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-49 FIGURE 7-48 FIGURE 7-51 FIGURE 7-52 FIGURE 7-53 FIGURE 7-54 FIGURE 7-55 FIGURE 7-57 FIGURE 7-58 FIGURE 7-59 Figure 7-45. Troubleshooting Tree 2: Self Test. 7-134...
Page 387 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-46. Troubleshooting Tree 3: Power Supplies A11, A12 (Sheet 1 of 2). 7-135...
Page 388: Troubleshooting Tree 3: Power Supplies A11, A12
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-46. Troubleshooting Tree 3: Power Supplies A11, A12 (Sheet 2 of 2). 7-136...
Page 389 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-47. Troubleshooting Tree 4: CRT A10 (Sheet 1 of 4). 7-137...
Page 390: Troubleshooting Tree 4: Crt A10
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-47. Troubleshooting Tree 4: CRT A10 (Sheet 2 of 4). 7-138...
Page 391 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-47. Troubleshooting Tree 4: CRT A10 (Sheet 3 of 4). 7-139...
Page 392 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-47. Troubleshooting Tree 4: CRT A10 (Sheet 4 of 4). 7-140...
Page 393 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-48. Troubleshooting Tree 5: MPU A06 (Sheet 1 of 5). 7-141...
Page 394: Troubleshooting Tree 5: Mpu A06
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-48. Troubleshooting Tree 5: MPU A06 (Sheet 2 of 5). 7-142...
Page 395 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-48. Troubleshooting Tree 5: MPU A06 (Sheet 3 of 5). 7-143...
Page 396 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-48. Troubleshooting Tree 5: MPU A06 (Sheet 4 of 5). 7-144...
Page 397 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-47 Figure 7-48. Troubleshooting Tree 5: MPU A06 (Sheet 5 of 5). 7-145...
Page 398 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-49. Troubleshooting Tree 6: Clock A04 (CLK) (Sheet 1 of 2). 7-146...
Page 399: Troubleshooting Tree 6: Clock A04 (Clk)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-49. Troubleshooting Tree 6: Clock A04 (CLK) (Sheet 2 of 2). 7-147...
Page 400 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-50. Troubleshooting Tree 7: Word Recognizer (WR A01 A02) (Sheet 1 of 4). 7-148...
Page 401: Troubleshooting Tree 7: Word Recognizer (Wr A01 A02)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-50. Troubleshooting Tree 7: Word Recognizer (WR A01 A02) (Sheet 2 of 4). 7-149...
Page 402 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-50. Troubleshooting Tree 7: Word Recognizer (WR A01 A02) (Sheet 3 of 4). 7-150...
Page 403 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-49 Figure 7-50. Troubleshooting Tree 7: Word Recognizer (WR A01 A02) (Sheet 4 of 4). 7-151...
Page 404 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-51. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 1 of 7). 7-152...
Page 405: Troubleshooting Tree 8: Data Acquisition (Acq A01 A02)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-50 Figure 7-51. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 2 of 7). 7-153...
Page 406 TM 11-6625-3145-14 Maintenance: Troubieshooting-318/338 Service Figure 7-51. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 3 of 7). 7-154...
Page 407 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-51. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 4 of 7). 7-155...
Page 408 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-51. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 5 of 7). 7-156...
Page 409 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-51. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 6 of 7). 7-157...
Page 410 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-49 Figure 7-51. Troubleshooting Tree 8: Data Acquisition (ACQ A01 A02) (Sheet 7 of 7). 7-158 7-158...
Page 411 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-50 FIGURE 7-50 Figure 7-52. Troubleshooting Tree 9: SQRAM A03 (Sheet 1 of 4). 7-159...
Page 412: Troubleshooting Tree 9: Sqram A03
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-52. Troubleshooting Tree 9: SQRAM A03 (Sheet 2 of 4). 7-160...
Page 413 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-63 Figure 7-52. Troubleshooting Tree 9: SQRAM A03 (Sheet 3 of 4). 7-161...
Page 414 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-49 Figure 7-52. Troubleshooting Tree 9: SQRAM A03 (Sheet 4 of 4). 7-162 7-162...
Page 415 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-54 Figure 7-53. Troubleshooting Tree 10: NDL A03 (Sheet 1 of 2). 7-163...
Page 416: Troubleshooting Tree 10: Ndl A03
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-54 Figure 7-53. Troubleshooting Tree 10: NDL A03 (Sheet 2 of 2). 7-164...
Page 417 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-50 Figure 7-54. Troubleshooting Tree 11: SEQ A03 (Sheet 1 of 4). 7-165...
Page 418: Troubleshooting Tree 11: Seq A03
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-51 FIGURE 7-52 Figure 7-54. Troubleshooting Tree 11: SEQ A03 (Sheet 2 of 4). 7-166...
Page 419 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-51 Figure 7-54. Troubleshooting Tree 11: SEQ A03 (Sheet 3 of 4) 7-167...
Page 420 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-52 Figure 7-54. Troubleshooting Tree 11: SEQ A03 (Sheet 4 of 4)., 7-168 7-168...
Page 421 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-55. Troubleshooting Tree 12: T/H A01 A02 7-169...
Page 422 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-51 Figure 7-56. Troubleshooting Tree 13: T/H A04. 7-170...
Page 423 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-57. Troubleshooting Tree 14: SER A07 TSTSR2 (Sheet 1 of 4). 7-171...
Page 424: Troubleshooting Tree 14: Ser A07 Tstsr2
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-57. Troubleshooting Tree 14: SER A07 TSTSR2 (Sheet 2 of 4). 7-172...
Page 425 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-57. Troubleshooting Tree 14: SER A07 TSTSR2 (Sheet 3 of 4). 7-173...
Page 426 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-48 FIGURE 7-48 Figure 7-57. Troubleshooting Tree 14: SER A07 TSTSR2 (Sheet 4 of 4). 7-174...
Page 427 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-58. Troubleshooting Tree 15: REMOTE A07 TSTRM2 (RMT) (Sheet 1 of 4). 7-175...
Page 428: Troubleshooting Tree 15: Remote A07 Tstrm2 (Rmt)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-48 FIGURE 7-48 Figure 7-58. Troubleshooting Tree 15: REMOTE A07 TSTRM2 (RMT) (Sheet 2 of 4). 7-176...
Page 429 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-48 Figure 7-58. Troubleshooting Tree 15: REMOTE A07 TSTRM2 (RMT) (Sheet 3 of 4). 7-177...
Page 430 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-48 FIGURE 7-48 Figure 7-58. Troubleshooting Tree 15: REMOTE A07 TSTRM2 (RMT) (Sheet 4 of 4). 7-178...
Page 431 TM 11-6625-3145.14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-48 Figure 7-59. Troubleshooting Tree 16: Non Volatile Memory (NVM A07) (Sheet 1 of 2). 7-179...
Page 432: Troubleshooting Tree 16: Non-Volatile Memory (Nvm A07)
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service FIGURE 7-48 Figure 7-59. Troubleshooting Tree 16: Non Volatile Memory (NVM A07) (Sheet 2 of 2), 7-180...
Page 433 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-60. Troubleshooting Tree 17: Can’t Get Glitch. 7-181...
Page 434 TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-61. Troubleshooting Tree 18: Can’t Get Good Data (Sheet 1 of 2). 7-182...
Page 435: Troubleshooting Tree 18: Can't Get Good Data
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-61. Troubleshooting Tree 18: Can’t Get Good Data (Sheet 2 of 2). 7-183...
Page 436: Troubleshooting Tree 19: Diagnostics Pass Can't Stop
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-62. Troubleshooting Tree 19: Diagnostics Pass Can’t Stop. 7-184...
Page 437: Troubleshooting Tree 20: Can't Get Glitch Trigger
‘ TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-63. Troubleshooting Tree 20: Can’t Get Glitch Trigger 7-185...
Page 438: Troubleshooting Tree 21: Test Output Doesn't Work
TM 11-6625-3145-14 Maintenance: Troubleshooting-318/338 Service Figure 7-64. Troubleshooting Tree 21: Test Output Doesn’t Work. 7-186...
Page 439 A2 with its subassemblies and parts). If a part you have ordered has been replaced with a new or improved part, your local Tektronix, Inc. Field Chassis-mounted parts have no assembly number Office or representative will contact you concerning any prefix and are located at the end of the Electrical Parts change in part number.
Page 440 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service CROSS INDEX-MFR. CODE NUMBER TO MANUFACTURER Mfr. Code Manufacturer Address City, State, Zip 0000M SONY/TEKTRONIX CORPORATION P O BOX 14, HANEDA AIRPORT TOKYO 149, JAPAN 000FJ MARCOM SWITCHES INC 67 ALBANY STREET CAZENOVIA, N.Y. 13035...
Page 441 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7819-00 CKT BOARD ASSY: DATA INPUT A 80009 670-7819-00 ---- ---- (318 ONLY) 670-7817-00 CKT BOARD ASSY: DATA INPUT A...
Page 442 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A01C114 281-0775-00 CAP., FXD, CER DI: 0.1UF, 20%, 50V 04222 MA205E104MAA A01C116 281-0775-00 CAP., FXD, CER DI: 0.1UF, 20%, 50V...
Page 443 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A01DL110 119-1608-00 DELAY LINE, ELEC: 5.5NS, 100 OHM 0000M 119-1608-00 A01DL110 ---- ---- (338 ONLY) A01J100 131-2936-01 CONN, RCPT, ELEC: FEMALE, 2 X 15...
Page 444 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A01R126 315-0472-00 RES., FXD, CMPSN: 4.7K OHM, 5%, 0.25W 57668 NTR25J-E04K7 A01R126 ---- ---- (318 ONLY) A01R126 315-0101-00 RES., FXD, CMPSN: 100 OHM, 5%, 0.25W...
Page 445 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A01U102 155-0215-00 MICROCIRCUIT, DI: LOGIC ANALYZER INPUT, 16 DIP 80009 155-0215-00 A01U102 ---- ---- (318 ONLY) A01U102 156-1038-00 MICROCIRCUIT, DI: 4 BIT BINARY COUNTER...
Page 446 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A01U126 156-1038-00 MICROCIRCUIT, DI: 4 BIT BINARY COUNTER 80009 156-1038-00 A01U126 ---- ---- (318 ONLY) A01U126 156-0092-01 .300101 .300150...
Page 447 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7818-00 CKT BOARD ASSY: DATA INPUT B 80009 670-7818-00 ---- ---- (318 ONLY) 670-7816-00 CKT BOARD ASSY: DATA INVERTER...
Page 448 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A02C250 281-0775-00 CAP., FXD, CER DI: 0.1UF, 20%, 50V 04222 MA205E104MAA A02C252 281-0775-00 CAP., FXD, CER DI: 0.1UF, 20%, 50V...
Page 449 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A02DL110 119-1610-00 DELAY LINE, ELEC: 5NS, 100 OHMS, TAPPED 0000M 119-1610-00 A02DL110 ---- ---- (318 ONLY) A02DL112 119-1608-00 DELAY LINE, ELEC: 5.5NS, 100 OHM...
Page 450 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A02R216 315-0272-00 RES., FXD, CMPSN: 2.7K OHM, 5%, 0.25W 57668 NTR25J-E02K7 A02R216 ---- ---- (318 ONLY) A02R216 307-0111-00 RES., FXD, CMPSN: 3.6 OHM, 5%, 0.25W...
Page 451 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A02R254 315-0102-00 RES., FXD, CMPSN: 1K OHM, 5%, 0.25W 57668 NTR25JE01K0 A02R254 ---- ---- (318 ONLY) A02R256 315-0101-00 RES., FXD, CMPSN: 100 OHM, 5%, 0.25W...
Page 452 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A02R300 315-0622-00 RES., FXD, CMPSN: 6.2K OHM, 5%, 0.25W 01121 CB6225 A02R300 ---- ---- (318 ONLY) A02R300 321-0929-07 RES., FXD, FILM: 2.5K OHM, 0.10%, 0.125W...
Page 453 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A02R324 311-2084-00 .300101 .300895 RES., VAR, NONWIR: TRMR, 500 OHM, 10%, 0.5W 0000M 311-2084-00 A02R324 ---- ---- (338 ONLY) A02R324 311-2084-01 .
Page 454 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A02R354 315-0101-00 RES., FXD, CMPSN: 100 OHM, 5%, 0.25W 57668 NTR25J-E 100E A02R354 ---- ---- (338 ONLY) A02R356 321-0317-00 RES., FXD, FILM: 19.6K OHM, 1%, 0.125W...
Page 455 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A02U228 156-0633-00 MICROCIRCUIT, DI: HEX D MASTER SLAVE F-F 80009 156-0633-00 A02U228 ---- ---- (318 ONLY) A02U228 156-0757-00 MICROCIRCUIT, DI: DUAL 3-IN, 3-OUT GATE...
Page 456 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7815-00 CKT BOARD ASSY: ACQ CONTROL 80009 670-7815-00 ---- ---- (318 ONLY) 670-7822-00 CKT BOARD ASSY: ACQ CONNECTOR 80009...
Page 457 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A03R112 307-0876-00 RES NTWK, FXD, FI: 8, 100 OHM, 5%, 0.125W 0000M 307-0876-00 A03R114 307-0879-00 RES NTWK, FXD, FI: 4, 51 OHM, 5%, 0.125W...
Page 458 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A03U150 156-0880-04 MICROCIRCUIT, DI: DUAL D-TYPE MASTER SLAVE 0000M 156-0880-04 A03U152 156-0229-02 MICROCIRCUIT, DI: DUAL 4-5 INPUT OR/NOR 0000M...
Page 459 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7814-00 CKT BOARD ASSY: ACO MEMORY 80009 670-7814-00 ---- ---- (318 ONLY) 670-7823-00 CKT BOARD ASSY: ACO MEMORY 80009...
Page 460 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A04R146 315-0511-00 RES., FXD, CMPSN: 510 OHM, 5%, 0.25W 01121 CB5115 A04TP110 214-0579-00 TERM, TEST POINT: BRS CD PL...
Page 461 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A04U118 156-1773-00 .300101 .300720 MICROCIRCUIT, DI: 256 WORD X 4 BIT RAM 0000M 156-1773-00 A04U118 ---- ---- (318 ONLY)
Page 462 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A04U130 156-1635-00 .300746 MICROCIRCUIT, DI: 256 X 4 SRAM, 24 PIN DIP, CER 27014 DM10422A A04U130 ---- ---- (338 ONLY)
Page 463 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7813-00 CKT BOARD ASSY: ROM/THRESHOLD 80009 670-7813-00 ---- ---- (318/338 ONLY) A05C070 281-0814-00 CAP., FXD, CER DI: 100PF, 10%, 100V...
Page 464 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A05TP088 214-0579-00 TERM, TEST POINT: BRS CD PL 80009 214-0579-00 A05U001 156-0541-00 .300101 .300280 MICROCIRCUIT, DI: DUAL 2 TO 4 LINE DCDR...
Page 465 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A05U090 156-0464-02 .300461 MICROCIRCUIT, DI: DUAL 4 INP NAND GATE 01295 SN74LS20 A05U090 ---- ---- (338 ONLY) A05U092 156-0541-00 .300101...
Page 466 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7812-00 CKT BOARD ASSY: MPU DISPLAY 80009 670-7812-00 ---- ---- (318/338 ONLY) A06C100 281-0811-00 CAP., FXD, CER DI: 10PF, 10%, 100V...
Page 467 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A06R316 307-0882-00 RES NTWK, FXD, FI: 8, 100K OHM, 10%, 0.125W 0000M 307-0882-00 A06R320 315-0104-00 RES., FXD, CMPSN: 100K OHM, 5%, 0.25W...
Page 468 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A06U212 156-0956-02 .300151 MICROCIRCUIT, DI: OCTAL BFR W/3 STATE OUT 01295 SN74LS244NP3 A06U212 ---- ---- (338 ONLY) A06U214 156-0914-00 .300101...
Page 469 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A06W500 131-0566-00 BUS CONDUCTOR: DUMMY RES, 2.375, 22 AWG 57668 JWW-0200E0 A06Y105 158-0268-00 .300126 XTAL UNIT, QTZ: 10.227MHZ, 20%, PAR...
Page 470 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7809-00 CKT BOARD ASSY: SERIAL/RS232/NUM 80009 670-7809-00 ---- ---- (318/338 OPTION 01 ONLY) A07BT001 146-0046-00 BATTERY, DRY: 3.4V, 850MA, LITHIUM...
Page 471 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A07R131 315-0104-00 RES., FXD, CMPSN: 100K OHM, 5%, 0.25W 57668 NTR25J-E100K A07R140 315-0622-00 RES., FXD, CMPSN: 6.2K OHM, 5%, 0.25W...
Page 472 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A07U020 156-0385-00 .300101 .300150 MICROCIRCUIT, DI: HEX INVERTER, SCRN, 74LS04 01295 SN74LS04 A07U020 ---- ---- (338 ONLY) A07U020 156-0385-02 .300151...
Page 473 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A07U100 156-1156-01 MICROCIRCUIT, LI: OPERATIONAL AMPL 27014 LF356N/A + A07U110 156-1126-02 MICROCIRCUIT, LI: COMPARATOR SINGLE W/STROBE 0000M 156-1126-02 A07U111...
Page 474 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7811-00 CKT BOARD ASSY: MOTHER 80009 670-7811-00 ---- ---- (318/338 ONLY) A08J001 131-3065-00 .300126 CONN, RCPT, ELEC: EDGE CARD, 50 FEMALE...
Page 475 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 260-2133-00 SWITCH PB ASSY: KEYBOARD 80009 260-2133-00 A09DS010 150-1057-00 LT EMITTING DIO: GREEN, 20MA 0000M 150-1057-00 A09J010 131-2230-01 CONN, RCPT, ELEC: HEADER, 2 X 8, 2.54 SPACING...
Page 476 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7810-00 CKT BOARD ASSY: CRT CIRCUIT 80009 670-7810-00 ---- ---- (318/338 ONLY) A10C001 290-0536-00 CAP., FXD, ELCTLT: 10UF, 20%, 25V...
Page 477 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Mfr. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A10R130 315-0362-00 RES., FXD, CMPSN:3.6K OHM, 5%, 0.25W 01121 CB3625 A10R135 315-0132-00 RES., FXD, CMPSN:1.3K OHM, 5%, 0.25W...
Page 478 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7821-00 CKT BOARD ASSY:INVERTER 80009 670-7821-00 ----- ----- (318/338 ONLY) A1C102 285-1272-00 CAP., FXD, PLASTIC:0.22UF, 20%, 250V 0000M 285-1272-00...
Page 479 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Mfr. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A11Q141 151-0764-00 TRANSISTOR:SILICON, NPN 0000M 151-0764-00 A11Q149 151-0766-00 TRANSISTOR:SILICON, NPN 0000M 151-0766-00 A11R121 301-0224-00 RES., FXD, CMPSN:220K OHM, 5%, 0.5W...
Page 480 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Component No. Part No. Dscont Name & Description Code Mfr. Part Number 670-7820-00 CKT BOARD ASSY:REGULATOR 80009 670-7820-00 ----- ----- (318/338 ONLY) A12C003 285-1269-00 CAP., FXD, PLASTIC:0.01UF, 10%, 250V 0000M 285-1269-00...
Page 481 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Mfr. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A12CR007 152-0333-03 SEMICOND DEVICE:SILICON, 50V, 200MA 0000M 152-0333-03 A12CR034 152-0333-03 SEMICOND DEVICE:SILICON, 50V, 200MA 0000M 152-0333-03 A12CR035 152-0333-03...
Page 482 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Mfr. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A12R005 315-0122-00 RES., FXD, CMPSN:1.2K OHM, 5%, 0.25W 57668 NTR25J-E01K2 A12R006 315-0102-00 RES., FXD, CMPSN:1K OHM, 5%, 0.25W...
Page 483 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Mfr. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A12R059 315-0683-00 RES., FXD, CMPSN:68K OHM, 5%, 0.25W 57668 NTR25J-E68K0 A12R060 315-0183-00 RES., FXD, CMPSN:18K OHM, 56%, 0.25W...
Page 484 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Mfr. Component No. Part No. Dscont Name & Description Code Mfr. Part Number A12VR038 152-0819-00 SEMICOND DEVICE:ZEN, SI, 2.7V, 5%, 0.4W 0000M 152-0819-00 A12VR039 152-0816-00 SEMICOND DEVICE:ZEN, SI, 12V, 5%, 0.4W...
Page 485 TM 11-6625-3145-14 Replaceable Electrical Parts-318/338 Service Tektronix Serial/Model No. Mfr. Component No. Part No. Dscont Name & Description Code Mfr. Part Number CHASSIS PARTS B001 119-1648-01 FAN, TUBEAXIAL:1 2VDC, 3-8W, 53300RPM 0000M 119-1648-01 159-0032-00 FUSE, CARTRIDGE:3AG, 0.5A, 250V, SLOW- 71400...
Page 486 (pF). Values less than one are in Other ANSI standards that are used in the preparation of microfarads ( µ / F). diagrams by Tektronix, Inc. are: Resistors = Ohms (Ω). The information and special symbols below may appear in this manual.
Page 487 TM 11-6625-3145-14 318/338 Table 9-1 IC PIN INFORMATION Device Type VCC or VDD Device Type VCC or VDD 10016 1, 16 74LS20 10101 1, 16 74LS74 10102 1, 16 74LS86 10109 1, 16 74LS92 10115 1, 16 74LS125 10116 1, 16...
Page 488 If a part you have ordered has been replaced with a Detail Part of Assembly and or Component new or improved part, your local Tektronix, Inc. Field Attaching parts for Detail Part Office or representative will contact you concerning any...
Page 489 TM 11-6625-3145-14 Replaceable Mechanical Parts-318/338 Service CROSS INDEX-MFR. CODE NUMBER TO MANUFACTURER Mfr Code Manufacturer Address City, State. Zip 0000M SONY TEKTRONIX CORPORATION P O BOX 14, HANEDA AIRPORT TOKYO 149, JAPAN 000BK STAUFFER SUPPLY 105 SE TAYLOR PORTLAND, OR 97214 000JA J.
Page 490 TM 11-6625-3145-14 Replaceable Mechanical Parts-318/338 Service Fig. & Index Tektronix Serial/Model No. Mfr. Part No. Dscont Qty 1 2 3 4 5 Name & Description Code Mfr Part Number 016-0408-00 .300101 .300925 COVER, PROT:FRONT PANEL 0000M 016-0408-00 ----- ----- (318 ONLY) 016-0408-01 .300926...
Page 491 SCREW, CAP:2-56 X 0.177, HEX SOCKET ----- ----- (338 ONLY) 361-1266-00 SPACER, RING:0.7 L X 2.4 ID MM 0000M 361-1266-00 **********(END ATTACHING PARTS)*********** 198-5297-00 WIRE SET, ELEC:FRONT PANEL, 318 0000M 198-5297-00 210-0202-00 TERMINAL, LUG:0.146 ID, LOCKING, BRZ, TIN PL 78189 2104-06-00-2520N ************(ATTACHING PARTS)**************** 211-0503-00 SCREW, MACHINE:6-32 X 0.188 INCH, PNH STL...
Page 492 ORD BY DESCR ************* (END ATTACHING PARTS) ******** ----- ----- .CKT BOARD ASSY INCLUDES: ----- ----- .SWITCH ASSY:(SEE A09 REPL) .CONNECTOR:(SEE A09J010 REPL) 198-5297-00 .WIRE SET, ELEC:FRONT PANEL, 318 0000M 198-5297-00 334-3360-00 MARKER, IDENT:MARKED WARNING 0000M 334-3360-00 386-4962-00 SUBPANEL, FRONT:...
Page 493 TM 11-6625-3145-14 Replaceable Mechanical Parts-318/338 Service Fig. & Index Tektronix Serial/Model No. Mfr. Part No. Dscont Qty 1 2 3 4 5 Name & Description Code Mfr Part Number 2-45 386-4059-00 SUPPORT, CRT.BLACK PLASTIC 0000M 386-4059-00 ----- ----- ELECTRON TUBE:(SEE V200 REPL)
Page 494 TM 11-6625-3145-14 Replaceable Mechanical Parts-318/338 Service Fig. & Index Tektronix Serial/Model No. Mfr. Part No. Dscont Qty 1 2 3 4 5 Name & Description Code Mfr Part Number 2-86 198-5296-00 WIRE SET, ELEC:INPUT BRACKET 0000M 198-5296-00 352-0162-00 .HLDR, TERM CONN:4 WIRE BLACK...
Page 495 TM 11-6625-3145-14 Replaceable Mechanical Parts-318/338 Service Fig. & Index Tektronix Serial/Model No. Mfr. Part No. Dscont Qty 1 2 3 4 5 Name & Description Code Mfr Part Number 2-126 ----- ----- CKT BOARD ASSY:ROM/THRSHLD(SEE A05 REPL) -127 136-0694-00 .SKT, PL-IN ELEK:MICROCIRCUIT, 28 CONTACT...
Page 496 TM 11-6625-3145-14 Replaceable Mechanical Parts-318/338 Service Fig. & Index Tektronix Serial/Model No. Mfr. Part No. Dscont Qty 1 2 3 4 5 Name & Description Code Mfr Part Number 441-1663-00 .300101 .300280 CHAS, PWR SUPPLY:318/338 0000M 441-1663-00 ----- ----- (318 ONLY) 441-1663-01 .300281...
Page 497 TM 11-6625-3145-14 Replaceable Mechanical Parts-318/338 Service Fig. & Index Tektronix Serial/Model No. Mfr. Part No. Dscont Qty 1 2 3 4 5 Name & Description Code Mfr Part Number 3-32 ----- ----- .DIODE:(SEE A11CR151 REPL) .***********(ATTACHING PARTS) *********** 211-0121-00 .SCR, ASSEM WSHR:4-40 X 0.438 INCH, PNH BRS...
Page 498 ----- ----- (OPTION AS-SWITZERLAND ONLY) 010-6451-07 LEAD, TEST:MULTI LEAD, W/ACCESS 80009 010-6451-07 010-6107-03 PROBE, VOLTAGE:10 X, 2 METER 80009 010-6107-03 OPTIONAL ACCESSORIES 012-0757-00 CABLE, INTCON:180.0 L 80009 012-0757-00 067-1159-00 FIXTURE, CAL:SERVICE MAINTENANCE 0000M 067-1159-00 070-4434-00 MANUAL, TECH:SERVICE 80009 070-4434-00 318/338 SERVICE...
Page 499: Appendix A References
TM 11-6625-3145-24P Organization, Direct Support, and General Support Maintenance, including Depot Maintenance Repair Parts and Special Tools Lists for Logic Analyzer, TEK Models 318/338 TM 7520-244-2 Procedures for Destruction of Electronics Materiel to Prevent Enemy Use (Electronics Command) A-1/(A-2 blank)
Page 500 COMPONENTS OF END ITEM LIST SECTION I. INTRODUCTION B-1. Scope The appendix lists integral components of and basic issue items for Logic Analyzer, TEK Models 318/338 to help you inventory items required for safe and efficient operation. B-2. General This Components of End Item List is divided into the following sections: a.
Page 501 TM 11-6625-3145-14 e. Column 5, Usable on Code. Not applicable. f. Column 6, Quantity Required (Qty Reqd). This column lists the quantity of each item required for a complete major item. g. Column 7, Quantity. This column is divided into two columns. In the Received (Rcvd) column, list the quantity actually received on your major item.
Page 502 QUANTITY NATIONAL DESCRIPTION USUABLE FIG. ITEM STOCK NUMBER PART NUMBER (FSCM) LOCATION CODE REQD RCVD DATE LOGIC ANALYZER, TEKTRONIX MODEL 31851 (FSCM) (80009) DRSEL-MA Form 6010, (1 Mar 77) (Edition of 1 Jun 76 is obsolete) B-3(B-4 blank) B-3(B-4 blank)
Page 503: Appendix C Error And Acquisition Status Messages
REMOTE MODE message. The 318/338 is waiting for a link message from the terminal. <WAITING TRIG> This message means that the 318/338 is waiting for a trigger word. This message appears just before the 318/338 starts an acquisition. C-1/(C-2 blank)
Page 504 SECTION 1. INTRODUCTION D-1. General This appendix provides a summary of the maintenance operations for Logic Analyzer, TEK Models 318/338. It authorizes categories of maintenance for specific maintenance functions on repairable items and components and the tools and equipment required to perform each function. This appendix may be used as an aid in planning maintenance operations.
Page 505 TM 11-6625-3145-14 measuring and diagnostics equipments use in precision measurement. Consists of comparison of two instruments, one in which is a certified standard of know accuracy of the instrument being compared. g. Install. The act of emplacing, seating, or fixing into position an item, part, module (component or assembly) in a manner to allow the proper functioning of the equipment or system.
Page 506 TM 11-6625-3145-14 and modules with the next higher assembly. b. Column 2, Component/Assembly. Indicates the noun names of components, assemblies, subassemblies, and modules for which maintenance is authorized. c. Column 3, Maintenance Function. Lists the functions to be performed on the item listed column 2. When items are listed without maintenance functions.
Page 507 TM 11-6625-3145-14 D-4. SECTION III. Tool and Test Equipment Requirements. a. Tool or Test Equipment Reference Code. The numbers in this column coincide with the numbers used in the tools and equipment column of the MAC. The numbers indicate the applicable tool or test equipment for the maintenance functions.
Page 508 TM 11-6625-3145-14 SECTION II MAINTENANCE ALLOCATION CHART LOGIC ANALYZER 318S1 MAINTENANCE LEVEL GROUP MAINTENANCE TOOLS AND NUMBER COMPONENT ASSEMBLY FUNCTION EQUIPMENT REMARKS LOGIC ANALYZER Inspect 318S1 (80009) Test Test Service Replace Repair A, B, C Repair DATA INPUT A CCA Inspect 670-7819-00 Test...
Page 509 TM 11-6625-3145-14 SECTION III TOOL AND TEST EQUIPMENT REQUIREMENTS LOGIC ANALYZER 318S1 TOOL OR TEST MAINTENANCE NATIONAL/NATO TOOL EQUIPMENT CATEGORY NOMENCLATURE STOCK NUMBER NUMBER REF CODE DUAL TRACE OSCILLOSCOPE TEK475 OS261C/U (80009) POWER MODULE TM503 OS261C/U (80009) PULSE GENERATOR 6625-01-137-5369 SG-1205/U DIGITAL MULTIMETER 6625-01-145-2430...
Page 510 TM 11-6625-3145-14 SECTION IV. REMARKS REFERENCE REMARKS CODE TEST AND REPAIR BY USATSG AT GENERAL SUPPORT LEVEL. CONSISTS OF REPLACEMENT OF CCA’S, SUBASSEMBLIES, AND MAINFRAME COMPONENTS AS REQUIRED. ASSEMBLY A9 IS A THROW-AWAY ITEM. D-7/(D-8 blank)
Page 511: Error Codes In Self Test
TM 11-6625-3145-14 APPENDIX E ERROR CODES Table E-1 ERROR CODES IN SELF TEST Code Description ROM U1 ( 00 TO 3FFF ) MAY BE DAMAGED. ROM U2 ( 4000 TO 7FFF ) MAY BE DAMAGED. ROM U3 ( PAGE 1: 8000 TO BFFF ) MAY BE DAMAGED. ROM U4 ( PAGE 2: 8000 TO BFFF ) MAY BE DAMAGED.
Page 512: Error Codes Of Parallel Tests In Diagnostics Menu
TM 11-6625-3145-14 Table E-2 ERROR CODES OF PARALLEL TESTS IN DIAGNOSTICS MENU Code Description CAN NOT WRITE WORD "55" INTO WRO, OR CAN NOT READ DATA FROM HIGH SPEED RAM. CAN NOT WRITE WORD "AA" INTO WRO, OR CAN NOT READ DATA FROM HIGH SPEED RAM.
Page 513: Error Codes Of Serial Tests In Diagnostics Menu
TM 11-6625-3145-14 Table E-3 ERROR CODES OF SERIAL TESTS IN DIAGNOSTICS MENU Code Description SERIAL STATUS REGISTER READ ERROR SERIAL RECEIVE READY NOT OFF SERIAL ERROR REGISTER READ ERROR SERIAL FRAMING-ERR BIT NOT OFF SERIAL OVER RUN-ERR BIT NOT OFF SERIAL PARITY-ERR BIT NOT OFF EXT-TRIG BIT NOT OFF EXT-TRIG BIT NOT ON...
Page 514: Error Codes Of Remote Tests In Diagnostics Menu
TM 11-6625-3145-14 Table E-4 ERROR CODES OF REMOTE TESTS IN DIAGNOSTICS MENU Code Description RTS NOT ON CTS NOT ON CD NOT ON RTS NOT OFF CTS NOT OFF CD NOT OFF DTR NOT ON DSR NOT ON RS232 STATUS REGISTER READ ERROR RS232 RECEIVE READY FLAG NOT OFF RS232 TRANSMIT EMPTY FLAG NOT ON RS232 ERROR REGISTER READ ERROR...
Page 515: Error Codes Of Nvm Tests In Diagnostics Menu
TM 11-6625-3145-14 Table E-5 ERROR CODES OF NVM TESTS IN DIAGNOSTICS MENU Code Description DATA ERROR WHEN DATA PATTERN IS FF MARCHING PATTERN INCREMENTING PATTERN E-5/(E-6 blank)
Page 516 By Order of the Secretary of the Army: JOHN A. WICKHAM JR. General, United States Army Official: Chief of Staff DONALD J. DELANDRO Brigadier General, United States Army The Adjutant General Distribution: To be distributed in accordance with special list. * U.S.
Page 517 TM 11-6625-3145-14 318/338 4434-923 318 Block Diagram...
Page 518 TM 11-6625-3145-14 318/338 4434-924 338 Block Diagram...
Page 519 TM 11-6625-3145-14 318/338 4434-925 318 Acquisition Module Wiring Diagram...
Page 520 TM 11-6625-3145-14 318/338 4434-926 318/338 Mainframe Wiring Diagram...
Page 521 TM 11-6625-3145-14 318/338 4434-926 338 Acquisition Module Wiring Diagram...
Page 522 TM 11-6625-3145-14 318/338 4434-928 Figure 9-1. 318 A01 Input-A Board Component Locations.
Page 523 TM 11-6625-3145-14 Table 9-2 318 CH 0-7 FRONT END -<1> INPUT-A BOARD, ASSEMBLY A01 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION DL100 A R106E DL100B R 106F DL100C R106G DL100D R106H DL102A R108B DL102B R108C...
Page 524 TM 11-6625-3145-14 Table 9-3 318 INPUT CONTROL - INPUT-A BOARD, ASSEMBLY A01 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION C100 Q100 C102 0102 C104 Q104 C106 R104 C108 R110 C110 R112 C112 R114 C114 R116...
Page 525 TM 11-6625-3145-14 Table 9-4 318 CH 8-15 FRONT END <3> -INPUT -B BOARD, ASSEMBLY A02 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION C200 R206D C202 R206E C204 R206F C206 R206G C208 R206H C270 R208A C276...
Page 526 TM 11-6625-3145-14...
Page 527 Table 9-5 TM 11-6625-3145-14 318 EXT CLOCK CIRCUIT O INPUT-B BOARD, ASSEMBLY A02 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION C210 R212D C212 R212E C214 R212H C216 R214 C218 R216 C220 R218 C222 R220 C224...
Page 528 TM 11-6625-3145-14 Figure 9-3. 318/338 A03 ACQ Control Board Component Locations.
Page 529 TM 11-6625-3145-14 Table 9-6 318/338 ACQUISITION CONTROL BOARD <5> - ASSEMBLY A03 CIRCUIT SCHEMATI BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION J050 * R110F R100A R110G R100B R110H R100C R160E R100D R160H R104A TP100 R104B TP200 R104C...
Page 530 TM 11-6625-3145-14 Table 9-7 318/338 ACQUISITION CONTROL BOARD <6> - ASSEMBLY A03 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION NUMBER LOCATION LOCATION C100 R108E C102 R108F C104 R108G C106 R110A C200 R2110B C202 R110C C204 R110D C206 R112A C208...
Page 531 TM 11-6625-3145-14 Table 9-8 318/338 ACQUISITION CONTROL BOARD <7> - ASSEMBLY A03 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION DL106A R150B P100 R150C P100 R152A P100 R`52B P100 R152C P100 R152D R100E R154A R100F R154B...
Page 532 TM 11-6625-3145-14...
Page 533 TM 11-6625-3145-14 Table 9-9 318/338 ACQUISITION MEMORY BOARD <8> - ASSEMBLY A04 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION J100 R134 J100 TP110 R100 TP111 R102 TP200 R104 U114 R106 U116 R108 * U118 R118C...
Page 534 TM 11-6625-3145-14 Table 9-10 318/338 ACQUISITION MEMORY BOARD <9> - ASSEMBLY A04 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION C100 R122 C101 R124 C102 R125 C104 R126 C106 R136 C108 R138 C109 R139 C110 R140...
Page 535 R082 U110 R084 U111 R086 U112 R088 U113 R100A U114 R100B U120 R100C U125 R100D U130A R100E U130B Figure 9-5. 318/338 A05 ROM/Threshold Board Component Locations R100F U150B R100G U150C R110 VR60 R115 *SEE PARTS LIST FOR SERIAL NUMBER RANGES...
Page 536 TM 11-6625-3145-14...
Page 537 R203 U505D R215 U510 R216 U515 R220 U520 R221 U525 R222 U530 R224 U540A R226 U540B Figure 9-6. 318/338 A06 MPU/Display Board Component Locations. R300 U540C R302 U540D R306 U540E R310 U540F R312 U542A R316 U542B R320 U542C R322 U542D...
Page 538 TM 11-6625-3145-14...
Page 539 TM 11-6625-3145-14...
Page 540 TM 11-6625-3145-14...
Page 541 TM 11-6625-3145-14...
Page 542 TM 11-6625-3145-14 Figure 9-8. 318/338 A10 CRT Board Component Locations.
Page 543 Table 9-13 TM 11-6625-3145-14 318/338 CRT BOARD<14> ASSEMBLY A10 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION C001 Q120 C005 0200 C010 Q220 C015 R001 C020 R002 C030 R005 C035 R010 C040 R015 C050 R030 C103...
Page 544 TM 11-6625-3145-14 Figure 9-9. 318/338 A11 Inverter Board component Locations.
Page 545 TM 11-6625-3145-14 Table 9-14 318/338 INVERTER BOARD <15> - ASSEMBLY A11 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION C102 C105 C106 C121 L101 C122 L102 C123 L103 C124 Q131 C132 0134 C143 Q135 C147 0139...
Page 546 TM 11-6625-3145-14 Figure 9-10. 318/338 A12 Regulator Board Component Locations.
Page 547 TM 11-6625-3145-14 Table 9-15 318/338 REGULATOR BOARD <16>- ASSEMBLY A12 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION R62A R62B R62C R62D RT65 On D1a. 15 CR34 CR35 CR36 CR44...
Page 548 TN 11-6625-3145-14 Figure 9-11. 318S1/338S1 A07 Serial/RS232/Non-Volatile Memory Board Component Locations.
Page 549 TM 11-6625-3145-14 Table 9-16 318S1/338S1 OPTION SERIAL <17> SERIAL/RS232/NON-VOLATILE MEMORY BD. ASSEMBLY A07 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION R141 R150 *R151 C130 R161 C150 R170 C160 R171 C200 R175 C201 R180 R181 C300 C301 C302 C310...
Page 550 TM 11-6625-3145-14 Table 9-17 318S1/338S1 SERIAL ACQ/RS232 <18> SER/RS232/NON-VOLATILE MEMORY BD. ASSEMBLY A07 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION U22A J100 U22B R50C U12A U12B U12C U32A U12D U32B U13A U32E U13B U40A U13C U40B U13D U40C...
Page 551 TM 11-6625-3145-14 Figure 9-12. 338 A01 Input-A Board Component Locations.
Page 552 TM 11-6625-3145-14 Table 9-18 338 CH 8-31 FRONT END <19> - INPUT-A BOARD, ASSEMBLY A01 CIRCUIT SCHEMATIC BOARD CIRCUIT SCHEMATIC BOARD NUMBER LOCATION LOCATION NUMBER LOCATION LOCATION DL100 TP100 DL102 TP140 DL104 TP150 DL106 TP160 DL108 U100 J100 U102 J100 U104 J100 U106...
Page 553 TM 11-6625-3145-14 318/338 SERVICE...
Page 555 PIN: 058584...

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